TW344792B - Method for automatically measuring the amount of photo-coupling - Google Patents

Method for automatically measuring the amount of photo-coupling

Info

Publication number
TW344792B
TW344792B TW085113591A TW85113591A TW344792B TW 344792 B TW344792 B TW 344792B TW 085113591 A TW085113591 A TW 085113591A TW 85113591 A TW85113591 A TW 85113591A TW 344792 B TW344792 B TW 344792B
Authority
TW
Taiwan
Prior art keywords
photo
coupling
coupling element
matching
data
Prior art date
Application number
TW085113591A
Other languages
Chinese (zh)
Inventor
Jyi-Wanq Tzeng
Shin-Rong Juang
Original Assignee
Jyi-Wanq Tzeng
Shin-Rong Juang
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jyi-Wanq Tzeng, Shin-Rong Juang filed Critical Jyi-Wanq Tzeng
Priority to TW085113591A priority Critical patent/TW344792B/en
Application granted granted Critical
Publication of TW344792B publication Critical patent/TW344792B/en

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Semiconductor Lasers (AREA)

Abstract

A method for automatically measuring the amount of photo-coupling, which comprises the following steps: (1) positioning a photo-coupling element on a jig; (2) using a program stored in a photo detection instrument to detect whether the photo-coupling element is positioned correctly; (3) continuing the detection if it is not being positioned correctly on the jig; if it has been positioned, separately flowing a plurality of sets of current through the light emitting elements of the photo-coupling element, and storing the data of the generated photo-coupling; (4) analyzing for which current is most suitable for the photo coupling element thereby matching it with a control element of an application device; (5) if the optimum data have been obtained, displaying the data with the photo detection instrument; if the optimum data have not been obtained, displaying an information indicating that the quality of the photo-coupling element is not good; (6) resetting it; (7) removing the photo-coupling element; (8) next, returning to the step (1); thereby, detecting the characteristics of a photo-coupling element prior to assembly, and measuring a suitable impedance of the resistance matching the light emitting element, so that the impedance of the resistance can match with the photo-coupling signal generated by the photo-coupling element thereby matching with the control element of the application device.
TW085113591A 1996-11-06 1996-11-06 Method for automatically measuring the amount of photo-coupling TW344792B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW085113591A TW344792B (en) 1996-11-06 1996-11-06 Method for automatically measuring the amount of photo-coupling

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW085113591A TW344792B (en) 1996-11-06 1996-11-06 Method for automatically measuring the amount of photo-coupling

Publications (1)

Publication Number Publication Date
TW344792B true TW344792B (en) 1998-11-11

Family

ID=58263760

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085113591A TW344792B (en) 1996-11-06 1996-11-06 Method for automatically measuring the amount of photo-coupling

Country Status (1)

Country Link
TW (1) TW344792B (en)

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