WO2008087809A1 - 光信号品質モニタ装置及びその方法 - Google Patents

光信号品質モニタ装置及びその方法 Download PDF

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Publication number
WO2008087809A1
WO2008087809A1 PCT/JP2007/073877 JP2007073877W WO2008087809A1 WO 2008087809 A1 WO2008087809 A1 WO 2008087809A1 JP 2007073877 W JP2007073877 W JP 2007073877W WO 2008087809 A1 WO2008087809 A1 WO 2008087809A1
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WO
WIPO (PCT)
Prior art keywords
optical
sampling
signal
optical signal
enter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2007/073877
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English (en)
French (fr)
Inventor
Akihito Otani
Takao Tanimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to EP07850439.6A priority Critical patent/EP2105720A4/en
Priority to CA002634671A priority patent/CA2634671A1/en
Priority to US12/085,876 priority patent/US8041211B2/en
Priority to JP2008528276A priority patent/JP5604042B2/ja
Publication of WO2008087809A1 publication Critical patent/WO2008087809A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
    • H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
    • H04B10/0795—Performance monitoring; Measurement of transmission parameters

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Optical Communication System (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)

Abstract

　サンプリング用光パルス発生部は、監視対象の光信号を変調しているデータ信号のクロック周期の整数倍に対して所定オフセット時間だけ異なる周期を有するサンプリング用光パルスを出射する。光サンプリング部は、電界吸収型光変調器を用いて監視対象の光信号をサンプリングする。前記電界吸収型光変調器は、光路を伝搬する光に対する吸収率が電界の大きさに応じて変化する特性を有している。監視対象の光信号は、前記電界吸収型光変調器の２つの光端子のうちの一方に入射される。また、前記２つの光端子のうちの他方の光端子には、サンプリング用光パルスを光カプラを介して入射させる。このサンプリング用光パルスが入射したときに生じる前記電界吸収型光変調器の相互吸収飽和特性により前記監視対象の光信号に対する吸収率を低下させて前記監視対象の光信号をサンプリングすることにより、前記２つの光端子のうちの他方の光端子から前記光カプラを介して光パルス信号を出射させる。
PCT/JP2007/073877 2007-01-15 2007-12-11 光信号品質モニタ装置及びその方法 Ceased WO2008087809A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP07850439.6A EP2105720A4 (en) 2007-01-15 2007-12-11 DEVICE AND METHOD FOR MONITORING THE QUALITY OF OPTICAL SIGNALS
CA002634671A CA2634671A1 (en) 2007-01-15 2007-12-11 Optical signal quality monitoring apparatus and method
US12/085,876 US8041211B2 (en) 2007-01-15 2007-12-11 Optical signal quality monitoring apparatus and method
JP2008528276A JP5604042B2 (ja) 2007-01-15 2007-12-11 光信号品質モニタ装置及びその方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-005761 2007-01-15
JP2007005761 2007-01-15

Publications (1)

Publication Number Publication Date
WO2008087809A1 true WO2008087809A1 (ja) 2008-07-24

Family

ID=39635814

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/073877 Ceased WO2008087809A1 (ja) 2007-01-15 2007-12-11 光信号品質モニタ装置及びその方法

Country Status (5)

Country Link
US (1) US8041211B2 (ja)
EP (1) EP2105720A4 (ja)
JP (1) JP5604042B2 (ja)
CA (1) CA2634671A1 (ja)
WO (1) WO2008087809A1 (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010199996A (ja) * 2009-02-25 2010-09-09 Anritsu Corp 光信号モニタ装置
JP2010217067A (ja) * 2009-03-18 2010-09-30 Anritsu Corp 光信号モニタ装置
JP2011021956A (ja) * 2009-07-15 2011-02-03 Anritsu Corp サンプリング波形測定装置
JP2011021957A (ja) * 2009-07-15 2011-02-03 Anritsu Corp サンプリング波形測定装置
JP2011102777A (ja) * 2009-11-11 2011-05-26 Anritsu Corp サンプリング波形測定装置及びサンプリング波形測定方法

