TW201614238A - Plunger, contact probe, socket, and plunger manufacturing method - Google Patents

Plunger, contact probe, socket, and plunger manufacturing method

Info

Publication number
TW201614238A
TW201614238A TW104127431A TW104127431A TW201614238A TW 201614238 A TW201614238 A TW 201614238A TW 104127431 A TW104127431 A TW 104127431A TW 104127431 A TW104127431 A TW 104127431A TW 201614238 A TW201614238 A TW 201614238A
Authority
TW
Taiwan
Prior art keywords
plunger
contact
contact probe
socket
manufacturing
Prior art date
Application number
TW104127431A
Other languages
Chinese (zh)
Other versions
TWI646331B (en
Inventor
Masaaki Nakayama
Tsugio Yamamoto
Original Assignee
Yokowo Seisakusho Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokowo Seisakusho Kk filed Critical Yokowo Seisakusho Kk
Publication of TW201614238A publication Critical patent/TW201614238A/en
Application granted granted Critical
Publication of TWI646331B publication Critical patent/TWI646331B/en

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

This invention aims to shorten the processing time for plunger of contact probe, increase production beat and so as to realize cost reduction. A contact probe 10 has a tubular first plunger 20 made by punching, a second plunger 30, a spring 40 arranged in the first plunger 20, and a cover 50. The first plunger 20 has a cylindrical part 21, a shoulder part 22 arranged at the opening of one side of the cylindrical part 21 to seal the periphery of the opening, and a contact part 23 vertically extended from the inner edge of the shoulder part 22 and in contact with an object at one side. The contact part 23 is formed by bending the notch of a bottom cylindrical shape.
TW104127431A 2014-08-29 2015-08-24 Plunger, contact probe, socket and plunger manufacturing method TWI646331B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014175657A JP6395297B2 (en) 2014-08-29 2014-08-29 Plunger, contact probe, socket and method for manufacturing plunger
JP2014-175657 2014-08-29

Publications (2)

Publication Number Publication Date
TW201614238A true TW201614238A (en) 2016-04-16
TWI646331B TWI646331B (en) 2019-01-01

Family

ID=55658440

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104127431A TWI646331B (en) 2014-08-29 2015-08-24 Plunger, contact probe, socket and plunger manufacturing method

Country Status (2)

Country Link
JP (1) JP6395297B2 (en)
TW (1) TWI646331B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI735583B (en) * 2016-06-28 2021-08-11 美商英特爾公司 Multiple contact probe, multiple pole bias-able probe, electronic system and method of constructing multiple contact probe
TWI747536B (en) * 2019-10-04 2021-11-21 日商村田製作所股份有限公司 Probe

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62158364U (en) * 1986-03-31 1987-10-07
US5667410A (en) * 1995-11-21 1997-09-16 Everett Charles Technologies, Inc. One-piece compliant probe
JP4857046B2 (en) * 2006-08-02 2012-01-18 株式会社エンプラス Electrical contact and socket for electrical parts
JP4857047B2 (en) * 2006-08-03 2012-01-18 株式会社エンプラス Electrical contact, method for forming first contact member of electrical contact, and socket for electrical component
KR101149760B1 (en) * 2009-07-03 2012-06-01 리노공업주식회사 a probe
JP6013731B2 (en) * 2011-12-27 2016-10-25 株式会社エンプラス Contact probe and manufacturing method thereof
JP2013205191A (en) * 2012-03-28 2013-10-07 Nidai Seiko:Kk Spring probe and manufacturing method of spring probe

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI735583B (en) * 2016-06-28 2021-08-11 美商英特爾公司 Multiple contact probe, multiple pole bias-able probe, electronic system and method of constructing multiple contact probe
TWI747536B (en) * 2019-10-04 2021-11-21 日商村田製作所股份有限公司 Probe

Also Published As

Publication number Publication date
JP6395297B2 (en) 2018-09-26
JP2016050828A (en) 2016-04-11
TWI646331B (en) 2019-01-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees