TW559571B - Apparatus and method for processing a workpiece - Google Patents

Apparatus and method for processing a workpiece Download PDF

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Publication number
TW559571B
TW559571B TW091115829A TW91115829A TW559571B TW 559571 B TW559571 B TW 559571B TW 091115829 A TW091115829 A TW 091115829A TW 91115829 A TW91115829 A TW 91115829A TW 559571 B TW559571 B TW 559571B
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TW
Taiwan
Prior art keywords
rotor
workpiece
head end
liquid
patent application
Prior art date
Application number
TW091115829A
Other languages
Chinese (zh)
Inventor
Steven L Peace
Paul Z Wirth
Erik Lund
Original Assignee
Semitool Inc
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Filing date
Publication date
Priority claimed from US09/907,522 external-priority patent/US6680253B2/en
Priority claimed from US09/907,552 external-priority patent/US6492284B2/en
Application filed by Semitool Inc filed Critical Semitool Inc
Application granted granted Critical
Publication of TW559571B publication Critical patent/TW559571B/en

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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7608Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of separate clamping members, e.g. clamping fingers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0406Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H10P72/0411Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H10P72/0416Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0418Apparatus for fluid treatment for etching
    • H10P72/0422Apparatus for fluid treatment for etching for wet etching
    • H10P72/0426Apparatus for fluid treatment for etching for wet etching with the semiconductor substrates being dipped in baths or vessels
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7624Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7626Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the construction of the shaft

Landscapes

  • Weting (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

A system for processing a workpiece includes a base having a bowl or recess for holding a liquid. A process reactor or head holds a workpiece between an upper rotor and a lower rotor. A head lifter lowers the head holding the workpiece into contact with the liquid. The head spins the workpiece during or after contact with the liquid. The upper and lower rotors have side openings for loading and unloading a workpiece into the head. The rotors are axially moveable to align the side openings.

Description

559571 A7559571 A7

本發明關於諸如半導體晶圓、扁平面板顯示器 光學媒介、薄膜頭端之工件’或其它由微電子電路、資: 健存元件或敷層,或微機械元件所製成基材之工件的表面 預備、清洗、洗濯及乾燥。這些或類似文章共同在此 晶圓’’或“工件,,。 …The invention relates to surface preparation of workpieces such as semiconductor wafers, flat panel display optical media, and thin film heads, or other substrates made of microelectronic circuits, materials, coatings, or micromechanical components. , Washing, washing and drying. These or similar articles are collectively on this wafer ’’ or “workpiece, ...

半導體製造工業不斷地尋求改良用於製造微電子電路及 元件,諸如由晶圓製造積體電路之製程。這些改良製程的 許多目的:系減少需要用於加工一晶圓以形成所須積體電路 的時間;藉由例如於加工期間減少晶圓污染,而增加每晶 圓可用積體電路的產出;降低需要產生所須積體電路的Ζ 驟數;及降低製造成本。 7 在晶圓加工時,其通常需要該晶圓之一側或多側受到任 液體、汽體或氣體形式之流體。此流體用於例如蝕刻該 晶圓表面、清潔晶圓表面、乾燥晶圓表面、鈍化晶圓表面 、沉積薄膜於晶圓表面,等等。控制加工流體如何施加於 晶圓表面,對於加工操作之成功,通常相當重要。 各種機械及方法已用於完成這些製造程序。然而,現存 機械具有數種缺點。這些缺點包括製程化學藥品及水相當 大的消耗。這製程化學藥品消耗增加製造成本,其最後將 增加最終產品、諸如例如電腦、行動電話,及實際上各種 型式消耗品、工業、化學、商業及軍事電子產品的成本。 此外,許多製程化學藥品係有毒的且需要特別處理、儲存 -4- 本纸银尺度適用中爾國家摞準(CNS) Α4規格(210 X 297公釐) 五、發明説明(2 ) 及配置方法。這些成本耗費甚多且困難度增高,但基於健 康、安全及環境的理由是必須具備的。因此,減少製程化 學藥品的消耗具有許多優點。 減少水的消耗也同樣有利。在許多區域,水變得逐漸稀 少。由於人口的成長,對於水有較大的競爭。在環境上以 友善的方式處置污水也通常變得更困難或成本太高。因此 ’降低製程水的消耗也同樣重要。 一般而言,現在使用於實際上所有電子產*中的微電子 電路,係由諸如矽之半導體材料所製成的扁平圓碟或晶圓 所製造。晶圓具有微電子電路的侧面或表面稱之為裝置側 。另-側通常稱之為晶圓的後側或底側。在一晶圓廠或製 造設施中,肖殊機械或機器人及方法使用於移冑、處理及 儲存晶® m維持晶圓於m㈣環境。應用這些 技術,晶圓以裝置側向上的方向均句地傳送至各製程機械 。這對於大多數製程步驟應用良好。然而,對於-些製程 步驟’以裝置側向下方向容納晶圓將是所需要的。例如, 如果裝置側加工-種液體,其使得裝置側向下有助透過重 力移除液體種特性不利於裝置側向上加工。當把晶圓 由:!置侧向上翻轉至一裝置向下方向時,在觀念上;為 巧單的事#貫際上其呈現出實質工程上的挑戰。最初 ,晶圓典型地僅能以其邊緣選出,晶圓沒有其它部份可接 觸(以減少污染)。此外,晶圓當然必須在其翻轉前穩固地抓 取或握持。翻轉或反向步驟必須在小量空間來完成,因為 製造設備清潔室區域空間小且成本昂貴。再者,翻轉步驟 本紙狀度適财® ® ^(^71^(210X297^) 必須快速完成,以避免緩慢製造操作,且具有工件之 運動或傳輸。 •在σ午夕製程製造步驟中,所使用之製程化學藥品必須平 均地施力/在晶圓上,以避免具有太多或太少的蝕刻,薄膜 t除等等。現存的機械通常不能充份平均地施壓製程化 ▲學藥品。,會導致較少的產出。再者,許多現存的機械償 试利用大量的製程化學藥品來補償施加製程化學藥品的偏 差。日這製程化學藥品的使用不足會導致上述的缺點。因此 供改良的產出、消耗較少的製程化學藥品及水、提供 更多的多樣性,及提供實行製造操作較佳結果之改良機械 及方法係所需的。 lAil單斂< 克服上述缺點之機械及方法現在已發明。在一設計中, 該機械包括-具有加工室之工件。加工流體利用離心力分 配通過加工室中工件的表面。 在第一内容,該機械具有一頭端,而該頭端具有一 第-轉子及-第二轉子,該第二轉子與該第—轉子接合 以握持一王件於其間。該第二轉子較佳地具有—開放= 〜區域’用以曝露卫件的底部表面。該卫件曝露底部表 面藉由固定或移動式㈣或液體塗抹器,或經接觸液體 池而與液體接觸。利用此設計,製程化學藥品的消耗將 戲劇性地減少。卫件上製程化學藥品的分佈係由轉子所 控制’其造成較均勻與有效的加工。多重步驟同時能在 該機械中完成,其將降低工件由於污染而潛在性的損 五、發明説明(4 ,且加速製造步驟。 在一第二及分別的内容令,該第一及第二轉子各具有一 至進出開口。该第一及第二轉子可彼此相對移動,使至w、 部份地對齊該開口,用於加載及卸載一工件。該第—及^ 二轉子同時可彼此相對移動,使得於該工件加卫_ 開口不須對齊。較佳地,該裝置包括至少一引動器,用於 以平行該轉子旋轉㈣方向移動轉子至少其中之—。此設 計容許工件更快速及易於加載進人機械且由其卸載。A 在-第三内容巾,該頭端連接至頭端提彳器上之支揮臂 ,用於垂直地移動該頭端朝向及離開一底座,該底座具有 一液體源用於施加液體至該工件的底部表面。該液體源可 為包含該液體之妹件’其選擇性地包括一音速能量源,諸 如一巨大音速傳送器。此設計提供能實行更多型式加工步 驟之多樣機械’其包括翻轉該工件來實行裝置側向下的力二 工。 在一第四及分別的内容中,在工件加工的方法中,該工 件水平地移至-製程頭端。該頭端及卫件係反向及降低朝 向一液體源,該液體源提供液體至該工件的底部表面。液 體係藉由直接接觸液體池或經液體出口,經由喷灑或浸洗 施加於該工件的底部表面。該工件於液體施加工件底部表 面期間或之後旋轉。-相同或不同的液體或一氣體或汽體 ,選擇性地引入工件的頂部表面。此方法以較少的製程化 學藥品及水消耗提供各種的製程步驟。其同時較不需要移 動工件,藉此降低製造時間與空間的需求。 559571The semiconductor manufacturing industry is constantly seeking to improve processes used to make microelectronic circuits and components, such as integrated circuits from wafers. Many purposes of these improved processes are to reduce the time required to process a wafer to form the required integrated circuits; to increase the output of available integrated circuits per wafer by, for example, reducing wafer contamination during processing; Reduce the number of Z steps required to produce the required integrated circuit; and reduce manufacturing costs. 7 During wafer processing, it usually requires that one or more sides of the wafer be exposed to any fluid in the form of a liquid, vapor or gas. This fluid is used to, for example, etch the wafer surface, clean the wafer surface, dry the wafer surface, passivate the wafer surface, deposit a thin film on the wafer surface, and so on. Controlling how the processing fluid is applied to the wafer surface is often important to the success of the processing operation. Various machinery and methods have been used to complete these manufacturing processes. However, existing machinery has several disadvantages. These disadvantages include the considerable consumption of process chemicals and water. The chemical consumption of this process increases manufacturing costs, which will ultimately increase the cost of end products such as, for example, computers, mobile phones, and virtually all types of consumables, industrial, chemical, commercial, and military electronics. In addition, many process chemicals are toxic and require special handling and storage. 4- The silver scale of this paper is applicable to the China National Standard (CNS) A4 specification (210 X 297 mm). 5. Description of the invention (2) and configuration method . These costs are costly and difficult, but they are necessary for health, safety and environmental reasons. Therefore, reducing the consumption of process chemicals has many advantages. Reducing water consumption is equally beneficial. In many areas, water is becoming scarce. As the population grows, there is greater competition for water. Disposing of sewage in an environmentally friendly manner also often becomes more difficult or costly. Therefore, it is equally important to reduce process water consumption. Generally speaking, the microelectronic circuits used in practically all electronic products * are made of flat disks or wafers made of semiconductor materials such as silicon. The side or surface of the wafer with microelectronic circuits is called the device side. The other side is often referred to as the back or bottom side of the wafer. In a wafer fab or manufacturing facility, Xiao Shu machinery or robots and methods are used to move, process, and store wafers m to maintain wafers in a m㈣ environment. Applying these technologies, the wafers are transferred to each process machine in a side-by-side direction. This applies well for most process steps. However, for some process steps' it will be necessary to accommodate the wafer in the device side down direction. For example, if the device side processes a liquid, it makes the device side down to help remove the liquid through gravity, and the characteristics are not conducive to the device side up processing. When putting the wafer by :! When the side is turned upside down to the downward direction of a device, conceptually; for 巧 单 事事 # it presents a substantial engineering challenge. Originally, wafers were typically selected only by their edges, and no other part of the wafer was accessible (to reduce contamination). In addition, the wafer must of course be securely grasped or held before it is turned over. The turning or reversing step must be done in a small amount of space because the clean room area of the manufacturing equipment is small and expensive. In addition, the flipping step of this paper-like paper ® ^ (^ 71 ^ (210X297 ^) must be completed quickly to avoid slow manufacturing operations and have movement or transfer of the workpiece. • In the manufacturing step of the σ midnight process, all The chemicals used in the process must be evenly applied / on the wafer to avoid having too much or too little etching, thin film removal, etc. Existing machinery usually cannot adequately and uniformly process chemicals. Will result in less output. In addition, many existing machinery trials use a large number of process chemicals to compensate for deviations in the application of process chemicals. Inadequate use of process chemicals in Japan will cause the above-mentioned disadvantages. Therefore, for improvement The required output, less process chemicals and water, more diversity, and improved machinery and methods that provide better results in manufacturing operations are needed. L Ail singularity < Machinery and methods to overcome the above shortcomings The method is now invented. In one design, the machine includes a workpiece having a processing chamber. The processing fluid is distributed through the surface of the workpiece in the processing chamber using centrifugal force. The machine has a head end, and the head end has a first rotor and a second rotor, the second rotor is engaged with the first rotor to hold a king piece in between. The second rotor preferably has- Open = ~ area 'is used to expose the bottom surface of the guard. The guard exposes the bottom surface to contact with the liquid through a fixed or mobile ㈣ or liquid applicator, or through contact with a liquid pool. With this design, the chemical Consumption will be dramatically reduced. The distribution of process chemicals on the guard is controlled by the rotor, which causes a more uniform and efficient processing. Multiple steps can be completed in the machine at the same time, which will reduce the potential damage to the workpiece due to contamination. 5. Description of the invention (4) and speeding up the manufacturing steps. In a second and separate content order, the first and second rotors each have a one-in and one-out opening. The first and second rotors can be moved relative to each other to w , Partially align the opening for loading and unloading a workpiece. The first and second rotors can move relative to each other at the same time, so that the opening of the guarding of the workpiece does not need to be aligned. Preferably, the opening The device includes at least one actuator for moving at least one of the rotors in a direction parallel to the rotation of the rotor. This design allows workpieces to be loaded into and unloaded from human machinery faster and easier. A-in-third content towel, the head The end is connected to a swinging arm on the head lifter for vertically moving the head toward and away from a base, the base has a liquid source for applying liquid to the bottom surface of the workpiece. The liquid source may be The sister element containing the liquid 'optionally includes a source of sonic energy, such as a huge sonic transmitter. This design provides a variety of machines capable of performing more types of processing steps' which includes turning the workpiece to implement the device side down Li Ergong. In a fourth and separate content, in the method of workpiece processing, the workpiece is horizontally moved to the-process head end. The head end and the guard are reversed and lowered toward a liquid source, the liquid The source provides liquid to the bottom surface of the workpiece. The liquid system is applied to the bottom surface of the workpiece by directly contacting the liquid pool or through the liquid outlet, by spraying or dipping. The workpiece rotates during or after the liquid is applied to the bottom surface of the workpiece. -The same or different liquid or a gas or vapor is selectively introduced into the top surface of the workpiece. This method provides a variety of process steps with less process chemicals and water consumption. It also eliminates the need to move workpieces, thereby reducing manufacturing time and space requirements. 559571

在第五内今中,—機械包括一工件外殼’而該外殼具 有力i力口工流體藉由離心力分佈通過加工室中之工 件表面。-製㈣端握持_卫件,且使得該工件底部打開 或開放、。—底座具有容納液體的砵件。-音速能源,諸如 巨大曰速傳送器,相連於該⑹卜該頭端移動使該工件配 置與砵内,體接觸。音速能量由該音速能源移動通過液體 至工件’藉此改良工件的加工。當製程頭端與液體接觸時 ’其選擇性地旋轉該工件。 在這二内谷中,9速能量的使用將加速加工且提供更有 效的加工°音速能量與反應器的使用,諸如敘述於現今使 用之國際專利申請案號碼WO99/46064 ,在這些反應器中, 由於通常為封閉結構;旋轉轉子;沿著該工件及/或缺少連 續性的液體容積,係大致反直觀的。然而,現在已發現音 速能量能實際地使用於這些型式反應器中,藉此提供改良 的加工。 因此,本發明之一目的係提供改良方法及裝置用於加工 一工件。本發明同時存在於步驟及所述特性的副組合中。 相關於一實施例之敘述與圖示特性當然可使用於其它實施 例中。 圖式簡單敘述 在圖式中’相同的元件編號用來表示相同的元件。 圖1係一工件加工之反應器或機械之切面透視圖。 圖2係圖1所示反應器的截面圖。 圖3係圖1反應器某元件的放大細圖。 本纸張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) 6 ) i、發明説明( 圖4係圖2所示下方加工室之底部透視圖。 圖5及6係圖3所示特性之進一步放大細圖。 圖7係圖1及2反應器中所示之上轉子的放大透視圖。 圖8係圖1及2反應器中所示之下轉子的放大透視圖。 圖9係一頭端上方位置所示變換工件加工系統的截面@。 圖10係如圖9所示在一頭端下方位置之系統截面圖。 圖11係圖9之製程頭端的部份透視圖。 圖12係圖9·11所示製程頭端的放大截面圖,其具有㈣ 程頭端於該頭端上位置及下方或外轉子於一延伸位置7用& 於加載及卸載一工件。 圖13係-其具有頭端上方及在收縮位置中下方或外部轉 子所示之製程頭端的截面圖。 圖14係一其變換截面圖。 圖15係一裝置具有圖丨-8或9-14所示系統之半圓形陣列之 概略平面圖。 圖16係一裝置具有圖丨-8或9_14所示系統之線性陣列之概 略平面圖。 圖17係一製程系統利用音速能量的透視圖。 圖1 8係一圖17所示底座下側之透視圖。 圖19係一圖1 8所示喷嘴的放大截面圖。 圖20係一沿著圖π之線20-20所取的截面圖。 本發明的詳細斂沭 參考圖1-8 ’反應裔1〇〇係提供用於加工室中之微電子工 件’諸如具有上側12、下側14及外部圓周16的矽晶圓55。 -9 - 559571 A7In the fifth inner case, the machine includes a workpiece casing, and the casing has a powerful working fluid distributed through the surface of the workpiece in the processing chamber by centrifugal force. -The holding end holds the guard and makes the bottom of the workpiece open or open. -The base has a clamshell that holds the liquid. -A sonic energy source, such as a giant speed transmitter, connected to the head and the head moving to bring the workpiece configuration into contact with the body. The sonic energy is moved by the sonic energy through the liquid to the workpiece ', thereby improving the machining of the workpiece. When the process head comes into contact with the liquid, it selectively rotates the workpiece. In these two inner valleys, the use of 9-speed energy will speed up processing and provide more efficient processing. Sonic energy and the use of reactors, such as those described in International Patent Application No. WO99 / 46064 used today, in these reactors, Because it is usually a closed structure; a rotating rotor; a fluid volume along the workpiece and / or lacking continuity, it is generally counter-intuitive. However, it has now been found that sonic energy can be practically used in these types of reactors, thereby providing improved processing. Therefore, it is an object of the present invention to provide an improved method and apparatus for processing a workpiece. The present invention exists in both steps and subcombinations of said characteristics. The features described and illustrated in relation to one embodiment can of course be used in other embodiments. Brief description of the drawings In the drawings, the same component number is used to indicate the same component. Figure 1 is a cutaway perspective view of a reactor or machine for workpiece processing. Fig. 2 is a sectional view of the reactor shown in Fig. 1. FIG. 3 is an enlarged detailed view of a certain element of the reactor of FIG. 1. This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) 6) i. Description of the invention (Figure 4 is the bottom perspective view of the lower processing room shown in Figure 2. Figures 5 and 6 are shown in Figure 3. A further enlarged detailed view showing the characteristics. Fig. 7 is an enlarged perspective view of the upper rotor shown in the reactors of Figs. 1 and 2. Fig. 8 is an enlarged perspective view of the lower rotor shown in the reactors of Figs. 1 and 2. Fig. 9 The cross section of the workpiece processing system is shown at a position above the head end. Fig. 10 is a cross-sectional view of the system at a position below the head end as shown in Fig. 9. Fig. 11 is a partial perspective view of the head end of the process of Fig. 9 Fig. 9.11 is an enlarged cross-sectional view of the process head end, which has a process head end position above and below the head end or an outer rotor in an extended position for loading and unloading a workpiece. Fig. 13-Its A cross-sectional view of a process head with the head end above and in the retracted position below or below the external rotor. Figure 14 is a cross-sectional view of the transformation. Figure 15 is a device with half of the system shown in Figures 丨 -8 or 9-14 A schematic plan view of a circular array. Figure 16 is a linear array of a device with the system shown in Figure 丨 -8 or 9_14 Figure 17 is a perspective view of a process system using sonic energy. Figure 18 is a perspective view of the lower side of the base shown in Figure 17. Figure 19 is an enlarged sectional view of the nozzle shown in Figure 18. Figure 20 is a cross-sectional view taken along the line 20-20 of FIG. Π. Refer to Figure 1-8 for details of the present invention. 'Reaction 100 is a microelectronic workpiece for use in a processing room', such as having an upper side. 12. Silicon wafer 55 on the lower side 14 and the outer circumference 16. -9-559571 A7

對於某些制,該上側12係前側,其可另外稱為裝置側, 且該下側U係後側,其可另外稱為㈣置側。然、而,對於 其它應用,工件55係反向的。 、 反應器1GG具有含上或室壁12()之上室構件或轉子ιι〇 ,及 包括下室壁14〇之下室構件或轉子112。這些壁面12〇及14〇 能移動分開,藉由加載及卸載機構(未顯示),其例如可以具 有操縱機構之機器人形式,用以容許工件55裝載進入反應 器100内用於加工。壁面120及140係配置同時移動用以沿^ 加工位置中的晶圓55形成室160。 反應器100可沿軸A旋轉。頭端2〇〇包含上轉子11〇 ,而該 上轉子包括上至壁120。一馬達220提供用於旋轉上轉子11〇 。上轉子110驅動下轉子,使得當其接合於閉合位置時,該 上轉子、下轉子及工件均同時旋轉。該馬達22〇藉由轉動元 件軸承224驅動套管222,而該套管係軸向支撐於頭端2〇〇中 。碩端200提升向上用於打開或分離壁面12〇及14〇 ,且降低 用於接合壁面120及140或使其朝向彼此接近。 上室壁面120具有入口 122,用於加工流體,其可為液體 、汽體或氣體。下室壁面140也具有一入口 142,用於此類 流體。所提供通過入口 122及142的流體可為相同流體或不 同流體。頭端200包括上噴嘴210,其軸向延伸通過套管222 ’以便不會干擾套管222的旋轉。上喷嘴210導引加工流體 向下流過上轉子中之上室壁面丨2〇的入口 122。 上室壁面120包括一相同出口 124的陣列,其較佳地沿 著垂直軸A以固定角度空間彼此間隔。在所示設計中,使 -10- 本紙張尺度遴用中國國家標準(CNS) A4規格(210X297公爱) 559571 A7 B7For some systems, the upper side 12 is the front side, which may be otherwise referred to as the device side, and the lower side U is the rear side, which may be otherwise referred to as the placement side. However, for other applications, the workpiece 55 is reversed. The reactor 1GG has a chamber member or rotor 112 including an upper or lower chamber wall 12 (), and a chamber member or rotor 112 including a lower chamber wall 14 (lower). These wall surfaces 12 and 14 can be moved apart, and by means of a loading and unloading mechanism (not shown), which can, for example, be in the form of a robot with a manipulation mechanism to allow the workpiece 55 to be loaded into the reactor 100 for processing. The wall surfaces 120 and 140 are configured to move simultaneously to form a chamber 160 along the wafer 55 in the processing position. The reactor 100 is rotatable along an axis A. The head end 200 includes an upper rotor 110, and the upper rotor includes up to a wall 120. A motor 220 is provided for rotating the upper rotor 110. The upper rotor 110 drives the lower rotor so that when it is engaged in the closed position, the upper rotor, the lower rotor, and the workpiece all rotate simultaneously. The motor 22 drives the sleeve 222 through a rotating element bearing 224, and the sleeve is axially supported in the head end 200. The large end 200 is lifted upward to open or separate the wall surfaces 12 and 14 and lowered to join the wall surfaces 120 and 140 or make them close to each other. The upper chamber wall surface 120 has an inlet 122 for processing a fluid, which may be a liquid, a vapor, or a gas. The lower chamber wall surface 140 also has an inlet 142 for such fluids. The fluids provided through inlets 122 and 142 may be the same fluid or different fluids. The head end 200 includes an upper nozzle 210 that extends axially through the sleeve 222 'so as not to interfere with the rotation of the sleeve 222. The upper nozzle 210 directs the processing fluid downwardly through the inlet 122 of the upper chamber wall surface 20 in the upper rotor. The upper chamber wall surface 120 includes an array of identical outlets 124, which are preferably spaced from each other at a fixed angular space along the vertical axis A. In the design shown, -10- this paper size is selected from the Chinese National Standard (CNS) A4 specification (210X297 public love) 559571 A7 B7

