TWI852004B - Processing method and system of checking offset between rfid tag's antenna and chip - Google Patents

Processing method and system of checking offset between rfid tag's antenna and chip Download PDF

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TWI852004B
TWI852004B TW111117730A TW111117730A TWI852004B TW I852004 B TWI852004 B TW I852004B TW 111117730 A TW111117730 A TW 111117730A TW 111117730 A TW111117730 A TW 111117730A TW I852004 B TWI852004 B TW I852004B
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antenna
chip
hough
processor
block
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TW111117730A
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TW202345032A (en
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林一帆
闕稚庭
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香港商永道無線射頻標籤(香港)有限公司
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Abstract

A processing method and system of checking offset between RFID tag's antenna and chip is provided. The processing system comprises a storage device and a process unit. The process unit performs the following steps. Fetch a input image and the input image comprises a first anchor point and a second anchor point. Perform a chip image process for the input image and outputs a chip edge image. Perform an antenna image process for the input image and output an antenna edge image. Perform a Hough transform process for the chip edge image and the antenna edge image, and output a Hough chip edge image and a Hough antenna edge image. Calculating an offset angle according to an antenna edge of the Hough antenna edge image and a chip edge of the Hough chip edge image. Generating a connecting line according to the first anchor point and the second anchor point. Acquiring an antenna image midpoint according to the Hough antenna edge image and the connecting line. Acquiring a chip image midpoint according to the Hough chip edge image. Calculating a offset distance according to the antenna image midpoint and the chip image midpoint. Generating a compare result according to the offset angle and the offset distance.

Description

檢測RFID標籤的天線與晶片位置精準度的處理方法與系統Processing method and system for detecting the position accuracy of antenna and chip of RFID tag

關於一種利用數位影像檢測物件偏移的方法與系統,特別有關一種檢測RFID標籤的天線與晶片位置精準度的處理方法與系統。 A method and system for detecting object deviation using digital images, and in particular, a processing method and system for detecting the position accuracy of antenna and chip of RFID tags.

隨著通訊技術的快速增長,也帶動天線與晶片的封裝需求。例如:無線射頻辨識(Radio Frequency Identification,RFID)標籤的天線與晶片封裝。在封裝過程中晶片可能受到干擾影響,使得晶片位置偏移至預設位置外。因此生產時需要對封裝結果進行檢測。由於封裝後的天線與晶片體積過小,檢測人員難以直接以肉眼進行判斷晶片位置是否有偏移。此外,若能在生產過程中立即發現晶片位置偏移或缺失(未被貼上晶片),可以盡早停機以矯正生產流程的疏失,減少廢料及提升生產良率。 With the rapid growth of communication technology, the packaging demand for antennas and chips has also been driven. For example: the antenna and chip packaging of Radio Frequency Identification (RFID) tags. During the packaging process, the chip may be affected by interference, causing the chip position to shift outside the preset position. Therefore, the packaging results need to be inspected during production. Since the antenna and chip after packaging are too small, it is difficult for inspectors to directly judge whether the chip position is offset with the naked eye. In addition, if the chip position offset or missing (chip not attached) can be immediately discovered during the production process, the machine can be stopped as soon as possible to correct the oversight of the production process, reduce waste and improve production yield.

有鑑於此,在一些實施例中提供一種檢測RFID標籤的天線 與晶片位置精準度的處理方法,其係透過數位影像的物件辨識與相關處理,並結合快速處理的霍夫轉換程序,用於判別天線中的晶片是否產生歪斜錯位。檢測RFID標籤的天線與晶片位置精準度的處理方法包括以下步驟:獲取輸入影像,輸入影像包括第一定位區;對輸入影像執行晶片影像程序,產生晶片輪廓圖塊;對輸入影像執行天線影像程序,產生天線輪廓圖塊;分別對晶片輪廓圖塊與天線輪廓圖塊執行霍夫轉換程序,分別產生霍夫晶片輪廓圖塊與霍夫天線輪廓圖塊;選擇霍夫天線輪廓圖塊的一天線邊界與霍夫晶片輪廓圖塊的一晶片邊界;根據天線邊界與晶片邊界獲取偏移角度;獲取通過第一定位區的連線線段;根據霍夫天線輪廓圖塊與連線線段以獲取天線圖塊中心點;根據霍夫晶片輪廓圖塊獲取晶片圖塊中心點;根據天線圖塊中心點與晶片圖塊中心點獲取偏移量;根據偏移角度與偏移量產生比對結果。 In view of this, in some embodiments, a processing method for detecting the position accuracy of the antenna and chip of an RFID tag is provided, which is used to determine whether the chip in the antenna is skewed or misaligned through object recognition and related processing of digital images, and combined with a fast processing Hough transformation program. The processing method for detecting the position accuracy of the antenna and chip of an RFID tag includes the following steps: obtaining an input image, the input image includes a first positioning area; executing a chip image program on the input image to generate a chip outline block; executing an antenna image program on the input image to generate an antenna outline block; executing a Hough transformation program on the chip outline block and the antenna outline block respectively, generating a Hough chip outline block and a Hough antenna outline block respectively; selecting a Hough An antenna boundary of the antenna outline block and a chip boundary of the Hough chip outline block; obtain an offset angle according to the antenna boundary and the chip boundary; obtain a connecting line segment passing through the first positioning area; obtain the center point of the antenna block according to the Hough antenna outline block and the connecting line segment; obtain the center point of the chip block according to the Hough chip outline block; obtain an offset according to the center point of the antenna block and the center point of the chip block; generate a comparison result according to the offset angle and the offset.

在一些實施例中,在執行晶片影像程序中包括晶片輪廓識別程序,該步驟更包括:辨識晶片二值化影像中的多個矩形區塊;判斷晶片選取框中的所述矩形區塊是否存在目標晶片;若晶片二值化影像中存在目標晶片,則移除晶片二值化影像中的其他非目標晶片的所述矩形區塊,並產生晶片輪廓圖塊;若晶片二值化影像中不存在目標晶片,則產生判斷結果為「不合格」。 In some embodiments, the chip image processing includes a chip contour recognition process, which further includes: identifying multiple rectangular blocks in the chip binary image; judging whether the target chip exists in the rectangular block in the chip selection box; if the target chip exists in the chip binary image, removing the rectangular blocks of other non-target chips in the chip binary image and generating a chip contour block; if the target chip does not exist in the chip binary image, generating a judgment result of "unqualified".

在一些實施例中,在執行天線影像程序中包括天線輪廓識別程序,該步驟更包括:辨識天線二值化影像中的多個矩形區塊;判斷天線選取框中的所述矩形區塊是否存在目標天線;若天線二值化影像中 存在目標天線,則移除天線二值化影像中的其他非目標天線的所述矩形區塊,並產生天線輪廓圖塊;若天線二值化影像中不存在目標天線,則產生判斷結果為「不合格」。 In some embodiments, the antenna image program includes an antenna outline recognition program in the execution, and the step further includes: identifying multiple rectangular blocks in the antenna binary image; determining whether the rectangular block in the antenna selection box contains a target antenna; if the target antenna exists in the antenna binary image, removing the rectangular blocks of other non-target antennas in the antenna binary image and generating an antenna outline block; if the target antenna does not exist in the antenna binary image, generating a judgment result of "unqualified".

在一些實施例中,在產生晶片輪廓圖塊與天線輪廓圖塊之後步驟更包括:判斷天線輪廓圖塊中是否包含晶片輪廓圖塊;若天線輪廓圖塊包含晶片輪廓圖塊,則晶片輪廓圖塊與天線輪廓圖塊執行霍夫轉換程序;若天線輪廓圖塊不包含晶片輪廓圖塊,則產生判斷結果為「不合格」。 In some embodiments, after generating the chip outline block and the antenna outline block, the step further includes: determining whether the antenna outline block contains the chip outline block; if the antenna outline block contains the chip outline block, the chip outline block and the antenna outline block perform a Hough transformation procedure; if the antenna outline block does not contain the chip outline block, a judgment result of "unqualified" is generated.

在一些實施例中,在對晶片輪廓圖塊執行霍夫轉換程序產生霍夫晶片輪廓圖塊之步驟包括:獲取在第一維度空間的晶片輪廓圖塊的選擇線段,其中選擇線段具有多個晶片邊界坐標;設定第二維度空間的晶片轉換角度區間;根據該些晶片邊界坐標與晶片轉換角度區間執行霍夫轉換程序,產生在第二維度空間的多個晶片邊界曲線;根據該些晶片邊界曲線獲取霍夫交點,並選擇至少一霍夫交點;從該些霍夫交點中選出交點數量最多的為目標交點;根據第二維度空間中的目標交點的坐標轉換為第一維度空間的霍夫線段;重複獲取其他的選擇線段,並產生其他的霍夫線段;根據該些霍夫線段繪製成該霍夫晶片輪廓圖塊。 In some embodiments, the step of executing a Hough transformation process on a chip outline block to generate a Hough chip outline block includes: obtaining a selected line segment of the chip outline block in a first dimensional space, wherein the selected line segment has a plurality of chip boundary coordinates; setting a chip transformation angle interval in a second dimensional space; executing a Hough transformation process according to the chip boundary coordinates and the chip transformation angle interval to generate a plurality of chip boundary coordinates in the second dimensional space; chip boundary curves; obtain Hough intersections according to the chip boundary curves, and select at least one Hough intersection; select the target intersection with the largest number of intersections from the Hough intersections; transform the coordinates of the target intersection in the second dimensional space into Hough line segments in the first dimensional space; repeatedly obtain other selected line segments and generate other Hough line segments; draw the Hough chip outline block according to the Hough line segments.

在一些實施例中,在繪製成霍夫晶片輪廓圖塊之步驟,更包括判斷霍夫晶片輪廓圖塊是否完整。 In some embodiments, the step of drawing a Hough chip outline block further includes determining whether the Hough chip outline block is complete.

在一些實施例中,在對天線輪廓圖塊執行霍夫轉換程序產生霍夫天線輪廓圖塊之步驟包括:獲取在第一維度空間的天線輪廓圖塊 的選擇線段,其中選擇線段具有多個天線邊界坐標;設定第二維度空間的天線轉換角度區間;根據所述天線邊界坐標與天線轉換角度區間執行霍夫轉換程序,產生在第二維度空間的多個霍夫天線邊界曲線;根據所述霍夫天線邊界曲線獲取霍夫交點,並選擇至少一霍夫交點;從所述霍夫交點中選出交點數量最多的為目標交點;根據第二維度空間的目標交點的坐標轉換為第一維度空間的霍夫線段;重複獲取其他的選擇線段,並產生其他的霍夫線段;根據所述霍夫線段繪製成霍夫天線輪廓圖塊。 In some embodiments, the step of executing a Hough transformation procedure on an antenna outline block to generate a Hough antenna outline block includes: obtaining a selected line segment of the antenna outline block in a first dimensional space, wherein the selected line segment has a plurality of antenna boundary coordinates; setting an antenna transformation angle interval in a second dimensional space; executing a Hough transformation procedure according to the antenna boundary coordinates and the antenna transformation angle interval to generate a plurality of antenna boundary coordinates in the second dimensional space. Hough antenna boundary curves; obtain Hough intersections according to the Hough antenna boundary curves, and select at least one Hough intersection; select the target intersection with the largest number of intersections from the Hough intersections; transform the coordinates of the target intersection in the second dimensional space into Hough line segments in the first dimensional space; repeatedly obtain other selected line segments and generate other Hough line segments; draw a Hough antenna outline block according to the Hough line segments.

在一些實施例中,在繪製成霍夫天線輪廓圖塊之步驟,更包括判斷霍夫天線輪廓圖塊是否完整。 In some embodiments, the step of drawing a Hough antenna outline block further includes determining whether the Hough antenna outline block is complete.

在一些實施例中,檢測RFID標籤的天線與晶片位置精準度的處理系統包括儲存設備與處理器。儲存設備儲存輸入影像、晶片影像程序、天線影像程序、霍夫轉換程序與比對結果,輸入影像至少包括第一定位區;處理器電性連接於儲存設備,處理器根據輸入影像分別執行晶片影像程序與天線影像程序,並產生晶片輪廓圖塊與天線輪廓圖塊;處理器分別對晶片輪廓圖塊與天線輪廓圖塊執行霍夫轉換程序,各別產生霍夫晶片輪廓圖塊與霍夫天線輪廓圖塊,處理器選擇霍夫天線輪廓圖塊的一天線邊界與霍夫晶片輪廓圖塊的一晶片邊界;處理器根據天線邊界與晶片邊界獲取偏移角度;處理器獲取通過第一定位區的連線線段;處理器根據霍夫天線輪廓圖塊與連線線段以獲取天線圖塊中心點;處理器根據霍夫晶片輪廓圖塊獲取晶片圖塊中心點;處理器根據天線圖塊中心點與晶片圖塊中心點獲取偏移量;處理器根據偏移角度與偏移量產生 比對結果。 In some embodiments, a processing system for detecting the position accuracy of the antenna and chip of an RFID tag includes a storage device and a processor. The storage device stores an input image, a chip image program, an antenna image program, a Hough transformation program, and a comparison result, and the input image includes at least a first positioning area; the processor is electrically connected to the storage device, and the processor executes the chip image program and the antenna image program respectively according to the input image, and generates a chip outline block and an antenna outline block; the processor executes the Hough transformation program on the chip outline block and the antenna outline block respectively, and generates a Hough chip outline block and a Hough antenna outline block respectively, and the processor selects the Hough antenna. The processor compares an antenna boundary of a line contour block with a chip boundary of a Hough chip contour block; the processor obtains an offset angle according to the antenna boundary and the chip boundary; the processor obtains a connecting line segment passing through the first positioning area; the processor obtains the center point of the antenna block according to the Hough antenna contour block and the connecting line segment; the processor obtains the center point of the chip block according to the Hough chip contour block; the processor obtains an offset according to the center point of the antenna block and the center point of the chip block; the processor generates a comparison result according to the offset angle and the offset.

在一些實施例中,在處理器對晶片輪廓圖塊執行霍夫轉換程序產生霍夫晶片輪廓圖塊之步驟包括:處理器獲取在第一維度空間的晶片輪廓圖塊的選擇線段,其中選擇線段具有多個晶片邊界坐標;處理器設定第二維度空間的晶片轉換角度區間;處理器根據該些晶片邊界坐標與晶片轉換角度區間執行霍夫轉換程序,產生在第二維度空間的多個霍夫晶片邊界曲線;處理器根據該些霍夫晶片邊界曲線獲取霍夫交點,並選擇至少一霍夫交點;處理器從所述霍夫交點中選出交點數量最多的為目標交點;處理器根據第二維度空間的目標交點的坐標轉換為第一維度空間的霍夫線段;重複獲取其他的選擇線段,並產生其他的霍夫線段;處理器根據所述霍夫線段繪製成霍夫晶片輪廓圖塊。 In some embodiments, the step of executing a Hough transformation process on a chip outline block by a processor to generate a Hough chip outline block includes: the processor obtains a selected line segment of the chip outline block in a first dimensional space, wherein the selected line segment has a plurality of chip boundary coordinates; the processor sets a chip transformation angle interval in a second dimensional space; the processor executes a Hough transformation process according to the chip boundary coordinates and the chip transformation angle interval to generate a plurality of chip transformation angles in the second dimensional space. Hough chip boundary curves; the processor obtains Hough intersections according to the Hough chip boundary curves and selects at least one Hough intersection; the processor selects the one with the largest number of intersections from the Hough intersections as the target intersection; the processor converts the coordinates of the target intersection in the second dimensional space into a Hough line segment in the first dimensional space; repeatedly obtains other selected line segments and generates other Hough line segments; the processor draws a Hough chip outline block according to the Hough line segments.

