WO2000077493A3 - Vorrichtung zur messung von feuchtigkeit und reflexionsvermögen von oberflächen - Google Patents

Vorrichtung zur messung von feuchtigkeit und reflexionsvermögen von oberflächen Download PDF

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Publication number
WO2000077493A3
WO2000077493A3 PCT/DE2000/001892 DE0001892W WO0077493A3 WO 2000077493 A3 WO2000077493 A3 WO 2000077493A3 DE 0001892 W DE0001892 W DE 0001892W WO 0077493 A3 WO0077493 A3 WO 0077493A3
Authority
WO
WIPO (PCT)
Prior art keywords
measuring
reflectance
humidity
light
region covering
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/DE2000/001892
Other languages
English (en)
French (fr)
Other versions
WO2000077493A8 (de
WO2000077493A2 (de
Inventor
Wilhelm Rapp
Thomas Schulze
Markus Riemenschneider
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Piller Group GmbH
Original Assignee
Piller GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Piller GmbH filed Critical Piller GmbH
Priority to AU59647/00A priority Critical patent/AU5964700A/en
Publication of WO2000077493A2 publication Critical patent/WO2000077493A2/de
Publication of WO2000077493A3 publication Critical patent/WO2000077493A3/de
Anticipated expiration legal-status Critical
Publication of WO2000077493A8 publication Critical patent/WO2000077493A8/de
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3554—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for determining moisture content
    • G01N21/3559—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for determining moisture content in sheets, e.g. in paper
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Die Erfindung betrifft eine Vorrichtung zur Messung von Feuchtigkeit und Reflexionsvermögen von Oberflächen mit Hilfe von Licht. Aufgabe der Erfindung ist es, die Vorrichtung so auszugestalten, daß sie genaue Messungen auch bei schnell veränderlichem Abstand und schneller Bewegung des Meßojekts ermöglicht. Gelöst wird diese Aufgabe durch eine Beleuchtungsvorrichtung, deren Emissionsspektrum zwei Bereiche enthält, wobei der eine Bereich Teile einer Wasserabsorptionsbande und der andere Bereich einen benachbarten Teil davon umfaßt, einen Strahlteiler zur Aufteilung des Lichts in zwei Teilstrahlen zum Bestrahlen der Oberfläche in zwei Meßflächen, einen Spiegel, der den am Strahlteiler reflektierten Teilstrahl parallel zum durchgehenden Strahl umlenkt, und ein Nachweisgerät für den gleichzeitigen Nachweis der beiden Bereiche.
PCT/DE2000/001892 1999-06-16 2000-06-15 Vorrichtung zur messung von feuchtigkeit und reflexionsvermögen von oberflächen Ceased WO2000077493A2 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU59647/00A AU5964700A (en) 1999-06-16 2000-06-15 Device for measuring the humidity and reflectance of surfaces

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19927452.5 1999-06-16
DE19927452A DE19927452C2 (de) 1999-06-16 1999-06-16 Vorrichtung zur Messung von Feuchtigkeit und Reflexionsvermögen von Oberflächen

Publications (3)

Publication Number Publication Date
WO2000077493A2 WO2000077493A2 (de) 2000-12-21
WO2000077493A3 true WO2000077493A3 (de) 2001-04-19
WO2000077493A8 WO2000077493A8 (de) 2003-08-14

Family

ID=7911424

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE2000/001892 Ceased WO2000077493A2 (de) 1999-06-16 2000-06-15 Vorrichtung zur messung von feuchtigkeit und reflexionsvermögen von oberflächen

Country Status (3)

Country Link
AU (1) AU5964700A (de)
DE (1) DE19927452C2 (de)
WO (1) WO2000077493A2 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2824138B1 (fr) * 2001-04-27 2003-06-13 Usinor Dispositif de mesure de brillance du type reflectometre

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3675019A (en) * 1971-03-19 1972-07-04 Measurex Corp Apparatus for measuring the amount of a substance that is associated with a base material
US4787238A (en) * 1984-10-08 1988-11-29 Dai Nippon Insatsu Kabushiki Kaisha Method and device for measuring the quantity of water dampening the face of an offset printing plate
US4840706A (en) * 1983-09-26 1989-06-20 The Wiggins Teape Group Limited Method and apparatus for measuring water content
US4884697A (en) * 1988-06-21 1989-12-05 Takacs Peter Z Surface profiling interferometer
US5067817A (en) * 1990-02-08 1991-11-26 Bauer Associates, Inc. Method and device for noncontacting self-referencing measurement of surface curvature and profile
US5891656A (en) * 1992-09-14 1999-04-06 Sri International Up-converting reporters for biological and other assays using laser excitation techniques

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US384553A (en) * 1888-06-12 Sash-fastener
US3614450A (en) * 1969-02-17 1971-10-19 Measurex Corp Apparatus for measuring the amount of a substance that is associated with a base material
IT982680B (it) * 1972-04-10 1974-10-21 Infra Systems Inc Sistema di misura mediante radia zione infrarossa
US3792271A (en) * 1972-06-30 1974-02-12 Asea Ab Means for determining moisture content and/or surface weight
DE3149809A1 (de) * 1981-12-16 1983-07-21 Robert Bosch Gmbh, 7000 Stuttgart Vorrichtung zum herstellen evakuierter beutelpackungen
DE3336659C2 (de) * 1982-10-12 1993-10-07 Sentrol Systems Ltd Meßgerät zum Bestimmen des Profils des Feuchtigkeitsgehalts einer Materialbahn quer zu ihrer Laufrichtung
DE3611645A1 (de) * 1986-04-07 1987-10-08 Grapho Metronic Gmbh & Co Verfahren und vorrichtung zur regelung der farb- und feuchtmittelanteile einer emulsionsschicht auf der druckplatte einer offset-druckmaschine
DE4131835A1 (de) * 1991-09-22 1993-03-25 Optronik Gmbh Berlin Opto Elek Fehlererkennungsgeraet
DE4321177A1 (de) * 1993-06-25 1995-01-05 Heidelberger Druckmasch Ag Vorrichtung zur parallelen Bildinspektion und Farbregelung an einem Druckprodukt
DE19831612A1 (de) * 1998-07-14 2000-01-20 Voith Sulzer Papiermasch Gmbh Meßsystem

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3675019A (en) * 1971-03-19 1972-07-04 Measurex Corp Apparatus for measuring the amount of a substance that is associated with a base material
US4840706A (en) * 1983-09-26 1989-06-20 The Wiggins Teape Group Limited Method and apparatus for measuring water content
US4787238A (en) * 1984-10-08 1988-11-29 Dai Nippon Insatsu Kabushiki Kaisha Method and device for measuring the quantity of water dampening the face of an offset printing plate
US4884697A (en) * 1988-06-21 1989-12-05 Takacs Peter Z Surface profiling interferometer
US5067817A (en) * 1990-02-08 1991-11-26 Bauer Associates, Inc. Method and device for noncontacting self-referencing measurement of surface curvature and profile
US5891656A (en) * 1992-09-14 1999-04-06 Sri International Up-converting reporters for biological and other assays using laser excitation techniques

Also Published As

Publication number Publication date
WO2000077493A8 (de) 2003-08-14
DE19927452C2 (de) 2001-05-03
WO2000077493A2 (de) 2000-12-21
AU5964700A (en) 2001-01-02
DE19927452A1 (de) 2001-01-25

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