TW540720U - Testing seat for semiconductor device - Google Patents

Testing seat for semiconductor device

Info

Publication number
TW540720U
TW540720U TW91203940U TW91203940U TW540720U TW 540720 U TW540720 U TW 540720U TW 91203940 U TW91203940 U TW 91203940U TW 91203940 U TW91203940 U TW 91203940U TW 540720 U TW540720 U TW 540720U
Authority
TW
Taiwan
Prior art keywords
semiconductor device
testing seat
testing
seat
semiconductor
Prior art date
Application number
TW91203940U
Other languages
Chinese (zh)
Inventor
Jia-Huang Wang
Original Assignee
Winway Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Winway Technology Co Ltd filed Critical Winway Technology Co Ltd
Priority to TW91203940U priority Critical patent/TW540720U/en
Publication of TW540720U publication Critical patent/TW540720U/en

Links

TW91203940U 2002-03-29 2002-03-29 Testing seat for semiconductor device TW540720U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW91203940U TW540720U (en) 2002-03-29 2002-03-29 Testing seat for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW91203940U TW540720U (en) 2002-03-29 2002-03-29 Testing seat for semiconductor device

Publications (1)

Publication Number Publication Date
TW540720U true TW540720U (en) 2003-07-01

Family

ID=29580901

Family Applications (1)

Application Number Title Priority Date Filing Date
TW91203940U TW540720U (en) 2002-03-29 2002-03-29 Testing seat for semiconductor device

Country Status (1)

Country Link
TW (1) TW540720U (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104714055A (en) * 2013-12-13 2015-06-17 旺矽科技股份有限公司 Detection jig
CN105842600A (en) * 2015-01-15 2016-08-10 京元电子股份有限公司 Semiconductor element testing device and testing equipment thereof
CN107238785A (en) * 2016-03-25 2017-10-10 联芯科技有限公司 Chip testing pedestal
TWI705253B (en) * 2019-05-06 2020-09-21 美商第一檢測有限公司 Detection device, socket device and a socket
CN113900013A (en) * 2021-10-20 2022-01-07 北京航天测控技术有限公司 Signal transmission device and equipment
CN113917316A (en) * 2021-10-14 2022-01-11 池州华宇电子科技股份有限公司 High-precision chip testing jig

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104714055A (en) * 2013-12-13 2015-06-17 旺矽科技股份有限公司 Detection jig
CN105842600A (en) * 2015-01-15 2016-08-10 京元电子股份有限公司 Semiconductor element testing device and testing equipment thereof
CN107238785A (en) * 2016-03-25 2017-10-10 联芯科技有限公司 Chip testing pedestal
CN107238785B (en) * 2016-03-25 2020-12-29 联芯科技有限公司 Chip testing base
TWI705253B (en) * 2019-05-06 2020-09-21 美商第一檢測有限公司 Detection device, socket device and a socket
CN113917316A (en) * 2021-10-14 2022-01-11 池州华宇电子科技股份有限公司 High-precision chip testing jig
CN113900013A (en) * 2021-10-20 2022-01-07 北京航天测控技术有限公司 Signal transmission device and equipment

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Legal Events

Date Code Title Description
GD4K Issue of patent certificate for granted utility model filed before june 30, 2004
MM4K Annulment or lapse of a utility model due to non-payment of fees