200907320 九、發明說明： 【發明所屬之技術領域】 ι特別是有 本發明是有關於-種測試裝置 關於一種密封測試裝置及其方法。、 【先前技術】 近年來，隨著科技與資訊的日新月異200907320 IX. Description of the invention: [Technical field to which the invention pertains] ι is particularly useful in the present invention. A sealing test device and method therefor. [Previous technology] In recent years, with the rapid development of technology and information
造技術亦日漸進步。在現抑人、έ七土 在現代人追求輕便性與實用性的考量 下’電子產品不但追求輕1、短、小的特性，更要有優 良的防水性能。特別是強調運動功能的產品，由於宜需要 在汗水或_的環境下U此防水性能的優劣往往是 消費者考量是否購買的要素。 目前電子產品做防水測試的方法主要有兩種，一種是 直接將電子產品浸泡於水中，接著再檢測水是否⑨漏至電 子產品中。然'%，此種測試不但耗時較長，i經過測試的 電子產品將無法正常出貨。 另一種則是真空測試，但電子產品置放於真空環境中 將導致内部電子元件損壞，因此測試後的電子產品也將無 法正常出貨。综以上所述，兩種習知的防水測試方法都只 能針對局部電子產品做少量的抽測，而無法全面或大量的 測試’因此難以確保電子產品的品質。 【發明内容】 因此本發明一方面就是在提供一種密封測試裝置，用 200907320 以對電子產品做防水測試，且不會對電子產品產生傷害。 根據本發明一實施例，一種密封測試裝置包含測試 腔、壓力計、調壓閥、氣體源及間門。其中，測試腔係用 以容置待測物體，且此測試腔具有氣體入口與氣體出口。 壓力計連接測試腔，用以偵測測試腔的内部壓力。調壓閥 連接測試腔之氣體入口。氣體源連接調壓閥。閥門連接測 試腔之氣體出口。 本發明另一方面就是在提供一種密封測試方法，其可 對電子產品做全面性的防水測試，以確保電子產品的品質。 根據本發明另一實施例，—種密封測試方法包含下列 步驟： U)將氣體充入含待測物體之測試腔中，使得測試腔的 内部壓力提升至預定壓力。 (2) 待測試腔的内部壓力提升至預定壓力後，將測試腔 密封一預定時間。 (3) 取得測試腔的内部壓力之變化。也就是說，若測試 腔的内部壓力於預定時間内下降，則代表待測物體的密封 或防水性能有缺陷。 综以上所述，本發明上述實施例係以氣壓來測試待測 物體的密封或防水性能，因此對電子產品將不會產生傷 害。此外，由於氣體對電子產品不會產生傷害，因此製造 者將可依據本發明上述實施例對量產之電子產品實施全面 或大量的測試’以確保電子產品的品質。 200907320 【實施方式】 以下將以圖示及詳細說明清楚說明本發明之精神，如 熟悉此技術之人員在瞭解本發明之實施例後，當可由本發 明所教示之技術，加以改變及修飾，其並不脫離本發明之 精神與範圍。 參照第1圖，其繪示依照本發明一實施例之密封測試 裝置的一種示意圖。如第1圖所示，一種密封測試裝置包 含測試腔110、壓力計120、調壓閥130、氣體源14〇及閥 門150。其令，測試腔11〇係用以容置待測物體，且此測試 腔H0具有氣體入口 112與氣體出口 π扣壓力計12〇連接 測試腔11〇，用以偵測測試腔110的内部壓力。調壓閥13〇 連接測試腔110之氣體入口 112。氣體源14〇連接調壓閥 130。閥門150連接測試腔11〇之氣體出口 114。 一併參照第1圖與第2圖，其中第2圖係繪示應用第i 圖之岔封測5式裝置的步驟流程圖。此外，第2圖亦可視為 揭露了種进封測試方法，此密封測試方法包含下列步驟： (1)將氣體充入含待測物體之測試腔11〇中，使得測試 腔110的内部壓力提升至預定壓力（步驟21〇)。更具體地 說，此步驟210係可藉由氣體源14〇來將氣體推入測試腔 11〇中。其中，上述氣體源14〇的實施方式可為空壓機或各 類高壓氣瓶。 一 待測試腔的内部壓力提升至預定壓力後，將測 試腔U〇密封一預定時間（步驟220)。更具體地說，此步驟 220係可藉由關閉調壓閥130與閥門150來達成。 200907320 (3)取得測試腔的内部壓力之變化。更具體地說，若測 試腔11〇的内部壓力於預定時間内下降（步驟23〇)，則判斷 氣體洩漏至待測物體令（步驟24〇^這是因為待測物體在步 驟210時並未遭氣體權入，因此此時待測物體的内部麼力 應較測試腔110的内部壓力為低。是故，若待測物體的密 封或防水性能有缺陷，將使得氣體洩漏至待測物體内，進 而讓測試腔11〇的内部壓力下降。也就是說’在測試腔ιι〇 密封一預定時間後，若測試腔11〇的内部壓力較步驟2ι〇 的預定壓力為低，則代表待測物體的密封或防水性能有缺 陷。 ' 然而，若待測物體本身的密封或防水性能有極大的缺 陷，將使得待測物體在步驟210時即已遭氣體灌入，此將 造成待測物體的内部壓力與測試腔11〇的内部壓力相同， 進而讓測試腔11 〇在密封前後保持一致的内部壓力。因此， 為了徹底檢測待測物體，本實施例之密封測試裝置更可包 含平衡腔160與卸壓閥170。其中，平衡腔16〇係連接閥門 150。卸壓閥170則連接平衡腔16〇。 當測試腔110的内部壓力於預定時間内未下降時，使 用者可先開啟測試腔11 〇與平衡腔丨6〇間的閥門丨5〇(步驟 250)。待測試腔11〇與平衡腔16〇内的壓力平衡後，判斷 測試腔110與平衡腔160内的壓力是否大於一理論壓力值 (步驟260)。當測試腔11〇與平衡腔16〇内的壓力大於理論 壓力值時，取得與理論壓力值之差值（步驟27〇)。相反地， 若測試腔110與平衡腔160内的壓力不大於理論壓力值， 200907320 則判斷待測物體通過密封測試（步驟280)。 上述之理論壓力值當可由波以爾定律運算得知。更具 體地說，由於測試腔110與平衡腔16〇内的氣體量與溫度 保持固定，因此平衡後的理論壓力值應可由式一獲得： 理論壓力值=PaVa+PbVb/(Va+Vb).......................式一 其中，Pa代表測試腔11〇於平衡前的内部壓力，卩匕代 表平衡腔160於平衡前的内部壓力，Va代表測試腔11〇扣 除待測物體後的體積，而Vb則代表平衡腔160的體積。 為了方便計算起見，上述之測試腔11〇扣除待測物體 後的體積（式一中的Va)係可大致與平衡腔16〇的體積（式一 中的Vb)相同。此外，平衡腔16〇的體積（換言之，測試腔 110扣除待測物體後的體積）亦可大致與待測物體的體積相 同。或者，平衡腔160的體積（換言之，測試腔i〇扣除待 測物體後的體積）也可以大致為待測物體的一半，甚至更 小，以利放大平衡後測試腔110或平衡腔16〇内的壓力與 理淪壓力值的差距，進而避免因儀器的機械誤差而造成誤 判。 舉例來說，當測試腔110扣除待測物體後的體積（式一 中的Va)、平衡腔160的體積（式一中的Vb)與待測物體的 體積均相同，且測試腔110於平衡前内部的預定壓力pa為 110 Kpa時，則根據式一可獲得不漏時的理論壓力值應為 105 Kpa(假設一大氣壓為100Kpa，則理論壓力值 =(ii〇xva+i〇0xVb)/(Va+Vb)=105)。然而，若氣體於步驟 21〇 時即已洩漏至待測物體中，則平衡後的壓力根據下式二的 200907320 推算應為106.67 Kpa(假設一大氣壓為loo Kpa，則平衡後 的壓力值 =(ll〇xVa+l〇〇xVb+ll〇xVc)/(Va+Vb+VC)=l〇6.67)，兩者僅 相差 1.67 Kpa。 >电漏時的遷力值=paVa+PbVb+PcVc/(Va+Vb+Vc)式二 其中，Pa代表測試腔11 〇於平衡前的内部壓力，代 表平衡腔160於平衡前的内部壓力，Pc代表待測物體於平 衡前的内部壓力，Va代表測試腔11〇扣除待測物體後的體 積，Vb代表平衡腔160的體積，而Ve則代表待測物體的 體積。 另一方面’當測試腔110扣除待測物體後的體積（式一 中的Va)與平衡腔160的體積（式一中的Vb)均為待測物體 體積的一半，且測試腔110於平衡前内部的預定壓力pa為 110 Kpa時，則根據式一可獲得不漏時的理論壓力值應為 105 Kpa(假設一大氣壓為1〇〇K]pa，則理論壓力值 =(ll〇xVa+l〇〇xVb)/(Va+Vb)=l〇5)。然而，若氣體於步驟 21〇 時即已洩漏至待測物體中，則平衡後的壓力根據上式二的 推算應為107.5 Kpa(假設一大氣壓為1〇〇Kpa，則平衡後的 壓力=(1 lOxVa+lOOxVb+1 l〇xVc)/(Va+Vb+Vc)=1〇7 5)，兩者 間的差距將擴大至2.5 Kpa。 上述之預定壓力可為約110Kpa，而預定時間可為約 3〇分鐘。然此不應限制本發明，此二數值應依設計者對待 測物體所設計的密封或防水強度而定。 更具體地說，上述之氣體源14〇所能提供的壓力範圍 200907320 可為約胸咖Kpa，而龍閱130則可將來自氣體源i4〇 ㈣入I力湘至預㈣力（例如：UG Kpa)輸出，以利穩 疋測試腔I1G的内部壓力。應瞭解到，上述之|力範圍或 數值均僅為例示，不應限制本發明，氣體源所能提供的壓 力fe圍與預定壓力的大小均應視實際需要而定。 第3圖係繪示第i圖之調壓閥13〇的細部示意圖。如 圖所示，調壓閥130更可具有第一減壓閥132，其係連接氣 體源140與氣體入π 112，用以控制測試腔！ i 〇的内部麼 力。更具體地說，本實施例之第一減壓閥132的工作範圍 係約110-200 Kpa，但此不應限制本發明，第一減壓閥132 的工作範圍應視預定壓力的大小而定。 當然，若需要更準確地控制測試腔11〇的内部壓力， 使用者亦可安裝第二減壓閥134,其係連接該第一減壓閥 132及氣體入口 112(繪示於帛i圖）。更具體地說，本實施 例之第二減壓閥134的工作範圍係約U5_i75K押，但此不 應限制本發明’第二減壓閥134的工作範圍應視預定壓力 的大小而定，只要比第一減壓閥132的工作範圍更小即可。 雖然本發明已以實施例揭露如上，然其並非用以限定 本發明，任何熟習此技藝者，在不脫離本發明之精神和範 圍内，當可作各種之更動與潤飾，因此本發明之保護範圍 當視後附之申請專利範圍所界定者為準。 【圖式簡單說明】 為讓本發明之上述和其他目的、特徵、優點與實施例 11 200907320 能更明顯易懂，所附圖式之詳細說明如下： 第1圖係繪示依照本發明一實施例之密封測試裝置的 一種示意圖。 第2圖係繪示應用第1圖之密封測試裝置的步驟流程 圖。 第3圖係繪示第1圖之調壓閥的細部示意圖。 112 :氣體入口 120 :壓力計 132 :第一減壓閥 140 :氣體源 160 :平衡腔 【主要元件符號說明】 110 :測試腔 114 :氣體出口 13 0 :調壓閥 134 :第二減壓閥 150 :閥門 17 0 :卸壓閥 210-290 :步驟 12The technology is also improving. In the current people's pursuit of portability and practicality, the electronic products not only pursue light, short, and small characteristics, but also have excellent waterproof performance. In particular, products that emphasize exercise function, because of the need to be in a sweat or _ environment, the quality of the waterproof performance is often the consumer to consider whether to buy the elements. At present, there are two main methods for waterproof testing of electronic products. One is to directly immerse the electronic product in water, and then detect whether the water 9 leaks into the electronic product. However, '%, this test is not only a long time, i tested electronic products will not be able to ship properly. The other is a vacuum test, but placing the electronics in a vacuum environment will cause damage to the internal electronic components, so the tested electronic products will not be shipped properly. In summary, the two conventional waterproof test methods can only perform a small amount of sampling for local electronic products, but cannot be comprehensively or extensively tested. Therefore, it is difficult to ensure the quality of electronic products. SUMMARY OF THE INVENTION Therefore, in one aspect of the present invention, a sealing test device is provided, which uses the 200907320 to perform a waterproof test on an electronic product without causing damage to the electronic product. In accordance with an embodiment of the invention, a seal test apparatus includes a test chamber, a pressure gauge, a pressure regulating valve, a gas source, and a door. Wherein, the test cavity is used for accommodating the object to be tested, and the test cavity has a gas inlet and a gas outlet. The pressure gauge is connected to the test chamber to detect the