用三十六此類出口丨24。出口 124經剛好稍小於工件半徑 由垂直軸A向外間隔。出口 124也可經更小的徑向距離, 諸如約1-5 mm的距離,由加工位置中所支撐工件55外圍 16向内間隔。 當上及下轉子同時聚合時,室壁面12〇及14〇形成微型環 境室160。此室160包括一上加工室段126,其係由上室壁面 120及晶圓55之一第一或上方概呈平面表面所界定。室16〇 同時包括一下加工室或段146 ,其係由下室壁面14〇及對立 於該第一側之支撐晶圓之一第二或底部概呈平面表面所界 定。上及下加工室126及146係透過環形區域13〇,且超過晶 圓55的外圍16而彼此連接或與流體溝通。當連結在一起時 ,形成該室160之上及下轉子係由環形,可壓縮密封(例如〇 形環)132沿下轉子112密封。密封132容許加工流體進入下 入口 142,以維持充份壓力流向出口 124。 如圖3所示,下喷嘴260提供於下室壁面14〇的入口 142, 且包括二或多埠262。這些導引二或多加工流體流向上通過 入口 142。導向埠262使其產生定向流,用以約略收斂定向 流達到晶圓55之下表面。反應器100同時較佳地包括一沖洗 喷嘴280 ,其位於下喷嘴260的一側,用於導引沖洗氣流, 諸如氮,通過下喷嘴260。 反應器100可具有一底座300,其支撐下喷嘴26〇及沖洗喷 嘴280,且界定一同轴環形流通系統32〇。該流通系統32〇具 有數個(例如四個)排放管322(其一如所示)(> 各排放管係透 過提升閥340氣動驅動用於打開及關閉排放管322。這些排 -11 -Use thirty-six such exits. The exit 124 is spaced outward from the vertical axis A by just slightly smaller than the workpiece radius. The exit 124 may also be spaced inwardly by a smaller radial distance, such as a distance of about 1-5 mm, by the periphery 16 of the workpiece 55 supported in the processing position. When the upper and lower rotors are polymerized at the same time, the wall surfaces 120 and 140 form the micro-environment chamber 160. The chamber 160 includes an upper processing chamber section 126 which is defined by a first or upper substantially planar surface of one of the upper chamber wall surface 120 and the wafer 55. The chamber 16 also includes a lower processing chamber or section 146, which is bounded by a lower chamber wall surface 14o and a second or bottom approximately planar surface of one of the supporting wafers opposite the first side. The upper and lower processing chambers 126 and 146 are connected to each other or communicate with the fluid through the annular region 13 and beyond the periphery 16 of the wafer 55. When joined together, the upper and lower rotors forming the chamber 160 are sealed along the lower rotor 112 by an annular, compressible seal (e.g., O-ring) 132. The seal 132 allows processing fluid to enter the lower inlet 142 to maintain sufficient pressure to flow to the outlet 124. As shown in FIG. 3, the lower nozzle 260 is provided at the inlet 142 of the lower chamber wall surface 14 and includes two or more ports 262. These direct two or more process fluid streams upward through inlet 142. The guide port 262 causes it to generate a directional flow to approximately converge the directional flow to the lower surface of the wafer 55. The reactor 100 also preferably includes a flushing nozzle 280 located on one side of the lower nozzle 260 for directing a flushing gas stream, such as nitrogen, through the lower nozzle 260. The reactor 100 may have a base 300, which supports the lower nozzle 26o and the flushing nozzle 280, and defines a coaxial annular flow system 32o. The circulation system 32 has several (for example, four) discharge pipes 322 (one of which is shown) (> each discharge pipe system is pneumatically driven through a poppet valve 340 for opening and closing the discharge pipe 322. These discharges -11-

559571 A7 B7 五、發明説明(9 放管322提供分離路徑,傳導不同型式加工液體至適當系統 (未表示),用於儲存、配置或循環。 上轉子2 10上之環形邊緣3 6 0,由位於流通系統3 2 〇上方之 上室壁面120,向下延伸。各出口 124之方向係導引加工流 體離開此出口 124,使沿著環形邊緣360内表面362通過流體 通道364。内表面362如所示向外及向下展開❶這將導致加 工流體達到内表面362,且當轉子旋轉時利用離心力向外及 向下朝流通系統流動。於是,加工流體易於掃除通過流通 系統320而朝向排放管322。 在與流通系統320溝通的環形區域204中,上轉子11〇具有 肋形表面215,其面向且與頭端2〇〇的平滑下表面緊密間隔 。當上轉子110旋轉時,肋形表面215易於在環形區域2〇4產 生空氣而捲動。這有助掃除加工流體通過流通系統32〇而朝 向排放管322。 上室壁面120具有隔片128,其向下突出,用以避免晶圓 55由加工位置提升,且防止接觸上室壁面12〇。下室壁面 MO具有隔片148,其向上突出用於間隔下室壁面14〇上方的 晶圓55。柱件15〇向上突出正好超過晶圓55的外圍16,用以 避免晶圓5 5偏離垂直軸A的中心。 參考圖8,下轉子112可包括一提升機構4〇〇 ,用於提升加 工位置中所支撐的晶圓55至一升高的位置。當頭端2〇〇提升0 高於底座300時,提升機構提升晶圓55至該升高的位置,用 以打開或分離上及下室壁面120及14〇。提升晶圓55至升高 位置,這將容許其藉由加載及卸載機構(未表示),諸如機械 -12-559571 A7 B7 V. Description of the invention (9 The discharge pipe 322 provides a separation path to conduct different types of processing liquid to an appropriate system (not shown) for storage, configuration or circulation. The upper rotor 2 10 The annular edge 3 6 0, by The chamber wall surface 120 is located above the circulation system 3 2 0 and extends downward. The direction of each outlet 124 directs the processing fluid away from this outlet 124 so that the inner surface 362 along the annular edge 360 passes through the fluid channel 364. The inner surface 362 is Extend outward and downward as shown: This will cause the processing fluid to reach the inner surface 362 and use centrifugal force to flow outward and downward toward the circulation system as the rotor rotates. Thus, the processing fluid is easily swept through the circulation system 320 toward the discharge pipe 322. In the annular region 204 communicating with the circulation system 320, the upper rotor 11 has a ribbed surface 215 facing and closely spaced from the smooth lower surface of the head end 200. When the upper rotor 110 rotates, the ribbed surface 215 is easy to generate air in the annular area 204 and scroll. This helps to sweep the processing fluid through the circulation system 32 to the discharge pipe 322. The upper chamber wall surface 120 has a partition 128, It protrudes downward to prevent the wafer 55 from being lifted from the processing position and to prevent contact with the upper chamber wall surface 120. The lower chamber wall surface MO has a spacer 148 that protrudes upward to space the wafer 55 above the lower chamber wall surface 140. The pillar 15 projects upward beyond the periphery 16 of the wafer 55 to prevent the wafer 55 from deviating from the center of the vertical axis A. Referring to FIG. 8, the lower rotor 112 may include a lifting mechanism 400 for lifting processing. The wafer 55 supported in the position is raised to a raised position. When the head end 200 is lifted 0 above the base 300, the lifting mechanism lifts the wafer 55 to the raised position to open or separate the upper and lower chambers. Walls 120 and 14. The wafer 55 is lifted to a raised position, which will allow it to be loaded and unloaded by a mechanism (not shown), such as mechanical-12-

