TW201329509A - 3D scan device and 3D scan method thereof - Google Patents
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Description
本發明有關一種掃瞄裝置,特別關於一種可建立具有待測物體之表面輪廓資訊及顏色資訊的立體掃瞄裝置、及關於立體掃瞄裝置之立體掃瞄方法。The invention relates to a scanning device, in particular to a stereo scanning device capable of establishing surface contour information and color information of an object to be tested, and a stereo scanning method for a stereo scanning device.
傳統的3維成像技術係對待測物品進行外觀掃瞄後再進行運算成像,其掃瞄所使用的方法包含3維量測平台或掃描器以進行物品的外觀尺寸資訊的蒐集,用以作為後續3維影像模型建構的基礎。The traditional 3D imaging technology performs the imaging scan of the object to be tested, and the method used for the scanning includes a 3-dimensional measuring platform or a scanner for collecting the appearance and size information of the article for use as a follow-up. The basis for the construction of 3D image models.
一般來說,掃描器是採用接觸式探針掃描器以搭配旋轉平台。待測物品置於旋轉平台以轉動,故接觸式探針掃描器可得到2維的相對位置資訊,並綜合於待測物品之不同視角所取得的2維資訊,便可透過電腦運算而建立3維的立體模型。然而此技術的缺點是量測設備體積相當龐大且不易攜帶,量測速度緩慢。In general, the scanner uses a contact probe scanner to match the rotating platform. The object to be tested is placed on the rotating platform to rotate, so the contact probe scanner can obtain the two-dimensional relative position information, and the two-dimensional information obtained from the different perspectives of the object to be tested can be established through computer operation. Dimensional model of the dimension. However, the disadvantage of this technique is that the measuring device is quite bulky and difficult to carry, and the measuring speed is slow.
再者,傳統的3維成像技術僅能針對待測物品的輪廓尺寸進行運算成像,並無法提供物體表面的外觀顏色及組成材質之資訊,因此無法滿足精密量測的嚴苛需求。Moreover, the traditional 3D imaging technology can only perform computational imaging on the contour size of the object to be tested, and cannot provide information on the appearance color and composition of the surface of the object, and thus cannot meet the stringent requirements of precision measurement.
有鑑於此,提供一種可改善至少一種上述缺失的,乃為此業界亟待解決的問題。In view of this, it is an urgent problem to be solved in the industry to provide an improvement that can at least one of the above-mentioned deficiencies.
本發明之主要目的在於提供一種可建立具有待測物體之表面輪廓資訊及顏色資訊的立體掃瞄裝置、及關於立體掃瞄裝置之立體掃瞄方法。The main object of the present invention is to provide a stereo scanning device capable of establishing surface contour information and color information of an object to be tested, and a stereo scanning method for the stereo scanning device.
為達上述目的,本發明所揭露的一種立體掃瞄裝置,包含一光源組、一掃描鏡元件、一測距元件與一顏色分析元件。該光源組用以發射一可見光束及一非可見光束。該掃描鏡元件光學地耦合該光源組,用來反射該可見光束及該非可見光束,以使該可見光束及該非可見光束投射至一待測物體之表面並沿著一預定掃瞄軌跡移動。該測距元件用以接收自該待測物體之表面所反射之一非可見反射光束。該顏色分析元件,用以接收自該待測物體之表面所反射之一可見反射光束。To achieve the above objective, a stereo scanning device according to the present invention comprises a light source group, a scanning mirror element, a ranging component and a color analysis component. The light source group is configured to emit a visible light beam and a non-visible light beam. The scanning mirror element is optically coupled to the light source group for reflecting the visible light beam and the non-visible light beam to project the visible light beam and the non-visible light beam onto a surface of an object to be tested and move along a predetermined scanning track. The ranging component is configured to receive a non-visible reflected light beam reflected from a surface of the object to be tested. The color analysis component is configured to receive a visible reflected beam reflected from a surface of the object to be tested.
為達上述目的,本發明所揭露的一種立體掃瞄方法,包含步驟發射一可見光束及一非可見光束;沿著一預定掃瞄軌跡將該可見光束及該非可見光束投射至一待測物體之表面;接收自該待測物體之表面所反射之一非可見反射光束;計算對應該待測物體表面之ㄧ距離資訊;接收自該待測物體之表面所反射之一可見反射光束;以及計算該待測物體表面之ㄧ顏色資訊。To achieve the above objective, a stereo scanning method disclosed in the present invention comprises the steps of emitting a visible light beam and a non-visible light beam; and projecting the visible light beam and the non-visible light beam to an object to be measured along a predetermined scanning track. a surface; a non-visible reflected beam reflected from a surface of the object to be tested; a distance information corresponding to a surface of the object to be tested; a visible reflected beam received from a surface of the object to be tested; and calculating The color information of the surface of the object to be tested.
為讓上述目的、技術特徵及優點能更明顯易懂,下文係以較佳之實施例配合所附圖式進行詳細說明。The above objects, technical features and advantages will be more apparent from the following description.
本發明提出一種立體掃瞄裝置,及一套關於立體掃瞄裝置之立體掃瞄方法。立體掃瞄裝置透過投射可見光束與非可見光束,及接收來自待測物體之可見反射光束及非可見反射光束,以計算該待測物體表面之距離資訊與顏色資訊,藉此建立相對應該待測物體之具有顏色的立體輪廓模型。The invention provides a stereo scanning device and a stereo scanning method for a stereo scanning device. The stereo scanning device projects the visible light beam and the non-visible light beam, and receives the visible reflected light beam and the non-visible reflected light beam from the object to be measured to calculate distance information and color information of the surface of the object to be tested, thereby establishing a relative testable A solid three-dimensional contour model of an object.
本發明之實施例並非用以限制本發明需在如實施例所述之任何特定環境、應用或特殊方式方能實施。在以下說明中,該等圖式均為簡化或稍誇大比例之示意圖,所顯示之元件並非實施時之數目、形狀及尺寸比例,而僅為一種選擇性設計,故實際元件佈局型態可能更為複雜,於此合先敘明。The embodiments of the present invention are not intended to limit the invention to any particular environment, application, or special mode as described in the embodiments. In the following description, the drawings are simplified or slightly exaggerated. The components shown are not the number, shape and size ratio of the implementation, but only a selective design, so the actual component layout may be more For the sake of complexity, this is a combination of the first.
請參閱第1圖與第2圖,第1圖為本發明之實施例之一立體掃瞄裝置10之功能方塊示意圖,第2圖為本發明之實施例之立體掃瞄裝置10之部份光路示意圖。立體掃瞄裝置10係可用來對一待測物體A的顏色與外型尺寸進行掃瞄量測。立體掃瞄裝置10包含有一光源組12、一掃瞄鏡元件14、一分光鏡組16、一測距元件18、一顏色分析元件20與一分析單元22。Please refer to FIG. 1 and FIG. 2 . FIG. 1 is a functional block diagram of a stereo scanning device 10 according to an embodiment of the present invention, and FIG. 2 is a partial optical path of the stereo scanning device 10 according to an embodiment of the present invention. schematic diagram. The stereo scanning device 10 can be used for scanning measurement of the color and shape of an object A to be tested. The stereo scanning device 10 includes a light source group 12, a scanning mirror element 14, a beam splitting mirror group 16, a ranging component 18, a color analyzing component 20 and an analyzing unit 22.
光源組12包含有一可見光光源121與一非可見光光源122,用以分別發射一可見光束1211及一非可見光束1221。如第2圖所繪示,可見光光源121可包含一紅色可見雷射光源121R、一綠色可見雷射光源121G與一藍色可見雷射光源121B,用以分別發射出藍色可見雷射光束1211B、綠色可見雷射光束1211G或紅色可見雷射光束1211R。其中,藍色可見雷射光束1211B、綠色可見雷射光束1211G或紅色可見雷射光束1211R行進的光路實際上經設計為彼此平行且極為接近(或重疊),以便於組合成一可見光光束1211。The light source group 12 includes a visible light source 121 and a non-visible light source 122 for respectively emitting a visible light beam 1211 and a non-visible light beam 1221. As shown in FIG. 2, the visible light source 121 can include a red visible laser light source 121R, a green visible laser light source 121G, and a blue visible laser light source 121B for respectively emitting a blue visible laser beam 1211B. , green visible laser beam 1211G or red visible laser beam 1211R. The optical paths through which the blue visible laser beam 1211B, the green visible laser beam 1211G, or the red visible laser beam 1211R travel are actually designed to be parallel to each other and in close proximity (or overlap) to facilitate combining into a visible light beam 1211.
於此實施例中,可見光光源121可同時選用上述三種原色的可見雷射光源,或從其中任選一種,以提供單色的藍色可見雷射光束1211B、綠色可見雷射光束1211G或紅色可見雷射光束1211R。於其他可供選擇的操作模式上,可見光光源121可依序發出三原色的可見光束,並配合時間間隔以跳打的方式進行輪廓掃瞄,但不以此為限。至於非可見光光源122則可包含一紅外光源或一紫外光源二者其中之一。In this embodiment, the visible light source 121 can simultaneously select the visible light sources of the above three primary colors, or select one of them to provide a monochromatic blue visible laser beam 1211B, a green visible laser beam 1211G or a red visible Laser beam 1211R. In other alternative modes of operation, the visible light source 121 can sequentially emit visible light beams of three primary colors, and perform contour scanning in a time-hopping manner with time intervals, but not limited thereto. As for the non-visible light source 122, one of an infrared light source or an ultraviolet light source may be included.
更進一步來說,前揭以跳打方式進行輪廓掃瞄的具體模式可舉例為,當可見光光源121於第一、第四及第七時間間隔內,僅發射出藍色可見雷射光束1211B;當可見光光源121於第二、第五及第八時間間隔內,僅發射出綠色可見雷射光束1211G;當可見光光源121於第三、第六及第九時間間隔內,僅發射出紅色可見雷射光束1211R。也因此,顏色分析元件20於每一時間間隔內僅需接收並處理該時間間隔內所接收的可見反射單色光束,可避免因其它色光干擾所導致不必要的誤偵測。於此跳打模式下,本實施例更可選擇性地採用簡易型且結構複雜度低的顏色分析元件20,進而達到降低立體掃瞄裝置整體成本及體積之目的。Further, the specific mode of performing the contour scanning in the jumping mode can be exemplified as: when the visible light source 121 is in the first, fourth and seventh time intervals, only the blue visible laser beam 1211B is emitted; When the visible light source 121 is in the second, fifth, and eighth time intervals, only the green visible laser beam 1211G is emitted; when the visible light source 121 is in the third, sixth, and ninth time intervals, only the red visible thunder is emitted. The beam 1211R. Therefore, the color analysis component 20 only needs to receive and process the visible reflected monochromatic light beam received during the time interval in each time interval, thereby avoiding unnecessary false detection caused by other color light interference. In this jump mode, the present embodiment can selectively use the simple color analysis component 20 with low structural complexity, thereby achieving the purpose of reducing the overall cost and volume of the stereo scanning device.
掃瞄鏡元件14係光學地耦合於光源組12,用來反射可見光束1211及非可見光束1221,以將可見光束1211與非可見光束1221投射至待測物體A之表面,並沿著一預定掃瞄軌跡移動以對待測物體A進行全面性的結構掃瞄。The scanning mirror element 14 is optically coupled to the light source group 12 for reflecting the visible light beam 1211 and the non-visible light beam 1221 to project the visible light beam 1211 and the non-visible light beam 1221 onto the surface of the object A to be tested, and along a predetermined The scanning track moves to perform a comprehensive structural scan of the object A to be measured.
詳言之,掃瞄鏡元件14為一微機電系統(Micro Electro Mechanical Systems, MEMS),其具有一可電驅動的反射鏡141。而該反射鏡141可沿著兩相互交錯的軸(圖未示)旋轉、擺動。當可見光束1211與非可見光束1221抵達至掃瞄鏡元件14之反射鏡141,然後被反射至待測物體A之表面上形成一可見光點P與非可見光點Q。當反射鏡141沿著兩相互交錯的軸旋轉時,形成於待測物體A之表面上的可見光點P及非可見光點Q會沿著預定掃瞄軌跡移動而對待測物體A之輪廓進行掃描。In particular, the scanning mirror element 14 is a Micro Electro Mechanical Systems (MEMS) having an electrically drivable mirror 141. The mirror 141 can be rotated and oscillated along two mutually interlaced axes (not shown). When the visible light beam 1211 and the non-visible light beam 1221 arrive at the mirror 141 of the scanning mirror element 14, and then reflected onto the surface of the object A to be measured, a visible light point P and a non-visible light point Q are formed. When the mirror 141 is rotated along two mutually interlaced axes, the visible point P and the invisible point Q formed on the surface of the object A to be measured are moved along the predetermined scanning trajectory to scan the contour of the object A to be measured.
上述的掃瞄鏡元件14、反射鏡141、及掃瞄軌跡等相關說明可至少藉由參考下列美國專利申請案而獲得:US 2011/0164223、US 2005/0280331、US 6359718及US 2009/0284622。The above description of the scanning mirror element 14, the mirror 141, and the scanning trajectory can be obtained, at least by reference to the following U.S. patent applications: US 2011/0164223, US 2005/0280331, US 6359718 and US 2009/0284622.
分光鏡組16可設置於光源組12與掃瞄鏡元件14之間。光源組12所發射之可見光束1211與非可見光束1221係透過分光鏡組16以聚光至掃瞄鏡元件14,接著掃瞄鏡元件14始可將可見光束1211與非可見光束1221同步投射至待測物體A以進行掃瞄量測。The beam splitter group 16 can be disposed between the light source group 12 and the scanning mirror element 14. The visible light beam 1211 and the non-visible light beam 1221 emitted by the light source group 12 pass through the beam splitter group 16 to condense to the scanning mirror element 14, and then the scanning mirror element 14 can simultaneously project the visible light beam 1211 and the non-visible light beam 1221 to The object A to be tested is used for scanning measurement.
值得一提的是,由於分光鏡組16可使可見光束1211與非可見光束1221行進的光路彼此平行且極為接近(或重疊),因此可見光點P及非可見光點Q兩者的移動軌跡原則上趨於一致且同步。It is worth mentioning that, since the beam splitter group 16 can make the visible light beam 1211 and the non-visible light beam 1221 travel parallel and close to each other (or overlap), the moving track of the visible light point P and the non-visible light point Q is in principle Convergence and synchronization.
換言之,配合分光鏡組16的使用可使經光路轉換後的可見光束1211及與可見光束1211極為靠近的非可見光束1221匯聚集合成一光點(亦即是可見光點P及非可見光點Q可視為一光點L)以投射至掃瞄鏡元件14。於此實施例中,分光鏡組16可包含有複數個分光鏡161a、161b、161c及161d,其中各分光鏡分別用來轉換光源組12之可見光光源121與非可見光光源122之光路,但其應用態樣不以此為限。In other words, the use of the beam splitter group 16 allows the visible light beam 1211 after the optical path conversion and the non-visible light beam 1221 closely adjacent to the visible light beam 1211 to be combined to form a light spot (that is, the visible light point P and the non-visible light point Q can be regarded as A spot L) is projected onto the scanning mirror element 14. In this embodiment, the beam splitter group 16 may include a plurality of beam splitters 161a, 161b, 161c, and 161d, wherein each of the beamsplitters is used to convert the light paths of the visible light source 121 and the non-visible light source 122 of the light source group 12, respectively. The application aspect is not limited to this.
測距元件18可為一非可見光束感測器,例如一紅外光感測器或一紫外光感測器,其係可耦合於分析單元22。測距元件18係用來接收自待測物體A之表面所反射之一非可見反射光束1222,並將感測資訊傳遞至分析單元22,以供計算測距元件18與該測物體A表面之一距離資訊。The ranging component 18 can be a non-visible beam sensor, such as an infrared light sensor or an ultraviolet light sensor, which can be coupled to the analysis unit 22. The ranging component 18 is configured to receive a non-visible reflected beam 1222 reflected from the surface of the object A to be tested, and transmit the sensing information to the analyzing unit 22 for calculating the distance measuring component 18 and the surface of the measuring object A. A distance information.
詳言之,測距元件18之一非可見光感測元件181用來接收非可見反射光束1222。測距元件18之一相位比較器182自非可見光光源122接收一第一相位訊號1223,及自非可見光感測元件181接收一第二相位訊號1224,並比照數位訊號處理方式比較兩相位訊號(例如方波時脈訊號、等間距時脈的週期性訊號)的相位差,以計算測距元件18與該測物體A表面之距離資訊。In particular, one of the ranging elements 18, the non-visible sensing element 181, is used to receive the non-visible reflected beam 1222. The phase comparator 182 of the ranging component 18 receives a first phase signal 1223 from the non-visible light source 122, and receives a second phase signal 1224 from the non-visible light sensing component 181, and compares the two phase signals according to the digital signal processing mode ( For example, the phase difference between the square wave clock signal and the periodic signal of the equally spaced clock is used to calculate the distance information between the distance measuring element 18 and the surface of the object A.
此外,由於掃瞄鏡元件14係針對垂直該距離資訊之向量的一平面,沿著該預定掃瞄輪廓投射非可見光束1221以執行回返式掃瞄,因此立體掃瞄裝置10可有效地取得待測物體A之一平面界限內之各區塊的距離資訊,從而組合出一精確的表面輪廓資訊。In addition, since the scanning mirror element 14 is directed to a plane perpendicular to the vector of the distance information, the non-visible light beam 1221 is projected along the predetermined scanning contour to perform a return scanning, so that the stereo scanning device 10 can effectively obtain The distance information of each block in the plane boundary of one of the objects A is measured, thereby combining a precise surface contour information.
顏色分析元件20可為一可見光束感測器,其係可耦合於分析單元22。顏色分析元件20用來接收自待測物體A之表面之一可見反射光束1212,並分析此可見反射光束1212之彩度值,及接收來自紅色可見雷射光源121R、綠色可見雷射光源121G與藍色可見雷射光源121B的一彩度訊號1213,其中彩度訊號1213包含可見反射光束1211之初始彩度值。換言之,顏色分析元件20依據可見反射光束1212與可見光束1211之彩度值,並通過分析單元22,以計算該待測物體A表面之一顏色資訊。Color analysis component 20 can be a visible beam sensor that can be coupled to analysis unit 22. The color analyzing component 20 is configured to receive the visible reflected light beam 1212 from one of the surfaces of the object A to be measured, and analyze the chroma value of the visible reflected light beam 1212, and receive the red visible laser light source 121R from the red visible laser light source 121R and A chroma signal 1213 of the laser source 121B is visible in blue, wherein the chroma signal 1213 includes an initial chroma value of the visible reflected beam 1211. In other words, the color analysis component 20 calculates the color information of one of the surfaces of the object A to be tested based on the chroma values of the visible reflected light beam 1212 and the visible light beam 1211 and through the analyzing unit 22.