internal pressure of the test chamber. Pressure regulator Connect the gas inlet to the test chamber. The gas source is connected to the pressure regulating valve. The valve is connected to the gas outlet of the test chamber. Another aspect of the present invention is to provide a seal test method that can perform a comprehensive waterproof test on an electronic product to ensure the quality of the electronic product. According to another embodiment of the present invention, a sealing test method comprises the steps of: U) charging a gas into a test chamber containing an object to be tested, so that the internal pressure of the test chamber is raised to a predetermined pressure. (2) After the internal pressure of the chamber to be tested is raised to a predetermined pressure, the test chamber is sealed for a predetermined time. (3) Obtain the change in the internal pressure of the test chamber. That is, if the internal pressure of the test chamber drops within a predetermined time, it means that the seal or waterproof property of the object to be tested is defective. As described above, the above embodiment of the present invention tests the sealing or waterproof performance of the object to be tested with air pressure, and thus will not cause damage to the electronic product. Moreover, since the gas does not cause damage to the electronic product, the manufacturer can perform a full or extensive test of the mass-produced electronic product in accordance with the above-described embodiments of the present invention to ensure the quality of the electronic product. The present invention will be clearly described and illustrated in the following detailed description, which is to be understood by those skilled in the art. The spirit and scope of the invention are not departed. Referring to Figure 1, there is shown a schematic view of a seal test apparatus in accordance with an embodiment of the present invention. As shown in Fig. 1, a seal test apparatus includes a test chamber 110, a pressure gauge 120, a pressure regulating valve 130, a gas source 14A, and a valve 150. The test chamber 11 is configured to receive the object to be tested, and the test chamber H0 has a gas inlet 112 and a gas outlet π buckle pressure gauge 12 〇 connected to the test chamber 11 〇 for detecting the internal pressure of the test chamber 110 . The pressure regulating valve 13 is connected to the gas inlet 112 of the test chamber 110. The gas source 14 is connected to the pressure regulating valve 130. The valve 150 is connected to the gas outlet 114 of the test chamber 11A. Referring to FIG. 1 and FIG. 2 together, FIG. 2 is a flow chart showing the steps of applying the apparatus of FIG. In addition, FIG. 2 can also be regarded as exposing a method for testing the seal. The seal test method comprises the following steps: (1) charging a gas into the test chamber 11〇 containing the object to be tested, so that the internal pressure of the test chamber 110 is increased. To the predetermined pressure (step 21〇). More specifically, this step 210 can be used to push gas into the test chamber 11 by means of a gas source 14 。. The embodiment of the gas source 14A may be an air compressor or various high pressure gas cylinders. After the internal pressure of the test chamber is raised to a predetermined pressure, the test chamber U is sealed for a predetermined time (step 220). More specifically, this step 220 can be accomplished by closing the pressure regulating valve 130 and the valve 150. 