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2128577A4 (en) * 2007-01-09 2013-11-06 Anritsu Corp SENSING DEVICE FOR SYNCHRONIZING OPTICAL SIGNALS, METHOD, USED MONITORING DEVICE FOR OPTICAL SIGNALS AND METHOD
EP2180302A4 (en) * 2007-05-25 2014-01-15 Anritsu Corp OPTICAL SIGNAL SAMPLING DEVICE AND ITS METHOD, AND OPTICAL CONTROL DEVICE USING THE SAME AND ITS METHOD
CN115913841B (zh) * 2022-11-25 2024-06-04 中北大学 一种用于等效时间采样信号的数据均衡方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11223575A (ja) * 1997-12-01 1999-08-17 Nippon Telegr & Teleph Corp <Ntt> 光信号品質モニタ
JP2003090766A (ja) * 2001-07-13 2003-03-28 Nippon Telegr & Teleph Corp <Ntt> 光信号品質劣化要因監視方法および装置
JP2004222252A (ja) 2002-12-24 2004-08-05 Nec Corp 光信号モニタ装置、及びその方法
JP2004286511A (ja) * 2003-03-20 2004-10-14 Anritsu Corp 光サンプリング装置および光波形観測システム
JP2005070698A (ja) * 2003-08-28 2005-03-17 National Institute Of Information & Communication Technology 光パルス分離装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3086039B2 (ja) 1991-12-13 2000-09-11 日置電機株式会社 波形測定装置の波形表示方法
JP3145941B2 (ja) * 1997-01-13 2001-03-12 日本電気株式会社 光機能増幅素子及びその動作方法
JPH11258560A (ja) * 1998-03-12 1999-09-24 Oki Electric Ind Co Ltd 半導体光変調器および波長変換装置
JP4571283B2 (ja) 2000-08-10 2010-10-27 アンリツ株式会社 波形測定装置
JP3507474B2 (ja) 2001-01-11 2004-03-15 キヤノン株式会社 光走査装置及びそれを用いた画像形成装置
EP1239623B1 (en) * 2001-03-07 2011-05-11 Nippon Telegraph And Telephone Corporation Optical wavelength division multiplex signal monitoring apparatus
US7200328B2 (en) 2001-07-13 2007-04-03 Nippon Telegraph And Telephone Corporation Method and system for determining origin of optical signal quality degradation
JP2004340812A (ja) * 2003-05-16 2004-12-02 Nippon Telegr & Teleph Corp <Ntt> 光サンプリング装置
JP2005337844A (ja) 2004-05-26 2005-12-08 Nippon Telegr & Teleph Corp <Ntt> 光サンプリング装置
JP4328724B2 (ja) * 2005-01-17 2009-09-09 富士通株式会社 光波形測定装置および光波形測定方法
TWI291814B (en) * 2005-12-30 2007-12-21 Ind Tech Res Inst Apparatus and method for homodyne detecting quality-factor measuring
EP2128577A4 (en) * 2007-01-09 2013-11-06 Anritsu Corp SENSING DEVICE FOR SYNCHRONIZING OPTICAL SIGNALS, METHOD, USED MONITORING DEVICE FOR OPTICAL SIGNALS AND METHOD

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11223575A (ja) * 1997-12-01 1999-08-17 Nippon Telegr & Teleph Corp <Ntt> 光信号品質モニタ
JP2003090766A (ja) * 2001-07-13 2003-03-28 Nippon Telegr & Teleph Corp <Ntt> 光信号品質劣化要因監視方法および装置
JP2004222252A (ja) 2002-12-24 2004-08-05 Nec Corp 光信号モニタ装置、及びその方法
JP2004286511A (ja) * 2003-03-20 2004-10-14 Anritsu Corp 光サンプリング装置および光波形観測システム
JP2005070698A (ja) * 2003-08-28 2005-03-17 National Institute Of Information & Communication Technology 光パルス分離装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2105720A4 *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010199996A (ja) * 2009-02-25 2010-09-09 Anritsu Corp 光信号モニタ装置
JP2010217067A (ja) * 2009-03-18 2010-09-30 Anritsu Corp 光信号モニタ装置
JP2011021956A (ja) * 2009-07-15 2011-02-03 Anritsu Corp サンプリング波形測定装置
JP2011021957A (ja) * 2009-07-15 2011-02-03 Anritsu Corp サンプリング波形測定装置
JP2011102777A (ja) * 2009-11-11 2011-05-26 Anritsu Corp サンプリング波形測定装置及びサンプリング波形測定方法

Also Published As

Publication number Publication date
EP2105720A4 (en) 2013-11-06
US8041211B2 (en) 2011-10-18
JPWO2008087809A1 (ja) 2010-05-06
CA2634671A1 (en) 2008-07-15
US20100150548A1 (en) 2010-06-17
JP5604042B2 (ja) 2014-10-08
EP2105720A1 (en) 2009-09-30

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