US4086566A - Error detector for modified duobinary signals - Google Patents

Error detector for modified duobinary signals Download PDF

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Publication number
US4086566A
US4086566A US05/742,168 US74216876A US4086566A US 4086566 A US4086566 A US 4086566A US 74216876 A US74216876 A US 74216876A US 4086566 A US4086566 A US 4086566A
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output
input connected
pulse
input
pulse train
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Adam Lender
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AG Communication Systems Corp
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GTE Automatic Electric Laboratories Inc
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Assigned to AG COMMUNICATION SYSTEMS CORPORATION, 2500 W. UTOPIA RD., PHOENIX, AZ 85027, A DE CORP. reassignment AG COMMUNICATION SYSTEMS CORPORATION, 2500 W. UTOPIA RD., PHOENIX, AZ 85027, A DE CORP. ASSIGNMENT OF ASSIGNORS INTEREST. Assignors: GTE COMMUNICATION SYSTEMS CORPORATION
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/24—Testing correct operation
    • H04L1/245—Testing correct operation by using the properties of transmission codes
    • H04L1/247—Testing correct operation by using the properties of transmission codes three-level transmission codes, e.g. ternary

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  • This invention relates to error detection in digital transmission wherein correlative level coding is employed, and more particularly relates to error detection for a modified duobinary signal.
  • duobinary systems are explained, for example, in an article appearing in IEEE Transactions on Communications and Electronics, vol. 82, May 1963, pp. 214-218, as well as a variety of generally available publications such as IEEE Spectrum article February 1966.
  • the duobinary system is disclosed and claimed in U.S. Pat. No. 3,238,299 entitled, "High-Speed Data Transmission System” by the present inventor.
  • Subsequent publications by this inventor have disclosed a number of variations in the basic duobinary concepts.
  • the duobinary technique contemplated a baseband three-level, correlative level-coded signal in which the frequency spectrum of the wave increased with decreasing frequency, reaching a maximum value at a frequency which was essentially zero.
  • the error detector of the subject invention contemplates dividing the modified duobinary signal, having a predetermined bit rate, into first and second pulse trains, each of which is representative of a bipolar pulse train, and each having a bit rate equal to one-half said predetermined bit rate.
  • the pulse trains are delayed one from the other by one bit interval. Errors which occur in each of the separate pulse trains are separately detected and serially combined to obtain the error output signal for the modified duobinary pulse train.
  • FIG. 1 is a waveform diagram showing transmitted and received modified duobinary pulse trains and the odd and even bipolar pulse trains that may be derived from the received modified duobinary pulse train.
  • FIG. 2 is a block diagram of the error detector of the invention.
  • FIG. 3 is a more detailed block diagram of the pulse train divider.
  • FIG. 4 is a more detailed block diagram of the clock divider.
  • FIG. 5 is a block diagram illustrating the two bipolar error detectors and the input paths including delay circuits 10 and 12.
  • FIG. 6 is a block diagram of the error combiner
  • FIG. 7 is a waveform diagram showing the detection of an error in the even bipolar error detector.
  • Table I illustrates the positive and negative representations of the time slots for the waveform polarity and further illustrates the odd and even representations that will be obtained from the waveform T-characteristic.
  • the modified duobinary waveform operated upon by the present invention comprises a three-level signal in which the extreme levels represent one binary state, such as MARK, and the center or intermediate level signal represents the other binary state, such as SPACE.
  • MARK one binary state
  • SPACE the center or intermediate level signal represents the other binary state
  • This signal follows a predetermined set of rules. These rules may be readily understood by grouping all of the successive MARKS in pairs and assigning the pair number of each MARK as illustrated in FIG. 1 for waveform T. Successive MARKS are indicated by the numerals 1 and 2, with a repetition of this numbering for the next pair of MARKS.
  • a MARK bearing number 1 in a pair of two successive MARKS will be seen to always have the opposite polarity relative to the previous MARK which, of course, carries the number 2.
  • the polarity of the MARK, identified by number 2, relative to the previous MARK bearing number 1, is governed by a set of odd and even rules, as in the straight duobinary system and method. Specifically, if the number of intervening SPACES between a pair of MARKS numbered 1 and 2 is odd, then the polarities of these two MARKS are opposite; and if the number of intervening SPACES between a pair of MARKS numbered 1 and 2 is even, then the polarities of these two marks are the same.
  • Waveforms A and B in FIG. 1 show, respectively, the odd and even bipolar waveforms which may be derived from the modified duobinary pulse train.
