EP2334839A2 - Procede de croissance controlee de film de graphene - Google Patents
Procede de croissance controlee de film de grapheneInfo
- Publication number
- EP2334839A2 EP2334839A2 EP09736945A EP09736945A EP2334839A2 EP 2334839 A2 EP2334839 A2 EP 2334839A2 EP 09736945 A EP09736945 A EP 09736945A EP 09736945 A EP09736945 A EP 09736945A EP 2334839 A2 EP2334839 A2 EP 2334839A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- carbon
- metal
- graphene
- graphene film
- metal layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 title claims abstract description 188
- 229910021389 graphene Inorganic materials 0.000 title claims abstract description 104
- 238000000034 method Methods 0.000 title claims abstract description 56
- 229910052751 metal Inorganic materials 0.000 claims abstract description 118
- 239000002184 metal Substances 0.000 claims abstract description 117
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 63
- 239000000758 substrate Substances 0.000 claims abstract description 47
- 125000004432 carbon atom Chemical group C* 0.000 claims abstract description 23
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- 239000000203 mixture Substances 0.000 claims abstract description 10
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- 230000008569 process Effects 0.000 claims description 22
- 239000000243 solution Substances 0.000 claims description 11
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- 238000001816 cooling Methods 0.000 claims description 10
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- 229910017052 cobalt Inorganic materials 0.000 claims description 5
- 239000010941 cobalt Substances 0.000 claims description 5
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 claims description 5
- 238000005468 ion implantation Methods 0.000 claims description 5
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- 239000000395 magnesium oxide Substances 0.000 claims description 3
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 claims description 3
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- 238000010899 nucleation Methods 0.000 claims description 3
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 3
- 239000011521 glass Substances 0.000 claims description 2
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 claims description 2
- 239000011819 refractory material Substances 0.000 claims description 2
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- 150000003624 transition metals Chemical class 0.000 claims description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims 1
- 229910052802 copper Inorganic materials 0.000 claims 1
- 239000010949 copper Substances 0.000 claims 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims 1
- 229910052737 gold Inorganic materials 0.000 claims 1
- 239000010931 gold Substances 0.000 claims 1
- 229910000510 noble metal Inorganic materials 0.000 claims 1
- 239000010410 layer Substances 0.000 description 59
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- 238000006243 chemical reaction Methods 0.000 description 11
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- XMWRBQBLMFGWIX-UHFFFAOYSA-N C60 fullerene Chemical class C12=C3C(C4=C56)=C7C8=C5C5=C9C%10=C6C6=C4C1=C1C4=C6C6=C%10C%10=C9C9=C%11C5=C8C5=C8C7=C3C3=C7C2=C1C1=C2C4=C6C4=C%10C6=C9C9=C%11C5=C5C8=C3C3=C7C1=C1C2=C4C6=C2C9=C5C3=C12 XMWRBQBLMFGWIX-UHFFFAOYSA-N 0.000 description 3
- 229910021393 carbon nanotube Inorganic materials 0.000 description 3
- 239000002041 carbon nanotube Substances 0.000 description 3
- 229910003472 fullerene Inorganic materials 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- CODVACFVSVNQPY-UHFFFAOYSA-N [Co].[C] Chemical compound [Co].[C] CODVACFVSVNQPY-UHFFFAOYSA-N 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
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- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
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- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
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- 238000000465 moulding Methods 0.000 description 1
- CXQXSVUQTKDNFP-UHFFFAOYSA-N octamethyltrisiloxane Chemical compound C[Si](C)(C)O[Si](C)(C)O[Si](C)(C)C CXQXSVUQTKDNFP-UHFFFAOYSA-N 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 125000001997 phenyl group Chemical class [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/26—Deposition of carbon only
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/02—Pretreatment of the material to be coated
- C23C16/0272—Deposition of sub-layers, e.g. to promote the adhesion of the main coating
- C23C16/0281—Deposition of sub-layers, e.g. to promote the adhesion of the main coating of metallic sub-layers
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/56—After-treatment
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
Definitions
- the field of the invention is that of the processes for manufacturing very thin graphene conductive layers having the great advantage of being transparent and therefore finding many applications in the field of electronics and visualization because of the excellent properties in terms of absorption and electrical conductivity of this type of material.
- Graphene is a two-dimensional carbon crystal formed of a monoatomic layer of hybrid carbon atoms sp2 (structure of a benzene ring corresponding to hexagonal cells), the graphite being formed by graphene sheets whose thickness corresponds to the size of a carbon atom.
- Graphene can thus very advantageously be applied on the one hand to the fabrication of thin-film transistors (subject to precisely controlling the width of the ribbons, so as to open an energy gap in the strip structure of the material) and on the other hand on the other hand, thin transparent metal layers are available instead of transparent conductive oxides (ie ITO or indium tin oxide) in flat screens, in solar cells and generally in all applications requiring transparent conductor.
- transparent conductive oxides ie ITO or indium tin oxide
- FLG for "few layers graphene”
- the subject of the invention is a method of controlled growth of graphene film characterized in that it comprises the following steps: the production on the surface of a substrate of a layer of a metal having a phase with carbon such that beyond a molar concentration threshold ratio CM / CM + CC, with CM the molar concentration of metal in a metal / carbon mixture and C c the molar concentration of carbon in said mixture, gets a homogeneous solid solution; exposing the metal layer to a controlled flow of carbon atoms or carbon radicals or carbon ions at a temperature such that the obtained ratio of molar concentration is greater than the threshold ratio so as to obtain a solid solution of the carbon in the metal; an operation for modifying the phase of mixing in two phases respectively of metal and graphite leading to the formation of at least one lower film of graphene located at the interface: metal layer incorporating carbon atoms / substrate and a top film of graphene on the surface of the metal layer.
- the method comprises a step of removing the upper film of graphene and a step of removing the metal layer incorporating carbon atoms located between the two graphene films, which can be an operation of chemical etching of the metal layer.
- the method further comprises: an etching operation of the metal layer making it possible to detach the upper film and to disengage the lower graphene film; a transfer step on a second substrate of the graphene upper film.
- the method comprises:
- the substrate comprising the lower graphene film, the metal layer and the upper graphene film in the presence of a chemical etching solution of the metal layer; positioning a second substrate opposite the assembly constituted by the two graphene films and the metal layer;
- the second substrate is of non-refractory material that can be glass or polymer type.
- the operation for modifying the phase of mixing in two phases one of which includes the cooling of the solid carbon solution in the metal so as to precipitate the carbon and form at least one film of graphene.
- the operation for modifying the phase of mixing in two phases one of which includes increasing the concentration of carbon in the solid solution of carbon in the metal.
- the method further comprises a step of exposure to an oxidizing plasma so as to remove the upper film of graphene.
- the method further comprises a step of removing the metal layer incorporating carbon atoms so as to disengage the lower film of graphene.
- the elimination of the metal layer incorporating carbon atoms is carried out by chemical dissolution.
- exposure to a controlled flow of carbon atoms, radicals or carbon ions is carried out in a reactor using a gaseous precursor of CH 4 , C 2 H 2 , C 6 type. H 6 by way of example, at a temperature between about 450 ° C and 900 ° C.
- the exposure to a controlled flow of carbon atoms, radicals or carbon ions is carried out by ion implantation.
- the method further comprises a subsequent annealing step in the ion implantation operation for homogenizing the carbon atoms in the metal layer, followed by a cooling step, in order to allow the precipitation of carbon.
- the production of the metal layer is carried out by epitaxy, the substrate being a monocrystalline inert substrate which may be of the sapphire or quartz type or of magnesium oxide.
- the posterior annealing step is performed by laser.
- the laser is scanned in a plane parallel to the plane of the substrate so as to precipitate graphene and promote nucleation of the graphene atoms, after passing said laser.
- the metal is of cobalt or nickel type and generally any type of transition metal (Ir, Ru ).
