WO2008120102A2 - Methode zum laserritzen von solarzellen - Google Patents
Methode zum laserritzen von solarzellen Download PDFInfo
- Publication number
- WO2008120102A2 WO2008120102A2 PCT/IB2008/001117 IB2008001117W WO2008120102A2 WO 2008120102 A2 WO2008120102 A2 WO 2008120102A2 IB 2008001117 W IB2008001117 W IB 2008001117W WO 2008120102 A2 WO2008120102 A2 WO 2008120102A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- substrate
- ablation
- edge
- edge region
- laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/16—Removal of by-products, e.g. particles or vapours produced during treatment of a workpiece
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/0823—Devices involving rotation of the workpiece
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/083—Devices involving movement of the workpiece in at least one axial direction
- B23K26/0853—Devices involving movement of the workpiece in at least two axial directions, e.g. in a plane
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/351—Working by laser beam, e.g. welding, cutting or boring for trimming or tuning of electrical components
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/40—Removing material taking account of the properties of the material involved
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/10—Manufacture or treatment of devices covered by this subclass the devices comprising amorphous semiconductor material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2103/00—Materials to be soldered, welded or cut
- B23K2103/50—Inorganic materials other than metals or composite materials
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present invention relates to a method and apparatus for ablation of thin films on a substrate for use in solar cells.
- Thin-film solar cells are becoming increasingly known as a cost-efficient and therefore interesting alternative to conventional crystalline solar cells.
- the substantial elements of a thin film solar cell consist of a thin film layer system on a glass substrate.
- the thin film layer system essentially comprises an absorber layer sandwiched between a back electrode and a front electrode.
- the thin film layer system must be encapsulated such that the sensitive thin film materials do not come into contact with the external environment, both for safety reasons, and to prevent excessive aging when the solar cell is exposed to the weather. Usually, this is done by means of a second piece of glass adhered to the coated side of the substrate. In order to prevent electrical contact with the outside of the solar cell and to ensure that the bond between the two glass substrates is firm and stable, it is necessary that the thin film system be removed in an edge region along the edge of the solar cell.
- Different methods are known for removing the thin film layer system from the edge region. These include, for example, sandblasting and laser ablation.
- Sandblasting is unreliable and expensive because many of the thin film layer systems include materials that require special disposal measures (e.g., CdTe). It is difficult and therefore expensive to separate such materials from the sand.
- CdTe special disposal measures
- Laser ablation is advantageous for this, since no ablation medium mixes with the materials to be removed and collection of the ablated materials is therefore not a problem.
- "Ablated" within the meaning of the present description By the action of electromagnetic radiation, this means that it is detached from the substrate.
- No. 4,734,500 describes a method for laser ablation which is based on a device for laser ablation.
- the basic components of such a device are the laser, an optical unit whose optical elements have the task of directing the laser beams and a table to store and support the substrate.
- a laser is used which emits short laser pulses to the surface of the substrate positioned on the table.
- the optical unit may include apertures that form the beam; lenses to focus the beam or image the aperture on the workpiece and further include movable mirror systems to rapidly move the spot across the surface of the workpiece.
- the generated laser light must be moved over the surface of the substrate to be processed. It is therefore required a relative movement between the substrate and the laser beam. This can be achieved either by moving the substrate relative to the stationary optical unit or by moving the optical unit relative to the stationary solar cell, or by a combination of both.
- a CNC machine with X and Y guide can be used for the movement.
- Figure 1 in US 4,734,550 shows an embodiment of a laser ablation apparatus which employs an XY table to move the substrate and in which the optical unit is stationary.
- the substrate is kept horizontal with the coating facing the light beam during ablation. This can lead to, for example, due to gravity, ablated material is only partially removed from the substrate and deposited on this again.
- FIG. 12 of US 4 734 550 An embodiment in which the "table" is suspended vertically from a support rail is shown in Figure 12 of US 4 734 550.
- the optical unit is arranged as a whole on an XY table and therefore movable with respect to the workpiece stationary in at least one direction. At least for the ablation, which is done on the upper part of the workpiece, it can happen that detached material only is incompletely collected and deposited again on the substrate. This can happen, for example, when thin film material is to be removed from the edge region along the top edge.
- the width of the edge region is typically less than 20mm.
- the object is achieved according to the invention by a method for ablating thin layers in the edge region of the surface of a planar thin-film-coated substrate, wherein the edge region extends along the edge of the substrate, comprising the following steps:
- the optical unit used to propagate laser pulses to the ablation area and optionally also means for finally removing the ablated material can be made completely stationary and it is ensured that the ablated material is always efficiently directed away from the substrate can.
- the substrate is held in a vertical orientation.
- This has the advantage of simplifying the required movement of the substrate.
- the movement of the border area of the sub- strates through the ablation region can take place in such a way that ablation is always carried out in the region at the edge of the substrate currently located at the bottom.
- Gravitational forces then cause or at least assist in transporting the ablated material away from the substrate. Sometimes the effect of the gravitational forces is sufficient and no further means of evacuation need be provided.
- FIG. 1 Device for laser ablation of the known type
- FIG. 4 Ablation head with means for the final removal of the ablated material.
- FIG. 5 Embodiment of the device according to the invention with vertical
- FIG. 1 shows a laser ablation device known from the prior art. This comprises a laser 3, an optical unit 5 with different optical elements such as mirrors and lenses and a table 7 which is movable along an X and a Y direction.
- the optical unit 5 directs the laser pulse generated by the laser 3 into a region on the surface of a coated substrate 9, which rests with its rear side on the table 7. This defines an ablation range. Since the coating is applied to the front side of the substrate 9, there is the disadvantage that the material which is removed by a laser pulse from the surface of the substrate is deposited again on the substrate with relatively high probability due to the gravitational forces and thereby disturbing impurities and problems can cause.
- FIG. 2 shows a first embodiment of the present invention. Shown is a device for laser ablation 201 with a laser 203 and an optical unit 205, which directs the laser pulses of the laser 203 to an ablation region 207.
- the laser ablation apparatus 201 also includes a table 209 to horizontally support a coated substrate 211.
- the table 209 can be moved in two horizontal directions X and Y, but it can also be rotated about a vertical axis. These movement possibilities are indicated in the figure 2 with the broken arrows.
- the extent of the table 209 and in particular the table surface is so much smaller than the extent of the substrate 211 that the substrate 211 can be positioned on the table such that the entire edge region to be machined projects beyond the table.
- the front side coated substrate 211 is placed on the table 209 with the front side so that the entire edge portion to be processed projects beyond the table.
- the coating faces down and the laser ablation is performed through the substrate.
- the laser light first transmits through the substrate before it hits the coating.
- means 213 for finally picking up the removed material Due to gravity, the material removed from the glass surface will move downwardly away from the substrate.
- the means 213 may comprise only one container to collect this material.
- the means preferably generates a flow of gas into the container, in the sense of a vacuum cleaner, thereby at least supporting the process of gathering and removing the material removed by ablation.
- FIG. 3a to 3j illustrate in a sequence how the method of ablation according to the present invention is performed.
- the coated substrate is shown. Coated areas are shaded. Areas where material has been removed by ablation are displayed transparently.
- the ablation is started somewhere in the middle region of the long edge of the substrate. This is shown in FIG. 3a. There is no material here yet removed.
- Ablation is now performed while the substrate is pushed through the ablation region along the edge region to be treated in a linear motion until a first corner of the substrate is reached. This is shown in FIG. 3b. Now, the substrate is rotated to the position shown in Fig. 3c. This rotation around the first corner involves a rotation of the table as well as movements in the X and Y directions.
- FIGS. 3 a to 3 j each show a small, non-dashed vector. This defines a directional distance, which remains constant during the ablation process, in the room with start point outside and end point within the substratum. It can be seen that this is a method for ablating thin layers in the edge region of the surface of a planar thin-film-coated substrate, wherein the edge region runs along the edge of the substrate, with the following steps
- FIG. 4 shows an example of means for finally picking up material removed from the substrate.
- An ablation head 401 is shown which includes a lens 421 as part of the optical unit.
- the ablation head 401 also includes a container 413 provided near the edge region of a substrate 411 with the thin film coating 419.