在一些實施例中,在處理器對天線輪廓圖塊執行霍夫轉換程序產生霍夫天線輪廓圖塊之步驟包括:處理器獲取在第一維度空間的天線輪廓圖塊的選擇線段,其中選擇線段具有多個天線邊界坐標;處理器設定第二維度空間的天線轉換角度區間;處理器根據該些天線邊界坐標與天線轉換角度區間執行霍夫轉換程序,產生在第二維度空間的多個霍夫天線邊界曲線;處理器根據該些霍夫天線邊界曲線獲取霍夫交點,並選擇至少一霍夫交點;處理器從該些霍夫交點中選出交點數量最多的為目標交點;處理器根據第二維度空間的目標交點的坐標轉換為第一維度空間的霍夫線段;重複獲取其他的選擇線段,並產生其他的霍夫線段;處理器根據所述霍夫線段繪製成霍夫天線輪廓圖塊。 In some embodiments, the step of executing a Hough transformation process on the antenna outline block to generate a Hough antenna outline block in a processor includes: the processor obtains a selected line segment of the antenna outline block in a first dimensional space, wherein the selected line segment has a plurality of antenna boundary coordinates; the processor sets an antenna transformation angle interval in a second dimensional space; the processor executes a Hough transformation process according to the antenna boundary coordinates and the antenna transformation angle interval to generate a plurality of antenna boundary coordinates in the second dimensional space. Hough antenna boundary curves; the processor obtains Hough intersections according to the Hough antenna boundary curves and selects at least one Hough intersection; the processor selects the target intersection with the largest number of intersections from the Hough intersections; the processor converts the coordinates of the target intersection in the second dimensional space into Hough line segments in the first dimensional space; repeatedly obtains other selected line segments and generates other Hough line segments; the processor draws a Hough antenna outline block according to the Hough line segments.

所述的檢測RFID標籤的天線與晶片位置精準度的處理方法與系統應用於目標晶片的天線影像中,用於辨識晶片的位置是否產生偏移。檢測RFID標籤的天線與晶片位置精準度的處理方法與系統也修改霍夫轉換程序的計算方式,以使處理系統的運算負載可以降低,並且保留高精準的識別結果。 The processing method and system for detecting the position accuracy of the antenna and chip of the RFID tag are applied to the antenna image of the target chip to identify whether the position of the chip is offset. The processing method and system for detecting the position accuracy of the antenna and chip of the RFID tag also modify the calculation method of the Hough transform program so that the computational load of the processing system can be reduced and retain high-precision identification results.

100:處理系統 100:Processing system

110:儲存設備 110: Storage equipment

111:晶片影像程序 111: Chip imaging program

112:天線影像程序 112: Antenna imaging program

113:霍夫轉換程序 113: Hough Transformation Procedure

114:比對結果 114:Comparison results

115:灰階程序 115: Gray-level program

116:二值化程序 116: Binarization procedure

117:晶片輪廓識別程序 117: Wafer profile recognition process

118:平滑程序 118: Smoothing program

119:天線輪廓識別程序 119: Antenna profile recognition procedure

120:處理器 120: Processor

130:輸入影像 130: Input image

131:目標天線 131: Target antenna

132:晶片封裝結構 132: Chip packaging structure

133:目標晶片 133: Target chip

134:載體 134: Carrier

140:攝像單元 140: Camera unit

410:晶片二值化影像 410:Chip binary image

411:矩形區塊 411: Rectangular block

412:邊緣偵測框 412: Edge detection frame

413:晶片選取框 413: Chip selection box

420:晶片輪廓圖塊 420: chip outline block

510:平滑影像 510: Smooth Image

511:天線選取框 511: Antenna selection box

520:天線二值化影像 520: Antenna binary image

530:天線輪廓圖塊 530: Antenna outline block

610:選擇線段 610: Select line segment

621:霍夫交點 621: Hough intersection

631:目標交點 631: Target intersection

640:霍夫線段 640: Hough line segment

650:霍夫晶片輪廓圖塊 650: Hoff chip outline block

660:晶片圖塊中心點 660:Chip block center point

710:霍夫天線輪廓圖塊 710: Hough antenna outline block

811:天線邊界 811: Antenna boundary

812:晶片邊界 812: Chip boundary

813:偏移角度 813:Offset angle

814:偏移量 814:Offset

911:第一定位區 911: First positioning area

912:第一中心點 912: First center point

921:第二定位區 921: Second positioning area

922:第二中心點 922: Second center point

931:連線線段 931:Connecting line segment

941:天線圖塊中心線 941: Antenna block center line

942:天線圖塊中心點 942: Center point of antenna block

[圖1]為此一實施例的檢測RFID標籤的天線與晶片位置精準度的處理系統架構示意圖。 [Figure 1] is a schematic diagram of the processing system architecture for detecting the antenna and chip position accuracy of the RFID tag in this embodiment.

[圖2]為一實施例的輸入影像示意圖。 [Figure 2] is a schematic diagram of an input image of an embodiment.

[圖3A]為一實施例的檢測RFID標籤的天線與晶片位置精準度的處理方法的運作狀態示意圖。 [Figure 3A] is a schematic diagram of the operation status of a processing method for detecting the position accuracy of the antenna and chip of an RFID tag according to an embodiment.

[圖3B]為一實施例的檢測RFID標籤的天線與晶片位置精準度的處理方法的檢測判斷示意圖。 [Figure 3B] is a schematic diagram of a detection and judgment method for detecting the position accuracy of the antenna and chip of an RFID tag according to an embodiment.

[圖4A]為一實施例的晶片二值化影像示意圖。 [Figure 4A] is a schematic diagram of a chip binary image of an embodiment.

[圖4B]為一實施例的晶片輪廓圖塊的示意圖。 [Figure 4B] is a schematic diagram of a chip outline block of an embodiment.

[圖5A]為一實施例的輸入影像與平滑影像的示意圖。 [Figure 5A] is a schematic diagram of an input image and a smoothed image of an embodiment.

[圖5B]為一實施例的移除矩形區塊前的天線輪廓圖塊的示意圖。 [Figure 5B] is a schematic diagram of an antenna outline block before removing the rectangular block in an embodiment.

[圖6A]為一實施例的選擇線段與其像素的示意圖。 [Figure 6A] is a schematic diagram of a selected line segment and its pixels according to an embodiment.

[圖6B]為一實施例的第一維度空間與第二維度空間的示意圖。 [Figure 6B] is a schematic diagram of the first dimensional space and the second dimensional space of an embodiment.

[圖6C]為一實施例的選擇線段與霍夫線段的示意圖。 [Figure 6C] is a schematic diagram of the selected line segments and Hough line segments of an embodiment.

[圖6D]為一實施例的霍夫晶片輪廓圖塊的示意圖。 [Figure 6D] is a schematic diagram of a Hoff chip outline block of an embodiment.

[圖7]為一實施例的霍夫天線輪廓圖塊的示意圖。 [Figure 7] is a schematic diagram of a Hough antenna outline block of an embodiment.

[圖8A]為一實施例的根據第一定位區產生連線線段的示意圖。 [Figure 8A] is a schematic diagram of generating a connecting line segment based on the first positioning area according to an embodiment.

[圖8B]為一實施例的偏移角度的示意圖。 [Figure 8B] is a schematic diagram of the offset angle of an embodiment.

[圖9]為一實施例的偏移量示意圖。 [Figure 9] is a schematic diagram of the offset of an embodiment.

請參考圖1,其係為此一實施例的檢測RFID標籤的天線與晶片位置精準度的處理系統架構示意圖。檢測RFID標籤的天線與晶片位置精準度的處理系統(後文簡稱處理系統100)可以應用於個人電腦、伺服器、筆記型電腦、平板電腦或行動通訊裝置等具有計算能力的電子設備。所述處理系統100除了可以本地端執行外,也可以透過網路連接至遠端伺服器執行數位影像檢測。 Please refer to FIG. 1, which is a schematic diagram of the processing system architecture for detecting the antenna and chip position accuracy of an RFID tag in this embodiment. The processing system for detecting the antenna and chip position accuracy of an RFID tag (hereinafter referred to as the processing system 100) can be applied to electronic devices with computing capabilities such as personal computers, servers, laptops, tablet computers or mobile communication devices. In addition to being able to be executed locally, the processing system 100 can also be connected to a remote server through a network to perform digital image detection.

處理系統100至少包括儲存設備110與處理器120。處理器120電性連接於儲存設備110。處理器120可以選擇性連接於攝像單元140。儲存設備110儲存輸入影像130、晶片影像程序111、天線影像程序112、霍夫轉換程序113(Hough transform)與比對結果114。晶片影像程序111係為灰階程序115、二值化程序116與晶片輪廓識別程序117的集合。天線影像程序112至少包括平滑程序118、二值化程序116與天線輪廓識別程序119。 The processing system 100 at least includes a storage device 110 and a processor 120. The processor 120 is electrically connected to the storage device 110. The processor 120 can be selectively connected to the imaging unit 140. The storage device 110 stores the input image 130, the chip image program 111, the antenna image program 112, the Hough transform program 113 and the comparison result 114. The chip image program 111 is a collection of a grayscale program 115, a binarization program 116 and a chip contour recognition program 117. The antenna image program 112 at least includes a smoothing program 118, a binarization program 116 and an antenna contour recognition program 119.

輸入影像130可以由外部的檔案匯入外,也可以通過攝像單元140拍攝無線射頻設備所獲得,亦或者將數位影像的部分區塊以做 為輸入影像130。請參考圖2,輸入影像130係為至少包括RFID標籤的目標晶片133與目標天線131的俯視拍攝的正面影像,其係為一實施例的輸入影像示意圖。圖2的上方為RFID標籤中完整的目標天線131與目標晶片133的拍攝影像示意圖;圖2下方係為前述的輸入影像130的RFID標籤局部放大圖;其中圖2下方的輸入影像130對應於圖2的上方的拍攝影像的虛線框。 The input image 130 can be imported from an external file, or obtained by photographing a wireless radio frequency device through the camera unit 140, or a partial block of a digital image can be used as the input image 130. Please refer to Figure 2, the input image 130 is a frontal image of at least the target chip 133 and the target antenna 131 of the RFID tag taken from a top view, which is a schematic diagram of the input image of an embodiment. The upper part of Figure 2 is a schematic diagram of the photographed image of the complete target antenna 131 and the target chip 133 in the RFID tag; the lower part of Figure 2 is a partial enlarged view of the RFID tag of the aforementioned input image 130; wherein the input image 130 at the lower part of Figure 2 corresponds to the dotted frame of the photographed image at the upper part of Figure 2.

請繼續參考圖2,輸入影像130中央鈍角方形結構係為晶片封裝結構132,其餘部分為載體134。晶片封裝結構132中包括目標晶片133。晶片封裝結構132係為目標晶片133以導電膠與目標天線131相互黏合所形成的結構。一般而言,圖2的晶片封裝結構132為正確黏合的樣態。在實際情況中,晶片封裝結構132可能發生未黏合於兩目標天線131,或是僅有單邊連接於目標天線131等各種黏合失敗的樣態。 Please continue to refer to Figure 2. The central blunt-cornered square structure of the input image 130 is a chip package structure 132, and the rest is a carrier 134. The chip package structure 132 includes a target chip 133. The chip package structure 132 is a structure formed by bonding the target chip 133 and the target antenna 131 with conductive glue. Generally speaking, the chip package structure 132 of Figure 2 is a correctly bonded state. In actual situations, the chip package structure 132 may fail to bond to the two target antennas 131, or only one side is connected to the target antenna 131.

為方便區別目標天線131與目標晶片133的差異,因此在目標天線131之中係以橫線示意。被封裝於目標天線131中的目標晶片133係以網格表示。在目標天線131與目標晶片133中則分布多個空洞,其係表示封裝時所產生的氣泡或其他灰塵。此外,晶片封裝結構132的黑色區塊也是封裝過程中所產生的瑕疵。輸入影像130可以是彩色影像或灰階影像。 In order to distinguish the difference between the target antenna 131 and the target chip 133, a horizontal line is used in the target antenna 131. The target chip 133 packaged in the target antenna 131 is represented by a grid. There are multiple holes distributed in the target antenna 131 and the target chip 133, which represent bubbles or other dust generated during packaging. In addition, the black area of the chip packaging structure 132 is also a defect generated during the packaging process. The input image 130 can be a color image or a grayscale image.

