US9632164B2 - Methods and systems for accuracy improvement in current comparators - Google Patents

Methods and systems for accuracy improvement in current comparators Download PDF

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US9632164B2
US9632164B2 US14/320,741 US201414320741A US9632164B2 US 9632164 B2 US9632164 B2 US 9632164B2 US 201414320741 A US201414320741 A US 201414320741A US 9632164 B2 US9632164 B2 US 9632164B2
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current
comparator
winding
bridge
current comparator
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US20150008899A1 (en
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Mark Evans
Tomasz Barczyk
Iain Page
Kenneth Mikolajek
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Guildline Instruments Ltd
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Guildline Instruments Ltd
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Priority to US15/454,736 priority patent/US10151777B2/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/10—AC or DC measuring bridges
    • G01R17/105—AC or DC measuring bridges for measuring impedance or resistance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
    • G01R15/183—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers using transformers with a magnetic core
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating

Definitions

  • Alternating Current (AC) and Direct Current (DC) electrical measurements are used in a wide variety of applications and may be performed for a variety of electrical quantities including voltage, current, capacitance, impedance, resistance etc. These tests and measurements include those relating to designing, evaluating, maintaining and servicing electrical circuits and equipment from high voltage electrical transmission lines operating at hundreds of kiloVolts (kV) and kiloAmps (kA) to industrial/medical/residential electrical and lighting, typically 400V/240V/100V and 30/15 A, to a wide variety of industrial/scientific/medical/consumer electrical and electronic devices.
  • kV kiloVolts
  • kA kiloAmps
  • comparator bridges e.g. AC comparator bridges and DC comparator bridges
  • Such bridge configurations remove many of the issues associated with achieving making measurements at accuracies of a part, or few parts, per million such as insensitivity to lead resistances, excellent ratio linearity, excellent ratio stability, and a high level of resolution.
  • DCC bridges for example, have replaced resistance ratio instruments such as the Wenner and Kelvin bridges for resistance measurements.
  • comparator implementations provide accuracies within the range of 0.1 ppm to 1.0 ppm.
  • FIG. 1 depicts a direct current comparator bridge according to the prior art as employed by National Institute of Standards and Technology;
  • FIG. 2 depicts a block diagram of an automatic micro-processor controlled measurement system comprising a current comparator bridge with a directly slaved extender;
  • FIG. 3 depicts a block diagram of an automatic micro-processor controlled measurement system comprising a current comparator bridge with a directly slaved extender and high current extenders;
  • FIG. 4 depicts a block diagram of an automatic micro-processor controlled measurement system comprising a current comparator bridge with a directly slaved extender and high current extenders;
  • FIG. 5 depicts a block diagram of an automatic micro-processor controlled measurement system current comparator bridge according to an embodiment of the invention
  • FIG. 6B depicts alternate circuit sections for the current comparator bridge of FIG. 6A according to embodiments of the invention
  • FIG. 8A depicts a block diagram of an automatic micro-processor controlled measurement system according to an embodiment of the invention comprising a current comparator bridge with a directly slaved extender and high current extenders exploiting dedicated degaussing current sources;
  • FIG. 8B depicts a block diagram of an automatic micro-processor controlled measurement system according to an embodiment of the invention comprising a current comparator bridge with a directly slaved extender and high current extenders exploiting dedicated degaussing current sources;
  • FIG. 9 depicts a block diagram of an automatic micro-processor controlled measurement system according to an embodiment of the invention comprising a current comparator bridge with a directly slaved extender and high current extenders exploiting dedicated degaussing current sources within the current comparator bridge and high current extender;
  • FIG. 10 depicts a block diagram of an automatic micro-processor controlled measurement system according to an embodiment of the invention comprising a current comparator bridge with a directly slaved extender exploiting a dedicated degaussing current source with fourth winding for the current comparator bridge;
  • FIG. 11 depicts an exemplary flowchart for an automatic micro-processor controlled measurement system according to an embodiment of the invention comprising degaussing current sources;
  • FIG. 12 depicts an exemplary construction of a current comparator according to an embodiment of the invention.
  • FIGS. 13A and 13B depict an exemplary construction of a current comparator with magnetic shield and shield degaussing winding according to an embodiment of the invention
  • FIG. 14 depicts a block diagram of an automatic micro-processor controlled measurement system according to an embodiment of the invention comprising a current comparator bridge with magnetic shield and shield degaussing winding such as depicted in FIGS. 13A and 13B .
  • the present invention is directed to electrical measurement and calibration systems and more particularly to current comparator based measurement and calibration systems with parts per billion accuracy.
  • the instruments are described as being resistance measurement systems.
  • the embodiments of the invention may be applied to other measurement systems exploiting current comparators as part of the measurement system and/or as the basis of the actual measurement.
  • Equation (1) the line integral of the magnetic field H around a closed path dl is equal to the total current I crossing any surface bounded by this path.
  • the total current is carried by two ratio windings, Primary Winding 110 and Secondary Winding 120 , and the total number of ampere-turns of one winding is equal and opposite to that of the other winding such that Equation (2) is satisfied where the subscripts P and S refer to the Primary and Secondary Windings 110 and 120 , respectively.
