WO2000020842A1 - Measuring amount of silicone coating on paper web - Google Patents

Measuring amount of silicone coating on paper web Download PDF

Info

Publication number
WO2000020842A1
WO2000020842A1 PCT/FI1999/000824 FI9900824W WO0020842A1 WO 2000020842 A1 WO2000020842 A1 WO 2000020842A1 FI 9900824 W FI9900824 W FI 9900824W WO 0020842 A1 WO0020842 A1 WO 0020842A1
Authority
WO
WIPO (PCT)
Prior art keywords
measuring
amount
silicone coating
coating
paper
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/FI1999/000824
Other languages
Finnish (fi)
French (fr)
Inventor
Markku MÄNTYLÄ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Metso Paper Automation Oy
Valmet Automation Inc
Original Assignee
Metso Paper Automation Oy
Valmet Automation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Metso Paper Automation Oy, Valmet Automation Inc filed Critical Metso Paper Automation Oy
Priority to EP99947501A priority Critical patent/EP1119762A1/en
Priority to AU60919/99A priority patent/AU6091999A/en
Priority to US09/806,068 priority patent/US6627043B1/en
Priority to CA002346480A priority patent/CA2346480C/en
Publication of WO2000020842A1 publication Critical patent/WO2000020842A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings

Definitions

  • the invention relates to a method of measuring the amount of silicone coating on a moving paper or board web, wherein the amount of the coating is measured substantially continuously.
  • the invention further relates to an apparatus for measuring the amount of silicone coating on a moving paper or board web, the apparatus comprising a radiation source for producing a beam, means for directing the beam at a material to be measured, a detector for measuring the beam arriving from the material to be measured, and means for processing a signal from the detector, the apparatus being arranged to measure the amount of the coating substantially continuously.
  • Silicone coating is used for paper grades that require small release strength.
  • An example is release paper for adhesive paper.
  • the amount of the silicone coating in a particular paper grade should be kept constant. A typical amount of silicone varies from 0.5 to 1.5 g/m 2 . Silicone is one of the most expensive materials in the manufacture of paper, and therefore measuring the amount of silicone accurately reduces costs considerably and provides products that are more uniform in quality.
  • the amount of a coating on a moving web can be measured, for example, with a method based on the difference between dry weights.
  • the basis weight of the web is measured by means of beta radiation absorption, and moisture is measured by infrared measurement. Both measurements are carried out before and after a coating head.
  • the wet weight is subtracted from the basis weight to obtain the dry weight, and the difference between the dry weights determines the amount of the coating.
  • the equipment is rather complicated and the accuracy of the final result depends on the accuracies of four meters. In practice, the accuracy of the measurement based on the difference between dry weights varies approximately from 0.5 to 1 g/m 2 .
  • the arrangement is not at all suitable for measuring the amount of silicone coating, where the accuracy should be about 0.1 g/m 2 . Also, the arrangement is expensive since it comprises four meters and two measuring frames.
  • the amount of the silicone coating is also measured by an X-ray fluorescence method, where the target of measurement is subjected to X- radiation, fluorescence peaks caused by silicon atoms are measured, and the amount of the silicone coating is determined on the basis thereof.
  • the fluorescence includes both the effect of the silicon atoms in the silicone coating and the effect of, for example, silicon atoms contained in clay used as a filler in the base paper. Therefore the measurement result is not accurate.
  • US Patent 4,639,942 discloses an X-ray fluorescence method where the accuracy is improved by the geometry of the equipment and by calculation. However, the arrangement is highly complicated and rather slow due to the required calculation. Further, the use of X-radiation in the measuring apparatus is hazardous to those working near the apparatus.
  • the prior art also teaches measurement of the amount of the silicone coating in the near-infrared range, where a weak absorption peak can be located in the coating on a wavelength of about 2.3 micrometers.
  • binders such as latex, used in the paper and the coating absorb in this range, which makes the measurement inaccurate if the effect of the interfering component is not measured before the siliconization.
  • EP 0,268,029 discloses a continuous method of measuring the amount of silicone coating on a moving paper web.
  • the method comprises measuring the gloss of the web surface before and after the coating process. The difference between the measured gloss values is then used to determine the amount of the silicone coating.
  • the arrangement requires two devices for measuring the gloss, which makes the measuring equipment cumbersome, complicated and expensive. Further, the results of gloss measurements are rather unreliable and not very accurate. Therefore, the amount of the silicone coating calculated on the basis of the gloss measurements is often erroneous and misleading.
  • the purpose of the present invention is to provide a method which avoids the aforementioned drawbacks.
  • the method according to the invention is characterized by directing an infrared beam at the moving paper or board web and measuring an absorption peak that is characteristic of the silicone coating in the mid-infrared range on a wavelength of from 2.5 to 5 micrometers.
