TWI810698B - 電極界定未懸掛之聲波共振器 - Google Patents
電極界定未懸掛之聲波共振器 Download PDFInfo
- Publication number
- TWI810698B TWI810698B TW110140579A TW110140579A TWI810698B TW I810698 B TWI810698 B TW I810698B TW 110140579 A TW110140579 A TW 110140579A TW 110140579 A TW110140579 A TW 110140579A TW I810698 B TWI810698 B TW I810698B
- Authority
- TW
- Taiwan
- Prior art keywords
- layer
- aforementioned
- thickness
- acoustic impedance
- mode
- Prior art date
Links
- 239000013078 crystal Substances 0.000 claims abstract description 36
- 229910013641 LiNbO 3 Inorganic materials 0.000 claims abstract description 35
- 239000000463 material Substances 0.000 claims description 76
- 238000005520 cutting process Methods 0.000 claims description 39
- 230000008878 coupling Effects 0.000 claims description 22
- 238000010168 coupling process Methods 0.000 claims description 22
- 238000005859 coupling reaction Methods 0.000 claims description 22
- 229910003460 diamond Inorganic materials 0.000 claims description 21
- 239000010432 diamond Substances 0.000 claims description 21
- 229910052710 silicon Inorganic materials 0.000 claims description 14
- 239000010703 silicon Substances 0.000 claims description 14
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 6
- 239000000919 ceramic Substances 0.000 claims description 6
- 229910052760 oxygen Inorganic materials 0.000 claims description 6
- 239000001301 oxygen Substances 0.000 claims description 6
- 230000000737 periodic effect Effects 0.000 claims description 6
- 239000011521 glass Substances 0.000 claims description 4
- 238000002161 passivation Methods 0.000 claims description 4
- 229920000642 polymer Polymers 0.000 claims description 4
- 229910003327 LiNbO3 Inorganic materials 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- 229910052750 molybdenum Inorganic materials 0.000 claims description 3
- 230000007704 transition Effects 0.000 claims description 3
- 229910052804 chromium Inorganic materials 0.000 claims description 2
- 229910052763 palladium Inorganic materials 0.000 claims description 2
- 229910052697 platinum Inorganic materials 0.000 claims description 2
- 229910052715 tantalum Inorganic materials 0.000 claims description 2
- 229910052719 titanium Inorganic materials 0.000 claims description 2
- 229910017083 AlN Inorganic materials 0.000 claims 1
- 230000002349 favourable effect Effects 0.000 claims 1
- 239000004020 conductor Substances 0.000 description 98
- 239000000758 substrate Substances 0.000 description 98
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 18
- 229910052751 metal Inorganic materials 0.000 description 17
- 239000002184 metal Substances 0.000 description 17
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 15
- 239000002131 composite material Substances 0.000 description 14
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 13
- 230000004044 response Effects 0.000 description 13
- 238000010586 diagram Methods 0.000 description 12
- 230000000717 retained effect Effects 0.000 description 12
- 229910004298 SiO 2 Inorganic materials 0.000 description 9
- 235000012239 silicon dioxide Nutrition 0.000 description 9
- 239000000377 silicon dioxide Substances 0.000 description 9
- 230000000638 stimulation Effects 0.000 description 9
- 238000004891 communication Methods 0.000 description 7
- 239000010408 film Substances 0.000 description 7
- 238000000034 method Methods 0.000 description 6
- 238000010897 surface acoustic wave method Methods 0.000 description 6
- 238000003780 insertion Methods 0.000 description 5
- 230000037431 insertion Effects 0.000 description 5
- 238000009434 installation Methods 0.000 description 5
- 229910052783 alkali metal Inorganic materials 0.000 description 4
- 150000001340 alkali metals Chemical class 0.000 description 4
- 229910052681 coesite Inorganic materials 0.000 description 4
- 229910052906 cristobalite Inorganic materials 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- 229910052682 stishovite Inorganic materials 0.000 description 4
- 229910052905 tridymite Inorganic materials 0.000 description 4