  • H ⁇ dl ⁇ I (1)
  • the current ratio of the comparator, I P /I S is therefore equal to the inverse of the turns ratio, N S /N P .
  • the ampere-turn balance or zero flux condition is determined by some type of flux detector system that is only sensitive to the mutual fluxes generated by the ratio windings.
  • a DCC achieves good ratio accuracy and sensitivity by utilizing high-permeability toroidal cores, magnetic and eddy-current shields, and careful winding procedures.
  • the main component of a DCC consists of a pair of high-permeability cores, surrounded by a magnetic shield, over which are the ratio windings that carry the direct currents to be compared.
  • Cryogenic current comparators are similar in concept, but make use of the ideal magnetic shielding properties of a self-enclosing, but non-continuous, surface made of superconducting material.
  • the currents for the ratio windings are supplied by two isolated direct current sources, such as Constant Current Source 170 and Slave Current Source 180 .
  • the cores and within the magnetic shield of the DCC is wound a Modulation-Detection Winding 130 which is used to sense the flux condition of the cores. This is achieved by modulating the core permeability through the Modulation-Detection Winding 130 with a Modulator Oscillator 190 and using a Second Harmonic Detector (SHD) Circuit 195 .
  • SHD Second Harmonic Detector
  • the presence of dc flux in the cores due to primary and secondary ampere-turn imbalance is indicated by this detector output both in magnitude and polarity.
  • the SHD Circuit 195 output is used in a feedback circuit to adjust the current in one of the windings, automatically maintaining ampere-turn balance.
  • This basic self-balancing DCC resistance bridge in FIG. 1 requires two simultaneous balances, an ampere-turn balance and a voltage balance.
  • the Slave Current Source 180 is continuously adjusted so that ampere-turn balance is maintained. Under this condition, the ampere-turn product of the primary circuit equals that of the secondary circuit, as given by Equation (3).
  • N P I P N S I S (3)
  • Equation (4) applies and using Equation (3) we obtain Equation (5) for the unknown resistor R X′ 160 .
  • R X I P R D I S (4)
  • R X ( N P /N S ) R D (5)
  • R S ( N P ′ / N S ) ⁇ R D ( 6 )
  • R X ( 1 + ⁇ ⁇ ⁇ N P N P ′ ) ⁇ R S ( 7 )
  • a Resistance Measurement System (RMS) 200 makes use of a low Current Comparator (CC) Bridge 202 and an Intermediate Current Range (ICR) Extender 204 .
  • the CC Bridge 202 generates a bi-polar current as directed by microcontroller 206 .
  • Microcontroller 206 controls Amplifier 208 , which is used to amplify a signal.
  • the Amplifier 208 is preferably a servo current tracking amplifier which can produce an output current in the range of 0 mA to ⁇ 150 mA.
  • the microcontroller 206 also connects to digital to analog converter (DAC) 210 which also provides an output in the range of 0 mA to ⁇ 150 mA.
  • DAC digital to analog converter
  • the second input to amplifier 208 is connected to the winding of Comparator 212 of the bridge.
  • the 0 mA to ⁇ 150 mA output of the amplifier 208 is also connected to the winding of Comparator 212 before it is connected to the reference resistance (P REF ) 214 .
  • a winding of Comparator 212 is also connected to a switch 218 . In one position, switch 218 will provide a connection to ground that feeds to the ICR Extender 204 . In the second position, it will connect a test resistance (P TEST ) 216 to allow the bridge to test the resistance with a low current of 0- ⁇ 150 mA.
  • the ICR Extender 204 extends the current test range of CC Bridge 202 in the RMS 200 . It connects to the CC Bridge 202 to receive both control information and an input current. Its output is connected to P TEST 216 to provide an intermediate level current.
  • the intermediate current level is a current range of 0 mA to ⁇ 3 A due to the use of a 20 ⁇ amplifier.
  • a different output current can be obtained by using a different amplifier stage.
  • the ICR Extender 204 includes a bipolar DC current amplifier 120 with a range of 0 to ⁇ 3 Amperes (or higher in other embodiments) directly coupled to the high current primary winding of the integrated ICR Current Comparator 222 and a servo amplifier 224 that provides sufficient lower level current through the secondary winding of the ICR Current Comparator 222 to balance the ICR Current Comparator 222 under all operating conditions.
  • the output of the primary winding is connected to P TEST 216 and the output of servo 224 through the extender secondary winding is connected back to the automated resistance CC Bridge 202 and as such the CC Bridge 202 can maintain balance within the bridge current Comparator 212 .
  • the output of the DAC 210 in CC Bridge 202 is the primary input to the ICR Extender 204 .
  • This output is a signal between 0 mA to ⁇ 150 mA which is provided to a directly coupled bi-polar current amplifier 220 .
  • the use of the bipolar amplifier 220 allows the obviation of mechanical switches that are required in the prior art.
  • the manner in which the ICR Extender 204 connects to the CC Bridge 202 allows the overall system to remain balanced, which is a factor in why the prior art maintained its reliance on the mechanical switches.
  • the output of bi-polar amplifier 220 is passed through the primary winding of ICR Current Comparator 222 , and is then provided as an output to the Extender 204 through P Test 216 .