  • the apparatus according to the invention is characterized in that the radiation source produces an infrared beam, and that the apparatus is arranged to measure the amount of the silicone coating by measuring an absorption peak that is characteristic of the coating in the mid-infrared range on a wavelength of from 2.5 to 5 micrometers.
  • the invention is based on the idea of directing an infrared beam at a moving paper or board web, measuring an absorption peak that is characteristic of the silicone coating in the mid-infrared range on a wavelength of 2.5 to 5 micrometers, and determining the amount of the silicone coating on the basis of the measurement.
  • the idea of a preferred embodiment is to measure an absorption peak that is characteristic of a methyl group in the silicone coating in a wavelength range of about 3.4 micrometers.
  • An advantage of the invention is that the amount of the silicone coating can be measured very accurately and reliably. Measurement can be carried out by one meter and, in the case of reflection measurement, by half a measuring frame.
  • Figure 1 shows schematically a measuring apparatus according to the invention
  • Figure 2 shows spectra of base paper and siliconized paper.
  • Figure 1 shows a measuring arrangement where radiation reflected from a target is measured. In other words, the source of the radiation and the receiver are on the same side of the target to be measured. This type of measurement is called reflection measurement.
  • Figure 1 shows a measuring apparatus 10 comprising a radiation source 1 , which produces an infrared beam 2.
  • the radiation source 1 can be, for example, a halogen lamp or some other suitable source for producing an infrared beam.
  • the infrared beam 2 is passed through a filter 3.
  • the filter 3 filters light in such a way that only the light that is essential for the measurement and that is on the correct wavelength band is able to propagate all the way to the target of the measurement.
  • the filter 3 can be, for example, a rotary filter disc comprising several interference filters, or some other filter arrangement known per se.
  • the structure of the filter 3 is known per se to those skilled in the art, wherefore it will not be described in greater detail herein.
  • the infrared beam 2 is directed through a window 5 at a paper or board web 4 moving on the paper machine.
  • the distance between the measuring apparatus 10 and the paper or board web 4 varies typically from 0 to 50 mm.
  • the measuring apparatus 10 can be arranged to measure a moving paper or board web in a continuous manner by mounting the apparatus in a measuring frame placed transversely across the web.
  • the measuring devices measuring different paper properties are arranged to traverse the measuring frame. If the measuring frame comprises only one beam to which the measuring devices are fastened, the distance between the measuring apparatus 10 according to the invention and the paper or board web 4 varies between 0 and 50 mm.
  • the measuring frame is an O frame comprising two measuring beams, one above and the other one below the paper
  • the distance between the measuring apparatus 10 and the paper or board web 4 varies between 0 and 6 mm.
  • the window 5 can be made of silica glass or sapphire, for example.
  • the paper or board web 4 travels in the direction of arrow A.
  • the surface of the paper or board web 4 is provided with a silicone coating 4a.
  • the moving bed which carries the coatings to be measured can also be for example a roll of a paper-coating machine, a roll of a paper machine and/or, generally, the surface of a metal sheet.
  • the equipment may also comprise a reference sample 6, which is moved at certain intervals to the point of measurement, as shown by arrow B.
  • the sample 6 is used as a reflection reference and the measurement result it provides indicates the condition of the radiation source 1 , a detector 7 and the window 5.
  • Reference measurement can also be used to correct the actual measurement result, if desired.
  • the reflected infrared beam 2 is supplied to the detector 7.
  • the signals are supplied from the detector 7 via preamplifiers 8 to a computer 9 which processes the measured data in a manner known per se.
  • Figure 1 does not show optics that is possibly required to align and direct the infrared beam 2.
  • the light can be guided/directed by means of focusing optics, an optical fibre or an optical fibre bundle, for example.
  • the amount of the silicone coating 4a is measured substantially continuously during the papermaking process. This means that the measurement is an on-line measurement of the papermaking process.
  • a silicon atom is surrounded by methyl groups that bond together.
  • the silicone coating thus contains methyl groups (CH 3 ).
  • curve C shows the reflection spectrum of base paper
  • curve D which is denoted by a broken line, shows the reflection spectrum of siliconized paper.
  • the horizontal axis shows the wavelength ⁇ in micrometers
  • the vertical axis shows the absorbency.
  • an absorption peak E was found in the siliconized paper on a wavelength of 3.4 micrometers. This absorption peak is characteristic of the methyl group (CH 3 ) of the silicone coating 4a and it can be found in the coating.
  • Reference wavelengths suitable for measuring the amount of the silicone coating include 3.3 and 3.7 micrometers or some other suitable reference wavelength which does not absorb the methyl group (CH 3 ).
  • the wavelength of 3.7 micrometers is particularly advantageous since it can also be used as a reference in measuring the amount of water.
  • the amount of water is preferably measured on a wavelength of about 3.175 micrometers, for example.

