TWI319089B - Probe block and probe assembly including the same - Google Patents

Probe block and probe assembly including the same

Info

Publication number
TWI319089B
TWI319089B TW096105252A TW96105252A TWI319089B TW I319089 B TWI319089 B TW I319089B TW 096105252 A TW096105252 A TW 096105252A TW 96105252 A TW96105252 A TW 96105252A TW I319089 B TWI319089 B TW I319089B
Authority
TW
Taiwan
Prior art keywords
probe
same
assembly including
block
probe assembly
Prior art date
Application number
TW096105252A
Other languages
Chinese (zh)
Other versions
TW200732669A (en
Inventor
Dong-Won Shin
Seok-Jung Kim
Original Assignee
Phicom Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Phicom Corp filed Critical Phicom Corp
Publication of TW200732669A publication Critical patent/TW200732669A/en
Application granted granted Critical
Publication of TWI319089B publication Critical patent/TWI319089B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Measurement Of Radiation (AREA)
TW096105252A 2006-02-23 2007-02-13 Probe block and probe assembly including the same TWI319089B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020060017803A KR100766296B1 (en) 2006-02-23 2006-02-23 Probe blocks and probe assemblies having them

Publications (2)

Publication Number Publication Date
TW200732669A TW200732669A (en) 2007-09-01
TWI319089B true TWI319089B (en) 2010-01-01

Family

ID=38613443

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096105252A TWI319089B (en) 2006-02-23 2007-02-13 Probe block and probe assembly including the same

Country Status (3)

Country Link
KR (1) KR100766296B1 (en)
CN (1) CN101038321B (en)
TW (1) TWI319089B (en)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009115585A (en) * 2007-11-06 2009-05-28 Micronics Japan Co Ltd Probe assembly and inspection device
KR100940505B1 (en) * 2009-06-10 2010-02-10 주식회사 디엠엔티 Probe unit for inspecting display panel
WO2012099405A2 (en) * 2011-01-21 2012-07-26 Pro-2000 Co. Ltd. Probe block
KR101249467B1 (en) 2013-01-04 2013-04-03 (주)유비프리시젼 Film-type probe block for checking lcd
KR102159672B1 (en) * 2019-04-16 2020-09-24 주식회사 케이에스디 Probe and Probe Block Using the Same
KR102121618B1 (en) * 2020-02-06 2020-06-10 주식회사 프로이천 Integrated Type Probe Array Block
KR102121620B1 (en) * 2020-02-11 2020-06-10 주식회사 프로이천 Integrated Type Probe Array Block
KR102136689B1 (en) * 2020-03-03 2020-07-22 장용철 Flying probe tester
KR102216326B1 (en) * 2020-04-17 2021-02-17 주식회사 케이에스디 Probe unit for testing OLED array glass
KR102265962B1 (en) * 2020-12-29 2021-06-17 주식회사 프로이천 Pin board
KR102294168B1 (en) * 2021-06-18 2021-08-25 이시훈 Blade type probe block
KR102357377B1 (en) * 2021-09-06 2022-02-08 가온솔루션 주식회사 Probe pin and probe unit with them
CN114137265A (en) * 2021-11-30 2022-03-04 昆山德普福电子科技有限公司 Transmission module
KR102367167B1 (en) * 2022-01-07 2022-02-25 이시훈 Probe block
KR102367175B1 (en) * 2022-01-07 2022-02-25 이시훈 Probe block
KR102409030B1 (en) * 2022-05-09 2022-06-14 이시훈 Blade type probe block
KR102707100B1 (en) * 2022-05-31 2024-09-13 심흥보 Alignment stage for adjusting the probe pin of the probe card

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100314586B1 (en) * 1999-05-17 2001-11-15 이석행 Prober apparatus for testing of tft-lcd
KR20020080580A (en) * 2001-04-16 2002-10-26 유렉스 프리시젼 인코포레이티드 Membrane probe block
JP2003066067A (en) * 2001-08-24 2003-03-05 Seiko Epson Corp Probe unit, inspection device, method of inspecting electro-optical panel substrate, and method of manufacturing electro-optical device
JP2005055343A (en) * 2003-08-06 2005-03-03 Tokyo Cathode Laboratory Co Ltd Probe device for flat-panel display inspection
KR100599989B1 (en) * 2003-12-24 2006-07-13 주식회사 파이컴 Probe device with probe unit
KR20050082431A (en) * 2005-07-25 2005-08-23 백종수 Probe unit for inspected the flat panel display device
KR100600700B1 (en) * 2005-07-29 2006-07-19 프롬써어티 주식회사 Probe device for flat panel display inspection

Also Published As

Publication number Publication date
CN101038321A (en) 2007-09-19
KR20070087420A (en) 2007-08-28
TW200732669A (en) 2007-09-01
KR100766296B1 (en) 2007-10-11
CN101038321B (en) 2011-09-14

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees