TWI292826B - - Google Patents

Download PDF

Info

Publication number
TWI292826B
TWI292826B TW094135464A TW94135464A TWI292826B TW I292826 B TWI292826 B TW I292826B TW 094135464 A TW094135464 A TW 094135464A TW 94135464 A TW94135464 A TW 94135464A TW I292826 B TWI292826 B TW I292826B
Authority
TW
Taiwan
Prior art keywords
end side
rear end
probe
insertion hole
side insertion
Prior art date
Application number
TW094135464A
Other languages
English (en)
Chinese (zh)
Other versions
TW200638046A (en
Inventor
Ito Mitsuhiko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2005123162A external-priority patent/JP2005338065A/ja
Application filed filed Critical
Publication of TW200638046A publication Critical patent/TW200638046A/zh
Application granted granted Critical
Publication of TWI292826B publication Critical patent/TWI292826B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
TW094135464A 2005-04-21 2005-10-12 Inspection jig and inspection equipment TW200638046A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005123162A JP2005338065A (ja) 2004-04-26 2005-04-21 検査冶具および検査装置

Publications (2)

Publication Number Publication Date
TW200638046A TW200638046A (en) 2006-11-01
TWI292826B true TWI292826B (2) 2008-01-21

Family

ID=37195047

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094135464A TW200638046A (en) 2005-04-21 2005-10-12 Inspection jig and inspection equipment

Country Status (3)

Country Link
KR (1) KR100824394B1 (2)
CN (1) CN100535676C (2)
TW (1) TW200638046A (2)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3849948B1 (ja) * 2005-11-16 2006-11-22 日本電産リード株式会社 基板検査用治具及び検査用プローブ
JP5651333B2 (ja) * 2007-07-17 2015-01-14 日本発條株式会社 プローブユニット
JP2009036532A (ja) * 2007-07-31 2009-02-19 Koyo Technos:Kk 検査冶具および検査装置
KR101037974B1 (ko) * 2009-05-20 2011-05-30 주식회사 메디오션 프로브 지지체 및 그 제조방법
KR101459667B1 (ko) * 2013-07-22 2014-11-12 바이옵트로 주식회사 지그 장치
CN103983816A (zh) * 2014-05-15 2014-08-13 珠海市运泰利自动化设备有限公司 高精度测试模组
JP6537315B2 (ja) * 2015-03-23 2019-07-03 オルガン針株式会社 ワイヤープローブ用治具
KR101656047B1 (ko) * 2016-03-23 2016-09-09 주식회사 나노시스 기판 검사용 지그
US11293976B1 (en) * 2020-09-25 2022-04-05 Essai, Inc. Integrated circuit device test tooling with dual angle cavities
KR102649845B1 (ko) * 2023-11-29 2024-03-21 주식회사 나노시스 반도체 소자 테스터 지그

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69326609T2 (de) * 1993-07-23 2000-04-27 International Business Machines Corp., Armonk Testsondenanordnung mit Knicknadeln
JPH09274054A (ja) * 1996-04-08 1997-10-21 Furukawa Electric Co Ltd:The プローバー
JP3505495B2 (ja) * 2000-09-13 2004-03-08 日本電産リード株式会社 基板検査用検査治具、該検査治具を備えた基板検査装置および基板検査用検査治具の組立方法
JP2004325306A (ja) * 2003-04-25 2004-11-18 Yokowo Co Ltd 検査用同軸プローブおよびそれを用いた検査ユニット
JP4242199B2 (ja) * 2003-04-25 2009-03-18 株式会社ヨコオ Ｉｃソケット

Also Published As

Publication number Publication date
CN100535676C (zh) 2009-09-02
TW200638046A (en) 2006-11-01
CN1854744A (zh) 2006-11-01
KR20060111248A (ko) 2006-10-26
KR100824394B1 (ko) 2008-04-22

Similar Documents

Publication Publication Date Title
KR102366546B1 (ko) 전기적 접촉자 및 전기적 접속장치
TWI740993B (zh) 檢查輔助具、具備該輔助具之基板檢查裝置及檢查輔助具的製造方法
TWI637446B (zh) 檢測夾具
JP5821642B2 (ja) 検査治具
JP3505495B2 (ja) 基板検査用検査治具、該検査治具を備えた基板検査装置および基板検査用検査治具の組立方法
JP7128837B2 (ja) 電子デバイスの試験装置用のプローブカード
US7771220B2 (en) Electrical connecting apparatus
TWI292826B (2)
JP5822042B1 (ja) 検査治具、基板検査装置、及び検査治具の製造方法
JP2009036532A (ja) 検査冶具および検査装置
TWI354108B (2)
US7791364B2 (en) Electronic device probe card with improved probe grouping
JP2019200143A (ja) プローブ、検査治具、検査装置、及びプローブの製造方法
TW201831912A (zh) 探針及電連接裝置
JP7353859B2 (ja) 電気的接触子及び電気的接続装置
JP4863466B2 (ja) 基板検査用治具の製造方法
JP2007017234A (ja) 検査装置用ソケット
JP2008216060A (ja) 電気的接続装置
JP2008185570A (ja) プローブユニット及び検査装置
WO2020022085A1 (ja) 測定装置
JP2005283218A (ja) コネクタ検査用治具
JP2013015422A (ja) 配線検査治具及び配線検査装置
JP2008267833A (ja) 基板検査用治具及びこの治具における接続電極部の電極構造
TW201535881A (zh) 插座安裝構造及彈簧構件
TWI284739B (en) Test card of integrated circuit

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees