WO2003107471A1 - 光電変換素子及びその製造方法 - Google Patents
光電変換素子及びその製造方法 Download PDFInfo
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- WO2003107471A1 WO2003107471A1 PCT/JP2003/007531 JP0307531W WO03107471A1 WO 2003107471 A1 WO2003107471 A1 WO 2003107471A1 JP 0307531 W JP0307531 W JP 0307531W WO 03107471 A1 WO03107471 A1 WO 03107471A1
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- film
- semiconductor layer
- electrode
- titanium oxide
- photoelectric conversion
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/20—Light-sensitive devices
- H01G9/2027—Light-sensitive devices comprising an oxide semiconductor electrode
- H01G9/2031—Light-sensitive devices comprising an oxide semiconductor electrode comprising titanium oxide, e.g. TiO2
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M14/00—Electrochemical current or voltage generators not provided for in groups H01M6/00 - H01M12/00; Manufacture thereof
- H01M14/005—Photoelectrochemical storage cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/542—Dye sensitized solar cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02T—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
- Y02T10/00—Road transport of goods or passengers
- Y02T10/60—Other road transportation technologies with climate change mitigation effect
- Y02T10/70—Energy storage systems for electromobility, e.g. batteries
Definitions
- the present invention relates to a photoelectric conversion element used for a dye-sensitized solar cell or the like.
- the Gretz-L-cell can be assembled simply by applying a paste in which ultrafine particles of titanium oxide are dispersed to a transparent electrode, supporting a sensitizing dye, and filling an electrolyte between the counter electrode and the transparent electrode. Compared to conventional solar cells, it can be manufactured with simpler equipment and is attracting attention as one of the next generation solar cells.
- the major feature of the Gretz-L-Cell is a porous semiconductor made by sintering ultrafine titanium oxide. Is to use a membrane.
- the purpose of sintering titanium oxide is to combine the ultrafine particles of semiconductors with each other, The purpose is to secure a transmission path for the electromotive force.
- the sintering temperature of titanium oxide for securing the transmission path of the photoexcited electrons is in the range of 450 to 550 ° C. Below this temperature range, the bonding between the semiconductor ultrafine particles is insufficient. Minutes. From this, it is practically impossible to use a material having a softening temperature higher than the sintering temperature as a base material of a transparent electrode for forming a porous titanium oxide film. However, many of the light-transmitting materials have a softening temperature lower than the sintering temperature of titanium oxide, and thus have a problem that it is difficult to use them as electrode substrates for Gretzelle cells.
- a film is used as the substrate of the Gretz-L-Cell, for example, a roll-to-to-roll continuous production method described in WO 97/15959, a W-99 / 66 519 Because the manufacturing method suitable for mass production described in the gazette can be adopted and the solar cell can be manufactured at a lower cost than existing solar cells, film-type Gretz-L-cells can be applied to a very wide range of applications.
- a porous titanium oxide film composed of ultrafine particles cannot cope with the flexibility of the film, and has a problem that cracks and peeling are likely to occur.
- a nonionic surfactant "TR I TON X—100” is used for the purpose of reducing cracks in the coating film when applying the titanium oxide paste. Is added, but “TRITON X-100” is added as much as 40% by mass with respect to titanium oxide, which may hinder electron transfer in the titanium oxide film. .
- WO 00/7 2 3 7 3 discloses, by applying a 1 0 0 ⁇ 1 0 0 0 k pressure GZC m 2 of titanium oxide film, without sintering the titanium oxide, the titanium oxide film Ensures mechanical strength and electron transmission path.
- the feature is that the binder is not contained in the titanium oxide film in order to avoid the inhibition of electron transfer in the titanium oxide film by the binder.
- the present inventors have confirmed that by applying a large pressure to the titanium oxide film, it is possible to obtain a titanium oxide film having a certain degree of mechanical strength. There was a problem that the adhesion was weak and the titanium oxide film was easily peeled off. Disclosure of the invention
- the photoelectric conversion element of the present invention includes: a first electrode on which a semiconductor layer carrying a sensitizing dye is attached; a second electrode facing the semiconductor layer of the first electrode; and the first electrode.
- a photoelectric conversion element comprising: an electrolyte layer disposed between the semiconductor layer and the second electrode; wherein the semiconductor layer includes semiconductor particles and a binder; and The degree is in the range of 40 to 80%.
- the method for manufacturing a photoelectric conversion element of the present invention includes: a first electrode on which a semiconductor layer supporting a sensitizing dye is adhered; and a second electrode facing the semiconductor layer of the first electrode.
- a method for manufacturing a photoelectric conversion element comprising: an electrolyte layer disposed between the semiconductor layer of the first electrode and the second electrode; The method is characterized in that the semiconductor layer is formed by applying a pressure of 20 to 200 MPa after applying to the first electrode and drying.
- FIG. 1 is a schematic sectional view showing an example of the photoelectric conversion element of the present invention.
- the present invention can solve the above-mentioned conventional problems, can secure a transmission path of photoexcited electrons without sintering at a high temperature, and can cope with the flexibility of a substrate.
