TWI354800B - - Google Patents

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Info

Publication number: TWI354800B
Authority: TW; Taiwan
Prior art keywords: test; electronic component; tested; carrier; storage
Prior art date: 2007-03-09

Application number

TW097105700A

Other languages

English (en)

Chinese (zh)

Other versions

TW200907369A (en

Inventor

Masuo Yoshiyuki

Original Assignee

Advantest Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2007-03-09

Filing date

2008-02-19

Publication date

2011-12-21

2008-02-19 Application filed by Advantest Corp filed Critical Advantest Corp

2009-02-16 Publication of TW200907369A publication Critical patent/TW200907369A/zh

2011-12-21 Application granted granted Critical

2011-12-21 Publication of TWI354800B publication Critical patent/TWI354800B/zh

Links

238000012360 testing method Methods 0.000 claims description 169
238000012546 transfer Methods 0.000 claims description 79
238000003860 storage Methods 0.000 claims description 64
230000008707 rearrangement Effects 0.000 claims description 25
238000000034 method Methods 0.000 claims description 10
239000011159 matrix material Substances 0.000 claims description 5
238000012937 correction Methods 0.000 claims description 4
210000002784 stomach Anatomy 0.000 claims description 2
238000001179 sorption measurement Methods 0.000 description 32
102100030140 Thiosulfate:glutathione sulfurtransferase Human genes 0.000 description 29
239000000758 substrate Substances 0.000 description 8
230000003139 buffering effect Effects 0.000 description 5
238000010586 diagram Methods 0.000 description 4
229910000831 Steel Inorganic materials 0.000 description 2
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238000009413 insulation Methods 0.000 description 2
230000014759 maintenance of location Effects 0.000 description 2
238000004519 manufacturing process Methods 0.000 description 2
230000002093 peripheral effect Effects 0.000 description 2
239000010959 steel Substances 0.000 description 2
102100032306 Aurora kinase B Human genes 0.000 description 1
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101000798007 Homo sapiens RAC-gamma serine/threonine-protein kinase Proteins 0.000 description 1
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206010036790 Productive cough Diseases 0.000 description 1
102100032314 RAC-gamma serine/threonine-protein kinase Human genes 0.000 description 1
238000013459 approach Methods 0.000 description 1
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238000010438 heat treatment Methods 0.000 description 1
238000003780 insertion Methods 0.000 description 1
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238000012423 maintenance Methods 0.000 description 1
238000005259 measurement Methods 0.000 description 1
239000008267 milk Substances 0.000 description 1
210000004080 milk Anatomy 0.000 description 1
235000013336 milk Nutrition 0.000 description 1
238000012545 processing Methods 0.000 description 1
238000003672 processing method Methods 0.000 description 1
239000004065 semiconductor Substances 0.000 description 1
230000035939 shock Effects 0.000 description 1
239000000344 soap Substances 0.000 description 1
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210000003802 sputum Anatomy 0.000 description 1
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XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

Engineering & Computer Science (AREA)
Computer Hardware Design (AREA)
Microelectronics & Electronic Packaging (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Testing Of Individual Semiconductor Devices (AREA)

TW097105700A 2007-03-09 2008-02-19 Electronic component testing apparatus and method for transferring electronic component TW200907369A (en)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
PCT/JP2007/054667 WO2008126164A1 (ja)	2007-03-09	2007-03-09	電子部品試験装置及び電子部品の移載方法

Publications (2)

Publication Number	Publication Date
TW200907369A TW200907369A (en)	2009-02-16
TWI354800B true TWI354800B (2)	2011-12-21

Family

ID=39863348

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
TW097105700A TW200907369A (en)	2007-03-09	2008-02-19	Electronic component testing apparatus and method for transferring electronic component

Country Status (2)

Country	Link
TW (1)	TW200907369A (2)
WO (1)	WO2008126164A1 (2)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPH08292233A (ja) *	1995-04-25	1996-11-05	Hitachi Ltd	Ｉｃハンドラ
JPH08334548A (ja) *	1995-06-07	1996-12-17	Tokyo Electron Ltd	検査装置

2007
- 2007-03-09 WO PCT/JP2007/054667 patent/WO2008126164A1/ja not_active Ceased
2008
- 2008-02-19 TW TW097105700A patent/TW200907369A/zh not_active IP Right Cessation

Also Published As

Publication number	Publication date
TW200907369A (en)	2009-02-16
WO2008126164A1 (ja)	2008-10-23

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Legal Events

Date	Code	Title	Description
2014-09-21	MM4A	Annulment or lapse of patent due to non-payment of fees