請參考圖3A與圖3B所示,其係為一實施例的檢測RFID標籤的天線與晶片位置精準度的處理方法的運作狀態與檢測判斷示意圖。處理器120獲取輸入影像130後,執行檢測RFID標籤的天線與晶片位置 精準度的處理方法包括以下步驟:步驟S210:獲取輸入影像130,輸入影像130包括第一定位區911與第二定位區921;步驟S220:對輸入影像130執行晶片影像程序111,產生晶片輪廓圖塊420;步驟S230:對輸入影像130執行天線影像程序112,產生天線輪廓圖塊530;步驟S240:分別對晶片輪廓圖塊420與天線輪廓圖塊530執行霍夫轉換程序113,各別產生霍夫晶片輪廓圖塊650與霍夫天線輪廓圖塊710;步驟S250:選擇霍夫天線輪廓圖塊710的天線邊界811與霍夫晶片輪廓圖塊650的晶片邊界812;步驟S260:根據天線邊界811與晶片邊界812獲取偏移角度813;步驟S270:根據第一定位區911與第二定位區921產生連線線段931;步驟S280:根據霍夫天線輪廓圖塊710與連線線段931以獲取天線圖塊中心點942;步驟S290:根據霍夫晶片輪廓圖塊650獲取晶片圖塊中心點660;步驟S300:根據天線圖塊中心點942與晶片圖塊中心點660獲取偏移量814;以及步驟S310:根據偏移角度813與偏移量814產生比對結果114。 Please refer to FIG. 3A and FIG. 3B, which are schematic diagrams of the operation state and detection judgment of a processing method for detecting the position accuracy of the antenna and chip of an RFID tag in an embodiment. After the processor 120 obtains the input image 130, the processing method for detecting the position accuracy of the antenna and chip of the RFID tag includes the following steps: Step S210: obtaining the input image 130, the input image 130 includes the first positioning area 911 and the second positioning area 921; Step S220: executing the chip image program 111 on the input image 130 to generate a chip wheel Step S230: Execute the antenna image program 112 on the input image 130 to generate the antenna outline block 530; Step S240: Execute the Hough transformation program 113 on the chip outline block 420 and the antenna outline block 530 to generate the Hough chip outline block 650 and the Hough antenna outline block 710 respectively; Step S250: Select the Hough antenna The antenna boundary 811 of the outline block 710 and the chip boundary 812 of the Hough chip outline block 650; Step S260: Obtain an offset angle 813 according to the antenna boundary 811 and the chip boundary 812; Step S270: Generate a connecting line segment 931 according to the first positioning area 911 and the second positioning area 921; Step S280: Generate a connecting line segment 931 according to the Hough antenna outline block 710 and the connecting line segment 931; Step S281: Generate a connecting line segment 931 according to the Hough antenna outline block 710 and the connecting line segment 931; Step S290: Generate a connecting line segment 931 according to the Hough antenna outline block 710 and the connecting line segment 931; Step S291: Generate a connecting line segment 931 according to the Hough antenna outline block 710 and the connecting line segment 931; Step S292: Generate a connecting line segment 931 according to the Hough antenna outline block 710 and the connecting line segment 931; Step S293: Generate a connecting line segment 931 according to the Hough antenna outline block 710 and the connecting line segment 931; Step S294: Generate a connecting line segment 931 according to the Hough antenna outline block 710 and the connecting line segment 931; Step S295: Generate a connecting line segment 931 according to the Hough antenna outline block 710 and the connecting line segment 931; Step S296: Generate a connecting line segment 931 according to the Hough antenna outline block 710 and the connecting line segment 931; Step S297: Generate a connecting line segment 931 according to the Hough antenna outline block 710 and the connecting line segment 931; Step S298: Generate a connecting line segment 931 according to the Hough antenna outline block 71 Line segment 931 is used to obtain the center point 942 of the antenna block; step S290: obtaining the center point 660 of the chip block according to the Hough chip outline block 650; step S300: obtaining the offset 814 according to the center point 942 of the antenna block and the center point 660 of the chip block; and step S310: generating a comparison result 114 according to the offset angle 813 and the offset 814.

首先,處理系統100獲取輸入影像130。處理器120將輸入影像130分別載入至晶片影像程序111與天線影像程序112。處理器120根據其運算能力可以分時或同步執行晶片影像程序111或天線影像程序112。 First, the processing system 100 obtains the input image 130. The processor 120 loads the input image 130 into the chip imaging program 111 and the antenna imaging program 112 respectively. The processor 120 can execute the chip imaging program 111 or the antenna imaging program 112 in time-sharing or synchronous manner according to its computing power.

請參考圖2,係以晶片影像程序111為優先說明。若輸入影像130為彩色影像,處理器120對輸入影像130執行灰階程序115,並產生一灰階影像。灰階程序115的像素灰階分布可以根據輸入影像130進行線性調整。若輸入影像130是灰階影像,處理器120可以選擇跳過此灰階程序115的執行。 Please refer to FIG. 2 , which is a chip imaging program 111 as a priority. If the input image 130 is a color image, the processor 120 executes the grayscale program 115 on the input image 130 and generates a grayscale image. The pixel grayscale distribution of the grayscale program 115 can be linearly adjusted according to the input image 130. If the input image 130 is a grayscale image, the processor 120 can choose to skip the execution of this grayscale program 115.

請同時參考圖3A、圖3B與圖4A,其中圖4A係為一實施例的晶片二值化影像的示意圖。處理器120對灰階影像執行二值化程序116,並產生晶片二值化影像410,接著,處理器120將晶片二值化影像410載入至晶片輪廓識別程序117,晶片輪廓識別程序117對晶片二值化影像410進行目標晶片133與矩形區塊411的辨識與移除。所述的晶片輪廓識別程序117包括以下步驟:步驟S410:辨識晶片二值化影像410中的多個矩形區塊411;步驟S420:判斷晶片選取框413中的矩形區塊411是否存在目標晶片133;步驟S430:若所述晶片二值化影像410中存在目標晶片133的矩形區塊411,則移除晶片二值化影像410中的其他非目標晶片133的所述矩形區塊411,並產生晶片輪廓圖塊420; 以及步驟S440:若所述晶片二值化影像410中不存在目標晶片133,則產生判斷結果為「不合格」。 Please refer to FIG. 3A, FIG. 3B and FIG. 4A, wherein FIG. 4A is a schematic diagram of a chip binary image of an embodiment. The processor 120 performs a binary process 116 on the grayscale image and generates a chip binary image 410. Then, the processor 120 loads the chip binary image 410 into the chip contour recognition process 117. The chip contour recognition process 117 recognizes and removes the target chip 133 and the rectangular block 411 from the chip binary image 410. The chip contour recognition procedure 117 includes the following steps: step S410: identifying multiple rectangular blocks 411 in the chip binary image 410; step S420: judging whether the rectangular block 411 in the chip selection box 413 contains the target chip 133; step S430: if the rectangular block 411 of the target chip 133 exists in the chip binary image 410, then removing the rectangular blocks 411 of other non-target chips 133 in the chip binary image 410 and generating a chip contour block 420; and step S440: if the target chip 133 does not exist in the chip binary image 410, then generating a judgment result of "unqualified".

請參考圖4A,晶片輪廓識別程序117主要針對晶片二值化影像410中的晶片封裝結構132的範圍。晶片輪廓識別程序117以n*m像素的邊緣偵測框412於晶片二值化影像410中移動並辨識邊緣偵測框412所涵蓋的矩形區塊411。圖4A上方係為晶片封裝結構132中目標晶片133的邊緣之局部放大示意。假設邊緣偵測框412為3*3像素大小,晶片輪廓識別程序117將邊緣偵測框412中目標晶片133的邊緣相鄰像素組合視為一個矩形區塊411。接著,晶片輪廓識別程序117根據邊緣偵測框412與所偵測的矩形區塊411進行拼接。晶片輪廓識別程序117判斷在晶片二值化影像410的不同區域中,矩形區塊411的集合為目標晶片133或封裝瑕疵。 Please refer to FIG. 4A , the chip contour recognition program 117 is mainly aimed at the range of the chip package structure 132 in the chip binary image 410. The chip contour recognition program 117 moves an edge detection frame 412 of n*m pixels in the chip binary image 410 and identifies the rectangular block 411 covered by the edge detection frame 412. The upper part of FIG. 4A is a partial enlarged schematic diagram of the edge of the target chip 133 in the chip package structure 132. Assuming that the edge detection frame 412 is 3*3 pixels in size, the chip contour recognition program 117 regards the edge adjacent pixel combination of the target chip 133 in the edge detection frame 412 as a rectangular block 411. Next, the chip contour recognition program 117 performs splicing based on the edge detection frame 412 and the detected rectangular block 411. The chip contour recognition program 117 determines that the set of rectangular blocks 411 in different areas of the chip binary image 410 is the target chip 133 or a package defect.

請參考圖4B,晶片輪廓識別程序117標示晶片二值化影像410的所有矩形區塊411後,晶片輪廓識別程序117根據晶片選取框413的面積範圍判斷晶片二值化影像410是否具有目標晶片133。一般而言,晶片選取框413的面積範圍是根據晶片種類的尺寸規格所決定。在圖4B上方的實線方框係為晶片選取框413之示意圖。晶片選取框413的預設位置與大小可以根據無線射頻設備的種類所決定。例如可預設為圖4B中相當於晶片面積的矩形範圍。由於目標晶片133在封裝過程中,目標晶片133會受到干擾而有所位移。因此輸入影像130中的目標晶片133可能會 有不在預設位置上,或者目標晶片133可能會略有歪斜。所以晶片選取框413的範圍將會略大於目標晶片133。晶片輪廓識別程序117可以通過晶片選取框413識別晶片二值化影像410中的目標晶片133與其位置。 Please refer to FIG4B. After the chip contour recognition program 117 marks all the rectangular blocks 411 of the chip binary image 410, the chip contour recognition program 117 determines whether the chip binary image 410 has the target chip 133 according to the area range of the chip selection box 413. Generally speaking, the area range of the chip selection box 413 is determined according to the size specifications of the chip type. The solid line box above FIG4B is a schematic diagram of the chip selection box 413. The default position and size of the chip selection box 413 can be determined according to the type of wireless radio frequency equipment. For example, it can be preset to a rectangular range equivalent to the chip area in FIG4B. Because the target chip 133 is disturbed and displaced during the packaging process. Therefore, the target chip 133 in the input image 130 may not be in the preset position, or the target chip 133 may be slightly skewed. Therefore, the range of the chip selection box 413 will be slightly larger than the target chip 133. The chip contour recognition program 117 can recognize the target chip 133 and its position in the chip binary image 410 through the chip selection box 413.

請參考圖4B所示,其係為一實施例的晶片輪廓圖塊420的示意圖。由於目標晶片133在封裝過程中,目標晶片133會受到干擾而有所位移。因此輸入影像130中的目標晶片133可能會有不在預設位置上,或者目標晶片133可能會略有歪斜。晶片輪廓識別程序117判斷晶片選取框413與目標晶片133的重疊面積範圍佔比是否符合門檻值。若晶片選取框413與目標晶片133的重疊面積不符合門檻值時,則晶片輪廓識別程序117判定目標晶片133產生一相應的判斷結果為「不合格」。以圖4B為例,目標晶片133係以黑色區塊表示。晶片輪廓識別程序117根據目標晶片133的黑色區塊與晶片選取框413的面積相對比,晶片輪廓識別程序117即可判斷目標晶片133與晶片選取框413的佔比是否符合門檻值。 Please refer to FIG. 4B , which is a schematic diagram of a chip outline block 420 of an embodiment. Since the target chip 133 is disturbed and displaced during the packaging process, the target chip 133 may not be in the preset position in the input image 130, or the target chip 133 may be slightly skewed. The chip outline recognition program 117 determines whether the overlapping area range ratio of the chip selection box 413 and the target chip 133 meets the threshold value. If the overlapping area of the chip selection box 413 and the target chip 133 does not meet the threshold value, the chip outline recognition program 117 determines that the target chip 133 generates a corresponding judgment result of "unqualified". Taking FIG. 4B as an example, the target chip 133 is represented by a black block. The chip contour recognition program 117 compares the black area of the target chip 133 with the area of the chip selection box 413, and the chip contour recognition program 117 can determine whether the ratio of the target chip 133 to the chip selection box 413 meets the threshold value.

晶片輪廓識別程序117將其他非目標晶片的矩形區塊411全部移除。圖4B中矩形區塊411係以虛線框表示。圖4B上方係為未移除矩形區塊411的晶片封裝結構132,圖4B下方係為晶片輪廓圖塊420。晶片輪廓圖塊420的整體影像大小係與輸入影像130相同,圖4B僅以晶片輪廓圖塊420中的目標晶片133為示意。若晶片輪廓識別程序117無法從晶片二值化影像410中識別目標晶片133,則晶片輪廓識別程序117產生為的判斷結果為「不合格」。 The chip contour recognition program 117 removes all the rectangular blocks 411 of other non-target chips. The rectangular block 411 in FIG. 4B is represented by a dashed frame. The upper part of FIG. 4B shows the chip package structure 132 without removing the rectangular block 411, and the lower part of FIG. 4B shows the chip contour block 420. The overall image size of the chip contour block 420 is the same as the input image 130, and FIG. 4B only shows the target chip 133 in the chip contour block 420. If the chip contour recognition program 117 cannot recognize the target chip 133 from the chip binary image 410, the chip contour recognition program 117 generates a judgment result of "unqualified".

處理器120另執行天線影像程序112,天線影像程序112係 由平滑程序118、二值化程序116與天線輪廓識別程序119所構成。處理器120將輸入影像130載入至平滑程序118,並產生平滑影像510,如圖5A所示。在其他實施態樣中,天線影像程序112係由灰階程序115、平滑程序118、二值化程序116與天線輪廓識別程序119所構成。因此處理器120也可以對平滑影像510選擇性執行灰階程序115,用以產生平滑灰階影像(無標號),請配合圖3A與圖3B所示。以下的天線影像程序112是以平滑程序118與二值化程序116的組合進行說明。 The processor 120 also executes the antenna image program 112, which is composed of a smoothing program 118, a binarization program 116, and an antenna contour recognition program 119. The processor 120 loads the input image 130 into the smoothing program 118 and generates a smoothed image 510, as shown in FIG5A. In other embodiments, the antenna image program 112 is composed of a grayscale program 115, a smoothing program 118, a binarization program 116, and an antenna contour recognition program 119. Therefore, the processor 120 can also selectively execute the grayscale program 115 on the smoothed image 510 to generate a smoothed grayscale image (no label), as shown in FIG3A and FIG3B. The following antenna image program 112 is described as a combination of the smoothing program 118 and the binarization program 116.

平滑程序118可以是但不限定以平滑線性濾波器、中值濾波器(median filter)、理想低通濾波器(Ideal lowpass filter,2-D ILPF)巴特沃斯低通濾波器(Butterworth Ideal lowpass filter,BILF)或高斯低通濾波器(Gaussian lowpass filter,GLPF)實現。輸入影像130通過平滑程序118後可以降低影像中的雜訊。在圖5A中,分別為輸入影像130經過平滑程序118後產生為平滑影像510。平滑影像510可以濾除輸入影像130中多個較小範圍的雜訊。 The smoothing program 118 may be, but is not limited to, a smoothing linear filter, a median filter, an ideal lowpass filter (2-D ILPF), or a Butterworth Ideal lowpass filter. , BILF) or Gaussian lowpass filter (Gaussian lowpass filter, GLPF) implementation. The input image 130 is passed through the smoothing process 118 to reduce noise in the image. In FIG. 5A , the input image 130 is generated into a smoothed image 510 after being processed by the smoothing process 118 . The smooth image 510 can filter out multiple smaller range noises in the input image 130 .

處理器120對平滑影像510執行二值化程序116,用以產生相應於平滑影像510的天線二值化影像520。接著,處理器120對天線二值化影像520載入至天線輪廓識別程序119。天線輪廓識別程序119對天線二值化影像520進行矩形區塊411的辨識與移除。所述的天線輪廓識別程序119包括以下步驟,並請配合圖3B所示:步驟S510:辨識天線二值化影像520中的多個矩形區塊411;步驟S520:根據天線選取框511內的矩形區塊411判斷是否存在目標 天線131;步驟S530:若所述天線二值化影像520中存在目標天線131的矩形區塊411,則移除天線二值化影像520中的其他非目標天線131的所述矩形區塊411,並產生天線輪廓圖塊530;以及步驟S540:若所述天線二值化影像520中不存在目標天線131,則產生判斷結果為「不合格」。 The processor 120 executes the binarization process 116 on the smoothed image 510 to generate an antenna binarization image 520 corresponding to the smoothed image 510. Then, the processor 120 loads the antenna binarization image 520 into the antenna contour recognition process 119. The antenna contour recognition process 119 recognizes and removes the rectangular block 411 from the antenna binarization image 520. The antenna outline recognition procedure 119 includes the following steps, and please refer to FIG. 3B: Step S510: Identify multiple rectangular blocks 411 in the antenna binary image 520; Step S520: Determine whether there is a target antenna 131 according to the rectangular block 411 in the antenna selection box 511; Step S530: If there is a rectangular block 411 of the target antenna 131 in the antenna binary image 520, remove the rectangular blocks 411 of other non-target antennas 131 in the antenna binary image 520, and generate an antenna outline block 530; and Step S540: If there is no target antenna 131 in the antenna binary image 520, generate a judgment result of "unqualified".

天線輪廓識別程序119識別天線二值化影像520中的矩形區塊411。如晶片輪廓識別程序117所述,天線輪廓識別程序119同樣採用邊緣偵測框412的辨識處理。天線輪廓識別程序119的邊緣偵測框412的大小可以與晶片輪廓識別程序117的邊緣偵測框412大小相異或相同。天線輪廓識別程序119是針對輸入影像130的全部範圍,其係包括目標天線131與晶片封裝結構132。天線輪廓識別程序119將其他非目標天線131的矩形區塊411全部移除,用於獲取目標天線131的圖塊影像。請參考圖5B所示,其係分別為一實施例的移除矩形區塊411的天線輪廓圖塊的示意圖。 The antenna contour recognition process 119 recognizes the rectangular block 411 in the antenna binary image 520. As described in the chip contour recognition process 117, the antenna contour recognition process 119 also adopts the recognition process of the edge detection frame 412. The size of the edge detection frame 412 of the antenna contour recognition process 119 can be different from or the same as the size of the edge detection frame 412 of the chip contour recognition process 117. The antenna contour recognition process 119 is for the entire range of the input image 130, which includes the target antenna 131 and the chip package structure 132. The antenna contour recognition process 119 removes all the rectangular blocks 411 of other non-target antennas 131 to obtain the block image of the target antenna 131. Please refer to FIG. 5B , which is a schematic diagram of an antenna outline block with the rectangular block 411 removed according to an embodiment.

天線輪廓識別程序119根據天線選取框511判斷矩形區塊411中是否存在目標天線131。如前述的晶片選取框413的判斷方式,天線輪廓識別程序119判斷天線選取框511與目標天線131的重疊面積範圍佔比是否符合門檻值。若天線選取框511與目標天線131的重疊面積符合門檻值時,天線輪廓識別程序119將視為目標天線131為存在。反之, 天線選取框511與目標天線131的重疊面積不符合門檻值時,天線輪廓識別程序119產生判斷結果為「不合格」。 The antenna contour recognition program 119 determines whether the target antenna 131 exists in the rectangular block 411 according to the antenna selection box 511. As in the determination method of the chip selection box 413 described above, the antenna contour recognition program 119 determines whether the overlapping area ratio of the antenna selection box 511 and the target antenna 131 meets the threshold value. If the overlapping area of the antenna selection box 511 and the target antenna 131 meets the threshold value, the antenna contour recognition program 119 will regard the target antenna 131 as existing. On the contrary, when the overlapping area of the antenna selection box 511 and the target antenna 131 does not meet the threshold value, the antenna contour recognition program 119 generates a judgment result of "failure".

在完成晶片輪廓圖塊420與天線輪廓圖塊530後,處理器120分別對晶片輪廓圖塊420與天線輪廓圖塊530執行霍夫轉換程序113。處理器120根據其運算能力可以分時或同步執行晶片輪廓圖塊420與天線輪廓圖塊530。首先,以晶片輪廓圖塊420進行霍夫轉換程序113的運作說明。 After completing the chip profile block 420 and the antenna profile block 530, the processor 120 executes the Hough transformation program 113 on the chip profile block 420 and the antenna profile block 530 respectively. The processor 120 can execute the chip profile block 420 and the antenna profile block 530 in time-sharing or synchronous manner according to its computing power. First, the operation of the Hough transformation program 113 is explained using the chip profile block 420.

步驟S610:獲取在第一維度空間的晶片輪廓圖塊420的選擇線段610;步驟S620:設定第二維度空間的晶片轉換角度區間;步驟S630:根據晶片邊界坐標與晶片轉換角度區間執行霍夫轉換程序113,產生在第二維度空間的多個霍夫晶片邊界曲線;步驟S640:根據霍夫晶片邊界曲線獲取霍夫交點621,並選擇至少一霍夫交點621;步驟S650:從霍夫交點621中選出交點數量最多的為目標交點631;步驟S660:根據第二維度空間中目標交點631的坐標轉換為第一維度空間的霍夫線段640;步驟S670:重複獲取其他的選擇線段610,並產生相應的霍夫線段640;以及步驟S680:根據霍夫線段640繪製成霍夫晶片輪廓圖塊650。 Step S610: obtaining a selected line segment 610 of a chip outline block 420 in a first dimension space; Step S620: setting a chip conversion angle interval in a second dimension space; Step S630: executing a Hough transformation procedure 113 according to the chip boundary coordinates and the chip conversion angle interval to generate a plurality of Hough chip boundary curves in the second dimension space; Step S640: obtaining a Hough intersection 621 according to the Hough chip boundary curve, and selecting at least one Hough intersection point 621; step S650: select the target intersection 631 with the largest number of intersections from the Hough intersections 621; step S660: transform the coordinates of the target intersection 631 in the second dimensional space into a Hough line segment 640 in the first dimensional space; step S670: repeatedly obtain other selected line segments 610 and generate corresponding Hough line segments 640; and step S680: draw a Hough chip outline block 650 based on the Hough line segment 640.

處理器120選取晶片輪廓圖塊420的任一邊界中的選擇線 段610。為能清楚說明霍夫轉換程序113的運作過程,因此將輸入影像130的像素坐標集合視為第一維度空間(無標號)。由於輸入影像130為一平面影像,因此第一維度空間也是一二維空間。第一維度空間的原點可以是輸入影像130的邊緣角落,也可以是由使用者所決定。下文中係以輸入影像130的左上角為原點,第一維度空間的邊界即為輸入影像130的影像長度與寬度。 The processor 120 selects a selected line segment 610 in any boundary of the chip outline block 420. In order to clearly explain the operation process of the Hough transform program 113, the pixel coordinate set of the input image 130 is regarded as the first dimensional space (no label). Since the input image 130 is a plane image, the first dimensional space is also a two-dimensional space. The origin of the first dimensional space can be the edge corner of the input image 130, or it can be determined by the user. In the following, the upper left corner of the input image 130 is used as the origin, and the boundary of the first dimensional space is the image length and width of the input image 130.

由於晶片輪廓圖塊420可以被視為第一維度空間中的像素集合,所以晶片輪廓圖塊420的每一像素可以對應於在第一維度空間的不同坐標,如圖6A所示。前述的選擇線段610的坐標集合稱之為晶片邊界坐標。處理器120設定霍夫轉換程序113產生的第二維度空間的晶片轉換角度區間。霍夫轉換程序113可以以極坐標(ρ,θ)表示第一維度空間的直角坐標(x,y),其中ρ為第一維度空間的原點至選定直線之間的截距,θ為截距與橫軸X的夾角。極座標與直角座標的轉換公式如下式:x cos(θ)+y sin(θ)=ρ,其中ρ為原點至目標的截距,θ為夾角。 Since the chip outline block 420 can be regarded as a pixel set in the first dimensional space, each pixel of the chip outline block 420 can correspond to a different coordinate in the first dimensional space, as shown in FIG6A. The coordinate set of the aforementioned selected line segment 610 is called the chip boundary coordinate. The processor 120 sets the chip conversion angle interval of the second dimensional space generated by the Hough transformation program 113. The Hough transformation program 113 can represent the rectangular coordinates (x, y) of the first dimensional space with polar coordinates (ρ, θ), where ρ is the intercept between the origin of the first dimensional space and the selected straight line, and θ is the angle between the intercept and the horizontal axis X. The conversion formula between polar coordinates and rectangular coordinates is as follows: x cos(θ)+y sin(θ)=ρ, where ρ is the intercept from the origin to the target, and θ is the angle.

晶片轉換角度區間係為夾角θ的區間範圍。處理器120可以根據運算能力或晶片輪廓圖塊420的大小決定晶片轉換角度區間的範圍。晶片轉換角度區間的範圍可以是但不限定為[-180°~+180°]。接著,從晶片邊界坐標中選擇其中之一為目標坐標(無標號)。處理器120根據晶片轉換角度區間對目標坐標進行霍夫轉換程序113,並獲得目標坐標對所有晶片轉換角度區間的產生結果。在經過霍夫轉換程序113後,目標坐標的晶片轉換角度區間會產生為第二維度空間(無標號)的霍夫晶片 邊界曲線。 The wafer conversion angle interval is the interval range of the included angle θ. The processor 120 may determine the range of the wafer conversion angle interval based on the computing power or the size of the wafer outline block 420 . The range of the wafer conversion angle interval may be but is not limited to [-180°~+180°]. Next, one of the wafer boundary coordinates is selected as the target coordinate (no label). The processor 120 performs the Hough transformation procedure 113 on the target coordinates according to the wafer conversion angle intervals, and obtains the generation results of the target coordinates for all wafer conversion angle intervals. After passing through the Hough transformation procedure 113, the wafer transformation angle interval of the target coordinates will generate a Hough wafer boundary curve in the second dimensional space (unlabeled).

接著,處理器120對於剩餘的晶片邊界坐標進行前述的霍夫轉換程序113。請參考圖6B所示,圖6B上方係為第一維度空間,圖6B下方中係為晶片邊界坐標轉換至第二維度空間後的霍夫晶片邊界曲線。不同的霍夫晶片邊界曲線會相互交錯,在此將不同曲線交錯的位置稱為霍夫交點621。處理器120將統計各霍夫交點621的交點數量,所述交點數量係為通過霍夫交點621上的曲線數量。若霍夫晶片邊界曲線無法相互交錯產生霍夫交點621,則表示晶片輪廓圖塊420可能存在異常的問題。 Next, the processor 120 performs the aforementioned Hough transformation procedure 113 on the remaining chip boundary coordinates. Please refer to FIG. 6B , the upper part of FIG. 6B is the first dimensional space, and the lower part of FIG. 6B is the Hough chip boundary curve after the chip boundary coordinates are converted to the second dimensional space. Different Hough chip boundary curves will intersect with each other, and the position where different curves intersect is called the Hough intersection 621. The processor 120 will count the number of intersections of each Hough intersection 621, and the number of intersections is the number of curves passing through the Hough intersection 621. If the Hough chip boundary curves cannot intersect with each other to generate the Hough intersection 621, it means that there may be an abnormal problem in the chip contour block 420.

處理器120從晶片轉換角度區間之中的所有霍夫交點621中選擇交點數量最多者為目標交點631。處理器120將目標交點631的坐標轉換至第一維度空間,並記錄目標交點631於第一維度空間的霍夫線段640。圖6C係對應於圖6A的晶片輪廓圖塊420,圖6A的選擇線段610經前述處理後得到如圖6C的霍夫線段640。處理器120重複對晶片輪廓圖塊420選取其他的選擇線段610,藉以獲得相應的霍夫線段640,如圖6D所示。處理器120根據所有的霍夫線段640繪製成霍夫晶片輪廓圖塊650。圖6D的晶片輪廓圖塊420僅用於示意霍夫線段640的相對位置,實際上晶片輪廓圖塊420中也可以不需顯示,圖6D中晶片輪廓圖塊420係以灰色虛線塊表示。 The processor 120 selects the one with the largest number of intersections from all the Hough intersections 621 in the chip conversion angle interval as the target intersection 631. The processor 120 converts the coordinates of the target intersection 631 into the first dimension space, and records the Hough line segment 640 of the target intersection 631 in the first dimension space. FIG. 6C corresponds to the chip outline block 420 of FIG. 6A. The selected line segment 610 of FIG. 6A is processed as described above to obtain the Hough line segment 640 of FIG. 6C. The processor 120 repeatedly selects other selected line segments 610 from the chip outline block 420 to obtain the corresponding Hough line segment 640, as shown in FIG. 6D. The processor 120 draws a Hough chip outline block 650 based on all the Hough line segments 640. The chip outline block 420 in FIG. 6D is only used to illustrate the relative position of the Hough line segment 640. In fact, the chip outline block 420 does not need to be displayed. The chip outline block 420 in FIG. 6D is represented by a gray dotted line block.

接下來,處理器120對於天線輪廓圖塊530進行霍夫轉換程序113。天線輪廓圖塊530進行霍夫轉換程序113包括以下步驟: 步驟S710:獲取在第一維度空間的天線輪廓圖塊530的選擇線段610;步驟S720:設定第二維度空間的天線轉換角度區間;步驟S730:根據天線邊界坐標與天線轉換角度區間執行霍夫轉換程序113,產生在第二維度空間的多個霍夫天線邊界曲線;步驟S740:根據霍夫天線邊界曲線獲取霍夫交點621,並選擇至少一霍夫交點621;步驟S750:從霍夫交點621中選出交點數量最多的為目標交點631;步驟S760:根據第二維度空間中目標交點631的坐標轉換為第一維度空間的霍夫線段640;步驟S770:重複獲取其他的選擇線段610,並產生相應該霍夫線段640;以及步驟S780:根據霍夫線段640繪製成霍夫天線輪廓圖塊710。 Next, the processor 120 performs a Hough transformation procedure 113 on the antenna outline block 530. The Hough transformation procedure 113 for the antenna outline block 530 includes the following steps: Step S710: Obtain the selected line segment 610 of the antenna outline block 530 in the first dimension space; Step S720: Set the antenna transformation angle interval in the second dimension space; Step S730: Execute the Hough transformation procedure 113 according to the antenna boundary coordinates and the antenna transformation angle interval to generate multiple Hough antenna boundary curves in the second dimension space; Step S740: Obtain the Hough intersection according to the Hough antenna boundary curve point 621, and select at least one Hough intersection 621; step S750: select the target intersection 631 with the largest number of intersections from the Hough intersections 621; step S760: transform the coordinates of the target intersection 631 in the second dimensional space into a Hough line segment 640 in the first dimensional space; step S770: repeatedly obtain other selected line segments 610 and generate the corresponding Hough line segment 640; and step S780: draw a Hough antenna outline block 710 based on the Hough line segment 640.

