WO2003102603A3 - Adaptateur d'essai sous vide modulaire - Google Patents

Adaptateur d'essai sous vide modulaire Download PDF

Info

Publication number
WO2003102603A3
WO2003102603A3 PCT/DE2003/001782 DE0301782W WO03102603A3 WO 2003102603 A3 WO2003102603 A3 WO 2003102603A3 DE 0301782 W DE0301782 W DE 0301782W WO 03102603 A3 WO03102603 A3 WO 03102603A3
Authority
WO
WIPO (PCT)
Prior art keywords
holding
test
test specimen
seal
down plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/DE2003/001782
Other languages
German (de)
English (en)
Other versions
WO2003102603A2 (fr
Inventor
Christian Ratzky
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to DE10393299T priority Critical patent/DE10393299D2/de
Priority to AU2003249843A priority patent/AU2003249843A1/en
Publication of WO2003102603A2 publication Critical patent/WO2003102603A2/fr
Publication of WO2003102603A3 publication Critical patent/WO2003102603A3/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

L'invention concerne un adaptateur d'essai sous vide modulaire comprenant une chambre à vide et une chambre de câblage, lequel adaptateur sert à tester des groupes de commutation électroniques. Cet adaptateur d'essai sous vide modulaire, sans couvercle, autoajustable en hauteur et pouvant être mis en contact de façon précise par le haut, comporte une plaque de retenue intégrée et des goupilles de guidage à rotule à encliquetage. Les adaptateurs d'essai sous vide classiques utilisent un joint d'étanchéité ou un couvercle pour vide afin de garantir l'étanchéité du groupe à tester. L'objectif de cette invention est de remplacer un joint d'étanchéité ou couvercle supplémentaire, qui exige un travail manuel complexe ainsi qu'un réglage fin des éléments de retenue, et de permettre également une mise en contact précise par le haut. Le groupe à tester (21) est placé sous la plaque de retenue (11) et pressé vers le bas par l'intermédiaire d'éléments de retenue (22) lors d'une aspiration. Deux goupilles de guidage à rotule (17, 18) dans la zone arrière et deux goupilles de guidage dans la zone avant permettent le relevage de la plaque de retenue (11) et l'insertion du groupe à tester (21). Cette plaque de retenue (11) opère à l'intérieur du joint d'étanchéité (19). Lesdites goupilles de guidage (17) permettent une mise en contact précise par le haut du groupe à tester (21). Lors de l'aspiration, la plaque de retenue (11) pourvue d'éléments de retenue (22) entraîne le groupe à tester (21) vers le bas, jusqu'à ce que ce dernier atteigne les butées d'espacement inférieures (20). La modularité est obtenue par l'insertion de plusieurs plaques (7). Ladite invention concerne également la fabrication d'un adaptateur d'essai sous vide modulaire sans couvercle à plaque de retenue intégrée et goupilles de guidage à rotule.
PCT/DE2003/001782 2002-06-04 2003-05-31 Adaptateur d'essai sous vide modulaire Ceased WO2003102603A2 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE10393299T DE10393299D2 (de) 2002-06-06 2003-05-31 Modularer Vakuum-Prüfadapter
AU2003249843A AU2003249843A1 (en) 2002-06-04 2003-05-31 Modular vacuum test adapter

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10225028.6 2002-06-04
DE2002125028 DE10225028B3 (de) 2002-06-06 2002-06-06 Kugelgelenk-Führungsstifte mit Einrastung-Modularer, haubenloser, höhenselbsteinstellender, von oben genau kontaktierbarer Vakuum-Prüfadapter

Publications (2)

Publication Number Publication Date
WO2003102603A2 WO2003102603A2 (fr) 2003-12-11
WO2003102603A3 true WO2003102603A3 (fr) 2004-02-12

Family

ID=29594292

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE2003/001782 Ceased WO2003102603A2 (fr) 2002-06-04 2003-05-31 Adaptateur d'essai sous vide modulaire

Country Status (3)

Country Link
AU (1) AU2003249843A1 (fr)
DE (2) DE10225028B3 (fr)
WO (1) WO2003102603A2 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE202013101614U1 (de) 2013-04-16 2014-07-18 Atx Hardware Gmbh Halter zum Niederhalten oder Auflegen einer zu prüfenden Platine in einer Prüfanordnung
DE202015104330U1 (de) 2015-08-17 2016-08-19 Atx Hardware Gmbh Halter zum Niederhalten einer zu prüfenden Platine auf einen Prüfadapter in einer Prüfanordnung
DE102015215634A1 (de) 2015-08-17 2017-02-23 Atx Hardware Gmbh Halter zum Niederhalten einer zu prüfenden Platine auf einen Prüfadapter in einer Prüfanordnung
DE202018104826U1 (de) * 2018-08-22 2019-08-22 Ingun Prüfmittelbau Gmbh Niederhalterelement

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4912400A (en) * 1988-09-13 1990-03-27 Design And Manufacturing Specialties, Inc. Apparatus for testing circuit boards
US5436567A (en) * 1993-02-08 1995-07-25 Automated Test Engineering, Inc. Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts
US5450017A (en) * 1993-12-03 1995-09-12 Everett Charles Technologies, Inc. Test fixture having translator for grid interface
US5894225A (en) * 1996-10-31 1999-04-13 Coffin; Harry S. Test fixture
US20020000820A1 (en) * 2000-05-18 2002-01-03 Qa Technology Company, Inc. Test probe and connector

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3637406C1 (en) * 1986-11-03 1988-05-05 Genrad Gmbh Test device for circuit boards
JPH07146336A (ja) * 1993-11-19 1995-06-06 Cosmo Tec Kk インサーキットテスタ用検査治具

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4912400A (en) * 1988-09-13 1990-03-27 Design And Manufacturing Specialties, Inc. Apparatus for testing circuit boards
US5436567A (en) * 1993-02-08 1995-07-25 Automated Test Engineering, Inc. Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts
US5450017A (en) * 1993-12-03 1995-09-12 Everett Charles Technologies, Inc. Test fixture having translator for grid interface
US5894225A (en) * 1996-10-31 1999-04-13 Coffin; Harry S. Test fixture
US20020000820A1 (en) * 2000-05-18 2002-01-03 Qa Technology Company, Inc. Test probe and connector

Also Published As

Publication number Publication date
AU2003249843A8 (en) 2003-12-19
DE10393299D2 (de) 2005-06-23
AU2003249843A1 (en) 2003-12-19
WO2003102603A2 (fr) 2003-12-11
DE10225028B3 (de) 2004-01-15

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