- the container 413 also includes a tube 425 to aspirate the ablated material 423.
- the geometry of the container 413 is selected so that a gas flow is generated from both sides of the substrate to the tube by negative pressure in the container and thereby the ablated material is transported away from the substrate.
- the ablation head may also include means for absorbing the portion of the laser light which is transmitted through the substrate without being absorbed. Such means are not shown in FIG.
- the ability to rotate the table is important. Only with such a rotatable table is it possible to keep the ablation head 401, as shown in FIG. 4, completely stationary.
- the substrate is held in a vertical orientation. This is shown in FIG.
- the ablation procedure is then carried out in such a way that the area of the ablation always comes to rest on the lower edge of the substrate.
- the coated surface may point toward or away from the optical unit: gravity carries the ablated material away from the substrate in both cases.
- a slight advantage may be to have the coating whitened away from the optical unit, since then no ablated material can interact with the laser light still needed for ablation.
- it is important to have a substrate holder which, in addition to permitting linear movements in the substrate plane, allows for rotation about a normal on the substrate surface. Only this will make it possible for the Ablation region is in each case at the lower edge of the substrate.
- the support of the substrate can be accomplished with a mechanism based on negative pressure.
- Figure 6 shows an embodiment of the present invention wherein the table is replaced by a robust multi-axis industrial robot.
- a robot With such a robot, not only the steps shown in Fig. 3 can be made, but also an efficient loading and unloading of the substrates is possible.
- the use of a robot makes it possible to support the substrate with the aid of a component at the end of the robot arm, whereby the component is fastened to the uncoated side of the substrate.
- the coated side can be towards or away from the optical component Unit, with the latter configuration having slight advantages, since it is clear that ablated material does not interact with the laser light still needed for ablation.
- the device of the invention is an apparatus for ablating thin layers in the edge region of the surface of a planar thin film coated substrate, the edge region extending along the edge or edges of the substrate comprises - a laser for generating laser light for ablation
- the ablation method according to the invention can be carried out, namely a method for ablating thin layers in the edge region of the surface of a thin film-coated substrate, wherein the edge region runs along the edge or edges of the substrate, and at least ablating the thin layers two not necessarily disjoint regions of the edge region along non-parallel edge pieces should take place with the following steps - providing a laser beam
- the orientation of the coated substrate is maintained at least substantially substantially during the ablation process in at least approximately vertical orientation and the substrate is moved so that the ablation region is always located at the lower edge of the substrate during ablation. It may be advantageous to use a multiaxial robot.
- the substrate is held by means that interact only with inner regions of the surface spaced from the edge region.
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Laser Beam Processing (AREA)
Abstract
Description
Claims
