TWD209939S - 電性接觸子 - Google Patents

電性接觸子 Download PDF

Info

Publication number
TWD209939S
TWD209939S TW108307106F TW108307106F TWD209939S TW D209939 S TWD209939 S TW D209939S TW 108307106 F TW108307106 F TW 108307106F TW 108307106 F TW108307106 F TW 108307106F TW D209939 S TWD209939 S TW D209939S
Authority
TW
Taiwan
Prior art keywords
design
subject
parts
item
case
Prior art date
Application number
TW108307106F
Other languages
English (en)
Chinese (zh)
Inventor
岸康貴
若澤勝博
Original Assignee
日商日本麥克隆尼股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商日本麥克隆尼股份有限公司 filed Critical 日商日本麥克隆尼股份有限公司
Publication of TWD209939S publication Critical patent/TWD209939S/zh

Links

Images

TW108307106F 2019-05-21 2019-11-20 電性接觸子 TWD209939S (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019011016F JP1646397S (2) 2019-05-21 2019-05-21
JP2019-011016 2019-05-21

Publications (1)

Publication Number Publication Date
TWD209939S true TWD209939S (zh) 2021-02-21

Family

ID=68610810

Family Applications (1)

Application Number Title Priority Date Filing Date
TW108307106F TWD209939S (zh) 2019-05-21 2019-11-20 電性接觸子

Country Status (3)

Country Link
US (1) USD931228S1 (2)
JP (1) JP1646397S (2)
TW (1) TWD209939S (2)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWD233187S (zh) 2023-08-04 2024-08-21 日商歐姆龍股份有限公司 (日本) 導通檢測用的探針
TWD233186S (zh) 2023-08-04 2024-08-21 日商歐姆龍股份有限公司 (日本) 導通檢測用的探針
TWD233188S (zh) 2023-08-04 2024-08-21 日商歐姆龍股份有限公司 (日本) 導通檢測用的探針
USD1043581S1 (en) * 2021-10-27 2024-09-24 Kabushiki Kaisha Nihon Micronics Electric contact

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP1667703S (2) * 2020-03-10 2020-09-07
JP1755926S (ja) * 2023-03-06 2023-10-23 電気接触子
JP1755925S (ja) * 2023-03-06 2023-10-23 電気接触子

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100664393B1 (ko) * 2003-05-13 2007-01-04 가부시키가이샤 니혼 마이크로닉스 통전 시험용 프로브
US7679389B2 (en) * 2005-03-07 2010-03-16 Kabushiki Kaisha Nihon Micronics Probe for electrical test and electrical connecting apparatus using it
JP5113392B2 (ja) * 2007-01-22 2013-01-09 株式会社日本マイクロニクス プローブおよびそれを用いた電気的接続装置
JP5123533B2 (ja) * 2007-02-01 2013-01-23 株式会社日本マイクロニクス 通電試験用プローブおよびその製造方法
JP2008203036A (ja) * 2007-02-19 2008-09-04 Micronics Japan Co Ltd 電気的接続装置
JP5046909B2 (ja) * 2007-12-21 2012-10-10 株式会社日本マイクロニクス 電気試験用接触子、これを用いる電気的接続装置、及び接触子の製造方法
JP2009270880A (ja) * 2008-05-02 2009-11-19 Micronics Japan Co Ltd 電子デバイスの電気的試験用接触子、その製造方法及びプローブ組立体
US8089294B2 (en) * 2008-08-05 2012-01-03 WinMENS Technologies Co., Ltd. MEMS probe fabrication on a reusable substrate for probe card application
JP5631131B2 (ja) * 2010-09-17 2014-11-26 株式会社日本マイクロニクス 通電試験用プローブ及びプローブ組立体
USD665361S1 (en) * 2011-02-15 2012-08-14 Omron Corporation Electric connector terminal
USD702646S1 (en) * 2012-08-29 2014-04-15 Kabushiki Kaisha Nihon Micronics Electric contact
JP2021028603A (ja) * 2019-08-09 2021-02-25 株式会社日本マイクロニクス 電気的接触子及び電気的接続装置
JP7353859B2 (ja) * 2019-08-09 2023-10-02 株式会社日本マイクロニクス 電気的接触子及び電気的接続装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1043581S1 (en) * 2021-10-27 2024-09-24 Kabushiki Kaisha Nihon Micronics Electric contact
TWD233187S (zh) 2023-08-04 2024-08-21 日商歐姆龍股份有限公司 (日本) 導通檢測用的探針
TWD233186S (zh) 2023-08-04 2024-08-21 日商歐姆龍股份有限公司 (日本) 導通檢測用的探針
TWD233188S (zh) 2023-08-04 2024-08-21 日商歐姆龍股份有限公司 (日本) 導通檢測用的探針

Also Published As

Publication number Publication date
USD931228S1 (en) 2021-09-21
JP1646397S (2) 2019-11-25

Similar Documents

Publication Publication Date Title
TWD209939S (zh) 電性接觸子
WO2018170093A8 (en) Multi-metal contact structure
USD1037282S1 (en) Display screen or portion thereof of an electrical test or measurement device with graphical user interface
JP2015088739A5 (2)
MY186300A (en) Electrostatic chuck
JP2016189464A5 (2)
TWD208041S (zh) 半導體製造裝置用密封材
TWD198372S (zh) 電氣特性測定用探針之部分
JP2017034051A5 (ja) 半導体装置
TWD211239S (zh) 晶圓保持器之部分
EP3343594A3 (en) Semiconductor device
TWD214030S (zh) 電連接器
EP3273467A3 (en) Semiconductor die backside devices and methods of fabrication thereof
EP2806467A3 (en) Semiconductor detector head and a method for manufacturing the same
JP2016139646A5 (2)
TWD195354S (zh) Electrical connection terminal
TWD195361S (zh) 電性接觸子之部分
TWD222981S (zh) 電性接觸子之部分
TWD233294S (zh) 電性接觸件
TWD233293S (zh) 電性接觸件
JP1743474S (ja) 電気接触子
JP1743473S (ja) 電気接触子
TWD229954S (zh) 電性接觸件組之部分
TWD197821S (zh) 電性接觸子之部分
TWD195583S (zh) 電性接觸子之部分