TW201133677A - Chip test device - Google Patents

Chip test device Download PDF

Info

Publication number: TW201133677A
Authority: TW; Taiwan
Prior art keywords: test; seat; detecting; wafer; testing device
Prior art date: 2010-03-22

Application number

TW99108342A

Other languages

English (en)

Chinese (zh)

Other versions

TWI406353B (de

Inventor

Yao-Hua Gao

Original Assignee

Global Master Tech Co Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2010-03-22

Filing date

2010-03-22

Publication date

2011-10-01

2010-03-22 Application filed by Global Master Tech Co Ltd filed Critical Global Master Tech Co Ltd

2010-03-22 Priority to TW99108342A priority Critical patent/TW201133677A/zh

2011-10-01 Publication of TW201133677A publication Critical patent/TW201133677A/zh

2013-08-21 Application granted granted Critical

2013-08-21 Publication of TWI406353B publication Critical patent/TWI406353B/zh

Links

238000012360 testing method Methods 0.000 title claims abstract description 88
239000013078 crystal Substances 0.000 claims description 23
238000001514 detection method Methods 0.000 claims description 7
239000000463 material Substances 0.000 claims 2
206010036790 Productive cough Diseases 0.000 claims 1
210000003298 dental enamel Anatomy 0.000 claims 1
210000003802 sputum Anatomy 0.000 claims 1
208000024794 sputum Diseases 0.000 claims 1
239000000523 sample Substances 0.000 abstract description 7
230000000694 effects Effects 0.000 abstract description 5
238000000034 method Methods 0.000 abstract description 5
230000003028 elevating effect Effects 0.000 abstract 3
238000004519 manufacturing process Methods 0.000 description 5
239000004065 semiconductor Substances 0.000 description 4
238000012858 packaging process Methods 0.000 description 3
238000006073 displacement reaction Methods 0.000 description 2
238000004806 packaging method and process Methods 0.000 description 2
238000013459 approach Methods 0.000 description 1
238000011109 contamination Methods 0.000 description 1
230000000994 depressogenic effect Effects 0.000 description 1
238000013461 design Methods 0.000 description 1
238000011161 development Methods 0.000 description 1
230000007613 environmental effect Effects 0.000 description 1
238000012986 modification Methods 0.000 description 1
230000004048 modification Effects 0.000 description 1
239000002245 particle Substances 0.000 description 1
238000010998 test method Methods 0.000 description 1

Landscapes

Testing Of Individual Semiconductor Devices (AREA)
Testing Electric Properties And Detecting Electric Faults (AREA)
Testing Or Measuring Of Semiconductors Or The Like (AREA)

TW99108342A 2010-03-22 2010-03-22 Chip test device TW201133677A (en)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
TW99108342A TW201133677A (en)	2010-03-22	2010-03-22	Chip test device

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
TW99108342A TW201133677A (en)	2010-03-22	2010-03-22	Chip test device

Publications (2)

Publication Number	Publication Date
TW201133677A true TW201133677A (en)	2011-10-01
TWI406353B TWI406353B (de)	2013-08-21

Family

ID=46751284

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
TW99108342A TW201133677A (en)	2010-03-22	2010-03-22	Chip test device

Country Status (1)

Country	Link
TW (1)	TW201133677A (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
TWI560457B (de) *	2014-10-24	2016-12-01	Advantest Corp
TWI681495B (zh) *	2018-08-15	2020-01-01	致茂電子股份有限公司	晶片旋轉暫置台

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4644269A (en) *	1983-05-31	1987-02-17	Pylon Company	Test fixture having full surface contact hinged lid
TW501215B (en) *	2000-10-18	2002-09-01	Scs Hightech Inc	Method and apparatus for multiple known good die processing
TW200925620A (en) *	2007-12-06	2009-06-16	Global Master Tech Co Ltd	Chip testing device
TWI375291B (en) *	2008-05-16	2012-10-21	Hon Tech Inc	Testing device for use in testing a chip

2010
- 2010-03-22 TW TW99108342A patent/TW201133677A/zh not_active IP Right Cessation

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
TWI560457B (de) *	2014-10-24	2016-12-01	Advantest Corp
US9588142B2 (en)	2014-10-24	2017-03-07	Advantest Corporation	Electronic device handling apparatus and electronic device testing apparatus
TWI681495B (zh) *	2018-08-15	2020-01-01	致茂電子股份有限公司	晶片旋轉暫置台

Also Published As

Publication number	Publication date
TWI406353B (de)	2013-08-21

Similar Documents

Publication	Publication Date	Title
US8336188B2 (en)	2012-12-25	Thin wafer chuck
US20130314112A1 (en)	2013-11-28	Resistivity-measuring device
CN103920653A (zh)	2014-07-16	一种全自动平面度检测送料分拣一体化装置及控制方法
US9134343B2 (en)	2015-09-15	Sort probe gripper
TWI541510B (zh)	2016-07-11	Can improve the detection efficiency of the point measurement method
WO2015022875A1 (ja)	2015-02-19	プリント基板検査装置
CN101271145A (zh)	2008-09-24	检查装置和检查方法
CN105480735B (zh)	2017-12-19	全自动碳刷弹簧校正测力机
CN207042874U (zh)	2018-02-27	一种测量装置
CN206992074U (zh)	2018-02-09	一种用于测试键合晶圆对准误差的结构
CN105390411A (zh)	2016-03-09	一种新型太阳能电池片电池效率测试机
TW201329483A (zh)	2013-07-16	探針針壓校正方法及其校正設備
CN107863302A (zh)	2018-03-30	测试装置以及测试方法
CN102768348A (zh)	2012-11-07	一种探针寿命自动测试系统
TW201133677A (en)	2011-10-01	Chip test device
CN110921278A (zh)	2020-03-27	电子元件性能自动检测机
CN202275092U (zh)	2012-06-13	一种对位装置
KR101838805B1 (ko)	2018-03-14	반도체 소자 테스트 장치 및 방법
WO2014157122A1 (ja)	2014-10-02	プローブ装置
CN102034683A (zh)	2011-04-27	激光修补机台
TW200931444A (en)	2009-07-16	Automated contact alignment tool
CN220820159U (zh)	2024-04-19	测试装置
CN215644395U (zh)	2022-01-25	一种晶圆测试仪
KR20100080025A (ko)	2010-07-08	웨이퍼 검사장치 및 검사방법
CN201926673U (zh)	2011-08-10	治具测试机构

Legal Events

Date	Code	Title	Description
2021-05-21	MM4A	Annulment or lapse of patent due to non-payment of fees