TWI325496B - - Google Patents

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TWI325496B
TWI325496B TW95149484A TW95149484A TWI325496B TW I325496 B TWI325496 B TW I325496B TW 95149484 A TW95149484 A TW 95149484A TW 95149484 A TW95149484 A TW 95149484A TW I325496 B TWI325496 B TW I325496B
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Taiwan
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function
electrical impedance
current
complex
digital
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TW95149484A
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Chinese (zh)
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TW200827713A (en
Inventor
Meng Hsiu Tsai
li de Wang
Lung Tien Wu
Ming Hsieng Lu
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Metal Ind Res & Dev Ct
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Description

1325496 九、發明說明: 【發明所屬之技術領域】 本發明是有關於一種檢測之方法及其測試系統,特別 是指一種銲道缺陷檢測之方法及其測試系統。 【先前技術】 對於汽車業、機械設備和航太工業等領域鈑金件的 銲接製程是相當重要的製造環節,尤其是在銲接的品質方1325496 IX. Description of the Invention: [Technical Field] The present invention relates to a method for detecting and a test system thereof, and more particularly to a method for detecting flaws in a weld bead and a test system therefor. [Prior Art] The welding process for sheet metal parts in the automotive industry, machinery and aerospace industry is a very important manufacturing process, especially in the quality of welding.

面。因此,銲道(或是銲接點)《否有缺陷,需要一套檢 測的設備進行檢查與測試。目前所知較常用之銲接缺陷檢 測方法有超音波檢測、練動態電阻,或是切接中即時 量測電阻抗函數。 ' 超曰波檢測是指以低能量高頻率的超音波,對已銲接 之待測試物件的内部瑕疫加以檢測…般超音波檢測所使 用的頻率範圍為麵z至25MHz,基本設備需有電子訊號 產生器’藉著換能器(Transducer of Pr〇be),或稱探頭( Search Umt)發射出超音波’再經由接觸媒質^卿㈣傳 入待測試物件中。超音波在待測試物件中會有或多或少的 衣減,當傳至不同材質的介面時,超音波可能反射或透射 因此藉由偵檢、分析反射或透射訊號,即可檢測出瑕疵 並定出檢測位置。超音波穿透力高,可檢職厚物件且對 :體無害’通常可立即研判内部瑕疲。然而,超音波檢測 需淵博技㈣驗,又不適於㈣或結晶顆粒粗大物件」 不適用於薄物件等,這是超音波檢測最大的缺點。 另-習知之銲點制方法係藉由量測動態電阻 5 1325496 (Dynamic Resistance)而達成。一待測試物件通入交流電後 ’以每半個週期測得之電壓峰值除以該半週期測得之電流 峰值得到動態電阻。其中,一個週期可設為湖秒(針對 6〇H\的頻率)。然而,該動態電阻的量測方法於每-週期只 有兩筆資料’實在過於簡略,而且電壓峰值與電流峰值的 產生存在-時間差’因此所得之動態電阻僅是與實際相近 之近似值。 < 幵—筲知surface. Therefore, the weld bead (or weld joint) is “defective and requires a set of inspection equipment for inspection and testing. At present, the commonly used welding defect detection methods include ultrasonic detection, dynamic resistance, or instantaneous measurement of the electrical impedance function in the splicing. 'Super chopping detection refers to the detection of the internal plague of the welded object to be tested with ultrasonic waves of low energy and high frequency. The frequency range used for ultrasonic detection is from z to 25 MHz, and the basic equipment needs to have electrons. The signal generator 'transmits the ultrasonic wave' through the Transducer of Pr〇be, or the search Umt, and then passes through the contact medium (4) into the object to be tested. Ultrasonic waves will have more or less clothing reduction in the object to be tested. When passing to different material interfaces, the ultrasonic waves may reflect or transmit. Therefore, by detecting, analyzing reflection or transmitting signals, the ultrasonic waves can be detected. Determine the detection position. Ultrasonic penetration is high, it can be used to inspect thick objects and it is harmless to the body. However, ultrasonic detection requires a profound technique (4), and is not suitable for (4) or coarse particles of crystal grains. It is not suitable for thin objects, etc., which is the biggest disadvantage of ultrasonic detection. Another-known solder joint method is achieved by measuring dynamic resistance 5 1325496 (Dynamic Resistance). After the test object is passed into the alternating current, the peak value of the voltage measured every half cycle is divided by the peak value of the current measured in the half cycle to obtain the dynamic resistance. Among them, one cycle can be set to lake seconds (for 6 〇 H \ frequency). However, the measurement method of the dynamic resistance has only two data per cycle, which is too simple, and the voltage peak and the current peak have a -time difference, so the resulting dynamic resistance is only an approximation similar to the actual value. < 幵—筲知

> 杆運缺陷檢測方法及檢測裝置係在銲接進 仃中即時量測電阻抗函數。該習知之檢測裝置與一點銲裝 置結合’當該點銲裝置銲接—待銲接物件時,該檢測裝置 即時測$該點銲系統之二電極間之電流訊號及㈣訊號, =點銲時該等電極通人高電流,必須經由_比流器降低 電 '以測得適當的電流值,再經由希爾伯特⑽_ rans 0rm)轉換式運算得到即時電阻抗㈣他⑽)訊號 二測:Γ可以根據電阻抗訊號得知可能的鲜接缺陷 測裝置只能在該銲接裝置銲接時之放電過程 中1測到電壓及雷宍,& β 士, ^ 銲接物件【鲜接缺岐在料後該待 2物 巾^的,因此冷料程巾的銲接缺 陷無法檢測。 j杆按缺 如上所述,該等習知 是無法精確地測量銲接結 之檢測方法有其使用的限制,或 果,因此,有必要尋求解決之道 【發明内容】 即在提供一種銲道缺陷檢測之 因此’本發明之目的, 1325496 方法 本發明之另一目的,即在提供一 試系統 種銲道缺陷檢測之測 於是,本發明銲道缺陷檢敎方法是包含下列步驟·· 於銲接後’連接二電極之待測試銲件持續地通入交 =二並測量㈣電極間於—預定時間内之—類比電流訊 二=電愿訊號。接著,分別轉換該類比電流訊號及 。“電坠訊號為一數位電流函數及一數位電壓函數。缺 =’將該數位電流函數及數位電麼函數分別轉換為一複數 數;、複數電屋函數’其中該複數電流函數及該複 =堡函數分別包括—實部及—以_希爾伯特轉換方程式 叙异的虛部。接著’將該複數電麼函數除以該複數電流函 數传到一電阻抗值。然後’將該電阻抗函數轉換為一電阻 抗波形,以顯示該待測試銲件之銲道缺陷。 本發明銲道缺陷檢測之測試系統,適用於分析一待測 試=件丄並包含一測試平台單元、一電流量測單元、一電 壓量測單元、-類比至數位轉換單元組、—處理單元及一 輪出單元。 該測試平台單元包括二電連接於該待測試銲件之鲜道 端的電極&電連接该等電極並提供交流電源的電力模 組’該電力模組用以於銲接後持續地通入交流電至該待測 1件。該電流量測單元電連接該測試平台單元,並用以 測里該等電極間之類比電流訊號。該電壓量測單元電連接 該測試平台單元’並用以測量該等電極間之類比電壓訊號 7 1325496 。該類比至數位轉換單元組電連接該電流量測單元及該電 壓畺測單元,並將該類比電流訊號及該類比電壓訊號分別 轉換為一數位電流函數及一數位電壓函數。該處理單元電 連接該類比至數位轉換單元組,並包括一運算模組,其中 該運算模組用以將該數位電流函數及該數位電壓函數分別 轉換為一複數電流函數及一複數電壓函數,並計算出一電 阻抗函數及-電阻抗波形,以該複數電流函數及複數電 壓函數分別包括—實部及一以一希爾伯特轉換方程式所計 算之虛部。該輸出單元電連接該處理單元,用以顯示該電 阻抗波形。 本發明的功效在於精確地量測於銲接後該待測試鲜件 的電阻抗函數及產生對應之電阻抗波形,使檢測人員可以 據以了解該待測試銲件是否有缺陷。 【實施方式】 有關本發明之前述及其他技術内容、特點與功效,在 以下配合參考圖式之二個較佳實施例的詳細說明中,將可 清楚的呈現。在本發明姑Δ , 破砰細描述之前,要注意的是,在> The bar defect detection method and detection device measure the electrical impedance function instantaneously in the welding process. The conventional detecting device is combined with a spot welding device. When the spot welding device is welded - the object to be welded, the detecting device instantly measures the current signal between the two electrodes of the spot welding system and (4) the signal, = when spot welding The electrode is connected to a high current, and the current must be reduced by the _current comparator to measure the appropriate current value, and then the Hilbert (10) _ rans 0rm) conversion operation is used to obtain the immediate electrical impedance (4) he (10)) signal two measurements: Γ can According to the electrical impedance signal, it is known that the possible fresh joint defect measuring device can only measure the voltage and the thunder during the welding process of the welding device, and the welding object (the welding object) After 2 towels, the welding defects of the cold towel can not be detected. The j-bar is as described above, and these conventional knowledge is that it is impossible to accurately measure the limitation of the detection method of the welded joint, or the result, therefore, it is necessary to seek a solution [invention] that a weld bead defect is provided. The object of the invention is therefore the object of the invention, 1325496. Another object of the invention is to provide a test system for the detection of weld bead defects. The method for inspecting the weld bead of the present invention comprises the following steps: 'The weldment to be tested connected to the two electrodes is continuously passed through the intersection = two and measured (four) between the electrodes - the predetermined time - analog current signal = electricity wish signal. Then, the analog current signal and the analog current are respectively converted. "The electric signal is a digital current function and a digital voltage function. Lack = 'The digital current function and the digital electric function are respectively converted into a complex number; and the complex electric house function' where the complex current function and the complex = The fort function consists of the real part and the imaginary part of the _Hilbert conversion equation. Then 'divide the complex electric function by the complex current function and pass it to an electrical impedance value. Then' the electrical impedance The function is converted into an electrical impedance waveform to display the weld bead defect of the weldment to be tested. The test system for weld bead defect detection of the present invention is suitable for analyzing a test to be tested and includes a test platform unit and a current measurement. a unit, a voltage measuring unit, an analog-to-digital converting unit group, a processing unit, and a round-out unit. The test platform unit includes two electrodes electrically connected to the fresh end of the solder to be tested, and electrically connected to the electrodes And providing a power module of the AC power source. The power module is configured to continuously input AC power to the one to be tested after welding. The current measuring unit is electrically connected to the test platform unit. And measuring the analog current signal between the electrodes. The voltage measuring unit is electrically connected to the test platform unit 'and is used to measure the analog voltage signal 7 1325496 between the electrodes. The analog to digital conversion unit group is electrically connected. The electric current measuring unit and the voltage detecting unit convert the analog current signal and the analog voltage signal into a digital current function and a digital voltage function respectively. The processing unit is electrically connected to the analog to digital conversion unit group, and includes An operation module, wherein the operation module is configured to convert the digital current function and the digital voltage function into a complex current function and a complex voltage function, and calculate an electrical impedance function and an electrical impedance waveform. The complex current function and the complex voltage function respectively comprise a real part and an imaginary part calculated by a Hilbert conversion equation. The output unit is electrically connected to the processing unit for displaying the electrical impedance waveform. Accurately measuring the electrical impedance function of the fresh component to be tested after welding and generating a corresponding electrical impedance waveform for inspection The test personnel can understand whether the weld to be tested is defective. [Embodiment] The foregoing and other technical contents, features and effects of the present invention are described in the following detailed description of two preferred embodiments with reference to the drawings. Will be clearly presented. Before the invention is described, it should be noted that

以下的說明内容中,翻如认_ 7 L 貝U的7L件是以相同的編號來表示。 參閱圖卜本發明銲道缺陷檢測之測試系統之第—較佳 實施例’適詩分析—已完成銲接之料m銲件卜並包含 一測試平台單元2、一雷法曰 3 1:机置測單元3、一電壓量測單 元 、-類比至數轉換單元、—處理單元6,及—輪出單 該測試平台單元2 電連接於該待測試銲件 兩 8 1325496 端的電極21及一電連接該等電極2ι並提供交流電源的電 力模..且22 „亥電力模組22用以持續地通入交流電至該待測 試銲件1。其中該電力模組22可以為一交流電發電機提 供該測4平台單元2所需之交流電亦可以將外部的交流 電源變愿為穩定、持續且適當的電流及電塵,而通入該待 測4銲件1的交流電電流值必須根據該待測試銲件丨的電 阻性質而定。 该電流量測單元3電連接該測試平台單元2,並用以測 量該測試平台單元2之該等電極21間之類比電流訊號。 該電壓量測單元4電連接該測試平台單元2,並用以測 1 »玄測試平D單元2之該等電極21間之類比電壓訊號。 該類比至數位轉換單元組5電連接該電流量測單元3 及6亥電壓3:測單元4,並將該類比電流訊號及該類比電壓訊 號分別轉換為一數位電流函數及一數位電壓函數。其中該 類比至數位轉換單元組5可以是單一的數位類比轉換器, 同時將輸入的類比電流訊號及類比電壓訊號轉換成對應之 數位電流函數及數位電壓函數。然而,該類比至數位轉換 單元組5並不限於上述之實施態樣,亦可以為一電流類比 至數位轉換器51及一電壓類比至數位轉換器52,分別電連 接該電流量測單元3及電壓量測單元4,再進行類比至數位 的轉換。 該處理單元6電連接該類比至數位轉換單元組5,並包 括一運算模組61,當該運算模組61接收該數位電流函數及 數位電壓函數後’將該數位電流函數及數位電壓函數轉換 丄325496 為複數(c〇mplex)形式進行運算。利用複數運算的原因在 於,銲接過程會產生電感效應,所以電壓相位會超前電流 相位,因此該待測試銲件丨的電阻抗函數不能直接用電壓 除以電流來計算。 該運算模組61所產生之一複數電流函數是依據式(1)計 算: ............................... 冗 t 一 t ...................I丄)In the following description, the 7L pieces of the _ 7 L Bay U are indicated by the same reference numerals. Referring to the drawings, the first preferred embodiment of the test system for the detection of weld bead defects, the preferred embodiment of the invention, the analysis of the appropriate poems, the welding of the material m weldment, and the inclusion of a test platform unit 2, a Leifa 曰 3 1: machine The measuring unit 3, a voltage measuring unit, an analog to digital conversion unit, a processing unit 6, and a wheeling unit, the test platform unit 2 is electrically connected to the electrode 21 of the 8 1325496 end of the to-be-tested weldment and an electrical connection The electrodes 2ι provide a power mode of the AC power source. The 22 power module 22 is used to continuously input AC power to the weldment 1 to be tested. The power module 22 can provide the AC generator. The AC power required for measuring the platform unit 2 can also change the external AC power source into a stable, continuous and appropriate current and electric dust, and the AC current value of the 4 weldment 1 to be tested must be based on the welding to be tested. The current measuring unit 3 is electrically connected to the test platform unit 2 and is used to measure an analog current signal between the electrodes 21 of the test platform unit 2. The voltage measuring unit 4 is electrically connected to the testing platform Element 2, and is used to measure the analog voltage signal between the electrodes 21 of the flat panel D unit 2. The analog to digital conversion unit group 5 is electrically connected to the current measuring unit 3 and 6 hai voltage 3: measuring unit 4 And converting the analog current signal and the analog voltage signal into a digital current function and a digital voltage function, wherein the analog to digital conversion unit group 5 can be a single digital analog converter, and the input analog current signal And the analog voltage signal is converted into a corresponding