  • ICR Current Comparator 222 Another winding on ICR Current Comparator 222 is used as the input to servo tracking amplifier 224 , whose output is passed through a third winding on ICR Current Comparator 222 .
  • This signal (the output of amplifier 224 ) is transmitted back to the CC Bridge 202 which connects the signal to the switch 218 .
  • switch 218 When in the first position, switch 218 connects this output to ground to balance the measurement system.
  • switch 218 connects the output of the DAC 210 to P TEST 216 , thus providing a current of 0 mA to ⁇ 150 mA to P TEST 216 , as opposed to the output of 0 mA to ⁇ 3 A provided by the output of Extender 204 .
  • This configuration allows the resistance measurement RMS 200 to perform resistance measurements at much higher currents than the CC Bridge 202 would be able to as a result of its limitation of 0 mA to ⁇ 150 mA.
  • This increase in the output makes use of the cascaded configuration.
  • the accuracy of the measurement is dependent mainly on the accuracy of the current comparison within the comparators 212 and 222 .
  • the base configuration can be integrated directly within the main assembly of the low level current comparator resistance measurement CC Bridge 202 such that no manual connections are required with the exception of connections to the test resistance P TEST to be measured.
  • the utilization of the bipolar directly coupled DC current amplifier 220 eliminates the requirement for reversing relays, external current supplies and the resulting complexity of interconnections.
  • a voltmeter to measure the potential drop across the test resistance 216 and reference resistance 214 can be performed as used in the prior art. However, as discussed above, for an accurate reading, the difference in the voltage drops across the test resistance 216 and the reference resistance 214 is driven towards zero, and the comparators 212 and 222 are employed to determine the current ratio directed to the two resistances. Knowing this ratio and the winding ratio of the comparators 212 and 222 allows the RMS 200 to determine the unknown resistance of P TEST 216 to a high degree of accuracy. It would be evident to one skilled in the art that the CC Bridge 202 may be operated discretely without the ICR Extender 204 .
  • FIG. 3 An Augmented Resistance Measurement System (ARMS) 300 is illustrated in FIG. 3 .
  • the ARMS 300 builds upon the configuration illustrated in FIG. 2 with the addition of a high Current Comparator (CC) Extender 232 .
  • the CC Extender 232 includes a High Current Comparator 236 that is connected to a modular bipolar directly coupled high current amplifier 234 , a servo amplifier 238 , and the output of amplifier 220 .
  • the bipolar high current amplifier 234 is directly coupled through the primary winding side of the High Current Comparator 236 to the resistance device P TEST 216 and can include multiple modules such that full scale currents up to ⁇ 3000 Amperes or higher may be attained, preferably in multiples of ⁇ 150 A in the present embodiment.
  • Servo amplifier 238 receives its input from High Current Comparator 236 , and its output is connected back into the input of the intermediate level Extender 204 and is fed to that stage's bipolar current amplifier 220 .
  • the output of intermediate current amplifier 220 is coupled through the primary winding of the intermediate level ICR Current Comparator 222 and also through the secondary winding of the High Current Comparator 236 such that both the intermediate ICR Current Comparator 222 and the High Current Comparator 236 can maintain current balance under all operating conditions.
  • the configuration is completed with the direct coupling of the output of the servo amplifier 224 of the intermediate level current Extender 204 through the secondary winding of the ICR Current Comparator 222 and the current Comparator 212 of the CC Bridge 202 as described in relation to the embodiment of FIG.
  • the CC Bridge 202 and Extender 204 of the ARMS 300 are configured largely as they were in RMS 200 of FIG. 2 .
  • One notable difference is that the input to Extender 204 is routed through High Current CC Extender 232 which in turn is connected to CC Bridge 202 .
  • the input to Extender 204 is still the output of CC Bridge 202 , it is not a direct connection.
  • the output of DAC 210 which in this exemplary embodiment is a signal of 0- ⁇ 150 mA, is provided to high current bipolar amplifiers 234 .
  • These amplifiers are preferably parallel amplifiers that allow, in the illustrated embodiment, an amplification of up to 20,000 ⁇ , allowing for an output signal ranging from 0 mA to ⁇ 3000 A.
  • This output signal is passed through the primary windings of High Current Comparator 236 and then provided as an external output of the stage to P TEST 216 .
  • a Servo Current Tracking Amp 238 receives input from the High Current Comparator 236 and provides its output signal, of 0 mA to ⁇ 150 mA to the input of the Extender 204 , which provides the input signal to amplifier 220 .
  • the resulting 0 mA to ⁇ 3 A signal is passed through the primary winding of ICR Current Comparator 222 , and then through the secondary winding of High Current Comparator 236 .
  • the ICR Current Comparator 222 of the Extender 204 is connected back to the CC Bridge 202 through servo tracking amplifier 224 as was described in FIG. 2 .
  • the amplifier 234 is a modular amplifier that can be built as ⁇ 150 A modules connected in parallel to allow for an output of ⁇ 3000 A. This allows the test resistance to be supplied a reliable bipolar current of 0 mA to ⁇ 3000 A which is typically sufficient in most instances to create a potential drop across the resistances that can be measured accurately by the CC Bridge 202 .
  • the known current ratios can then be used to determine the unknown resistance.