559571 A7 B7 五、發明説明(1〇 ) 手臂來卸載。 提升機構400包括一提升桿42〇陣列。各提升桿42〇可經樞 軸插銷422樞轉安裝於下室壁面14〇 ,該插銷延伸至下室壁 面140中的插座424。當轉子同時移動且當上及下室壁面12〇 及140閉合時,各回轉桿42〇係配置經上室壁面12〇來接合。 各回轉桿420接著轉入不活動或下方位置。當不經上室壁面 120接合時,各提升桿420利用作用於鉤子425上之彈性構件 440(例如,〇-形環),偏轉或彈性加載,用以轉入該活動或 上方位置。當該提升桿420由下方位置樞轉至上方位置時, 各挺升才干420上的插銷422延伸於加工位置中所支撐晶圓55 的下方,且提升該晶圓至升高位置。 暫時地參考圖4,當在閉合位置時,該上及下轉子藉由閉 鎖機構500彼此連接。如圖2、3及4,該閉鎖機構包括一閉 鎖環520 ,其保留在下轉子112上,且其適應用以接合上室 壁面120中所配置互補外型的凹口 542。該閉鎖環520係由具 向内階段部530陣列之彈性彈簧材料(例如聚偏氟乙烯)所製 成,其容許閉鎖環520由未變形狀態,其中閉鎖環520具有 第一直徑’而改變至一變形狀態,其中閉鎖環52〇具有比較 小直徑。此變形係當階段部530受到徑向向内定向力而產生 。當移除該力時,閉鎖環52〇回至未變形狀態。 閉鎖機構500進一步包括一閉鎖凸輪545陣列,各連帶一 各別之階段部530。各閉鎖凸輪540適合於施加徑向力至各 別階段部530。 如圖2所示,閉鎖機構500進一步包括一致動環560,當致 •13- 本紙張尺度適用中Η ®家標準(CNS) A4規格(210X297公ί) — ' 559571 A7 _____B7 五、發明説明(11 ) 動% 560於預定限制動作範圍内上升或下降時,該機構適合 於致動閉鎖凸輪540。致動環560當上升時適合於致動閉鎖 凸輪540,而當下降時解除閉鎖凸輪。氣動提升器58〇(例如 一個此類裝置)係適合上升且下降致動環56〇。當致動環56〇 上升時,該上及下室壁面12〇及140彼此釋放,使得頭端2〇〇 能由底座300提升用於打開上及下室壁面12〇及14〇,或下降 至底座3 00用於關閉上及下室壁面12〇及14〇。 如圖3所示,當致動環560提升時,致動環56〇上之插銷 562向上犬出且進入定位環570中的通孔564。定位環570結 合至下室壁面140且隨其旋轉。當致動環56〇下降時,插銷 562由通孔564抽出且清除定位環57〇。當突出進入各別通孔 564時,插銷562對齊已支撐於加工位置中的晶圓55,使易 於利用上述機械系統卸載晶圓55。 在使用上,當轉子彼此間隔,一工件配置於由桿件42〇所 支撐之下轉子上。轉子接著聚合在一起。這將工件向下移 動至加工位置’其間工件經僅例如,〇·1· , 0.5 _ 〇·9或0.7 mm的小型空隙與上及下室壁面12〇及14〇間隔。較 佳地,加工室160形成於扁平工件,諸如半導體晶圓或微電 子工件55之一般型狀,且密切地適應工件的扁平表面。一 般而言,工件與上及下壁面間的空隙係約〇·75 mm。馬達旋 轉轉子及工件。液體或氣體透過入口 122及142引入。液體 利用離心力向外流動通過工件。這以相當薄的液體層披覆 工件。壁面及工件的緊密間隔有助於提供控制及均勻的液 流。氣體,如果使用,能沖洗或限制液體的汽體,或同時 本纸張尺度適用中國國家標準(CNS) A4規格(210X297公釐) 559571 A7 _________Β7 五、發明説明(12 ) 提供工件的化學處理。旋轉動作驅動流體向外通過工件, 且接著透過出口 124流出室160外。該閥340控制釋放自底座 3 00的流體。 許多利益直接地由反應器室中的降低流體流動區域而 產生。一般而言,因為非常少的流體浪費,加工流體的 使用將更有效率。再者,利用反應器室之降低流體流動 區域,其通常易於控制流體流動的物理參數,諸如溫度 、流動體積,等等。這將產生更為一致的結果,且使其 結果可重覆。 多重單一工件連續製程也能利用二或多個加工流體連續 地提供通過反應器室單一入口來完成。提供不同流體至工 件之上及下表面之能力容許特殊的加工操作。例如,諸如 HF液體之加工流體可供給至反應室之下流體入口,用於加 工下晶圓表面,而一不活潑流體,諸如氮氣可提供至上流 體入口。因而,HF液體容許與晶圓下表面反應,而晶圓上 表面有效地隔離HF反應。 反應器100能實行寬廣範圍的功能。例如,反應器1〇〇能 實行一需要加工流體完全接觸工件第一側,及僅工件第二 侧之圓周邊緣部份的製程。進入下室壁面140入口 142的加 工流體能作用於晶圓55的下側14上。於達到出口 124前,該 流體能作用於支撐晶圓55的外圍16,及作 12的外邊賴上。於達到一,除上側12二邊= ’進入上室壁面版口 122之加工流體能作用於晶圓”之 上側12上。 ^纸張尺度逋用中國國家標準(CNS) A4規格(210X 297公釐)559571 A7 B7 V. Description of the invention (10) Arm to unload. The lifting mechanism 400 includes an array of lifting rods 42. Each lifter lever 42 can be pivotally mounted on the lower chamber wall surface 14 via a pivot pin 422, which extends to a socket 424 in the lower chamber wall surface 140. When the rotor moves at the same time and when the upper and lower chamber wall surfaces 12o and 140 are closed, each of the rotary rods 42o is configured to be joined via the upper chamber wall surface 12o. Each swivel lever 420 then turns into an inactive or lowered position. When not engaged through the upper chamber wall surface 120, each of the lifting rods 420 is deflected or elastically loaded with an elastic member 440 (for example, a 0-ring) acting on the hook 425 to turn into the movable or upper position. When the lift lever 420 is pivoted from the lower position to the upper position, the pins 422 on each of the lifting capabilities 420 extend below the wafer 55 supported in the processing position, and lift the wafer to the raised position. Referring temporarily to FIG. 4, when in the closed position, the upper and lower rotors are connected to each other by a locking mechanism 500. As shown in FIGS. 2, 3 and 4, the locking mechanism includes a locking ring 520 retained on the lower rotor 112 and adapted to engage a notch 542 configured in the complementary shape of the upper chamber wall surface 120. The latching ring 520 is made of an elastic spring material (such as polyvinylidene fluoride) with an array of inward-stage portions 530. The latching ring 520 allows the latching ring 520 to be in an undeformed state, wherein the latching ring 520 has a first diameter 'and changes to A deformed state in which the lock ring 52 has a relatively small diameter. This deformation occurs when the stage portion 530 is subjected to a radially inwardly directed force. When this force is removed, the lock ring 52 returns to its undeformed state. The locking mechanism 500 further includes an array of locking cams 545 each associated with a respective stage portion 530. Each latching cam 540 is adapted to apply a radial force to the respective stage portion 530. As shown in FIG. 2, the locking mechanism 500 further includes a uniform moving ring 560. When the standard of this paper is applicable to the standard of China Standards (CNS) A4 (210X297), '559571 A7 _____B7 V. Description of the invention ( 11) The mechanism is adapted to actuate the lock cam 540 when the movement% 560 rises or falls within a predetermined limited action range. The actuation ring 560 is adapted to actuate the latching cam 540 when raised, and release the latching cam when descended. A pneumatic lifter 58 (such as one such device) is suitable for raising and lowering the actuating ring 56. When the actuation ring 56 rises, the upper and lower chamber wall surfaces 120 and 140 are released from each other, so that the head end 200 can be lifted by the base 300 for opening the upper and lower chamber wall surfaces 12 and 14 or lowered to The base 300 is used to close the upper and lower chamber wall surfaces 120 and 140. As shown in FIG. 3, when the actuating ring 560 is lifted, the latch 562 on the actuating ring 56 is pulled out upward and enters the through hole 564 in the positioning ring 570. The positioning ring 570 is coupled to the lower chamber wall surface 140 and rotates therewith. When the actuating ring 56 is lowered, the latch 562 is withdrawn from the through hole 564 and the positioning ring 57 is cleared. When protruding into the respective through holes 564, the pins 562 are aligned with the wafer 55 already supported in the processing position, making it easy to unload the wafer 55 using the above-mentioned mechanical system. In use, when the rotors are spaced apart from each other, a workpiece is arranged on the rotor supported by the rod 42. The rotors then converge. This moves the workpiece down to the processing position 'during which the workpiece is spaced from the upper and lower chamber wall surfaces 12 and 14 by a small gap of, for example, only 〇 · 1 ·, 0.5_0.9 · or 0.7 mm. Preferably, the processing chamber 160 is formed on a flat workpiece, such as a semiconductor wafer or a microelectronic workpiece 55, and closely conforms to the flat surface of the workpiece. In general, the gap between the workpiece and the upper and lower wall surfaces is about 0.75 mm. The motor rotates the rotor and the workpiece. Liquid or gas is introduced through the inlets 122 and 142. Liquid flows outward through the workpiece using centrifugal force. This coats the workpiece with a relatively thin liquid layer. The tight separation of the walls and the workpiece helps to provide a controlled and uniform flow. Gas, if used, can flush or restrict liquid vapor, or at the same time This paper size applies Chinese National Standard (CNS) A4 specification (210X297 mm) 559571 A7 _________B7 5. Description of invention (12) Provide chemical treatment of workpieces The rotational motion drives the fluid outward through the workpiece, and then flows out of the chamber 160 through the outlet 124. The valve 340 controls the fluid released from the base 300. Many benefits arise directly from the reduced fluid flow area in the reactor chamber. In general, because very little fluid is wasted, the use of process fluids will be more efficient. Furthermore, using the reduced fluid flow area of the reactor chamber, it is usually easy to control the physical parameters of the fluid flow, such as temperature, flow volume, and so on. This will produce more consistent results and make them repeatable. Multiple single workpiece continuous processes can also be accomplished using two or more processing fluids continuously provided through a single inlet through the reactor chamber. The ability to provide different fluids to the upper and lower surfaces of the workpiece allows special machining operations. For example, a processing fluid such as HF liquid may be supplied to the fluid inlet below the reaction chamber for processing the lower wafer surface, and an inert fluid such as nitrogen may be supplied to the upper fluid inlet. Thus, the HF liquid is allowed to react with the lower surface of the wafer, while the upper surface of the wafer effectively isolates the HF reaction. The reactor 100 can perform a wide range of functions. For example, the reactor 100 can perform a process that requires the processing fluid to fully contact the first side of the workpiece and only the peripheral edge portion of the second side of the workpiece. The processing fluid entering the inlet 142 of the lower chamber wall surface 140 can act on the lower side 14 of the wafer 55. Before reaching the outlet 124, the fluid can act on the periphery 16 of the supporting wafer 55 and the outer edge of the substrate 12. After reaching one, the two sides except the upper side 12 = 'The processing fluid entering the upper chamber wall plate opening 122 can act on the upper side of the wafer.' ^ Paper size: Chinese National Standard (CNS) A4 specification (210X 297 male) (Centimeter)

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k -15- 559571 A7 B7 如一範例,反應器100能用於控制加工流體進入入口 l22 及142的壓力,用以完成加工流體容許接觸工件之第一側、 工件之圓周邊緣,及工件對立側的圓周區域的製程。此流 體流動/接觸也能視作將施加至對立側之加工流體排除其側 之圓周邊緣外的方式。在此製程實施例中,一薄膜材料由 該第一側、工件之圓周邊緣,及工件對立側的圓周區域蝕 刻。 圖9_Π表示於變換系統中,該系統具有一開放於底部上 之反應器,用以利用其它技術施加流體至工件的下表面。 這容許工件裝置側向下單側之加工。反應器可具有一開放 下轉子,用以容許來自反應器外部源之流體施加至工件的 底部或裝置側。如工件將裝置側裝載向上,流體能通過下 轉子中開口施加至工件的後側上。一種具有轉子的系統將 工件底部曝露於外部施加的流體較佳包括具有環形下轉子 的反應器頭端。該頭端係於頭端向上位置用於加載及卸載 ,且在頭端向下位置用於加工。該頭端可移動朝向或遠離 底座。通過開放下轉子,該底座施加流體至工件的下部表 面0 圖9表示反應器系統700許多可能設計外的一種設計,用 於工件裝置側向下單側之加工,或用於外部施加流體至工 件的底部表面。如圖9所示,該系統700包括一連接至升高 益或提升組件702之支撐臂711的製程頭端714。升高器組件 702包括一包圍提升馬達7〇6之升高器外殼7〇4,該馬達轉動 導螺桿708,用以提升下方電樞71〇 ^該支撐臂711連接至電 -16- ^張尺度適財關冢群(CNS) Α4規格(摩297公釐)----—k -15- 559571 A7 B7 As an example, the reactor 100 can be used to control the pressure of the processing fluid entering the inlets 12 and 142 to complete the processing fluid allowed to contact the first side of the workpiece, the peripheral edge of the workpiece, and the opposite side of the workpiece. Manufacturing process in a circumferential area. This fluid flow / contact can also be considered as a way to exclude the processing fluid applied to the opposite side from the peripheral edge of its side. In this embodiment of the process, a thin film material is etched from the first side, the peripheral edge of the workpiece, and the peripheral area of the opposite side of the workpiece. Figure 9_Π is shown in the transformation system, which has a reactor open on the bottom for applying fluid to the lower surface of the workpiece using other techniques. This allows machining of the workpiece device side to side. The reactor may have an open lower rotor to allow fluid from an external source of the reactor to be applied to the bottom or device side of the workpiece. If the workpiece is loaded with the device side up, fluid can be applied to the rear side of the workpiece through the opening in the lower rotor. A system with a rotor that exposes the bottom of a workpiece to an externally applied fluid preferably includes a reactor head having a ring-shaped lower rotor. The head end is tied to the head end up position for loading and unloading, and the head end down position is used for processing. The head end can be moved towards or away from the base. By opening the lower rotor, the base applies fluid to the lower surface of the workpiece. Figure 9 shows one of the many possible designs of the reactor system 700 for processing from the workpiece device side down to one side, or for externally applying fluid to the workpiece. Bottom surface. As shown in FIG. 9, the system 700 includes a process head end 714 connected to a support arm 711 of a lifter or lifter assembly 702. The lifter assembly 702 includes a lifter housing 700 that surrounds a lift motor 70. The motor rotates a lead screw 708 to lift the lower armature 71. The support arm 711 is connected to the electric -16- Standards for Financial Seizures (CNS) A4 Specification (297 mm)

