WO2001009902A8 - Verfahren und schaltungsanordnung zum korrigieren von speicherfehlern - Google Patents

Verfahren und schaltungsanordnung zum korrigieren von speicherfehlern

Info

Publication number
WO2001009902A8
WO2001009902A8 PCT/DE2000/002381 DE0002381W WO0109902A8 WO 2001009902 A8 WO2001009902 A8 WO 2001009902A8 DE 0002381 W DE0002381 W DE 0002381W WO 0109902 A8 WO0109902 A8 WO 0109902A8
Authority
WO
WIPO (PCT)
Prior art keywords
memory
correction
circuit
writing
memory errors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/DE2000/002381
Other languages
English (en)
French (fr)
Other versions
WO2001009902A1 (de
Inventor
Thomas Kern
Von Schwerin Andreas Graf
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Infineon Technologies AG
Original Assignee
Infineon Technologies AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infineon Technologies AG filed Critical Infineon Technologies AG
Publication of WO2001009902A1 publication Critical patent/WO2001009902A1/de
Publication of WO2001009902A8 publication Critical patent/WO2001009902A8/de
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/88—Masking faults in memories by using spares or by reconfiguring with partially good memories
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
    • G11C16/3459—Circuits or methods to verify correct programming of nonvolatile memory cells
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/004—Error avoidance

Landscapes

  • Read Only Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

Zum Korrigieren von Speicherfehlern, die beim Programmieren oder Beschreiben eines Speichers (1) auftreten können, werden die infolge eines Schreibvorgangs in einer Speichereinheit (9) gespeicherten Informationen mit den beim Schreibvorgang verwendeten Schreibinformationen verglichen und bei Feststellen einer Abweichung die zuvor verwendete Schreibinformation invertiert, die Invertierung vermerkt und die Speichereinheit (9) erneut mit der invertierten Schreibinformation beschrieben.
PCT/DE2000/002381 1999-07-28 2000-07-20 Verfahren und schaltungsanordnung zum korrigieren von speicherfehlern Ceased WO2001009902A1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19935497.9 1999-07-28
DE1999135497 DE19935497A1 (de) 1999-07-28 1999-07-28 Verfahren und Schaltungsanordnung zum Korrigieren von Speicherfehlern

Publications (2)

Publication Number Publication Date
WO2001009902A1 WO2001009902A1 (de) 2001-02-08
WO2001009902A8 true WO2001009902A8 (de) 2001-04-19

Family

ID=7916387

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE2000/002381 Ceased WO2001009902A1 (de) 1999-07-28 2000-07-20 Verfahren und schaltungsanordnung zum korrigieren von speicherfehlern

Country Status (2)

Country Link
DE (1) DE19935497A1 (de)
WO (1) WO2001009902A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5867264B2 (ja) * 2012-04-24 2016-02-24 ソニー株式会社 記憶制御装置、メモリシステム、情報処理システム、および、記憶制御方法
US9582354B2 (en) 2014-01-28 2017-02-28 Infineon Technologies Ag Apparatus and method for improving data storage by data inversion
US10916324B2 (en) * 2018-09-11 2021-02-09 Micron Technology, Inc. Data state synchronization involving memory cells having an inverted data state written thereto

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE6912605U (de) * 1969-03-28 1969-10-02 Steinhaus Gmbh Lochsiebboden aus gummielastischem vollmaterial
JPH02166700A (ja) * 1988-12-15 1990-06-27 Samsung Electron Co Ltd エラー検査及び訂正装置を内蔵した不揮発性半導体メモリ装置
US5396468A (en) * 1991-03-15 1995-03-07 Sundisk Corporation Streamlined write operation for EEPROM system
US5267204A (en) * 1991-10-18 1993-11-30 Texas Instruments Incorporated Method and circuitry for masking data in a memory device
JPH0729395A (ja) * 1993-06-25 1995-01-31 Mitsubishi Electric Corp Ｅｅｐｒｏｍ装置
US5673224A (en) * 1996-02-23 1997-09-30 Micron Quantum Devices, Inc. Segmented non-volatile memory array with multiple sources with improved word line control circuitry
DE19610838A1 (de) * 1996-03-19 1997-02-27 Siemens Ag Verfahren zum Speichern eines Datensatzes in einem Speicher

Also Published As

Publication number Publication date
WO2001009902A1 (de) 2001-02-08
DE19935497A1 (de) 2001-03-01

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