TWI320497B - Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display - Google Patents

Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display

Info

Publication number
TWI320497B
TWI320497B TW094143671A TW94143671A TWI320497B TW I320497 B TWI320497 B TW I320497B TW 094143671 A TW094143671 A TW 094143671A TW 94143671 A TW94143671 A TW 94143671A TW I320497 B TWI320497 B TW I320497B
Authority
TW
Taiwan
Prior art keywords
angle
blemish
measurement
flat panel
panel display
Prior art date
Application number
TW094143671A
Other languages
Chinese (zh)
Other versions
TW200722825A (en
Inventor
Wei Hsiumg Tsai
Chao Hua Wen
Cheng Han Kuo
Tung Fa Liu
Hong Tu Yu
Original Assignee
Taiwan Tft Lcd Ass
Chunghwa Picture Tubes Ltd
Au Optronics Corp
Quanta Display Inc
Hannstar Display Corp
Chi Mei Optoelectronics Corp
Ind Tech Res Inst
Toppoly Optoelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiwan Tft Lcd Ass, Chunghwa Picture Tubes Ltd, Au Optronics Corp, Quanta Display Inc, Hannstar Display Corp, Chi Mei Optoelectronics Corp, Ind Tech Res Inst, Toppoly Optoelectronics Corp filed Critical Taiwan Tft Lcd Ass
Priority to TW094143671A priority Critical patent/TWI320497B/en
Priority to JP2006036263A priority patent/JP4436810B2/en
Priority to KR1020060017825A priority patent/KR100805486B1/en
Publication of TW200722825A publication Critical patent/TW200722825A/en
Priority to JP2009252691A priority patent/JP5176014B2/en
Application granted granted Critical
Publication of TWI320497B publication Critical patent/TWI320497B/en

Links

Classifications

    • A—HUMAN NECESSITIES
    • A01—AGRICULTURE; FORESTRY; ANIMAL HUSBANDRY; HUNTING; TRAPPING; FISHING
    • A01G—HORTICULTURE; CULTIVATION OF VEGETABLES, FLOWERS, RICE, FRUIT, VINES, HOPS OR SEAWEED; FORESTRY; WATERING
    • A01G9/00—Cultivation in receptacles, forcing-frames or greenhouses; Edging for beds, lawn or the like
    • A01G9/14—Greenhouses
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00—Cleaning by methods involving the use of tools
    • B08B1/10—Cleaning by methods involving the use of tools characterised by the type of cleaning tool
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00—Cleaning by methods involving the use of tools
    • B08B1/30—Cleaning by methods involving the use of tools by movement of cleaning members over a surface
    • B08B1/32—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members
    • E—FIXED CONSTRUCTIONS
    • E04—BUILDING
    • E04H—BUILDINGS OR LIKE STRUCTURES FOR PARTICULAR PURPOSES; SWIMMING OR SPLASH BATHS OR POOLS; MASTS; FENCING; TENTS OR CANOPIES, IN GENERAL
    • E04H9/00—Buildings, groups of buildings or shelters adapted to withstand or provide protection against abnormal external influences, e.g. war-like action, earthquake or extreme climate
    • E04H9/16—Buildings, groups of buildings or shelters adapted to withstand or provide protection against abnormal external influences, e.g. war-like action, earthquake or extreme climate against adverse conditions, e.g. extreme climate, pests

Landscapes

  • Engineering & Computer Science (AREA)
  • Architecture (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Civil Engineering (AREA)
  • Business, Economics & Management (AREA)
  • Pest Control & Pesticides (AREA)
  • Emergency Management (AREA)
  • Environmental & Geological Engineering (AREA)
  • Environmental Sciences (AREA)
  • Structural Engineering (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
TW094143671A 2005-12-09 2005-12-09 Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display TWI320497B (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
TW094143671A TWI320497B (en) 2005-12-09 2005-12-09 Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display
JP2006036263A JP4436810B2 (en) 2005-12-09 2006-02-14 Display multi-angle measuring system and method
KR1020060017825A KR100805486B1 (en) 2005-12-09 2006-02-23 Display angle measurement system and method
JP2009252691A JP5176014B2 (en) 2005-12-09 2009-11-04 Display multi-angle measuring system and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW094143671A TWI320497B (en) 2005-12-09 2005-12-09 Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display

Publications (2)

Publication Number Publication Date
TW200722825A TW200722825A (en) 2007-06-16
TWI320497B true TWI320497B (en) 2010-02-11

Family

ID=38246502

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094143671A TWI320497B (en) 2005-12-09 2005-12-09 Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display

Country Status (3)

Country Link
JP (2) JP4436810B2 (en)
KR (1) KR100805486B1 (en)
TW (1) TWI320497B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI690748B (en) * 2018-07-23 2020-04-11 財團法人工業技術研究院 Transparent display system and its operating method

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012060332A (en) * 2010-09-07 2012-03-22 Iix Inc Display device
CN103217436B (en) 2013-03-06 2015-05-20 京东方科技集团股份有限公司 Backlight module group defect detection method and equipment
KR20160032909A (en) * 2014-09-17 2016-03-25 한화테크윈 주식회사 Apparatus for preprocessing of multi-image and method thereof
CN109985846B (en) * 2019-01-11 2022-07-08 贵州电网有限责任公司 Laser radar calibration method for live-line water washing robot of transformer substation
CN110031470A (en) * 2019-05-16 2019-07-19 武汉精立电子技术有限公司 Optical detection apparatus
CN110148131B (en) * 2019-05-28 2023-04-25 易诚高科（大连）科技有限公司 A MURA detection method for OLED screens
CN110723478A (en) * 2019-09-27 2020-01-24 苏州精濑光电有限公司 Display panel overhauls device
KR102443798B1 (en) * 2020-09-25 2022-09-19 주식회사 맥사이언스 Optical measuring device and multi-channel display device image life measurement system and method using same
TWI816060B (en) * 2020-10-28 2023-09-21 友達光電股份有限公司 Monitor system and method thereof
CN114428412B (en) * 2020-10-29 2024-10-22 中强光电股份有限公司 Image recognition device and image recognition method
CN113362751B (en) * 2021-06-01 2023-11-28 深圳市华星光电半导体显示技术有限公司 Data compensation method and data compensation device of display panel
CN116128795B (en) * 2022-10-20 2025-12-19 昆山国显光电有限公司 Mura defect localization method, mura defect localization system, mura defect localization computer apparatus, and mura defect localization storage medium

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW410524B (en) * 1994-07-14 2000-11-01 Advantest Corp LCD panel image quality examining device and LCD image sampling method
JPH10336707A (en) * 1997-06-03 1998-12-18 Sefuto Kenkyusho:Kk Image distortion measuring device for CRT
KR100304649B1 (en) * 1999-02-02 2001-09-13 윤종용 Method for inspecting lead pins of IC package and apparatus therefor
JP3421299B2 (en) * 2000-03-28 2003-06-30 科学技術振興事業団 Apparatus and method for measuring viewing angle dependence and location dependence of luminance
JP2002333407A (en) * 2001-05-09 2002-11-22 Horiba Ltd Defect inspection device of plane display device
JP2003106936A (en) * 2001-09-27 2003-04-09 Japan Science & Technology Corp Sensor head, luminance distribution measuring device provided with the same, appearance inspection device, and display unevenness inspection evaluation device
JP4154156B2 (en) 2002-02-08 2008-09-24 ソニーマニュファクチュアリングシステムズ株式会社 Defect classification inspection system
KR20040060019A (en) * 2002-12-30 2004-07-06 삼성전자주식회사 Inspection Equipment for LCD module
KR20050014127A (en) * 2003-07-30 2005-02-07 삼성전자주식회사 Lcd panel test apparatus
JP4429683B2 (en) * 2003-10-17 2010-03-10 大日本印刷株式会社 Image input device
JP4230880B2 (en) * 2003-10-17 2009-02-25 株式会社東芝 Defect inspection method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI690748B (en) * 2018-07-23 2020-04-11 財團法人工業技術研究院 Transparent display system and its operating method
US10891917B2 (en) 2018-07-23 2021-01-12 Industrial Technology Research Institute Transparent display system and operation method thereof

Also Published As

Publication number Publication date
JP4436810B2 (en) 2010-03-24
KR20070060965A (en) 2007-06-13
JP2007163450A (en) 2007-06-28
KR100805486B1 (en) 2008-02-20
JP2010019868A (en) 2010-01-28
TW200722825A (en) 2007-06-16
JP5176014B2 (en) 2013-04-03

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees