TW478016B - Method to strip off polyimide layer for electro-optic and semiconductor manufacture process - Google Patents
Method to strip off polyimide layer for electro-optic and semiconductor manufacture process Download PDFInfo
- Publication number
- TW478016B TW478016B TW89118080A TW89118080A TW478016B TW 478016 B TW478016 B TW 478016B TW 89118080 A TW89118080 A TW 89118080A TW 89118080 A TW89118080 A TW 89118080A TW 478016 B TW478016 B TW 478016B
- Authority
- TW
- Taiwan
- Prior art keywords
- stripping
- semiconductor
- scope
- patent application
- item
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 52
- 229920001721 polyimide Polymers 0.000 title claims abstract description 29
- 239000004065 semiconductor Substances 0.000 title claims abstract description 17
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 16
- 239000004642 Polyimide Substances 0.000 title claims abstract description 9
- 238000011282 treatment Methods 0.000 claims abstract description 23
- 239000000463 material Substances 0.000 claims abstract description 13
- 239000000126 substance Substances 0.000 claims abstract description 10
- 238000005406 washing Methods 0.000 claims abstract description 7
- 239000013557 residual solvent Substances 0.000 claims abstract description 3
- 239000002904 solvent Substances 0.000 claims description 19
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 14
- 238000004140 cleaning Methods 0.000 claims description 11
- 230000005693 optoelectronics Effects 0.000 claims description 11
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 claims description 10
- 238000007654 immersion Methods 0.000 claims description 10
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 claims description 9
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 8
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 claims description 8
- 150000001412 amines Chemical class 0.000 claims description 7
- 239000012046 mixed solvent Substances 0.000 claims description 7
- 229920006264 polyurethane film Polymers 0.000 claims description 7
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 claims description 6
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 claims description 6
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 claims description 6
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 claims description 6
- 238000011010 flushing procedure Methods 0.000 claims description 6
- 229930188620 butyrolactone Natural products 0.000 claims description 5
- 150000003950 cyclic amides Chemical class 0.000 claims description 5
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 claims description 4
- 239000008367 deionised water Substances 0.000 claims description 4
- 229910021641 deionized water Inorganic materials 0.000 claims description 4
- 238000001035 drying Methods 0.000 claims description 4
- 230000000694 effects Effects 0.000 claims description 4
- 150000002576 ketones Chemical class 0.000 claims description 4
- 239000007788 liquid Substances 0.000 claims description 4
- 229910021642 ultra pure water Inorganic materials 0.000 claims description 4
- 239000012498 ultrapure water Substances 0.000 claims description 4
- GIAFURWZWWWBQT-UHFFFAOYSA-N 2-(2-aminoethoxy)ethanol Chemical compound NCCOCCO GIAFURWZWWWBQT-UHFFFAOYSA-N 0.000 claims description 3
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 claims description 3
- 239000000758 substrate Substances 0.000 claims description 3
- -1 tetramethyl hydroxide Chemical compound 0.000 claims description 3
- 150000001298 alcohols Chemical class 0.000 claims description 2
