WO2006128317A1 - Procede d'eclairage et systeme d'eclairage - Google Patents

Procede d'eclairage et systeme d'eclairage Download PDF

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Publication number
WO2006128317A1
WO2006128317A1 PCT/CH2006/000297 CH2006000297W WO2006128317A1 WO 2006128317 A1 WO2006128317 A1 WO 2006128317A1 CH 2006000297 W CH2006000297 W CH 2006000297W WO 2006128317 A1 WO2006128317 A1 WO 2006128317A1
Authority
WO
WIPO (PCT)
Prior art keywords
light sources
image
pulse
illumination
laser diodes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CH2006/000297
Other languages
German (de)
English (en)
Inventor
Joachim Schwarz
Johann HÄRTL
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Elpatronic AG
Original Assignee
Elpatronic AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elpatronic AG filed Critical Elpatronic AG
Publication of WO2006128317A1 publication Critical patent/WO2006128317A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K9/00—Arc welding or cutting
    • B23K9/095—Monitoring or automatic control of welding parameters
    • B23K9/0956—Monitoring or automatic control of welding parameters using sensing means, e.g. optical
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8835—Adjustable illumination, e.g. software adjustable screen
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8838—Stroboscopic illumination; synchronised illumination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G01N2201/0612—Laser diodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's
    • G01N2201/0625—Modulated LED
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0696—Pulsed
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0696—Pulsed
    • G01N2201/0697—Pulsed lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/101—Scanning measuring head

Definitions

  • the invention relates to a lighting method and a pulsable illumination arrangement for illuminating image areas for taking pictures of image sequences by a sensor head according to claim 1 or claim 8.
  • Laser welding seams have been optically checked for defects in the weld seams for years.
  • a sensor head is mounted for this purpose, which takes pictures sequentially with an image area of about 10 x 10 mm. These image sequences are then optically-evaluated.
  • the welds and then on the welds the defects that appear through black dots must be recognized.
  • the sheets to be welded from 20 to 50 cm / s thus result in very short image repetition times. These are usually 40 to 60 ms, but can also be shortened to 10 ms in special cases.
  • the recording time of the sensor head is about 2 ms.
  • the remaining time until the next pulse is used for the transmission and evaluation of the data and for the feed until the next image section is within the field of view of the sensor head.
  • the respective image section must be illuminated. This is done with a very short pulsed illumination system of at most 20 ⁇ s, preferably between 5 and 10 ⁇ s. This ensures that the images are sharp and not blurred by the continuous relative motion between the sensor head and the image surface.
  • the light of a sufficiently bright xenon flash lamp is used for the illumination and projected onto the image plane by means of light guides.
  • the design of the light guide allows it to be mounted on both sides with respect to the direction of movement of the sensor head next to this and directed vertically downwards. They are located approximately halfway between the image surface and the sensor head.
  • These lamps allow a pulsed illumination in the required intensity of at least 5 W / cm ⁇ , preferably about 10 W / cm2 in the required pulse times and repetition rates.
  • Lighting arrangements are known from DE-C-101 17 048, US-A-5,365,084, US-A-5,264,678, DE-U-20004 014797, US-A-5,978,090, DE-A-195 05 832, EP-A-0 431 751, EP-AI 455 179 and US-A-205/0041852.
  • the object of the invention is to describe a method and a lighting arrangement which, independently of the individual sheet thicknesses used, always illuminates each image surface optimally for each image of an image sequence in such a way that both the seam and the defects can be found well.
  • the method or the illumination arrangement serves to illuminate image areas for taking pictures of image sequences of a step forming welds.
  • the recording is carried out in particular by a sensor head with a picture repetition time of 60 ms or shorter and with an illumination duration of at most 20 ⁇ s per pulse and delivers a total light intensity of at least 5 W on a screen of 1 cm 2.
  • a multiplicity of individually activatable light sources are used which have surface-emitting laser diodes, wherein for each pulse of an image sequence those light sources can be optionally activated which optimally illuminate the image area or so that the contrast between the weld seam and possibly existing defects is maximum is.
  • Fig. 1-4 In each case a profile through two connected to a weld sheets of different thickness with incident and reflecting light beams with different angles of incidence of the light sources;
  • Fig. 5-8 In each case an image taken at a sensor head of a corresponding configuration;
  • Fig. 9 A profile through two with a
  • Fig. 1 shows a profile through two connected to a weld seam 2 sheets 1, 2, wherein the one sheet 1 is thicker than the other sheet 2.
  • the arrows 5 in the sheet direction denote incident, which deflected away from the sheets arrows 6 light rays.
  • FIG. 1 It can be seen from FIG. 1 that the light beams 5 impinging on the weld seam 3 are not reflected perpendicularly like the other light beams striking the sheets 1, 2, but are deflected at a certain angle according to the arrow 7.
  • FIG. 2 represents the same facts as Fig. 1 with the only difference that the thickness difference of the sheets 1, 2 is greater. As a result, the light beams 7 reflected at the welding seam 3 are deflected considerably more strongly from the normal.
  • Figures 5 and 6 illustrate the corresponding images taken by a sensor head on the respective image surfaces.
  • the sheets 1, 2 are very bright in both pictures, since the reflected light beams 6 directly to the
  • the weld seam 3 is to some extent easily recognizable in FIG. 5 as a gray stripe, and in FIG. 6 as a black stripe even very well.
  • a defect 4 will appear on a picture as a black dot. Such a point is still fairly well recognizable in FIG. 5, but hardly any longer in FIG.
  • FIG. 3 and 4 An alternative illumination system, shown in Fig. 3 and 4, illuminates the sheets 1, 2 at a 45 ° angle, wherein the difference of the sheet thicknesses 1, 2 in Fig. 3 and small in Fig. 4 is larger, according to Fig. 1 and 2. It can be seen from the figures that the light rays 7 reflected at the weld seam 3 hardly reach the sensor head in the arrangement according to FIG. 3, which is arranged (not shown) perpendicularly above the weld seam 3. The in Fig. 4 at the
  • FIGS. 7 and 8 again show the corresponding images which can be picked up by a sensor head on the corresponding image surfaces.
  • the sheets 1, 2 are very dark in both images, since the reflected light beams 6 hardly reach the sensor head.
  • the weld seam 3 is barely discernible in FIG. 7 as a dark gray stripe, but is very good in FIG. 8 as a light stripe.
  • a defect 4 in turn appears as a black dot in appearance. Such a point 4 is only weakly recognizable in FIG. 7, but again very good in FIG. 8, since the contrast from the weld seam 3 to the fault point 4 is optimal.
  • the weld seam 3 should be able to be displayed as light as possible, so that a defect 4, which always appears black, can be recognized simply and reliably by maximum contrast to the weld seam 3.
  • the optimum angle of incidence accordingly changes with the difference in thickness of the sheets 1, 2: the greater the difference in thickness, the more the optimum irradiation direction 5 of the illumination system must deviate from the normal. It should be noted that different thicknesses are connected to one another in a weld seam 3, so that the optimum irradiation direction 5 changes during a weld seam.
  • the inventive method or arrangement solves the problem with immovable components, apart of course from the movement in the direction of the weld 3.
  • a movable lighting system would have to meet very high mechanical requirements in view of the high image repetition rate in order to always be in the correct position ,
  • FIG. 9 shows an example of a lighting arrangement 10 according to the invention, which can illuminate an image area 8 in the area of a weld seam 3 between two sheets 1, 2.
  • a sensor head is received at a distance of about 10 mm along the entire weld seam.
  • the arrangement 10 is arranged approximately in the middle between the sensor head 9 and the image surface 8 and consists of a plurality of light sources 12, which are arranged on both sides of the sensor head 9 in the direction of the weld seam 3.
  • a typical distance to the sheets 1, 2 is 30 to 50 mm.
  • These light sources 12 are all directed onto the image surface 8 and are preferably arranged on a circular arc at different angles of incidence with respect to the image surface 8. Depending on the angle of the surface 3 of the
  • Welding seams are preferably made of other of these light sources.
  • len 12 used to 'optimal lighting to achieve.
  • the image area is approx. 10 x 10 mm.
  • These light sources 12 must meet very high requirements. They must be pulsatile with a pulse repetition time of 60 ms or shorter, with the
  • Duration of illumination may not exceed 20 ⁇ s, preferably between 5 and 10 ⁇ s.
  • the light intensity must be so strong that each image is illuminated with about 10 W.
  • these 10 watts can be distributed over four light sources 12. In this case, every light source 12 must provide 2.5W.
  • Such a light source 12 is achieved by diode lasers, also called semiconductor lasers, wherein surface-emitting laser diodes are used.
  • diodes in which multimodes are used so that no interference occurs because they could disturb the image analysis as bright points.
  • Surface emitting laser diodes are known by the name VCSEL (Vertical Surface Emitting Laser). These are semiconductor lasers that emit their light in a cylindrical beam vertically from the semiconductor wafer. These lasers are used for optical communication and can operate, for example, in wavelengths of 780 nm and 850 nm.
  • the light sources 12 are very powerful and consist of a plurality of laser diodes 13, which are arranged for example in a row or in a circle.
  • a light source 12 includes about 30 to 70, preferably 50 laser diodes 13 in a row to about 10 mm in length.
  • the diode lasers can be flexibly arranged at any angle of incidence and switched from image to image. As a result, for each image, those of the light sources 12 can be activated, which overall result in optimum illumination of the weld seam 3 for the sensor head, so that, on the one hand, these are easily recognizable in the weld seam compared to the sheets 1, 2 and, on the other hand, a fault location 4 is.
  • the illumination arrangement 10 can have stored, predetermined data for each pulse of an image sequence which contain the information of the light sources 12 to be activated in order to optimally illuminate the image area 8. These data can be determined in a series production in advance in test runs. For this purpose, in addition to the weld seams 3, a certain number of triangulation points on the sheets 1, 2 are measured in the pictures, on the basis of which the relevant geometries, in particular the differences in thickness of the sheets 1, 2 and / or the inclination of the weld seam 3, are determined can. From these data, the optimal illumination directions are determined and those light sources 12 are determined which are to be activated for the respective pulse. These data are then stored and made available at each repetition of the same welding process, for the control of the inventive lighting system.
  • the arrangement contains a controller which, for each pulse of an image sequence on the basis of evaluations of at least one previous image, can interactively determine the information about those light sources which optimally illuminates the respective image area.
  • the first Picture is a default setting.
  • triangulation points on the metal sheets 1, 2 are measured in the same way as in the first example and evaluated to determine the light sources 12 to be activated for each pulse. In contrast to the first example, this determination and evaluation is performed interactively.
  • the necessary data for a pulse are obtained from the evaluations of one of several data previously determined in the same image sequence. This allows individual adaptation and is desirable above all for large fluctuations in the sheet metal parameters.

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  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Procédé et système (10) d'éclairage de surfaces (8) d'images pour des prises de séquences d'images par une tête de détection (9) ayant une durée de répétition d'image de 60 ms ou moins et une durée d'éclairage de 20 µs au maximum par impulsion, ce qui produit une intensité lumineuse totale d'au moins 5 W sur une surface d'image de 1 cm<SUP>2</SUP>. Ledit système est constitué d'une pluralité de sources de lumière (12) pouvant être activées séparément et ayant une intensité lumineuse appropriée, pourvues de diodes laser à émission de surface, et pour chaque impulsion, les sources de lumière (12) pouvant être activées sélectivement sont celles qui éclairent de manière optimale la surface (8) d'image.
PCT/CH2006/000297 2005-06-03 2006-06-01 Procede d'eclairage et systeme d'eclairage Ceased WO2006128317A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH936/05 2005-06-03
CH9362005 2005-06-03

Publications (1)

Publication Number Publication Date
WO2006128317A1 true WO2006128317A1 (fr) 2006-12-07

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102565103A (zh) * 2011-12-16 2012-07-11 清华大学 一种基于x射线图像的焊缝缺陷跟踪检测方法
EP2684033A4 (fr) * 2011-03-10 2014-10-01 Mapvision Ltd Oy Système de vision de machine permettant un contrôle qualité
EP4016058A1 (fr) * 2020-12-16 2022-06-22 Zhejiang University Machine automatique de vision sur un dispositif de détection pour pièce à surface courbe complexe