  • the waveforms as shown may be considered to be return-to-zero or 50% duty cycle bipolar signals at the bit rate equal to half of the modified duobinary waveform.
  • the coding rule for the bipolar signal is that successive MARKS will have opposite polarities. Referring now to the waveform B, wherein the error occurs because time slot 6 is associated with this waveform, it is to be noted that here again the violation of the modified duobinary coding rules also appears as a violation of the bipolar coding rules.
  • the essence of this error detection technique is to regard the modified duobinary signal as an algebraic sum of two independent bipolar pulse trains, delayed with respect to each other by T seconds, where T is the bit interval duration of the modified duobinary, and 1/T is the bit rate in bits per second of the modified duobinary pulse train.
  • T is the bit interval duration of the modified duobinary
  • 1/T is the bit rate in bits per second of the modified duobinary pulse train.
  • Waveform A represents the odd pulses only (1, 3, 5, etc.) and waveform B represents only the even pulses (2, 4, 6, etc.).
  • An algebraic sum of waveforms A and B is, indeed, R. Except for the error which occurs at time slot 6, waveforms A and B follow the bipolar pulse train rules in that successive MARKS alternate in polarity.
  • the keypoint in the implementation is to separate the pulse train R in FIG. 1 into bipolar pulse trains. A and B and to check these bipolar waveforms separately for bipolar violations. In order to effectuate this representation using a binary logic, it is necessary to approach the required result in a somewhat different manner.
  • FIG. 2 shows a general block diagram of the preferred embodiment of the invention
  • the received modified duobinary signal as shown at R, FIG. 1 is applied to pulse train divider 4 via path 2.
  • Pulse train divider 4 separates the waveform R into waveforms C and D, as shown in FIG. 7.
  • waveform C is a unipolar representation of the positive pulses of waveform R
  • waveform D is a unipolar representation of the negative pulses of waveform R.
  • the pulses are shown as positive in waveform D.
  • the bipolar signals are representative only because they are derived from a unipolar representation.
  • a clock signal at the pulse repetition rate of the modified duobinary signal in FIG. 2 is applied from clock 34 via path 36 to pulse train divider 4.
  • the clock 34 may be a local clock, but most often is derived from the incoming data, as is well known in the art. Techniques for deriving a local clock are well known and these will not be described in this specification. It is also seen that the output from clock 34 is applied to clock divider 40, and clock divider 40 divides the clock rate in half and, in addition, provides 42 and 44 at one-half of the clock 34 rate, but in opposite phases one from the other. Reverting now to the output of pulse train divider 4, it is to be seen that two similar circuit paths are employed.
  • the first path includes delay 10 and bipolar error detector 22, and the second includes delay 12 and bipolar error detector 24. Since these operate similarly, only the upper one will be considered in the following discussion.
  • Outputs 6 and 8 i.e., waveforms C and D, are applied to inputs of delay 10 along with the input 42 from clock divider 40.
  • Delay 10 provides, on output path 14, a delayed representation of the input signal on path 6 and, at output path 16, the delayed output representation on path 8. It should be noted that because of the timing from clock divider 40, the representations on paths 14 and 16 are applicable only to the odd time slots of the original waveform.
  • the original waveforms on paths 6 and 8 are applied to bipolar error detector 22 as well as the timing signal along path 42 from clock divider 40.
  • the bipolar error detector detects pipolar error violations which may occur by comparing the polarities of previous and present MARKS, and applies these via path 26 to error combiner 30, which combines the errors from both paths and applies these to output 32. Pertinent portions of the error detector shown in FIG. 2 will be explained in more detail hereinbelow.
  • FIG. 7 A technique for generating waveforms C and D is shown in FIG. 7 is illustrated in FIG. 3.
  • the modified duobinary waveform which is received from the transmission facility, is applied to center-tap transformer 46 via path 2 and provides the positive and negative outputs, respectively, at paths 48 and 50.
  • the positive output is applied to top slicer 52, which identifies the pressence of a positive pulse, such as is shown in time slots 1 and 2 of FIG. 7.
  • the bottom slicer 54 identifies the negative- going pulses such as is shown in time slots 3 and 8 of waveform R, FIG. 7.
  • pulses are amplified in amplifiers 56 and 58, which are then applied, respectively, to flip-flops 60 and 62 from which the output waveforms C and D are obtained from the Q-outputs of the respective flip-flops.
  • the timing information for flip-flops 60 and 62 is applied via path 36 from clock 34 to the clock inputs of the respective flip flops.
  • the waveforms C and D i.e., the positive representation in a unipolar format of the positive and negative pulses of a modified duobinary waveform, may already be available from equipment associated with the error detector, and thus the elements as shown in FIG. 3 would not be required.
  • clock pulse signals each having a clock rate of one-half the bit of the modified duobinary signal and each being of opposite phase one from the other.
  • clock divider 40 which is shown in FIG. 4.
  • the clock frequency in the form of a square wave appears on path 38 and is applied to inverter 64.
  • Inverter 64 may include a plurality of inverters as is necessary to obtain the time delay required to maintain timing integrity.
  • the output of inverter 64 is applied to a D-type flip-flop 66 which has the Q output and the D input strapped as shown.
  • the Q-output becomes Q, i.e., the same as the D-input. Equivalently, Q always changes state. Further, it is apparent that Q and Q have opposite phases. Thus, the outputs Q and Q are square waves at a frequency which is half that of the modified duobinary bit rate, and they have opposite phases. Essentially this is the same as having the clock square waves delayed by T seconds, where T is equal to the reciprocal of the modified duobinary bit rate.
  • NAND-gates 70 and 72 operate as inverters to clean up the waveforms.
  • the delay and bipolar error detector circuit arrangements illustrated in block form in FIG. 2 are shown in more detail in FIG. 5.
  • the circuits for the odd and even time slots are identical, and therefore only the operation of one will be described in detail since the operation of the other is identical, except for the time slots for which they are applied.
  • the discussion will focus on the even time slots, i.e., the lower circuit configuration, since the waveform R, as shown in FIG. 1, has an error in the even time slot no. 6.
  • the only essential difference between the two is in the phase of the clock pulses, as described hereinabove.
  • Each of these circuits detects errors. One detects the errors caused by bipolar violations of the odd bits, and the other detects errors cause by bipolar violation of the even bits.
  • the two clocks in effect, separate odd from even bits that appear at waveforms C and D along input paths 6 and 8.
  • the delay 10 is shown as J-K flip-flop having a timing input to select only the odd bits
  • the delay 12 is shown as a J-K flip-flop with timing, such as to select only the even bits.
  • delay 12 is to "remember" the previous +1 represented in waveform C, applied on path 6, or to "remember” the previous -1 represented in waveform D, which is applied on path 8.
  • This may be readily accomplished by using a J-K flip-flop as shown in FIG. 5.
  • a +1 represented by waveform 6 will result in the Q-output of flip-flop 12 being positive or high; however, should the input on path 8, i.e., waveform D, be positive, representing -1, Q will be high and Q will be low. This "reading in” into flip-flop 12 occurs at the instant of clock pulse on the input CP.
  • Table 1 illustrates the positive and negative representations of the time slots for the waveform polarity, both prior to and subsequent to the representations of the waveforms C and D, and further illustrates the odd and even representations that will be obtained from the waveform T-characteristic, as illustrated in FIG. 1. Thus, no error occurrences appear in Table 1 as illustrated. It is interesting to note that the odd and even waveforms show a "bipolar" representation in that positive representations alternately occur in the C- and D- outputs for the odd time slots and also for the even time slots, as indicated. Reverting back to the waveform diagrams, FIG. 7, the representations at the Q and Q-outputs of delay 12 are shown at 18 and 20.
  • NAND-gate 102 When these, in conjunction with the inputs on paths 6 and 8, are combined in the logic gating arrangement consisting of NAND-gates 102, 104 and 106, it is noted that the output of NAND-gate 102 is always positive, i.e., a+1, during the intervals in question, whereas the output of NAND-gate 104 is positive, i.e., a+1, except for one time slot, thus, indicating that an error had occurred. Note that since this is detection only, the actual time of occurrence of the error is not obtained.
  • the 1 and 0 inputs to NAND-gate 106 then cause an output pulse to appear as illustrated in waveform 106, which is then timed through flip-flop 108 to appear on output path 28.
  • the output W of NAND-gate 106 is CQ + DQ. This means that simultaneous occurrence of either C and Q or D and Q will cause an output pulse indicating an error.
  • the error combiner block diagram in FIG. 6 the three NAND-gates constitute an AND-OR combination.
  • the three NAND-gates are 110, 112, and 114, and their function is to combine odd and even output errors.
  • the output on path 16 provides all errors, both odd and even.
  • Gate 116 is merely an inverter to "clean" the error output waveform.
  • the output from NAND-gate 114 occurs when one of the two possible events occurs; simultaneous occurrence of a positive output on path 26 and appearance of the clock pulse on path 42. This indicates an odd error.
  • the second possible event is simultaneous occurrence of a positive output on path 28 in conjunction with a clock pulse on path 44. This indicates an even error.

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US05/742,168 1976-11-15 1976-11-15 Error detector for modified duobinary signals Expired - Lifetime US4086566A (en)

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Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0044555A1 (fr) * 1980-07-22 1982-01-27 Siemens Aktiengesellschaft Régénérateur comportant un vérificateur de violation de la règle du code
EP0044554A1 (fr) * 1980-07-22 1982-01-27 Siemens Aktiengesellschaft Dispositif de surveillance pour un régénérateur MIC comportant un vérificateur de violation de la règle du code
US4441185A (en) * 1980-07-22 1984-04-03 Siemens Aktiengesellschaft Monitoring method and device for a PCM regenerator having a code rule violation checking device
US4468787A (en) * 1981-11-09 1984-08-28 Lear Siegler, Inc. Ternary data transmission system
US4472813A (en) * 1981-03-30 1984-09-18 Nippon Electric Co., Ltd. Transmission system for intentionally violating a class IV partial response code to distinguish subsidiary signals from an error
FR2556906A1 (fr) * 1983-12-20 1985-06-21 Italtel Spa Disposition de circuit capable de relever le taux d'erreur dans les systemes de transmission de type numerique
US4545055A (en) * 1983-07-20 1985-10-01 Loral Corporation Error analyzer for data communicated by bus protocol
US4750179A (en) * 1986-05-02 1988-06-07 Lynch Communications Systems, Inc. Selective prevention of bipolar violation detection
US4807231A (en) * 1986-03-08 1989-02-21 Honda Giken Kogyo Kabushiki Kaisha Multiplex communication method
US5504761A (en) * 1993-09-17 1996-04-02 Fujitsu Limited Apparatus for detecting error in a communications line
US5832033A (en) * 1995-01-27 1998-11-03 Nec Corporation Clock disturbance detection based on ratio of main clock and subclock periods
US20020196872A1 (en) * 2001-06-23 2002-12-26 Carsten Noeske Apparatus and method for decoding biphase signals
US6741636B1 (en) 2000-06-27 2004-05-25 Lockheed Martin Corporation System and method for converting data into a noise-like waveform
US20040101315A1 (en) * 2002-11-25 2004-05-27 Sung-Kee Kim Duobinary optical transmission apparatus
US20050024253A1 (en) * 2003-07-30 2005-02-03 Adamiecki Andrew L. Duobinary-to-binary signal converter
US20050122954A1 (en) * 2003-12-04 2005-06-09 Adamiecki Andrew L. Electrical backplane transmission using duobinary signaling
US20060215791A1 (en) * 2002-06-24 2006-09-28 Carsten Noeske Apparatus and method and decoding biphase signals