- 150000003973 alkyl amines Chemical class 0.000 claims description 2
- 229910021529 ammonia Inorganic materials 0.000 claims description 2
- 125000004122 cyclic group Chemical group 0.000 claims description 2
- QEMXHQIAXOOASZ-UHFFFAOYSA-N tetramethylammonium Chemical compound C[N+](C)(C)C QEMXHQIAXOOASZ-UHFFFAOYSA-N 0.000 claims description 2
- 238000010407 vacuum cleaning Methods 0.000 claims description 2
- FERIUCNNQQJTOY-UHFFFAOYSA-N Butyric acid Chemical compound CCCC(O)=O FERIUCNNQQJTOY-UHFFFAOYSA-N 0.000 claims 4
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 claims 2
- 238000000861 blow drying Methods 0.000 claims 2
- 229960001760 dimethyl sulfoxide Drugs 0.000 claims 2
- 229920000768 polyamine Polymers 0.000 claims 2
- 229920001228 polyisocyanate Polymers 0.000 claims 2
- 239000005056 polyisocyanate Substances 0.000 claims 2
- RVSIYTLODOLVKA-UHFFFAOYSA-N 2-(2-aminoethoxy)ethanol Chemical compound NCCOCCO.NCCOCCO RVSIYTLODOLVKA-UHFFFAOYSA-N 0.000 claims 1
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 claims 1
- 238000013019 agitation Methods 0.000 claims 1
- 239000003125 aqueous solvent Substances 0.000 claims 1
- 239000012752 auxiliary agent Substances 0.000 claims 1
- 230000003139 buffering effect Effects 0.000 claims 1
- 239000007789 gas Substances 0.000 claims 1
- 150000002978 peroxides Chemical class 0.000 claims 1
- 238000006116 polymerization reaction Methods 0.000 claims 1
- 238000013404 process transfer Methods 0.000 claims 1
- 239000001294 propane Substances 0.000 claims 1
- 239000007921 spray Substances 0.000 claims 1
- 238000002791 soaking Methods 0.000 abstract description 4
- 238000007664 blowing Methods 0.000 abstract 1
- 235000012431 wafers Nutrition 0.000 description 8
- ROSDSFDQCJNGOL-UHFFFAOYSA-N Dimethylamine Chemical compound CNC ROSDSFDQCJNGOL-UHFFFAOYSA-N 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000012467 final product Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 239000000047 product Substances 0.000 description 2
- OXHNLMTVIGZXSG-UHFFFAOYSA-N 1-Methylpyrrole Chemical compound CN1C=CC=C1 OXHNLMTVIGZXSG-UHFFFAOYSA-N 0.000 description 1
- CFVCOFNWHGMJGK-UHFFFAOYSA-N 2-(2-aminoethoxy)ethanol;ethanol Chemical compound CCO.NCCOCCO CFVCOFNWHGMJGK-UHFFFAOYSA-N 0.000 description 1
- PWRADVNVLKVVCO-UHFFFAOYSA-N N-methylmethanamine methylsulfinylmethane Chemical compound CNC.CS(=O)C PWRADVNVLKVVCO-UHFFFAOYSA-N 0.000 description 1
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 239000013040 bath agent Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- 231100000357 carcinogen Toxicity 0.000 description 1
- 239000003183 carcinogenic agent Substances 0.000 description 1
- 239000013043 chemical agent Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 150000002466 imines Chemical class 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- GSWAOPJLTADLTN-UHFFFAOYSA-N oxidanimine Chemical compound [O-][NH3+] GSWAOPJLTADLTN-UHFFFAOYSA-N 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000011877 solvent mixture Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- FDDDEECHVMSUSB-UHFFFAOYSA-N sulfanilamide Chemical compound NC1=CC=C(S(N)(=O)=O)C=C1 FDDDEECHVMSUSB-UHFFFAOYSA-N 0.000 description 1
- 229940124530 sulfonamide Drugs 0.000 description 1
- 150000003462 sulfoxides Chemical class 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 125000003698 tetramethyl group Chemical group [H]C([H])([H])* 0.000 description 1
Landscapes
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
4/^UW ϊ° Jp 1 84 / ^ UW ϊ ° Jp 1 8
