US3448263A - Device for deriving a beam from a particle accelerator utilizing triple focusing means - Google Patents
Device for deriving a beam from a particle accelerator utilizing triple focusing means Download PDFInfo
- Publication number
- US3448263A US3448263A US534505A US3448263DA US3448263A US 3448263 A US3448263 A US 3448263A US 534505 A US534505 A US 534505A US 3448263D A US3448263D A US 3448263DA US 3448263 A US3448263 A US 3448263A
- Authority
- US
- United States
- Prior art keywords
- magnet
- deriving
- particles
- path
- target
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/08—Deviation, concentration or focusing of the beam by electric or magnetic means
- G21K1/093—Deviation, concentration or focusing of the beam by electric or magnetic means by magnetic means
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H7/00—Details of devices of the types covered by groups H05H9/00, H05H11/00, H05H13/00
Definitions
- the present invention relates to a beam deriving device, and more particularly to a device for deriving the accelerated beam of a particle accelerator is such a manner that it is deflected onto a target lying outside of the normal path followed by the accelerated beam.
- the eifect of such a magnet is, firstly, a defocusing of said particles due to their dilferent energy levels, i.e., a splitting of the path of the original beam containing, as is well known, a spectrum of particles of diflerent energies, into a' multitude of diflFerent paths, one path each for particles of one and the same energy, and secondly, a defocusing of particles of a predetermined energy in two mutually perpendicular planes, conveniently termed horizontal and vertical planes, respectively.
- the problem therefore arises as to how to refocus the particles of diiferent energy level and also in the horizontal plane and in the vertical plane, and moreover how to achieve this triple focusing action so that the triple focus point will fall into coincidence with the location of the target, i.e., that the energy focus, the vertical focus and the horizontal focus would find themselves precisely on the target.
- a guiding system for the derived beam comprising a combi- Patented June 3, 1969 ice nation of two deflecting magnets having lines of force parallel but of opposite sense, and of one or two quadrupolar magnetic lenses.
- Another object of the present invention is a beam deriving device for operating on a beam from a particle accelerator, wherein triple, i.e., energy, vertical and horizontal, focusing is attained in a common point located on a target positioned somewhere out of alignment with the axis of the accelerator, with the use of only two deflecting magnets exclusive of any other magnetic optical components along the path of particles between the accelerator and the target.
- FIGURE 1 is schematic plan view of a beam deriving device ensuring triple focusing action in accordance Wth the present invention
- FIGURE 2 is a view, similar to FIGURE 1, showing a development of the present invention wherein some faces of the deflecting magnets have been made orientable;
- FIGURE 3 is a view similar to FIGURES 1 and 2, showing a further development according to the present invention, wherein all faces of the deflecting magnets have been made orientable, and
- FIGURE 4 is a view similar to FIGURES 1, 2 and 3, showing a still further development of the present invention wherein some orientable faces of the deflecting magnets have a concave shape.
- a beam deriving device including only two deflecting magnets without any further components such as a magnetic lens, the lines of force of these magnets being parallel and moreover, in contrast with the device described in the aforesaid copending application, being of the same sense. Furthermore, the sizes and locations of these magnets are defined by six parameters, two of which are selected freely and the remaining four being determined from a set of four equations which will be given below, in dependence on the coordinates of the target and of said two freely selected parameters.
- a first sectoral magnet 2 is placed in such a manner that the point A is within the gap thereof.
- This magnet includes an input face 3 and an output face 4, the face 3 being normal to the axis 1' and the face 4 being normal to the desired path of the beam after deflection caused by the magnet 2.
- the angular opening of the sector occupied by the magnet 2 is at, so that the particles are deflected therein by an angle on with an average radius of curvature R.
- a second sectoral magnet 5 having an input face 6 normal to the line AB, and an output face 7 having means to rotate it so as to change its orientation.
- the sector of the magnet 5 occupies an angle ,3 and the particles are deflected therein, with respect to the line AB, by this angle ,3 with an average curvature radius r.
