WO2009057301A1 - レーザ励起蛍光顕微鏡 - Google Patents

レーザ励起蛍光顕微鏡 Download PDF

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Publication number
WO2009057301A1
WO2009057301A1 PCT/JP2008/003094 JP2008003094W WO2009057301A1 WO 2009057301 A1 WO2009057301 A1 WO 2009057301A1 JP 2008003094 W JP2008003094 W JP 2008003094W WO 2009057301 A1 WO2009057301 A1 WO 2009057301A1
Authority
WO
WIPO (PCT)
Prior art keywords
laser
exciting
light beams
highly
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/003094
Other languages
English (en)
French (fr)
Inventor
Hisashi Okugawa
Naoshi Aikawa
Masatoshi Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2007283133A external-priority patent/JP2009109818A/ja
Priority claimed from JP2007284758A external-priority patent/JP2009109933A/ja
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to EP08844871.7A priority Critical patent/EP2204685B1/en
Priority to AU2008320236A priority patent/AU2008320236A1/en
Priority to CN200880112675.8A priority patent/CN101836152B/zh
Publication of WO2009057301A1 publication Critical patent/WO2009057301A1/ja
Priority to US12/748,031 priority patent/US8310754B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/08—Mirrors
    • G02B5/0816—Multilayer mirrors, i.e. having two or more reflecting layers
    • G02B5/0825—Multilayer mirrors, i.e. having two or more reflecting layers the reflecting layers comprising dielectric materials only
    • G02B5/0833—Multilayer mirrors, i.e. having two or more reflecting layers the reflecting layers comprising dielectric materials only comprising inorganic materials only
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G02B5/28—Interference filters
    • G02B5/285—Interference filters comprising deposited thin solid films

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

　本発明は、高効率なレーザ励起蛍光顕微鏡を提供することを目的とする。そのために本発明のレーザ励起蛍光顕微鏡は、波長の異なる少なくとも２種類の励起光を出射するレーザ光源部（１０）と、前記レーザ光源部が出射した前記２種類の励起光を標本へ集光する集光部（１１０）と、前記レーザ光源部と前記集光部との間に配置され、前記レーザ光源部が出射した前記２種類の励起光を反射して前記集光部へ入射させると共に、それら２種類の励起光に応じて前記標本で発生した２種類の蛍光を透過させる高機能ダイクロイックミラー（２２）と、前記高機能ダイクロイックミラーを透過した光を検出する検出部（５０）とを備え、前記高機能ダイクロイックミラー（２２）に対する前記励起光及び前記蛍光の入射角度θは、０°＜θ＜４５°の式を満たす。
PCT/JP2008/003094 2007-10-31 2008-10-29 レーザ励起蛍光顕微鏡 Ceased WO2009057301A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP08844871.7A EP2204685B1 (en) 2007-10-31 2008-10-29 Laser-exciting fluorescence microscope
AU2008320236A AU2008320236A1 (en) 2007-10-31 2008-10-29 Laser-exciting fluorescence microscope
CN200880112675.8A CN101836152B (zh) 2007-10-31 2008-10-29 激光激发荧光显微镜
US12/748,031 US8310754B2 (en) 2007-10-31 2010-03-26 Laser excitation fluorescent microscope

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2007-283133 2007-10-31
JP2007283133A JP2009109818A (ja) 2007-10-31 2007-10-31 レーザ励起蛍光顕微鏡
JP2007284758A JP2009109933A (ja) 2007-11-01 2007-11-01 レーザ励起蛍光顕微鏡
JP2007-284758 2007-11-01

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/748,031 Continuation US8310754B2 (en) 2007-10-31 2010-03-26 Laser excitation fluorescent microscope

Publications (1)

Publication Number Publication Date
WO2009057301A1 true WO2009057301A1 (ja) 2009-05-07

Family

ID=40590706

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/003094 Ceased WO2009057301A1 (ja) 2007-10-31 2008-10-29 レーザ励起蛍光顕微鏡

Country Status (6)

Country Link
US (1) US8310754B2 (ja)
EP (1) EP2204685B1 (ja)
KR (1) KR20100087141A (ja)
CN (1) CN101836152B (ja)
AU (1) AU2008320236A1 (ja)
WO (1) WO2009057301A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017522605A (ja) * 2014-07-28 2017-08-10 ライカ マイクロシステムズ シーエムエス ゲゼルシャフト ミット ベシュレンクテル ハフツングＬｅｉｃａ Ｍｉｃｒｏｓｙｓｔｅｍｓ ＣＭＳ ＧｍｂＨ ビームスプリッタ装置を備えた顕微鏡

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WO2011019553A2 (en) * 2009-08-10 2011-02-17 Chroma Technology Corporation Microscope cube
US8305502B2 (en) * 2009-11-11 2012-11-06 Eastman Kodak Company Phase-compensated thin-film beam combiner
DE102010049212A1 (de) * 2010-10-21 2012-04-26 Rudolf Grosskopf Simultane Fluoreszenzkorrelationsspektroskopie (sFCS)
DE102010055882A1 (de) * 2010-12-22 2012-06-28 Carl Zeiss Microlmaging Gmbh Pinhole für ein konfokales Laser-Scanning Mikroskop
CN102436061B (zh) * 2011-12-13 2013-06-12 刘诚 高速三维荧光成像显微镜
CN103424392A (zh) * 2012-05-24 2013-12-04 黄书伟 波长分工srs显微镜
SE1351503A1 (sv) * 2013-12-16 2015-01-07 Per Fogelstrand System och metod för fluorescensmikroskopi med detektering av ljusemission från multipla fluorokromer
JP6300658B2 (ja) * 2014-06-19 2018-03-28 オリンパス株式会社 標本観察装置
CN105629453A (zh) * 2016-03-10 2016-06-01 德诺杰亿（北京）生物科技有限公司 荧光显微镜
CN109313326B (zh) * 2016-05-19 2021-09-17 株式会社尼康 显微镜
CN106644068B (zh) * 2016-12-30 2018-05-11 聚光科技(杭州)股份有限公司 一种长光程光学系统
JP2019066706A (ja) * 2017-10-02 2019-04-25 ソニー株式会社 蛍光顕微鏡装置及び蛍光顕微鏡システム
US11029506B2 (en) * 2018-04-20 2021-06-08 Coluxa Inc. Scanning microscope with multiplexed light sources
JP7380569B2 (ja) 2018-08-09 2023-11-15 ソニーグループ株式会社 光学顕微鏡装置及び光学顕微鏡システム
US11209367B2 (en) * 2018-08-27 2021-12-28 Yale University Multi-color imaging using salvaged fluorescence
JP2022524888A (ja) * 2019-03-29 2022-05-10 ファセ ホログラフィック イマイング ペーホーイー アクティエボラーグ 顕微鏡観察のためのマイクロプレート
JP7430449B2 (ja) 2020-02-04 2024-02-13 株式会社ディスコ 加工装置
EP4562406A1 (en) * 2022-07-28 2025-06-04 Fei Deutschland GmbH Multi-spot confocal imaging system with spectral multiplexing
JP2026509679A (ja) * 2022-11-12 2026-03-24 ルーメンコア インコーポレイテッド 自由空間光学系リンケージを有する共焦点顕微鏡検査システム
CN115575374B (zh) * 2022-11-18 2023-03-31 北京超维景生物科技有限公司 用于微型多光子显微镜的光学仪器及成像系统、成像方法

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JPH0387721A (ja) * 1989-08-31 1991-04-12 Asahi Glass Co Ltd 投射型カラー液晶表示装置
JPH05249408A (ja) * 1992-03-06 1993-09-28 Seiko Epson Corp 投写型液晶表示装置
JP2004177495A (ja) * 2002-11-25 2004-06-24 Olympus Corp 顕微鏡
JP2005055745A (ja) * 2003-08-06 2005-03-03 Olympus Corp 走査型光学顕微鏡
JP2005140981A (ja) * 2003-11-06 2005-06-02 Nikon Corp 顕微鏡装置
JP2006125970A (ja) * 2004-10-28 2006-05-18 Nikon Corp 分光装置および分光システム
JP2006156392A (ja) * 2004-11-30 2006-06-15 Samsung Sdi Co Ltd 二次電池モジュールおよびこれに適用される単位電池固定用エンドプレート

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JPH0387721A (ja) * 1989-08-31 1991-04-12 Asahi Glass Co Ltd 投射型カラー液晶表示装置
JPH05249408A (ja) * 1992-03-06 1993-09-28 Seiko Epson Corp 投写型液晶表示装置
JP2004177495A (ja) * 2002-11-25 2004-06-24 Olympus Corp 顕微鏡
JP2005055745A (ja) * 2003-08-06 2005-03-03 Olympus Corp 走査型光学顕微鏡
JP2005140981A (ja) * 2003-11-06 2005-06-02 Nikon Corp 顕微鏡装置
JP2006125970A (ja) * 2004-10-28 2006-05-18 Nikon Corp 分光装置および分光システム
JP2006156392A (ja) * 2004-11-30 2006-06-15 Samsung Sdi Co Ltd 二次電池モジュールおよびこれに適用される単位電池固定用エンドプレート

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017522605A (ja) * 2014-07-28 2017-08-10 ライカ マイクロシステムズ シーエムエス ゲゼルシャフト ミット ベシュレンクテル ハフツングＬｅｉｃａ Ｍｉｃｒｏｓｙｓｔｅｍｓ ＣＭＳ ＧｍｂＨ ビームスプリッタ装置を備えた顕微鏡

Also Published As

Publication number Publication date
CN101836152A (zh) 2010-09-15
US8310754B2 (en) 2012-11-13
CN101836152B (zh) 2014-04-16
EP2204685A4 (en) 2011-07-13
EP2204685A1 (en) 2010-07-07
EP2204685B1 (en) 2022-04-20
AU2008320236A1 (en) 2009-05-07
US20100182683A1 (en) 2010-07-22
KR20100087141A (ko) 2010-08-03

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