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559571 A7 B7 五、發明説明(14 ) ' --~~- 樞m。電樞710中的支樓臂馬達或致動器712轉動或拖轉製 私頭端7 14’由圖9所示之頭端向上位置至圖1()所示頭端 下位置。 又參考圖9,底部716提供位於製程頭端714下方。底部包 括-流體源用於提供流體至工件55的底部表面。該底座716 可連接至升高器組件7G2或支撐於地板上。升高器組件加 車乂佳支撐於地板上。底座716垂直對齊製程頭端714的下方 。升_高器組件702移動製程頭端714朝向及離開底座716。圖 9表不製私頭端714提升離開底座716,且將製程頭端7丨4置 於頭端向上位置,用於加載或卸載工件55。圖1〇表示製程 頭端714位於向下位置,且將製程頭端714接合底座“,用 於施加流體至工件5 5的底部表面。 圖9及10所示之設計具有底座716固定在升高器組件702上 。忒製程頭端714可以垂直方向v移動朝向及離開底座716。 製程頭端714也可沿水平通路H樞轉。雖然這些係製程頭端 714間較佳相對運動,升高器組件7〇2 ,及底座716,各種其 匕運動也可使用。例如,一或多製成頭端714可沿著垂直軸 ,諸如圖9所示之E軸樞轉。一或多底座716可在垂直、側面 、縱向方向固定或移動,或沿著垂直軸樞轉或旋轉。如此 ’該底座716或底座可相對於其支撐結構移動或固定,諸如 升兩器組件702。相同地,製程頭端714可具備其它形式運 動。此外,除了一側藉由支撐臂7丨丨支撐,該製程頭端7 i 4 可由上述或其它方式支撐。製程頭端714也可支撐或至接地 連接至底座716,而非連接至升高器組件7〇2。此外,圖9所 -17- 本紙張尺度適用中國國家標準(CMS) A4規格(210 X 297公釐) 五、發明説明(15 ) 示頭端上方位置及提供頭端上方 乃及頭鳊下方位置間運動之 支撐臂馬達712可省略頭端下方位置中 7仅直干所貫仃包括加載及卸 載的所有功能。如此,圖9及1G,雖然表示較佳設計,卻只 是本發明所打算許多設計之一。 現在回到圖U·14’除了如下述外,製程頭端或轉子714 相同於㈣所示反應器之設計與操作。當圖9]4所示製程 碩端714實行圖1()所示頭端下方位置之加工於之下 面敘述,該名稱“上方,,、“下方,,、“向上,,、“向下”,及敘述 位置相對於重力的相同名稱係在此用來敘述頭端下方位置 具製程頭端7U的系統70(^圖10之頭端向下位置對應至反 向之圖13及14。 最初參考圖11及12,製程頭端714包括一下方或外轉子 730,其位於或低於頭端外殼734内的上或内轉子^二。上轉 子732經一軸741連接至頭端旋轉馬達738。相同於圖卜8, 流體可由流體所供給之上喷嘴744,經延伸通過管件74〇之 供給管線,提供至工件55的上表面。馬達738藉由圖12所示 之馬達板746支撐於頭端外殼734上。連接至頭端外殼734之 頭端蓋736覆蓋或封閉製程頭端714的内組件。 仍參考圖11及12 ,該下或外轉子730具有一環或環形結構 。下轉子730中的中心開口或區域73丨容許液體,由底座716 供給至工件55的底部表面。如圖12所示,下轉子環748連接 至下轉子730的頂部表面。下轉子730經下轉子環連接至或 隨上轉子旋轉。一風箱750連接至下轉子環748及上轉子732 的頂板752。參考圖12,下轉子延伸致動器760連接至馬達 -18- 559571 A7 B7 五、發明説明(16 ) 板746。各致動器760之軸或臂延伸通過馬達板746及頭端外 殼734中的開口,且推至下轉子環748上。較佳地,提供三 個氣動致動器760,使平均間隔於馬達板746上。如圖丨丨及 12所示’致動器760由延伸或外部位置移動下轉子730 ,用 於加載及卸載。圖13所示之回送彈箐742運用作用力連續地 驅使下轉730接合上轉子732。回送彈簧移動下轉子至一縮 回或用於加工的位置,且如圖13及丨4所示。 參考回至圖11,一加載/卸載開口或窗口 762延伸通過下 轉子730較佳之圓柱形側壁面。一加載/卸載或進出槽了料提 供於上轉子732較佳之圓柱形側壁面。上轉子732當由旋轉 馬達738驅動時,沿圖12之¥軸旋轉。上轉子732另外較佳地 固定於頭端外殼734的位置。下轉子73〇隨著上轉子732旋轉 且也可一方面在圖Η及12所示位置間,及另一方面圖13 及圖14所示位置間,以平行ν軸之方向軸向移動。當下轉子 730位於延伸位置,如圖丨丨及12所示,窗口 了心及下轉子 延伸出去,或打開或曝露上轉子732中的凹槽764。在凹槽 764 ,工件55及上轉子732間的垂直尺寸及高度,如f所指示 ’係充份容許端操縱裝置或其它機器設備或工具,移動通 過囪口 762用以提升晶圓離開上轉子732。窗口 762之寬度W 表面上大於工件55的直徑或特性尺寸,使得機器人能通過 窗口 762將工件抽出製程端頭714。 上轉子732具有插銷或支架766用於沿其圓周支撐工件, 且轉子732其餘部分間隔。相同地,下轉子730上之插銷或 支架768延伸朝向工件55 ,用以握持與下轉子73〇環形構造 -19- 559571 A7 ----------B7__ 五、發明説明(17 ) 間隔之工件55。當下轉子730位於延伸位置,如圖η所示, 工件利用重力停留在上轉子732的插銷766上。當下轉子73〇 位於收縮位置,如圖35所示,工件55固定、握持或夾持於 插銷766及768間,而與轉子其它構造間隔。上轉732也具有 導向插銷769,其位於表面上大於工件直徑之圓上。導向插 銷769保持工件大上居於上轉子中間。導向插銷延伸超過上 轉子732 — 1_5、2_4的高度,且典型約2.5 mm。工件支撐插 銷766具有約〇·7-〇.8 mm之公稱高度。相同地,下轉子上之 支撐插銷768由下轉子延伸超過約〇·7_〇·8 mm。就工件具有 約〇.7-0.8 mm厚度而言,當轉子聚合在一起時,在支撐插銷 及工件間有一約0.25 mm之公稱垂直空隙。該導向插銷769 作用為一硬式止動器,且設定轉子間的空隙。 當下轉子730位於圖13所示之收縮位置,該窗口 762移動 於頭端外殼734内,且上轉子732中之凹槽764藉由下轉子 730實心曲形側壁面覆蓋或閉合。 如圖12所示,出口 772由連續沿下轉子延伸之環形通道 77 1延伸通過下轉730之側壁面。相同地,出口 770延伸通過 外轉子732。參考圖13,當下轉子73〇位於收縮位置,出口 770連接進入環形通道771,藉此由工件55之上表面及上轉 子732之下表面間所形成之空間或室775,提供一出口路徑 。當下轉子移入圖13所示之製程位置時,徑向密封774密封 上及下轉子。 參考回至圖9,透過下轉子73 〇之開放中心區域731,該底 座716提供液體至工件55之下表面。因此,該底座716可包 -20-559571 A7 B7 V. Description of the invention (14) '-~~-Pivot m. The arm arm motor or actuator 712 in the armature 710 is turned or dragged. The private end 7 14 'is moved from the head up position shown in FIG. 9 to the head end down position shown in FIG. 1 (). Referring again to FIG. 9, the bottom 716 is provided below the process head end 714. The bottom includes a fluid source for providing fluid to the bottom surface of the workpiece 55. The base 716 can be connected to the riser assembly 7G2 or supported on the floor. The riser assembly is optimally supported on the floor. The base 716 is aligned vertically below the process head 714. The lifter assembly 702 moves the process head 714 toward and away from the base 716. FIG. 9 shows that the private head end 714 is lifted away from the base 716, and the process head end 7 丨 4 is placed in the head end upward position for loading or unloading the workpiece 55. FIG. 10 shows the process head 714 in the down position and engages the process head 714 with the base "for applying fluid to the bottom surface of the workpiece 55. The design shown in Figs. 9 and 10 has a base 716 fixed to the elevation The process head 714 can be moved in the vertical direction v toward and away from the base 716. The process head 714 can also be pivoted along the horizontal path H. Although these process heads 714 preferably move relatively, the lifter The assembly 702, and the base 716 can also be used for various dagger motions. For example, one or more of the head ends 714 can be pivoted along a vertical axis, such as the E-axis shown in FIG. Fixed or moved in a vertical, lateral, or longitudinal direction, or pivoted or rotated along a vertical axis. In this way, the base 716 or base can be moved or fixed relative to its supporting structure, such as the lifter assembly 702. Similarly, the process head The end 714 can be provided with other forms of movement. In addition, the process head end 7 i 4 can be supported by the above or other methods, in addition to being supported by the support arm 7 丨 丨 on one side. The process head end 714 can also be supported or connected to the ground to the base 716 Instead of connecting to Height device assembly 702. In addition, Figure 9-17-This paper size is applicable to the Chinese National Standard (CMS) A4 specification (210 X 297 mm) V. Description of the invention (15) Shows the position above the head end and provides the head end The support arm motor 712, which moves between the upper and lower positions of the head, can omit all the functions of loading and unloading, including direct loading and unloading in the lower position of the head. In this way, although Figures 9 and 1G show the better design, This is just one of the many designs contemplated by the present invention. Now returning to Figure U · 14 'except for the following, the process head or rotor 714 is the same as the design and operation of the reactor shown in Figure ㈣. The end 714 performs the processing of the position below the head end shown in FIG. 1 (). The name "above,", "below,", "up,", "down", and the position described with respect to gravity are the same. The name is used here to describe a system 70 with a process head end 7U at the position below the head end (^ The head end position of Fig. 10 corresponds to the reversed Figs. 13 and 14. Referring initially to Figs. 11 and 12, the process head end 714 Includes a lower or outer rotor 730 located at or below the head end housing 73 The upper or inner rotor inside 4. The upper rotor 732 is connected to the head-end rotation motor 738 through a shaft 741. As in Fig. 8, the fluid can be supplied by the upper nozzle 744 through the supply line extending through the pipe 74. Provided to the upper surface of the workpiece 55. The motor 738 is supported on the head end housing 734 by the motor plate 746 shown in FIG. Still referring to Figures 11 and 12, the lower or outer rotor 730 has a ring or ring structure. A central opening or region 73 in the lower rotor 730 allows liquid to be supplied from the base 716 to the bottom surface of the workpiece 55. As shown in FIG. 12, the lower rotor ring 748 is connected to the top surface of the lower rotor 730. The lower rotor 730 is connected to or rotates with the upper rotor via a lower rotor ring. An air box 750 is connected to the top plate 752 of the lower rotor ring 748 and the upper rotor 732. Referring to FIG. 12, the lower rotor extension actuator 760 is connected to the motor -18-559571 A7 B7 V. Description of the invention (16) Plate 746. The shaft or arm of each actuator 760 extends through the opening in the motor plate 746 and the head end housing 734, and is pushed onto the lower rotor ring 748. Preferably, three pneumatic actuators 760 are provided to be evenly spaced from the motor plate 746. As shown in Figures 丨 and 12, the actuator 760 moves the lower rotor 730 from an extended or external position for loading and unloading. The loopback bomb 742 shown in FIG. 13 continuously drives the lower rotor 730 to engage the upper rotor 732 by applying a force. The return spring moves the lower rotor to a retracted or machining position, as shown in Figures 13 and 4. Referring back to Fig. 11, a load / unload opening or window 762 extends through the preferably cylindrical side wall surface of the lower rotor 730. A loading / unloading or loading / unloading slot provides material to the preferably cylindrical side wall surface of the upper rotor 732. When the upper rotor 732 is driven by the rotation motor 738, it rotates along the ¥ axis of FIG. The upper rotor 732 is also preferably fixed to the position of the head end housing 734. The lower rotor 73 ° rotates with the upper rotor 732 and can also move axially in a direction parallel to the ν axis between the positions shown in Figs. Η and 12 on the one hand and the positions shown in Figs. 13 and 14 on the other hand. When the lower rotor 730 is located in the extended position, as shown in FIGS. 丨 and 12, the window and the lower rotor are extended out, or the groove 764 in the upper rotor 732 is opened or exposed. The vertical size and height between the groove 764, the workpiece 55 and the upper rotor 732, as indicated by f ', are sufficient allowable end manipulators or other machinery equipment or tools to move through the opening 762 to lift the wafer away from the upper rotor 732. The width W of the window 762 is larger than the diameter or characteristic size of the workpiece 55 on the surface, so that the robot can pull the workpiece out of the process end 714 through the window 762. The upper rotor 732 has a latch or a bracket 766 for supporting the workpiece along its circumference, and the rest of the rotor 732 is spaced. Similarly, the bolt or bracket 768 on the lower rotor 730 extends toward the workpiece 55 for holding and the lower rotor 73 ° ring structure-19- 559571 A7 ---------- B7__ 5. Description of the invention (17 ) Spaced workpiece 55. When the lower rotor 730 is located in the extended position, as shown in FIG. Η, the workpiece stays on the latch 766 of the upper rotor 732 using gravity. When the lower rotor 73 ° is located at the retracted position, as shown in FIG. 35, the workpiece 55 is fixed, held, or clamped between the pins 766 and 768, and is spaced from other structures of the rotor. The upturn 732 also has a guide pin 769, which is located on a surface larger than the diameter of the workpiece. The guide pin 769 keeps the workpiece large in the middle of the upper rotor. The guide pins extend beyond the height of the upper rotor 732 — 1_5, 2_4, and are typically approximately 2.5 mm. The work support pin 766 has a nominal height of approximately 0.7-0.8 mm. Similarly, the support pin 768 on the lower rotor extends from the lower rotor by more than about 0.7 mm. As far as the workpiece has a thickness of about 0.7-0.8 mm, when the rotors are brought together, there is a nominal vertical gap of about 0.25 mm between the support pin and the workpiece. The guide pin 769 functions as a hard stopper and sets a gap between the rotors. When the lower rotor 730 is located in the retracted position shown in Fig. 13, the window 762 is moved inside the head end housing 734, and the groove 764 in the upper rotor 732 is covered or closed by the solid curved side wall surface of the lower rotor 730. As shown in FIG. 12, the outlet 772 extends from the side wall surface of the downward rotation 730 by an annular channel 77 1 extending continuously along the lower rotor. Similarly, the outlet 770 extends through the outer rotor 732. Referring to FIG. 13, when the lower rotor 73 is in the retracted position, the outlet 770 is connected into the annular passage 771, thereby providing an exit path by a space or chamber 775 formed between the upper surface of the workpiece 55 and the lower surface of the upper rotor 732. When the lower rotor is moved into the process position shown in Fig. 13, the radial seal 774 seals the upper and lower rotors. Referring back to FIG. 9, the base 716 provides liquid to the lower surface of the workpiece 55 through the open center region 731 of the lower rotor 73 °. Therefore, the base 716 can pack -20-

