TW428094B - Fault insertion apparatus and method of the same - Google Patents

Fault insertion apparatus and method of the same

Info

Publication number
TW428094B
TW428094B TW88108585A TW88108585A TW428094B TW 428094 B TW428094 B TW 428094B TW 88108585 A TW88108585 A TW 88108585A TW 88108585 A TW88108585 A TW 88108585A TW 428094 B TW428094 B TW 428094B
Authority
TW
Taiwan
Prior art keywords
terminals
fault insertion
plural
under test
board under
Prior art date
Application number
TW88108585A
Other languages
Chinese (zh)
Inventor
Yi-Shr Tzeng
Ying-Kuen Tsau
Shing-Fu Shiue
Shou-Jie Jang
Yi-Fan Jan
Original Assignee
Inst Information Industry
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inst Information Industry filed Critical Inst Information Industry
Priority to TW88108585A priority Critical patent/TW428094B/en
Application granted granted Critical
Publication of TW428094B publication Critical patent/TW428094B/en

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  • Tests Of Electronic Circuits (AREA)

Abstract

This invention relates to a fault insertion apparatus and method, in which fault insertion is performed and used for the board under test so as to provide the automatic testing equipment with a testing program set for testing and verifying purpose. On the board under test, plural circuit connection points are selected and plural control terminals are provided to control the close or open circuit state of the two adjacent terminals. Plural single-blade single-pitch switches are used such that both terminals of the single-blade single-pitch switch are electrically connected with one terminal of the contact terminals and one terminal of the control terminals, respectively, to perform the switching of close or open circuit between contact terminals and control terminals. Therefore, a plurality of fault insertion states can be formed individually on the board under test so as to provide the corresponding testing program to perform the test.
TW88108585A 1999-05-25 1999-05-25 Fault insertion apparatus and method of the same TW428094B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW88108585A TW428094B (en) 1999-05-25 1999-05-25 Fault insertion apparatus and method of the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW88108585A TW428094B (en) 1999-05-25 1999-05-25 Fault insertion apparatus and method of the same

Publications (1)

Publication Number Publication Date
TW428094B true TW428094B (en) 2001-04-01

Family

ID=21640847

Family Applications (1)

Application Number Title Priority Date Filing Date
TW88108585A TW428094B (en) 1999-05-25 1999-05-25 Fault insertion apparatus and method of the same

Country Status (1)

Country Link
TW (1) TW428094B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI386661B (en) * 2009-12-11 2013-02-21 Maintek Comp Suzhou Co Ltd Detecting device and detecting method
TWI777707B (en) * 2021-01-15 2022-09-11 大陸商勝達克半導體科技（上海）有限公司 Energy-storage capacitor malfunction detection method based on test carrier board

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI386661B (en) * 2009-12-11 2013-02-21 Maintek Comp Suzhou Co Ltd Detecting device and detecting method
TWI777707B (en) * 2021-01-15 2022-09-11 大陸商勝達克半導體科技（上海）有限公司 Energy-storage capacitor malfunction detection method based on test carrier board

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Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MM4A Annulment or lapse of patent due to non-payment of fees