值得留意,由於包含初始彩度值之彩度訊號1213及可見反射光束1212之彩度值可以是不以方波型態顯示的類比訊號來呈現,因此顏色分析元件20及分析單元22係以類比訊號方式進行分析處理,但不以此為限。It should be noted that since the chroma value of the chroma signal 1213 and the visible reflected beam 1212 including the initial chroma value may be represented by an analog signal that is not displayed in a square wave type, the color analysis component 20 and the analysis unit 22 are analogous. The signal method is analyzed and processed, but not limited to this.
舉例來說,當掃瞄鏡元件14沿著該預定掃瞄軌跡,投射可見光束1211至待測物體A垂直該距離資訊之向量的該平面時,分析單元22可透過顏色分析元件20接收可見反射光束1212,以計算出待測物體A於該平面界限內之各區塊的顏色資訊,並配合測距元件18所取得之該表面輪廓資訊,以建立一標示顏色的立體輪廓模型。For example, when the scanning mirror element 14 projects the visible light beam 1211 along the predetermined scanning trajectory to the plane of the vector of the distance information of the object A to be measured, the analyzing unit 22 can receive the visible reflection through the color analyzing component 20. The light beam 1212 is used to calculate the color information of each block in the plane of the object A to be measured, and cooperate with the surface contour information obtained by the distance measuring component 18 to establish a stereoscopic contour model of the color.
為確保測距元件18及顏色分析元件20可獲得絕佳感測能力,立體掃瞄裝置10另可選擇性包含有一聚光透鏡19,設置於測距元件18與顏色分析元件20之接收光束端之前。聚光透鏡19可為一凸透鏡,用來協助非可見反射光束1222與可見反射光束1212集中聚焦以分別投射至測距元件18與顏色分析元件20。To ensure that the ranging component 18 and the color analysis component 20 can obtain excellent sensing capability, the stereo scanning device 10 can optionally include a collecting lens 19 disposed at the receiving beam end of the ranging component 18 and the color analyzing component 20. prior to. The concentrating lens 19 can be a convex lens for assisting in focusing the non-visible reflected beam 1222 and the visible reflected beam 1212 to be projected to the ranging element 18 and the color analysis element 20, respectively.
除此之外,立體掃瞄裝置10可另包含有一旋轉平台13,用以承載並轉動待測物體A。立體掃瞄裝置10僅能掃瞄待測物體A面對掃瞄鏡元件14、測距元件18及一顏色分析元件20之該側面的立體輪廓資訊,故隨著旋轉平台13之轉動,掃瞄鏡元件14始可將可見光束1211及非可見光束1221投射至待測物體A之不同表面,藉此取得待測物體A於各個不同角度的表面輪廓資訊,並將其統合接續而建立待測物體A完整的立體輪廓模型。In addition, the stereo scanning device 10 may further include a rotating platform 13 for carrying and rotating the object A to be tested. The stereo scanning device 10 can only scan the stereoscopic contour information of the object A to face the scanning mirror element 14, the distance measuring component 18 and the color analysis component 20, so that the scan is rotated with the rotation of the rotating platform 13. The mirror element 14 can project the visible light beam 1211 and the non-visible light beam 1221 to different surfaces of the object A to be measured, thereby obtaining surface contour information of the object A to be measured at different angles, and integrating the same to establish an object to be tested. A complete three-dimensional contour model.
值得一提的是,旋轉平台13係為選擇性之元件配置。請參閱第3圖,第3圖為本發明之另一實施例之立體掃瞄裝置10之使用說明圖。使用者可利用複數個不具有旋轉平台的立體掃瞄裝置10,將其分別環繞設置於待測物體A的各個角度上。複數個立體掃瞄裝置10各自建立於其視角的待測物體A之表面輪廓資訊,最後再將複數個表面輪廓資訊依序接合,亦可建立待測物體A完整的立體輪廓模型。It is worth mentioning that the rotating platform 13 is an optional component configuration. Please refer to FIG. 3, which is a diagram for explaining the use of the stereo scanning device 10 according to another embodiment of the present invention. The user can use a plurality of stereo scanning devices 10 that do not have a rotating platform to surround them at respective angles of the object A to be tested. The plurality of stereo scanning devices 10 are each established on the surface contour information of the object A to be measured at the viewing angle thereof, and finally the plurality of surface contour information are sequentially joined, and a complete stereoscopic contour model of the object A to be measured can also be established.
更進一步,測距元件18或顏色分析元件20另可進一步配合分析出非可見反射光束1222及可見反射光束1212的光譜資訊,以取得待測物體A的表面材質資訊。其應用及操作原理如前所述,故於此不再詳述。Further, the ranging component 18 or the color analysis component 20 can further cooperate to analyze the spectral information of the non-visible reflected beam 1222 and the visible reflected beam 1212 to obtain surface material information of the object A to be tested. The application and operation principle are as described above, so it will not be described in detail here.
請參閱第4圖,第4圖為本發明之實施例之立體掃瞄方法之流程圖。該方法包含有:Please refer to FIG. 4, which is a flow chart of a stereo scanning method according to an embodiment of the present invention. The method includes:
步驟400:光源組12發射可見光束1211及非可見光束1221。Step 400: The light source group 12 emits a visible light beam 1211 and a non-visible light beam 1221.
步驟402:分光鏡組16將可見光束1211及非可見光束1221聚合成一光點L以投射至掃瞄鏡元件14。Step 402: The beam splitter group 16 aggregates the visible light beam 1211 and the non-visible light beam 1221 into a light spot L for projection onto the scanning mirror element 14.
步驟404:掃瞄鏡元件14沿著該預定掃瞄軌跡將可見光束1211及非可見光束1221所形成之光點L投射至待測物體A之表面。Step 404: The scanning mirror element 14 projects the visible light beam 1211 and the light spot L formed by the non-visible light beam 1221 along the predetermined scanning track to the surface of the object A to be tested.