- FIGS. 1a, 1b, 1c and 1d represent respectively an atomic plane of hybrid sp2 carbon atoms corresponding to a graphene structure and different structures that may result: fullerenes, carbon nanotubes and graphite;
- Figure 2 illustrates the phase diagram of the cobalt-carbon system;
- FIG. 3 illustrates the reaction paths that can be used for the synthesis of graphene in a process according to the invention;
- FIGS. 1a, 1b, 1c and 1d represent respectively an atomic plane of hybrid sp2 carbon atoms corresponding to a graphene structure and different structures that may result: fullerenes, carbon nanotubes and graphite;
- Figure 2 illustrates the phase diagram of the cobalt-carbon system;
- FIG. 3 illustrates the reaction paths that can be used for the synthesis of graphene in a process according to the invention;
- FIGS. 1a, 1b, 1c and 1d represent respectively an atomic plane of hybrid sp2 carbon atoms
- FIGS. 4a and 4b illustrate the first steps of the method of the invention, of deposition of the metal layer on the surface of a substrate respectively corresponding to a sectional view and to a top view in the case of a layer. thin metal etched;
- FIG. 5 illustrates the step of exposure to a flow of atoms, radicals or carbon ions within the metal layer in the method of the invention;
- Figures 6a and 6b illustrate two views in section and from above a step of obtaining two layers of graphene in the method of the invention;
- FIG. 7 illustrates a step of exposure to an oxidizing plasma in the process of the invention;
- FIGS. 8a and 8b illustrate a step of removing the metal layer at the end of the process of the invention making it possible to clear the layer; graphene interface; FIGS. 9a to 9e illustrate the various steps of an exemplary method of the invention comprising a transfer step making it possible to isolate each of the graphene films; FIGS. 10a to 1 Od illustrate a variant of the invention, in which a laser is used and respectively the implantation of the carbon atoms in the layer, the illumination of the metal layer implanted by a moving laser, the gradient temperature obtained within the metal layer during the displacement of the laser beam and the typical shape of the laser beam focused by a cylindrical lens.
- the graphene film growth method according to the invention consists in using an intermediate metal layer deposited on the surface of a substrate, the chosen metal having a limited solubility range with carbon.
- phase diagram A typical example of a phase diagram is illustrated in FIG. 2 and concerns the phase diagram of the cobalt-carbon system, this example is not limiting, nickel and other metals having phase diagrams similar to that obtained with cobalt.
- the boundary between the homogeneous solid solution and the mixture of the two metal + graphite phases is schematically represented by the curve AB in FIG. 3 which represents an enlargement of a part of the phase diagram illustrated in FIG.
- a certain amount of carbon lower than a Cc concentration is introduced into the metal at the temperature T1 (as illustrated in FIG.
- the carbon concentration is changed, the reaction path illustrated by the arrow F 2 .
- This can be done for example by continuous carbon deposition on the surface of the metal, followed by a volume diffusion (examples of methods will be given in the application below).
- the carbon concentration in the metal reaches the concentration value Cc, the carbon precipitates as graphite.
- the metal is in the form of a thin layer deposited on an inert substrate, the graphite precipitates at the surface and at the interface when one of the two reaction schemes described above is applied.
- the solubility of carbon in the metal is low at ambient temperature, typically of the order of 10 15 to 10 16 / cm 3, it suffices to introduce 8x10 15 atoms / cm 2 at the surface of the metal layer at the working temperature (a monolayer of graphite carbon equals about 3.71 15 / cm 2 carbon atoms) and cool the sample (according to the reaction path F1 illustrated in Figure 3).
- the thickness of the metal will be adapted to the limit concentration of the phase diagram, taking into account the working temperature.
- a minimum thickness of 100 nm of metal is required to fully dissolve a dose of 8x10 15 carbon atoms / cm 2 at the surface of the metal.
