ATE510225T1 - Integrierte schaltung mit empfängerjittertoleranzmessung - Google Patents

Integrierte schaltung mit empfängerjittertoleranzmessung

Info

Publication number
ATE510225T1
ATE510225T1 AT08744054T AT08744054T ATE510225T1 AT E510225 T1 ATE510225 T1 AT E510225T1 AT 08744054 T AT08744054 T AT 08744054T AT 08744054 T AT08744054 T AT 08744054T AT E510225 T1 ATE510225 T1 AT E510225T1
Authority
AT
Austria
Prior art keywords
integrated circuit
jitter tolerance
tolerance measurement
jitter
receiver
Prior art date
Application number
AT08744054T
Other languages
English (en)
Inventor
Hae-Chang Lee
Jaeha Kim
Brian Leibowitz
Original Assignee
Rambus Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rambus Inc filed Critical Rambus Inc
Application granted granted Critical
Publication of ATE510225T1 publication Critical patent/ATE510225T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Dc Digital Transmission (AREA)
  • Manipulation Of Pulses (AREA)
  • Tests Of Electronic Circuits (AREA)
AT08744054T 2007-03-20 2008-03-19 Integrierte schaltung mit empfängerjittertoleranzmessung ATE510225T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US89586007P 2007-03-20 2007-03-20
PCT/US2008/057455 WO2008115968A1 (en) 2007-03-20 2008-03-19 Integrated circuit having receiver jitter tolerance ('jtol') measurement

Publications (1)

Publication Number Publication Date
ATE510225T1 true ATE510225T1 (de) 2011-06-15

Family

ID=39589250

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08744054T ATE510225T1 (de) 2007-03-20 2008-03-19 Integrierte schaltung mit empfängerjittertoleranzmessung

Country Status (5)

Country Link
US (6) US8289032B2 (de)
EP (2) EP2130055B1 (de)
JP (1) JP5432730B2 (de)
AT (1) ATE510225T1 (de)
WO (1) WO2008115968A1 (de)

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KR20220091880A (ko) 2020-12-24 2022-07-01 삼성전자주식회사 위상 보간 기반의 클럭 데이터 복원 회로 및 이를 포함하는 통신 장치
US11784856B2 (en) * 2021-01-22 2023-10-10 Macom Technology Solutions Holdings, Inc. Area efficient high-speed sequence generator and error checker
US11948621B2 (en) * 2021-07-28 2024-04-02 Samsung Electronics Co., Ltd. Memory devices, memory systems having the same, and operating methods thereof
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Also Published As

Publication number Publication date
US9791492B2 (en) 2017-10-17
US8289032B2 (en) 2012-10-16
JP5432730B2 (ja) 2014-03-05
US20130093433A1 (en) 2013-04-18
EP2130055A1 (de) 2009-12-09
US20200124652A1 (en) 2020-04-23
US20180052194A1 (en) 2018-02-22
US20170052221A1 (en) 2017-02-23
US11022639B2 (en) 2021-06-01
US11525854B2 (en) 2022-12-13
EP2360488B1 (de) 2013-01-23
US10466289B2 (en) 2019-11-05
EP2360488A1 (de) 2011-08-24
US20100097071A1 (en) 2010-04-22
WO2008115968A1 (en) 2008-09-25
EP2130055B1 (de) 2011-05-18
JP2010522331A (ja) 2010-07-01
US20210318371A1 (en) 2021-10-14
US9423441B2 (en) 2016-08-23

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