TWI924100B - 測試系統及其測試方法 - Google Patents

測試系統及其測試方法

Info

Publication number
TWI924100B
TWI924100B TW113132328A TW113132328A TWI924100B TW I924100 B TWI924100 B TW I924100B TW 113132328 A TW113132328 A TW 113132328A TW 113132328 A TW113132328 A TW 113132328A TW I924100 B TWI924100 B TW I924100B
Authority
TW
Taiwan
Prior art keywords
testing
testing method
testing system
Prior art date
Application number
TW113132328A
Other languages
English (en)
Other versions
TW202609322A (zh
Inventor
曾建財
陳志銘
Original Assignee
新唐科技股份有限公司
Filing date
Publication date
Application filed by 新唐科技股份有限公司 filed Critical 新唐科技股份有限公司
Priority to CN202510545497.3A priority Critical patent/CN121633928A/zh
Publication of TW202609322A publication Critical patent/TW202609322A/zh
Application granted granted Critical
Publication of TWI924100B publication Critical patent/TWI924100B/zh

Links

TW113132328A 2024-08-28 2024-08-28 測試系統及其測試方法 TWI924100B (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202510545497.3A CN121633928A (zh) 2024-08-28 2025-04-28 测试系统及其测试方法

Publications (2)

Publication Number Publication Date
TW202609322A TW202609322A (zh) 2026-03-01
TWI924100B true TWI924100B (zh) 2026-05-01

Family

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Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117665344A (zh) 2023-11-30 2024-03-08 拓尔微电子股份有限公司 修调电路、方法、控制芯片和修调系统

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117665344A (zh) 2023-11-30 2024-03-08 拓尔微电子股份有限公司 修调电路、方法、控制芯片和修调系统

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