Λ號 89m(m 、發明說明(i) 璃表i=^於1導體或光電元件製程中剝除晶圓或玻 為录面承亞fe胺(p〇 i y】m | d e )膜層 自動化設備皆能對半導體及光雷_ ’ ,尤和一種配合 層處;”且;:;量大、速度快:去:胺膜 聚亞::二在=:戶中’其表面會塗佈-種 予以去除。以目前產業較為廣時便需將此膜層 除法而t·,纟電漿纟面處理雖可、曰曰圓加工的電漿去 除,且不影響晶圓強度,但處理文ΐ亞酷胺膜層燒 間,產能不大,並在晶圓表面會產:夕吊小二所以耗費時 合物,影響後續處理及最終產品的=種物質結合成之錯 實驗室、少量或局部去除的處理情;#性’故僅較適合 工驟增之產能,此種方法以不符:ί求=現今晶圓加 士有i佈”程中也會塗佈聚亞酿胺膜層, 如有塗佈不均或厗度不符時便需將此 前較為廣泛採用於LCD產業的ΝΜΡ去丰曰=去除。以目 逐片處理方式,虽請去除不供烤取^ ’其係以Spin, P〇iyinnde)相當有效’但仍然經;=胺^Uncured 後續製程或最終產品的應有特性,甚^’導致影響 了丨土 爸至直接報麼,反而影 響良率問題’又spin,方式每次處理只〜能/ 適用於小面積LCD ’而一不適用於曰漸量產的大面積產品。 為了徹底角:決目厨及未來產能倍增之需求,本發明人 便提供創:::導=光電元件製程中剝除聚亞醯胺膜層 的方法’此方法係將夕片處理物一次承放於—浸泡槽中, 478016Λ No. 89m (m, description of the invention (i) glass surface i = ^ stripping wafers or glass for recording surface in the process of 1 conductor or optoelectronic element) film automation equipment (p〇iy m | de) Both can be used for semiconductors and light mines, especially at a matching layer; "and;:; large quantity, fast speed: to: amine film poly :: two in =: household's surface will be coated-species It is necessary to divide this film layer when the current industry is relatively wide. Although the plasma surface treatment can be done by plasma processing, which does not affect the strength of the wafer, it does not affect the strength of the wafer. Cool amine film firing room, the production capacity is not large, and it will be produced on the wafer surface: Xi Hang Xiao Er consumes time-consuming compounds, which affects subsequent processing and the final product = a combination of substances in the laboratory, small or partial removal The nature of the treatment is #suitable. Therefore, it is only suitable for the sudden increase in production capacity. This method is inconsistent with the following: = 求 = Current wafers plus fabrics will also be coated with polyurethane film during the process. If the coating is uneven or the degree is not the same, the NMP, which has been widely used in the LCD industry, must be removed before it is removed. The process is to be treated piece by piece, although please go Except that it is not available for roasting ^ 'It is Spin, Poiinnde) which is quite effective', but it still passes; = amine ^ Uncured The subsequent process or the characteristics of the final product, and even ^ 'lead to the impact 丨 do you directly report it? Instead, it affects the yield problem 'spin, and the method only handles ~ applicable / applicable to small-area LCDs' each time, and not applicable to large-scale products that are gradually mass-produced. In order to thoroughly meet the needs of the eye-catcher and future production capacity doubling, the present inventor has provided a method of ::: guide = a method of stripping the polyimide film layer in the process of photovoltaic elements. Placed in a soaking tank, 478016
MM, 89118080 五、發明說明(2) 该浸泡槽内盛裝有能完全覆蓋處理 層實施鬆脫或剝除或蝕刻反應之化學ΐ♦亞胺膜 片/理物-次浸泡處理及可完全以ί::除=:多 達到=數量大、處理快速及處理效果佳之目的。、… 炫就本發明方法之優點及特性說明如下·· 1二本,明係採化學溶劑浸泡之除膜處理方 -次可多片處理,處理數量大為大理在:t士 剝除時間,增加產能,可因應掸 α即省 求。 。q佼座此驟增的處理能量需 其2材=之化學溶劑浸泡除膜處理方式,其可適用多種 土材如圓LCD、晶圓尺寸封裂等級晶圓 CSP )、先纖、其他先進的複合材料及各種 亞醯胺膜層的除膜處理。 蜀予衣面+ 3曰冬:明之化學溶劑浸泡除膜處理方式,其除膜處理均 二U又陕不會有去除不乾淨之死角,並能針對烘乾 (cii/ed)或未烘烤(uncured)的聚亞醯胺膜層(p〇iyiwde) 有效剝除,也不會在處理表面生成錯合物等特性。 4·本發明之化學溶劑浸泡除膜處理方式,其化學混合溶MM, 89118080 V. Description of the invention (2) The immersion tank contains a chemical that can completely cover the treatment layer for loosening or stripping or etching reaction. ♦ Imine membrane / physical-sub-immersion treatment and can be completely :: Divide =: To achieve a large number of = fast processing and good results. , ... The advantages and characteristics of the method of the present invention are explained as follows: 12 copies. The film removal treatment using chemical solvent immersion in the Ming Dynasty can be performed in multiple pieces. The number of treatments is largely in the following: Increasing production capacity can save demand in response to 掸 α. . Q. This sudden increase in processing energy requires its 2 materials = chemical solvent soaking and film removal methods, which can be applied to a variety of earth materials such as round LCD, wafer size sealing grade wafer CSP, fiber, and other advanced Film removal for composite materials and various sulfamine layers. Shu Yu clothing surface + 3 winter: Mingzhi chemical solvent immersion film removal treatment method, the film removal treatment is two U and Shaanxi will not remove the dirty dead corners, and can be targeted for drying (cii / ed) or unbaked The (uncured) polyimide film layer (poiyiwde) is effectively stripped, and characteristics such as the formation of complexes on the treated surface are not formed. 4. The chemical solvent immersion and film removal treatment method of the present invention
劑係由烷胺(ALKANOLAMINE)、2- (2-氨基乙氧基)乙 (2- (2-AMIN0ETH0XY)ETHAN0L) 、 丁酸内醋 (BUTYROLACTONE)、環氨(CYCLIC AMIDE)、二甲 亞職DIMETHYL SULFOXIDE)、N-甲基四氫Dbb 口各酮(N-METHYL PYRR0LID0NE)、四甲基氫氧化銨(tetRAMETHYL AMMONIUM Η Y D R 0 X I D E )等溶劑混合而成,不含氯化溶劑、不燃、不含The agent is composed of ALKANOLAMINE, 2- (2-aminoethoxy) ethyl (2- (2-AMIN0ETH0XY) ETHAN0L), BUTYROLACTONE, CYCLIC AMIDE, dimethylamine DIMETHYL SULFOXIDE), N-Methyltetrahydro Dbb (N-METHYL PYRR0LID0NE), tetramethylammonium hydroxide (tetRAMETHYL AMMONIUM Η YDR 0 XIDE) and other solvents are mixed, without chlorinated solvents, non-flammable, non-flammable With
478016 9 0 1 CM 案號89118080 年 月478016 9 0 1 CM case number 89118080 month
五、發明說明(3) 致癌物及破壞臭氧層的溶劑成分,兼具環保特性,且也不 會傷害相關可能接觸的金屬或其他材料,以及閃火點高, 更具有安全性高之防護。 ^ 依據本發明上揭目的之半導體或光電元件製程中剝除 聚亞醯胺膜層之方法,詳加說明如下: 如第一圖所示為本發明具體實施之流程示意圖。 於步驟1中,係將表面具有聚亞醯胺膜層之晶圓或光 電元件的處理物’以多片方式(原則上是以2 〇〜2 5片為準較 佳)承載於自動化設備之載具中,將此載具移送至槽内盛 裝有能完全覆蓋處理物載具以對聚亞醯胺膜層實施鬆脫或 剝除或蝕刻反應之化學混合溶劑的浸泡槽中,該化學混合 溶劑係由烷胺(八11^1^01^^11籠)、2-(2-氨基乙氧基)乙醇 (2-(2 4%]^(^丁[1(^丫)£1[1^肌〇、丁酸内酉旨 (BUTYROLACTONE)、環氨(CYCLIC AMIDE)、二曱 亞猶{DIMETHYL SULFOXIDE)、N-曱基四氫邮咯酮(n-METHYL PYRROL I DONE)、四甲基氫氧化銨(teTRAMETHYL AMMONIUM Η Y D R 0 X I D E)等溶劑混合而成,其中丁酸内酯 (BUTYR0LACT0NE)及 N-曱基四氫岐略酮(n-METHYL PYRROL I DONE)為清潔力強、閃火點高於9〇 °c且1 〇〇%與水 互溶,可以軟化聚亞龜胺膜層的軟化溶劑,其至少約佔 4 5 %之總混合浴劑里’ 2 - ( 2 -氛基乙氧基)乙醇(2 -(2-AMINOETHOXY ) ETHANOL)為可以降低上述軟化溶劑對 基材的侵蝕性緩衝助劑,其約佔3 5 %以下之總混合溶劑V. Description of the invention (3) Carcinogens and solvents that destroy the ozone layer are environmentally friendly and do not harm related metals or other materials that may be in contact with them. They also have high flash points and high safety protection. ^ The method for stripping the polyimide film in the semiconductor or optoelectronic device manufacturing process according to the object of the present invention is described in detail as follows: As shown in the first figure, the flow chart of the specific implementation of the present invention is shown. In step 1, the processed object of the wafer or photovoltaic element with a polyurethane film layer on the surface is carried in a multi-piece manner (in principle, it is preferably 20 to 25 pieces) to be carried on the automation equipment. In the carrier, the carrier is transferred to an immersion tank containing a chemically mixed solvent capable of completely covering the treatment object carrier to carry out the release or peeling or etching reaction of the polyurethane film layer. The solvent system consists of alkylamines (eight 11 ^ 1 ^ 01 ^^ 11 cages), 2- (2-aminoethoxy) ethanol (2- (2 4%) ^ (^ 丁 [1 (^ 丫) £ 1 [ 1 ^ muscle〇, BUTYROLACTONE, CYCLIC AMIDE, DIMETHYL SULFOXIDE, N-METHYL PYRROL I DONE, Tetramethyl