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010500383A JP2010524203A (ja) | 2007-03-30 | 2008-03-26 | 太陽電池をレーザーアブレーションするための方法 |
| CN2008800106174A CN101647126B (zh) | 2007-03-30 | 2008-03-26 | 用于激光刻蚀太阳能电池的方法 |
| EP08737595A EP2131993A2 (de) | 2007-03-30 | 2008-03-26 | Methode zum laserritzen von solarzellen |
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102007015767A DE102007015767A1 (de) | 2007-03-30 | 2007-03-30 | Methode zum Laserritzen von Solarzellen |
| DE102007015767.5 | 2007-03-30 | ||
| US90972807P | 2007-04-03 | 2007-04-03 | |
| US60/909,728 | 2007-04-03 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2008120102A2 true WO2008120102A2 (de) | 2008-10-09 |
| WO2008120102A3 WO2008120102A3 (de) | 2008-12-24 |
Family
ID=39719583
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/IB2008/001117 Ceased WO2008120102A2 (de) | 2007-03-30 | 2008-03-26 | Methode zum laserritzen von solarzellen |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8299396B2 (de) |
| EP (1) | EP2131993A2 (de) |
| JP (1) | JP2010524203A (de) |
| CN (1) | CN101647126B (de) |
| DE (1) | DE102007015767A1 (de) |
| TW (1) | TWI440199B (de) |
| WO (1) | WO2008120102A2 (de) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007275962A (ja) * | 2006-04-10 | 2007-10-25 | Disco Abrasive Syst Ltd | レーザー加工装置 |
| DE102009020365A1 (de) * | 2009-05-07 | 2010-11-11 | Jenoptik Automatisierungstechnik Gmbh | Verfahren zur Herstellung von Dünnschichtsolarzellenmodulen mit einer vorbestimmten Transparenz |
| DE102009021273A1 (de) * | 2009-05-14 | 2010-11-18 | Schott Solar Ag | Verfahren und Vorrichtung zur Herstellung eines photovoltaischen Dünnschichtmoduls |
| ITUD20090105A1 (it) * | 2009-05-27 | 2010-11-28 | Applied Materials Inc | Applicazione laser in fibra per un processo di rimozione della pellicola di bordo in applicazioni di celle solari |
| KR20120101460A (ko) * | 2009-11-19 | 2012-09-13 | 오리콘 솔라 아게, 트루바흐 | 기판으로부터 박막을 어블레이션하는 방법 및 장치 |
| CN102110745B (zh) * | 2010-12-20 | 2012-07-04 | 东莞宏威薄膜真空技术有限公司 | 薄膜层边缘清除装置及清除方法 |
| DE102011103589B4 (de) * | 2011-05-30 | 2024-08-08 | Hegla Boraident Gmbh & Co. Kg | Verfahren zum Entfernen einer Schicht auf einem Trägersubstrat |
| DE102011103481B4 (de) * | 2011-06-03 | 2017-08-17 | Leibniz-Institut für Oberflächenmodifizierung e.V. | Selektives Abtragen dünner Schichten mittels gepulster Laserstrahlung zur Dünnschichtstrukturierung |
| US20130153552A1 (en) * | 2011-12-14 | 2013-06-20 | Gwangju Institute Of Science And Technology | Scribing apparatus and method for having analysis function of material distribution |
| US8980156B2 (en) * | 2012-02-23 | 2015-03-17 | Nike, Inc. | System and method for making golf balls |
| CN102626831A (zh) * | 2012-04-09 | 2012-08-08 | 镇江大成新能源有限公司 | 薄膜太阳能电池飞秒激光刻蚀设备 |
| DE102018010277B4 (de) | 2018-03-29 | 2022-01-13 | Hegla Boraident Gmbh & Co. Kg | Entschichtungsverfahren und Verwendung einer Entschichtungseinrichtung zum Entschichten von Glastafeln, vorzugsweise Verbundglastafeln |
| DE102018107697B4 (de) | 2018-03-29 | 2020-12-10 | Hegla Boraident Gmbh & Co. Kg | Entschichtungseinrichtungen und -verfahren zum Entschichten von Glastafeln, vorzugsweise Verbundglastafeln |
| KR102270936B1 (ko) * | 2019-06-17 | 2021-07-01 | 세메스 주식회사 | 기판 처리 방법 및 기판 처리 장치 |
| DE102019213603A1 (de) | 2019-09-06 | 2021-03-11 | Hegla Boraident Gmbh & Co. Kg | Entschichtungseinrichtung und -verfahren zum Entschichten von Glasscheiben, sowie Verfahren zur Herstellung von Glasscheiben für Stufenglas, Stufenglas und Stufenglasfenster |
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| US4650524A (en) * | 1984-06-20 | 1987-03-17 | Sanyo Electric Co., Ltd | Method for dividing semiconductor film formed on a substrate into plural regions by backside energy beam irradiation |