處理器120從天線輪廓圖塊530中選取任一選擇線段610。選擇線段610的每一像素具有相應的天線邊界坐標。處理器120設定第一維度空間的天線轉換角度區間。一般而言,天線轉換角度區間可以等同於晶片轉換角度區間。或者根據處理器120的運算能力使晶片轉換角度區間的範圍相異於天線轉換角度區間的範圍。處理器120根據天線邊界坐標與天線轉換角度區間執行霍夫轉換程序113,並獲得第二維度空間的多個霍夫天線邊界曲線。不同的霍夫天線邊界曲線會相互交錯,在此將不同曲線交錯的位置稱為霍夫交點621。處理器120將統計各霍夫交點 621的交點數量,所述交點數量係為通過霍夫交點621上的曲線數量。若霍夫天線邊界曲線無法相互交錯產生霍夫交點621,則表示天線輪廓圖塊530可能存在異常的問題。 The processor 120 selects any selected line segment 610 from the antenna outline block 530. Each pixel of the selected line segment 610 has a corresponding antenna boundary coordinate. The processor 120 sets the antenna conversion angle range in the first dimension. Generally speaking, the antenna conversion angle range can be equivalent to the chip conversion angle range. Or the range of the chip conversion angle range is different from the range of the antenna conversion angle range according to the computing power of the processor 120. The processor 120 executes the Hough transformation program 113 according to the antenna boundary coordinates and the antenna conversion angle range, and obtains multiple Hough antenna boundary curves in the second dimension. Different Hough antenna boundary curves will intersect with each other, and the position where different curves intersect is called the Hough intersection 621. The processor 120 counts the number of intersections of each Hough intersection 621, which is the number of curves passing through the Hough intersection 621. If the Hough antenna boundary curves cannot intersect with each other to generate the Hough intersection 621, it means that there may be an abnormal problem in the antenna outline block 530.

處理器120根據天線轉換角度區間從多個霍夫天線邊界曲線所形成的霍夫交點621中選擇交點數量最多的目標交點631。換言之,處理器120將從天線轉換角度區間中查找交點並統計交點數量。處理器120將目標交點631的坐標轉換為第一維度空間的霍夫線段640,請參考圖7所示。天線輪廓圖塊530具有垂直方向的左、右兩組側邊與水平方向的四組側邊。一般而言,所述的垂直方向是為輸入影像130的寬邊(width)的法線方向。但實際上垂直方向也可以是以寬邊的法線為基準,並於法線設置一夾角範圍,而所述法線的夾角範圍內均可視為垂直方向。同理,水平方向也可以是輸入影像130的長邊(height)的法線延伸方向,或是與法線夾角範圍的方向。因此霍夫天線輪廓圖塊710也包括目標天線131的兩組垂直方向側邊與四組水平方向側邊的霍夫線段640。在圖7中,天線輪廓圖塊530僅用於示意霍夫線段640的相對位置,實際上天線輪廓圖塊530可以不需顯示,在圖7中係以灰色圖塊表示天線輪廓圖塊530。 The processor 120 selects the target intersection 631 with the largest number of intersections from the Hough intersections 621 formed by multiple Hough antenna boundary curves according to the antenna conversion angle interval. In other words, the processor 120 will search for intersections in the antenna conversion angle interval and count the number of intersections. The processor 120 converts the coordinates of the target intersection 631 into a Hough line segment 640 in the first dimensional space, as shown in FIG7 . The antenna outline block 530 has two sets of left and right sides in the vertical direction and four sets of sides in the horizontal direction. Generally speaking, the vertical direction is the normal direction of the width of the input image 130. However, in practice, the vertical direction can also be based on the normal of the width, and an angle range is set on the normal, and the angle range of the normal can be regarded as the vertical direction. Similarly, the horizontal direction can also be the direction of the normal extension of the long side (height) of the input image 130, or the direction of the angle range with the normal. Therefore, the Hough antenna outline block 710 also includes two sets of vertical side edges and four sets of horizontal side edges of the target antenna 131. Hough line segments 640. In FIG. 7, the antenna outline block 530 is only used to illustrate the relative position of the Hough line segments 640. In fact, the antenna outline block 530 does not need to be displayed. In FIG. 7, the antenna outline block 530 is represented by a gray block.

在獲取霍夫晶片輪廓圖塊650或霍夫天線輪廓圖塊710之後,處理器120判斷霍夫晶片輪廓圖塊650與霍夫天線輪廓圖塊710是否完整,並請配合圖3B所示。處理器120依序選擇霍夫晶片輪廓圖塊650的任兩側的霍夫線段640,並判斷受選的兩霍夫線段640的夾角角度是否符 合預設角度。若相對兩側的霍夫線段640的夾角角度不符合預設角度,表示霍夫晶片輪廓圖塊650可能發生異常,並產生判斷結果為「不合格」,例如晶片毀損或識別錯誤。一般而言,處理器120至少比對兩次的兩霍夫線段640,例如上、下側邊或是左、右側邊或是相鄰兩側邊的兩霍夫線段640。當任一側邊同時具有兩霍夫線段640,則表示霍夫晶片輪廓圖塊650可能存在異常的問題,並產生判斷結果為「不合格」。處理器120根據兩霍夫線段640產生相應的檢測結果。 After obtaining the Hoff chip outline block 650 or the Hoff antenna outline block 710, the processor 120 determines whether the Hoff chip outline block 650 and the Hoff antenna outline block 710 are complete, and please refer to FIG. 3B. The processor 120 sequentially selects the Hoff line segments 640 on any two sides of the Hoff chip outline block 650, and determines whether the angle of the selected two Hoff line segments 640 meets the preset angle. If the angle of the Hoff line segments 640 on the opposite sides does not meet the preset angle, it means that the Hoff chip outline block 650 may be abnormal, and the judgment result is "unqualified", such as chip damage or recognition error. Generally speaking, the processor 120 compares two Hough line segments 640 at least twice, such as the two Hough line segments 640 on the upper and lower sides or the left and right sides or the two adjacent sides. When any side has two Hough line segments 640 at the same time, it means that the Hough chip outline block 650 may have an abnormal problem and the judgment result is "unqualified". The processor 120 generates corresponding detection results based on the two Hough line segments 640.

此外,處理器120也會對於霍夫天線輪廓圖塊710進行輪廓完整的檢測。如前文所述,霍夫天線輪廓圖塊710包括垂直方向的左、右兩組側邊與水平方向的四組側邊的霍夫線段640,請參考圖7下方的虛線處。處理器120判斷左、右兩側邊的霍夫線段640的夾角是否符合預設角度。於此同時,處理器120也判斷水平的四組霍夫線段640延伸是否與垂直方向的兩側邊的霍夫線段640相交。當所述夾角符合預設角度且存在相交時,處理器120產生正確的檢測結果。 In addition, the processor 120 will also perform a complete contour detection on the Hough antenna contour block 710. As mentioned above, the Hough antenna contour block 710 includes two sets of left and right sides in the vertical direction and four sets of Hough line segments 640 in the horizontal direction, please refer to the dotted line below Figure 7. The processor 120 determines whether the angle of the Hough line segments 640 on the left and right sides meets the preset angle. At the same time, the processor 120 also determines whether the four sets of horizontal Hough line segments 640 extend and intersect with the Hough line segments 640 on the two sides in the vertical direction. When the angle meets the preset angle and there is an intersection, the processor 120 generates a correct detection result.

處理器120在確認霍夫晶片輪廓圖塊650與霍夫天線輪廓圖塊710為正常後,處理器120從霍夫天線輪廓圖塊710中選擇任一個霍夫線段640為天線邊界811。天線邊界811可以是霍夫天線輪廓圖塊710的垂直方向的左、右兩組側邊與水平方向的四組側邊。以圖7與圖8A為例,處理器120可以從圖7的垂直方向的左、右的兩側邊的霍夫線段640選擇任一為天線邊界811。處理器120可以從霍夫晶片輪廓圖塊650中選取相應垂直方向的霍夫線段640為晶片邊界812。 After confirming that the Hough chip outline block 650 and the Hough antenna outline block 710 are normal, the processor 120 selects any Hough line segment 640 from the Hough antenna outline block 710 as the antenna boundary 811. The antenna boundary 811 can be the left and right sides of the Hough antenna outline block 710 in the vertical direction and the four sides in the horizontal direction. Taking Figures 7 and 8A as examples, the processor 120 can select any one of the Hough line segments 640 on the left and right sides of Figure 7 in the vertical direction as the antenna boundary 811. The processor 120 can select the corresponding vertical Hough line segment 640 from the Hough chip outline block 650 as the chip boundary 812.

請參考圖8A所示,處理器120根據以下處理獲得偏移角度813。處理器120可以根據第一定位區911與第二定位區921之任一,或者第一定位區911與第二定位區921的組合獲得連線線段931。首先以選擇第一定位區911,並根據第一定位區911產生連線線段931為例說明。 Please refer to FIG. 8A , the processor 120 obtains the offset angle 813 according to the following processing. The processor 120 can obtain the connecting line segment 931 according to either the first positioning area 911 and the second positioning area 921, or the combination of the first positioning area 911 and the second positioning area 921. First, the first positioning area 911 is selected, and the connecting line segment 931 is generated according to the first positioning area 911 as an example.

圖8A中係以輸入影像130以表示霍夫天線輪廓圖塊710。處理器120從霍夫天線輪廓圖塊710中選擇相對兩側邊的霍夫線段640(意即為前述的天線邊界811)。處理器120以第一定位區911的第一中心點912為原點產生一連線線段931,連線線段931通過垂直方向的兩霍夫線段640,且連線線段931與其中一霍夫線段640相互垂直。處理器120計算連線線段931與水平側邊的晶片邊界812所形成的夾角角度,夾角角度係為偏移角度813。 FIG8A shows the Hough antenna outline block 710 using the input image 130. The processor 120 selects the Hough line segments 640 on opposite sides (i.e., the antenna boundary 811 mentioned above) from the Hough antenna outline block 710. The processor 120 generates a connecting line segment 931 with the first center point 912 of the first positioning area 911 as the origin. The connecting line segment 931 passes through two Hough line segments 640 in the vertical direction, and the connecting line segment 931 is perpendicular to one of the Hough line segments 640. The processor 120 calculates the angle formed by the connecting line segment 931 and the chip boundary 812 on the horizontal side, and the angle is the offset angle 813.

除了前述以第一定位區911獲得連線線段931與相應的偏移角度813的處理方式外,也可以透過多個定位區進行相應的處理。若輸入影像130具有第一定位區911與第二定位區921,處理器120可以根據第一定位區911與第二定位區921決定連線線段931。第一定位區911或第二定位區921的外觀或大小不限定於圖8B所示。第一定位區911與第二定位區921的可以是但不限定為三角形、圓形、方形或矩形等,也可以是其他多邊形,且具有與目標天線131相同材質,與目標天線131可以在同一製程形成,但不與目標天線131電導通。處理器120將第一定位區911的第一中心點912與第二定位區921的第二中心點922連線,而所連接的線段即為連線線段931。處理器120根據連線線段與相應的晶片邊界 812獲得偏移角度813。 In addition to the aforementioned processing method of obtaining the connecting line segment 931 and the corresponding offset angle 813 using the first positioning area 911, corresponding processing can also be performed through multiple positioning areas. If the input image 130 has a first positioning area 911 and a second positioning area 921, the processor 120 can determine the connecting line segment 931 according to the first positioning area 911 and the second positioning area 921. The appearance or size of the first positioning area 911 or the second positioning area 921 is not limited to that shown in FIG. 8B. The first positioning area 911 and the second positioning area 921 may be, but are not limited to, triangles, circles, squares, rectangles, etc., or may be other polygons, and have the same material as the target antenna 131. They may be in the same shape as the target antenna 131. process, but is not electrically connected to the target antenna 131 . The processor 120 connects the first center point 912 of the first positioning area 911 and the second center point 922 of the second positioning area 921, and the connected line segment is the connecting line segment 931. The processor 120 The corresponding chip boundary 812 obtains an offset angle 813.

處理器120根據霍夫天線輪廓圖塊710中的垂直方向兩側邊的霍夫線段640產生一天線圖塊中心線941(請參考圖9中的黑色虛線)。處理器120可以根據上述兩霍夫線段640的各自兩端點均值後得到天線圖塊中心線941。天線圖塊中心線941與連線線段931的交點為霍夫天線輪廓圖塊710的天線圖塊中心點942。處理器120根據霍夫晶片輪廓圖塊650計算目標晶片133的中心點,將所述中心點稱為晶片圖塊中心點660。處理器120可以根據霍夫晶片輪廓圖塊的650的四組霍夫線段640的交點,進而獲得四組交點坐標。處理器120將四組交點坐標加總後取均值,從而霍夫晶片輪廓圖塊650的獲得晶片圖塊中心點660,請參考圖6D。處理器120計算天線圖塊中心點942與晶片圖塊中心點660之間的距離值,而距離值係為天線圖塊中心點942與晶片圖塊中心點660係為偏移量814。 The processor 120 generates an antenna block center line 941 (see the black dashed line in FIG. 9 ) based on the Hough line segments 640 on both sides of the vertical direction in the Hough antenna outline block 710. The processor 120 can obtain the antenna block center line 941 based on the average of the two end points of the two Hough line segments 640. The intersection of the antenna block center line 941 and the connecting line segment 931 is the antenna block center point 942 of the Hough antenna outline block 710. The processor 120 calculates the center point of the target chip 133 based on the Hough chip outline block 650, and the center point is referred to as the chip block center point 660. The processor 120 can obtain four sets of intersection coordinates based on the intersection points of the four sets of Hough line segments 640 of the Hough chip outline block 650. The processor 120 sums up the four sets of intersection coordinates and takes the average, thereby obtaining the chip block center point 660 of the Hough chip outline block 650, please refer to Figure 6D. The processor 120 calculates the distance value between the antenna block center point 942 and the chip block center point 660, and the distance value is the antenna block center point 942 and the chip block center point 660 is the offset 814.

除此之外,處理器120從霍夫天線輪廓圖塊710中選擇任一個霍夫線段640為天線邊界811。天線邊界811可以是霍夫天線輪廓圖塊710的長邊(意即垂直方向的側邊)或寬邊(意即水平方向的側邊)。以圖7與圖9為例,處理器120可以從圖7的左、右的兩側邊選擇任一為天線邊界811。在霍夫晶片輪廓圖塊650包括兩長邊(意即左、右側邊的霍夫線段640)。處理器120根據受選的天線邊界811從霍夫晶片輪廓圖塊650中選取相應位置的霍夫線段640為晶片邊界812。 In addition, the processor 120 selects any Hough line segment 640 from the Hough antenna outline block 710 as the antenna boundary 811. The antenna boundary 811 can be the long side (i.e., the side in the vertical direction) or the wide side (i.e., the side in the horizontal direction) of the Hough antenna outline block 710. Taking Figures 7 and 9 as examples, the processor 120 can select any one of the left and right sides of Figure 7 as the antenna boundary 811. The Hough chip outline block 650 includes two long sides (i.e., the Hough line segments 640 on the left and right sides). The processor 120 selects the Hough line segments 640 at the corresponding positions from the Hough chip outline block 650 as the chip boundary 812 according to the selected antenna boundary 811.