- An object of the present invention is to provide a photoelectric conversion element using a semiconductor layer having a strong adhesion and exhibiting excellent photoelectric conversion characteristics, and a method for manufacturing the same.
- embodiments of the present invention will be described.
- One example of the photoelectric conversion element of the present invention includes: a first electrode on which a semiconductor layer supporting a sensitizing dye is adhered; a second electrode facing the semiconductor layer of the first electrode; A photoelectric conversion element comprising: an electrolyte layer disposed between the semiconductor layer of the first electrode and the second electrode; wherein the semiconductor layer includes semiconductor particles and a binder; and The porosity of the layer is in the range of 40-80%.
- the semiconductor layer contains the semiconductor particles and the binder, a semiconductor layer having a strong adhesive force capable of coping with the flexibility of the base material can be realized.
- the porosity of the semiconductor layer is in the range of 40 to 80%, a transmission path of photoexcited electrons can be secured without sintering at a high temperature, and the conversion efficiency can be improved.
- a ratio of the binder contained in the semiconductor layer is in a range of 0.2 to 10% by mass with respect to all components forming the semiconductor layer. This is because the conversion efficiency becomes higher within this range.
- the binder may be a cellulose derivative, a rubber-like hydrophilic polymer, a homopolymer or copolymer of N-vinylacetamide, polyethylene oxide, sodium alginate, polyacrylic acid, Its salts, polybierphenol, polybier methyl ether, polyvinyl alcohol, polyvinylpyrrolidone, polyacrylamide, polyhydroxy (meth) acrylate, polyvinyl acetal, styrene-maleic acid copolymer, polyethylene glycol, starch oxide, phosphorylation Selected from the group consisting of starch, casein and polyolefin It is preferable to include at least one of them. This is because these have a strong adhesive force and a high flexibility, so that it is possible to realize a semiconductor layer that can flexibly respond to the flexibility of the base material.
- the photoelectric conversion element of the present embodiment is preferably configured such that the first electrode is formed by attaching an electrode portion to a synthetic resin film. This is because mass production of the electrodes becomes easy, and the production cost can be reduced.
- the synthetic resin film is a polyethylene terephthalate film, a polyethylene naphthalate film, a polyethersulfone film, a polyarylate film, a polyimide film, a cycloolefin polymer film, and a norpollenene film. It is preferably one type selected from the group consisting of resin films. This is because these films are particularly excellent in toughness and heat resistance.
- an example of a method for manufacturing a photoelectric conversion element of the present invention includes a first electrode on which a semiconductor layer supporting a sensitizing dye is attached, and a second electrode facing the semiconductor layer of the first electrode.
- a method for manufacturing a photoelectric conversion element comprising: an electrode; and an electrolyte layer disposed between the semiconductor layer of the first electrode and the second electrode, wherein the semiconductor layer includes semiconductor particles and a binder. Is applied to the first electrode, dried, and then pressed at a pressure of 20 to 200 MPa.
- the semiconductor layer is formed by applying a solution containing semiconductor particles and a binder to the first electrode, drying the solution, and pressing the solution at a pressure of 20 to 200 MPa. Even without sintering at a high temperature, a transmission path for photoexcited electrons can be ensured, and a semiconductor layer having a strong adhesion that can cope with the flexibility of the substrate can be formed.
- the material of the semiconductor particles contained in the semiconductor layer is titanium oxide; Before and after pressing at a pressure of 200 MPa, the half-width of the diffraction intensity peak attributed to the (101) plane of the anatase-type crystal structure of the titanium oxide measured by X-ray diffraction analysis was reduced. Preferably, the rate is in the range of 5-50%. If the material of the semiconductor particles contained in the semiconductor layer is titanium oxide, it is possible to avoid photodissolution in the electrolytic solution and obtain high photoelectric conversion characteristics.
- the crystal particle diameter of the titanium oxide particles increases, and the titanium oxide particles adhere to each other, so that a path of the photo-excited electrons can be formed in the semiconductor layer,
- the semiconductor layer having an appropriate porosity can be formed.
- the ratio of the binder contained in the semiconductor layer is in the range of 0.2 to 10% by mass with respect to all components forming the semiconductor layer. Is preferred. This is because the conversion efficiency is higher within this range.
- the binder may be a cellulose derivative, a rubbery polymer, a homopolymer or copolymer of N-vinylacetamide, polyethylene oxide, sodium alginate, Acrylic acid and its salts, polyvinylphenol, polyvinylmethylether, polyvinylalcohol, polyvinylpyrrolidone, polyacrylamide, polyhydroxy (meth) acrylate, polybiercetal, styrene-maleic acid copolymer, polyethylene glycol, starch oxide, It preferably contains at least one selected from the group consisting of phosphorylated starch, casein and polyolefin. This is because these have strong adhesiveness and high flexibility, so that a semiconductor layer that can respond flexibly to the flexibility of the base material can be manufactured.
- the first electrode is formed by attaching an electrode portion to a synthetic resin film. This is because the mass production of the electrodes becomes easy and the manufacturing cost can be reduced.
- the synthetic resin film may be a polyethylene terephthalate film, a polyethylene naphthalene film, a film, a polyester sulfone film, a polyarylate film, a polyimide film, a cycloimide film. It is preferably one type selected from the group consisting of a refin polymer film and a norpolene resin film. This is because these films are particularly excellent in toughness and heat resistance.
- FIG. 1 is a schematic sectional view showing an example of the photoelectric conversion element of the present invention.
- the photoelectric conversion element 1 of the present embodiment has an electrode 5 (first electrode) formed on one surface of a substrate 3. On one surface of the electrode 5, a semiconductor layer 7 carrying a sensitizing dye is formed. Further, a counter electrode 9 (second electrode) exists opposite the semiconductor layer 7 on which the sensitizing dye is carried. The counter electrode 9 is formed on one surface of another substrate 11. An electrolyte layer 13 exists between the semiconductor layer 7 and the counter electrode 9.
- the present inventors have made intensive efforts to solve the conventional problem, and as a result, by forming the semiconductor layer 7 with semiconductor particles and a binder, the transmission path of photoexcited electrons can be achieved without sintering at high temperature. It has been found that a photoelectric conversion element having excellent photoelectric conversion characteristics can be realized using a semiconductor layer having a strong adhesion that can be secured and can cope with the flexibility of the substrate.
- the effect of the addition of the binder (binder effect) in the present invention is an effect of reducing cracks generated in the semiconductor layer 7 and an effect of improving the adhesion between the semiconductor layer 7 and the flexible base material. is there.
- the present inventors have selected a binder that can provide a sufficient binder effect with a small amount of addition, and apply pressure to the semiconductor layer 7 to which the binder has been added, so that sintering is unnecessary and the base material is not required. It was found that a porous semiconductor layer 7 having excellent adhesiveness could be formed, and the problem that had been feared by conventional knowledge could be solved.
- examples of the binder capable of obtaining a sufficient binder effect by adding such a small amount include a cellulose derivative, a rubbery elastic polymer, a homopolymer or copolymer of N-vinylacetamide, polyethylene oxide, Sodium alginate, polyacrylic acid and its salts, polyvinyl phenol, polyvinyl methyl ether, polyvinyl alcohol, polyvinyl pyrrolidone, polyacrylamide, polyhydroxy (meth) acrylate, polyvinyl acetal, styrene-maleic acid copolymer, polyethylene glycol , Oxidized starch, phosphorylated starch, casein, polyolefin and the like can be used alone or in combination.
- a cellulose derivative is more preferable because it can bind semiconductor particles with a small amount when compared with other binders having the same molecular weight.
- the cellulose derivative include cellulose, methylcellulose, ethylcellulose, hydroxypropylcellulose, hydroxypropylmethylcellulose, hydroxyethylcellulose, hydroxymethylcellulose, carboxymethylcellulose, and diacetyl.
- examples include cellulose.
- the cellulose derivative may be in the form of a sodium salt or an ammonium salt.
- the rubber-like elastic polymer is more preferable because the flexibility of the base material can reduce the strain generated in the semiconductor layer 7 and increase the adhesion between the base material and the semiconductor layer 7.
- the rubber-like elastic polymer include natural rubber, isoprene rubber, butadiene rubber, butyl rubber, silicon rubber, fluorine rubber, polystyrene rubber, nitrile rubber, polystyrene butadiene rubber, chloroprene rubber, urethane rubber, polystyrene ethylene rubber, and ethylene.
- Examples include propylene gemethylene copolymer, polyacetylene, and polyurethane rubber.
- the rubbery elastic polymer may contain a polar group such as a propyloxyl group or an alkoxycarbonyl group.
- thermosetting and solvent-insoluble resins include organic solvents which are components of the electrolyte layer 13 in the semiconductor layer 7. It is more preferable because it can impart resistance to the
- polyvinyl acetal can be used as a thermosetting and solvent-insoluble resin by performing a crosslinking reaction with a phenol resin, an epoxy resin, a melamine resin, an isocyanate, a dialdehyde, and the like.
- the porosity of the semiconductor layer 7 needs to be in the range of 40 to 80%.
- the porosity in the present invention is defined as the total volume of the pores contained in the semiconductor layer 7 as the pore volume, and is expressed as a percentage of the pore volume with respect to the total volume including the pores of the semiconductor layer 7. .
- the adsorption / desorption isotherm was measured using a pore distribution measuring device “ASAP 210” (manufactured by Micrometritics), and from the BJH desorption pore distribution plot, the pore diameter was 1 Calculate by integrating the volume of each pore within the range of 7 to 300 nm.
- the total volume of the layer 7 including the pores is the sum of the pore volume and the volume of the solid component of the semiconductor layer 7, and the volume of the solid component of the semiconductor layer 7 is the density of the solid component using a hydrometer. Can be measured and determined.
- the porosity of the semiconductor layer 7 is smaller than 40%, the contact area between the semiconductor layer 7 and the electrolyte solution is reduced, and the photoelectric conversion characteristics are reduced.
- the porosity of the semiconductor layer 7 exceeds 80%, the semiconductor layer 7 becomes brittle, and the adhesion to a flexible substrate deteriorates.
- the type of press for applying pressure to form the semiconductor layer 7 is not particularly limited, such as a flat plate press or a roll press.However, a roll press is a roll-to-roll type when a conductive film is used as a base material. This is preferable because it can be produced continuously.
- release material when applying pressure to the semiconductor layer 7, it is preferable to sandwich a release material between the press and the semiconductor layer 7. Thereby, the case where the semiconductor layer 7 adheres to the press and peels off from the electrode 5 is eliminated.
- the release materials used are polytetrafluoroethylene (PTF E), polychlorinated ethylene trifluoride (PCTFE), tetrafluoroethylene titanium hexafluoropropylene copolymer (FEP), and perfluoroalkoxy fluoride.
- PVDF polyvinylidene fluoride
- EDF E ethylene tetrafluoride ethylene copolymer
- ECTFE ethylene black ethylene trifluoride copolymer
- PVF polyvinyl fluoride
- the present inventors confirmed with a scanning electron microscope that when titanium oxide particles were used as the semiconductor particles contained in the semiconductor layer 7, the particle size of the titanium oxide particles increased when pressure was applied to the semiconductor layer 7. are doing.
- the increase in the particle size of the titanium oxide particles was due to the half width of the diffraction intensity peak attributed to the (101) plane of the anatase crystal structure of titanium oxide measured by X-ray diffraction analysis. It was found to correlate with the decrease. That is, when pressure is applied to the titanium oxide particles, adjacent titanium oxide particles are combined. It is speculated that the crystal growth proceeds and the particle size of the titanium oxide particles increases.
- the half-value width of the diffraction intensity peak attributed to the (101) plane of the anatase crystal structure of titanium oxide was determined using an X-ray diffraction analyzer "RINT 250 V / PC" (manufactured by Rigaku Corporation). It can be determined by measuring the X-ray diffraction profile of the semiconductor layer 7 containing titanium oxide.
- the reduction rate of the half-width in the present invention is a numerical value expressed as a percentage of the reduction in the half-width of the semiconductor layer 7 containing titanium oxide after pressing with respect to the half-width of the semiconductor layer 7 containing titanium oxide before pressing. It is.
- glass or a film is used as the material of the substrate 3, but it is preferable to use a flexible film as the base material because pressure can be easily applied to the semiconductor layer 7. Further, since the substrate 3 functions as a light incident substrate, the film is preferably transparent.
- Transparent films include regenerated cellulose film, diacetate cellulose film, triacetate cellulose film, tetraacetyl cellulose film, polyethylene film, polypropylene film, polyvinyl chloride film, polyvinylidene chloride film, polyvinyl alcohol film, Polyethylene terephthalate film, Polycarbonate film, Polyethylene naphthalate film, Polyethersulfone film, Polyetheretherketone film, Polysulfone film, Polyetherimide film, Polyimide film, Polyarylate film, Cyclone Refin polymer film, norpolene resin film, polystyrene film, rubber hydrochloride film, nylon film Lum, Poria Kurire one Tofuirumu, polyvinyl fluoride film, and the like poly tetrafluoroethylene modified Chile emission film.
- polyethylene terephthalate Films polyethylene naphthalate films, polyethersulfone films, polyimide films, polyarylate films, cycloolefin polymer films, and norpolene resin films are preferred because of their toughness and excellent heat resistance.
- a metal foil such as nickel, zinc, and titanium can be used as the film of the substrate 3.
- the particle size of the semiconductor particles is preferably in the range of 5 to 100 nm. Within this range, the pore size of the semiconductor layer 7 becomes an appropriate pore size, and the electrolyte sufficiently penetrates into the semiconductor layer 7 so that excellent photoelectric conversion characteristics can be obtained.
- a particularly preferred particle size range of the semiconductor particles is 10 to: L00 nm.
- the thickness of the semiconductor layer 7 is preferably in the range of 0.1 to 100 xm. Within this range, a sufficient photoelectric conversion effect can be obtained, and the transparency to visible light and near-infrared light does not deteriorate.
- a more preferred range of the film thickness of the semiconductor layer 7 is 1 to 50 m, a particularly preferred range is 5 to 30 m, and a most preferred range is 10 to 20 m.
- the semiconductor layer 7 is formed by applying a solution containing semiconductor particles and a binder by, for example, a coating method using a doctor blade or a barco, a spray method, a dip coating method, a screen printing method, a spin coating method, or the like.
- the semiconductor layer 7 can be formed by applying the solution on the surface of the electrode 5 and then applying pressure by the press.
- Semiconductor materials include cd, Zn, In, Pb, Mo, W, Sb, Bi, Cu, Hg, Ti, Ag, Mn, Fe, V, Sn, Zr, Sr , G a, S i, oxides of metal elements such as C r, S r T i ⁇ 3, C a T i O 3 Bae such Ropusukai bets, or C d S, Z n S, I n 2 S 3 P b S, M o 2 S, WS 2, S b 2 S 3, B i 2 S 3, Z n C d S 2, sulfides such as C u 2 S, C d S e, I n 2 S e 3, WS e 2 , Hg S, P b S e , C dT e like metal chalcogenide de, other G a a s S i, S e, C d 2 P 3, Z n 2 P 3, I n P, a g B r
- C d S / C d S e C d y Z n! _ y S such as C d S ZH g S ZC d S is Can be Among them, T I_ ⁇ 2, in Gurettsueru cell, preferred in terms of avoiding a high photoelectric conversion ⁇ of photodissolution the electrolytic solution.