步驟406:測距元件18接收自待測物體A之表面所反射的非可見反射光束1222。Step 406: The ranging component 18 receives the non-visible reflected beam 1222 reflected from the surface of the object A to be tested.
步驟408:分析單元22依據測距元件18所接收之數據,計算出對應待測物體A之表面的距離資訊。Step 408: The analyzing unit 22 calculates the distance information corresponding to the surface of the object A to be tested according to the data received by the ranging component 18.
步驟410:分析單元22依據待測物體A之複數組距離資訊,取得待測物體A之表面輪廓資訊。Step 410: The analyzing unit 22 obtains the surface contour information of the object A to be tested according to the complex array distance information of the object A to be measured.
步驟412:顏色分析元件20接收自待測物體A之表面所反射的可見反射光束1212。Step 412: The color analysis component 20 receives the visible reflected light beam 1212 reflected from the surface of the object A to be tested.
步驟414:分析單元22依據顏色分析元件20所接收之數據,計算出對應待測物體A之表面的顏色資訊。Step 414: The analyzing unit 22 calculates color information corresponding to the surface of the object A to be tested according to the data received by the color analyzing component 20.
步驟416:利用旋轉平台13轉動待測物體A,以使掃瞄鏡元件14可將可見光束1211及非可見光束1221投射至待測物體A的不同表面。Step 416: Rotate the object A to be measured by the rotating platform 13 so that the scanning mirror element 14 can project the visible beam 1211 and the non-visible beam 1221 onto different surfaces of the object A to be tested.
步驟418:分析單元22組合待測物體A之距離資訊、表面輪廓資訊及顏色資訊,建立對應於待測物體A之立體輪廓模型。Step 418: The analyzing unit 22 combines the distance information, the surface contour information and the color information of the object A to be measured, and establishes a three-dimensional contour model corresponding to the object A to be tested.
步驟420:結束。Step 420: End.
於此對上述步驟進行詳細說明。立體掃瞄裝置10透過掃瞄鏡元件14與分光鏡組16,將光源組12所發射之可見光束1211及非可見光束1221聚合成光點L以投射至待測物體A之表面。接著掃瞄鏡元件14可沿著該預定掃瞄軌跡移動,例如沿著S型曲線,以使該光點L可依序且逐步地投射至待測物體A之表面的各個區塊。The above steps will be described in detail herein. The stereo scanning device 10 transmits the visible light beam 1211 and the non-visible light beam 1221 emitted by the light source group 12 into a light spot L through the scanning mirror element 14 and the beam splitting mirror group 16 to be projected onto the surface of the object A to be tested. The scanning mirror element 14 can then be moved along the predetermined scanning trajectory, for example along an S-shaped curve, such that the spot L can be projected sequentially and stepwise onto the respective blocks of the surface of the object A to be tested.
當該光點L投射至待測物體A之表面時,測距元件18與顏色分析元件20可分別接收來自待測物體A的非可見反射光束1222及可見反射光束1212,並透過分析單元22以計算出待測物體A之距離資訊、表面輪廓資訊與顏色資訊。When the spot L is projected onto the surface of the object A to be measured, the ranging component 18 and the color analyzing component 20 can respectively receive the non-visible reflected beam 1222 and the visible reflected beam 1212 from the object A to be measured, and pass through the analyzing unit 22 to Calculate the distance information, surface contour information and color information of the object A to be tested.
詳細來說,投射至待測物體A之非可見光束1221、及自待測物體A表面所反射之非可見反射光束1222之間具有相位差,分析單元可透過測距元件18偵測所得之相位變化量計算光束往返的延遲量,藉此得出掃瞄鏡元件14、待測物體A與測距元件18之間的距離資訊關係,並可進一步沿著該預定掃瞄路徑取得待測物體A的表面輪廓資訊。In detail, the non-visible light beam 1221 projected onto the object A to be measured and the non-visible reflected light beam 1222 reflected from the surface of the object A to be tested have a phase difference, and the analyzing unit can detect the phase obtained through the ranging component 18. The amount of change calculates the amount of delay of the round trip of the beam, thereby obtaining the distance information relationship between the mirror element 14, the object A to be measured and the distance measuring element 18, and further obtaining the object A to be tested along the predetermined scanning path. Surface contour information.
此外,可見光束1211可為混雜複數種顏色光束的白光光束。當該白光光束投射至待測物體A時,相應於待測物體A表面之該區塊顏色的光束會被吸收,因此顏色分析元件20可用來分析可見反射光束1212相較可見光束1211缺乏何種顏色之光束,意即缺乏何種波段的的光線,即可有效判斷待測物體A之該區塊的顏色資訊,進而搭配測距元件18所取得之表面輪廓資訊,建立待測物體A完整的立體輪廓模型。In addition, the visible beam 1211 can be a white light beam that is interspersed with a plurality of color beams. When the white light beam is projected onto the object A to be measured, the light beam corresponding to the color of the block of the surface of the object A to be measured is absorbed, so the color analyzing element 20 can be used to analyze what the visible reflected light beam 1212 lacks compared to the visible light beam 1211. The color beam, which means that the light of the band is lacking, can effectively judge the color information of the block of the object A to be measured, and then match the surface contour information obtained by the distance measuring component 18 to establish the complete object A to be tested. Stereo contour model.
請參閱第5圖,第5圖為本發明之另一實施例之立體掃瞄方法之流程圖。該方法包含有:Please refer to FIG. 5. FIG. 5 is a flow chart of a stereo scanning method according to another embodiment of the present invention. The method includes:
步驟500:光源組12發射可見光束1211及非可見光束1221。Step 500: The light source group 12 emits a visible light beam 1211 and a non-visible light beam 1221.
步驟502:分光鏡組16將可見光束1211及非可見光束1221聚合成一光點L以投射至掃瞄鏡元件14。Step 502: The beam splitter group 16 aggregates the visible light beam 1211 and the non-visible light beam 1221 into a light spot L for projection onto the scanning mirror element 14.
步驟504:掃瞄鏡元件14沿著該預定掃瞄軌跡將可見光束1211及非可見光束1221所形成之光點L投射至待測物體A之表面。Step 504: The scanning mirror element 14 projects the visible light beam 1211 and the light spot L formed by the non-visible light beam 1221 along the predetermined scanning track to the surface of the object A to be tested.
步驟506:測距元件18接收自待測物體A之表面所反射的非可見反射光束1222。Step 506: The ranging component 18 receives the non-visible reflected light beam 1222 reflected from the surface of the object A to be tested.
步驟508:分析單元22依據測距元件18所接收之數據,計算出對應待測物體A之表面的距離資訊。Step 508: The analyzing unit 22 calculates the distance information corresponding to the surface of the object A to be tested according to the data received by the ranging component 18.
步驟510:分析單元22依據待測物體A之複數組距離資訊,取得待測物體A之表面輪廓資訊。Step 510: The analyzing unit 22 obtains the surface contour information of the object A to be tested according to the complex array distance information of the object A to be measured.
步驟512:顏色分析元件20接收自待測物體A之表面所反射的可見反射光束1212。Step 512: The color analysis component 20 receives the visible reflected light beam 1212 reflected from the surface of the object A to be tested.
步驟514:分析單元22依據顏色分析元件20所接收之數據,計算出對應待測物體A之表面的顏色資訊。Step 514: The analyzing unit 22 calculates the color information corresponding to the surface of the object A to be tested according to the data received by the color analyzing component 20.
步驟516:掃瞄鏡元件14從至少二不同之位置,將可見光束1211及非可見光束1221投射至待測物體A的不同表面。Step 516: The scanning mirror element 14 projects the visible light beam 1211 and the non-visible light beam 1221 from different positions on the different surfaces of the object A to be tested from at least two different positions.
步驟518:分析單元22組合待測物體A之距離資訊、表面輪廓資訊及顏色資訊,建立對應於待測物體A之立體輪廓模型。Step 518: The analyzing unit 22 combines the distance information, the surface contour information and the color information of the object A to be measured, and establishes a three-dimensional contour model corresponding to the object A to be tested.
步驟520:結束。Step 520: End.
此實施例相對前述實施例之差異在於,本實施例之立體掃瞄裝置10可從至少二不同的位置,掃瞄待測物體A以取得不同視角的表面輪廓資訊,接著再藉由拼裝來自不同視角的表面輪廓資訊,以組成待測物體A之立體輪廓模型。The difference between the embodiment and the foregoing embodiment is that the stereo scanning device 10 of the embodiment can scan the object A to be tested from at least two different positions to obtain surface contour information of different viewing angles, and then assemble from different regions. The surface contour information of the viewing angle to form a three-dimensional contour model of the object A to be measured.
舉例來說,使用者可設置複數個立體掃瞄裝置10於待測物體A之四周的不同視角位置,各立體掃瞄裝置10執行距離資訊、表面輪廓資訊及顏色資訊的計算與分析方式如前述實施例所述,故於此不再說明。本實施例之特色在於,各立體掃瞄裝置10各自取得待測物體A於不同視角的表面輪廓資訊,而後再組合該些表面輪廓資訊以建立完整的立體輪廓模型。For example, the user can set a plurality of stereo scanning devices 10 at different viewing angles of the object A to be tested, and the stereo scanning device 10 performs distance information, surface contour information, and color information calculation and analysis methods as described above. It is described in the embodiment, so it will not be described here. The feature of the embodiment is that each of the stereo scanning devices 10 obtains surface contour information of the object A to be measured at different viewing angles, and then combines the surface contour information to establish a complete three-dimensional contour model.
以上為本發明較佳實施例的立體掃瞄裝置、及應用於立體掃瞄裝置之立體掃瞄方法的流程說明。本發明具有下列優點:The above is a flow description of a stereo scanning device and a stereo scanning method applied to the stereo scanning device according to a preferred embodiment of the present invention. The invention has the following advantages:
- 本發明提供一物件掃瞄技術與立體模型成像技術,此等技術可以同時對待測物體的顏色及外型尺寸進行量測,並可進一步包含對待測物體之外觀色彩資訊與組成材質資訊等細部資訊的量測技術。The invention provides an object scanning technology and a three-dimensional model imaging technology, wherein the technology can simultaneously measure the color and shape of the object to be measured, and further includes detailed information such as appearance color information and composition material information of the object to be measured. Measurement technology.
- 本發明提供即時的立體模型成像技術,此立體模型成像技術可提供待測物體之尺寸及相關位置的檢驗,以快速地得到精確的立體輪廓模型。The invention provides an instant three-dimensional model imaging technology, which can provide an inspection of the size and related position of the object to be tested, so as to quickly obtain an accurate three-dimensional contour model.
- 本發明之立體掃瞄裝置具有體積輕巧、量測時間快速及攜帶方便等優點,可彈性地運用於各種型態之待測物之立體輪廓模型建立上。The three-dimensional scanning device of the invention has the advantages of light volume, fast measuring time and convenient carrying, and can be elastically applied to the establishment of a three-dimensional contour model of various types of objects to be tested.
上述之實施例僅用來例舉本發明之實施態樣,以及闡釋本發明之技術特徵,並非用來限制本發明之保護範疇。任何熟悉此技術者可輕易完成之改變或均等性之安排均屬於本發明所主張之範圍,本發明之權利保護範圍應以申請專利範圍為準。The embodiments described above are only intended to illustrate the embodiments of the present invention, and to explain the technical features of the present invention, and are not intended to limit the scope of protection of the present invention. Any changes or equivalents that can be easily made by those skilled in the art are within the scope of the invention. The scope of the invention should be determined by the scope of the claims.