  • One skilled in the art will appreciate that other factors can be determined by knowing the current ratios.
  • Electronically Reconfigurable ARMS (ERARMS) 400 comprises the CC Bridge 202 and ICR Extender 204 together with the CC Extender 232 as discussed supra in respect of FIG. 3 .
  • the ERARMS 300 may provide three output current ranges to the Test Resistance 406 based upon the configuration of the first to fourth configuration switches 401 through 404 respectively.
  • the output of the DAC 210 is routed by switch 218 to the bridge output CIA of the Bridge 202 .
  • the output of the DAC 110 is routed to the amplifier 220 within the ICR Extender 204 and thereby to the extender output C 1 B of the ICR Extender 204 .
  • the output of the DAC 110 is routed to the high current bipolar amplifiers 234 within the CC Extender 232 and therein to the high current extender output C 1 C. Coupling these three outputs to the fourth configuration switch 404 allows the selected current range to be coupled to the Test Resistance 406 .
  • the other side of the Test Resistance 406 being coupled to bridge input port C 2 A of Bridge 202 and extender input port C 1 B of CC Extender 232 .
  • First and second configuration switches 401 and 402 manage the routing of the output of the DAC 210 to the ICR Extender 204 and High Current Extender in the second and third configurations and the routing of the Servo Current Tracking Amp 138 to the input of amplifier 220 in the third configuration.
  • Third configuration switch 403 manages routing of the output port of the amplifier 220 between the fourth configuration switch 404 and High Current Comparator 236 in the second and third configurations respectively.
  • the re-configurable system 300 provides multiple programmable output ranges such as the ⁇ 150 mA, ⁇ 3 A, or ⁇ 3000 A discussed above provided by exemplary embodiments of the Bridge 102 , ICR Extender 204 , and CC Extender 232 . It would be evident to one skilled in the art that the re-configurable system 300 may be implemented in a modular manner such as for example by providing Bridge 202 , ICR Extender 204 , and CC Extender 232 as discrete units together with first to fourth configuration switches 401 through 404 .
  • first to third configuration switches 401 and 404 relate to interconnections and input/outputs of ICR Extender 204 and CC Extender 232 these may be provided within a single module with the CC Extender 232 . It would also be evident that the CC Extender 232 which within the embodiments above provides multiplication of the output of the DAC 210 may be similarly implemented in modular format either through multiple amplifier stages with single comparator stage or multiple High Current Extenders 232 with appropriate switching elements. It would be further evident that the fourth configuration switch 404 may alternatively be a 1:4, 1:5, 1:6, of 1:N switch rather than the 1:3 switch depicted.
  • CC Extender 232 in FIGS. 2 and 3 is depicted as being implemented with multiple high current bipolar amplifiers 234 . Accordingly CC Extender 232 may provide multiple output current ranges with the provision of additional primary windings with appropriate switching elements to provide more output current options. Alternatively it would be evident to one skilled in the art that the multiple high current bipolar amplifiers 234 may be similarly switchably engaged thereby providing additional output current ranges for the resistance measurement systems described above in respect of FIGS. 2 through 4 . It would also be evident that alternatively multiple High Current Extenders 232 may be employed with different gain factors and maximum output current range to provide a modular approach to currents of ⁇ 3000 A or higher.
  • RMS 200 ARMS 300 and ERARMS 400 provide measurement capabilities over a wide range of resistances, currents, and voltages.
  • such systems can measure resistances as low as 1 ⁇ at 300 A all the way through to 1 G ⁇ at 1 kV and others operating at 10,000 A.
  • DC current comparator based measurement systems there are a corresponding parallel set of AC current comparator based measurement systems.
  • evolving measurement requirements have shifted the error in such measurements from a few parts per million to tens or hundreds of part per billion and as a result error sources that were previously minor but known factors or unknown factors become important and require correction in order to reduce or remove these error sources. Accordingly, the behaviour of the toroidal current transformer at parts per billion becomes important.
  • test resistor 216 or test resistance 406 is cycled through a range of operational voltages and currents generated by DAC 210 under control of the Microcontroller 206 .
  • interruption of the testing e.g. turning off the system, disconnecting power supply, disconnecting device under test, etc may leave remanent flux within the core of one or more of the current comparators within the test and measurement system (TMS).
  • Such remanence magnetization being more likely when such an interruption occurs at high current and/or voltage but it may also arise as a result of anhysteretic remanence or anhysteretic remanent magnetization (ARM) which arises when the magnetic core of the current comparator toroidal transformers is exposed to a large alternating field with a small DC bias field. It would be evident that where a large alternating field of ⁇ 1 kV is applied then a DC bias field of 1 mV is equivalent to 100 ppb and 10 ⁇ V equivalent to 10 ppb.
  • ARM anhysteretic remanence or anhysteretic remanent magnetization
  • the remanent magnetization within the transformer core of the current comparator may depend upon many factors including magnitude of the primary current, impedance of the secondary circuit, and the amplitude and time constant of an offset transients. Accordingly, when the current transformer is next energized the flux changes will start from the remanent value and not zero as expected. Accordingly, in order to remove such remanent magnetization it is necessary to degauss the magnetic core of the toroidal transformers within the AC and DC comparators. However, in contrast to prior art transformers wherein degaussing is undertaken in conjunction with primary and secondary windings or current sensors with a sole primary winding the degaussing of AC and DC current comparators requires consideration of the primary, secondary, and tertiary windings.
  • AC/DC comparators are magnetically shielded to reduce the susceptibility of the current comparator to external magnetic fields but that these magnetic shields may themselves become partially magnetized through operation of the AC/DC transformer especially at high currents.
  • DRMS 510 comprises microcontroller 206 in communication with the primary and secondary current sources, namely Amplifier 208 and DAC 210 respectively, which are coupled permanently and switchably to Comparator 212 .
  • Switch 218 in RMS 200 is replaced by first and second switches 520 A and 520 B respectively.
  • First switch 520 A provides the same functionality of 1 ⁇ 2 to connect to ports 540 A and 540 B, corresponding to the output/input feeds of Extender 204 respectively.
  • Second switch 520 B is now a 1 ⁇ 3 switch rather than a 1 ⁇ 2 switch such that in addition to providing the original connections to test resistance (P TEST ) 216 and 500 F to ground it also provides a resistive connection to ground via second Load Resistor 530 B.
  • the Amplifier 208 is routed via third switch 520 C that connects to reference resistance (P REF ) 214 or via first Load Resistor 530 A to ground.
  • Amplifier 208 and DAC 210 are coupled to ground via the primary and secondary windings of Comparator 212 and first and second Load Resistors 530 A and 530 B respectively.
  • Amplifier 208 and DAC 210 as depicted in magnetic field graph 500 B and current profile 500 C the maximum current delivered is ⁇ I SATURATE rather than the operational limits ⁇ I OP MAX .
  • Test Cycle 540 as depicted in current profile 500 C cycles the current according to a predetermined profile, e.g. between ⁇ I OP MAX or lower values as established by the Microcontroller 206 according to the Test Resistor (P TEST ) 216 being tested.
  • Degauss Cycle 550 the Microcontroller now drives the Amplifier 208 and DAC 210 to a current past the saturation current, ⁇ I SATURATE , and then cycles down to no current through a number, N, of cycles, C X , for a total period of time, T. Whilst all N cycles may be of equal duration it would be evident that each cycle C X may be of different duration. Similarly, the amplitude of each cycle may follow a predetermined mathematical relationship, e.g. exponential, linear or may be arbitrarily defined. For example, the Degauss Cycle 550 may start with a number of cycles that meet or exceed the saturation current ⁇ I SATURATE before reducing over a number of cycles that decrease linearly. Accordingly. Degauss Cycle 550 cycles the magnetic materials within the Comparator 212 to magnetic field saturation, reverses the saturation, and then cycles the magnetic field through a series of field reversals with reducing magnitude until the field is null.
  • each of the Amplifier 208 and DAC 210 are implemented to provide at least ⁇ I SATURATE which is in excess of the maximum operating current ⁇ I OP MAX .
  • the primary and secondary of Comparator 212 are coupled to the Amplifier 208 and DAC 210 respectively at one end of each and to ground via first and second Load Resistors P LOAD 530 A and 530 B respectively, for example 1 ⁇ resistors although other values may employed as determined by characteristics of one or more of the Comparator 212 , DAC 210 , and Amplifier 208 for example. It would be apparent that first and second Load Resistors P LOAD 530 A and 530 B respectively do not need to be accurate but rather may be nominally the target resistance.
  • FIG. 6A there is depicted a De-Gaussing Resistance Measurement System (DRMS) 600 A according to an embodiment of the invention similarly based upon the architecture of RMS 200 described supra in respect of FIG. 2 based upon CC Bridge 202 as was DRMS 510 in FIG. 5 .
  • DRMS De-Gaussing Resistance Measurement System
  • the first and second Load Resistors 630 and 640 are disposed within the circuit between the Comparator 212 and the Amplifier 208 and DAC 210 respectively.
  • first switch 620 A still selects between DAC 210 which is also coupled to port 540 A or port 540 B to the secondary of Comparator 212 .
  • a first Circuit Section 600 B is shown depicting part of the secondary circuit path from DAC 210 through Comparator 212 to test resistor P TEST 216 .
  • the DRMS switches to ground via additional Load Resistor 650 .
  • additional Load Resistor may be applied to the primary side of the Comparator 212 such that each of the primary and secondary sides of Comparator 212 have Load Resistors in series when the DRMS of which first Circuit Section 600 B forms part. Also depicted in FIG.
  • FIG. 6B is second Circuit Section 600 C depicts an alternative embodiment according to the invention wherein the DAC 610 is employed to drive both the primary and secondary sides of the Comparator 212 .
  • first switch 620 now couples to sixth switch 620 F to select either the primary or secondary side of the Comparator 212 and fourth switch 620 D is replaced with seventh switch 620 G to either couple DAC 210 via first load resistor 630 to the primary side in degauss mode or couple Amplifier 208 directly to the primary side.
  • the DAC 210 may be executed once on the primary side and once on the secondary or one only in one degauss step and then the other in a later degauss step.
  • the secondary may be grounded via second load resistor 640 rather than floating as depicted in second Circuit Section 600 C through the addition of additional elements or modification of fifth switch 620 E.
  • FIG. 7 there is depicted a schematic of a De-Gaussing Resistance Measurement System (DRMS) 700 according to an embodiment of the invention similarly based upon the architecture of RMS 200 described supra in respect of FIG. 2 based upon CC Bridge 202 as were DRMS 510 and 600 A in FIGS. 5 and 6 respectively.
  • DRMS De-Gaussing Resistance Measurement System
  • Microcontroller 206 is now connected to first and second Degauss Current Sources 730 A and 730 B as well as Amplifier 208 and DAC 210 .
  • First Degauss Current Source 730 A is switchably connected to the primary of Comparator 212 by first switch 720 A whilst the other end of the primary of Comparator 212 is connected to either the Reference Resistor 214 or ground by third Switch 720 C.
  • Second Degauss Current Source 730 B is switchably connected to the secondary of Comparator 212 by second switch 720 B whilst the other end of the secondary of Comparator 212 is connected to either the Test Resistor 216 or ground by fourth Switch 720 D. Accordingly, first and second Degauss Current Sources 730 A and 730 B, which include Load Resistors, are driven during the Degauss Cycle whilst Amplifier 208 and DAC 210 are driven during the measurement cycle.
  • first and second Degauss Current Sources 730 A and 730 B may be lower accuracy, but higher current, sources than Amplifier 208 and DAC 210 .
  • First and second Degauss Current Sources 730 A and 730 B may be programmable via the Microcontroller 206 providing flexibility in current versus time, such as described supra with multiple cycles alternating to ⁇ I SATURATE followed by a series of cycles with reducing peak current until the cycles collapse to zero.
  • first and second Degauss Current Sources 730 A and 730 B may also be resonant circuits providing decaying oscillatory behaviour established in dependence upon, for example, capacitance, inductance, and resistance parameters of elements which may be fixed or variable under Microcontroller 206 control.
  • FIG. 8A there is depicted an Electronically Reconfigurable ARMS (ERARMS) 800 according to an embodiment of the invention comprising De-Gaussing Resistance Measurement System (DRMS) 700 together with ICR Extender 204 and CC Extender 232 such as discussed supra in respect of FIGS. 3 and 4 respectively.
  • DRMS 700 may execute a degaussing cycle for Comparator 212 within DRMS 700 as discussed supra whilst providing, through the configuration switches 401 through 404 which are controlled through the Microcontroller 206 or another controller, not shown for clarity, together with the switches internally to the DRMS 700 , multiple programmable output ranges such as ⁇ 150 mA, ⁇ 3 A, and ⁇ 3000 A for example.
  • FIG. 8B there is depicted an ERARMS 8000 employing a Modified DRMS 7000 together with first Switch 810 which replaces fourth switch 404 in ERARMS 800 .
  • Modified DRMS 7000 replaces second switch 720 B with second and third Switches 820 and 830 respectively.
  • Second Switch 830 provides for selective coupling of the DAC 210 or second Degauss Current Source 730 B to first port 540 A.
  • first Switch 820 selectively couples either the output of second Switch 830 or second port 540 B to the secondary of Comparator 212 .
  • First Switch 810 provides the same 3 ⁇ 1 switching connectivity as fourth switch 404 but now also provides 1 ⁇ 2 switching to either Test Resistance 406 or ground.
  • second Degauss Current Source 730 B can be coupled to first port 540 A and thereafter to either ICR Extender 204 or CC Extender 232 with the other end of the ICR Current Comparator 222 or High Current Comparator 236 respectively coupled to ground through First Switch 810 . Accordingly, each of the magnetic cores with the ICR Current Comparator 222 and High Current Comparator 236 may be degaussed through second Degauss Current Source 730 B being executed through a current profile, e.g. Degauss Cycle 550 as discussed in respect of FIG. 5 , under control of Microcontroller 206 , or another controller not shown for clarity.
  • a current profile e.g. Degauss Cycle 550 as discussed in respect of FIG. 5
  • Microcontroller 206 or another controller not shown for clarity.
  • the current profile executed by second Degauss Current Source 730 B may be different for each of the Comparator 212 , ICR Current Comparator 222 , and High Current Comparator 236 according to one of more factors including, but not limited to, the characteristics of their magnetic core, the history of the comparator since last degaussing, and the current required to saturate relative to the gain provided or normal operating current.
  • the timing of degaussing for each of Comparator 212 , ICR Current Comparator 222 , and High Current Comparator 236 may be varied such as discussed below in respect of FIG. 11 .
  • FIG. 9 there is depicted an ERARMS 900 according to an embodiment of the invention wherein ERARMS 900 comprises Modified DRMS 7000 , such as described supra in respect of FIG. 8B , ICR Extender 204 , and High Current (HC) Extender 900 A.
  • HC Extender 900 A provides the same functionality as CC Extender 232 , such as described supra in respect of FIG. 2 , through Bipolar High Current Amplifier 234 , High Current (HC) Comparator 236 , and Servo Amplifier 238 but is augmented with an internal degaussing function through Integral Degauss High Current Source (IDHCS) 905 .