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Paper (AREA)

Abstract

The invention relates to a method and an apparatus for measuring the amount of silicone coating on a moving paper or board web. In the invention, the characteristics of the coating (4a) are measured by means of reflection measurement or transmission measurement. The amount of the silicone in the coating is measured by measuring an absorption peak that is characteristic of the silicone in the mid-infrated range.

Description

MEASURING AMOUNT OF SILICONE COATING ON PAPER WEB
The invention relates to a method of measuring the amount of silicone coating on a moving paper or board web, wherein the amount of the coating is measured substantially continuously. The invention further relates to an apparatus for measuring the amount of silicone coating on a moving paper or board web, the apparatus comprising a radiation source for producing a beam, means for directing the beam at a material to be measured, a detector for measuring the beam arriving from the material to be measured, and means for processing a signal from the detector, the apparatus being arranged to measure the amount of the coating substantially continuously.
When siliconized products are being manufactured, it is important to monitor the amount of the silicone coating on a moving bed, such as a paper or board web. Silicone coating is used for paper grades that require small release strength. An example is release paper for adhesive paper. The amount of the silicone coating in a particular paper grade should be kept constant. A typical amount of silicone varies from 0.5 to 1.5 g/m2. Silicone is one of the most expensive materials in the manufacture of paper, and therefore measuring the amount of silicone accurately reduces costs considerably and provides products that are more uniform in quality.
The amount of a coating on a moving web can be measured, for example, with a method based on the difference between dry weights. In this method the basis weight of the web is measured by means of beta radiation absorption, and moisture is measured by infrared measurement. Both measurements are carried out before and after a coating head. The wet weight is subtracted from the basis weight to obtain the dry weight, and the difference between the dry weights determines the amount of the coating. The equipment is rather complicated and the accuracy of the final result depends on the accuracies of four meters. In practice, the accuracy of the measurement based on the difference between dry weights varies approximately from 0.5 to 1 g/m2. Therefore, the arrangement is not at all suitable for measuring the amount of silicone coating, where the accuracy should be about 0.1 g/m2. Also, the arrangement is expensive since it comprises four meters and two measuring frames. The amount of the silicone coating is also measured by an X-ray fluorescence method, where the target of measurement is subjected to X- radiation, fluorescence peaks caused by silicon atoms are measured, and the amount of the silicone coating is determined on the basis thereof. However, the fluorescence includes both the effect of the silicon atoms in the silicone coating and the effect of, for example, silicon atoms contained in clay used as a filler in the base paper. Therefore the measurement result is not accurate. US Patent 4,639,942 discloses an X-ray fluorescence method where the accuracy is improved by the geometry of the equipment and by calculation. However, the arrangement is highly complicated and rather slow due to the required calculation. Further, the use of X-radiation in the measuring apparatus is hazardous to those working near the apparatus.
The prior art also teaches measurement of the amount of the silicone coating in the near-infrared range, where a weak absorption peak can be located in the coating on a wavelength of about 2.3 micrometers. However, due to the weakness of the absorption it is difficult to achieve sufficient accuracy of measurement. Another problem is that binders, such as latex, used in the paper and the coating absorb in this range, which makes the measurement inaccurate if the effect of the interfering component is not measured before the siliconization.
