Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP32464596Aexternal-prioritypatent/JP3645379B2/en
Application filed by Handotai Enetgy Kenkyusho KkfiledCriticalHandotai Enetgy Kenkyusho Kk
Application grantedgrantedCritical
Publication of TW326547BpublicationCriticalpatent/TW326547B/en
A semiconductor device, which is fabricated to a thin film transistor on active polysilicon layer with insulation substrates, has the features as follows: 1) polysilicon containing continuous crystallization structure in desired orientation, and its crystallization grain boundary in previous desired orientation; 2) in thin film transistor, the connection direction of source and drain regions having the same direction as previous desired orientation; 3) impurity segregating along previous grain boundary.
TW085116291A1996-02-201996-12-30Semiconductor device and its manufacturing method
TW326547B
(en)