WO2009028062A1 - Ｆｒｅｔ検出方法および装置 - Google Patents

Ｆｒｅｔ検出方法および装置 Download PDF

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Publication number
WO2009028062A1
WO2009028062A1 PCT/JP2007/066849 JP2007066849W WO2009028062A1 WO 2009028062 A1 WO2009028062 A1 WO 2009028062A1 JP 2007066849 W JP2007066849 W JP 2007066849W WO 2009028062 A1 WO2009028062 A1 WO 2009028062A1
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WO
WIPO (PCT)
Prior art keywords
fluorescence
fret
donor
leak rate
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2007/066849
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English (en)
French (fr)
Inventor
Shigeyuki Nakada
Noriaki Kimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsui Engineering and Shipbuilding Co Ltd
Original Assignee
Mitsui Engineering and Shipbuilding Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsui Engineering and Shipbuilding Co Ltd filed Critical Mitsui Engineering and Shipbuilding Co Ltd
Priority to KR1020097027321A priority Critical patent/KR101152615B1/ko
Priority to CN2007800537062A priority patent/CN101688836B/zh
Priority to PCT/JP2007/066849 priority patent/WO2009028062A1/ja
Priority to EP07806326.0A priority patent/EP2196794A4/en
Priority to US12/675,323 priority patent/US8614099B2/en
Publication of WO2009028062A1 publication Critical patent/WO2009028062A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • G01N2021/6439—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" with indicators, stains, dyes, tags, labels, marks
    • G01N2021/6441—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" with indicators, stains, dyes, tags, labels, marks with two or more labels

Landscapes

  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pathology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Optics & Photonics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

　蛍光検出情報の不確定要素を除外して、定量的にＦＲＥＴ効率を測定するとき、測定対象サンプルの蛍光のうち、ドナー分子が発するドナー蛍光成分の漏れ込み率と、アクセプタ分子が発するアクセプタ蛍光成分の漏れ込み率と、ＦＲＥＴが発生しない場合のドナー蛍光成分の非ＦＲＥＴ蛍光寿命と、を少なくとも含む、予め記憶手段に記憶されているキャリブレーション情報を取得する。次に、測定対象サンプルの蛍光の蛍光強度情報および位相情報と、ドナー蛍光成分の漏れ込み率およびアクセプタ蛍光成分の漏れ込み率とを用いて、ドナー蛍光成分のＦＲＥＴ蛍光寿命を求め、ＦＲＥＴ効率を求める。
PCT/JP2007/066849 2007-08-30 2007-08-30 Ｆｒｅｔ検出方法および装置 Ceased WO2009028062A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
KR1020097027321A KR101152615B1 (ko) 2007-08-30 2007-08-30 형광공명에너지이동 검출 방법 및 장치
CN2007800537062A CN101688836B (zh) 2007-08-30 2007-08-30 Fret检测方法及装置
PCT/JP2007/066849 WO2009028062A1 (ja) 2007-08-30 2007-08-30 Ｆｒｅｔ検出方法および装置
EP07806326.0A EP2196794A4 (en) 2007-08-30 2007-08-30 DEVICE AND METHOD FOR DETECTING FLUORESCENCE ENERGY TRANSFER (FRET)
US12/675,323 US8614099B2 (en) 2007-08-30 2007-08-30 FRET detection method and device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/066849 WO2009028062A1 (ja) 2007-08-30 2007-08-30 Ｆｒｅｔ検出方法および装置

Publications (1)

Publication Number Publication Date
WO2009028062A1 true WO2009028062A1 (ja) 2009-03-05

Family

ID=40386806

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/066849 Ceased WO2009028062A1 (ja) 2007-08-30 2007-08-30 Ｆｒｅｔ検出方法および装置

Country Status (5)

Country Link
US (1) US8614099B2 (ja)
EP (1) EP2196794A4 (ja)
KR (1) KR101152615B1 (ja)
CN (1) CN101688836B (ja)
WO (1) WO2009028062A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011142103A1 (ja) * 2010-05-12 2011-11-17 三井造船株式会社 Ｆｒｅｔ測定方法及びｆｒｅｔ測定装置