digital current function and a digital voltage function. However, the analog to digital conversion unit group 5 is not limited to the above embodiment, and may be a current analog to digital converter 51 and a voltage analogy. The analog converter 52 is electrically connected to the current measuring unit 3 and the voltage measuring unit 4, and then analog-to-digital conversion is performed. The processing unit 6 is electrically connected to the analog-to-digital converting unit group 5 and includes a computing module. Group 61, when the computing module 61 receives the digital current function and the digital voltage function, 'converts the digital current function and the digital voltage function 丄 325496 The operation is performed for the complex (c〇mplex) form. The reason for using the complex operation is that the welding process produces an inductive effect, so the voltage phase leads the current phase, so the electrical impedance function of the weldment to be tested cannot be directly divided by the voltage. The current is calculated. The complex current function generated by the operation module 61 is calculated according to the formula (1): .......................... ..... redundant t a...................I丄)

其中,該如為該複數電流函數,該明為該數位電流函 數且是該複數電流函數之實部,而該則為該數位電 流函數代入一希爾伯特轉換(Hilbert Transf〇rm)方程式計 异後所得之該複數電流函數的虛部,幻.是虛數單位。該複 數電流函數經式(1)計算後可再以式(2)表示: 〜)=|/(〇卜_)........................ 其中’該φ 2係該相對相位。Wherein, the function is the complex current, the function is the digital current function and is the real part of the complex current function, and the digital current function is substituted into a Hilbert Transf〇rm equation The imaginary part of the complex current function obtained by the difference is imaginary. The complex current function can be expressed by the formula (2) after being calculated by the formula (1): ~)=|/(〇卜_).................... .... where 'the φ 2 is the relative phase.

而該運算模組61所產生之—複數電壓函數是依據式⑺ 計算: π} t-t’ .............................................. 其中,該f(〇為該複數電壓函數,該<〇為該數位電壓函 數且是該複數電壓函數之實部,而該^則為該數位電 壓函數代入該希爾伯特轉換方程式計算後所得之該複數電 壓函數的虛部,且_/是虛數單位。該複數電壓函數經上式計 10 .·.···(4) 算後可再以式(4)表示: V(0 = |v(i)|eM(〇 其中,該P 1係一相對相位- 1Φ求得該複數電流函數及該複數電壓函數後,即可4 -該電阻枋孑叙 1 j叶异 ζ(,)啲灿而該電阻抗函數是依據式(5)計算: ‘ > 〜)]相μ-..................................... I , 。、 歧丨z(t)丨係代表電阻抗的振幅,妒係一相對相位 間為二:出該電阻抗函數後,便可以以該電阻抗函數的時 ’、Ί ,言亥電阻抗函數的電阻抗值為縱軸 抗波形。 I王電阻 該輸出早兀7電連接該處理單元6 ’用以顯示該電阻抗 …。由於無銲道缺陷之銲件與有銲道缺陷之銲件的電阻 ,波形不同,檢測人員可以根據該電阻抗波形了解待測試 件1是否峰實地被銲接。 、、m 2 ’本發明第—較佳實施例之銲道缺陷檢測之方 法適用於上述之銲道缺陷檢測之測試系統,並包含下列 步驟: 百先,如步驟9〇1所示,於銲接後,將該待測試銲件工 電連接該測試平台單元2之該等電極21並持續地通入交流 電此時,可以利用該電流量測單元3及電壓量測單元4 刀别測量該等電極21間於-預定時間内之類比電流訊號及 類比電壓訊號。 11 接著,如步驟902 %· + 2所不,利用該類比至數一 組5轉換該類比電流訊號 轉換早兀The complex voltage function generated by the operation module 61 is calculated according to the formula (7): π} t-t' ......................... ..................... where f (〇 is the complex voltage function, the <〇 is the function of the digital voltage and is the function of the complex voltage And the ^ is the imaginary part of the complex voltage function obtained by substituting the digital voltage function into the Hilbert conversion equation, and _/ is an imaginary unit. The complex voltage function is calculated by the above formula 10 . ···(4) After the calculation, it can be expressed by the formula (4): V(0 = |v(i)|eM(wherein, the P 1 is a relative phase - 1Φ to obtain the complex current function and the complex number After the voltage function, it can be 4 - the resistance 枋孑 1 1 j leaf ζ ζ (,) 而 而 and the electrical impedance function is calculated according to the formula (5): ' > ~)] phase μ-..... ................................ I , . . , 丨 z(t) 丨 represents the amplitude of the electrical impedance, The relative phase between the two systems is two: after the electrical impedance function is obtained, the resistance of the electrical impedance function can be used as the vertical axis impedance waveform.兀7 Electrically connecting the processing unit 6' to display the electrical resistance.... Because the resistance of the weldment without the weld bead and the weldment with the weld bead, the waveform is different, the tester can understand the test piece according to the electrical impedance waveform 1 Whether the peak is actually welded. , m 2 'The method for detecting the weld bead defect of the first preferred embodiment of the present invention is applicable to the above test system for weld bead defect detection, and includes the following steps: First, as in step 9 As shown in FIG. 1 , after the welding, the welding consumables are electrically connected to the electrodes 21 of the test platform unit 2 and continuously connected to the alternating current. At this time, the current measuring unit 3 and the voltage measuring unit 4 can be utilized. The knife does not measure the analog current signal and the analog voltage signal between the electrodes 21 within a predetermined time. 11 Next, if the step 902 %· + 2 is not used, the analog to current group 5 is used to convert the analog current signal.兀