TeTRAMETHYL AMMONIUM Η YDR 0 XIDE and other solvents are mixed, of which, butyrolactone (BUTYR0LACT0NE) and N-Methyl Pyrrolo I DONE are strong cleaning power, flash A softening solvent with a fire point higher than 90 ° C and 100% miscibility with water, which can soften the polyimide film layer, which accounts for at least about 45% of the total mixed bath agent '2-(2- Ethoxy ) Ethanol (2 - (2-AMINOETHOXY) ETHANOL) can be reduced to the above-described aggressive solvent softening aid to the substrate buffer, which accounts for 35% or less of the total solvent mixture
量,環氨(CYCLIC AMIDE)、二甲亞hKDIMETHYLVolume, cyclic ammonia (CYCLIC AMIDE), dimethyl amine hKDIMETHYL
478016 修正 案號 89118080 曰 五、發明說明(4) SULFOXIDE)為可以加速上述赴儿_ 义狀化洛劑對聚亞醯胺膜層的鬆 脫速度之添加促進劑,其約彳ς()/ Α ^ 曰幻私 」佔1 5 %以下之總混合溶劑量, 烷胺(ALKANOLAMINE)及四甲其 τ & 風氧化銨(TETRAMETHYL AMMONIUM HYDROXIDE)為可以 1:夂 ^ 、 ^ J以降低已鬆脫聚亞醯胺膜層回 沾到基材的情形之添加抗靜雷助 0/ 呢电助劑,其約佔5 %以下之總混 合溶劑量丄以對聚亞酿胺膜層 < 處理物進行除膜處理,在 除膜處理κ鉍中需將除膜溫度保持在丨〇 4〜2丨2。F之間,若 為烘乾聚亞醯胺膜層(cured p〇lyimide)之處理物時,其 除膜時間係介於5〜90分鐘之間,若為未烘乾聚亞醯胺膜層 (uncured polyimide)之處理物時,其除膜時間係介於 1〜1 0分鐘之間。 於步驟2中,係以反應後之處理物再利用載具將其移 送至沖洗槽中,該沖洗槽中内盛裝有清洗液,該清洗液係 屬純水、去離子水、乙醇、超純水、過氧化氫、甲醇、異 丙醇、丙酮或其他醇、酮等混合而成的,其中純水、去離 子水、超純水皆為一種潔淨水,其潔淨水約佔至少5 〇 %之 沖洗喷出量’過氧化氫可對處理物表面的殘留物有快速洗 除的效果,其約佔2 5%以下之沖洗量,曱醇、乙醇、異丙 醇、丙酮或其他醇、_類水性溶劑可加快對清洗的速度及 效果,其約佔2 5 %以下之沖洗量,供以對處理物表面殘留 物或殘留溶劑進行清除處理,其處理過程中需將液溫保持 2 2〜8 0 C之間,沖洗時間則需保持1 〇秒〜2分鐘之間。 於步驟3中,係再以清洗液進行處理物表面二次清洗 處理,將處理物表面殘留物質清除潔淨,其處理過程中同478016 Amendment No. 89118080 (5) Description of the invention (4) SULFOXIDE) is an addition accelerator that can accelerate the release rate of the polyimide film layer from the above-mentioned chemical agent, which is about 彳 ς () / Α ^ "Magic Private" accounts for less than 15% of the total mixed solvent. Alkanolamine and tetramethyl τ & wind ammonium oxide (TETRAMETHYL AMMONIUM HYDROXIDE) can be 1: 夂 ^, ^ J to reduce In the case where the depolyimide film layer is re-attached to the substrate, an anti-static and lightning aid 0 / dyne electric additive is added, which accounts for less than 5% of the total mixed solvent amount to treat the polyimide film layer < The film is subjected to a film removing treatment. In the film removing treatment of κ-bismuth, the temperature of the film removing needs to be maintained at 〇04 ~ 2 丨 2. Between F, if it is a cured product of cured polyimide, the film removal time is between 5 and 90 minutes. If it is an unbaked polyimide film, (uncured polyimide), the film removal time is between 1 and 10 minutes. In step 2, the reacted processed material is transferred to a washing tank by using a carrier, and the washing tank contains a cleaning solution. The cleaning solution is pure water, deionized water, ethanol, and ultrapure water. Water, hydrogen peroxide, methanol, isopropanol, acetone or other alcohols, ketones, etc., among which pure water, deionized water, ultrapure water are all clean water, and the clean water accounts for at least 50% The flushing and spraying amount of hydrogen peroxide can quickly remove the residue on the surface of the treated object, which accounts for about 25% of the flushing amount. Water-based solvents can accelerate the speed and effect of cleaning. It accounts for less than 25% of the flushing amount and is used to remove residues or residual solvents on the surface of the treatment. During the treatment, the liquid temperature needs to be maintained 2 2 ~ Between 80 C, the rinse time needs to be maintained between 10 seconds and 2 minutes. In step 3, the surface of the processed object is further cleaned with a cleaning solution to remove the remaining material on the surface of the processed object.