- the lines of force of both magnets 2 and 5 are parallel and of the same sense. Admitting that the particles are negatively charged (electrons), for deflecting these particles in the plane of the drawing and in the counterclockwise sense, the lines of force must be perpendicular to the drawing and directed toward the viewer, which is denoted by the circles B and B.
- a calculation made with the present invention has established that for the paths leaving the magnet 5 to pass through the point C, and for the energy focus, the horizontal focus and the vertical focus :to be brought into coincidence at this very point C, the following conditions must be met at least approximately.
- the size and the location of magnets 2 and 5 being defined by the following six parameters.
- E is the mean energy of the energy band of the particles to be guided toward the target, in MeV.
- B or B is the respective induction, in Tesla, and R or r is the respective curvature radius, in meters.
- FIGURE 2 wherein the same reference numerals are used to denote similar elements as in FIG- URE 1, the input face 3 of the magnet 2 is also orientable. This feature makes it possible to adjust coincidence between horizontal and vertical focus in the event of inaccuracies in the manufacture of the magnets or in their positioning.
- FIGURE 3 showing a further development of the present invention, differs from FIGURE 2 merely by the fact that the output face 4 of the magnet 2 and the input face 6 of the magnet 5 have also been shown as orientable. Tdjusting these intermediate faces makes it possible to determine with great flexibility a compromise between the positions of the faces 3 and 7 concurring in an optimum of triple focalization at C. As well known to those skilled in the art, the same effect could be achieved by selecting for the polar pieces of the magnet 2 a suitable profile to form a field gradient magnet with varying width of its gap.
- FIGURE 4 showing a still further development of the present invention, differs from FIGURE 1 bythe fact that the output face 7 of the magnet 5 has been given a concave shape. The same feature is shown for the input face 6 thereof, which, for instance although not necessarily, has been also made orientable.
- the exact profile of the concave faces will be determined graphically by those skilled in the art with a view of obtaining achromatic focalization within a broad energy passband, starting from a widened path of the beam within the magnet 5, as comprised between extreme or limiting trajectories 8 and 9 traced in FIGURE 1.
- One of said first and second magnets is of field-gradient and the input face of said second magnet. type.
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Plasma & Fusion (AREA)
- Particle Accelerators (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR10461A FR1453847A (fr) | 1965-03-24 | 1965-03-24 | Nouveau système de triple focalisation pour les particules dérivées d'un accélérateur |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| US3448263A true US3448263A (en) | 1969-06-03 |
Family
ID=8574731
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US534505A Expired - Lifetime US3448263A (en) | 1965-03-24 | 1966-03-15 | Device for deriving a beam from a particle accelerator utilizing triple focusing means |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3448263A (fr) |
| CH (1) | CH444327A (fr) |
| FR (1) | FR1453847A (fr) |
| GB (1) | GB1080191A (fr) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4056728A (en) * | 1972-01-31 | 1977-11-01 | C.G.R.-Mev. | Magnetic deflecting and focusing device for a charged particle beam |
| EP0041753A3 (en) * | 1980-06-10 | 1983-09-28 | Philips Electronic And Associated Industries Limited | Deflection system for charged-particle beam |
| US4442352A (en) * | 1979-05-17 | 1984-04-10 | Instrument Ab Scanditronix | Scanning system for charged and neutral particle beams |
| US4559449A (en) * | 1984-05-23 | 1985-12-17 | Indiana University Foundation | High resolution particle spectrometer |
| US4659926A (en) * | 1984-05-23 | 1987-04-21 | Indiana University Foundation | High resolution particle spectrometer |
