WO2010043716A2 - Procede de croissance controlee de film de graphene - Google Patents
Procede de croissance controlee de film de graphene Download PDFInfo
- Publication number
- WO2010043716A2 WO2010043716A2 PCT/EP2009/063617 EP2009063617W WO2010043716A2 WO 2010043716 A2 WO2010043716 A2 WO 2010043716A2 EP 2009063617 W EP2009063617 W EP 2009063617W WO 2010043716 A2 WO2010043716 A2 WO 2010043716A2
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- WO
- WIPO (PCT)
- Prior art keywords
- carbon
- metal
- graphene
- graphene film
- metal layer
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Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/26—Deposition of carbon only
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/02—Pretreatment of the material to be coated
- C23C16/0272—Deposition of sub-layers, e.g. to promote the adhesion of the main coating
- C23C16/0281—Deposition of sub-layers, e.g. to promote the adhesion of the main coating of metallic sub-layers
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/56—After-treatment
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
Definitions
- the field of the invention is that of the processes for manufacturing very thin graphene conductive layers having the great advantage of being transparent and therefore finding many applications in the field of electronics and visualization because of the excellent properties in terms of absorption and electrical conductivity of this type of material.
- Graphene is a two-dimensional carbon crystal formed of a monoatomic layer of hybrid carbon atoms sp2 (structure of a benzene ring corresponding to hexagonal cells), the graphite being formed by graphene sheets whose thickness corresponds to the size of a carbon atom.
- Graphene can thus very advantageously be applied on the one hand to the fabrication of thin-film transistors (subject to precisely controlling the width of the ribbons, so as to open an energy gap in the strip structure of the material) and on the other hand on the other hand, thin transparent metal layers are available instead of transparent conductive oxides (ie ITO or indium tin oxide) in flat screens, in solar cells and generally in all applications requiring transparent conductor.
- transparent conductive oxides ie ITO or indium tin oxide
- FLG for "few layers graphene”
- the subject of the invention is a method of controlled growth of graphene film characterized in that it comprises the following steps: the production on the surface of a substrate of a layer of a metal having a phase with carbon such that beyond a molar concentration threshold ratio CM / CM + CC, with CM the molar concentration of metal in a metal / carbon mixture and C c the molar concentration of carbon in said mixture, gets a homogeneous solid solution; exposing the metal layer to a controlled flow of carbon atoms or carbon radicals or carbon ions at a temperature such that the obtained ratio of molar concentration is greater than the threshold ratio so as to obtain a solid solution of the carbon in the metal; an operation for modifying the phase of mixing in two phases respectively of metal and graphite leading to the formation of at least one lower film of graphene located at the interface: metal layer incorporating carbon atoms / substrate and a top film of graphene on the surface of the metal layer.
- the method comprises a step of removing the upper film of graphene and a step of removing the metal layer incorporating carbon atoms located between the two graphene films, which can be an operation of chemical etching of the metal layer.
- the method further comprises: an etching operation of the metal layer making it possible to detach the upper film and to disengage the lower graphene film; a transfer step on a second substrate of the graphene upper film.
- the method comprises:
- the substrate comprising the lower graphene film, the metal layer and the upper graphene film in the presence of a chemical etching solution of the metal layer; positioning a second substrate opposite the assembly constituted by the two graphene films and the metal layer;
- the second substrate is of non-refractory material that can be glass or polymer type.
- the operation for modifying the phase of mixing in two phases one of which includes the cooling of the solid carbon solution in the metal so as to precipitate the carbon and form at least one film of graphene.
- the operation for modifying the phase of mixing in two phases one of which includes increasing the concentration of carbon in the solid solution of carbon in the metal.
- the method further comprises a step of exposure to an oxidizing plasma so as to remove the upper film of graphene.
- the method further comprises a step of removing the metal layer incorporating carbon atoms so as to disengage the lower film of graphene.
- the elimination of the metal layer incorporating carbon atoms is carried out by chemical dissolution.
- exposure to a controlled flow of carbon atoms, radicals or carbon ions is carried out in a reactor using a gaseous precursor of CH 4 , C 2 H 2 , C 6 type. H 6 by way of example, at a temperature between about 450 ° C and 900 ° C.