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8415627B2 (en) * 2008-09-19 2013-04-09 Mitsui Engineering & Shipbuilding Co., Ltd. Fluorescence detection device using intensity-modulated laser light and fluorescence detection method
DE102009024943A1 (de) * 2009-06-10 2010-12-16 W.O.M. World Of Medicine Ag Bildgebungssystem und Verfahren zur fluoreszenz-optischen Visualisierung eines Objekts
KR20120104265A (ko) * 2010-01-06 2012-09-20 미쯔이 죠센 가부시키가이샤 형광 검출 장치, 형광 검출 방법 및 형광 신호를 신호 처리하는 방법
US8352207B2 (en) * 2010-03-31 2013-01-08 Ecolab Usa Inc. Methods for calibrating a fluorometer
US20150044763A1 (en) * 2012-03-22 2015-02-12 Mitsui Engineering & Shipbuilding Co., Ltd. Fret measurement device and fret measurement method
JP5585973B2 (ja) * 2012-03-22 2014-09-10 三井造船株式会社 Ｆｒｅｔ計測装置及びｆｒｅｔ計測方法
CN108778098A (zh) * 2016-03-14 2018-11-09 美国亚德诺半导体公司 皮肤类型和条件的光学评估
US10337993B2 (en) * 2016-04-15 2019-07-02 Massachusetts Institute Of Technology Methods and apparatus for fluorescence lifetime imaging with periodically modulated light
EP3644046A4 (en) * 2017-06-23 2020-07-08 Konica Minolta, Inc. SAMPLE DETECTION DEVICE AND SAMPLE DETECTION METHOD
CN110334319B (zh) * 2019-05-22 2021-06-29 航天科工防御技术研究试验中心 发射飞行可靠性评估方法
JP7624015B2 (ja) 2020-04-20 2025-01-29 ベクトン・ディキンソン・アンド・カンパニー 光検出器の定量的特性評価のための装置及び方法
CN116593427B (zh) * 2023-03-13 2025-08-05 华南师范大学 一种用于定量fret成像的激发光强度自动校准装置及方法

Citations (8)

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JPH07229835A (ja) * 1994-02-16 1995-08-29 Hamamatsu Photonics Kk エネルギー移動検出法およびその装置
JPH10227739A (ja) * 1997-02-18 1998-08-25 Bunshi Bio Photonics Kenkyusho:Kk 被検体検出方法および装置
JPH10332594A (ja) * 1997-05-28 1998-12-18 Bunshi Baiohotonikusu Kenkyusho:Kk 被検体検出方法
JP2002535655A (ja) * 1999-01-19 2002-10-22 インペリアル キャンサー リサーチ テクノロジー リミテッド 細胞成分に対する変化を検出する方法
JP2005037399A (ja) 2003-07-17 2005-02-10 General Electric Co <Ge> ファイバオプティクスを用いる電気機械の固定部品の温度測定
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JP2005207823A (ja) 2004-01-21 2005-08-04 Olympus Corp 蛍光分光分析の方法
JP2006054347A (ja) 2004-08-12 2006-02-23 Rohm Co Ltd 発光素子及びその作製方法

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CN1142423C (zh) * 2000-04-28 2004-03-17 华中理工大学 定量测量荧光共振能量转移效率的方法
WO2003029796A1 (en) * 2001-09-28 2003-04-10 Ciencia, Incorporated Method to improve sensitivity of molecular binding assays using phase-sensitive luminescence detection
US20060287337A1 (en) 2001-11-09 2006-12-21 Proteologics, Inc. Trans-golgi network-associated processes, methods and compositions related thereto
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Patent Citations (8)

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JPH07229835A (ja) * 1994-02-16 1995-08-29 Hamamatsu Photonics Kk エネルギー移動検出法およびその装置
JPH10227739A (ja) * 1997-02-18 1998-08-25 Bunshi Bio Photonics Kenkyusho:Kk 被検体検出方法および装置
JPH10332594A (ja) * 1997-05-28 1998-12-18 Bunshi Baiohotonikusu Kenkyusho:Kk 被検体検出方法
JP2002535655A (ja) * 1999-01-19 2002-10-22 インペリアル キャンサー リサーチ テクノロジー リミテッド 細胞成分に対する変化を検出する方法
JP2005519636A (ja) * 2001-11-09 2005-07-07 プロテオロジックス，インク． Ｐｏｓｈ核酸、ポリペプチド及び関連する方法、関連する用途
JP2005037399A (ja) 2003-07-17 2005-02-10 General Electric Co <Ge> ファイバオプティクスを用いる電気機械の固定部品の温度測定
JP2005207823A (ja) 2004-01-21 2005-08-04 Olympus Corp 蛍光分光分析の方法
JP2006054347A (ja) 2004-08-12 2006-02-23 Rohm Co Ltd 発光素子及びその作製方法

Non-Patent Citations (2)

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Title
See also references of EP2196794A4 *
SHIGEYUKI NAKADA ET AL: "Keiko jumyo FRET flow cytometry sochi no kaihatsu", MITSUI ZOSEN TECHNICAL REVIEW, no. 190, 31 March 2007 (2007-03-31), pages 54 - 60, XP003027158 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011142103A1 (ja) * 2010-05-12 2011-11-17 三井造船株式会社 Ｆｒｅｔ測定方法及びｆｒｅｔ測定装置
JP2011237342A (ja) * 2010-05-12 2011-11-24 Mitsui Eng & Shipbuild Co Ltd Ｆｒｅｔ測定方法及びｆｒｅｔ測定装置

Also Published As

Publication number Publication date
EP2196794A4 (en) 2014-04-02
KR101152615B1 (ko) 2012-06-07
CN101688836B (zh) 2012-08-29
US8614099B2 (en) 2013-12-24
CN101688836A (zh) 2010-03-31
KR20100017952A (ko) 2010-02-16
US20100312482A1 (en) 2010-12-09
EP2196794A1 (en) 2010-06-16

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