TW434113B - Polishing apparatus - Google Patents

Polishing apparatus Download PDF

Info

Publication number
TW434113B
TW434113B TW89102874A TW89102874A TW434113B TW 434113 B TW434113 B TW 434113B TW 89102874 A TW89102874 A TW 89102874A TW 89102874 A TW89102874 A TW 89102874A TW 434113 B TW434113 B TW 434113B
Authority
TW
Taiwan
Prior art keywords
slurry
arm
polishing
polishing pad
patent application
Prior art date
Application number
TW89102874A
Other languages
English (en)
Chinese (zh)
Inventor
Gee Hoey
Manoocher Birang
Doyle E Bennett
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Application granted granted Critical
Publication of TW434113B publication Critical patent/TW434113B/zh

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B53/00Devices or means for dressing or conditioning abrasive surfaces
    • B24B53/017Devices or means for dressing, cleaning or otherwise conditioning lapping tools
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Grinding-Machine Dressing And Accessory Apparatuses (AREA)
TW89102874A 1999-03-16 2000-02-18 Polishing apparatus TW434113B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US27064299A 1999-03-16 1999-03-16

Publications (1)

Publication Number Publication Date
TW434113B true TW434113B (en) 2001-05-16

Family

ID=23032186

Family Applications (1)

Application Number Title Priority Date Filing Date
TW89102874A TW434113B (en) 1999-03-16 2000-02-18 Polishing apparatus

Country Status (3)

Country Link
EP (1) EP1038635A3 (ja)
JP (1) JP2000280165A (ja)
TW (1) TW434113B (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI548483B (zh) * 2011-07-19 2016-09-11 荏原製作所股份有限公司 研磨裝置及方法
TWI770533B (zh) * 2020-02-14 2022-07-11 南亞科技股份有限公司 研磨輸送設備
TWI777630B (zh) * 2020-06-24 2022-09-11 美商應用材料股份有限公司 用於拋光液體傳輸臂的清潔裝置、工具及方法,及其拋光組件

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6379229B1 (en) * 1999-05-17 2002-04-30 Ebara Corporation Polishing apparatus
KR100494145B1 (ko) * 2000-12-15 2005-06-10 주식회사 하이닉스반도체 화학기계적 연마장치 및 그를 이용한 웨이퍼 연마방법
US6409580B1 (en) * 2001-03-26 2002-06-25 Speedfam-Ipec Corporation Rigid polishing pad conditioner for chemical mechanical polishing tool
WO2003018256A1 (en) * 2001-08-31 2003-03-06 Koninklijke Philips Electronics N.V. Method and apparatus for chemical mechanical planarization end-o f-polish optimization
TW200517478A (en) * 2003-05-09 2005-06-01 Sanyo Chemical Ind Ltd Polishing liquid for CMP process and polishing method
CN100490084C (zh) * 2003-05-09 2009-05-20 三洋化成工业株式会社 Cmp方法用研磨液及研磨方法
JP4901301B2 (ja) 2006-05-23 2012-03-21 株式会社東芝 研磨方法及び半導体装置の製造方法
JP2011167800A (ja) * 2010-02-18 2011-09-01 Disco Corp 切削装置
JP5791987B2 (ja) * 2011-07-19 2015-10-07 株式会社荏原製作所 研磨装置および方法
JP5775797B2 (ja) * 2011-11-09 2015-09-09 株式会社荏原製作所 研磨装置および方法
JP5911786B2 (ja) * 2012-10-31 2016-04-27 株式会社荏原製作所 研磨装置
CN113471108B (zh) * 2021-07-06 2022-10-21 华海清科股份有限公司 一种基于马兰戈尼效应的晶圆竖直旋转处理装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2622069B2 (ja) * 1993-06-30 1997-06-18 三菱マテリアル株式会社 研磨布のドレッシング装置
US5885147A (en) * 1997-05-12 1999-03-23 Integrated Process Equipment Corp. Apparatus for conditioning polishing pads
US6139406A (en) * 1997-06-24 2000-10-31 Applied Materials, Inc. Combined slurry dispenser and rinse arm and method of operation
WO1999033612A1 (en) * 1997-12-26 1999-07-08 Ebara Corporation Polishing device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI548483B (zh) * 2011-07-19 2016-09-11 荏原製作所股份有限公司 研磨裝置及方法
TWI770533B (zh) * 2020-02-14 2022-07-11 南亞科技股份有限公司 研磨輸送設備
TWI777630B (zh) * 2020-06-24 2022-09-11 美商應用材料股份有限公司 用於拋光液體傳輸臂的清潔裝置、工具及方法,及其拋光組件

Also Published As

Publication number Publication date
JP2000280165A (ja) 2000-10-10
EP1038635A2 (en) 2000-09-27
EP1038635A3 (en) 2003-05-14

Similar Documents

Publication Publication Date Title
TW434113B (en) Polishing apparatus
TW385500B (en) Combined slurry dispenser and rinse arm and method of operation
US6669538B2 (en) Pad cleaning for a CMP system
TW422755B (en) Improved method of polishing a substrate
US6193587B1 (en) Apparatus and method for cleansing a polishing pad
JP3797861B2 (ja) ポリッシング装置
US5885147A (en) Apparatus for conditioning polishing pads
TW471994B (en) System and method for controlled polishing and planarization of semiconductor wafers
TW513336B (en) Cleaning and slurry distribution system assembly for use in chemical mechanical polishing apparatus
TW495416B (en) Polishing apparatus
JP5405887B2 (ja) 研磨装置及び研磨方法
US6022266A (en) In-situ pad conditioning process for CMP
US9475170B2 (en) Device for cleaning fixed abrasives polishing pad
CN204658194U (zh) 一种清洗装置
KR19990036619A (ko) 연마 패드의 유지장치 및 방법
JPWO2003071592A1 (ja) ポリッシング方法および装置
JP2019029562A (ja) 基板処理装置
TW393378B (en) Apparatus and methods for slurry removal in chemical mechanical polishing
US6273797B1 (en) In-situ automated CMP wedge conditioner
US6217430B1 (en) Pad conditioner cleaning apparatus
US7883393B2 (en) System and method for removing particles from a polishing pad
JP2008068389A5 (ja)
JP3708740B2 (ja) 研磨装置および研磨方法
JP2000254855A (ja) 研磨パッドのコンディショニング装置および研磨パッドのコンディショニング方法
TW389953B (en) Method and apparatus for distributing a polishing agent onto a polishing element