換言之,處理器120若從霍夫天線輪廓圖塊710中選擇長邊 為天線邊界811,則處理器120將從霍夫晶片輪廓圖塊650中也選擇長邊為晶片邊界812。圖9的晶片邊界812係對應於圖6D的左側霍夫線段640。最後,處理器120計算天線邊界811與晶片邊界812之間的偏移角度813,請配合圖9所示。換言之,處理器120根據天線邊界811與晶片邊界812的夾角差異,進而獲得目標晶片133的偏移角度813。此外,處理器120也可以根據其他線段判斷目標晶片133的偏移角度813。 In other words, if the processor 120 selects the long side from the Hough antenna outline block 710 as the antenna boundary 811, the processor 120 will also select the long side from the Hough chip outline block 650 as the chip boundary 812. The chip boundary 812 of FIG. 9 corresponds to the left Hough line segment 640 of FIG. 6D. Finally, the processor 120 calculates the offset angle 813 between the antenna boundary 811 and the chip boundary 812, as shown in FIG. 9. In other words, the processor 120 obtains the offset angle 813 of the target chip 133 based on the difference in the angle between the antenna boundary 811 and the chip boundary 812. In addition, the processor 120 can also determine the offset angle 813 of the target chip 133 based on other line segments.

最後,處理器120根據偏移角度813與偏移量814產生目標晶片133與目標天線131的檢測結果。處理器120可以根據不同種類的RFID標籤進而設定不同的偏移角度813與偏移量814的合格條件。舉例來說處理器120判斷偏移量814是否符合預設距離門檻值。若偏移量814不符合預設距離且偏移角度813不符合預設角度門檻值,處理器120將產生判斷結果為「不合格」。實際上,處理器120係根據RFID標籤的種類進而設定相應的判斷標準,並非僅侷限前述示例。 Finally, the processor 120 generates the detection results of the target chip 133 and the target antenna 131 according to the offset angle 813 and the offset amount 814. The processor 120 can set different qualified conditions for the offset angle 813 and the offset amount 814 according to different types of RFID tags. For example, the processor 120 determines whether the offset amount 814 meets the preset distance threshold. If the offset amount 814 does not meet the preset distance and the offset angle 813 does not meet the preset angle threshold, the processor 120 will generate a judgment result of "failure". In fact, the processor 120 sets the corresponding judgment standard according to the type of RFID tag, and is not limited to the above example.

在一實施例中,在完成晶片輪廓圖塊420與天線輪廓圖塊530後,處理器120可以進一步確認天線輪廓圖塊530中是否包含目標晶片133。 In one embodiment, after completing the chip outline block 420 and the antenna outline block 530, the processor 120 can further confirm whether the antenna outline block 530 includes the target chip 133.

步驟S910:判斷天線輪廓圖塊530中是否包含晶片輪廓圖塊420;步驟S920:若天線輪廓圖塊530包含晶片輪廓圖塊420,則晶片輪廓圖塊420與天線輪廓圖塊530執行霍夫轉換程序;以及步驟S930:若天線輪廓圖塊530不包含晶片輪廓圖塊420,產生判斷結果為「不合格」。 Step S910: Determine whether the antenna outline block 530 includes the chip outline block 420; Step S920: If the antenna outline block 530 includes the chip outline block 420, the chip outline block 420 and the antenna outline block 530 perform a Hough transformation procedure; and Step S930: If the antenna outline block 530 does not include the chip outline block 420, the judgment result is "unqualified".

處理器120在完成天線輪廓圖塊530與晶片輪廓圖塊420後,處理器120檢查天線輪廓圖塊530中是否包含晶片輪廓圖塊420。若天線輪廓圖塊530包含晶片輪廓圖塊420,處理器120將繼續執行步驟S230。反之,若天線輪廓圖塊530不包含晶片輪廓圖塊420,產生判斷結果為「不合格」。 After the processor 120 completes the antenna outline block 530 and the chip outline block 420, the processor 120 checks whether the antenna outline block 530 includes the chip outline block 420. If the antenna outline block 530 includes the chip outline block 420, the processor 120 will continue to execute step S230. On the contrary, if the antenna outline block 530 does not include the chip outline block 420, the judgment result is "unqualified".

在一實施例中,處理器120選擇霍夫交點621的過程中更包括以下步驟:步驟S1010:依序調整晶片轉換角度區間的浮點精度位階,並統計每一浮點精度位階的霍夫交點621的數量;以及步驟S1020:從霍夫交點621中選出交點數量最多的為目標交點631。 In one embodiment, the process of selecting the Hough intersection 621 by the processor 120 further includes the following steps: Step S1010: sequentially adjusting the floating point precision level of the chip conversion angle range, and counting the number of Hough intersections 621 of each floating point precision level; and Step S1020: selecting the Hough intersection 621 with the largest number of intersections as the target intersection 631.

一般而言,晶片轉換角度區間的範圍越大可以獲得更多數量的霍夫晶片邊界曲線。雖然更多數量的霍夫晶片邊界曲線可以獲得更為精確的目標交點631與霍夫線段640,但對於處理器120而言,晶片轉換角度區間的範圍越大將會增加處理器120的運算負載。 Generally speaking, the larger the chip conversion angle range is, the more Hough chip boundary curves can be obtained. Although more Hough chip boundary curves can obtain more accurate target intersection points 631 and Hough line segments 640, for the processor 120, the larger the chip conversion angle range is, the greater the computational load of the processor 120 will be.

處理器120通過浮點精度位階的變動進而調整晶片轉換角度區間。處理器120將各浮點精度位階中的交點數量進行排序,從排序結果中獲取交點數量最多者為新的目標交點631。前述的浮點精度位階除了可以對應於小數點系統外,也可以應用於科學計數(scientific notation)。下文中浮點精度位階係以小數點系統為例說明。而浮點精度位階對應於小數點後的數字長度。 The processor 120 adjusts the chip conversion angle range by changing the floating point precision rank. The processor 120 sorts the number of intersections in each floating point precision rank, and obtains the one with the largest number of intersections from the sorting result as the new target intersection 631. In addition to corresponding to the decimal point system, the aforementioned floating point precision rank can also be applied to scientific notation. The floating point precision rank is explained below using the decimal point system as an example. The floating point precision rank corresponds to the length of the number after the decimal point.

假設晶片轉換角度區間為θ,且θ

Figure 111117730-A0305-02-0028-5
(-10°~+10°)。例如,晶片轉換角度區間在θ={6°~7°}之間具有最多的霍夫交點621,處理器120選擇θ={6°~7°}為新的晶片轉換角度區間。處理器120根據目標交點631為基準且依序移動浮點精度位階。處理器120依次計算θ=6.9,θ=6.8...θ=6.0的霍夫交點621的數量。處理器120將霍夫交點621的數量進行排序,並獲取霍夫交點621數量最大者為目標交點631的坐標值。假設,處理器120在目標交點631的坐標值θ=6.8獲得該區間中最多的霍夫交點621;接著,處理器120根據目標交點631的坐標值θ=6.8並移動浮點精度位階,處理器120從θ=6.80~6.71進行前述的統計與排序。請參考下表1所示,其係為目標交點631的坐標值在各浮點精度位階的交點數量示意表。 Assume that the chip conversion angle range is θ, and θ
Figure 111117730-A0305-02-0028-5
(-10°~+10°). For example, the chip conversion angle interval has the most Hough intersections 621 between θ={6°~7°}, and the processor 120 selects θ={6°~7°} as the new chip conversion angle interval. The processor 120 uses the target intersection 631 as a reference and moves the floating point precision level in sequence. The processor 120 calculates the number of Hough intersections 621 of θ=6.9, θ=6.8...θ=6.0 in sequence. The processor 120 sorts the number of Hough intersections 621 and obtains the coordinate value of the target intersection 631 with the largest number of Hough intersections 621. Assume that the processor 120 obtains the most Hough intersections 621 in the interval at the coordinate value θ=6.8 of the target intersection 631; then, the processor 120 performs the aforementioned statistics and sorting from θ=6.80 to 6.71 according to the coordinate value θ=6.8 of the target intersection 631 and moves the floating point precision level. Please refer to Table 1 below, which is a schematic table of the number of intersections at each floating point precision level for the coordinate value of the target intersection 631.

Figure 111117730-A0305-02-0028-2
Figure 111117730-A0305-02-0028-2

處理器120完成所有浮點精度位階後,處理器120選擇浮點精度位階最末階的目標交點631的坐標值為新的目標交點631。處理器120根據前述所獲取的目標交點631產生霍夫線段640。實際上處理器120可以根據運算能力決定浮點精度位階的數量。 After the processor 120 completes all floating point precision levels, the processor 120 selects the coordinate value of the target intersection 631 at the last level of the floating point precision level as the new target intersection 631. The processor 120 generates a Hough line segment 640 based on the target intersection 631 obtained above. In practice, the processor 120 can determine the number of floating point precision levels based on computing power.

處理器120除了對於晶片轉換角度區間進行浮點精度位階 的處理外,在一實施例中,處理器120也可以對天線轉換角度區間進行浮點精度位階的調整並從中選擇相應的目標交點。 In addition to processing the chip conversion angle interval with floating point precision, in one embodiment, the processor 120 can also adjust the antenna conversion angle interval with floating point precision and select the corresponding target intersection point therefrom.

步驟S1110:依序調整天線轉換角度區間的浮點精度位階,並統計每一浮點精度位階的霍夫交點621的數量;以及步驟S1120:從霍夫交點621中選出交點數量最多的為目標交點631。 Step S1110: sequentially adjust the floating point precision level of the antenna conversion angle interval, and count the number of Hough intersections 621 of each floating point precision level; and Step S1120: select the Hough intersection 621 with the largest number of intersections as the target intersection 631.

處理器120通過浮點精度位階的變動進而調整天線轉換角度區間。處理器120將各浮點精度位階中的交點數量進行排序,從排序結果中獲取交點數量最多者為新的目標交點631。承接前例,處理器120首先選擇天線轉換角度區間為θ,且θ

Figure 111117730-A0305-02-0029-7
(-10°~+10°)。經過θ
Figure 111117730-A0305-02-0029-8
(-10°~+10°)的霍夫轉換程序113後,假設在θ={0°~2°}具有最多的霍夫交點621。因此處理器120再選出天線轉換角度區間為θ={0°~2°}。請參考下表2,其係為天線轉換角度區間的各浮點精度位階交點數量示意表:
Figure 111117730-A0305-02-0029-3
The processor 120 adjusts the antenna conversion angle range by changing the floating point precision level. The processor 120 sorts the number of intersections in each floating point precision level, and obtains the one with the largest number of intersections from the sorting result as the new target intersection 631. Continuing from the previous example, the processor 120 first selects the antenna conversion angle range as θ, and θ
Figure 111117730-A0305-02-0029-7
(-10°~+10°). After θ
Figure 111117730-A0305-02-0029-8
After the Hough transformation process 113 of (-10°~+10°), it is assumed that the maximum number of Hough intersections 621 is in θ={0°~2°}. Therefore, the processor 120 selects the antenna transformation angle interval as θ={0°~2°}. Please refer to the following Table 2, which is a schematic table of the number of intersections of each floating point precision level in the antenna transformation angle interval:
Figure 111117730-A0305-02-0029-3

處理器120根據表1、表2獲得相應的霍夫線段640。處理器根據霍夫線段640進行天線邊界811與晶片邊界812的相關比對與處理。 The processor 120 obtains the corresponding Hough line segment 640 according to Table 1 and Table 2. The processor performs relevant comparison and processing of the antenna boundary 811 and the chip boundary 812 according to the Hough line segment 640.

在一實施例中,天線影像程序112在執行平滑程序118與二 值化程序116之間也可以執行灰階程序115,請參考圖3A。輸入影像130經過平滑程序118的處理後,產生平滑影像510。處理器120對平滑影像510執行灰階程序115,用於產生平滑灰階影像(無標號)。處理器120對平滑灰階影像執行二值化程序116,並產生天線二值化影像520。處理器120根據天線二值化影像520進行相應的處理。 In one embodiment, the antenna image program 112 may also execute the grayscale program 115 between executing the smoothing program 118 and the binarization program 116, see FIG3A. After the input image 130 is processed by the smoothing program 118, a smoothed image 510 is generated. The processor 120 executes the grayscale program 115 on the smoothed image 510 to generate a smoothed grayscale image (unlabeled). The processor 120 executes the binarization program 116 on the smoothed grayscale image and generates an antenna binarization image 520. The processor 120 performs corresponding processing according to the antenna binarization image 520.

所述的檢測RFID標籤的天線與晶片位置精準度的處理方法與系統應用於目標晶片133的天線影像中,用於辨識晶片的位置是否產生偏移。檢測RFID標籤的天線與晶片位置精準度的處理方法與系統也修改霍夫轉換程序113的計算方式,以使處理系統的運算負載可以降低,並且保留高精準的識別結果。 The processing method and system for detecting the position accuracy of the antenna and chip of the RFID tag are applied to the antenna image of the target chip 133 to identify whether the position of the chip is offset. The processing method and system for detecting the position accuracy of the antenna and chip of the RFID tag also modify the calculation method of the Hough transform program 113 so that the computational load of the processing system can be reduced and the high-precision recognition result can be retained.

