WO2006079096A2 - Systemes optiques ioniques - Google Patents

Systemes optiques ioniques Download PDF

Info

Publication number
WO2006079096A2
WO2006079096A2 PCT/US2006/002596 US2006002596W WO2006079096A2 WO 2006079096 A2 WO2006079096 A2 WO 2006079096A2 US 2006002596 W US2006002596 W US 2006002596W WO 2006079096 A2 WO2006079096 A2 WO 2006079096A2
Authority
WO
WIPO (PCT)
Prior art keywords
ion
condenser
optics system
condensers
ions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2006/002596
Other languages
English (en)
Other versions
WO2006079096A3 (fr
Inventor
Marvin L. Vestal
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nordion Inc
Applied Biosystems Inc
Original Assignee
MDS Inc
Applera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MDS Inc, Applera Corp filed Critical MDS Inc
Publication of WO2006079096A2 publication Critical patent/WO2006079096A2/fr
Publication of WO2006079096A3 publication Critical patent/WO2006079096A3/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/05—Arrangements for energy or mass analysis
    • H01J2237/053—Arrangements for energy or mass analysis electrostatic

Definitions

  • a major factor limiting resolving power can be the spread in kinetic energy of the ions
  • an ion mirror is often employed to compensate for, to first or second order, the effect of kinetic energy on flight time, thereby improving the resolving power of the TOF instrument.
  • One property of prior art ion mirrors is that they produce energy dispersion whereby ions of differing kinetic energies may be time focused at a particular focal plane, but are displaced in a direction parallel to the plane according to their kinetic energies, hi many applications this may not be a problem, but in others it can limit both the resolving power and the sensitivity of the mass analyzer.
  • ion optics systems comprising four or more ion condensers each with a deflection angle, ⁇ , less than or equal to about ⁇ radians, where a parallel input ion beam yields a substantially parallel output ion beam with no magnification and where the transit time through the condenser is independent of the displacement of an entering trajectory from the nominal axis.
  • the ion optics system comprises an ion selector.
  • an ion optics system comprises two or more pairs of ion condensers where the members of each pair of ion condensers are disposed on opposite sides of a first plane such that the first member of a pair of ion condensers has a position that is substantially mirror-symmetric about the first plane relative to the position of the second member of the pair, each of the ion condensers having a deflection angle, ⁇ , less than or equal to about ⁇ radians, and at least one ion selector positioned between two of the ion condensers, for example, to prevent the transmission of ions with select kinetic energies.
  • Suitable ion selectors include any structure that can prevent the transmission of ions based on
  • These ions can experience elliptical trajectories (orbits) in the ion condenser.
  • ion condensers can be employed in the ion optics systems of the present teachings including, but not limited to, spherical, cylindrical and toroidal ion condensers. It is to be understood that the ion condensers in the figures are illustrated schematically. For example, ion condensers typically comprise multiple elements for establishing the electrical fields therein, and can contain guard electrodes to prevent stray electrical fields from entering field-free regions. Further, it is to be understood that although various electrical potentials are noted as zero or ground, this is purely for convenience of notation and conciseness in the equations appearing herein.
  • the present teachings provide an ion optics system comprising two or more of pairs of ion condensers where the members of each pair of ion condensers are disposed on opposite sides of a first plane such that the first member of a pair of ion condensers has a position that is substantially mirror-symmetric about the first plane relative to the position of the second member of the pair.
  • the ion condensers are positioned relative to each other to substantially compensate for the energy dispersion inherent to a single ion condenser.
  • lower energy ion and higher energy ion trajectories exiting the ion optics system exhibit substantially no spatial dispersion due to differences in the ion kinetic energy.
  • a mass analyzer system 500 comprises an ion optics system 502 positioned to receive at least a portion of a pulse of ions provided by an ion source 504, an ion detector 506, and one or more mass analyzers positioned in one or more of: the region 508 between the ion source 504 and the ion optics system 502, the region 510 between the ion detector 506 and the ion optics system 502, or both.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Lasers (AREA)

Abstract

Dans différents modes de réalisation, l'invention concerne des systèmes optiques ioniques composés de deux ou plusieurs paires de condenseurs d'ions disposés de telle sorte que le premier élément et le deuxième élément de chaque paire est placé sur les côtés opposés d'un premier plan, le premier élément de la paire possédant une position présentant pratiquement une symétrie de miroir autour du premier plan par rapport à la position du deuxième élément de la paire, l'angle de déviation de chacune des condenseurs d'ions étant inférieur ou égal à Π radians.
PCT/US2006/002596 2005-01-24 2006-01-24 Systemes optiques ioniques Ceased WO2006079096A2 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/042,191 US7439520B2 (en) 2005-01-24 2005-01-24 Ion optics systems
US11/042,191 2005-01-24

Publications (2)

Publication Number Publication Date
WO2006079096A2 true WO2006079096A2 (fr) 2006-07-27
WO2006079096A3 WO2006079096A3 (fr) 2007-06-07

Family

ID=36590227

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2006/002596 Ceased WO2006079096A2 (fr) 2005-01-24 2006-01-24 Systemes optiques ioniques

Country Status (2)

Country Link
US (1) US7439520B2 (fr)
WO (1) WO2006079096A2 (fr)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2003260773A1 (en) * 2002-09-03 2004-03-29 Micromass Uk Limited Mass spectrometer
GB2402260B (en) * 2003-05-30 2006-05-24 Thermo Finnigan Llc All mass MS/MS method and apparatus
US8093555B2 (en) * 2007-11-21 2012-01-10 Shimadzu Corporation Mass spectrometer
WO2010041296A1 (fr) * 2008-10-09 2010-04-15 株式会社島津製作所 Spectromètre de masse
GB2470600B (en) * 2009-05-29 2012-06-13 Thermo Fisher Scient Bremen Charged particle analysers and methods of separating charged particles
GB2496991B (en) 2010-11-26 2015-05-20 Thermo Fisher Scient Bremen Method of mass selecting ions and mass selector
JP5885474B2 (ja) * 2011-11-17 2016-03-15 キヤノン株式会社 質量分布分析方法及び質量分布分析装置
US9627190B2 (en) * 2015-03-27 2017-04-18 Agilent Technologies, Inc. Energy resolved time-of-flight mass spectrometry
US20240047190A1 (en) * 2020-07-09 2024-02-08 Inter-University Research Institute Corporation National Institute Of Natural Sciences Electrostatic deflection convergence-type energy analyzer, imaging-type electron spectroscopic device, reflecting imaging-type electron spectroscopic device, and spin vector distribution imaging device
WO2023150680A1 (fr) * 2022-02-04 2023-08-10 Perkinelmer Health Sciences, Inc. Piège à ions toroïdal

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5829577B2 (ja) * 1980-06-13 1983-06-23 日本電子株式会社 二重収束質量分析装置
US4864130A (en) * 1986-06-04 1989-09-05 Arch Development Corporation Photo ion spectrometer
US5128543A (en) * 1989-10-23 1992-07-07 Charles Evans & Associates Particle analyzer apparatus and method
US5087815A (en) * 1989-11-08 1992-02-11 Schultz J Albert High resolution mass spectrometry of recoiled ions for isotopic and trace elemental analysis
DE69027602T2 (de) * 1990-08-08 1997-01-23 Philips Electronics Nv Energiefilter für Ladungsträgervorrichtung
US5202563A (en) * 1991-05-16 1993-04-13 The Johns Hopkins University Tandem time-of-flight mass spectrometer
DE4310559A1 (de) * 1993-03-26 1994-09-29 Zeiss Carl Fa Abbildendes Elektronenenergiefilter
US5637879A (en) * 1996-03-20 1997-06-10 Schueler; Bruno W. Focused ion beam column with electrically variable blanking aperture
DE19633496B4 (de) * 1996-08-20 2006-06-08 Ceos Corrected Electron Optical Systems Gmbh Monchromator für die Elektronenoptik, insbesondere Elketronenmikroskopie
US6469295B1 (en) * 1997-05-30 2002-10-22 Bruker Daltonics Inc. Multiple reflection time-of-flight mass spectrometer
US5955730A (en) * 1997-06-26 1999-09-21 Comstock, Inc. Reflection time-of-flight mass spectrometer
WO1999027560A2 (fr) * 1997-11-24 1999-06-03 The Johns-Hopkins University Procede et appareil permettant de corriger la vitesse initiale d'ions dans un spectrometre de masse a temps de vol a reflectron
US6013913A (en) * 1998-02-06 2000-01-11 The University Of Northern Iowa Multi-pass reflectron time-of-flight mass spectrometer
ATE460744T1 (de) * 1998-09-25 2010-03-15 Oregon State Tandemflugzeitmassenspektrometer
US6274866B1 (en) * 1999-06-17 2001-08-14 Agilent Technologies, Inc. Systems and methods of mass spectrometry
DE10020382A1 (de) * 2000-04-26 2001-10-31 Ceos Gmbh Strahlerzeugungssystem für Elektronen oder Ionenstrahlen hoher Monochromasie oder hoher Stromdichte
WO2002001599A2 (fr) * 2000-06-28 2002-01-03 The Johns Hopkins University Reseau de spectrometres de masse a temps de vol
US6867414B2 (en) * 2002-09-24 2005-03-15 Ciphergen Biosystems, Inc. Electric sector time-of-flight mass spectrometer with adjustable ion optical elements

Also Published As

Publication number Publication date
US7439520B2 (en) 2008-10-21
US20060163473A1 (en) 2006-07-27
WO2006079096A3 (fr) 2007-06-07

Similar Documents

Publication Publication Date Title
US8188425B2 (en) Ion optics systems
US10636646B2 (en) Ion mirror and ion-optical lens for imaging
CA2821097C (fr) Spectrometre de masse
USRE38861E1 (en) Multideflector
US9196469B2 (en) Constraining arcuate divergence in an ion mirror mass analyser
RU2660655C2 (ru) Способ управления соотношением разрешающей способности по массе и чувствительности в многоотражательных времяпролетных масс-спектрометрах
US9449804B2 (en) Dual field multipole converging ion guides, hyperbolic ion guides, and related methods
US7439520B2 (en) Ion optics systems
US9997345B2 (en) Orthogonal acceleration coaxial cylinder mass analyser
US6759651B1 (en) Ion guides for mass spectrometry
EP0456516B1 (fr) Dispositif de regroupement de paquets d'ions
WO2014108375A1 (fr) Spectromètre de masse à secteur magnétique perfectionné
Toyoda Development of multi-turn time-of-flight mass spectrometers and their applications
US8330099B2 (en) Mass spectrometer and mass analyzer comprising pulser
US6310353B1 (en) Shielded lens
US9536723B1 (en) Thin field terminator for linear quadrupole ion guides, and related systems and methods
Blase et al. A Prolate Trochoidal Mass Spectrometer (PTMS) for Isotope Ratio Analysis

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application
122 Ep: pct application non-entry in european phase

Ref document number: 06719452

Country of ref document: EP

Kind code of ref document: A2