TW201226888A - Glass substrate - Google Patents

Glass substrate Download PDF

Info

Publication number
TW201226888A
TW201226888A TW100144476A TW100144476A TW201226888A TW 201226888 A TW201226888 A TW 201226888A TW 100144476 A TW100144476 A TW 100144476A TW 100144476 A TW100144476 A TW 100144476A TW 201226888 A TW201226888 A TW 201226888A
Authority
TW
Taiwan
Prior art keywords
bubble
glass substrate
diameter
image
ball
Prior art date
Application number
TW100144476A
Other languages
English (en)
Chinese (zh)
Inventor
Nobuhiko Higuchi
Makoto Kurumisawa
Shinji Fujii
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Publication of TW201226888A publication Critical patent/TW201226888A/zh

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G01N2021/8967Discriminating defects on opposite sides or at different depths of sheet or rod

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
TW100144476A 2010-12-09 2011-12-02 Glass substrate TW201226888A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010275049 2010-12-09

Publications (1)

Publication Number Publication Date
TW201226888A true TW201226888A (en) 2012-07-01

Family

ID=46207033

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100144476A TW201226888A (en) 2010-12-09 2011-12-02 Glass substrate

Country Status (5)

Country Link
JP (1) JP5686139B2 (fr)
KR (1) KR20130124954A (fr)
CN (1) CN103250046B (fr)
TW (1) TW201226888A (fr)
WO (1) WO2012077542A1 (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5769895B1 (ja) * 2014-04-18 2015-08-26 AvanStrate株式会社 フラットパネルディスプレイ用ガラス基板及びその製造方法、ならびに液晶ディスプレイ
CN105204207B (zh) * 2014-04-18 2019-07-09 安瀚视特控股株式会社 平板显示器用玻璃基板及其制造方法、以及液晶显示器
JP6067777B2 (ja) * 2015-04-27 2017-01-25 AvanStrate株式会社 フラットパネルディスプレイ用ガラス基板及びその製造方法、ならびに液晶ディスプレイ
CN105842885B (zh) * 2016-03-21 2018-11-27 凌云光技术集团有限责任公司 一种液晶屏缺陷分层定位方法及装置
CN107884318B (zh) * 2016-09-30 2020-04-10 上海微电子装备(集团)股份有限公司 一种平板颗粒度检测方法
CN106872483A (zh) * 2017-02-04 2017-06-20 大连益盛达智能科技有限公司 解决光学检测设备因透明材质中的气泡影响检测的方法
CN106996937B (zh) * 2017-06-15 2019-09-06 福州东旭光电科技有限公司 一种玻璃基板内缺陷检测方法及装置
CN117491391B (zh) * 2023-12-29 2024-03-15 登景(天津)科技有限公司 基于芯片计算的玻璃基板光三维健康检测方法及设备

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54106289A (en) * 1978-02-07 1979-08-21 Nippon Sheet Glass Co Ltd Defect detector for glass sheet
JPH0961139A (ja) * 1995-08-22 1997-03-07 Asahi Glass Co Ltd 透明体の欠点検出方法及び装置
JP2004233338A (ja) * 2003-01-08 2004-08-19 Tdk Corp 円盤状基板の欠陥検出方法、その装置及び光ディスク用基板の製造方法
KR100897223B1 (ko) * 2004-11-24 2009-05-14 아사히 가라스 가부시키가이샤 투명 판상체의 결함 검사 방법 및 장치
WO2007129744A1 (fr) * 2006-05-10 2007-11-15 Asahi Glass Company, Limited Verre flotte pour substrat d'affichage et son procede de production
KR101548025B1 (ko) * 2007-07-27 2015-08-27 아사히 가라스 가부시키가이샤 투광성 기판, 그의 제조 방법, 유기 led 소자 및 그의 제조 방법
CN101790679B (zh) * 2007-09-04 2012-05-09 旭硝子株式会社 检测透明板体内部的微小异物的方法及其装置
CN101855182B (zh) * 2007-11-08 2012-12-05 旭硝子株式会社 玻璃板制造方法
JP2010008177A (ja) * 2008-06-26 2010-01-14 Adtec Engineeng Co Ltd 欠陥検出装置及び方法
JP5521377B2 (ja) * 2009-04-13 2014-06-11 セントラル硝子株式会社 ガラス板の欠陥識別方法および装置

Also Published As

Publication number Publication date
WO2012077542A1 (fr) 2012-06-14
JP5686139B2 (ja) 2015-03-18
CN103250046B (zh) 2016-02-24
CN103250046A (zh) 2013-08-14
KR20130124954A (ko) 2013-11-15
JPWO2012077542A1 (ja) 2014-05-19

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