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3337864A (en) * 1963-08-01 1967-08-22 Automatic Elect Lab Duobinary conversion, reconversion and error detection
US3343125A (en) * 1964-02-13 1967-09-19 Automatic Elect Lab Apparatus for detecting errors in a polylevel coded waveform
US3418631A (en) * 1965-06-04 1968-12-24 Bell Telephone Labor Inc Error detection in paired selected ternary code trains
US3461426A (en) * 1966-04-20 1969-08-12 Lenkurt Electric Co Inc Error detection for modified duobinary systems

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3337864A (en) * 1963-08-01 1967-08-22 Automatic Elect Lab Duobinary conversion, reconversion and error detection
US3343125A (en) * 1964-02-13 1967-09-19 Automatic Elect Lab Apparatus for detecting errors in a polylevel coded waveform
US3418631A (en) * 1965-06-04 1968-12-24 Bell Telephone Labor Inc Error detection in paired selected ternary code trains
US3461426A (en) * 1966-04-20 1969-08-12 Lenkurt Electric Co Inc Error detection for modified duobinary systems

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0044555A1 (fr) * 1980-07-22 1982-01-27 Siemens Aktiengesellschaft Régénérateur comportant un vérificateur de violation de la règle du code
EP0044554A1 (fr) * 1980-07-22 1982-01-27 Siemens Aktiengesellschaft Dispositif de surveillance pour un régénérateur MIC comportant un vérificateur de violation de la règle du code
US4441185A (en) * 1980-07-22 1984-04-03 Siemens Aktiengesellschaft Monitoring method and device for a PCM regenerator having a code rule violation checking device
US4472813A (en) * 1981-03-30 1984-09-18 Nippon Electric Co., Ltd. Transmission system for intentionally violating a class IV partial response code to distinguish subsidiary signals from an error
US4468787A (en) * 1981-11-09 1984-08-28 Lear Siegler, Inc. Ternary data transmission system
US4545055A (en) * 1983-07-20 1985-10-01 Loral Corporation Error analyzer for data communicated by bus protocol
FR2556906A1 (fr) * 1983-12-20 1985-06-21 Italtel Spa Disposition de circuit capable de relever le taux d'erreur dans les systemes de transmission de type numerique
US4807231A (en) * 1986-03-08 1989-02-21 Honda Giken Kogyo Kabushiki Kaisha Multiplex communication method
US4750179A (en) * 1986-05-02 1988-06-07 Lynch Communications Systems, Inc. Selective prevention of bipolar violation detection
US5504761A (en) * 1993-09-17 1996-04-02 Fujitsu Limited Apparatus for detecting error in a communications line
US5832033A (en) * 1995-01-27 1998-11-03 Nec Corporation Clock disturbance detection based on ratio of main clock and subclock periods
US6741636B1 (en) 2000-06-27 2004-05-25 Lockheed Martin Corporation System and method for converting data into a noise-like waveform
US20020196872A1 (en) * 2001-06-23 2002-12-26 Carsten Noeske Apparatus and method for decoding biphase signals
US7095807B2 (en) * 2001-06-23 2006-08-22 Micronas Gmbh Method for decoding biphase signals
US20060215791A1 (en) * 2002-06-24 2006-09-28 Carsten Noeske Apparatus and method and decoding biphase signals
US7292655B2 (en) 2002-06-24 2007-11-06 Micronas Gmbh Apparatus and method and decoding biphase signals
US20040101315A1 (en) * 2002-11-25 2004-05-27 Sung-Kee Kim Duobinary optical transmission apparatus
US20050024253A1 (en) * 2003-07-30 2005-02-03 Adamiecki Andrew L. Duobinary-to-binary signal converter
US20050122954A1 (en) * 2003-12-04 2005-06-09 Adamiecki Andrew L. Electrical backplane transmission using duobinary signaling
US7508882B2 (en) 2003-12-04 2009-03-24 Alcatel-Lucent Usa Inc. Electrical backplane transmission using duobinary signaling

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