100:處理系統 100:Processing system

110:儲存設備 110: Storage equipment

111:晶片影像程序 111: Chip imaging program

112:天線影像程序 112: Antenna imaging program

113:霍夫轉換程序 113: Hough Transformation Procedure

114:比對結果 114:Comparison results

115:灰階程序 115: Gray-level program

116:二值化程序 116: Binarization procedure

117:晶片輪廓識別程序 117: Wafer profile recognition process

118:平滑程序 118: Smoothing program

119:天線輪廓識別程序 119: Antenna profile recognition procedure

120:處理器 120: Processor

130:輸入影像 130: Input image

131:目標天線 131: Target antenna

133:目標晶片 133: Target chip

140:攝像單元 140: Camera unit

Claims (35)

一種檢測RFID標籤的天線與晶片位置精準度的處理方法,包括:由一處理器獲取一輸入影像,該輸入影像包括一第一定位區;該處理器對該輸入影像執行一晶片影像程序,產生一晶片輪廓圖塊;該處理器對該輸入影像執行一天線影像程序,產生一天線輪廓圖塊;該處理器分別對該晶片輪廓圖塊與該天線輪廓圖塊執行一霍夫轉換程序,各別產生一霍夫晶片輪廓圖塊與一霍夫天線輪廓圖塊;該處理器選擇該霍夫天線輪廓圖塊的一天線邊界與該霍夫晶片輪廓圖塊的一晶片邊界;該處理器根據該天線邊界與該晶片邊界獲取一偏移角度;該處理器獲取通過該第一定位區的一連線線段;該處理器根據該霍夫天線輪廓圖塊與該連線線段以獲取一天線圖塊中心點;該處理器根據該霍夫晶片輪廓圖塊獲取一晶片圖塊中心點;該處理器根據該天線圖塊中心點與該晶片圖塊中心點獲取一偏移量;以及該處理器根據該偏移角度與該偏移量產生一比對結果。 A processing method for detecting the position accuracy of the antenna and chip of an RFID tag includes: obtaining an input image by a processor, the input image including a first positioning area; the processor executing a chip image program on the input image to generate a chip outline block; the processor executing an antenna image program on the input image to generate an antenna outline block; the processor executing a Hough transformation program on the chip outline block and the antenna outline block respectively to generate a Hough chip outline block and a Hough antenna outline block respectively; the processor selects the Hough antenna outline The processor obtains an antenna boundary of the block and a chip boundary of the Hough chip outline block; the processor obtains an offset angle according to the antenna boundary and the chip boundary; the processor obtains a connecting line segment passing through the first positioning area; the processor obtains an antenna block center point according to the Hough antenna outline block and the connecting line segment; the processor obtains a chip block center point according to the Hough chip outline block; the processor obtains an offset according to the antenna block center point and the chip block center point; and the processor generates a comparison result according to the offset angle and the offset. 如請求項1所述的檢測RFID標籤的天線與晶片位置精準度的處理方法,其中該晶片影像程序包括:對該輸入影像執行一灰階程序,產生一灰階影像; 對該灰階影像執行一二值化程序,產生一晶片二值化影像;以及對該晶片二值化影像執行一晶片輪廓識別程序,產生該晶片輪廓圖塊。 The processing method for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 1, wherein the chip image process includes: executing a grayscale process on the input image to generate a grayscale image; executing a binarization process on the grayscale image to generate a chip binarization image; and executing a chip contour recognition process on the chip binarization image to generate the chip contour block. 如請求項2所述的檢測RFID標籤的天線與晶片位置精準度的處理方法,其中在執行該晶片輪廓識別程序之步驟包括:辨識該晶片二值化影像中的多個矩形區塊;判斷一晶片選取框中的該些矩形區塊是否存在一目標晶片;若該晶片二值化影像中存在該目標晶片,則移除該晶片二值化影像中的其他非該目標晶片的該些矩形區塊,並產生該晶片輪廓圖塊;以及若該晶片二值化影像中不存在該目標晶片,則產生一判斷結果。 The processing method for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 2, wherein the step of executing the chip contour recognition procedure includes: identifying multiple rectangular blocks in the chip binary image; judging whether there is a target chip in the rectangular blocks in a chip selection box; if the target chip exists in the chip binary image, removing the other rectangular blocks in the chip binary image that are not the target chip and generating the chip contour block; and if the target chip does not exist in the chip binary image, generating a judgment result. 如請求項1所述的檢測RFID標籤的天線與晶片位置精準度的處理方法,其中該天線影像程序包括:對該輸入影像執行一平滑程序,產生一平滑影像;對該平滑影像執行一二值化程序,產生一天線二值化影像;以及對該天線二值化影像執行一天線輪廓識別程序,產生該天線輪廓圖塊。 The processing method for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 1, wherein the antenna image process includes: executing a smoothing process on the input image to generate a smoothed image; executing a binarization process on the smoothed image to generate an antenna binarization image; and executing an antenna outline recognition process on the antenna binarization image to generate the antenna outline block. 如請求項1所述的檢測RFID標籤的天線與晶片位置精準度的處理方法,其中該天線影像程序包括:對該輸入影像執行一平滑程序,產生一平滑影像;對該平滑影像執行一灰階程序,產生一灰階影像;對該灰階影像執行一二值化程序,產生一天線二值化影像;以及 對該天線二值化影像執行一天線輪廓識別程序,產生該天線輪廓圖塊。 The processing method for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 1, wherein the antenna image process includes: executing a smoothing process on the input image to generate a smoothed image; executing a grayscale process on the smoothed image to generate a grayscale image; executing a binarization process on the grayscale image to generate an antenna binarization image; and executing an antenna outline recognition process on the antenna binarization image to generate the antenna outline block. 如請求項4或5所述的檢測RFID標籤的天線與晶片位置精準度的處理方法,其中在執行該天線輪廓識別程序之步驟包括:辨識該天線二值化影像中的多個矩形區塊;根據一天線選取框判斷該些矩形區塊中是否存在一目標天線;若該天線二值化影像中存在該目標天線,則移除該天線二值化影像中的其他該些矩形區塊並產生該天線輪廓圖塊;以及若該天線二值化影像中不存在該目標天線,則產生一判斷結果。 The processing method for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 4 or 5, wherein the step of executing the antenna outline recognition procedure includes: identifying multiple rectangular blocks in the antenna binary image; judging whether there is a target antenna in the rectangular blocks according to an antenna selection frame; if the target antenna exists in the antenna binary image, removing the other rectangular blocks in the antenna binary image and generating the antenna outline block; and if the target antenna does not exist in the antenna binary image, generating a judgment result. 如請求項1所述的檢測RFID標籤的天線與晶片位置精準度的處理方法,其中在對該晶片輪廓圖塊與該天線輪廓圖塊執行該霍夫轉換程序之步驟前更包括:該處理器判斷該天線輪廓圖塊中是否包含該晶片輪廓圖塊;若該天線輪廓圖塊包含該晶片輪廓圖塊,則該處理器對該晶片輪廓圖塊與該天線輪廓圖塊執行該霍夫轉換程序;以及若該天線輪廓圖塊不包含該晶片輪廓圖塊,則該處理器產生一判斷結果。 The processing method for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 1, wherein before the step of executing the Hough transformation procedure on the chip outline block and the antenna outline block, further includes: the processor determines whether the antenna outline block includes the chip outline block; if the antenna outline block includes the chip outline block, the processor executes the Hough transformation procedure on the chip outline block and the antenna outline block; and if the antenna outline block does not include the chip outline block, the processor generates a judgment result. 如請求項1所述的檢測RFID標籤的天線與晶片位置精準度的處理方法,其中在對該晶片輪廓圖塊執行該霍夫轉換程序產生該霍夫晶片輪廓圖塊之步驟包括: 獲取在一第一維度空間的該晶片輪廓圖塊的一選擇線段,其中該選擇線段具有多個晶片邊界坐標;設定一第二維度空間的一晶片轉換角度區間;根據該些晶片邊界坐標與該晶片轉換角度區間執行該霍夫轉換程序,產生在該第二維度空間的多個霍夫晶片邊界曲線;根據該些霍夫晶片邊界曲線獲取一霍夫交點,並該處理器選擇至少一該霍夫交點;該處理器從該些霍夫交點中選出交點數量最多的為一目標交點;根據該第二維度空間中該目標交點的坐標轉換為該第一維度空間的一霍夫線段;重複獲取其他的該選擇線段,並產生其他的該霍夫線段;以及根據該些霍夫線段繪製成該霍夫晶片輪廓圖塊。 The processing method for detecting the antenna and chip position accuracy of the RFID tag as described in claim 1, wherein the step of executing the Hough transformation process on the chip outline block to generate the Hough chip outline block includes: obtaining a selected line segment of the chip outline block in a first dimensional space, wherein the selected line segment has a plurality of chip boundary coordinates; setting a chip transformation angle interval in a second dimensional space; executing the Hough transformation process according to the chip boundary coordinates and the chip transformation angle interval to generate A plurality of Hough chip boundary curves in the second dimensional space; a Hough intersection is obtained according to the Hough chip boundary curves, and the processor selects at least one of the Hough intersections; the processor selects the one with the largest number of intersections from the Hough intersections as a target intersection; the coordinates of the target intersection in the second dimensional space are converted into a Hough line segment in the first dimensional space; other selected line segments are repeatedly obtained and other Hough line segments are generated; and the Hough chip outline block is drawn according to the Hough line segments. 如請求項8所述的檢測RFID標籤的天線與晶片位置精準度的處理方法,其中從該些霍夫交點中選出交點數量最多的為該目標交點之步驟包括:該處理器依序調整該晶片轉換角度區間的一浮點精度位階,並統計每一該浮點精度位階的該些霍夫交點的數量;以及從該些霍夫交點中選出交點數量最多的為該目標交點。 The processing method for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 8, wherein the step of selecting the target intersection point from the Hough intersection points with the largest number of intersection points includes: the processor sequentially adjusts a floating point precision level of the chip conversion angle range, and counts the number of the Hough intersection points of each floating point precision level; and selecting the target intersection point from the Hough intersection points with the largest number of intersection points. 如請求項8所述的檢測RFID標籤的天線與晶片位置精準度的處理方法,其中在繪製成該霍夫晶片輪廓圖塊步驟之後更包括: 該處理器判斷該霍夫晶片輪廓圖塊是否完整。 The processing method for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 8 further includes the following steps after drawing the Hough chip outline block: The processor determines whether the Hough chip outline block is complete. 如請求項1所述的檢測RFID標籤的天線與晶片位置精準度的處理方法,其中在對該天線輪廓圖塊執行該霍夫轉換程序產生該霍夫天線輪廓圖塊之步驟包括:獲取在一第一維度空間的該天線輪廓圖塊的一選擇線段,其中該選擇線段具有多個天線邊界坐標;設定一第二維度空間的一天線轉換角度區間;根據該些天線邊界坐標與該天線轉換角度區間執行該霍夫轉換程序,產生在該第二維度空間的多個霍夫天線邊界曲線;根據該些霍夫天線邊界曲線獲取一霍夫交點,並該處理器選擇至少一該霍夫交點;該處理器從該些霍夫交點中選出交點數量最多的為一目標交點;根據該第二維度空間的該目標交點的坐標轉換為該第一維度空間的一霍夫線段;重複獲取其他的該選擇線段,並產生其他的該霍夫線段;以及根據該些霍夫線段繪製成該霍夫天線輪廓圖塊。 The processing method for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 1, wherein the step of executing the Hough transformation process on the antenna outline block to generate the Hough antenna outline block includes: obtaining a selected line segment of the antenna outline block in a first dimensional space, wherein the selected line segment has a plurality of antenna boundary coordinates; setting an antenna transformation angle interval in a second dimensional space; executing the Hough transformation process according to the antenna boundary coordinates and the antenna transformation angle interval to generate A plurality of Hough antenna boundary curves in the second dimensional space; a Hough intersection is obtained according to the Hough antenna boundary curves, and the processor selects at least one of the Hough intersections; the processor selects the one with the largest number of intersections from the Hough intersections as a target intersection; the coordinates of the target intersection in the second dimensional space are converted into a Hough line segment in the first dimensional space; other selected line segments are repeatedly obtained and other Hough line segments are generated; and the Hough antenna outline block is drawn according to the Hough line segments. 如請求項11所述的檢測RFID標籤的天線與晶片位置精準度的處理方法,其中從該些霍夫交點中選出交點數量最多的為該目標交點之步驟包括:該處理器依序調整該天線轉換角度區間的一浮點精度位階,並統計每一該浮點精度位階的該些霍夫交點的數量;以及 該處理器從該些霍夫交點中選出交點數量最多的為該目標交點。 The processing method for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 11, wherein the step of selecting the target intersection point from the Hough intersection points with the largest number of intersection points includes: the processor sequentially adjusts a floating point precision level of the antenna conversion angle range, and counts the number of the Hough intersection points of each floating point precision level; and the processor selects the target intersection point from the Hough intersection points with the largest number of intersection points. 如請求項11所述的檢測RFID標籤的天線與晶片位置精準度的處理方法,其中在繪製成該霍夫天線輪廓圖塊步驟之後更包括:該處理器判斷該霍夫天線輪廓圖塊是否完整。 The processing method for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 11 further includes: after drawing the Hough antenna outline block, the processor determines whether the Hough antenna outline block is complete. 如請求項1所述的檢測RFID標籤的天線與晶片位置精準度的處理方法,其中在選擇該霍夫天線輪廓圖塊的該天線邊界與該霍夫晶片輪廓圖塊的該晶片邊界的步驟包括:該天線邊界選自該霍夫天線輪廓圖塊的一垂直方向的一霍夫線段或一水平方向的該霍夫線段,該晶片邊界根據該垂直方向或該水平方向從該霍夫晶片輪廓圖塊選擇受選方向的該霍夫線段。 The processing method for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 1, wherein the step of selecting the antenna boundary of the Hough antenna outline block and the chip boundary of the Hough chip outline block includes: the antenna boundary is selected from a Hough line segment in a vertical direction or a Hough line segment in a horizontal direction of the Hough antenna outline block, and the chip boundary selects the Hough line segment in the selected direction from the Hough chip outline block according to the vertical direction or the horizontal direction. 如請求項1所述的檢測RFID標籤的天線與晶片位置精準度的處理方法,其中在獲取通過該第一定位區的該連線線段的步驟包括:該處理器獲取該輸入影像的一第二定位區;以及該處理器連接該第一定位區的一第一中心點與該第二定位區的一第二中心點,形成該連線線段。 The processing method for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 1, wherein the step of obtaining the connecting line segment passing through the first positioning area includes: the processor obtains a second positioning area of the input image; and the processor connects a first center point of the first positioning area and a second center point of the second positioning area to form the connecting line segment. 如請求項1所述的檢測RFID標籤的天線與晶片位置精準度的處理方法,其中在獲取通過該第一定位區的該連線線段的步驟包括: 該連線線段垂直相交於該霍夫天線輪廓圖塊的一垂直方向的一霍夫線段,並該連線線段通過該第一定位區的一第一中心點。 The processing method for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 1, wherein the step of obtaining the connecting line segment passing through the first positioning area includes: The connecting line segment vertically intersects a Hough line segment in a vertical direction of the Hough antenna outline block, and the connecting line segment passes through a first center point of the first positioning area. 如請求項1所述的檢測RFID標籤的天線與晶片位置精準度的處理方法,其中在根據該霍夫天線輪廓圖塊與該連線線段獲取該天線圖塊中心點的步驟包括:該處理器根據該霍夫天線輪廓圖塊的一垂直方向的兩霍夫線段產生一天線圖塊中心線;以及該天線圖塊中心線與該連線線段相交點為該天線圖塊中心點。 The processing method for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 1, wherein the step of obtaining the center point of the antenna block according to the Hough antenna outline block and the connecting line segment includes: the processor generates an antenna block center line according to two Hough line segments in a vertical direction of the Hough antenna outline block; and the intersection point of the antenna block center line and the connecting line segment is the center point of the antenna block. 一種檢測RFID標籤的天線與晶片位置精準度的處理系統,包括:一儲存設備,儲存一輸入影像、一晶片影像程序、一天線影像程序、一霍夫轉換程序與一比對結果,該輸入影像至少包括一第一定位區;以及一處理器,電性連接於該儲存設備,該處理器根據該輸入影像分別執行該晶片影像程序與該天線影像程序,並各別產生一晶片輪廓圖塊與一天線輪廓圖塊;該處理器分別對該晶片輪廓圖塊與該天線輪廓圖塊執行該霍夫轉換程序,各別產生一霍夫晶片輪廓圖塊與一霍夫天線輪廓圖塊,該處理器選擇該霍夫天線輪廓圖塊的一天線邊界與該霍夫晶片輪廓圖塊的一晶片邊界;該處理器根據該天線邊界與該晶片邊界獲取一偏移角度;該處理器獲取通過該第一定位區的一連線線段;該處理器根據該霍夫天線輪廓圖塊與該連線線段以獲取一天線圖塊中心點;該處理器根 據該霍夫晶片輪廓圖塊獲取一晶片圖塊中心點;該處理器根據該天線圖塊中心點與該晶片圖塊中心點獲取一偏移量;該處理器根據該偏移角度與該偏移量產生該比對結果。 