- 229910052721 tungsten Inorganic materials 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 3
- 239000002585 base Substances 0.000 description 3
- 229910052741 iridium Inorganic materials 0.000 description 3
- 238000002310 reflectometry Methods 0.000 description 3
- 150000001342 alkaline earth metals Chemical class 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000005496 eutectics Effects 0.000 description 2
- 229910052451 lead zirconate titanate Inorganic materials 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 229910003465 moissanite Inorganic materials 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 229910002704 AlGaN Inorganic materials 0.000 description 1
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 1
- 229910002601 GaN Inorganic materials 0.000 description 1
- 238000001069 Raman spectroscopy Methods 0.000 description 1
- PGHQEOHSIGPJOC-UHFFFAOYSA-N [Fe].[Ta] Chemical compound [Fe].[Ta] PGHQEOHSIGPJOC-UHFFFAOYSA-N 0.000 description 1
- -1 alkaline earth metal titanate Chemical class 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000005094 computer simulation Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 229910052500 inorganic mineral Inorganic materials 0.000 description 1
- HFGPZNIAWCZYJU-UHFFFAOYSA-N lead zirconate titanate Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Zr+4].[Pb+2] HFGPZNIAWCZYJU-UHFFFAOYSA-N 0.000 description 1
- 239000011707 mineral Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
- H03H9/171—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02228—Guided bulk acoustic wave devices or Lamb wave devices having interdigital transducers situated in parallel planes on either side of a piezoelectric layer
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/0004—Impedance-matching networks
- H03H9/0014—Impedance-matching networks using bulk acoustic wave devices
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02007—Details of bulk acoustic wave devices
- H03H9/02015—Characteristics of piezoelectric layers, e.g. cutting angles
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02007—Details of bulk acoustic wave devices
- H03H9/02086—Means for compensation or elimination of undesirable effects
- H03H9/02102—Means for compensation or elimination of undesirable effects of temperature influence
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders or supports
- H03H9/0538—Constructional combinations of supports or holders with electromechanical or other electronic elements
- H03H9/0547—Constructional combinations of supports or holders with electromechanical or other electronic elements consisting of a vertical arrangement
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
- H03H9/171—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
- H03H9/172—Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
- H03H9/175—Acoustic mirrors
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201962860426P | 2019-06-12 | 2019-06-12 | |
| US62/860,426 | 2019-06-12 | ||
| US16/874,164 US11362640B2 (en) | 2018-07-17 | 2020-05-14 | Electrode-defined unsuspended acoustic resonator |
| US16/874,164 | 2020-05-14 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202221950A TW202221950A (zh) | 2022-06-01 |
| TWI810698B true TWI810698B (zh) | 2023-08-01 |
Family
ID=73546976
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW110140579A TWI810698B (zh) | 2019-06-12 | 2020-06-03 | 電極界定未懸掛之聲波共振器 |
| TW112124378A TWI866311B (zh) | 2019-06-12 | 2020-06-03 | 電極界定未懸掛之聲波共振器 |
| TW109118689A TWI748497B (zh) | 2019-06-12 | 2020-06-03 | 電極界定未懸掛之聲波共振器 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW112124378A TWI866311B (zh) | 2019-06-12 | 2020-06-03 | 電極界定未懸掛之聲波共振器 |
| TW109118689A TWI748497B (zh) | 2019-06-12 | 2020-06-03 | 電極界定未懸掛之聲波共振器 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP7307032B2 (ja) |
| KR (2) | KR102451077B1 (ja) |
| DE (1) | DE102020115436B4 (ja) |
| TW (3) | TWI810698B (ja) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP4454128A1 (en) * | 2022-03-08 | 2024-10-30 | Huawei Technologies Co., Ltd. | An acoustic resonator solidly mounted on a high acoustic velocity substrate |
