TW359748B - Device for inspecting liquid crystal display panel, method of inspecting liquid crystal display panel and method of manufacturing liquid crystal display panel - Google Patents

Device for inspecting liquid crystal display panel, method of inspecting liquid crystal display panel and method of manufacturing liquid crystal display panel

Info

Publication number
TW359748B
TW359748B TW086112603A TW86112603A TW359748B TW 359748 B TW359748 B TW 359748B TW 086112603 A TW086112603 A TW 086112603A TW 86112603 A TW86112603 A TW 86112603A TW 359748 B TW359748 B TW 359748B
Authority
TW
Taiwan
Prior art keywords
liquid crystal
crystal display
display panel
bonded
inspecting
Prior art date
Application number
TW086112603A
Other languages
Chinese (zh)
Inventor
Kozo Gyoda
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Application granted granted Critical
Publication of TW359748B publication Critical patent/TW359748B/en

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

A novel structure of a device for inspecting liquid crystal display panels. A liquid crystal display panel is almost completely inspected using the device before an IC chip is mounted and, further, wiring patterns on external terminals can be inspected simultaneously. An air supply inlet (40a) and a wide opening part (40b) are provided in the edge part of a holding plate (40), and an elastic sheet (42) is attached so as to close the wide opening part (40b). An IC chip (A) is bonded and fixed to the outer surface of the elastic sheet (42). A flexible circuit board (43) is bonded and fixed to the lower surface of the holding plate (40), and wiring patterns (43a) are provided on the flexible circuit board (43). Connection terminal parts (43b) are provided on the edge parts of the wiring patterns (43a) to which one ends of conductive wires (44) are bonded. The other ends of the conductive wires (44) are bonded to contact terminals (45). The connection terminal parts (43b) and the conductive wires (44) are encapsulated in a molding body (46).
TW086112603A 1996-09-02 1997-09-02 Device for inspecting liquid crystal display panel, method of inspecting liquid crystal display panel and method of manufacturing liquid crystal display panel TW359748B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23233596A JP3624570B2 (en) 1996-09-02 1996-09-02 Liquid crystal display panel inspection apparatus, liquid crystal display panel inspection method, and integrated circuit mounting method

Publications (1)

Publication Number Publication Date
TW359748B true TW359748B (en) 1999-06-01

Family

ID=16937594

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086112603A TW359748B (en) 1996-09-02 1997-09-02 Device for inspecting liquid crystal display panel, method of inspecting liquid crystal display panel and method of manufacturing liquid crystal display panel

Country Status (5)

Country Link
JP (1) JP3624570B2 (en)
KR (1) KR100518161B1 (en)
CN (1) CN1175271C (en)
TW (1) TW359748B (en)
WO (1) WO1998010298A1 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3525918B2 (en) * 2000-10-31 2004-05-10 セイコーエプソン株式会社 Electro-optical device, inspection method thereof, and electronic apparatus
KR100911467B1 (en) * 2002-12-31 2009-08-11 삼성전자주식회사 LCD Inspection Device
JP4219729B2 (en) * 2003-04-25 2009-02-04 日本発條株式会社 LCD panel inspection equipment
JP4579074B2 (en) * 2005-07-15 2010-11-10 三菱電機株式会社 Flexible circuit board and display device using the same
JP2008032958A (en) * 2006-07-28 2008-02-14 Optrex Corp Lighting inspection device and lighting inspection method for display panel
KR100843126B1 (en) * 2006-08-29 2008-07-02 주식회사 에스에프에이 Panel inspection apparatus and method of flat panel display, and circuit board bonding system and method of flat panel display
KR20060122804A (en) * 2006-11-11 2006-11-30 윤재완 Probe Block for Display Panel Inspection
JP5347258B2 (en) * 2007-09-28 2013-11-20 カシオ計算機株式会社 Functional inspection equipment for electronic devices
KR101219285B1 (en) * 2011-01-06 2013-01-11 (주)에이앤아이 Inspection method and apparatus of substrate
KR101290669B1 (en) * 2013-02-04 2013-07-29 (주)메리테크 Bump-type probe, glass block panels for testing
CN105867003A (en) * 2016-06-15 2016-08-17 苏州众显电子科技有限公司 Novel STN liquid crystal display screen
CN106205030B (en) * 2016-07-25 2019-01-29 京东方科技集团股份有限公司 Alarm circuit, integrated circuit board and alarm system

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2559242B2 (en) * 1987-12-25 1996-12-04 東京エレクトロン株式会社 Probe card
JPH02253168A (en) * 1989-03-28 1990-10-11 Seiko Epson Corp Probe for lighting inspection of liquid crystal display panel
JP2524308Y2 (en) * 1989-12-27 1997-01-29 日本電子材料 株式会社 Probe card
JPH0489579A (en) * 1990-07-31 1992-03-23 Morimichi Fujiyoshi Inspecting device for printed board and the like
JPH0495929A (en) * 1990-08-08 1992-03-27 Fujitsu Ltd Device and method for test using active probe
JP2966671B2 (en) * 1991-11-18 1999-10-25 東京エレクトロン株式会社 Probe card
JPH06120647A (en) * 1992-10-06 1994-04-28 Fujitsu Ltd Semiconductor element mounting method and mounting apparatus

Also Published As

Publication number Publication date
JP3624570B2 (en) 2005-03-02
WO1998010298A1 (en) 1998-03-12
KR20000064315A (en) 2000-11-06
KR100518161B1 (en) 2005-12-01
CN1199466A (en) 1998-11-18
CN1175271C (en) 2004-11-10
JPH1078456A (en) 1998-03-24

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees