WO2009092975A3 - Instrument et procede de caracterisation d'un systeme optique - Google Patents

Instrument et procede de caracterisation d'un systeme optique Download PDF

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Publication number
WO2009092975A3
WO2009092975A3 PCT/FR2009/050064 FR2009050064W WO2009092975A3 WO 2009092975 A3 WO2009092975 A3 WO 2009092975A3 FR 2009050064 W FR2009050064 W FR 2009050064W WO 2009092975 A3 WO2009092975 A3 WO 2009092975A3
Authority
WO
WIPO (PCT)
Prior art keywords
optical system
instrument
wave front
characterising
front analyser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/FR2009/050064
Other languages
English (en)
Other versions
WO2009092975A2 (fr
Inventor
Xavier Levecq
Guillaume Dovillaire
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Imagine Optic SA
Original Assignee
Imagine Optic SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Imagine Optic SA filed Critical Imagine Optic SA
Priority to DE112009000132.7T priority Critical patent/DE112009000132B4/de
Priority to JP2010542669A priority patent/JP5390534B2/ja
Priority to US12/863,058 priority patent/US8593623B2/en
Publication of WO2009092975A2 publication Critical patent/WO2009092975A2/fr
Publication of WO2009092975A3 publication Critical patent/WO2009092975A3/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0285—Testing optical properties by measuring material or chromatic transmission properties

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Instrument (1) pour caractériser un système optique, comprenant : - au moins une source primaire (3) pour émettre un faisceau lumineux d'éclairage (FE), - un dispositif optique pour diriger ce faisceau d'éclairage (FE) sur le système optique (L) à caractériser, - un analyseur de front d'onde (4), agencé pour recevoir un faisceau issu du système optique (L), et - une unité de traitement des signaux de mesure issu de l'analyseur de font d'onde (4), prévue pour délivrer des informations de caractérisation du système optique (L). Cet instrument comprend en outre un élément de diffusion (22) disposé sensiblement en un plan de focalisation du système optique (L), de façon à créer une source secondaire générant un faisceau secondaire traversant ce système optique (L) et dirigé ensuite vers l'analyseur de front d'onde.
PCT/FR2009/050064 2008-01-18 2009-01-16 Instrument et procede de caracterisation d'un systeme optique Ceased WO2009092975A2 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
DE112009000132.7T DE112009000132B4 (de) 2008-01-18 2009-01-16 Instrument und Verfahren zur Charakterisierung eines optischen Systems
JP2010542669A JP5390534B2 (ja) 2008-01-18 2009-01-16 光学系を特性評価するための機器及び方法
US12/863,058 US8593623B2 (en) 2008-01-18 2009-01-16 Instrument and method for characterising an optical system

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0850336 2008-01-18
FR0850336A FR2926636B1 (fr) 2008-01-18 2008-01-18 Instrument et procede de caracterisation d'un systeme optique

Publications (2)

Publication Number Publication Date
WO2009092975A2 WO2009092975A2 (fr) 2009-07-30
WO2009092975A3 true WO2009092975A3 (fr) 2009-09-17

Family

ID=39714172

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FR2009/050064 Ceased WO2009092975A2 (fr) 2008-01-18 2009-01-16 Instrument et procede de caracterisation d'un systeme optique

Country Status (5)

Country Link
US (1) US8593623B2 (fr)
JP (1) JP5390534B2 (fr)
DE (1) DE112009000132B4 (fr)
FR (1) FR2926636B1 (fr)
WO (1) WO2009092975A2 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011119806B4 (de) * 2011-11-25 2020-10-15 Carl Zeiss Vision International Gmbh Verfahren und Vorrichtung zum Sichtbarmachen eines Signierzeichens auf einem Brillenglas
DE102013008645B3 (de) * 2013-05-21 2014-08-21 Alsitec S.A.R.L. Bearbeitungskopf für eine Laserbearbeitungsvorrichtung, Laserbearbeitungsvorrichtung sowie Verfahren zum Messen von Veränderungen der Brennweite einer in einem Bearbeitungskopf enthaltenen Fokussieroptik
FR3017963B1 (fr) 2014-02-27 2016-03-25 Essilor Int Instrument optique pour identifier et localiser des microgravures presentes sur une lentille ophtalmique
FR3017964B1 (fr) 2014-02-27 2016-03-25 Essilor Int Instrument optique pour reperer au moins un point caracteristique d'une lentille ophtalmique
CN113916507B (zh) * 2021-10-11 2024-03-08 北京环境特性研究所 小空间高集成度红外共孔径光学系统测试装置及方法
DE102023200924A1 (de) * 2023-02-06 2024-02-22 Carl Zeiss Smt Gmbh Messvorrichtung zur interferometrischen Bestimmung einer Oberflächenform
KR20240127754A (ko) * 2023-02-16 2024-08-23 삼성전자주식회사 광학 계측 설비

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2193975A1 (fr) * 1972-07-26 1974-02-22 Sira Institute
EP0831298A2 (fr) * 1996-09-20 1998-03-25 Nikon Corporation Dispositifs et procédés pour mesurer l'aberration d'une surface
US6266141B1 (en) * 1998-04-22 2001-07-24 Ricoh Company, Ltd. Birefringence measuring apparatus and method of measuring birefringence
US20010035948A1 (en) * 2000-03-31 2001-11-01 Takanori Maeda Apparatus for measuring aberration of a lens and an apparatus for adjusting a position of the lens
WO2001089372A2 (fr) * 2000-05-20 2001-11-29 Carl Zeiss Procede et appareil permettant de mesurer des erreurs de refraction d'un oeil
WO2003022140A2 (fr) * 2001-09-12 2003-03-20 Johnson & Johnson Vision Care, Inc. Dispositifs de mesure de font d'onde ophtalmique
US20040041978A1 (en) * 2002-05-31 2004-03-04 Neal Daniel R. Method and system for sensing and analyzing a wavefront of an optically transmissive system
US20040174535A1 (en) * 2003-03-07 2004-09-09 Yoshiyuki Kuramoto Abberration measuring apparatus
DE10333426A1 (de) * 2003-07-17 2005-02-10 Carl Zeiss Verfahren und Vorrichtung zum Sichtbarmachen eines Signierzeichens auf einem Brillenglas
US20050105044A1 (en) * 2003-11-14 2005-05-19 Laurence Warden Lensometers and wavefront sensors and methods of measuring aberration

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3040140B2 (ja) * 1990-07-12 2000-05-08 株式会社リコー 色収差測定方法及び測定装置
US6148097A (en) * 1995-06-07 2000-11-14 Asahi Kogaku Kogyo Kabushiki Kaisha Optical member inspecting apparatus and method of inspection thereof
US5847822A (en) * 1995-08-29 1998-12-08 Asahi Kogaku Kogyo Kabushiki Kaisha Optical element inspecting apparatus
JP3823266B2 (ja) * 1997-05-13 2006-09-20 株式会社トプコン 光学特性測定装置
DE69737242T2 (de) * 1997-11-21 2007-10-25 Alcon Inc. Objektive messung und korrektur optischer systeme mittels wellenfrontanalyse
US6687396B1 (en) * 1998-07-29 2004-02-03 Pentax Corporation Optical member inspection apparatus, image-processing apparatus, image-processing method, and computer readable medium
TW550377B (en) * 2000-02-23 2003-09-01 Zeiss Stiftung Apparatus for wave-front detection
US6575572B2 (en) * 2001-09-21 2003-06-10 Carl Zeiss Ophthalmic Systems, Inc. Method and apparatus for measuring optical aberrations of an eye
JP4245967B2 (ja) * 2003-04-23 2009-04-02 オリンパス株式会社 レンズ軸上軸外点像観察装置および方法
JP4229782B2 (ja) * 2003-09-05 2009-02-25 オリンパス株式会社 波面収差測定装置
JP2007069283A (ja) * 2005-09-05 2007-03-22 Nikon Corp 加工装置および加工装置を用いた製造方法

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2193975A1 (fr) * 1972-07-26 1974-02-22 Sira Institute
EP0831298A2 (fr) * 1996-09-20 1998-03-25 Nikon Corporation Dispositifs et procédés pour mesurer l'aberration d'une surface
US6266141B1 (en) * 1998-04-22 2001-07-24 Ricoh Company, Ltd. Birefringence measuring apparatus and method of measuring birefringence
US20010035948A1 (en) * 2000-03-31 2001-11-01 Takanori Maeda Apparatus for measuring aberration of a lens and an apparatus for adjusting a position of the lens
WO2001089372A2 (fr) * 2000-05-20 2001-11-29 Carl Zeiss Procede et appareil permettant de mesurer des erreurs de refraction d'un oeil
WO2003022140A2 (fr) * 2001-09-12 2003-03-20 Johnson & Johnson Vision Care, Inc. Dispositifs de mesure de font d'onde ophtalmique
US20040041978A1 (en) * 2002-05-31 2004-03-04 Neal Daniel R. Method and system for sensing and analyzing a wavefront of an optically transmissive system
US20040174535A1 (en) * 2003-03-07 2004-09-09 Yoshiyuki Kuramoto Abberration measuring apparatus
DE10333426A1 (de) * 2003-07-17 2005-02-10 Carl Zeiss Verfahren und Vorrichtung zum Sichtbarmachen eines Signierzeichens auf einem Brillenglas
US20050105044A1 (en) * 2003-11-14 2005-05-19 Laurence Warden Lensometers and wavefront sensors and methods of measuring aberration

Also Published As

Publication number Publication date
FR2926636B1 (fr) 2010-09-17
DE112009000132T5 (de) 2010-12-09
FR2926636A1 (fr) 2009-07-24
US20110134417A1 (en) 2011-06-09
JP5390534B2 (ja) 2014-01-15
JP2011510286A (ja) 2011-03-31
US8593623B2 (en) 2013-11-26
WO2009092975A2 (fr) 2009-07-30
DE112009000132B4 (de) 2019-04-11

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