| JPS61210063A (ja) | 1985-03-14 | 1986-09-18 | Mitsubishi Chem Ind Ltd | アリ−ルスルホン類 |
| JPS6240986A (ja) | 1985-08-20 | 1987-02-21 | Fuji Electric Corp Res & Dev Ltd | レ−ザ−加工方法 |
| US4705698A (en) * | 1986-10-27 | 1987-11-10 | Chronar Corporation | Isolation of semiconductor contacts |
| FI78577C (fi) * | 1987-12-30 | 1989-08-10 | Vaisala Oy | Foerfarande foer avstaemning av en plankondensator. |
| US5082791A (en) * | 1988-05-13 | 1992-01-21 | Mobil Solar Energy Corporation | Method of fabricating solar cells |
| JPH0523875A (ja) * | 1991-07-24 | 1993-02-02 | Nec Yamagata Ltd | レーザーマーキング装置 |
| EP0536431B1 (de) * | 1991-10-07 | 1994-11-30 | Siemens Aktiengesellschaft | Laserbearbeitungsverfahren für einen Dünnschichtaufbau |
| DE29512519U1 (de) * | 1994-10-27 | 1995-09-21 | Benteler Ag, 33104 Paderborn | Vorrichtung zum Abbrechen eines Randstreifens einer Glasscheibe |
| JPH11267860A (ja) | 1998-03-23 | 1999-10-05 | Olympus Optical Co Ltd | マーキング装置 |
| US6413839B1 (en) * | 1998-10-23 | 2002-07-02 | Emcore Corporation | Semiconductor device separation using a patterned laser projection |
| US7649153B2 (en) * | 1998-12-11 | 2010-01-19 | International Business Machines Corporation | Method for minimizing sample damage during the ablation of material using a focused ultrashort pulsed laser beam |
| CN1211862C (zh) * | 1999-04-07 | 2005-07-20 | 壳牌太阳能股份有限公司 | 衬底薄膜烧蚀方法及其设备 |
| DE19933703B4 (de) * | 1999-04-07 | 2005-07-28 | Shell Solar Gmbh | Vorrichtung und Verfahren zum Abtragen von Schichten auf einer Solarzelle |
| BE1013237A3 (fr) * | 2000-01-20 | 2001-11-06 | Wallonia Space Logistics En Ab | Procede d'enlevement local d'un revetement applique sur un substrat translucide ou transparent. |
| US6422082B1 (en) * | 2000-11-27 | 2002-07-23 | General Electric Company | Laser shock peening quality assurance by ultrasonic analysis |
| US6559411B2 (en) * | 2001-08-10 | 2003-05-06 | First Solar, Llc | Method and apparatus for laser scribing glass sheet substrate coatings |
| US20030047538A1 (en) * | 2001-09-12 | 2003-03-13 | Paul Trpkovski | Laser etching indicia apparatus |
| US6737605B1 (en) * | 2003-01-21 | 2004-05-18 | Gerald L. Kern | Single and/or dual surface automatic edge sensing trimmer |
| JP4342992B2 (ja) * | 2004-03-17 | 2009-10-14 | 株式会社ディスコ | レーザー加工装置のチャックテーブル |
| US20070084838A1 (en) * | 2004-12-07 | 2007-04-19 | Chih-Ming Hsu | Method and cutting system for cutting a wafer by laser using a vacuum working table |
| US20100038825A1 (en) * | 2006-12-21 | 2010-02-18 | Mcdonald Joel P | Methods of forming microchannels by ultrafast pulsed laser direct-write processing |
-
2007
- 2007-03-30 DE DE102007015767A patent/DE102007015767A1/de not_active Withdrawn
-
2008
- 2008-03-26 WO PCT/IB2008/001117 patent/WO2008120102A2/de not_active Ceased
- 2008-03-26 CN CN2008800106174A patent/CN101647126B/zh not_active Expired - Fee Related
- 2008-03-26 EP EP08737595A patent/EP2131993A2/de not_active Withdrawn
- 2008-03-26 JP JP2010500383A patent/JP2010524203A/ja active Pending
- 2008-03-27 TW TW097110931A patent/TWI440199B/zh not_active IP Right Cessation
- 2008-03-31 US US12/059,305 patent/US8299396B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN101647126A (zh) | 2010-02-10 |
| JP2010524203A (ja) | 2010-07-15 |
| US8299396B2 (en) | 2012-10-30 |
| DE102007015767A1 (de) | 2008-10-02 |
| TWI440199B (zh) | 2014-06-01 |
| EP2131993A2 (de) | 2009-12-16 |
| TW200849634A (en) | 2008-12-16 |
| WO2008120102A3 (de) | 2008-12-24 |
| CN101647126B (zh) | 2011-09-07 |
| US20080237189A1 (en) | 2008-10-02 |
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