WO2007098426A3 - Methods and apparatus for data analysis - Google Patents

Methods and apparatus for data analysis Download PDF

Info

Publication number
WO2007098426A3
WO2007098426A3 PCT/US2007/062366 US2007062366W WO2007098426A3 WO 2007098426 A3 WO2007098426 A3 WO 2007098426A3 US 2007062366 W US2007062366 W US 2007062366W WO 2007098426 A3 WO2007098426 A3 WO 2007098426A3
Authority
WO
WIPO (PCT)
Prior art keywords
data
methods
data analysis
outliers
test data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2007/062366
Other languages
French (fr)
Other versions
WO2007098426A2 (en
Inventor
Emilio Miguelanez
Michael J Scott
Greg Labonte
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Test Advantage Inc
Original Assignee
Test Advantage Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Test Advantage Inc filed Critical Test Advantage Inc
Priority to JP2008555533A priority Critical patent/JP2009527903A/en
Priority to EP07757164A priority patent/EP1989561A2/en
Publication of WO2007098426A2 publication Critical patent/WO2007098426A2/en
Priority to US11/857,654 priority patent/US7904279B2/en
Priority to IL193447A priority patent/IL193447A/en
Anticipated expiration legal-status Critical
Publication of WO2007098426A3 publication Critical patent/WO2007098426A3/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2894—Aspects of quality control [QC]

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Complex Calculations (AREA)

Abstract

Methods and apparatus for data analysis according to various aspects of the present invention identify statistical outliers in data, such as test data for components. The outliers may be identified and categorized according to the distribution of the data. In addition, outliers may be identified according to multiple parameters, such as spatial relationships, variations in the test data, and correlations to other test data.
PCT/US2007/062366 2004-04-02 2007-02-17 Methods and apparatus for data analysis Ceased WO2007098426A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2008555533A JP2009527903A (en) 2006-02-17 2007-02-17 Method and apparatus for data analysis
EP07757164A EP1989561A2 (en) 2006-02-17 2007-02-17 Methods and apparatus for data analysis
US11/857,654 US7904279B2 (en) 2004-04-02 2007-09-19 Methods and apparatus for data analysis
IL193447A IL193447A (en) 2006-02-17 2008-08-14 Method and apparatus for data analysis

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US77468206P 2006-02-17 2006-02-17
US60/774,682 2006-02-17

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
US11/535,851 Continuation-In-Part US20070219741A1 (en) 2002-05-24 2006-09-27 Methods and apparatus for hybrid outlier detection

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US11/857,654 Continuation-In-Part US7904279B2 (en) 2004-04-02 2007-09-19 Methods and apparatus for data analysis

Publications (2)

Publication Number Publication Date
WO2007098426A2 WO2007098426A2 (en) 2007-08-30
WO2007098426A3 true WO2007098426A3 (en) 2008-11-13

Family

ID=38438077

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/062366 Ceased WO2007098426A2 (en) 2004-04-02 2007-02-17 Methods and apparatus for data analysis

Country Status (4)

Country Link
EP (1) EP1989561A2 (en)
JP (3) JP2009527903A (en)
IL (1) IL193447A (en)
WO (1) WO2007098426A2 (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5537346B2 (en) * 2010-09-06 2014-07-02 株式会社日立メディコ Image diagnosis support apparatus and image diagnosis support method
JP5767963B2 (en) * 2011-12-28 2015-08-26 株式会社キーエンス Appearance inspection apparatus, appearance inspection method, and computer program
JP6532373B2 (en) * 2015-10-16 2019-06-19 株式会社Ｎｔｔファシリティーズ Storage battery deterioration estimation system, storage battery deterioration estimation method and storage battery deterioration estimation program
JP6752661B2 (en) * 2016-09-05 2020-09-09 日置電機株式会社 Processing equipment, inspection systems and processing programs
EP3451219A1 (en) 2017-08-31 2019-03-06 KBC Groep NV Improved anomaly detection
US20200004619A1 (en) * 2018-06-28 2020-01-02 Honeywell International Inc. System and method for detecting a shift in real data trend using the configurable adaptive threshold
US11157346B2 (en) * 2018-09-26 2021-10-26 Palo Alto Rsearch Center Incorporated System and method for binned inter-quartile range analysis in anomaly detection of a data series
KR102831544B1 (en) * 2021-01-13 2025-07-07 주식회사 엘지에너지솔루션 Apparatus and method for managing battery
CN113486003B (en) * 2021-06-02 2024-03-19 广州数说故事信息科技有限公司 Enterprise data set processing method and system considering abnormal values in data visualization
US11907088B2 (en) * 2021-12-15 2024-02-20 Synopsys, Inc. Testing of hardware queue systems using on device test generation
CN118131054B (en) * 2024-01-12 2024-09-03 东莞市丰晖电子有限公司 A method and system for intelligent monitoring of state of charge of sodium ion battery

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030014205A1 (en) * 2001-05-24 2003-01-16 Tabor Eric Paul Methods and apparatus for semiconductor testing

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0352247A (en) * 1989-07-20 1991-03-06 Seiko Instr Inc Semiconductor testing apparatus
JPH04283046A (en) * 1991-03-12 1992-10-08 Nec Corp Working sequence control system
JP2002016118A (en) * 2000-06-29 2002-01-18 Agilent Technologies Japan Ltd Semiconductor parametric test device
US7356430B2 (en) * 2001-05-24 2008-04-08 Test Advantage, Inc. Methods and apparatus for data analysis
US8417477B2 (en) * 2001-05-24 2013-04-09 Test Acuity Solutions, Inc. Methods and apparatus for local outlier detection
JP2006146459A (en) * 2004-11-18 2006-06-08 Renesas Technology Corp Method and system for manufacturing semiconductor device
JP5116307B2 (en) * 2007-01-04 2013-01-09 ルネサスエレクトロニクス株式会社 Integrated circuit device abnormality detection device, method and program

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030014205A1 (en) * 2001-05-24 2003-01-16 Tabor Eric Paul Methods and apparatus for semiconductor testing

Also Published As

Publication number Publication date
IL193447A0 (en) 2009-05-04
JP5907649B2 (en) 2016-04-26
JP2009188418A (en) 2009-08-20
JP5080526B2 (en) 2012-11-21
JP2009527903A (en) 2009-07-30
WO2007098426A2 (en) 2007-08-30
IL193447A (en) 2015-05-31
EP1989561A2 (en) 2008-11-12
JP2010197385A (en) 2010-09-09

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