559571 A7 B7559571 A7 B7

五、發明説明(18 ) 括為此目的的各種裝置,諸如一接觸或浸洗料件、 心喷嘴噴灑系、統,及-固定間隔喷㈣嘴陣列,或_或夕 個可移動式喷麗噴嘴,諸如一或多個平移或樞轉臂上之; 嘴。此外’易於液體接觸至工件之液體出口可用來 灑喷嘴。 圖9及10表示系統700具有一表面接觸或浸洗蛛件或 780於底座716中。邊緣葉片782可沿著绰件7 於加工期間用以補捉及導引液體流出或另外由工=除 。如使用,氣體或液體入口 786延伸進入緊鄰於邊緣葉 782之绰件780。液體入口 792及出口或排放管788,提供液 體進入或流出绰件78〇。連接至不同液體源之多重入口州 可被提供。 裝載件JL件55降低(於重力方向)且停留在插銷鳩上。 解除致動器760,容許彈簧742抽出下轉子73<),由圖η所示 延伸位置至圖13所示之收縮位置。工件55固定於插銷766及 768間。如圖15所示之邊緣密封環774大量地密封上及下轉 在使用上,單一工件55載入製程頭端714。參考圖9、n 及12 ’在較佳實施例中,製程頭端714位於頭端上方位置中 ’且升高或提升向上及離開底座716。下轉子73G位於該延 伸位置。工件55水平移動通過下轉子73〇中之窗口加,且 通過上轉子732中之凹槽764。較佳地,工件55由機器人裝 載。凹槽764之高度η係充份容許工件及機器人端操縱機構 ’用以清除或安裝於插銷766及768間。機器人端操縱機構 或手部能安裝通過側凹槽或開口 762及764且進入室775用以V. Description of the invention (18) Includes various devices for this purpose, such as a contact or dip material part, a core nozzle spray system, a system, and a fixed interval nozzle array, or a movable spray spray Nozzles, such as on one or more translation or pivot arms; mouth. In addition, a 'liquid outlet' for easy liquid contact with the workpiece can be used to spray the nozzle. 9 and 10 show that the system 700 has a surface contact or dip spider or 780 in a base 716. The edge blade 782 may be used to catch and guide the flow of liquid along the chamfer 7 during processing or otherwise be divided. If used, the gas or liquid inlet 786 extends into the piece 780 next to the edge leaf 782. The liquid inlet 792 and the outlet or discharge pipe 788 provide liquid entry or exit flow 78. Multiple inlet states connected to different liquid sources are available. The loader JL member 55 is lowered (in the direction of gravity) and stays on the latch dove. Deactivating the actuator 760 allows the spring 742 to withdraw the lower rotor 73 <) from the extended position shown in Fig. N to the retracted position shown in Fig. 13. The work 55 is fixed between the latches 766 and 768. A large number of edge seal rings 774 as shown in FIG. 15 seal up and down. In use, a single workpiece 55 is loaded into the process head end 714. Referring to Figures 9, n and 12 ', in a preferred embodiment, the process head end 714 is in a position above the head end' and raised or lifted upward and away from the base 716. The lower rotor 73G is located at this extended position. The workpiece 55 moves horizontally through the window in the lower rotor 73 and through the groove 764 in the upper rotor 732. Preferably, the workpiece 55 is loaded by a robot. The height η of the groove 764 is sufficient to allow the workpiece and the robot-side operating mechanism ′ to be cleared or installed between the pins 766 and 768. The robot-side operating mechanism or hand can be installed through the side grooves or openings 762 and 764 and enter the room 775 for

559571 A7 _ B7 五、發明説明(~~) ~ -- 子在一起,用以避免或減少其間的洩漏。當下轉子73〇位於 收縮位置,窗口 762及凹槽764不再對齊。直接進出入口進 入室775係因此關閉。馬達712移動製程頭端714由圖9所示 頭端上方位置至圖10所示頭端下方位置。升高器組件7〇2移 動製程頭端7 14而與底座716接合。 製程液體提供進入钵件780透過液體入口 792藉此形成液 體溶液。當製程頭端714接合底部716,工件55的底部表面 接觸該溶液。工件55可完全浸洗於溶液中。變換地,僅底 部表面或底部表面及工件邊緣可接觸溶液。工件至溶液接 觸的範圍可由改變承盤780中液位,或改變製程頭端714及 底部716間相對垂直位置來調整。較佳地,缽件78〇的液位 係透過缽件側面之堰794的高度來設定。 當接觸溶液時,工件55可固定。變換地,旋轉馬達738較 佳地可以低RPM旋轉工件,有助易於液體移動通過工件表 面。其它製程汽體、氣體或液體可通過上噴嘴7料提供至工 件頂部表面。缽件78〇可其它液體施加器,諸如固定或移動 式喷灑喷嘴或液體出口來替換。 在液體溶液加工完成後,缽件78〇中的溶液經排放出口 788排放或移除。工件可接著選擇性地以高速旋轉,將製程 流體不論與否藉由喷嘴744引至工件頂部表面。該頭端可稍 微於旋轉前提升。諸如氮或空氣之氣體可藉由氣體入口 引入底座716,有助於由底部移除或沖洗液體。 在加工完成後,升高器組件702經致動升高器馬達7〇6將 製程頭端714提升離開底座716。支撐臂馬達712將製程頭端 -22- 本紙張尺度適用巾81 81家標準(CNS) A4規格(210X297公爱) ---- 五、發明説明( 714送回至頭端上方位置。延伸致動器76〇移動下轉子73〇回 送至延伸位置。工件接著由製程頭端714移除。 ”洗00谷許裝置側向下加工,為較佳易於各種製程步驟 ,特別當其關於加工半導體晶圓。 工件在圖9_14之設計令所消耗的量較佳受到控制,因為 工件係由相同部件所握持,該部件控制邊緣㈣區域,且 在馬達轴74i及工件55間僅具有二介面。第一介面位於定部 板及馬達軸741間。第二介面位於頂板及上轉子732間。 在圖15之系統600中,一機器手臂61〇沿軸615旋轉,用以 在_加載/卸載機台007及反應器100及/或7〇〇間之路徑6〇6, 實行運輸操作之系統6财,—或多個機器手臂 625沿線性路徑63〇傳送,用以在一加載/卸載機台6们及反 應器100及/或700間所須的運輸操作。 、本發明已圖示相關之晶圓。然而,其將瞭解本發明具有 較廣範圍的應用能力。利用範例,本發明可應用於碟片及 頭端的加工、扁平面板顯示器、微電子光罩,及其它裝置 需要有效及控制液體加工。 在一變換設計中,如圖17-20所示利用音速能量之加工系 統810具有一製程頭端812及底座814。該頭端812具有上轉 子838,其接合下轉子836用以握持工件55於其間。連接上 及下轉子之風箱840有助保持製程化學物由頭端812内組件 流出。當頭端位於加載/卸載位置時,工件可通過側面開口 842加載及卸載進出頭端上喷嘴846引入製程流體至工件頂 部表面上。 -23- 本紙張尺度適用中國國家標準(CNS) A4規格(210X297公釐) 559571 A7 __B7 五、發明説明(21 ) 底座814包括一底板816。一音速傳送器82〇,諸如巨音速 傳送器連接至部份的底板816。音速傳送器820大上為直角 ,且較佳地居於頭端812旋轉軸的中間。如圖2〇所示,音速 傳送器安裝在底板816中的中心開口,且形成缽件或液體裝 載容器817的中心底段。 喷灌喷嘴822延伸通過底板8 16。如圖1 8所示,較佳地, 一系列喷灑噴嘴822提供音速傳送器820的對立側上,接近 製程頭端812的中心。喷灑喷嘴以一角度導向用以喷灑液體 朝向工件55的中心。溢流喷嘴或入口 830同時延伸通過底板 816進入缽件817。溢流喷嘴830以液體用來充填缽件817, 使液體接觸或浸洗加工工件5 5的底部或裝置侧。溢流喷嘴 830可提供通過音速傳送器820之開口中。變換地,溢流喷 嘴830可位於傳送器820的一侧,緊鄰喷灑喷嘴822。排放管 出口 824由钵件817延伸至一或多個排放閥826。音速傳送器 820由一 〇形環828密封於底板816。 參考圖19,各喷灑喷嘴822較佳地具有一流體管件83 2延 伸通過喷嘴主體834。在流體管件832上端的定向開口 835導 引喷灑流體朝向與底座814接合之製程頭端812上工件的下 表面。 當蛛件817位於含液體的底座814及工件位於液體中時, 激發傳送器820。來自傳送器820之音速能量傳送通過液體 至與液體8 2 2接觸的工件。音速能量輔助及加強加工。例 如,在洗濯步驟中,在缽件817中的液體已移除後,或排 放至足夠低的位準用以曝露噴灑喷嘴822,該喷灑喷嘴822 -24- 本紙張尺度適用中國國家標準(CNS) A4規格(210X 297公釐)559571 A7 _ B7 V. Description of the invention (~~) ~-To prevent or reduce leakage during the process. When the lower rotor 73 is in the retracted position, the window 762 and the groove 764 are no longer aligned. The direct access door 775 was closed. The motor 712 moves the process head end 714 from the position above the head end shown in FIG. 9 to the position below the head end shown in FIG. 10. The riser assembly 702 moves the process head 714 to engage the base 716. Process liquid is supplied into the bowl member 780 through the liquid inlet 792, thereby forming a liquid solution. When the process head 714 engages the bottom 716, the bottom surface of the workpiece 55 contacts the solution. The workpiece 55 may be completely immersed in the solution. Alternatively, only the bottom surface or bottom surface and the edges of the workpiece may come into contact with the solution. The workpiece-to-solution contact range can be adjusted by changing the liquid level in the carrier 780, or changing the relative vertical position between the process head end 714 and the bottom 716. Preferably, the liquid level of the bowl member 78 is set through the height of the weir 794 on the side of the bowl member. When contacted with the solution, the workpiece 55 may be fixed. Alternatively, the rotary motor 738 can better rotate the workpiece at a low RPM, which facilitates easy liquid movement across the surface of the workpiece. Other process gases, gases or liquids can be supplied to the top surface of the workpiece through the upper nozzle 7. The bowl 78 may be replaced with other liquid applicators, such as fixed or mobile spray nozzles or liquid outlets. After the processing of the liquid solution is completed, the solution in the bowl 78 is discharged or removed through the discharge outlet 788. The workpiece may then be selectively rotated at high speed, directing the process fluid to the top surface of the workpiece with or without nozzle 744. The head can be lifted slightly before turning. A gas, such as nitrogen or air, can be introduced into the base 716 through a gas inlet to help remove or flush the liquid from the bottom. After processing is completed, the lifter assembly 702 lifts the process head 714 off the base 716 by actuating the lifter motor 706. The support arm motor 712 will make the process head end-22- this paper size applies to 81 81 standards (CNS) A4 specifications (210X297 public love) ---- 5. Description of the invention (714 returned to the position above the head end. Extending the cause Actuator 76 moves the lower rotor 73 and returns to the extended position. The workpiece is then removed by the process head end 714. "Washing the machine from the bottom to the bottom is better for various process steps, especially when it comes to processing semiconductor wafers. The design of the workpiece in Figure 9_14 is better controlled because the workpiece is held by the same component, which controls the edge area and has only two interfaces between the motor shaft 74i and the workpiece 55. One interface is located between the fixed plate and the motor shaft 741. The second interface is located between the top plate and the upper rotor 732. In the system 600 of FIG. 15, a robot arm 61 is rotated along the axis 615 to load and unload the machine. 007 and the path 600 between the reactor 100 and / or 700, the system for carrying out the transport operation, or six or more robotic arms 625 are conveyed along the linear path 63 for a loading / unloading machine 6 Required transport between us and reactor 100 and / or 700 The present invention has illustrated related wafers. However, it will understand that the present invention has a wide range of application capabilities. Using examples, the present invention can be applied to the processing of discs and head-ends, flat panel displays, microelectronics Hoods, and other devices need effective and controlled liquid processing. In a transform design, as shown in Figures 17-20, the processing system 810 using sonic energy has a process head 812 and a base 814. The head end 812 has an upper rotor 838 It engages the lower rotor 836 to hold the workpiece 55 in between. The bellows 840 connecting the upper and lower rotors helps to keep process chemicals from flowing out of the components inside the head end 812. When the head end is in the loading / unloading position, the workpiece can pass through The side opening 842 is loaded and unloaded. The nozzle 846 on the inlet and outlet head end introduces the process fluid to the top surface of the workpiece. -23- This paper size applies to China National Standard (CNS) A4 specification (210X297 mm) 559571 A7 __B7 V. Description of the invention (21 ) The base 814 includes a base plate 816. A sonic transmitter 82, such as a giant sonic transmitter, is connected to a portion of the base plate 816. The sonic transmitter 820 is at right angles, and preferably In the middle of the rotation axis of the head end 812. As shown in FIG. 20, the sonic transmitter is installed in the central opening in the bottom plate 816 and forms the central bottom section of the bowl or liquid loading container 817. The spray nozzle 822 extends through the bottom plate 8 16 As shown in FIG. 18, preferably, a series of spray nozzles 822 are provided on the opposite side of the sonic transmitter 820, close to the center of the process head end 812. The spray nozzles are oriented at an angle to spray liquid toward the workpiece 55. The overflow nozzle or inlet 830 extends through the bottom plate 816 and into the bowl 817 at the same time. The overflow nozzle 830 is used to fill the bowl member 817 with liquid so that the liquid may contact or dip the bottom of the processing workpiece 55 or the device side. An overflow nozzle 830 may be provided through the opening of the sonic transmitter 820. Alternatively, the overflow nozzle 830 may be located on one side of the conveyor 820, next to the spray nozzle 822. The discharge pipe outlet 824 extends from the bowl member 817 to one or more discharge valves 826. The sonic transmitter 820 is sealed to the bottom plate 816 by an O-ring 828. Referring to FIG. 19, each of the spray nozzles 822 preferably has a fluid pipe 832 extending through the nozzle body 834. A directional opening 835 at the upper end of the fluid tube 832 directs the spray fluid toward the lower surface of the workpiece on the process head end 812 that engages the base 814. When the spider 817 is on the liquid-containing base 814 and the workpiece is in the liquid, the conveyor 820 is activated. The sonic energy from the conveyor 820 is transmitted through the liquid to the workpiece in contact with the liquid 8 2 2. Sonic energy assists and enhances processing. For example, in the washing step, after the liquid in the bowl 817 has been removed, or it is discharged to a low enough level to expose the spray nozzle 822, the spray nozzle 822 -24- This paper size applies the Chinese national standard (CNS ) A4 size (210X 297mm)