- the same material as the substrate 3 can be used for the substrate 11.
- the transmissivity of the substrate 11 may be either transparent or opaque, but is preferably transparent because light can be incident from both substrates.
- the substrate 11 is preferably made of the above-mentioned translucent material.
- the electrode 5 formed on one surface of the substrate 3 functions as a negative electrode of the photoelectric conversion element 1 and is formed of metal itself or formed by laminating a conductive agent layer on a film.
- Preferred conductive agents are metals, for example, platinum, gold, silver, copper, aluminum, rhodium, indium, etc., or carbon or conductive metal oxides, for example, doped with indium-tin-tin composite oxide, antimony. Tin oxide, fluorine-doped tin oxide, and the like.
- the preferred range of the surface resistance is 50 ⁇ / square or less, and more preferably 30 ⁇ square or less. It is. There is no particular lower limit, but it is usually 0.1 ⁇ square.
- the preferable range of the light transmittance is 50% or more, and more preferably 80% or more.
- the thickness of the electrode 5 is preferably in the range of 0.1 to 10 m. Within this range, an electrode film having a uniform thickness can be formed, and sufficient light can be incident on the semiconductor layer 7 without reducing the light transmittance.
- a transparent electrode 5 it is preferable that light be incident from the electrode 5 on the side on which the semiconductor layer 7 carrying the sensitizing dye is applied.
- the counter electrode 9 functions as a positive electrode of the photoelectric conversion element 1, and can be formed in the same manner as the electrode 5 on the side on which the semiconductor layer 7 supporting the sensitizing dye is attached.
- a material having a catalytic action of giving electrons to a reduced form of the electrolyte in order to efficiently act as a positive electrode of the photoelectric conversion element 1.
- Such materials include, for example, metals such as platinum, gold, silver, copper, aluminum, rhodium, and indium, or graphite, carbon carrying platinum, or an oxide tin composite oxide, or an oxide doped with antimony.
- the substrate 11 on which the counter electrode 9 is provided may have a transparent conductive film (not shown) on the surface on which the counter electrode 9 is to be attached.
- This transparent conductive film can be formed, for example, from the same material as the electrode 5 described above.
- the counter electrode 9 is also preferably transparent.
- any dye commonly used in conventional dye-sensitized photoelectric conversion elements can be used.
- Such dyes include, for example, RuL 2 (H 20 ) 2 type ruthenium-cis diaqua bipyridyl complex or ruthenium mutris (RuL 3 ), ruthenium-bis (RuL 2 ), osmium Transition of tris ( ⁇ s L 3 ) and osmium (bis L 2 ) types Transfer metal complexes (wherein L represents 4,4'-dicarpoxyl-2,2'-bipyridine), or zinc-tetra (4-caproloxyphenyl) porphyrin, iron-hexocyanide complex, phthalocyanine, etc. .
- Organic dyes include 9-phenylxanthene dyes, coumarin dyes, acridine dyes, triphenylmethane dyes, tetraphenylmethane dyes, quinone dyes, azo dyes, indigo dyes, cyanine dyes, Examples include merocyanine dyes and xanthene dyes.
- a ruthenium-bis (Ru L 2 ) derivative is particularly preferable because it has a broad absorption spectrum in a visible light region.
- the method of supporting the sensitizing dye on the semiconductor layer 7 includes, for example, a method of immersing the substrate 3 provided with the electrode 5 on which the semiconductor layer 7 is applied in a solution in which the sensitizing dye is dissolved.
- a solvent for this solution any solvent can be used as long as it can dissolve the sensitizing dye such as water, alcohol, toluene and dimethylformamide.
- the immersion method when the substrate 3 provided with the electrode 5 on which the semiconductor layer 7 is applied is immersed in the sensitizing dye solution for a certain period of time, heat reflux or application of ultrasonic waves is performed. Can also. After the dye is loaded on the semiconductor layer 7, it is preferable to wash with alcohol or heat and reflux to remove the sensitizing dye remaining on the semiconductor layer 7 without being loaded.
- the supported amount of the sensitizing dye to the semiconductor particles may be within the range of 1x1 0- 8 ⁇ lxl 0 one 6 mo 1 / cm 2, in particular 0. 1 x1 0- 7 ⁇ 9. Ox 1 0- 7 mo 1 / cm 2 is preferred. This is because within this range, the effect of improving the photoelectric conversion efficiency can be obtained economically and sufficiently.
- the electrolyte used in the electrolyte layer 13 in the photoelectric conversion element 1 of the present embodiment is not particularly limited as long as a pair of redox-based constituent substances composed of an oxidant and a reductant is contained in a solvent.