10...立體掃瞄裝置10. . . Stereo scanning device
12...光源組12. . . Light source group
121...可見光光源121. . . Visible light source
121B...藍色可見雷射光源121B. . . Blue visible laser source
121G...綠色可見雷射光源121G. . . Green visible laser source
121R...紅色可見雷射光源121R. . . Red visible laser source
1211...可見光束1211. . . Visible beam
1211B...藍色可見雷射光束1211B. . . Blue visible laser beam
1211G...綠色可見雷射光束1211G. . . Green visible laser beam
1211R...紅色可見雷射光束1211R. . . Red visible laser beam
1212...可見反射光束1212. . . Visible reflected beam
1213...彩度訊號1213. . . Chroma signal
122...非可見光光源122. . . Non-visible light source
1221...非可見光束1221. . . Non-visible beam
1222...非可見反射光束1222. . . Non-visible reflected beam
1223...第一相位訊號1223. . . First phase signal
1224...第二相位訊號1224. . . Second phase signal
13...旋轉平台13. . . Rotating platform
14...掃瞄鏡元件14. . . Scanning mirror element
141...反射鏡141. . . Reflector
16...分光鏡組16. . . Beam splitter
161a、161b、161c、161d...分光鏡161a, 161b, 161c, 161d. . . Beam splitter
18...測距元件18. . . Ranging component
181...非可見光感測元件181. . . Non-visible light sensing element
182...相位比較元件182. . . Phase comparison component
19...聚光透鏡19. . . Condenser lens
20...顏色分析元件20. . . Color analysis component
22...分析單元twenty two. . . Analysis unit
A...待測物體A. . . Object to be tested
L...光點L. . . light spot
P...可見光點P. . . Visible light point
Q...非可見光點Q. . . Non-visible point
400~420、500~520...步驟400~420, 500~520. . . step
第1圖為本發明之實施例之立體掃瞄裝置之功能方塊示意圖;1 is a functional block diagram of a stereo scanning device according to an embodiment of the present invention;
第2圖為本發明之實施例之立體掃瞄裝置之部份光路示意圖;2 is a schematic view showing a part of an optical path of a stereo scanning device according to an embodiment of the present invention;
第3圖為本發明之另一實施例之立體掃瞄裝置之使用說明圖;3 is an explanatory view of the use of a stereo scanning device according to another embodiment of the present invention;
第4圖為本發明之實施例之立體掃瞄方法之流程圖;以及4 is a flow chart of a stereo scanning method according to an embodiment of the present invention;
第5圖為本發明之另一實施例之立體掃瞄方法之流程圖。FIG. 5 is a flow chart of a stereo scanning method according to another embodiment of the present invention.
10...立體掃瞄裝置10. . . Stereo scanning device
12...光源組12. . . Light source group
121...可見光光源121. . . Visible light source
1211...可見光束1211. . . Visible beam
1212...可見反射光束1212. . . Visible reflected beam
122...非可見光光源122. . . Non-visible light source
1221...非可見光束1221. . . Non-visible beam
1222...非可見反射光束1222. . . Non-visible reflected beam
1223...第一相位訊號1223. . . First phase signal
13...旋轉平台13. . . Rotating platform
14...掃瞄鏡元件14. . . Scanning mirror element
16...分光鏡組16. . . Beam splitter
18...測距元件18. . . Ranging component
19...聚光透鏡19. . . Condenser lens
20...顏色分析元件20. . . Color analysis component
22...分析單元twenty two. . . Analysis unit
A...待測物體A. . . Object to be tested
L...光點L. . . light spot
P...可見光點P. . . Visible light point
Q...非可見光點Q. . . Non-visible point
Claims (14)
一光源組,用以發射一可見光束及一非可見光束;
一掃描鏡元件,光學地(optically)耦合該光源組,該掃描鏡元件用來反射該可見光束及該非可見光束,以使該可見光束及該非可見光束投射至一待測物體之表面並沿著一預定掃瞄軌跡移動;
一測距元件,用以接收自該待測物體之表面所反射之一非可見反射光束;以及
一顏色分析元件,用以接收自該待測物體之表面所反射之一可見反射光束。A stereo scanning device comprising:
a light source group for emitting a visible light beam and a non-visible light beam;
a scanning mirror element optically coupling the light source group, the scanning mirror element for reflecting the visible light beam and the non-visible light beam to project the visible light beam and the non-visible light beam onto a surface of an object to be tested and along a predetermined scan trajectory movement;
a ranging component for receiving a non-visible reflected beam reflected from a surface of the object to be tested; and a color analyzing component for receiving a visible reflected beam reflected from a surface of the object to be tested.
一分光鏡組,該光源組所發射之該可見光束及該非可見光束經由該分光鏡組聚光於該掃描鏡元件,以進行投射至該待測物體。The stereo scanning device according to claim 1, further comprising:
A beam splitter group, the visible light beam emitted by the light source group and the non-visible light beam are collected by the beam splitter group on the scanning mirror element for projection to the object to be tested.
一旋轉平台,用以承載並轉動該待測物體,該掃描鏡元件隨著該旋轉平台之轉動,而將該可見光束及該非可見光束投射至該待測物體之不同表面。The stereo scanning device according to claim 1, further comprising:
a rotating platform for carrying and rotating the object to be tested, the scanning mirror element projecting the visible light beam and the non-visible light beam to different surfaces of the object to be tested as the rotating platform rotates.
發射一可見光束及一非可見光束;
沿著一預定掃瞄軌跡將該可見光束及該非可見光束投射至一待測物體之表面;
接收自該待測物體之表面所反射之一非可見反射光束;
計算對應該待測物體表面之ㄧ距離資訊;
接收自該待測物體之表面所反射之一可見反射光束;以及
計算該待測物體表面之ㄧ顏色資訊。A stereo scanning method comprising the steps of:
Transmitting a visible beam and a non-visible beam;
Projecting the visible light beam and the non-visible light beam onto a surface of an object to be tested along a predetermined scanning track;
Receiving a non-visible reflected light beam reflected from a surface of the object to be tested;
Calculate the distance information corresponding to the surface of the object to be tested;
Receiving a visible reflected beam reflected from a surface of the object to be tested; and calculating a color information of the surface of the object to be tested.
將該可見光束及該非可見光束聚合成一光點後,將該光點沿著該預定掃瞄軌跡投射至該待測物體之表面。The method of claim 9, further comprising the steps of:
After the visible light beam and the non-visible light beam are aggregated into a light spot, the light spot is projected along the predetermined scanning track to the surface of the object to be tested.
沿著該預定掃瞄軌跡投射該非可見光束,以取得該待測物體之表面輪廓資訊。The method of claim 9, further comprising the steps of:
The non-visible light beam is projected along the predetermined scanning trajectory to obtain surface contour information of the object to be tested.
旋轉該待測物體,並將該可見光束及該非可見光束投射至該待測物體之不同表面。The method of claim 9, further comprising the steps of:
Rotating the object to be tested and projecting the visible beam and the non-visible beam onto different surfaces of the object to be tested.
從至少二不同之位置,將該可見光束及該非可見光束投射至該待測物體之不同表面。The method of claim 9, further comprising the steps of:
The visible light beam and the non-visible light beam are projected onto different surfaces of the object to be tested from at least two different positions.
依據該非可見反射光束與該非可見光束之相位差,以計算該待測物體表面之該距離資訊。The method of claim 9, wherein calculating the distance information corresponding to the surface of the object to be tested comprises:
And determining the distance information of the surface of the object to be tested according to a phase difference between the non-visible reflected beam and the non-visible beam.
依據該可見反射光束與該可見光束之彩度值,以計算該待測物體表面之該顏色資訊。The method of claim 9, wherein calculating the color information of the surface of the object to be tested comprises:
And determining the color information of the surface of the object to be tested according to the chroma value of the visible reflected beam and the visible beam.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW101100891A TW201329509A (en) | 2012-01-10 | 2012-01-10 | 3D scan device and 3D scan method thereof |
| CN2012101043151A CN103196385A (en) | 2012-01-10 | 2012-04-11 | Stereoscopic Scanning Device and Stereoscopic Scanning Method |
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| TW101100891A TW201329509A (en) | 2012-01-10 | 2012-01-10 | 3D scan device and 3D scan method thereof |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI616842B (en) * | 2015-07-31 | 2018-03-01 | 惠普發展公司有限責任合夥企業 | Turntable peripheral for 3D scanning |
| TWI710798B (en) * | 2016-01-29 | 2020-11-21 | 學校法人明治大學 | Laser scanning system atteched on moving object, laser scanning method for laser scanner atteched on moving object, and laser scanning program |
| TWI748282B (en) * | 2019-11-13 | 2021-12-01 | 陳彥宏 | Scanning device |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104424662B (en) * | 2013-08-23 | 2017-07-28 | 三纬国际立体列印科技股份有限公司 | Stereo scanning device |
| CN105333837A (en) * | 2015-10-21 | 2016-02-17 | 上海集成电路研发中心有限公司 | Three dimension scanning device |
| KR102543275B1 (en) | 2016-12-07 | 2023-06-16 | 매직 아이 인코포레이티드 | Distance sensor projecting parallel patterns |
| KR20200054324A (en) | 2017-10-08 | 2020-05-19 | 매직 아이 인코포레이티드 | Calibration of sensor systems including multiple mobile sensors |
| US11199397B2 (en) | 2017-10-08 | 2021-12-14 | Magik Eye Inc. | Distance measurement using a longitudinal grid pattern |
| JP2021518535A (en) | 2018-03-20 | 2021-08-02 | マジック アイ インコーポレイテッド | Distance measurement using projection patterns of various densities |
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| US11474245B2 (en) | 2018-06-06 | 2022-10-18 | Magik Eye Inc. | Distance measurement using high density projection patterns |
| US11475584B2 (en) | 2018-08-07 | 2022-10-18 | Magik Eye Inc. | Baffles for three-dimensional sensors having spherical fields of view |
| CN113272624B (en) * | 2019-01-20 | 2024-11-26 | 魔眼公司 | Three-dimensional sensor including a bandpass filter having multiple passbands |
| US11474209B2 (en) | 2019-03-25 | 2022-10-18 | Magik Eye Inc. | Distance measurement using high density projection patterns |
| US11019249B2 (en) | 2019-05-12 | 2021-05-25 | Magik Eye Inc. | Mapping three-dimensional depth map data onto two-dimensional images |
| WO2021113135A1 (en) | 2019-12-01 | 2021-06-10 | Magik Eye Inc. | Enhancing triangulation-based three-dimensional distance measurements with time of flight information |
| US11580662B2 (en) | 2019-12-29 | 2023-02-14 | Magik Eye Inc. | Associating three-dimensional coordinates with two-dimensional feature points |
| JP7699132B2 (en) | 2020-01-05 | 2025-06-26 | マジック アイ インコーポレイテッド | A method for moving the coordinate system of a 3D camera to the incident position of a 2D camera |
| CN117492027B (en) * | 2024-01-03 | 2024-03-15 | 成都量芯集成科技有限公司 | A laser scanning identification device and method thereof |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6507036B1 (en) * | 1999-06-01 | 2003-01-14 | National Research Council Of Canada | Three dimensional optical scanning |
| US7253832B2 (en) * | 2001-08-13 | 2007-08-07 | Olympus Corporation | Shape extraction system and 3-D (three dimension) information acquisition system using the same |
| US7787134B2 (en) * | 2005-11-09 | 2010-08-31 | The Boeing Company | Multiple fanned laser beam metrology system |
| WO2007067163A1 (en) * | 2005-11-23 | 2007-06-14 | University Of Washington | Scanning beam with variable sequential framing using interrupted scanning resonance |
| CN101377610A (en) * | 2007-08-30 | 2009-03-04 | 鸿富锦精密工业(深圳)有限公司 | Projecting system and portable electronic apparatus using the same |
| CN101592477B (en) * | 2009-06-30 | 2011-07-20 | 长春理工大学 | Right-angled reflection type three-dimensional laser scanner and method for realizing three-dimensional imaging by using same |
| CN201562075U (en) * | 2009-11-18 | 2010-08-25 | 九江精密测试技术研究所 | Portable there-dimensional laser scanning device |
-
2012
- 2012-01-10 TW TW101100891A patent/TW201329509A/en unknown
- 2012-04-11 CN CN2012101043151A patent/CN103196385A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI616842B (en) * | 2015-07-31 | 2018-03-01 | 惠普發展公司有限責任合夥企業 | Turntable peripheral for 3D scanning |
| US10852396B2 (en) | 2015-07-31 | 2020-12-01 | Hewlett-Packard Development Company, L.P. | Turntable peripheral for 3D scanning |
| TWI710798B (en) * | 2016-01-29 | 2020-11-21 | 學校法人明治大學 | Laser scanning system atteched on moving object, laser scanning method for laser scanner atteched on moving object, and laser scanning program |
| US11187790B2 (en) | 2016-01-29 | 2021-11-30 | Meiji University | Laser scanning system, laser scanning method, movable laser scanning system, and program |
| TWI748282B (en) * | 2019-11-13 | 2021-12-01 | 陳彥宏 | Scanning device |
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