Claims (1)

559571 A8 B8 广. C8 ------------- —_D8 六、申請專利範園 一 ---- K 一種用於加工工件之機械,包含: 一頭端,具有一第一轉子及圍繞頭端外殼内之該第一 轉子的第—轉子,其中該第二轉子具有-開放中心區域 且-亥第II子接合該第二轉子用w握持其間的工件; 及 該第二轉子可由一第一位置,其間其緊鄰於該第一轉 子’移動至-第二位置’其間該第二轉子與該第一轉子 間隔。 2·如申請專利範圍第1項之機械,其中該第二轉子及該第一 轉子各具有一室進出開口,且當該第二轉子位於第一位 置時,該進出開口彼此偏離,且當該第二轉子位於第二 位置時,該進出開口至少部份彼此對齊。 如申吻專利粑圍第1項之機械,進一步包含至少一致動 器於頭端中,用於移動該第二轉子由第一位置至第二 位置。 4 ·如申請專利範圍第1項之機械,進一步包含一支撐臂, 其連接至該頭端及一頭端提升器,用於提升及降低該 頭端。 5 ·如申清專利範圍第4項之機械,進一步包含一樞轉馬達, 用於樞轉支撐臂上之頭端,由一頭端向上位置至一頭端 向下位置。 6·如申請專利範圍第4項之機械,進一步包含一具有承盤的 底座,其中該頭端提升器相對於該頭端及底座定位,用 於降低至少部份該頭端第二轉子進入該承盤。 •26- 本紙張尺歧財® g家料(CNS) A4規格(210X297公釐) k 訂559571 A8 B8 Guang. C8 ------------- —_D8 VI. Patent Application Fan Yuan I K A machine for processing workpieces, including: one end, one first A rotor and a first rotor surrounding the first rotor in the head-end housing, wherein the second rotor has an open center area and a second sub-engager engages the second rotor to hold a workpiece therebetween; and the second The rotor can be moved from a first position during which the first rotor is 'moved to-a second position' during which the second rotor is spaced from the first rotor. 2. The machine according to item 1 of the scope of patent application, wherein the second rotor and the first rotor each have a chamber access opening, and when the second rotor is in the first position, the access openings deviate from each other, and when the When the second rotor is in the second position, the access openings are at least partially aligned with each other. For example, the machine of claim 1 in the patent claim further includes at least a uniform actuator in the head end for moving the second rotor from the first position to the second position. 4. The machine according to item 1 of the scope of patent application, further comprising a support arm connected to the head end and a head end lifter for raising and lowering the head end. 5. The machine according to item 4 of the patent claim, further comprising a pivot motor for pivoting the head end of the support arm from a head end up position to a head end down position. 6. The machine according to item 4 of the scope of patent application, further comprising a base with a bearing plate, wherein the head end lifter is positioned relative to the head end and the base, for lowering at least part of the head end second rotor into the Offer. • 26- This paper ruler Qi Cai® g house materials (CNS) A4 size (210X297 mm) k Order ★中》月專利範圍第6項之機械,進一步包括與該承盤相關 連之音速能量源。 如申明專利範圍第i項之機械,進一步包含一入口於該第 及第一轉子至少其中之_。 9. 如中請專利範圍第6項之機械,其中該底座連接至該頭端 k升器。 10. 如申明專利範圍第丨項之機械,進一步包含鎖定裝置,用 於鎖定該第一轉子至第二轉子。 η.如申請專利範圍第丨項之機械,進—步包含_旋轉馬達於 連接至該第-轉子及第二轉子至少其中之一的頭端中。 士申咐專利範圍第1項之機械,進一步包含一連接至該第 一轉子及第二轉子的風箱。 U·—種用於加工工件之反應器,包含: 一反應器頭端外殼; 一第一轉子,可旋轉地安裝於該反應器頭端外殼内; 一第二轉子,可隨該第一轉子旋轉; 轉子移動裝置,用於移動該第二轉子,由該第一及第 二轉子彼此緊鄰之一第一位置,至該第一及第二轉子彼 此間隔之一第二位置;及 液體施加裝置,其與反應器頭端分離,用於施加液體 至由該第-及第二轉子所支撐之工件的面朝下表面。 14· 一種用於加工工件之系統,包含·· 一頭端提升器; -頭端’連接至該頭端提升器,且由—頭端向上位置 -27- 本紙張尺度適用中國國家樣準(CNS) Α4規格(210 X 297公釐) 559571★ The machine in item 6 of the "Monthly" Patent Range further includes a sonic energy source associated with the undercarriage. For example, the machine of claim i of the patent scope further includes an entrance in at least one of the first and the first rotor. 9. The machine according to item 6 of the patent, wherein the base is connected to the head-end k-liter. 10. As stated in the patent scope, the machine further includes a locking device for locking the first rotor to the second rotor. η. The machine according to the scope of the patent application, further comprising a rotating motor in a head end connected to at least one of the first rotor and the second rotor. The patentee claims that the machine of item 1 of the patent scope further includes a bellows connected to the first rotor and the second rotor. U · —A reactor for processing a workpiece, comprising: a reactor head end shell; a first rotor rotatably installed in the reactor head end shell; a second rotor that can follow the first rotor Rotating; a rotor moving device for moving the second rotor from a first position in which the first and second rotors are immediately adjacent to each other to a second position in which the first and second rotors are spaced from each other; and a liquid applying device It is separated from the head of the reactor and is used to apply liquid to the downward facing surface of the workpiece supported by the first and second rotors. 14 · A system for processing workpieces, including a head end lifter;-the head end 'is connected to the head end lifter, and the head end is positioned upwards-27-This paper standard is applicable to China National Standard (CNS ) Α4 size (210 X 297 mm) 559571 15 移動至一頭端向下位置; 一第一轉子,位於至少一工件支架之頭端中; 職有—钵件用於包含液體,該料可藉μ Π加直料件上方之一第一位置,移動至該至 y 件支架係至少部份位於绰件中之一第_位置 一種用於加工工件之反應器,包含: 一第一轉子,具有一概呈圓形之側壁,及 開口位於該第一側壁中; 迟113 :第二轉子,可接合該第一轉子,且具有一概呈圓开 之第一側壁,及一第二進出開口位於該第二側壁中;及 一致動器,連結至該第一及第二轉子至少其"中之一, 用於移動該第一轉子由該第一及第-隹 ^ ^ ^ 汉弗一進出開口彼此間傾 之第位置,至該第一及第二進出開口至少部份對濟 之一第二位置,用以容許工件通過其移動。 16. 如申請專利範圍第15項之反應器,進一步包含一轉子外 殼,該外殼包含連接該第一轉子之至少一轉子致動器, 用於移動該第一轉子進入該第一及第二位置。 17. —種用於加工工件之機械,包含: 一頭端提升器; 一頭端支架,位於該頭端提升器上; 一製程頭端,附接至該頭端支架; 製程頭知致動器’連接至該製程頭端,用於繞著一 概呈水平軸,樞轉該製程頭端; 一底座,垂直對齊於該製程頭端下方; -28- 本紙張尺度適用中國國家標準(CNS) A4規格(210X 297公釐)15 Move to a head-down position; a first rotor located in the head-end of at least one workpiece holder; job-bowl for containing liquid, the material can be borrowed μ μ plus a first position above the material Moving to the y-piece bracket is at least partly located in one of the first position of a reactor for processing a workpiece, including: a first rotor with a generally circular side wall, and an opening in the first A side wall; Chi 113: a second rotor that can be engaged with the first rotor, and has a first side wall that is generally open, and a second access opening is located in the second side wall; and an actuator connected to the At least one of the first and second rotors is used to move the first rotor from the first and third positions where the first and second openings of the Humph are tilted toward each other, to the first and second positions. The two access openings are at least partially opposed to one of the second positions to allow the workpiece to move therethrough. 16. The reactor according to item 15 of the patent application scope, further comprising a rotor housing, the housing comprising at least one rotor actuator connected to the first rotor, for moving the first rotor into the first and second positions. . 17. —A machine for processing workpieces, including: a head end lifter; a head end bracket on the head end lifter; a process head end attached to the head end bracket; the process head knows the actuator ' Connected to the process head for pivoting the process head around a generally horizontal axis; a base that is vertically aligned below the process head; -28- This paper size applies to China National Standard (CNS) A4 (210X 297 mm) 裝 訂Binding ^59571^ 59571 一底座内之液體施加器,用於裝載液體溶液; 一第一轉子,位於該製程頭端上,且具有一第一轉子 進出開口; 一第二轉子,位於該製程頭端上,且具有一第二轉子 進出開口,其可移動以接合及隨該第一轉子旋轉,且可 移動至少部份對齊之該第一進出開口與該第二轉子進出 開口。 18·如申凊專利範圍第17項之機械,其中該液體施加器包含 至少一喷灑喷嘴。 19·如申清專利範圍第丨7項之機械,其中該液體施加器包含 一缽件用於裝持液體溶液。 2〇·如申請專利範圍第17項之機械,其中該液體施加器包含 具有至少一喷灑喷嘴之擺動臂。 21 ·如申印專利範圍第18項之機械,其中該喷灑喷嘴係定位 ’用以垂直向上噴灑流體。 22.如申請專利範圍第21項之機械,其中該喷灑喷嘴係位於 該第二轉子旋轉軸上。 23 ·如申凊專利範圍第17項之機械,其中該液體施加器包含 一液體供給管線之液體出口。 24· —種用於加工工件之方法,包含以下步驟: 水平移動該工件進入一製程頭端; 反向該製成頭端; 降低該製程頭端向下朝向一液體溶液,使至少工件之 一表面與液體接觸; -29- 本紙張尺度適用中國國家樣準(CNS) A4規格(210X 297公董)"' ------—- 申請專利範圍 體:::件製程及頭端向上由該液體溶液離開,用以由該液 旋轉該工件。 25.如申請專利範 推一丰“法,其中移動該工件之步驟 :)包3 :相對於製程頭端上之第一轉子移動第二轉 2用以對齊該第二及第—轉子中的開σ,且接著水平 移動該工件通過開口。 26· 一種用於加工工件之裝置,包含: 一上板及一下環,可分別地接合至一上表面及一下表 面或一工件,該上板形成一上加工室,位於該工件的上 表面之上; 一上入口,通過該上板,用於提供流體至工件之上表 面, 至少-流體出口,位於上加工室中,藉由工件旋轉所 產生之離心力’移除來自加工室的流體。 27. 如申請專利範圍第26項之裝置,其中該上板及下環支撐 於製程頭鈿上,且其間該下環在平行於該下環旋轉軸 的方向位移。 28. 如申請專利範圍第27項之裝置,其間該上板係固定於相 對該製程頭端之位置。 29·如申請專利範圍第26項之裝置,其中該上板具有一曲形 上板側壁,而以板進出開口通過其間,且其中該下環具 有一曲形下環側壁,而以一環進出開口通過其間,且其 間該上板及下環可移動用以對齊該板進出開口與環進出 -30- 本紙張尺度適用中國國家棵準(CNS) Α4規格(210X297公釐)A liquid applicator in a base is used for loading a liquid solution; a first rotor is located on the process head end and has a first rotor access opening; a second rotor is located on the process head end and has a The second rotor access opening is movable to engage with and rotate with the first rotor, and at least partially aligned with the first rotor access opening and the second rotor access opening. 18. The machine of claim 17 in the scope of patent application, wherein the liquid applicator comprises at least one spray nozzle. 19. The machine according to claim 7 of the patent application, wherein the liquid applicator includes a bowl for holding a liquid solution. 20. The machine according to item 17 of the application, wherein the liquid applicator includes a swing arm having at least one spray nozzle. 21 · The machine according to item 18 of the scope of the patent application, wherein the spray nozzle is positioned to spray the fluid vertically upward. 22. The machine according to claim 21, wherein the spray nozzle is located on the second rotor rotating shaft. 