- An oxidation-reduction constituent material in which the oxidized form and the reduced form have the same charge is preferable.
- Redox constituents in the present invention Quality means a pair of substances that are reversibly present in an oxidized and reduced form in a redox reaction.
- Examples of the oxidation-reduction constituent materials that can be used in the present embodiment include: chlorine compound monochlorine, iodine compound monoiodine, bromine compound—bromine, thallium ion (III) —thallium ion (0, mercury ion ( ⁇ ) —mercury silver ion (1), ruthenium ion (III) -ruthenium ion (11), copper ion (II), copper ion (1), iron ion (III)-iron ion (11), vanadium ion (III)-vanadium Ion (11), manganate ion-permanganate ion, ferricyanide-ferrocyanide, quinone monohydroquinone, fumaric acid-succinic acid, etc.
- Iodine compounds are preferably iodine, and the iodine compounds are lithium iodide, metal iodides such as lithium iodide, and tetraalkylammonium compounds.
- Disilazide, ® ⁇ of quaternary Anmoniumu salt compounds such pyridinylbenzoyloxy ⁇ Muyo over disilazide, iodide Imidazoriumu compounds such as iodide dimethylpropylimidazolium Riu beam is particularly preferred.
- the solvent used for dissolving the electrolyte is preferably a compound that dissolves a redox constituent material and has excellent ion conductivity.
- the solvent any of an aqueous solvent and an organic solvent can be used, but an organic solvent is preferable in order to further stabilize the oxidation-reduction-type constituent material.
- Ether compounds such as getyl ether, 1,2-dimethoxyethane, 1,3-dioxosilane, tetrahydrofuran, and 2-methyltetrahydrofuran; heterocyclic compounds such as 3-methyl-2-oxazodilinone and 2-methylpyrrolidone; acetonitrile; Ditolyl compounds such as methoxyacetonitrile and propionitrile, sulfolane, didimethylsulfoxide, Aprotic polar compounds such as methylformamide; Each of these can be used alone, or two or more can be used in combination.
- carbonate compounds such as ethylene carbonate and propylene carbonate
- heterocyclic compounds such as 3-methyl-2-oxazolidinone and 2-methylpyrrolidone
- acetonitrile methoxyacetonitrile
- propionitrile propionitrile
- 3-methoxypropionitrile ditolyl compounds
- CMC carboxymethylcellulose
- This dispersion was applied to a polyethylene terephthalate (PET) film coated with indium-tin composite oxide (ITO) manufactured by Oji Tobi (thickness: 125 m, sheet resistance: 10 ⁇ square). I I ⁇ film), and coated with a brush, dried with warm air to form a titanium oxide film on the film.
- the pressure shown in Table 1 was applied to the titanium oxide film with a press to form a titanium oxide film having a thickness of 8.
- a Nitto Denko fluorinated resin processed sheet "Nitoflon” was sandwiched between the press and the titanium oxide film. This is to improve the releasability between the pressing machine and the titanium oxide film and to prevent the titanium oxide film from peeling off from the ITO PET film.
- the pore volume of the obtained titanium oxide film was measured using the pore distribution analyzer "ASAP 2
- the adsorption / desorption isotherm was measured with 0 10 "(Micromic ritics), and from the BJH desorption pore distribution plot, each pore whose pore diameter was in the range of 1.7 to 300 nm was obtained.
- the density of the solid component of the obtained titanium oxide film was measured with a hydrometer to determine the volume of the solid component.
- the porosity of the obtained titanium oxide film was calculated from the volume of the solid component, and the porosity of the obtained titanium oxide film was 64% at a pressure of 20 MPa and at a pressure of 100 MPa. It was 40% at a pressure of 48% and a pressure of 20 OMPa.
- the IT ⁇ / PET film provided with this titanium oxide film was sensitized with [Ru (4,4 'dicarboxyl-2,2'-bipyridine) 2 (NCS) 2 ] bis-tetrabutylammonium.
- the semiconductor electrode thus obtained and the counter electrode were brought into contact with an electrolyte solution to form a photoelectric conversion element.
- an ITOZPET film manufactured by Oji Tobi Co. on which platinum was deposited to a thickness of 20 nm, was used as a counter electrode.
- a “Byne 1” sheet (thickness: 30 m) manufactured by DuPont which is a hot melt resin, was attached as a spacer around the titanium oxide film. This "By ne 1" sheet also functions as a sealing material for the electrolyte solution.
- a polybutylene terephthalate is placed between the titanium oxide film and the counter electrode. Evening rate (PBT) nonwoven fabric is sandwiched.
- PBT Evening rate
- electrolyte solution 0. 5 mo 1 and lithium iodide Zdm 3 0. 0 5mo l Zdm 3 of iodine, a 0.5 3-methoxamine Shipuropio nitrile containing 4 one tert- heptyl pyridine mo 1 ZDM 3 Using. Conversion efficiency of the photoelectric conversion device of this embodiment, pseudo-sunlight (AM I. 5, 1 OmW / cm 2) was measured by irradiating the sample cell (light receiving area 0. 64 cm 2). Table 1 shows the results.