- the method thus consists in using a thin layer of a suitable metal, that is to say having a shape of the phase diagram of the metal side as shown schematically in FIG. 3, to expose it, at high temperature (typically from 400 ° C to 1000 ° C), to a controlled flow of carbon or carbon precursor (for example, active radicals in a plasma reactor or in a chemical vapor deposition reactor -
- a layer of selected metal 2 is deposited, as illustrated in FIG. 4a.
- an exposure of the metal layer or only of the metal element by a flow FIc of carbon or of carbon radicals or ions is then carried out.
- the carbon may be introduced at a temperature typically between 450 ° C. and 1000 ° C., in a CVD or PECVD reactor (Plasma-Enhanced CVD) and using a gaseous precursor such as CH 4 , C 2 H 2 , C 6 H 6 , etc.
- the exposure time is adapted according to the partial pressure of the gaseous precursor, its dissociation rate (therefore the temperature, the power of the plasma, etc.).
- the interface graphene layer 31 is of better crystalline quality than the upper surface 30 or "patterned" surface metal elements 301 whose Zc defects are shown in FIG. 6b.
- the procedure is as shown in FIG. 7 for the removal of the top layer 30 of graphene by exposure by a Poxy oxidizing plasma that can typically be of the oxygen flux or water vapor type. This operation also removes the amorphous carbon deposited on the substrate, on the surfaces where the metal has been removed (where the metal has been previously "patterned").
- the metal is then removed (for example by chemical dissolution), leaving on the substrate the graphene film 31 originally present at the interface as illustrated in FIGS. 8a and 8b in the case where the metal has been previously "patterned” by lithography, graphene will be "patterned” in the same way on the substrate.
- the carbon can be introduced by ion implantation between room temperature and 600 ° C, which allows to control the dose incorporated into the metal. The process is then a little different, insofar as annealing is necessary in order to homogenize the carbon implanted in the metal film.
- the carbon implanted metal film is heated to a temperature between 450 and 900 ° C prior to the controlled cooling step which results in graphene precipitation.
- the reaction path is that illustrated in FIG. 3 by the arrow F2 if the implanted dose is greater than the limiting solubility of the carbon in the metal at the treatment temperature. In the opposite case, the reaction path is also F1. If the high temperature solubility limit is exceeded, additional graphitic layers may precipitate during cooling and it may be difficult to obtain a small number of graphene layers at the upper and lower interfaces of the metal. For this, we can practice a quenching, in order to "freeze" the number of layers of graphene on the surface of the metal and at the interface with the substrate.
- a metal layer epitaxially grown on a monocrystalline inert substrate (sapphire, quartz, MgO, spinel, etc.).
- the polymer film is finally dissolved in a solvent.
- the polymer is the host substrate, or it is used as a buffer (nano-imprint method).
- FIGS. 9a to 9e there is provided the following transfer method illustrated by FIGS. 9a to 9e.
- the entire 30/2/31 trilayer on the surface of the substrate 1 is placed in an enclosure E and positioned on a first support Si and placed in the presence of a Fluide solution for etching the coating layer.
- metal 2 typically it may be an aqueous or alcoholic etching solution specific to the metal used (for example, if the metal is nickel, the Fluid solution may be dilute hydrochloric acid).
- the substrate and the top layer are separated by a slight pressure on the substrate of growth.
- the graphene layer being hydrophobic, it remains to float on the etching solution.
- the growth substrate is flowing.
- a second reception substrate S 2 is placed above the etching solution, reception face downwards.
- Liquid Fluid 2 for example water or ethanol, is added until the supernatant upper graphene layer and the host substrate S 2 are brought into contact as illustrated in FIG. 9d.
- Fluid 2 is then withdrawn, leaving the upper graphene layer 30 on the surface of the host substrate S 2 .
- the method of the invention may be advantageous in the method of the invention to use a laser that makes it possible to induce a particular temperature profile within the metal layer in which atoms have been implanted. carbon.
- a laser L which can be slowly displaced on the substrate by a scanning movement as shown in FIG. 10b leading, during cooling, to the formation of the upper 30 and lower 31 layers of graphene.