23. The machine of claim 17 in the scope of patent application, wherein the liquid applicator comprises a liquid outlet of a liquid supply line. 24 · —A method for processing a workpiece, including the following steps: horizontally moving the workpiece into a process head end; reversing the manufacturing head end; lowering the process head end toward a liquid solution so that at least one of the workpieces The surface is in contact with liquid; -29- This paper size is applicable to China National Standard (CNS) A4 specification (210X 297 public directors) " '----------- Patent application scope ::: piece manufacturing process and head end Leaving upward from the liquid solution is used to rotate the workpiece by the liquid. 25. If applying for a patent, the "Feng Yifeng" method, wherein the step of moving the workpiece :) Package 3: Move the second rotation 2 relative to the first rotor on the process head end to align the second and first rotors. Open σ, and then move the workpiece horizontally through the opening. 26. A device for processing a workpiece, comprising: an upper plate and a lower ring, which can be separately joined to an upper surface and a lower surface or a workpiece, the upper plate is formed An upper processing chamber is located on the upper surface of the workpiece; an upper inlet through the upper plate is used to provide fluid to the upper surface of the workpiece, at least-the fluid outlet is located in the upper processing chamber and is generated by the rotation of the workpiece The centrifugal force 'removes fluid from the processing chamber. 27. For the device in the scope of patent application No. 26, wherein the upper plate and the lower ring are supported on the process head, and the lower ring is parallel to the rotation axis of the lower ring 28. If the device of scope 27 of the patent application is applied, the upper plate is fixed at the position relative to the head end of the process. 29. The device of scope 26 of the patent application, wherein the upper plate has a curve shape The upper plate side wall, with the plate in and out openings passing therethrough, and wherein the lower ring has a curved lower ring side wall, and the ring in and out openings passing therethrough, and during which the upper plate and the lower ring are movable to align the plate in and out openings With ring in and out -30- This paper size is applicable to China National Standard (CNS) Α4 (210X297 mm) 開口。 3〇·如申請專利範圍第26項之 定位。 其中該下環圍繞該上板 31·如申請專利範圍第26項之裝 中心區域位於該工件下表面下方其中該下壤具有一開放 玟如申請專利範圍第27項之裝置,進—步包含一連接至兮 製程頭端之頭端提升器,及底 以 1 & 4具有一液體施加器,用 於施加液體至工件的下表面,Β制i .. 且製程頭端可移動透過頭 鈿提升器朝向及離開底座。 33·如申請專利範圍第26項裝 α心衣置,進一步包含施加裝置, 用於施加液體至工件之下表面。 34. 如申請專利範圍第26項之裝置,其中該上加工室係由工 件之上表面與該上板間之空隙區域所形成,用以緊密限 制加工工件流體沿工件上表面引入上加工室。 35. 如申請專利第32項之裝置,進_步包含反向裝置, 用於反向該製程頭端。 36· —種用於加工工件之系統,包含: 一缽件,用於裝載一液體; 曰速月b Ϊ源’係與該蛛件相連,用於引入音速能量 進入缽件中的液體; 一製程頭端; 一製程頭端提升器,係定位用以移動至少部份製程頭 端進入及離開缽件中的液體,而該製程頭端包括一上轉 子及下轉子,且該上轉子及下轉子可沿一工件接合。 •31 -本紙張尺度適用中國國家樣準(CNS) A4規格(210X 297公釐) 559571Opening. 30. Positioning of item 26 in the scope of patent application. Wherein, the lower ring surrounds the upper plate 31. If the center area of the 26th area of the patent application is located below the lower surface of the workpiece, the lower soil has an opening. For the device of the 27th area of the patent application, further includes a The head lifter connected to the head end of the process, and the bottom 1 & 4 has a liquid applicator for applying liquid to the lower surface of the work piece, and the process head end can be moved through the head to lift. Device toward and away from the base. 33. The alpha heart device according to item 26 of the patent application scope, further comprising an application device for applying a liquid to the lower surface of the workpiece. 34. The device of claim 26, wherein the upper processing chamber is formed by a gap region between the upper surface of the workpiece and the upper plate to tightly restrict the processing fluid from being introduced into the upper processing chamber along the upper surface of the workpiece. 35. If the device of claim 32 is applied, the step further includes a reverse device for reversing the process head. 36 · —A system for processing a workpiece, comprising: a bowl member for loading a liquid; "Suoyue b Ϊ source" is connected to the spider member for introducing sonic energy into the liquid in the bowl member; a Process head end; a process head end lifter is positioned to move at least part of the process head end into and out of the liquid in the bowl, and the process head end includes an upper rotor and a lower rotor, and the upper rotor and the lower rotor The rotor can be engaged along a workpiece. • 31-This paper size applies to China National Standard (CNS) A4 (210X 297mm) 559571 37. 如申請專利範圍第36項之系統,進一步包括該缽件中之 一充填埠及排放埠。 38. 如申氧專利範圍第36項之系統,進一步包括該上轉子中 之一入口。 39·如申請專利範圍第36項之系統,其中該下轉子包含一環 形環件。 < 4〇·如申請專利範圍第39項之系統,其中該下轉子可移動進 入其大致圍繞該音速能量源之位置。 41. 如申請專利範圍第36項之系統,其中該音速能量源包含 一音速傳送器。 42. 如申請專利範圍第41項之系統,其中該傳送器固定於绰 件内之定位。 43·如申請專利範圍第42項之系統,其中該傳送器對齊該下 轉子。 44·如申請專利範圍第36項之系統’進一步包含連接至該蛛 件之一或多製程液體供給源。 45·如申請專利範圍第44項之系統,其中該製程液體供給源 包含一由水、HF,及臭氧水,及其組合所組成群組中選 取之液體。 46·如申請專利範圍第36項之系統,進一步包含一馬達,其 至少間接連接至該上轉子。 47·如申請專利範圍第41項之系統,進一步包含一位於傳送 器開口下方之液體出口喷嘴。 4 8 ·如申請專利範圍第41項之系統,進一步包含一延伸通過 •32· 本紙張尺度適用中國國家搮準(CNS) A4規格(210 X 297公釐) 559571 A8 B837. The system of claim 36, further comprising a filling port and a discharging port in the bowl. 38. The system of claim 36 of the scope of patent application for oxygen further includes an inlet for the upper rotor. 39. The system of claim 36, wherein the lower rotor includes an annular ring member. < 40. The system according to item 39 of the patent application scope, wherein the lower rotor is movable into a position approximately surrounding the sound velocity energy source. 41. The system of claim 36, wherein the sonic energy source includes a sonic transmitter. 42. The system of claim 41, wherein the transmitter is fixed in position within the pod. 43. The system of claim 42 in which the conveyor is aligned with the lower rotor. 44. The system of claim 36, further comprising a liquid supply source connected to one or more of the spiders. 45. The system according to item 44 of the patent application scope, wherein the process liquid supply source includes a liquid selected from the group consisting of water, HF, and ozone water, and combinations thereof. 46. The system of claim 36, further comprising a motor connected at least indirectly to the upper rotor. 47. The system of claim 41, further comprising a liquid outlet nozzle located below the conveyor opening. 4 8 · If the system of the scope of application for patent No. 41, further includes an extension passed. 32. This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) 559571 A8 B8 訂 tOrder t 六、申請專利範圍 56·如申請專利範圍第50項之方法,其中該工件具有一頂部 表面及底部表面且其間該工件底部表面與該溶液接觸, 進一步包含提供一流體至該工件頂部表面上之步驟。 57·如申請專利範圍第50項之方法,其中該流體提供於該工 件之中心區域。 5 8 · —種用於加工工件之系統,包含: 一上轉子; 一下轉子,可與該上轉子接合,用以握持其間之工 件; 一音速傳送器,位於該上轉子及下轉子至少其中之一 至少一流體入口,位於該上轉子及下轉子至少其中之 一中;及 ^ 至少一流體出口,位於該上轉子及下轉子至少其中之 一-中 〇 59. 如申請專利範圍第58項之系統,進—步包含一水槽用於 裝載液體’及-致動器用於降低該下轉子進人該水槽。 60. 如申請專利範圍第59項之系統,其中該音速傳送器且有 -中心通孔’且進一步包含一水槽中之喷嘴出口,其與 該中心通孔對齊。 、、 61. 如申請專利範圍第58項之系統,進—步包含連接至該上 轉子之旋轉馬達。 62·如申請專利範圍第58項之系统 ^ ^ 土 只尔、也進一步包含用於連接及 釋放該上轉子及下轉子之裝置。 • 34 - 559571 A8 B8 C8 D8 、申請專利範圍 63·如申請專利範圍第59項之系統,進一步包含連接至該水 槽之第一製程流體源,及連接至該上轉子中之出口之一 第二製程流體源。 64·如申請專利範圍第59項之系統,進一步包含旋轉裝置, 用於相對於該水槽旋轉該下轉子。 -35- 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐)6. Scope of Patent Application 56. The method of claim 50, wherein the workpiece has a top surface and a bottom surface and the bottom surface of the workpiece is in contact with the solution, and further includes providing a fluid to the top surface of the workpiece. step. 57. The method of claim 50, wherein the fluid is provided in a central area of the workpiece. 5 8 · —A system for processing workpieces, including: an upper rotor; a lower rotor that can be engaged with the upper rotor to hold the workpiece therebetween; a sonic transmitter located at least among the upper and lower rotors One of at least one fluid inlet located in at least one of the upper rotor and the lower rotor; and ^ at least one fluid outlet located in at least one of the upper rotor and the lower rotor-medium 59. If the scope of patent application is 58 The system further includes a water tank for loading liquid 'and an actuator for lowering the lower rotor into the water tank. 60. The system of claim 59, wherein the sonic transmitter has a -center through hole 'and further includes a nozzle outlet in a water tank, which is aligned with the center through hole. 61. If the system according to item 58 of the scope of patent application, the step further includes a rotary motor connected to the upper rotor. 62. The system according to item 58 of the scope of patent application ^ ^ It also further includes a device for connecting and releasing the upper rotor and the lower rotor. • 34-559571 A8 B8 C8 D8, patent application scope 63. If the system of patent application item 59, further includes a first process fluid source connected to the water tank, and one second outlet connected to the upper rotor Process fluid source. 64. The system of claim 59, further comprising a rotating device for rotating the lower rotor with respect to the water tank. -35- This paper size applies to China National Standard (CNS) A4 (210 X 297 mm)
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