第7頁 478016 案號 89118080 (5)Page 7 478016 case number 89118080 (5)
五、發明說明 樣將液溫保持22〜80。C之間,沖洗時間保持在1〇秒〜2分鐘 之間。 於步驟4中,係將清洗完成後處理物進行烘乾或吹乾 處理,其溫度保持在22〜120。C之間’而時間保持1〇秒〜2 分鐘,即能對處理物表面上水氣予以乾燥,以達成處理物 表面聚亞醯胺膜層完全剝除者。 因此,上述之方法配合實施於自動化設備上,苴浸泡 槽及沖洗槽内可搭配超音波震盪、真空洗淨、流水^及機 械授動方式以^短去除時間,而化學溶劑浸泡除膜處.理方 式,在浸泡槽内能一次浸泡多片同時處理,處理數^大, 可增加產能,且為大面積的除膜處理,能節省剝除時間, 以下就本發明之處理能量與習知電漿去除法、NMp去除法 之處理能$作具體比較(以〇 · 6 # m聚亞醯胺膜層為去除 象): ^ 1, 以電漿去除法推算: 一次一片,一小區一小區逐區除去,每次以5分鐘 計,以1 2小時一班推算,每個月2 〇個工作天可處理 20X12X60/5=2880 片 。 2. 以NMP去除法推算: 一次一片’每次以3分鐘(u n c u r e d)計,以1 2小時一班 推算’每個月20個工作天可處理2〇χΐ2χ6〇/3 = 488〇片。 3·本發明之剝除法推算: 一次以最小機組25片計,每次以2分鐘(uncured)計, 以1 2小時一班推算,每個月2 〇個工作天可處理V. Description of the invention The temperature of the liquid should be kept at 22 ~ 80. Between C, the rinsing time was maintained between 10 seconds and 2 minutes. In step 4, the post-cleaning processed material is dried or blow-dried, and its temperature is maintained at 22 ~ 120. C ', and the time is maintained for 10 seconds to 2 minutes, that is, the moisture on the surface of the processed object can be dried to achieve the complete removal of the polyurethane film layer on the surface of the processed object. Therefore, the above method is implemented on automated equipment in cooperation, soaking tanks and washing tanks can be equipped with ultrasonic vibration, vacuum cleaning, running water ^ and mechanical actuation methods ^ short removal time, and chemical solvents immersed to remove the membrane. In the immersion tank, multiple pieces can be immersed in one treatment at the same time, the number of treatments can be increased, the production capacity can be increased, and the large-area film removal treatment can save stripping time. The following is the processing energy and conventional electricity of the present invention. The specific treatments of the pulp removal method and the NMp removal method can be compared (using the 0.6 · m polyimide film layer as the removal image): ^ 1, estimated by the plasma removal method: one sheet at a time, one cell at a time The area is removed, and each time is calculated in 5 minutes and calculated in 12-hour shifts. 20 working days per month can process 20X12X60 / 5 = 2880 pieces. 2. Estimation by NMP removal method: One piece at a time is calculated as 3 minutes (u n c u r e d) at a time of 12 hours, and 20 working days per month can be processed 20 × 2 × 60 × 3 = 4880 pieces. 3. Estimation of the stripping method of the present invention: 25 pieces of the minimum unit at a time, 2 minutes (uncured) each time, 12 hours per hour, and 20 working days per month.
第8頁 478016Page 8 478016
由上述得知,本發明之方法每個月處理能量為 除法的62.5倍,為關?去除法的37 5倍,是目前徹= 未來產能倍增需求之最佳途徑。 -/、 本毛月之方法在處理上以相同設備上能針對炉乾 予cr有二以 化學溶劑浸泡除膜處理方式,處 會傷害物處理效果極佳,也不 。 吏用的孟屬或/、他材料,可以提高良率 表Τ、上所陳’本發明所提供- 除…胺膜層之方法,具備有處理ίΐ”:製程中剝 及處理效果佳之三大特性,能因#『ϋ大、處理速度快 製程中需剝除聚亞醒胺膜層之需:;『半導體』 值者。 位具產業上之利用價It is known from the above that the processing energy of the method of the present invention is 62.5 times that of division per month. Is it relevant? The removal method of 37.5 times is currently the best way to double the demand for future production capacity. -/ 、 The method of this month can use the same equipment to treat the furnace drying on the same equipment. It can be soaked with chemical solvents to remove the film. It will have a very good treatment effect on the injured objects. The materials used by government officials can improve the yield rate, and the above-mentioned methods provided by the present invention-the method of removing ... the amine film layer, which has treatments "Three of the three best peeling and treatment effects in the process Characteristics, can be due to # "large, fast processing speed need to strip the polyimide film layer :;" semiconductor "value. Positioned in the industrial use price
478016478016
第ίο頁Page ίο
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW89118080A TW478016B (en) | 2000-09-05 | 2000-09-05 | Method to strip off polyimide layer for electro-optic and semiconductor manufacture process |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW89118080A TW478016B (en) | 2000-09-05 | 2000-09-05 | Method to strip off polyimide layer for electro-optic and semiconductor manufacture process |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW478016B true TW478016B (en) | 2002-03-01 |
Family
ID=21661029
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW89118080A TW478016B (en) | 2000-09-05 | 2000-09-05 | Method to strip off polyimide layer for electro-optic and semiconductor manufacture process |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW478016B (en) |
-
2000
- 2000-09-05 TW TW89118080A patent/TW478016B/en not_active IP Right Cessation
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103342356B (en) | Method for transferring graphene on metal foil substrate | |
| US20050016565A1 (en) | Cleaning masks | |
| TWI514094B (en) | Stripper composition for thick negative photoresist | |
| KR20210008519A (en) | Composition, method for cleaning adhesive polymer, method for manufacturing device wafer, and method for regenerating support wafer | |
| CN113820927B (en) | Positive photoresist stripping liquid composition | |
| TW200905015A (en) | Method for cleaning metal mask | |
| CN104752161A (en) | Method for improving appearance quality of rear surface of thin sheet | |
| JPWO2020148968A1 (en) | Decomposition cleaning composition, adhesive polymer cleaning method, and device wafer manufacturing method | |
| JP2009506538A5 (en) | ||
| JP4398091B2 (en) | Cleaning solution and cleaning method for parts of semiconductor processing equipment | |
| CN110727182A (en) | A method of stripping photoresist | |
| TW200905420A (en) | Particle-containing resist peeling liquid and peeling method by using it | |
| CN103157619A (en) | Washing method for mask used in vapor deposition step in production of organic EL device and cleaning agent | |
| TW478016B (en) | Method to strip off polyimide layer for electro-optic and semiconductor manufacture process | |
| CN106378334A (en) | Ultrasonic washing method for precise optical element | |
| JP2002118085A (en) | Substrate-treating method and apparatus therefor | |
| WO2020052426A1 (en) | Method for preparing super-hydrophobic surface having dendritic structure | |
| CN102051283B (en) | Hydroxylamine-containing cleaning solution and use thereof | |
| JPWO1999061573A1 (en) | Cleaning solution and cleaning method for semiconductor processing equipment parts | |
| CN113467201A (en) | Method for cleaning photoresist | |
| JP2626324B2 (en) | Cleaning method | |
| CN117086003A (en) | A cleaning method for semiconductor wafer coating tooling | |
| US20090095320A1 (en) | Composition for Removing Photresist Layer and Method for Using it | |
| CN1347013A (en) | Stripping method of polyimide film layer in photoelectric and semiconductor manufacturing process | |
| CN108231541A (en) | A kind of cleaning method of indium antimonide polishing chip |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GD4A | Issue of patent certificate for granted invention patent | ||
| MM4A | Annulment or lapse of patent due to non-payment of fees |