EP 0,268,029 discloses a continuous method of measuring the amount of silicone coating on a moving paper web. The method comprises measuring the gloss of the web surface before and after the coating process. The difference between the measured gloss values is then used to determine the amount of the silicone coating. The arrangement requires two devices for measuring the gloss, which makes the measuring equipment cumbersome, complicated and expensive. Further, the results of gloss measurements are rather unreliable and not very accurate. Therefore, the amount of the silicone coating calculated on the basis of the gloss measurements is often erroneous and misleading.
The purpose of the present invention is to provide a method which avoids the aforementioned drawbacks.
The method according to the invention is characterized by directing an infrared beam at the moving paper or board web and measuring an absorption peak that is characteristic of the silicone coating in the mid-infrared range on a wavelength of from 2.5 to 5 micrometers. Further, the apparatus according to the invention is characterized in that the radiation source produces an infrared beam, and that the apparatus is arranged to measure the amount of the silicone coating by measuring an absorption peak that is characteristic of the coating in the mid-infrared range on a wavelength of from 2.5 to 5 micrometers.
The invention is based on the idea of directing an infrared beam at a moving paper or board web, measuring an absorption peak that is characteristic of the silicone coating in the mid-infrared range on a wavelength of 2.5 to 5 micrometers, and determining the amount of the silicone coating on the basis of the measurement. The idea of a preferred embodiment is to measure an absorption peak that is characteristic of a methyl group in the silicone coating in a wavelength range of about 3.4 micrometers.
An advantage of the invention is that the amount of the silicone coating can be measured very accurately and reliably. Measurement can be carried out by one meter and, in the case of reflection measurement, by half a measuring frame. The invention will be described in greater detail in the accompanying drawings, in which
Figure 1 shows schematically a measuring apparatus according to the invention, and
Figure 2 shows spectra of base paper and siliconized paper. Figure 1 shows a measuring arrangement where radiation reflected from a target is measured. In other words, the source of the radiation and the receiver are on the same side of the target to be measured. This type of measurement is called reflection measurement.
Figure 1 shows a measuring apparatus 10 comprising a radiation source 1 , which produces an infrared beam 2. The radiation source 1 can be, for example, a halogen lamp or some other suitable source for producing an infrared beam. The infrared beam 2 is passed through a filter 3. The filter 3 filters light in such a way that only the light that is essential for the measurement and that is on the correct wavelength band is able to propagate all the way to the target of the measurement. The filter 3 can be, for example, a rotary filter disc comprising several interference filters, or some other filter arrangement known per se. The structure of the filter 3 is known per se to those skilled in the art, wherefore it will not be described in greater detail herein. After the filter 3 the infrared beam 2 is directed through a window 5 at a paper or board web 4 moving on the paper machine. The distance between the measuring apparatus 10 and the paper or board web 4 varies typically from 0 to 50 mm. The measuring apparatus 10 can be arranged to measure a moving paper or board web in a continuous manner by mounting the apparatus in a measuring frame placed transversely across the web. The measuring devices measuring different paper properties are arranged to traverse the measuring frame. If the measuring frame comprises only one beam to which the measuring devices are fastened, the distance between the measuring