A processing system for detecting the position accuracy of the antenna and chip of an RFID tag includes: a storage device for storing an input image, a chip image program, an antenna image program, a Hough transformation program and a comparison result, wherein the input image at least includes a first positioning area; and a processor electrically connected to the storage device, wherein the processor executes the chip image program and the antenna image program respectively according to the input image, and generates a chip outline block and an antenna outline block respectively; the processor executes the Hough transformation program on the chip outline block and the antenna outline block respectively, and generates a Hough chip outline block and an antenna outline block respectively. The processor selects an antenna boundary of the Hough antenna outline block and a chip boundary of the Hough chip outline block; the processor obtains an offset angle according to the antenna boundary and the chip boundary; the processor obtains a connecting line segment passing through the first positioning area; the processor obtains an antenna block center point according to the Hough antenna outline block and the connecting line segment; the processor obtains a chip block center point according to the Hough chip outline block; the processor obtains an offset according to the antenna block center point and the chip block center point; the processor generates the comparison result according to the offset angle and the offset. 如請求項18所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中該處理器執行該晶片影像程序,該晶片影像程序包括以下步驟:該處理器對該輸入影像執行一灰階程序,產生一灰階影像;該處理器對該灰階影像執行一二值化程序,產生一晶片二值化影像;以及該處理器對該晶片二值化影像執行一晶片輪廓識別程序,產生該晶片輪廓圖塊。 A processing system for detecting the antenna and chip position accuracy of an RFID tag as described in claim 18, wherein the processor executes the chip imaging program, and the chip imaging program includes the following steps: the processor executes a grayscale program on the input image to generate a grayscale image; the processor executes a binarization program on the grayscale image to generate a chip binarization image; and the processor executes a chip contour recognition program on the chip binarization image to generate the chip contour block. 如請求項18所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中該處理器執行一晶片輪廓識別程序之步驟包括:該處理器辨識一晶片二值化影像中的多個矩形區塊;該處理器根據一晶片選取框判斷該些矩形區塊中是否存在一目標晶片;若該晶片二值化影像中存在該目標晶片,則該處理器移除該晶片二值化影像中的其他該些矩形區塊並產生該晶片輪廓圖塊;以及若該晶片二值化影像中不存在該目標晶片,則該處理器產生一判斷結果。 A processing system for detecting the antenna and chip position accuracy of an RFID tag as described in claim 18, wherein the processor executes a chip outline recognition procedure including: the processor identifies multiple rectangular blocks in a chip binary image; the processor determines whether a target chip exists in the rectangular blocks according to a chip selection frame; if the target chip exists in the chip binary image, the processor removes the other rectangular blocks in the chip binary image and generates the chip outline block; and if the target chip does not exist in the chip binary image, the processor generates a judgment result. 如請求項18所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中該處理器執行該天線影像程序,該天線影像程序包括以下步驟:該處理器對該輸入影像執行一平滑程序,產生一平滑影像;該處理器對該平滑影像執行一二值化程序,產生一天線二值化影像;以及該處理器對該天線二值化影像執行一天線輪廓識別程序,產生該天線輪廓圖塊。 A processing system for detecting the position accuracy of the antenna and chip of an RFID tag as described in claim 18, wherein the processor executes the antenna image program, and the antenna image program includes the following steps: the processor executes a smoothing program on the input image to generate a smoothed image; the processor executes a binarization program on the smoothed image to generate an antenna binarization image; and the processor executes an antenna outline recognition program on the antenna binarization image to generate the antenna outline block. 如請求項18所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中該處理器執行該天線影像程序,該天線影像程序包括以下步驟:該處理器對該輸入影像執行一平滑程序,產生一平滑影像;該處理器對該平滑影像執行一灰階程序,產生一灰階影像;該處理器對該灰階影像執行一二值化程序,產生一天線二值化影像;以及該處理器對該天線二值化影像執行一天線輪廓識別程序,產生該天線輪廓圖塊。 A processing system for detecting the position accuracy of the antenna and chip of an RFID tag as described in claim 18, wherein the processor executes the antenna image program, and the antenna image program includes the following steps: the processor executes a smoothing program on the input image to generate a smoothed image; the processor executes a grayscale program on the smoothed image to generate a grayscale image; the processor executes a binarization program on the grayscale image to generate an antenna binarization image; and the processor executes an antenna outline recognition program on the antenna binarization image to generate the antenna outline block. 如請求項18所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中該處理器執行一天線輪廓識別程序之步驟包括:該處理器辨識一天線二值化影像中的多個矩形區塊; 該處理器根據一天線選取框判斷該些矩形區塊中是否存在一目標天線;若該天線二值化影像中存在該目標天線,則該處理器移除該天線二值化影像中的其他該些矩形區塊並產生該天線輪廓圖塊;以及若該天線二值化影像中不存在該目標天線,則產生一判斷結果。 The processing system for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 18, wherein the processor executes an antenna outline recognition procedure including: the processor identifies multiple rectangular blocks in an antenna binary image; the processor determines whether there is a target antenna in the rectangular blocks according to an antenna selection frame; if the target antenna exists in the antenna binary image, the processor removes the other rectangular blocks in the antenna binary image and generates the antenna outline block; and if the target antenna does not exist in the antenna binary image, a judgment result is generated. 如請求項18所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中該處理器在執行對該晶片輪廓圖塊與該天線輪廓圖塊執行該霍夫轉換程序之步驟前更包括:該處理器判斷該天線輪廓圖塊中是否包含該晶片輪廓圖塊;若該天線輪廓圖塊包含該晶片輪廓圖塊,則該處理器對該晶片輪廓圖塊與該天線輪廓圖塊執行該霍夫轉換程序;以及若該天線輪廓圖塊不包含該晶片輪廓圖塊,則該處理器產生一判斷結果。 The processing system for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 18, wherein the processor further includes before executing the step of executing the Hough transformation procedure on the chip outline block and the antenna outline block: the processor determines whether the antenna outline block contains the chip outline block; if the antenna outline block contains the chip outline block, the processor executes the Hough transformation procedure on the chip outline block and the antenna outline block; and if the antenna outline block does not contain the chip outline block, the processor generates a judgment result. 如請求項18所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中在該處理器對該晶片輪廓圖塊執行該霍夫轉換程序產生該霍夫晶片輪廓圖塊之步驟包括:該處理器獲取在一第一維度空間的該晶片輪廓圖塊的一選擇線段,其中該選擇線段具有多個晶片邊界坐標;該處理器設定一第二維度空間的一晶片轉換角度區間;該處理器根據該些晶片邊界坐標與該晶片轉換角度區間執行該霍夫轉換程序,產生在該第二維度空間的多個霍夫晶片邊界曲線; 該處理器根據該些霍夫晶片邊界曲線獲取一霍夫交點,並選擇至少一該霍夫交點;該處理器從該些霍夫交點中選出交點數量最多的為一目標交點;該處理器根據該第二維度空間的該目標交點的坐標轉換為該第一維度空間的一霍夫線段;重複獲取其他的該選擇線段,並產生其他的該霍夫線段;以及該處理器根據該些霍夫線段繪製成該霍夫晶片輪廓圖塊。 A processing system for detecting the antenna and chip position accuracy of an RFID tag as described in claim 18, wherein the step of executing the Hough transform program on the chip outline block to generate the Hough chip outline block comprises: the processor obtains a selected line segment of the chip outline block in a first dimensional space, wherein the selected line segment has a plurality of chip boundary coordinates; the processor sets a chip transformation angle interval in a second dimensional space; the processor executes the Hough transform program according to the chip boundary coordinates and the chip transformation angle interval. , generating multiple Hough chip boundary curves in the second dimensional space; The processor obtains a Hough intersection according to the Hough chip boundary curves and selects at least one of the Hough intersections; the processor selects the one with the largest number of intersections from the Hough intersections as a target intersection; the processor converts the coordinates of the target intersection in the second dimensional space into a Hough line segment in the first dimensional space; repeatedly obtains other selected line segments and generates other Hough line segments; and the processor draws the Hough chip outline block according to the Hough line segments. 如請求項25所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中在該處理器從該些霍夫交點中選出交點數量最多的為該目標交點之步驟包括:依序調整該晶片轉換角度區間的一浮點精度位階,並統計每一該浮點精度位階的該些霍夫交點的數量;以及該處理器從該些霍夫交點中選出交點數量最多的為該目標交點。 A processing system for detecting the position accuracy of the antenna and chip of an RFID tag as described in claim 25, wherein the step of the processor selecting the target intersection point from the Hough intersections with the largest number of intersections includes: sequentially adjusting a floating point precision level of the chip conversion angle range, and counting the number of the Hough intersection points of each floating point precision level; and the processor selecting the target intersection point from the Hough intersections with the largest number of intersections. 如請求項25所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中在繪製成該霍夫晶片輪廓圖塊步驟之後更包括:判斷該霍夫晶片輪廓圖塊是否完整。 The processing system for detecting the antenna and chip position accuracy of the RFID tag as described in claim 25 further includes: determining whether the Hough chip outline block is complete after drawing the Hough chip outline block. 如請求項18所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中在該處理器執行該天線輪廓圖塊執行該霍夫轉換程序產生該霍夫天線輪廓圖塊之步驟包括: 該處理器獲取在一第一維度空間的該天線輪廓圖塊的一選擇線段,其中該選擇線段具有多個天線邊界坐標;該處理器設定一第二維度空間的一天線轉換角度區間;該處理器根據該些天線邊界坐標與該天線轉換角度區間執行該霍夫轉換程序,產生在該第二維度空間的多個霍夫天線邊界曲線;該處理器根據該些霍夫天線邊界曲線獲取一霍夫交點,並選擇至少一該霍夫交點;該處理器從該些霍夫交點中選出交點數量最多的為一目標交點;該處理器根據該第二維度空間的該目標交點的坐標轉換為該第一維度空間的一霍夫線段;重複獲取其他的該選擇線段,並產生其他的該霍夫線段;以及該處理器根據該些霍夫線段繪製成該霍夫天線輪廓圖塊。 The processing system for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 18, wherein the step of executing the Hough transform process on the processor to generate the Hough antenna outline block includes: the processor obtains a selected line segment of the antenna outline block in a first dimensional space, wherein the selected line segment has a plurality of antenna boundary coordinates; the processor sets an antenna transformation angle interval in a second dimensional space; the processor executes the Hough transform process according to the antenna boundary coordinates and the antenna transformation angle interval. The processor obtains a Hough intersection point according to the Hough antenna boundary curves and selects at least one of the Hough intersection points; the processor selects the one with the largest number of intersection points from the Hough intersection points as a target intersection point; the processor converts the coordinates of the target intersection point in the second dimensional space into a Hough line segment in the first dimensional space; repeatedly obtains other selected line segments and generates other Hough line segments; and the processor draws the Hough antenna outline block according to the Hough line segments. 如請求項28所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中在該處理器從該些霍夫交點中選出交點數量最多的為該目標交點之步驟包括:依序調整該天線轉換角度區間的一浮點精度位階,並統計每一該浮點精度位階的該些霍夫交點的數量;以及該處理器從該些霍夫交點中選出交點數量最多的為該目標交點。 A processing system for detecting the position accuracy of the antenna and chip of an RFID tag as described in claim 28, wherein the step of the processor selecting the target intersection point from the Hough intersection points with the largest number of intersection points includes: sequentially adjusting a floating point precision level of the antenna conversion angle range, and counting the number of the Hough intersection points of each floating point precision level; and the processor selecting the target intersection point from the Hough intersection points with the largest number of intersection points. 如請求項28所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中在該處理器根據該些霍夫線段繪製成該霍夫天線輪廓圖塊步驟之後更包括: 判斷該霍夫天線輪廓圖塊是否完整。 The processing system for detecting the position accuracy of the antenna and chip of the RFID tag as described in claim 28, wherein after the processor draws the Hough antenna outline block according to the Hough line segments, it further includes: Determining whether the Hough antenna outline block is complete. 如請求項18所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中該處理器獲取該輸入影像的一第二定位區,該處理器連接該第一定位區的一第一中心點與該第二定位區的一第二中心點,形成該連線線段。 A processing system for detecting the position accuracy of the antenna and chip of an RFID tag as described in claim 18, wherein the processor obtains a second positioning area of the input image, and the processor connects a first center point of the first positioning area and a second center point of the second positioning area to form the connecting line segment. 如請求項18所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中該處理器將該連線線段垂直相交於該霍夫天線輪廓圖塊的垂直方向的一霍夫線段,並該連線線段通過該第一定位區的一第一中心點。 A processing system for detecting the position accuracy of the antenna and chip of an RFID tag as described in claim 18, wherein the processor intersects the connecting line segment perpendicularly with a Hough line segment in the vertical direction of the Hough antenna outline block, and the connecting line segment passes through a first center point of the first positioning area. 如請求項18所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中該處理器根據該霍夫天線輪廓圖塊的一垂直方向的兩霍夫線段產生一天線圖塊中心線;該處理器將該天線圖塊中心線與該連線線段相交點為該天線圖塊中心點。 A processing system for detecting the position accuracy of the antenna and chip of an RFID tag as described in claim 18, wherein the processor generates an antenna block centerline based on two Hough line segments in a vertical direction of the Hough antenna outline block; the processor uses the intersection point of the antenna block centerline and the connecting line segment as the center point of the antenna block. 如請求項18所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中該處理器在選擇該霍夫天線輪廓圖塊的該天線邊界與該霍夫晶片輪廓圖塊的該晶片邊界的步驟包括:該天線邊界選自該霍夫天線輪廓圖塊的一垂直方向的一霍夫線段或一水平方向的該霍夫線段,該晶片邊界根據該垂直方向或該水平方向從該霍夫晶片輪廓圖塊選擇受選方向的該霍夫線段。 A processing system for detecting the position accuracy of the antenna and chip of an RFID tag as described in claim 18, wherein the processor selects the antenna boundary of the Hough antenna outline block and the chip boundary of the Hough chip outline block in the step of: the antenna boundary is selected from a Hough line segment in a vertical direction or a Hough line segment in a horizontal direction of the Hough antenna outline block, and the chip boundary selects the Hough line segment in the selected direction from the Hough chip outline block according to the vertical direction or the horizontal direction. 如請求項18所述的檢測RFID標籤的天線與晶片位置精準度的處理系統,其中包括一攝像單元,其係電性連接於該處理器,該攝像單元拍攝該輸入影像。 The processing system for detecting the antenna and chip position accuracy of the RFID tag as described in claim 18 includes a camera unit electrically connected to the processor, and the camera unit captures the input image.
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