- a binder solution was prepared by dissolving ethyl cellulose "N300” manufactured by Honeycules in ethanol at the ratio shown in Table 2. 6 g of titanium oxide "P25” manufactured by Nippon Aerosil Co., Ltd. was added to 24 g of the binder solution, and the mixture was passed through a planetary pole mill to prepare a dispersion of titanium oxide. The content of titanium oxide in the dispersion was adjusted to be 20% by mass. This dispersion was applied to a polyethylene naphthalate (PEN) film (thickness: 125 mm2) coated with indium-tin-tin oxide (ITO) manufactured by Oji Tobi.
- PEN polyethylene naphthalate
- ITO indium-tin-tin oxide
- the ratio of ethyl cellulose is the ratio of the mass of ethyl cellulose to the mass of the entire pinda solution
- the binder addition ratio is the ratio of the mass of ethyl cellulose to the mass of the entire titanium oxide film. is there.
- the presence or absence of film peeling was determined by pressing the titanium oxide film and then coating the titanium oxide film on the I TOZP EN film with 99% or more of the applied area (0.64 cm 2 ) (0.6% in area). (3 cm 2 or more) When there was, it was evaluated as “absent”, and when it was less than that, it was evaluated as “present”.
- CMC carboxymethylcellulose
- SBR polystyrene butadiene rubber
- This dispersion is applied to Oto Tobi's I TOZPEN film (thickness: 125 im, sheet resistance: 10 ⁇ / square) with a brush, dried with warm air, and dried on a titanium oxide film.
- a pressure of 100 MPa was applied by a press machine to form a titanium oxide film having a length of 20 mm, a width of 20 mm, and a thickness of 12 m.
- the press surface of the press was coated with a fluororesin to improve the releasability between the titanium oxide film and the press surface.
- the porosity of the obtained titanium oxide film was measured by the method described in Example 1, and was 48% when the SBR addition ratio was 0% by mass and 42% when the 381 addition ratio was 1.0%.
- a cellophane tape having a width of 12 mm was attached to the titanium oxide film thus obtained, and a peeling test (90 ° peeling test) was performed in which the cellophane tape was pulled at an angle of 90 ° with respect to the adhered surface.
- a peeling test 90 ° peeling test
- the SBR addition ratio is the ratio of the mass of SBR to the total mass of the titanium oxide dispersion
- the binder addition ratio is the ratio of ethyl cellulose and SBR to the total mass of the titanium oxide film. It is the ratio of the total mass.
- This dispersion is applied to Oji Tobi's I TO PEN film (thickness: 125 m, sheet resistance: 10 ⁇ / square).
- the film was coated with a brush and dried with warm air to form a titanium oxide film on the film.
- the titanium oxide film on the ITO / PEN film was left in a drier set at 60 for 20 hours, and the polyvinyl butyral in the titanium oxide film was crosslinked with isocyanate.
- a pressure of 100 MPa was applied to the titanium oxide film with a press machine to form a 15 / m-thick titanium oxide film.
- the press surface of the press was coated with a fluororesin to improve the releasability between the titanium oxide film and the press surface.
- the porosity of the obtained titanium oxide film was measured by the method described in Example 1, and was 58%.
- the titanium oxide film thus obtained was subjected to a procedure similar to that of Example 3 to 90. A peel test was performed. The obtained titanium oxide film did not undergo interface destruction from the ITO / PEN film and did not undergo cohesive failure.
- An ethanol solution was prepared by dissolving 0.5% by mass of ethyl cellulose "N300" manufactured by Honeycules. To 24 g of this ethanol solution was added 6 g of titanium oxide "P25” manufactured by Nippon Aerosil Co., Ltd., and the mixture was passed through a planetary pole mill to prepare a dispersion of titanium oxide. The content of titanium oxide in the dispersion was 20% by mass, and the content of ethyl cellulose was 2% by mass. This dispersion was applied to Oto Tobi's I TOZP EN film (thickness: 125 xm, sheet resistance: 10 ⁇ / square) by a brush, dried with warm air, and dried on a titanium oxide film. Was formed.
- the pressure shown in Table 4 was applied to the titanium oxide film using a press to form a titanium oxide film.
- the press surface of the press was coated with a fluororesin to improve the releasability between the titanium oxide film and the press surface.
- the porosity of the obtained titanium oxide film was measured by the method described in Example 1, and the results are shown in Table 4.
- the semiconductor electrode manufactured in this manner was assembled into a photoelectric conversion element in the same manner as in Example 1, and simulated sunlight (AM 1.5, 1 OmW / cm 2 ) was applied.
- the sample was irradiated with a sample cell (light receiving area: 0.64 cm 2 ), and the conversion efficiency was measured. Table 4 shows the results.
- a titanium oxide film was formed on an ITO / PEN film (thickness: 125 m, sheet resistance: 10 ⁇ / square) manufactured by Oji Tobi Co., Ltd.
- a titanium oxide film was formed by applying the pressure shown in Table 5 to the titanium oxide film using a press.
- the press surface of the press machine was coated with a fluororesin to improve the releasability between the titanium oxide film and the press surface.