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5264678A (en) * 1991-09-26 1993-11-23 Applied Research, Inc. Weld-bead profilometer
US5365084A (en) * 1991-02-20 1994-11-15 Pressco Technology, Inc. Video inspection system employing multiple spectrum LED illumination
DE19505832A1 (de) * 1995-02-21 1996-08-22 Thyssen Stahl Ag Optische Prüfeinrichtung zur Online-Bewertung von Schweiß- oder Lötnähten
US5978090A (en) * 1996-10-10 1999-11-02 Elpatronic Ag Method and arrangement for optical inspection of a weld seam
DE10117048C1 (de) * 2001-04-05 2002-08-22 Fraunhofer Ges Forschung Verfahren und Vorrichtung zur Detektion von Oberflächendefekten auf Messobjekten
WO2003096387A2 (fr) * 2002-05-08 2003-11-20 Phoseon Technology, Inc. Source lumineuse a semi-conducteurs a haut rendement et leurs procedes d'utilisation et de fabrication
EP1431751A2 (fr) * 2002-12-20 2004-06-23 Volkswagen Aktiengesellschaft Méthode, dispositif et programme d'ordinateur pour la détection optique de surfaces
EP1455179A1 (fr) * 2003-03-07 2004-09-08 MV Research Limited Système de vision artificielle et procédé pour l'inspection
DE202004014797U1 (de) * 2004-09-23 2004-12-16 Ibak Helmut Hunger Gmbh & Co. Kg Schwenkkopf-Kamera
US20050041852A1 (en) * 2001-11-15 2005-02-24 Joachim Schwarz Method and device for evaluation of jointing regions on workpieces

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5365084A (en) * 1991-02-20 1994-11-15 Pressco Technology, Inc. Video inspection system employing multiple spectrum LED illumination
US5264678A (en) * 1991-09-26 1993-11-23 Applied Research, Inc. Weld-bead profilometer
DE19505832A1 (de) * 1995-02-21 1996-08-22 Thyssen Stahl Ag Optische Prüfeinrichtung zur Online-Bewertung von Schweiß- oder Lötnähten
US5978090A (en) * 1996-10-10 1999-11-02 Elpatronic Ag Method and arrangement for optical inspection of a weld seam
DE10117048C1 (de) * 2001-04-05 2002-08-22 Fraunhofer Ges Forschung Verfahren und Vorrichtung zur Detektion von Oberflächendefekten auf Messobjekten
US20050041852A1 (en) * 2001-11-15 2005-02-24 Joachim Schwarz Method and device for evaluation of jointing regions on workpieces
WO2003096387A2 (fr) * 2002-05-08 2003-11-20 Phoseon Technology, Inc. Source lumineuse a semi-conducteurs a haut rendement et leurs procedes d'utilisation et de fabrication
EP1431751A2 (fr) * 2002-12-20 2004-06-23 Volkswagen Aktiengesellschaft Méthode, dispositif et programme d'ordinateur pour la détection optique de surfaces
EP1455179A1 (fr) * 2003-03-07 2004-09-08 MV Research Limited Système de vision artificielle et procédé pour l'inspection
DE202004014797U1 (de) * 2004-09-23 2004-12-16 Ibak Helmut Hunger Gmbh & Co. Kg Schwenkkopf-Kamera

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2684033A4 (fr) * 2011-03-10 2014-10-01 Mapvision Ltd Oy Système de vision de machine permettant un contrôle qualité
CN102565103A (zh) * 2011-12-16 2012-07-11 清华大学 一种基于x射线图像的焊缝缺陷跟踪检测方法
EP4016058A1 (fr) * 2020-12-16 2022-06-22 Zhejiang University Machine automatique de vision sur un dispositif de détection pour pièce à surface courbe complexe
JP2022126587A (ja) * 2020-12-16 2022-08-30 浙江大学 複雑な曲面を有するワークの自動視覚検査装置
JP7762415B2 (ja) 2020-12-16 2025-10-30 浙江大学 複雑な曲面を有するワークの自動視覚検査装置

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