  • IDHCS Integral Degauss High Current Source
  • IDHCS 905 may be switchably connected to either the primary and secondary windings of the HC Comparator 236 through appropriate control of first to fifth switches 915 to 935 respectively which HC 900 A may be disconnected from ERARM 900 through sixth switch 910 . Accordingly, degaussing of the comparators within Modified DRMS 7000 and ICR Extender 204 may be undertaken using the integral degauss current sources within the DRMS 7000 whilst degaussing of HC Comparator 236 is undertaken with IDHCS 905 within HC Extender 900 A. As depicted IDHCS 905 includes the current source and load resistance although optionally multiple load resistance may be disposed after the primary and second windings and be switched into the circuit when the third and fifth switches 925 and 935 respectively switch the appropriate winding to ground.
  • HC Extender 900 A may include a pair of IDHCS 905 to simultaneously drive the primary and secondary windings of HC Comparator 236 .
  • IDHC 905 may within a degaussing cycle only be driven through one of the primary and secondary windings of HC Comparator 236 and the functionality reduced with respect to the other winding or within one degaussing cycle the primary is employed followed by the secondary within a subsequent degaussing cycle.
  • ICR Extender 204 may be integrated within ICR Extender 204 such that each stage of the ERARM 900 may be degaussed simultaneously as opposed to sequentially or in different sequences.
  • RMS Resistance Measurement System
  • ICR Intermediate Current Range
  • FIG. 10 there is depicted a Resistance Measurement System (RMS) 1000 which makes use of a low Current Comparator Bridge 1010 and an Intermediate Current Range (ICR) Extender 204 .
  • low Current Comparator Bridge 1010 has a similar construction to CC Bridge 202 described supra in respect of FIG. 5 in that the primary and secondary windings are connected to Amplifier 208 and DAC 210 /second Port 540 B.
  • a fourth winding 1012 D which is coupled to Degauss Current Source 1060 via Load Resistor 1040 .
  • FIG. 11 there is depicted an exemplary flowchart 1100 for a controller within a measurement system exploiting one or more degaussing circuits such as described supra in respect of FIGS. 5 through 10 for example.
  • the process begins with Instrument Power Up 1105 wherein the measuring instrument is either connected to mains power and turned on or if handheld or remote and being operated from a battery simply turned on.
  • the process checks in step 1110 whether Auto-Degauss has been enabled wherein a positive determination results in the process proceeding to step 1115 wherein a Power-Up Degauss Sequence is executed such that, for example all compensators within the instrument are cycled to reduce residual magnetization and the process proceeds to step 1120 wherein the instrument performs the first measurement.
  • a Measurement Protocol is selected. This selection may be automatically determined by the controller in dependence upon the test to be performed or alternatively may be established as a factory default or selected by a user of the Instrument. Based upon the selection the process flow proceeds to one of three Sub-Flows 1100 A to 1100 C respectively. Optionally, only one, two, or all may be implemented within the Instrument as well as others not described within respect of FIG. 11 . Additional Sub-Flows may be added to the Instrument through one or more interfaces such as USB, memory card, wireless, and Wi-Fi for example. For simplicity, the measurement steps in each of first to third Sub-Flows 1100 A to 1100 C respectively have been omitted but it would be evident to one skilled in the art where these would be inserted into the Sub-Flows.
  • First Sub-Flow 1100 A a simple sub-flow, begins with step 1140 wherein all current comparators within the Instrument are degaussed before the measurement and afterwards in step 1145 A the process determines whether another measurement will be made. If yes then the process returns to step 1130 otherwise the first Sub-Flow 1100 A proceeds to step 1150 A degausses all current comparator stages and stops in step 1155 A.
  • Second Sub-Flow 1100 B begins with step 1160 A wherein the measurement to be performed is configured upon the instrument. Next in step 1165 those current comparators to be employed within the measurement are degaussed before the process in step 1145 B determines whether another measurement will be made. If yes then the process returns to step 1130 otherwise the second Sub-Flow 1100 B proceeds to step 1150 B degausses all current comparator stages and stops in step 1155 B
  • step 1160 B the measurement to be performed is configured upon the instrument.
  • step 1165 a determination is made as to whether the measurement to be performed exceeds a predetermined threshold. If yes the process proceeds to step 1170 wherein all current comparator stages are degaussed and if not the process proceeds to step 1175 . After step 1170 the process proceeds to step 1145 C to determine whether another measurement is to be performed or not. If yes the process proceeds back to step 1130 otherwise it proceeds to step 1150 C, degausses all current comparator stages, and then stops in step 1155 C.
  • step 1165 the measurement to be performed do not exceed the predetermined threshold then the process proceeds to step 1175 wherein a determination is made as to whether the cumulative measurements since a last degauss process was executed have exceeded a predetermined threshold. If yes the process proceeds to step 1150 C wherein all stages are degaussed and then step 1145 C and if not the process proceeds directly to step 1145 C.
  • cumulative thresholds for step 1175 may be 25 mA, 500 mA, and 20 A as well such that:
  • FIG. 12 there is depicted a Current Comparator (CC) 1200 according to an embodiment of the invention showing the CC 1200 sequentially stripped from the outermost layer towards the magnetic core 1210 .
  • the CC 1210 comprises a magnetic core 1210 over which is wrapped first tape layer 1230 A separating the first winding 1240 A from it.
  • Second tape layer 1230 B is then wrapped over first winding 1240 A upon which is then wrapped second winding 1240 B.
  • These layers are then over-wrapped with third tape layer 1230 C followed by third winding 1250 , fourth tape layer 1230 D, shielding 1260 , fifth tape layer 1230 E and fourth winding 1270 .
  • first winding 1240 A corresponds to the primary winding of the CC 1200
  • second winding 1240 B corresponds to the secondary winding of the CC 1200
  • third winding 1250 corresponds to comparator output, e.g. the winding on ICR Current Comparator 222 which provides the input to servo tracking amplifier 224 as depicted in FIG. 2
  • Fourth winding 1270 provides the winding for a dedicated degauss current source connection such as depicted supra in respect of FIG. 10 with fourth winding 1012 D.
  • FIG. 13A there is depicted a Current Comparator (CC) 1300 according to an embodiment of the invention showing the CC 1300 sequentially stripped from the outermost layer towards the magnetic core 1210 .
  • the CC 1210 comprises a magnetic core 1210 over which is wrapped first tape layer 1230 A separating the first winding 1240 A from it.
  • Second tape layer 1230 B is then wrapped over first winding 1240 A upon which is then wrapped second winding 1240 B.
  • These layers are then over-wrapped with third tape layer 1230 C followed by third winding 1250 , fourth tape layer 1230 D, shielding 1260 , and fifth tape layer 1230 E.
  • first winding 1240 A corresponds to the primary winding of the CC 1200
  • second winding 1240 B corresponds to the secondary winding of the CC 1200
  • third winding 1250 corresponds to comparator output, e.g. the winding on ICR Current Comparator 222 which provides the input to servo tracking amplifier 224 as depicted in FIG. 2
  • magnetic shield 1310 surrounding the CC 1300 upon which is wound shield degauss winding 1320 .
  • Perspective view 1350 shows a partial cross-section three-dimensional view of the CC 1300 showing square magnetic core 1210 with the magnetic shield 1310 surrounding upon which is wound Shield Degauss Winding 1320 . Also it is evident how the windings on CC 1300 pass through a portion of magnetic shield 1310 .
  • FIG. 14 there is depicted a DRMS 1410 incorporating magnetic shield 1310 around Comparator 1300 together with Shield Degauss Winding 1320 which is coupled to Degauss Current Source 1420 via Load Resistor 1430 .
  • Implementation of the techniques, blocks, steps and means described above may be done in various ways. For example, these techniques, blocks, steps and means may be implemented in hardware, software, or a combination thereof.
  • the processing units may be implemented within one or more application specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), processors, controllers, micro-controllers, microprocessors, other electronic units designed to perform the functions described above and/or a combination thereof.
  • ASICs application specific integrated circuits
  • DSPs digital signal processors
  • DSPDs digital signal processing devices
  • PLDs programmable logic devices
  • FPGAs field programmable gate arrays
  • processors controllers, micro-controllers, microprocessors, other electronic units designed to perform the functions described above and/or a combination thereof.
  • the embodiments may be described as a process which is depicted as a flowchart, a flow diagram, a data flow diagram, a structure diagram, or a block diagram. Although a flowchart may describe the operations as a sequential process, many of the operations can be performed in parallel or concurrently. In addition, the order of the operations may be rearranged.
  • a process is terminated when its operations are completed, but could have additional steps not included in the figure.
  • a process may correspond to a method, a function, a procedure, a subroutine, a subprogram, etc. When a process corresponds to a function, its termination corresponds to a return of the function to the calling function or the main function.
  • the specification may have presented the method and/or process of the present invention as a particular sequence of steps. However, to the extent that the method or process does not rely on the particular order of steps set forth herein, the method or process should not be limited to the particular sequence of steps described. As one of ordinary skill in the art would appreciate, other sequences of steps may be possible. Therefore, the particular order of the steps set forth in the specification should not be construed as limitations on the claims. In addition, the claims directed to the method and/or process of the present invention should not be limited to the performance of their steps in the order written, and one skilled in the art can readily appreciate that the sequences may be varied and still remain within the spirit and scope of the present invention.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
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CN108535677A (zh) * 2017-07-21 2018-09-14 国网湖北省电力公司孝感供电公司 一种小电流接地系统故障选线装置实际选线效果的测试系统
EP3812785A1 (fr) * 2019-10-22 2021-04-28 LEM International SA Transducteur de courant de barrière de flux
CN115308666B (zh) * 2021-12-13 2024-05-17 中国电力科学研究院有限公司 一种测量宽量程电流互感器误差的装置和方法
CN116106814B (zh) * 2022-11-15 2025-06-20 福建星云电子股份有限公司 一种ocv探针断线检测方法、系统、设备及介质
CN115951291B (zh) * 2023-03-14 2023-05-23 北京森社电子有限公司 一种闭环霍尔传感器的自动调零设备

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CA2855406A1 (fr) 2015-01-02
CA2960361C (fr) 2019-01-29
CA2960361A1 (fr) 2015-01-02
US10151777B2 (en) 2018-12-11
US20150008899A1 (en) 2015-01-08
US20170184637A1 (en) 2017-06-29

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