apparatus 10 according to the invention and the paper or board web 4 varies between 0 and 50 mm. On the other hand, if the measuring frame is an O frame comprising two measuring beams, one above and the other one below the paper, the distance between the measuring apparatus 10 and the paper or board web 4 varies between 0 and 6 mm. The window 5 can be made of silica glass or sapphire, for example. The paper or board web 4 travels in the direction of arrow A. The surface of the paper or board web 4 is provided with a silicone coating 4a. Instead of a moving paper or board web 4, the moving bed which carries the coatings to be measured can also be for example a roll of a paper-coating machine, a roll of a paper machine and/or, generally, the surface of a metal sheet. The equipment may also comprise a reference sample 6, which is moved at certain intervals to the point of measurement, as shown by arrow B. The sample 6 is used as a reflection reference and the measurement result it provides indicates the condition of the radiation source 1 , a detector 7 and the window 5. Reference measurement can also be used to correct the actual measurement result, if desired.
The reflected infrared beam 2 is supplied to the detector 7. The signals are supplied from the detector 7 via preamplifiers 8 to a computer 9 which processes the measured data in a manner known per se. For the sake of clarity, Figure 1 does not show optics that is possibly required to align and direct the infrared beam 2. The light can be guided/directed by means of focusing optics, an optical fibre or an optical fibre bundle, for example.
The amount of the silicone coating 4a is measured substantially continuously during the papermaking process. This means that the measurement is an on-line measurement of the papermaking process.
Naturally, even if the measurement were interrupted for a rather short period due to calibration or some other reason, it is still considered to be continuous.
In the silicone used as a coating, a silicon atom is surrounded by methyl groups that bond together. The silicone coating thus contains methyl groups (CH3). In Figure 2, curve C shows the reflection spectrum of base paper, and curve D, which is denoted by a broken line, shows the reflection spectrum of siliconized paper. The horizontal axis shows the wavelength λ in micrometers, and the vertical axis shows the absorbency. When the spectra were measured, an absorption peak E was found in the siliconized paper on a wavelength of 3.4 micrometers. This absorption peak is characteristic of the methyl group (CH3) of the silicone coating 4a and it can be found in the coating. However, such a methyl group formed around silicon cannot be found in the base paper, wherefore the measurement result is specifically proportional to the amount of the silicone coating. Thus, silicon atoms that possibly exist in the base paper do not affect the accuracy of the measurement. The response on the wavelength of 3.4 micrometers is rather significant, which facilitates the measurement. Furthermore, the aforementioned wavelength range does not really exhibit any absorption bands, resulting from other materials used in the papermaking, that would interfere with the measurement of the silicone coating. By arranging the apparatus of Figure 1 to measure an absorption peak on a wavelength of about 3.4 micrometers, it is possible to measure the amount of the silicone coating. Reference wavelengths suitable for measuring the amount of the silicone coating include 3.3 and 3.7 micrometers or some other suitable reference wavelength which does not absorb the methyl group (CH3). The wavelength of 3.7 micrometers is particularly advantageous since it can also be used as a reference in measuring the amount of water. The amount of water is preferably measured on a wavelength of about 3.175 micrometers, for example.
The drawing and the related description are only intended to illustrate the inventive idea. The details of the invention may vary within the scope of the claims. Therefore the invention can be applied not only in reflection measurement but also in transmission measurement.