- the X-ray diffraction profile of the obtained titanium oxide film was measured with an X-ray diffraction analyzer "RINT 2500 V / PC" (manufactured by Rigaku Corporation).
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- Chemical Kinetics & Catalysis (AREA)
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- General Chemical & Material Sciences (AREA)
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Abstract
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Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP03733413A EP1437790B1 (en) | 2002-06-14 | 2003-06-13 | Photoelectric transducer and its manufacturing method |
| AU2003242373A AU2003242373B9 (en) | 2002-06-14 | 2003-06-13 | Photoelectric transducer and its manufacturing method |
| US10/489,793 US7224036B2 (en) | 2002-06-14 | 2003-06-13 | Photoelectric transducer and its manufacturing method |
| JP2004514176A JP4086037B2 (ja) | 2002-06-14 | 2003-06-13 | 光電変換素子の製造方法 |
| US11/787,805 US7422923B2 (en) | 2002-06-14 | 2007-04-18 | Photoelectric transducer and its manufacturing method |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002-174864 | 2002-06-14 | ||
| JP2002174864 | 2002-06-14 |
Related Child Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US10489793 A-371-Of-International | 2003-06-13 | ||
| US11/787,805 Division US7422923B2 (en) | 2002-06-14 | 2007-04-18 | Photoelectric transducer and its manufacturing method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2003107471A1 true WO2003107471A1 (ja) | 2003-12-24 |
Family
ID=29727996
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2003/007531 Ceased WO2003107471A1 (ja) | 2002-06-14 | 2003-06-13 | 光電変換素子及びその製造方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US7224036B2 (ja) |
| EP (1) | EP1437790B1 (ja) |
| JP (1) | JP4086037B2 (ja) |
| CN (1) | CN1288794C (ja) |
| AU (1) | AU2003242373B9 (ja) |
| WO (1) | WO2003107471A1 (ja) |
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| JP2013258127A (ja) * | 2011-11-25 | 2013-12-26 | Tokyo Univ Of Science | 色素増感太陽電池用光電極とその製造方法および色素増感太陽電池 |
| WO2014017535A1 (ja) * | 2012-07-27 | 2014-01-30 | 株式会社ダイセル | 光電変換層用組成物および光電変換素子 |
| WO2014017536A1 (ja) * | 2012-07-27 | 2014-01-30 | 株式会社ダイセル | 光電変換層用組成物および光電変換素子 |
| JP2018101786A (ja) * | 2017-12-28 | 2018-06-28 | 京都エレックス株式会社 | 電子デバイス、および電子デバイス用無機粒子含有機能膜形成用組成物 |
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Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011142010A (ja) * | 2010-01-07 | 2011-07-21 | Nisshin Steel Co Ltd | 色素増感型太陽電池用光電極の製造方法 |
| JP2013069557A (ja) * | 2011-09-22 | 2013-04-18 | Osaka Gas Co Ltd | 電解液及び光電変換素子 |
| JP2013258127A (ja) * | 2011-11-25 | 2013-12-26 | Tokyo Univ Of Science | 色素増感太陽電池用光電極とその製造方法および色素増感太陽電池 |
| WO2014017535A1 (ja) * | 2012-07-27 | 2014-01-30 | 株式会社ダイセル | 光電変換層用組成物および光電変換素子 |
| WO2014017536A1 (ja) * | 2012-07-27 | 2014-01-30 | 株式会社ダイセル | 光電変換層用組成物および光電変換素子 |
| JPWO2014017535A1 (ja) * | 2012-07-27 | 2016-07-11 | 株式会社ダイセル | 光電変換層用組成物および光電変換素子 |
| JPWO2014017536A1 (ja) * | 2012-07-27 | 2016-07-11 | 株式会社ダイセル | 光電変換層用組成物および光電変換素子 |
| US10270050B2 (en) | 2012-07-27 | 2019-04-23 | Daicel Corporation | Photoelectric conversion layer composition and photoelectric conversion element |
| US10395846B2 (en) | 2012-07-27 | 2019-08-27 | Daicel Corporation | Photoelectric conversion layer composition and photoelectric conversion element |
| JP2018101786A (ja) * | 2017-12-28 | 2018-06-28 | 京都エレックス株式会社 | 電子デバイス、および電子デバイス用無機粒子含有機能膜形成用組成物 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1437790A1 (en) | 2004-07-14 |
| EP1437790B1 (en) | 2012-08-08 |
| AU2003242373B2 (en) | 2005-07-21 |
| EP1437790A4 (en) | 2010-05-12 |
| JP4086037B2 (ja) | 2008-05-14 |
| CN1610987A (zh) | 2005-04-27 |
| CN1288794C (zh) | 2006-12-06 |
| US7422923B2 (en) | 2008-09-09 |
| US20040232506A1 (en) | 2004-11-25 |
| US20070194311A1 (en) | 2007-08-23 |
| US7224036B2 (en) | 2007-05-29 |
| AU2003242373A1 (en) | 2003-12-31 |
| JPWO2003107471A1 (ja) | 2005-10-20 |
| AU2003242373B9 (en) | 2005-08-11 |
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