- the temperature increases sufficiently to induce complete solubilization of the carbon in the metal.
- the temperature decreases to a threshold temperature Tc such as that illustrated in Figure 3 below which the carbon begins to precipitate as graphene.
- Tc threshold temperature
- graphene precipitates as the laser advances and its nucleation is from graphene having already precipitated.
- the method is similar to a lateral epitaxy and the crystalline quality of the graphene obtained is better than during the direct precipitation.
- the temperature is high enough to induce a complete solubilization of the carbon in the metal.
- the carbon precipitates, leading to the formation of graphene layers at the surface and at the interface.
- the laser beam is shaped in the form of a linear brush as shown in FIG. 10c by the use, for example, of a cylindrical lens allowing focusing, a graphene ribbon of width L (corresponding to the length of the brush , see Figure 1 Od which illustrates the typical shape of the laser beam after focusing by a cylindrical lens) is thus generated on the surface of the metal and at the interface with the substrate.
- the laser may just as well be focused on a circular task, and be scanned very quickly in a direction y perpendicular to a direction x in the plane of the substrate and slowly in the x direction.
- the graphene obtained at the surface and at the interface it can as previously eliminate by surface etching and remove the metal to reveal the graphene interface.
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- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
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Abstract
Description
Claims
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0805769A FR2937343B1 (fr) | 2008-10-17 | 2008-10-17 | Procede de croissance controlee de film de graphene |
| PCT/EP2009/063617 WO2010043716A2 (fr) | 2008-10-17 | 2009-10-16 | Procede de croissance controlee de film de graphene |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP2334839A2 true EP2334839A2 (fr) | 2011-06-22 |
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| EP09736945A Withdrawn EP2334839A2 (fr) | 2008-10-17 | 2009-10-16 | Procede de croissance controlee de film de graphene |
Country Status (6)
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| US (1) | US9206509B2 (fr) |
| EP (1) | EP2334839A2 (fr) |
| JP (1) | JP5816981B2 (fr) |
| KR (1) | KR101626181B1 (fr) |
| FR (1) | FR2937343B1 (fr) |
| WO (1) | WO2010043716A2 (fr) |
Families Citing this family (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100323113A1 (en) * | 2009-06-18 | 2010-12-23 | Ramappa Deepak A | Method to Synthesize Graphene |
| KR101132706B1 (ko) * | 2010-02-01 | 2012-04-06 | 한국과학기술원 | 그래핀 층 형성 방법 |
| KR101472948B1 (ko) * | 2010-02-26 | 2014-12-15 | 내셔날 인스티튜트 오브 어드밴스드 인더스트리얼 사이언스 앤드 테크놀로지 | 탄소막 적층체 |
| KR101251020B1 (ko) * | 2010-03-09 | 2013-04-03 | 국립대학법인 울산과학기술대학교 산학협력단 | 그라펜의 제조 방법, 이를 포함하는 투명 전극, 활성층, 이를 구비한 표시소자, 전자소자, 광전소자, 태양전지 및 염료감응 태양전지 |
| KR101403989B1 (ko) * | 2010-11-09 | 2014-06-10 | 포항공과대학교 산학협력단 | 그래핀 피복 강판 및 이의 제조 방법 |