Claims

1. A method of measuring the amount of silicone coating on a moving paper or board web, wherein the amount of the coating is measured substantially continuously, characterized by directing an infrared beam (2) at the moving paper or board web (4) and measuring an absorption peak that is characteristic of the silicone coating (4a) in the mid-infrared range on a wavelength of from 2.5 to 5 micrometers.
2. A method according to claim 1 , characterized by measuring the absorption peak of the silicone coating on a wavelength of about 3.4 micrometers.
3. A method according to claim 1 or 2, characterized in that the measured absorption peak is characteristic of a methyl group in the silicone coating.
4. A method according to any one of the preceding claims, char- acterized by measuring a reference value for the measurement of the absorption peak of the silicone coating (4a) on a wavelength of about 3.7 micrometers.
5. A method according to any one of the preceding claims, characterized by simultaneously measuring the amount of water on a wavelength of about 3.175 micrometers.
6. A method according to claim 5, characterized by measuring a reference value for the measurement of the amount of water on a wavelength of about 3.7 micrometers.
7. A method according to any one of the preceding claims, char- acterized by measuring the amount of the coating during a papermaking process.
8. A method according to any one of the preceding claims, characterized by measuring the amount of the silicone coating by a measuring apparatus (10) arranged on a distance of less than 50 millimetres from the paper or board web (4).
9. A method according to claim 8, characterized by arranging the measuring apparatus (10) on a distance of less than 6 millimetres from the paper or board web (4).
10. An apparatus for measuring the amount of silicone coating on a moving paper or board web, the apparatus comprising a radiation source (1) for producing a beam (2), means for directing the beam (2) at a material to be measured, a detector (7) for measuring the beam (2) arriving from the material to be measured, and means for processing a signal from the detector (7), the apparatus being arranged to measure the amount of the coating substantially continuously, characterized in that the radiation source (1) produces an infrared beam (2), and that the apparatus is arranged to measure the amount of the silicone coating (4a) by measuring an absorption peak that is characteristic of the coating (4a) in the mid-infrared range on a wavelength of from 2.5 to 5 micrometers.
11. An apparatus according to claim 10, characterized in that the apparatus is arranged to measure the absorption peak of the silicone coating on a wavelength of about 3.4 micrometers.
12. An apparatus according to claim 10 or 11, characterized in that the apparatus is arranged to measure an absorption peak that is characteristic of a methyl group in the silicone coating.
13. An apparatus according to any one of claims 10 to 12, characterized in that the apparatus is arranged to measure the amount of the silicone coating (4a) in connection with a papermaking process.
14. An apparatus according to any one of claims 10 to 13, char- acterized in that the apparatus is arranged on a distance of less than 50 millimetres from the paper or board web (4).
15. An apparatus according to claim 14, characterized in that the apparatus is arranged on a distance of less than 6 millimetres from the paper or board web (4).
PCT/FI1999/000824 1998-10-06 1999-10-05 Measuring amount of silicone coating on paper web Ceased WO2000020842A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP99947501A EP1119762A1 (en) 1998-10-06 1999-10-05 Measuring amount of silicone coating on paper web
AU60919/99A AU6091999A (en) 1998-10-06 1999-10-05 Measuring amount of silicone coating on paper web
US09/806,068 US6627043B1 (en) 1998-10-06 1999-10-05 Measuring amount of silicone coating on paper web
CA002346480A CA2346480C (en) 1998-10-06 1999-10-05 Measuring amount of silicone coating on paper web

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI982171 1998-10-06
FI982171A FI110638B (en) 1998-10-06 1998-10-06 Method and apparatus for measuring the amount of silicone coating on a moving surface

Publications (1)

Publication Number Publication Date
WO2000020842A1 true WO2000020842A1 (en) 2000-04-13

Family

ID=8552656

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FI1999/000824 Ceased WO2000020842A1 (en) 1998-10-06 1999-10-05 Measuring amount of silicone coating on paper web

Country Status (6)

Country Link
US (1) US6627043B1 (en)
EP (1) EP1119762A1 (en)
AU (1) AU6091999A (en)
CA (1) CA2346480C (en)
FI (1) FI110638B (en)
WO (1) WO2000020842A1 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005025329A1 (en) * 2005-05-31 2006-12-07 Eduard Küsters Maschinenfabrik GmbH & Co. KG Detection method for detecting areas of a material run covered with finishing chemicals uses optical methods to detect quantitative/qualitative coating properties
DE102008055584B3 (en) * 2008-12-23 2010-04-22 Gunther Prof. Dr.-Ing. Krieg Method and device for coating printed paper webs
ITUB20156830A1 (en) * 2015-11-23 2017-05-23 Iannone Antonio Verification system of the indelible printing of the traceability code on the pharmaceutical label.
WO2018011465A1 (en) * 2016-07-13 2018-01-18 Valmet Automation Oy Measuring method, measuring arrangement and measuring device