函數及該數位電壓函數。 電”L 接者’如步驟903所示,該處理單元 根據上述式⑴及式(該數㈣流函數㈣模數·= 函數,並根據上述式⑺及式( 電爪 複數電Μ函數。 )及“數位電壓函數轉換為該 然後,如步驟_所示,該處理單元6之運算模組Η 根據上述式(5)將該複數電壓 該電阻抗函數。 除以該複數電流函數得到 接者如步驟9〇5所不,該處理單元6之運算模組61 將該電阻抗函數轉換為電阻抗波形’並利用輸出單元7顯 示該電阻抗波形’檢測人員即可依據該電阻抗波形得知該 待測試銲件1是否有銲道缺陷的問題。 參閱圖3 ’本發明銲道缺陷檢測之測試系統之第二較佳 實施例,如同第-較佳實施例,同樣包含-測試平台單元2 、-電流量測單元3…電壓量測單元4—類比至數位轉 換單元組5、—處理單元6及—輸出單元7。和該第一較佳 實施例不同的是,該第二較佳實施例之銲道缺陷測試系統 更包含一通頻帶濾波器(Band Pass Fiher) 53、一顯示單元 8,且該處理單元6除了一運算漁61外更包括_分析模 組62。 該通頻帶濾波器53電連接該類比至數位轉換單元組5 及該處理單元6間,該通頻帶濾波器53用以增加檢測的精 12 1325496 法’適用於該第二較佳實施例之銲道缺陷檢測之測試系統 ,並包含下列步驟: " 如步驟911所示,將該待測試銲件1電連接該測 式平口單元2之該等電極21並由該電力模組22持續地通 入父流電。此時,可以利用該電流量測單元3及電壓量測 單元4分別測量該等電極21間於該預定時間内之類比電流 訊號及類比電壓訊號。 接者,如步驟912所示,利用該類比至數位轉換單元 組5轉換該類比電流訊號及該類比電壓訊號為該數位電流 函數及該數位電壓函數。 接著,如步驟913所示,以通頻帶濾波器53處理該數 位電流函數及該數位電壓函數之較高諧振。 接著,如步驟914所示,該處理單元6之運算模組61 與第一較佳實施例相同,將該數位電流函數轉換為該複數 電流函數,並將該數位電壓函數轉換為該複數電壓函數。 然後,如步驟915所示,該處理單元6之運算模組61 將該複數電壓函數除以該複數電流函數得到該電阻抗函數 〇 接著’如步驟916所示’該處理單元6之運算模組61 將該電阻抗函數轉換為電阻抗波形,並利用輸出單元7顯 示該電阻抗波形, 然後,如步驟917所示,該處理單元6之分析單元62 將該電阻抗函數與該等歷史電阻抗函數比對,並於該顯示 早元8顯不該電阻抗函數是否符合任一歷史電阻抗函數 14 1325496 其中,該分析單元62可以使用資料庫建置該等歷史電阻抗 函數,亦可以將分析單元62以該神經網路辨識圖建置提 昇該分析單元62分析的能力。檢測人員可依據輸出單元7 及…員示單元8所顯示的結果,進行正確的判斷即使是檢 測經驗較資淺者,亦能有效協助其判斷。 知上所述,本發明利用複數計算避免量測動態電阻所 產生的相位差問題’另夕卜’因本發明之設計係針對已鲜接 完成之銲件,因此可偵測到非放電過程中所產生的缺陷, 確實可有效提高偵測銲道缺陷的準確度。再者,在第二較 佳實施例中結合該分析模組62的功能,更能協助無豐富檢 測經驗的工作人員做出準確的判斷。 a惟以上所述者,僅為本發明之較佳實施例而已,當不 :以此限定本發明實施之範圍,即大凡依本發明申請專利 範圍及發明說明内容所作之簡單的等效變化與修飾,皆仍 屬本發明專利涵蓋之範圍内。 【圖式簡單說明】 圖1是—方塊圖’ #明本發明之銲道缺陷檢測之測試 系統之第一較佳實施例; 圖2是一流程圖,說明本發明之銲道缺陷檢測方法之 第—較佳實施例; 圖3是一方塊圖,說明本發明之銲道缺檢測之測試系 統之第二較佳實施例;及 圖4是一流程圖,說明本發明之銲道缺陷檢測方法之 第一較佳實施例。 15 1325496 【主要元件符號說明】 1 ·· ……待測試銲件 2 .... ......測試平台單元 21… ……電極 22··· ......電力模組 3…· ……電流量測單元 4 ···· ……電壓量測單元 5 ···· ……類比至數位轉換 單元組 51… ......電流類比至數位 轉換器 52-........電壓類比至數位 轉換器 53·………通頻帶濾波器 6 ..........處理單元 61 .........運算模組 62 .........分析模組 7 ..........輸出單元 8 ..........顯示單元 901〜905步驟 911〜917步驟Function and the digital voltage function. The electric "L connector" is as shown in step 903, and the processing unit is based on the above equations (1) and (the number (four) stream function (four) modulus·= function, and according to the above equation (7) and equation (electric claw complex electric function). And the "digital voltage function is converted to the then, as shown in step _, the processing module of the processing unit 6 将该 the complex voltage according to the above equation (5) the electrical impedance function. Divided by the complex current function to obtain the receiver Step 9〇5, the operation module 61 of the processing unit 6 converts the electrical impedance function into an electrical impedance waveform 'and displays the electrical impedance waveform by the output unit 7', and the detecting person can know the electrical impedance waveform according to the electrical impedance waveform. Whether the weldment 1 to be tested has a problem of weld bead defects. Referring to Figure 3, a second preferred embodiment of the test system for weld bead defect detection of the present invention, like the first preferred embodiment, also includes a test platform unit 2 Current measuring unit 3 ... voltage measuring unit 4 - analog to digital converting unit group 5, processing unit 6 and - output unit 7. Unlike the first preferred embodiment, the second preferred embodiment Weld defect test system Furthermore, a pass band filter (Band Pass Fiher) 53 and a display unit 8 are included, and the processing unit 6 further includes an _analysis module 62 in addition to a computing fish 61. The passband filter 53 electrically connects the analog to digital conversion. Between the unit group 5 and the processing unit 6, the passband filter 53 is used to increase the detected precision 12 1325496 method for the test system of the bead defect detection of the second preferred embodiment, and includes the following steps: As shown in step 911, the soldering member 1 to be tested is electrically connected to the electrodes 21 of the measuring flat unit 2, and the power module 22 continuously passes the parent current. At this time, the current amount can be utilized. The measuring unit 3 and the voltage measuring unit 4 respectively measure the analog current signal and the analog voltage signal between the electrodes 21 within the predetermined time. Then, as shown in step 912, the analog to digital conversion unit group 5 is used to convert the The analog current signal and the analog voltage signal are a function of the digital current and the digital voltage function. Next, as shown in step 913, the digital current function and the digital voltage function are processed by the passband filter 53. High resonance. Next, as shown in step 914, the operation module 61 of the processing unit 6 is the same as the first preferred embodiment, converting the digital current function into the complex current function, and converting the digital voltage function into the The complex voltage function. Then, as shown in step 915, the operation module 61 of the processing unit 6 divides the complex voltage function by the complex current function to obtain the electrical impedance function. Then, as shown in step 916, the processing unit The operation module 61 of 6 converts the electrical impedance function into an electrical impedance waveform, and displays the electrical impedance waveform by using the output unit 7. Then, as shown in step 917, the analyzing unit 62 of the processing unit 6 compares the electrical impedance function with The historical electrical impedance functions are aligned, and in the display, the electrical impedance function is consistent with any historical electrical impedance function 14 1325496. The analysis unit 62 can use the database to establish the historical electrical impedance functions. The analysis unit 62 can also be used to enhance the ability of the analysis unit 62 to analyze the neural network identification map. The tester can make a correct judgment based on the results displayed by the output unit 7 and the member display unit 8, and even if the test experience is shallower, it can effectively assist the judgment. As described above, the present invention utilizes a complex calculation to avoid the problem of phase difference caused by measuring dynamic resistance. [In addition, the design of the present invention is directed to a weldment that has been successfully completed, so that a non-discharge process can be detected. The resulting defects can effectively improve the accuracy of detecting weld bead defects. Furthermore, in combination with the function of the analysis module 62 in the second preferred embodiment, it is possible to assist an operator without extensive test experience to make an accurate judgment. The above is only the preferred embodiment of the present invention, and is not intended to limit the scope of the practice of the present invention, that is, the simple equivalent change of the scope of the invention and the description of the invention. Modifications are still within the scope of the invention. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a block diagram of a first embodiment of a test system for flaw detection of a bead of the present invention; FIG. 2 is a flow chart illustrating a method for detecting a defect of a bead of the present invention. a preferred embodiment; FIG. 3 is a block diagram showing a second preferred embodiment of the test system for bead defect detection of the present invention; and FIG. 4 is a flow chart illustrating a method for detecting a weld bead defect of the present invention. A first preferred embodiment. 15 1325496 [Explanation of main component symbols] 1 ·· ...welding of weldments 2 ..........test platform unit 21.........electrode 22··· ...power module 3 ...· ...... current measuring unit 4 ···· ... voltage measuring unit 5 ···· ... analog to digital conversion unit group 51... ...... current analog to digital converter 52-.. ...voltage analog to digital converter 53 .......... passband filter 6 ..... processing unit 61 ... ... computing module 62 .. .......analysis module 7 ..........output unit 8 .......... display unit 901~905 steps 911~917

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Claims (1)