200907320 (3) Obtain the change of the internal pressure of the test chamber. More specifically, if the internal pressure of the test chamber 11〇 falls within a predetermined time (step 23〇), it is judged that the gas leaks to the object to be tested (step 24〇) because the object to be tested is not at step 210. The gas is intruded, so the internal force of the object to be tested should be lower than the internal pressure of the test chamber 110. Therefore, if the sealing or waterproof performance of the object to be tested is defective, the gas will leak into the object to be tested. , in turn, the internal pressure of the test chamber 11 下降 is lowered. That is, after the test chamber is sealed for a predetermined time, if the internal pressure of the test chamber 11 较 is lower than the predetermined pressure of the step 2 ι , it represents the object to be tested The sealing or waterproof performance is defective. ' However, if the sealing or waterproofing property of the object to be tested has a great defect, the object to be tested will be filled with gas at step 210, which will cause the inside of the object to be tested. The pressure is the same as the internal pressure of the test chamber 11〇, thereby allowing the test chamber 11 to maintain a consistent internal pressure before and after the sealing. Therefore, in order to thoroughly detect the object to be tested, the sealing test package of this embodiment The balance chamber 160 and the pressure relief valve 170 are included. The balance chamber 16 is connected to the valve 150. The pressure relief valve 170 is connected to the balance chamber 16A. When the internal pressure of the test chamber 110 does not fall within a predetermined time, The user can first open the valve 丨5〇 between the test chamber 11 〇 and the balance chamber 〇6〇 (step 250). After the pressure of the test chamber 11〇 and the balance chamber 16〇 is balanced, the test chamber 110 and the balance chamber 160 are judged. Whether the pressure inside is greater than a theoretical pressure value (step 260). When the pressure in the test chamber 11〇 and the balance chamber 16〇 is greater than the theoretical pressure value, the difference from the theoretical pressure value is obtained (step 27〇). Conversely, If the pressure in the test chamber 110 and the balance chamber 160 is not greater than the theoretical pressure value, 200907320 determines that the object to be tested passes the seal test (step 280). The above theoretical pressure value can be learned by Bohr's law. More specifically Since the amount of gas and temperature in the test chamber 110 and the balance chamber 16〇 are kept fixed, the theoretical pressure value after the balance should be obtained by Equation 1: Theoretical pressure value=PaVa+PbVb/(Va+Vb)..... ..................Form one of them, Pa generation The test chamber 11 is clamped to the internal pressure before the balance, 卩匕 represents the internal pressure of the balance chamber 160 before the balance, Va represents the volume of the test chamber 11 〇 after subtracting the object to be tested, and Vb represents the volume of the balance chamber 160. For calculation, the volume of the above test chamber 11 after deducting the object to be tested (Va in Equation 1) may be substantially the same as the volume of the balance chamber 16〇 (Vb in Equation 1). In addition, the balance chamber 16〇 The volume (in other words, the volume of the test chamber 110 after subtracting the object to be tested) may also be substantially the same as the volume of the object to be tested. Alternatively, the volume of the balance chamber 160 (in other words, the volume of the test chamber i after subtracting the object to be tested) may also be It is roughly half of the object to be tested, or even smaller, in order to enlarge the difference between the pressure in the test chamber 110 or the balance chamber 16〇 and the pressure value, thereby avoiding misjudgment caused by mechanical errors of the instrument. For example, when the test chamber 110 subtracts the volume of the object to be tested (Va in Equation 1), the volume of the balance chamber 160 (Vb in Equation 1), and the volume of the object to be tested are the same, and the test chamber 110 is balanced. When the pre-internal predetermined pressure pa is 110 Kpa, the theoretical pressure value at which the leak is obtained according to Equation 1 should be 105 Kpa (assuming the atmospheric pressure is 100 Kpa, then the theoretical pressure value = (ii〇xva+i〇0xVb)/ (Va+Vb)=105). However, if the gas has leaked into the object to be tested at step 21, the equilibrium pressure is estimated to be 106.67 Kpa according to the 200907320 of the following formula 2 (assuming the atmospheric pressure is loo Kpa, the equilibrium pressure value = ( ll〇xVa+l〇〇xVb+ll〇xVc)/(Va+Vb+VC)=l〇6.67), the difference between the two is only 1.67 Kpa. > Force value at the time of electric leakage = paVa + PbVb + PcVc / (Va + Vb + Vc) Equation 2 where Pa represents the internal pressure of the test chamber 11 before equilibrium, representing the internal pressure of the balance chamber 160 before equilibrium Pc represents the internal pressure of the object to be tested before the balance, Va represents the volume of the test chamber 11 after subtracting the object to be tested, Vb represents the volume of the balance chamber 160, and Ve represents the volume of the object to be tested. On the other hand, when the test chamber 110 deducts the volume of the object to be tested (Va in Equation 1) and the volume of the balance chamber 160 (Vb in Equation 1) is half the volume of the object to be tested, and the test chamber 110 is balanced. When the pre-internal predetermined pressure pa is 110 Kpa, the theoretical pressure value when the first one can be obtained according to Equation 1 should be 105 Kpa (assuming the atmospheric pressure is 1〇〇K]pa, then the theoretical pressure value = (ll〇xVa+ l〇〇xVb)/(Va+Vb)=l〇5). However, if the gas has leaked into the object to be tested at step 21, the equilibrium pressure should be 107.5 Kpa according to the above formula 2 (assuming the atmospheric pressure is 1 〇〇 Kpa, then the equilibrium pressure = ( 1 lOxVa+lOOxVb+1 l〇xVc)/(Va+Vb+Vc)=1〇7 5), the