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004053140B4 (en) 2004-11-03 2008-12-11 Airbus Deutschland Gmbh Luggage compartment, method for producing a luggage compartment and use of a luggage compartment in a passenger transport device
US7482590B2 (en) * 2006-12-20 2009-01-27 Voith Patent Gmbh Method for determining the coating quantity on a material web
US7609366B2 (en) * 2007-11-16 2009-10-27 Honeywell International Inc. Material measurement system for obtaining coincident properties and related method
US9029776B2 (en) * 2008-09-05 2015-05-12 Metso Automation Oy Determining the amount of starch
US11327010B2 (en) * 2018-01-31 2022-05-10 3M Innovative Properties Company Infrared light transmission inspection for continuous moving web

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4631408A (en) * 1984-09-24 1986-12-23 Kollmorgen Technologies Corporation Method of simultaneously determining gauge and orientation of polymer films
EP0268029A2 (en) * 1986-11-14 1988-05-25 Kämmerer Gmbh Method for measuring coating-quantities, in particular silicon-coatings on paper or plastic foil
WO1997025605A2 (en) * 1996-01-12 1997-07-17 Institut für Chemo- und Biosensorik Münster E.V. Process and device for recognizing organic substances
JPH09239914A (en) * 1996-03-04 1997-09-16 Teijin Ltd Release film
US5795394A (en) * 1997-06-02 1998-08-18 Honeywell-Measurex Coating weight measuring and control apparatus
WO1999041590A1 (en) * 1998-02-12 1999-08-19 Neles Paper Automation Oy Method and device for measuring the amount of coating on a moving substrate

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3631526A (en) 1969-11-05 1971-12-28 Brun Sensor Systems Inc Apparatus and methods for eliminating interference effect errors in dual-beam infrared measurements
US3793524A (en) * 1972-09-05 1974-02-19 Measurex Corp Apparatus for measuring a characteristic of sheet materials
US4818576A (en) * 1980-02-20 1989-04-04 Flexcon Co., Inc. Silicone releases, laminates and methods
FI68322C (en) 1983-06-28 1985-08-12 Enso Gutzeit Oy REFRIGERATION FOR THE MAINTENANCE OF THE SILICONE BOTTOM OF THE PAPER ELLER CARTON
JPS60184218A (en) * 1984-03-01 1985-09-19 Fujikura Ltd Optical fiber core
US4957770A (en) * 1989-01-27 1990-09-18 Measurex Corporation Coating weight measuring and control apparatus and method
US6179918B1 (en) * 1998-11-20 2001-01-30 Honeywell International Inc. Silicone coat weight measuring and control apparatus

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4631408A (en) * 1984-09-24 1986-12-23 Kollmorgen Technologies Corporation Method of simultaneously determining gauge and orientation of polymer films
EP0268029A2 (en) * 1986-11-14 1988-05-25 Kämmerer Gmbh Method for measuring coating-quantities, in particular silicon-coatings on paper or plastic foil
WO1997025605A2 (en) * 1996-01-12 1997-07-17 Institut für Chemo- und Biosensorik Münster E.V. Process and device for recognizing organic substances
JPH09239914A (en) * 1996-03-04 1997-09-16 Teijin Ltd Release film
US5795394A (en) * 1997-06-02 1998-08-18 Honeywell-Measurex Coating weight measuring and control apparatus
WO1999041590A1 (en) * 1998-02-12 1999-08-19 Neles Paper Automation Oy Method and device for measuring the amount of coating on a moving substrate