1325496 十、申請專利範圍: 1 · 一種銲道缺陷檢測之方法,包含下列步驟: (a) 於銲接後,將一電連接二電極之待測試銲件持續 地通入交流電,並測量該等電極間於一預定時間内之一 類比電流訊號及一類比電壓訊號; (b) 分別轉換該類比電流訊號及該類比電壓訊號為— 數位電流函數及一數位電壓函數; (c) 將該數位電流函數及數位電壓函數分別轉換為— 複數電流函數及一複數電壓函數,其中該複數電流函數 及該複數電壓函數分別包括一實部及一以一希爾伯特轉 換方程式計算的虛部; (d) 將該複數電壓函數除以該複數電流函數得到一電 阻抗函數;及 (e) 將該電阻抗函數轉換為一電阻抗波形,以顯示該 待測試銲件之銲道缺陷。 2. 依據申請專利範圍第丨項所述之銲道缺陷檢測之方法, 在該(b)步驟及(c)步驟間,更包含一步驟(f),以一通頻帶 濾波器處理該數位電流函數及該數位電壓函數之較高諧 振。 3. 依據申請專利範圍第i項所述之銲道缺陷檢測之方法, 在忒(e)步驟後,更包含一步驟(g),比對該電阻抗函數與 複數預先儲存之歷史電阻抗函數,並顯示該電阻抗函數 是否符合任一歷史電阻抗函數。 4. 依據申請專利範圍第3項所述之銲道缺陷檢測之方法, 17 其中該等歷史電阻抗函數包 双巴栝正常電阻抗函數及複數 標記為不同原因之異常電阻抗函數。 5. 依據申έ青專利範圍第3 、+. Λ μ 固弟3項所述之銲道缺陷檢測之方法, 在該(e)步驟後,更包合— 3 步驟(h),將該電阻抗函數儲存 成其中一歷史電阻抗函數。 6. 依據中請專利範圍第丨項所述之銲道缺陷檢測之方法, 在“⑷步驟後’更包含一步驟⑴,將該電阻抗函數與一 利用複數歷史電阻抗函數訓練之神經網路辨識圖建置的 分析模組進行分析,並顯示分析結果。 7. -種銲道缺陷檢測之測試系統,適用於分析一待測試辉 件,並包含: 測試平台單元,包括二電連接於該待測試銲件之 鲜道兩端的電極及-電連接該等電極並提供交流電源的 電力模組,該電力模組用以於鋅接後持續地通入交流電 至該待測試銲件; 一電流量測單元,電連接該測試平台單元,並用以 測量於一預定時間内該等電極間之類比電流訊號; 一電壓量測單元,電連接該測試平台單元,並用以 測量於該預定時間内該等電極間之類比電壓訊號; 一類比至數位轉換單元組,電連接該電流量測單元 及該電壓量測單元,並將該類比電流訊號及該類比電壓 訊號分別轉換為一數位電流函數及一數位電壓函數; 一處理單元’電連接該類比至數位轉換單元組,並 包括一運算模組,其中該運算模組用以將該數位電流函 18 1325496 數及該數位電壓函數分 数刀別轉換為一複數電流函數及一複 數電壓函數,並計算出-電阻抗函數及-電阻抗波形, -中“複數電机函數及複數電壓函數分別包括—實部及 一以:希爾伯特轉換方程式所計算之虛部;及 輸出單元,電連接該處理單元,用以顯示該電阻 抗波形。 8·依據申叫專利範圍第7項所述之銲道缺陷檢測之測試系 :’其中該類比至數位轉換單元組包括一電連接該電流 里測單元之類比至數位電流轉換單元及一電連接該電壓 量測單兀之類比至數位電壓轉換單元。 9. 依據申》月專利範圍帛7項所述之鲜道缺陷檢測之測試系 、.克更匕έ電連接於該類比至數位轉換單元組及該處 理單元間的通頻帶濾波器,用以處理該數位電流函數及 該數位電壓函數之較高諧振。 10. 依據申請專利範圍第7項所述之銲道缺陷檢測之測試系 統,其中該處理單元更包括一分析模組,該分析模組紀 錄有複數預先儲存之歷史電阻抗函數,並可分析該電阻 抗函數是否符合任一歷史電阻抗函數。 11. 依據申請專利範圍第10項所述之銲道缺陷檢測之測試系 統’其中該處理單元之分析模組所紀錄的該等歷史電阻 抗函數包括一正常電阻抗函數及複數標記為不同原因之 異常電阻抗函數。 1 2 .依據申請專利範圍第1 〇項所述之銲道缺陷檢測之測試系 統’更包含一顯示單元,用以顯示該電阻抗函數是否符 19 1325496 合任一歷史電阻抗函數β 13·依射請專利範圍第1Q項所述之銲道缺陷檢測之測試系 統,其中該處理單元之分析模組可將該電阻抗函數館存 成其中一歷史電阻抗函數。 ' 14. 依據申請專利範圍第7項 吓❿之知道缺陷檢測之測試系 統,其中該處理單元更包括一公 斗’、 刀析杈組,該分析模組以 一利用複數歷史電阻抗函數钏綠 数』丨練之砷經網路辨識圖建置 ’並用以分析該電阻抗函數。 15. 依據申請專利範圍第丨4項所 所34之銲道缺陷檢測之測試系 統’更包含一顯示單元,該基 dd — / ·'、貝不早兀用以顯示該分析模 組所分析後的分析結果。1325496 X. Patent application scope: 1 · A method for detecting weld bead defects, comprising the following steps: (a) After welding, a weldment to be tested electrically connected to the two electrodes is continuously connected to an alternating current, and the electrodes are measured (b) converting the analog current signal and the analog voltage signal to a digital current function and a digital voltage function respectively; (c) the digital current function is converted between the analog current signal and the analog voltage signal; And the digital voltage function is respectively converted into a complex current function and a complex voltage function, wherein the complex current function and the complex voltage function respectively comprise a real part and an imaginary part calculated by a Hilbert conversion equation; (d) Dividing the complex voltage function by the complex current function to obtain an electrical impedance function; and (e) converting the electrical impedance function into an electrical impedance waveform to display a weld bead defect of the weldment to be tested. 2. According to the method for detecting weld bead defects according to the scope of the patent application, in the steps (b) and (c), a step (f) is further included, and the digital current function is processed by a passband filter. And the higher resonance of the digital voltage function. 3. According to the method for detecting the flaw of the weld bead according to item i of the patent application scope, after the step (e), a step (g) is further included, and the historical electrical impedance function is pre-stored with respect to the electrical impedance resistance function and the complex number. And show whether the electrical impedance function matches any historical electrical impedance function. 4. According to the method for detecting weld bead defects according to item 3 of the patent application scope, 17 wherein the historical electrical impedance resistance functions include a normal electrical impedance resistance function of the double-barbar and a complex electrical impedance function of the complex mark for different reasons. 5. According to the method of detecting the defects of the weld bead as described in Shen Yiqing's patent scope No. 3, +. Λ μ Gudi 3, after the step (e), it is further included - 3 step (h), the electricity The impedance function is stored as one of the historical electrical impedance functions. 6. According to the method of flaw detection of the weld bead mentioned in the scope of the patent application, after the "(4) step", a step (1) is further included, and the electrical impedance function and a neural network trained by the complex historical electrical impedance function are included. The analysis module built by the identification map is analyzed and the analysis result is displayed. 7. The test system for the detection of the weld bead is suitable for analyzing a test piece to be tested, and comprises: a test platform unit, comprising two electrical connections An electrode at both ends of the fresh track of the weldment to be tested and a power module electrically connected to the electrodes and providing an AC power source, the power module is configured to continuously apply an alternating current to the weldment to be tested after the zinc is connected; a measuring unit electrically connected to the test platform unit and configured to measure an analog current signal between the electrodes within a predetermined time; a voltage measuring unit electrically connected to the test platform unit and configured to measure the predetermined time An analog voltage signal between the electrodes; a analog to digital conversion unit group electrically connected to the current measuring unit and the voltage measuring unit, and the analog current signal and The analog voltage signal is converted into a digital current function and a digital voltage function respectively; a processing unit is electrically connected to the analog to digital conversion unit group, and includes a computing module, wherein the computing module is configured to use the digital current function 18 The 1325496 number and the digital voltage function fractional tool are converted into a complex current function and a complex voltage function, and the -resistance function and the electrical impedance waveform are calculated, - "the complex motor function and the complex voltage function respectively include - And the imaginary part calculated by the Hilbert conversion equation; and an output unit electrically connected to the processing unit for displaying the electrical impedance waveform. 8. Test system for bead defect detection according to item 7 of the patent application scope: 'The analog-to-digital conversion unit group includes an analog-to-digital current conversion unit electrically connected to the current measurement unit and an electrical connection The voltage measurement unit is analogous to a digital voltage conversion unit. 9. According to the test system of the fresh track defect detection described in the Japanese Patent Application 帛7, the passband filter is connected to the analog-to-digital conversion unit group and the processing unit, The digital current function and the higher resonance of the digital voltage function are processed. 10. The test system for bead defect detection according to claim 7, wherein the processing unit further comprises an analysis module, wherein the analysis module records a plurality of pre-stored historical electrical impedance functions, and can analyze the Whether the electrical impedance function conforms to any historical electrical impedance function. 11. The test system for weld bead defect detection according to claim 10, wherein the historical electrical impedance function recorded by the analysis module of the processing unit includes a normal electrical impedance function and a complex mark for different reasons. Abnormal electrical impedance function. 1 2. The test system for bead defect detection described in item 1 of the patent application scope further includes a display unit for displaying whether the electrical impedance function is 19 1325496 or any historical electrical impedance function β 13· The testing system for the bead defect detection described in the patent scope 1Q, wherein the processing module of the processing unit can store the electrical impedance function as one of the historical electrical impedance functions. 14. The test system for knowing the defect detection according to item 7 of the scope of the patent application, wherein the processing unit further comprises a gong ', a knife 杈 group, the analysis module uses a complex historical electrical impedance function 钏 green The number of arsenic is established by the network identification diagram and used to analyze the electrical impedance function. 15. The test system for the detection of weld bead defects according to item 34 of the scope of the patent application s 4 further includes a display unit, the base dd — / · ', is not used to display the analysis module after analysis Analysis results. 2020
TW95149484A 2006-12-28 2006-12-28 Testing method for the defect of welds and testing system TW200827713A (en)

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