| CN116707477B (zh) * | 2023-08-02 | 2024-04-02 | 深圳新声半导体有限公司 | 用于制造薄膜体声波谐振器fbar滤波装置的方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20130099630A1 (en) * | 2010-08-31 | 2013-04-25 | Taiyo Yuden Co., Ltd. | Acoustic wave device |
| US20140117815A1 (en) * | 2012-10-26 | 2014-05-01 | Avago Technologies General Ip (Singapore) Pte. Ltd | Temperature compensated resonator device having low trim sensitivy and method of fabricating the same |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| ATE427583T1 (de) | 2000-04-06 | 2009-04-15 | Nxp Bv | Abstimmbare filteranordnung |
| JP2006246451A (ja) | 2005-02-07 | 2006-09-14 | Kyocera Corp | 薄膜バルク音響波共振子およびフィルタならびに通信装置 |
| JP2007228225A (ja) | 2006-02-23 | 2007-09-06 | Seiko Epson Corp | 弾性表面波デバイス |
| JP2007312164A (ja) * | 2006-05-19 | 2007-11-29 | Hitachi Ltd | 圧電薄膜共振器並びにそれを用いた高周波フィルタ及び高周波モジュール |
| JP2008301453A (ja) | 2007-06-04 | 2008-12-11 | Toshiba Corp | 薄膜圧電共振器及びこれを用いたフィルタ回路 |
| JPWO2009013938A1 (ja) * | 2007-07-20 | 2010-09-30 | 株式会社村田製作所 | 圧電共振子及び圧電フィルタ装置 |
| US8512800B2 (en) * | 2007-12-04 | 2013-08-20 | Triquint Semiconductor, Inc. | Optimal acoustic impedance materials for polished substrate coating to suppress passband ripple in BAW resonators and filters |
| FI123640B (fi) | 2010-04-23 | 2013-08-30 | Teknologian Tutkimuskeskus Vtt | Laajakaistainen akustisesti kytketty ohutkalvo-BAW-suodin |
| CN103283147B (zh) * | 2010-12-24 | 2016-09-21 | 株式会社村田制作所 | 弹性波装置及其制造方法 |
| FI124732B (en) * | 2011-11-11 | 2014-12-31 | Teknologian Tutkimuskeskus Vtt | Lateral connected bulk wave filter with improved passband characteristics |
| DE102011119660B4 (de) | 2011-11-29 | 2014-12-11 | Epcos Ag | Mikroakustisches Bauelement mit Wellenleiterschicht |
| US20130322328A1 (en) | 2012-05-30 | 2013-12-05 | Qualcomm Incorporated | Methods and devices for optimizing cell re acquisitions |
| US9240767B2 (en) * | 2012-05-31 | 2016-01-19 | Texas Instruments Incorporated | Temperature-controlled integrated piezoelectric resonator apparatus |
| CN102904546B (zh) * | 2012-08-30 | 2016-04-13 | 中兴通讯股份有限公司 | 一种温度补偿能力可调节的压电声波谐振器 |
| GB2511919A (en) | 2013-02-28 | 2014-09-17 | Avago Technologies General Ip | Acoustic resonator comprising collar and frame |
| DE102014103229B3 (de) | 2014-03-11 | 2015-07-23 | Epcos Ag | BAW-Resonator mit Temperaturkompensation |
| CN107567682B (zh) * | 2014-12-17 | 2021-01-22 | Qorvo美国公司 | 具有波限制结构的板波装置和制造方法 |
| CN108463720B (zh) * | 2015-10-21 | 2021-03-23 | Qorvo美国公司 | 具有声学振动的剪切模式和纵向模式的增强反射的谐振器结构 |
| SG11201903365SA (en) * | 2016-10-20 | 2019-05-30 | Skyworks Solutions Inc | Elastic wave device with sub-wavelength thick piezoelectric layer |
-
2020
- 2020-06-03 TW TW110140579A patent/TWI810698B/zh active
- 2020-06-03 TW TW112124378A patent/TWI866311B/zh active
- 2020-06-03 TW TW109118689A patent/TWI748497B/zh active
- 2020-06-04 JP JP2020097677A patent/JP7307032B2/ja active Active
- 2020-06-10 DE DE102020115436.4A patent/DE102020115436B4/de active Active
- 2020-06-11 KR KR1020200070691A patent/KR102451077B1/ko active Active
-
2022
- 2022-09-29 KR KR1020220124142A patent/KR102740970B1/ko active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20130099630A1 (en) * | 2010-08-31 | 2013-04-25 | Taiyo Yuden Co., Ltd. | Acoustic wave device |
| US20140117815A1 (en) * | 2012-10-26 | 2014-05-01 | Avago Technologies General Ip (Singapore) Pte. Ltd | Temperature compensated resonator device having low trim sensitivy and method of fabricating the same |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202221950A (zh) | 2022-06-01 |
| KR102451077B1 (ko) | 2022-10-06 |
| TWI866311B (zh) | 2024-12-11 |
| DE102020115436B4 (de) | 2025-03-27 |
| JP2020202564A (ja) | 2020-12-17 |
| TW202343838A (zh) | 2023-11-01 |
| JP7307032B2 (ja) | 2023-07-11 |
| TWI748497B (zh) | 2021-12-01 |
| DE102020115436A1 (de) | 2020-12-17 |
| TW202103346A (zh) | 2021-01-16 |
| KR20220137599A (ko) | 2022-10-12 |
| KR102740970B1 (ko) | 2024-12-11 |
| KR20200142469A (ko) | 2020-12-22 |
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