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN *

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005025329A1 (en) * 2005-05-31 2006-12-07 Eduard Küsters Maschinenfabrik GmbH & Co. KG Detection method for detecting areas of a material run covered with finishing chemicals uses optical methods to detect quantitative/qualitative coating properties
DE102005025329B4 (en) * 2005-05-31 2007-06-21 Eduard Küsters Maschinenfabrik GmbH & Co. KG Method and device for qualitative and quantitative surface detection in the finishing of web products
DE102005025329C5 (en) * 2005-05-31 2009-10-01 Andritz Küsters Gmbh Method and device for qualitative and quantitative surface detection in the finishing of web products
DE102008055584B3 (en) * 2008-12-23 2010-04-22 Gunther Prof. Dr.-Ing. Krieg Method and device for coating printed paper webs
EP2202357A2 (en) 2008-12-23 2010-06-30 Krieg, Gunther, Prof.Dr.Ing. Method and device for coating printed sheets of paper
EP2202357A3 (en) * 2008-12-23 2012-02-01 Krieg, Gunther, Prof.Dr.Ing. Method and device for coating printed sheets of paper
ITUB20156830A1 (en) * 2015-11-23 2017-05-23 Iannone Antonio Verification system of the indelible printing of the traceability code on the pharmaceutical label.
WO2018011465A1 (en) * 2016-07-13 2018-01-18 Valmet Automation Oy Measuring method, measuring arrangement and measuring device
US10969343B2 (en) 2016-07-13 2021-04-06 Valmet Automation Oy Measuring method, measuring arrangement and measuring device

Also Published As

Publication number Publication date
FI982171A0 (en) 1998-10-06
CA2346480A1 (en) 2000-04-13
EP1119762A1 (en) 2001-08-01
FI110638B (en) 2003-02-28
CA2346480C (en) 2009-02-03
FI982171L (en) 2000-04-07
US6627043B1 (en) 2003-09-30
AU6091999A (en) 2000-04-26

Similar Documents

Publication Publication Date Title
FI81203C (en) Method and apparatus for measuring water content
EP0611329B1 (en) Multiple coat measurement and control
US4879471A (en) Rapid-scanning infrared sensor
JPH02247528A (en) Coating weight measuring and controlling device and method thereof
WO2007075304A1 (en) Combined paper sheet temperature and moisture sensor
JP6771498B2 (en) Holmium oxide glass as a calibration criterion for near-infrared moisture sensors
US4363968A (en) Method and apparatus for determining the binder content in a fibrous mat
US6627043B1 (en) Measuring amount of silicone coating on paper web
EP0394128B1 (en) X-ray coating weight controller and sensor
EP2169390B1 (en) Method for correcting gypsum crystal water effect on infrared moisture measurement
US6538743B2 (en) Method and apparatus for measuring properties of paper web
US6495831B1 (en) Method and apparatus for measuring properties of paper
EP2326938B1 (en) Determining the amount of starch
WO1999041590A1 (en) Method and device for measuring the amount of coating on a moving substrate
US20030132387A1 (en) Method and device for measuring the amount of coating on a moving substrate
CA2251347A1 (en) Process and device for determining the mechanical properties of paper
FI73318B (en) METHOD FOER MAETNING AV PAPPERETS FORMATION.

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A1

Designated state(s): AE AL AM AT AT AU AZ BA BB BG BR BY CA CH CN CR CU CZ CZ DE DE DK DK DM EE EE ES FI FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MD MG MK MN MW MX NO NZ PL PT RO RU SD SE SG SI SK SK SL TJ TM TR TT TZ UA UG US UZ VN YU ZA ZW

AL Designated countries for regional patents

Kind code of ref document: A1

Designated state(s): GH GM KE LS MW SD SL SZ TZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
DFPE Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101)
WWE Wipo information: entry into national phase

Ref document number: 1999947501

Country of ref document: EP

WWE Wipo information: entry into national phase

Ref document number: 09806068

Country of ref document: US

ENP Entry into the national phase

Ref document number: 2346480

Country of ref document: CA

Ref country code: CA

Ref document number: 2346480

Kind code of ref document: A

Format of ref document f/p: F

WWP Wipo information: published in national office

Ref document number: 1999947501

Country of ref document: EP

REG Reference to national code

Ref country code: DE

Ref legal event code: 8642

WWW Wipo information: withdrawn in national office

Ref document number: 1999947501

Country of ref document: EP