- the exposure to a controlled flow of carbon atoms, radicals or carbon ions is carried out by ion implantation.
- the method further comprises a subsequent annealing step in the ion implantation operation for homogenizing the carbon atoms in the metal layer, followed by a cooling step, in order to allow the precipitation of carbon.
- the production of the metal layer is carried out by epitaxy, the substrate being a monocrystalline inert substrate which may be of the sapphire or quartz type or of magnesium oxide.
- the posterior annealing step is performed by laser.
- the laser is scanned in a plane parallel to the plane of the substrate so as to precipitate graphene and promote nucleation of the graphene atoms, after passing said laser.
- the metal is of cobalt or nickel type and generally any type of transition metal (Ir, Ru ).
- FIGS. 1a, 1b, 1c and 1d represent respectively an atomic plane of hybrid sp2 carbon atoms corresponding to a graphene structure and different structures that may result: fullerenes, carbon nanotubes and graphite;
- Figure 2 illustrates the phase diagram of the cobalt-carbon system;
- FIG. 3 illustrates the reaction paths that can be used for the synthesis of graphene in a process according to the invention;
- FIGS. 1a, 1b, 1c and 1d represent respectively an atomic plane of hybrid sp2 carbon atoms corresponding to a graphene structure and different structures that may result: fullerenes, carbon nanotubes and graphite;
- Figure 2 illustrates the phase diagram of the cobalt-carbon system;
- FIG. 3 illustrates the reaction paths that can be used for the synthesis of graphene in a process according to the invention;
- FIGS. 1a, 1b, 1c and 1d represent respectively an atomic plane of hybrid sp2 carbon atoms
- FIGS. 4a and 4b illustrate the first steps of the method of the invention, of deposition of the metal layer on the surface of a substrate respectively corresponding to a sectional view and to a top view in the case of a layer. thin metal etched;
- FIG. 5 illustrates the step of exposure to a flow of atoms, radicals or carbon ions within the metal layer in the method of the invention;
- Figures 6a and 6b illustrate two views in section and from above a step of obtaining two layers of graphene in the method of the invention;
- FIG. 7 illustrates a step of exposure to an oxidizing plasma in the process of the invention;
- FIGS. 8a and 8b illustrate a step of removing the metal layer at the end of the process of the invention making it possible to clear the layer; graphene interface; FIGS. 9a to 9e illustrate the various steps of an exemplary method of the invention comprising a transfer step making it possible to isolate each of the graphene films; FIGS. 10a to 1 Od illustrate a variant of the invention, in which a laser is used and respectively the implantation of the carbon atoms in the layer, the illumination of the metal layer implanted by a moving laser, the gradient temperature obtained within the metal layer during the displacement of the laser beam and the typical shape of the laser beam focused by a cylindrical lens.
- the graphene film growth method according to the invention consists in using an intermediate metal layer deposited on the surface of a substrate, the chosen metal having a limited solubility range with carbon.
- phase diagram A typical example of a phase diagram is illustrated in FIG. 2 and concerns the phase diagram of the cobalt-carbon system, this example is not limiting, nickel and other metals having phase diagrams similar to that obtained with cobalt.
- the boundary between the homogeneous solid solution and the mixture of the two metal + graphite phases is schematically represented by the curve AB in FIG. 3 which represents an enlargement of a part of the phase diagram illustrated in FIG.
- a certain amount of carbon lower than a Cc concentration is introduced into the metal at the temperature T1 (as illustrated in FIG.
- the carbon concentration is changed, the reaction path illustrated by the arrow F 2 .
- This can be done for example by continuous carbon deposition on the surface of the metal, followed by a volume diffusion (examples of methods will be given in the application below).
- the carbon concentration in the metal reaches the concentration value Cc, the carbon precipitates as graphite.
- the metal is in the form of a thin layer deposited on an inert substrate, the graphite precipitates at the surface and at the interface when one of the two reaction schemes described above is applied.
- the solubility of carbon in the metal is low at ambient temperature, typically of the order of 10 15 to 10 16 / cm 3, it suffices to introduce 8x10 15 atoms / cm 2 at the surface of the metal layer at the working temperature (a monolayer of graphite carbon equals about 3.71 15 / cm 2 carbon atoms) and cool the sample (according to the reaction path F1 illustrated in Figure 3).
- the thickness of the metal will be adapted to the limit concentration of the phase diagram, taking into account the working temperature.
- a minimum thickness of 100 nm of metal is required to fully dissolve a dose of 8x10 15 carbon atoms / cm 2 at the surface of the metal.
- the method thus consists in using a thin layer of a suitable metal, that is to say having a shape of the phase diagram of the metal side as shown schematically in FIG. 3, to expose it, at high temperature (typically from 400 ° C to 1000 ° C), to a controlled flow of carbon or carbon precursor (for example, active radicals in a plasma reactor or in a chemical vapor deposition reactor -
- a layer of selected metal 2 is deposited, as illustrated in FIG. 4a.
- an exposure of the metal layer or only of the metal element by a flow FIc of carbon or of carbon radicals or ions is then carried out.
- the carbon may be introduced at a temperature typically between 450 ° C. and 1000 ° C., in a CVD or PECVD reactor (Plasma-Enhanced CVD) and using a gaseous precursor such as CH 4 , C 2 H 2 , C 6 H 6 , etc.
- the exposure time is adapted according to the partial pressure of the gaseous precursor, its dissociation rate (therefore the temperature, the power of the plasma, etc.).
- the interface graphene layer 31 is of better crystalline quality than the upper surface 30 or "patterned" surface metal elements 301 whose Zc defects are shown in FIG. 6b.
- the procedure is as shown in FIG. 7 for the removal of the top layer 30 of graphene by exposure by a Poxy oxidizing plasma that can typically be of the oxygen flux or water vapor type. This operation also removes the amorphous carbon deposited on the substrate, on the surfaces where the metal has been removed (where the metal has been previously "patterned").
- the metal is then removed (for example by chemical dissolution), leaving on the substrate the graphene film 31 originally present at the interface as illustrated in FIGS. 8a and 8b in the case where the metal has been previously "patterned” by lithography, graphene will be "patterned” in the same way on the substrate.
- the carbon can be introduced by ion implantation between room temperature and 600 ° C, which allows to control the dose incorporated into the metal. The process is then a little different, insofar as annealing is necessary in order to homogenize the carbon implanted in the metal film.
- the carbon implanted metal film is heated to a temperature between 450 and 900 ° C prior to the controlled cooling step which results in graphene precipitation.
- the reaction path is that illustrated in FIG. 3 by the arrow F2 if the implanted dose is greater than the limiting solubility of the carbon in the metal at the treatment temperature. In the opposite case, the reaction path is also F1. If the high temperature solubility limit is exceeded, additional graphitic layers may precipitate during cooling and it may be difficult to obtain a small number of graphene layers at the upper and lower interfaces of the metal. For this, we can practice a quenching, in order to "freeze" the number of layers of graphene on the surface of the metal and at the interface with the substrate.
- a metal layer epitaxially grown on a monocrystalline inert substrate (sapphire, quartz, MgO, spinel, etc.).
- the polymer film is finally dissolved in a solvent.
- the polymer is the host substrate, or it is used as a buffer (nano-imprint method).
- FIGS. 9a to 9e there is provided the following transfer method illustrated by FIGS. 9a to 9e.
- the entire 30/2/31 trilayer on the surface of the substrate 1 is placed in an enclosure E and positioned on a first support Si and placed in the presence of a Fluide solution for etching the coating layer.
- metal 2 typically it may be an aqueous or alcoholic etching solution specific to the metal used (for example, if the metal is nickel, the Fluid solution may be dilute hydrochloric acid).
- the substrate and the top layer are separated by a slight pressure on the substrate of growth.
- the graphene layer being hydrophobic, it remains to float on the etching solution.
- the growth substrate is flowing.
- a second reception substrate S 2 is placed above the etching solution, reception face downwards.
- Liquid Fluid 2 for example water or ethanol, is added until the supernatant upper graphene layer and the host substrate S 2 are brought into contact as illustrated in FIG. 9d.
- Fluid 2 is then withdrawn, leaving the upper graphene layer 30 on the surface of the host substrate S 2 .
- the method of the invention may be advantageous in the method of the invention to use a laser that makes it possible to induce a particular temperature profile within the metal layer in which atoms have been implanted. carbon.
- a laser L which can be slowly displaced on the substrate by a scanning movement as shown in FIG. 10b leading, during cooling, to the formation of the upper 30 and lower 31 layers of graphene.
- the temperature increases sufficiently to induce complete solubilization of the carbon in the metal.
- the temperature decreases to a threshold temperature Tc such as that illustrated in Figure 3 below which the carbon begins to precipitate as graphene.
- Tc threshold temperature
- graphene precipitates as the laser advances and its nucleation is from graphene having already precipitated.
- the method is similar to a lateral epitaxy and the crystalline quality of the graphene obtained is better than during the direct precipitation.
- the temperature is high enough to induce a complete solubilization of the carbon in the metal.
- the carbon precipitates, leading to the formation of graphene layers at the surface and at the interface.
- the laser beam is shaped in the form of a linear brush as shown in FIG. 10c by the use, for example, of a cylindrical lens allowing focusing, a graphene ribbon of width L (corresponding to the length of the brush , see Figure 1 Od which illustrates the typical shape of the laser beam after focusing by a cylindrical lens) is thus generated on the surface of the metal and at the interface with the substrate.
- the laser may just as well be focused on a circular task, and be scanned very quickly in a direction y perpendicular to a direction x in the plane of the substrate and slowly in the x direction.
- the graphene obtained at the surface and at the interface it can as previously eliminate by surface etching and remove the metal to reveal the graphene interface.
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Abstract
Description
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Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011531510A JP5816981B2 (ja) | 2008-10-17 | 2009-10-16 | グラフェン膜成長の制御方法 |
| US13/124,413 US9206509B2 (en) | 2008-10-17 | 2009-10-16 | Method for the controlled growth of a graphene film |
| EP09736945A EP2334839A2 (fr) | 2008-10-17 | 2009-10-16 | Procede de croissance controlee de film de graphene |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0805769 | 2008-10-17 | ||
| FR0805769A FR2937343B1 (fr) | 2008-10-17 | 2008-10-17 | Procede de croissance controlee de film de graphene |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2010043716A2 true WO2010043716A2 (fr) | 2010-04-22 |
| WO2010043716A3 WO2010043716A3 (fr) | 2010-06-24 |
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ID=40718812
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/EP2009/063617 Ceased WO2010043716A2 (fr) | 2008-10-17 | 2009-10-16 | Procede de croissance controlee de film de graphene |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9206509B2 (fr) |
| EP (1) | EP2334839A2 (fr) |
| JP (1) | JP5816981B2 (fr) |
| KR (1) | KR101626181B1 (fr) |
| FR (1) | FR2937343B1 (fr) |
| WO (1) | WO2010043716A2 (fr) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
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| WO2010148001A1 (fr) * | 2009-06-18 | 2010-12-23 | Varian Semiconductor Equipment Associates | Procédé de synthèse du graphène |
| WO2012086641A1 (fr) * | 2010-12-21 | 2012-06-28 | 学校法人 名城大学 | Procédé de production d'un matériau en graphène et matériau en graphène |
| WO2012118023A1 (fr) * | 2011-02-28 | 2012-09-07 | 独立行政法人科学技術振興機構 | Procédé de production de graphène, graphène produit sur un substrat, et graphène sur substrat |
| JP2012236745A (ja) * | 2011-05-12 | 2012-12-06 | Nippon Telegr & Teleph Corp <Ntt> | 炭素薄膜の作製方法 |
| US20130052121A1 (en) * | 2010-02-26 | 2013-02-28 | Masataka Hasegawa | Carbon film laminate |
| CN103201405A (zh) * | 2010-11-09 | 2013-07-10 | Posco公司 | 石墨烯被覆钢板及其制造方法 |
| US20140212671A1 (en) * | 2011-07-14 | 2014-07-31 | Jeffry Kelber | Direct Growth of Graphene by Molecular Beam Epitaxy for the Formation of Graphene Heterostructures |
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| KR101132706B1 (ko) * | 2010-02-01 | 2012-04-06 | 한국과학기술원 | 그래핀 층 형성 방법 |
| KR101251020B1 (ko) * | 2010-03-09 | 2013-04-03 | 국립대학법인 울산과학기술대학교 산학협력단 | 그라펜의 제조 방법, 이를 포함하는 투명 전극, 활성층, 이를 구비한 표시소자, 전자소자, 광전소자, 태양전지 및 염료감응 태양전지 |
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| EP2584067A1 (fr) * | 2011-10-20 | 2013-04-24 | Siemens Aktiengesellschaft | Composant avec graphène et procédé de fabrication de composants avec graphène |
| FR2982853B1 (fr) * | 2011-11-22 | 2018-01-12 | Ecole Polytechnique | Procede de fabrication de film de graphene |
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- 2009-10-16 EP EP09736945A patent/EP2334839A2/fr not_active Withdrawn
- 2009-10-16 JP JP2011531510A patent/JP5816981B2/ja not_active Expired - Fee Related
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Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010148001A1 (fr) * | 2009-06-18 | 2010-12-23 | Varian Semiconductor Equipment Associates | Procédé de synthèse du graphène |
| US20130052121A1 (en) * | 2010-02-26 | 2013-02-28 | Masataka Hasegawa | Carbon film laminate |
| US9074278B2 (en) * | 2010-02-26 | 2015-07-07 | National Institute Of Advanced Industrial Science And Technology | Carbon film laminate |
| EP2540862A4 (fr) * | 2010-02-26 | 2015-12-09 | Nat Inst Of Advanced Ind Scien | Stratifié de film de carbone |
| CN103201405A (zh) * | 2010-11-09 | 2013-07-10 | Posco公司 | 石墨烯被覆钢板及其制造方法 |
| US9689071B2 (en) | 2010-11-09 | 2017-06-27 | Posco | Graphene-coated steel sheet, and method for manufacturing same |
| CN103201405B (zh) * | 2010-11-09 | 2015-08-05 | Posco公司 | 石墨烯被覆钢板及其制造方法 |
| JPWO2012086641A1 (ja) * | 2010-12-21 | 2014-05-22 | 学校法人 名城大学 | グラフェン素材の製造方法及びグラフェン素材 |
| WO2012086641A1 (fr) * | 2010-12-21 | 2012-06-28 | 学校法人 名城大学 | Procédé de production d'un matériau en graphène et matériau en graphène |
| JP5152945B2 (ja) * | 2011-02-28 | 2013-02-27 | 独立行政法人科学技術振興機構 | グラフェンの製造方法、基板上に製造されたグラフェン、ならびに、基板上グラフェン |
| WO2012118023A1 (fr) * | 2011-02-28 | 2012-09-07 | 独立行政法人科学技術振興機構 | Procédé de production de graphène, graphène produit sur un substrat, et graphène sur substrat |
| US8772181B2 (en) | 2011-02-28 | 2014-07-08 | Japan Science And Technology Agency | Method for producing graphene, graphene produced on substrate, and graphene on substrate |
| EP2682366A4 (fr) * | 2011-02-28 | 2014-08-27 | Japan Science & Tech Agency | Procédé de production de graphène, graphène produit sur un substrat, et graphène sur substrat |
| JP2012236745A (ja) * | 2011-05-12 | 2012-12-06 | Nippon Telegr & Teleph Corp <Ntt> | 炭素薄膜の作製方法 |
| US20140212671A1 (en) * | 2011-07-14 | 2014-07-31 | Jeffry Kelber | Direct Growth of Graphene by Molecular Beam Epitaxy for the Formation of Graphene Heterostructures |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2334839A2 (fr) | 2011-06-22 |
| FR2937343B1 (fr) | 2011-09-02 |
| JP5816981B2 (ja) | 2015-11-18 |
| US20110198313A1 (en) | 2011-08-18 |
| FR2937343A1 (fr) | 2010-04-23 |
| KR20110094178A (ko) | 2011-08-22 |
| WO2010043716A3 (fr) | 2010-06-24 |
| KR101626181B1 (ko) | 2016-05-31 |
| US9206509B2 (en) | 2015-12-08 |
| JP2012505816A (ja) | 2012-03-08 |
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