gap between the two will be extended to 2.5 Kpa. The predetermined pressure described above may be about 110 Kpa, and the predetermined time may be about 3 minutes. However, the invention should not be limited, and the values should be based on the seal or waterproof strength of the design of the object to be tested. More specifically, the above-mentioned gas source 14 〇 can provide a pressure range of 200907320, which can be about the chest coffee Kpa, and the dragon reading 130 can be from the gas source i4 〇 (four) into the I-to-pre-four force (for example: UG Kpa) output to stabilize the internal pressure of the test chamber I1G. It should be understood that the above-mentioned range of forces or values are merely exemplary and should not be construed as limiting the present invention. The pressure and the predetermined pressure of the gas source should be determined according to actual needs. Fig. 3 is a schematic view showing a detail of the pressure regulating valve 13A of Fig. i. As shown, the pressure regulating valve 130 can further have a first pressure reducing valve 132 that connects the gas source 140 and the gas into the π 112 for controlling the test chamber! i 〇 internal force. More specifically, the working range of the first pressure reducing valve 132 of the present embodiment is about 110-200 Kpa, but this should not limit the invention, and the working range of the first pressure reducing valve 132 should be determined according to the predetermined pressure. . Of course, if it is necessary to more accurately control the internal pressure of the test chamber 11〇, the user can also install a second pressure reducing valve 134 that connects the first pressure reducing valve 132 and the gas inlet 112 (shown in FIG. . More specifically, the working range of the second pressure reducing valve 134 of the present embodiment is about U5_i75K, but this should not limit the working range of the second pressure reducing valve 134 of the present invention, depending on the predetermined pressure, as long as It is smaller than the working range of the first pressure reducing valve 132. Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and the present invention can be modified and retouched without departing from the spirit and scope of the present invention. The scope is subject to the definition of the scope of the patent application attached. BRIEF DESCRIPTION OF THE DRAWINGS The above and other objects, features, advantages and embodiments of the present invention will become more apparent from the description of the embodiments of the present invention. The detailed description of the drawings is as follows: FIG. 1 is a diagram showing an embodiment of the present invention. A schematic diagram of a sealed test device. Fig. 2 is a flow chart showing the steps of applying the sealing test apparatus of Fig. 1. Fig. 3 is a schematic view showing a detail of the pressure regulating valve of Fig. 1. 112: gas inlet 120: pressure gauge 132: first pressure reducing valve 140: gas source 160: balance chamber [main component symbol description] 110: test chamber 114: gas outlet 13 0: pressure regulating valve 134: second pressure reducing valve 150: valve 17 0 : pressure relief valve 210-290 : step 12