| US4742223A (en) * | 1984-05-23 | 1988-05-03 | Indiana University Foundation | High resolution particle spectrometer |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2169746B1 (fr) * | 1972-01-31 | 1974-09-13 | Thomson Csf |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2909688A (en) * | 1957-02-19 | 1959-10-20 | Vickers Electrical Co Ltd | Magnetic means for deflecting electron beams |
| US3135863A (en) * | 1961-02-09 | 1964-06-02 | Ass Elect Ind | Magnetic deflection system providing plural exit ports for a beam of charged particles |
-
1965
- 1965-03-24 FR FR10461A patent/FR1453847A/fr not_active Expired
-
1966
- 1966-03-15 US US534505A patent/US3448263A/en not_active Expired - Lifetime
- 1966-03-23 GB GB12806/66A patent/GB1080191A/en not_active Expired
- 1966-03-24 CH CH428466A patent/CH444327A/fr unknown
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2909688A (en) * | 1957-02-19 | 1959-10-20 | Vickers Electrical Co Ltd | Magnetic means for deflecting electron beams |
| US3135863A (en) * | 1961-02-09 | 1964-06-02 | Ass Elect Ind | Magnetic deflection system providing plural exit ports for a beam of charged particles |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4056728A (en) * | 1972-01-31 | 1977-11-01 | C.G.R.-Mev. | Magnetic deflecting and focusing device for a charged particle beam |
| US4442352A (en) * | 1979-05-17 | 1984-04-10 | Instrument Ab Scanditronix | Scanning system for charged and neutral particle beams |
| EP0041753A3 (en) * | 1980-06-10 | 1983-09-28 | Philips Electronic And Associated Industries Limited | Deflection system for charged-particle beam |
| US4559449A (en) * | 1984-05-23 | 1985-12-17 | Indiana University Foundation | High resolution particle spectrometer |
| US4659926A (en) * | 1984-05-23 | 1987-04-21 | Indiana University Foundation | High resolution particle spectrometer |
| US4742223A (en) * | 1984-05-23 | 1988-05-03 | Indiana University Foundation | High resolution particle spectrometer |
Also Published As
| Publication number | Publication date |
|---|---|
| GB1080191A (en) | 1967-08-23 |
| FR1453847A (fr) | 1966-07-22 |
| CH444327A (fr) | 1967-09-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4425506A (en) | Stepped gap achromatic bending magnet | |
| US3448263A (en) | Device for deriving a beam from a particle accelerator utilizing triple focusing means | |
| Fuller et al. | Domains in thin magnetic films observed by electron microscopy | |
| GB1269017A (en) | Electron beam deflector system | |
| US3691374A (en) | Stigmatic and achromatic system for deflecting a particle beam | |
| US3031596A (en) | Device for separating electrons in accordance with their energy levels | |
| US3777211A (en) | Adjusting device for a particle beam | |
| Panofsky et al. | Achromatic beam translation systems for use with the linear accelerator | |
| US4389572A (en) | Two magnet asymmetric doubly achromatic beam deflection system | |
| US4322622A (en) | Device for the achromatic magnetic deflection of a beam of charged particles and an irradiation apparatus using such a device | |
| EP0041753B1 (fr) | Déflecteur pour faisceau de particules chargées | |
| US2719924A (en) | Magnetic shims | |
| US3287584A (en) | Focusing arrangement for guiding particles from an accelerator device toward a laterally shifted target | |
| US2886727A (en) | Electron optical apparatus | |
| US3287558A (en) | Charged particle deflecting device consisting of sequentially positioned uniform and non-uniform magnetic field sectors | |
| US3202817A (en) | Polyenergetic particle deflecting system | |
| US3671895A (en) | Graded field magnets | |
| US2824987A (en) | Electron optical elements and systems equivalent to light optical prisms for charge carriers in discharge vessels | |
| US2945125A (en) | Magnetic prisms used for separating ionized particles | |
| US4455489A (en) | Quadrupole singlet focusing for achromatic parallel-to-parallel devices | |
| US3723730A (en) | Multiple ion source array | |
| US3388359A (en) | Particle beam focussing magnet with a septum wall | |
| US3516037A (en) | Nondispersive magnetic deflection method | |
| US4056728A (en) | Magnetic deflecting and focusing device for a charged particle beam | |
| US3056023A (en) | Mass separation of high energy particles |