WO1991011094A3 - Sonde et appareil d'inversion - Google Patents

Sonde et appareil d'inversion Download PDF

Info

Publication number
WO1991011094A3
WO1991011094A3 PCT/US1991/000288 US9100288W WO9111094A3 WO 1991011094 A3 WO1991011094 A3 WO 1991011094A3 US 9100288 W US9100288 W US 9100288W WO 9111094 A3 WO9111094 A3 WO 9111094A3
Authority
WO
WIPO (PCT)
Prior art keywords
probe
probes
suction pin
chip
housing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US1991/000288
Other languages
English (en)
Other versions
WO1991011094A2 (fr
Inventor
Robert R Tessier
Dennis H Jensen
Jeffrey J Hertz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Aetrium Inc
Original Assignee
Aetrium Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aetrium Inc filed Critical Aetrium Inc
Priority to KR1019920701688A priority Critical patent/KR920704558A/ko
Priority to US07/910,116 priority patent/US5374158A/en
Publication of WO1991011094A2 publication Critical patent/WO1991011094A2/fr
Publication of WO1991011094A3 publication Critical patent/WO1991011094A3/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04—Mounting of components, e.g. of leadless components
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04—Mounting of components, e.g. of leadless components
    • H05K13/0404—Pick-and-place heads or apparatus, e.g. with jaws
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04—Mounting of components, e.g. of leadless components
    • H05K13/0404—Pick-and-place heads or apparatus, e.g. with jaws
    • H05K13/0408—Incorporating a pick-up tool
    • H05K13/0409—Sucking devices
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04—Mounting of components, e.g. of leadless components
    • H05K13/046—Surface mounting

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Attitude Control For Articles On Conveyors (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Specific Conveyance Elements (AREA)

Abstract

Inverseur (10) comprenant des première et seconde sondes (12, 14) montées pivotantes par rapport à un logement en forme de U (20) et par rapport à un bloc (18), lequel est monté de manière à effectuer un va-et-vient par rapport audit logement (20) à l'aide d'arbres de guidage (38). Le bloc (18) effectue un va-et-vient à l'aide d'un actuateur rotatif (42), entre une première position dans laquelle les sondes (12, 14) sont parallèles, et une seconde position dans laquelle les sondes (12, 14) sont en ligne. La pointe d'aspiration (80) de la première sonde (12) peut être prolongée afin de se fixer à la première surface (96) de la puce (98) puis être rétractée. Ensuite, on peut déplacer les sondes (12, 14) jusqu'à leur position en ligne, dans laquelle on peut faire passer la puce (98) de la première sonde (12) à la seconde sonde (14) par fixation de la surface opposée (100) de la puce (98) à la pointe d'aspiration (80) de la seconde sonde (14). Après déplacement des sondes (12, 14) jusque dans leur position parallèle, on peut prolonger la pointe d'aspiration (80) de la seconde sonde (14) afin de placer et de libérer la puce (98). Dans le mode de réalisation préféré, les sondes (12, 14) comprenent un logement (72) divisé en chambres supérieure et inférieure (74, 76) par un insert (78) lequel reçoit également dans un mouvement de va-et-vient la pointe d'aspiration (80). Ladite pointe d'aspiration (80) comprend un piston (86) destiné à définir une chambre de pression (88) avec l'insert (78). Les chambres (74, 88) peuvent être soumises à une pression hydraulique, à un vide, ou être vidées afin de fixer la pointe d'aspiration (80) à la puce (98), et/ou afin de faire aller et venir la pointe d'aspiration (80) à l'intérieur du logement (72).
PCT/US1991/000288 1990-01-16 1991-01-15 Sonde et appareil d'inversion Ceased WO1991011094A2 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR1019920701688A KR920704558A (ko) 1990-01-16 1991-01-15 프로우브 및 역전(inverting)장치
US07/910,116 US5374158A (en) 1990-01-16 1991-01-15 Probe and inverting apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US46601590A 1990-01-16 1990-01-16
US466,015 1990-01-16

Publications (2)

Publication Number Publication Date
WO1991011094A2 WO1991011094A2 (fr) 1991-07-25
WO1991011094A3 true WO1991011094A3 (fr) 1992-01-09

Family

ID=23850101

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1991/000288 Ceased WO1991011094A2 (fr) 1990-01-16 1991-01-15 Sonde et appareil d'inversion

Country Status (6)

Country Link
US (1) US5374158A (fr)
EP (1) EP0511315A1 (fr)
JP (1) JPH05503490A (fr)
KR (1) KR920704558A (fr)
AU (1) AU7308691A (fr)
WO (1) WO1991011094A2 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104245248A (zh) * 2012-02-06 2014-12-24 苹果公司 具有测试托盘和自动化测试托盘翻转器的测试系统

Families Citing this family (15)

* Cited by examiner, † Cited by third party
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DE19728029C2 (de) * 1997-07-01 2003-05-22 Kammann Maschf Werner Verfahren und Vorrichtung zum Dekorieren von flachen selbsttragenden Objekten
US6139243A (en) * 1997-07-09 2000-10-31 Systemation Engineering Method and system for flipping a tray of parts
JP2002531845A (ja) 1998-12-02 2002-09-24 シュランバーガー テクノロジーズ インク． Ｉｃデバイスを反転させる装置および方法
DE19957792A1 (de) 1998-12-02 2000-06-08 Schlumberger Technologies Inc Transport und aktive Temperatursteuerung von zu prüfenden integrierten Schaltungen
TW533319B (en) * 1999-11-19 2003-05-21 De & T Co Ltd LCD testing system
WO2001073458A1 (fr) * 2000-03-06 2001-10-04 Vladimir Nikolaevich Davidov Appareil pour traiter et trier des dispositifs semi-conducteurs reçus sur des plateaux
JP3488979B2 (ja) * 2000-08-04 2004-01-19 山久チヱイン株式会社 ワーク反転システム
US7794194B2 (en) * 2007-09-14 2010-09-14 Seagate Technology Llc Pick and place work piece flipper
CN103659411B (zh) * 2012-08-31 2016-03-09 鸿富锦精密工业（深圳）有限公司 翻转装置
JP2014140910A (ja) * 2013-01-22 2014-08-07 Yaskawa Electric Corp ロボットハンドおよびロボット
US11084175B2 (en) * 2018-12-13 2021-08-10 Amazon Technologies, Inc. End-of-arm tool having concentric suction cups, and related systems and methods
CN110077847A (zh) * 2019-06-03 2019-08-02 东莞市光轩塑料制品有限公司 上下料系统及其上下料机构
TWI799111B (zh) * 2022-01-26 2023-04-11 東佑達自動化科技股份有限公司 自動化生產線送料裝置
FR3150730A1 (fr) * 2023-07-03 2025-01-10 Velec Systems Dispositif de vérin préhenseur ventouse et ensemble retourneur
CN117104834B (zh) * 2023-09-11 2025-03-28 池州市谦跃信息技术有限公司 一种压敏电阻芯片定向自动叠放装置

Citations (3)

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Publication number Priority date Publication date Assignee Title
EP0166409A2 (fr) * 1984-06-25 1986-01-02 Advantest Corporation Equipement pour essayer des circuits intégrés
EP0253015A1 (fr) * 1986-07-18 1988-01-20 SCHOENELEC Produktionseinrichtungen für die Elektronikindustrie GmbH Système de transport pour dispositif de test de composants électroniques
US4843712A (en) * 1988-09-02 1989-07-04 American Telephone And Telegraph Company, At&T Technologies, Inc. Method and apparatus for handling parts

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FR2195753B1 (fr) * 1972-08-11 1975-03-07 Carnaud & Forges
DE2448028C2 (de) * 1974-10-09 1982-12-02 Festo-Maschinenfabrik Gottlieb Stoll, 7300 Esslingen Arbeitszylinder für pneumatische bzw. hydraulische Druckmedien
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Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0166409A2 (fr) * 1984-06-25 1986-01-02 Advantest Corporation Equipement pour essayer des circuits intégrés
EP0253015A1 (fr) * 1986-07-18 1988-01-20 SCHOENELEC Produktionseinrichtungen für die Elektronikindustrie GmbH Système de transport pour dispositif de test de composants électroniques
US4843712A (en) * 1988-09-02 1989-07-04 American Telephone And Telegraph Company, At&T Technologies, Inc. Method and apparatus for handling parts

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104245248A (zh) * 2012-02-06 2014-12-24 苹果公司 具有测试托盘和自动化测试托盘翻转器的测试系统
US9423420B2 (en) 2012-02-06 2016-08-23 Apple Inc. Testing system with test trays
CN104245248B (zh) * 2012-02-06 2017-02-22 苹果公司 具有测试托盘和自动化测试托盘翻转器的测试系统

Also Published As

Publication number Publication date
US5374158A (en) 1994-12-20
EP0511315A1 (fr) 1992-11-04
AU7308691A (en) 1991-08-05
WO1991011094A2 (fr) 1991-07-25
JPH05503490A (ja) 1993-06-10
KR920704558A (ko) 1992-12-19

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