| JP2012144415A (ja) * | 2010-12-21 | 2012-08-02 | Meijo Univ | グラフェン素材の製造方法及びグラフェン素材 |
| EP2682366B1 (fr) * | 2011-02-28 | 2016-11-02 | Japan Science And Technology Agency | Procédé de production de graphène sur un substrat |
| JP5666984B2 (ja) * | 2011-05-12 | 2015-02-12 | 日本電信電話株式会社 | 炭素薄膜の作製方法 |
| EP2541559B1 (fr) * | 2011-06-30 | 2014-03-26 | Rohm and Haas Electronic Materials LLC | Article transparent conducteur |
| US20140212671A1 (en) * | 2011-07-14 | 2014-07-31 | Jeffry Kelber | Direct Growth of Graphene by Molecular Beam Epitaxy for the Formation of Graphene Heterostructures |
| US8828193B2 (en) * | 2011-09-06 | 2014-09-09 | Indian Institute Of Technology Madras | Production of graphene using electromagnetic radiation |
| EP2584067A1 (fr) * | 2011-10-20 | 2013-04-24 | Siemens Aktiengesellschaft | Composant avec graphène et procédé de fabrication de composants avec graphène |
| FR2982853B1 (fr) * | 2011-11-22 | 2018-01-12 | Ecole Polytechnique | Procede de fabrication de film de graphene |
| JP6052537B2 (ja) * | 2011-12-01 | 2016-12-27 | 国立大学法人東北大学 | グラフェン構造体及びそれを用いた半導体装置並びにそれらの製造方法 |
| CN102433544B (zh) * | 2012-01-11 | 2013-07-10 | 中国科学院上海微系统与信息技术研究所 | 一种利用多苯环碳源低温化学气相沉积生长大面积石墨烯的方法 |
| CN102633258A (zh) * | 2012-05-10 | 2012-08-15 | 中国科学院上海微系统与信息技术研究所 | 一种无需衬底转移的制备石墨烯的方法 |
| PL224447B1 (pl) * | 2012-08-25 | 2016-12-30 | Advanced Graphene Products Spółka Z Ograniczoną Odpowiedzialnością | Sposób oddzielania grafenu od ciekłej matrycy formującej |
| CN102903618B (zh) * | 2012-10-22 | 2015-07-29 | 西安电子科技大学 | 基于AlN衬底的石墨烯CVD直接外延生长方法及制造的器件 |
| CN102903617B (zh) * | 2012-10-22 | 2015-09-09 | 西安电子科技大学 | 基于GaN衬底的石墨烯CVD直接外延生长方法及制造的器件 |
| US9593019B2 (en) | 2013-03-15 | 2017-03-14 | Guardian Industries Corp. | Methods for low-temperature graphene precipitation onto glass, and associated articles/devices |
| US10431354B2 (en) * | 2013-03-15 | 2019-10-01 | Guardian Glass, LLC | Methods for direct production of graphene on dielectric substrates, and associated articles/devices |
| WO2015077751A1 (fr) * | 2013-11-25 | 2015-05-28 | Northeastern University | Membranes ultraminces auto-portées et leur fabrication sans transfert |
| GB201409895D0 (en) * | 2014-06-04 | 2014-07-16 | Cambridge Entpr Ltd | Method for producing synthetic diamonds |
| GB201410214D0 (en) | 2014-06-09 | 2014-07-23 | Univ Surrey | A method for graphene and carbon nanotube growth |
| JP6039616B2 (ja) * | 2014-08-11 | 2016-12-07 | 東京エレクトロン株式会社 | グラフェンの下地膜の生成方法、グラフェンの生成方法及びグラフェンの下地膜生成装置 |
| CN104485310B (zh) * | 2014-12-25 | 2019-06-21 | 上海集成电路研发中心有限公司 | 一种形成石墨烯互连线的方法 |
| KR101723728B1 (ko) * | 2015-03-31 | 2017-04-07 | 고려대학교 산학협력단 | 그래핀 박막의 제조 방법 |
| US10145005B2 (en) | 2015-08-19 | 2018-12-04 | Guardian Glass, LLC | Techniques for low temperature direct graphene growth on glass |
| CN106521618B (zh) * | 2016-11-07 | 2018-10-26 | 山东大学 | 一种在SiC衬底上通过点籽晶定位生长大尺寸单晶石墨烯的方法 |
| CN106947956B (zh) * | 2017-03-17 | 2018-12-28 | 厦门大学 | 一种层数可控的石墨烯微纳结构快速制备装置 |
| KR102149831B1 (ko) * | 2018-11-12 | 2020-09-01 | 한국과학기술연구원 | 그래핀 패턴의 합성 방법 및 이를 이용한 전광 모듈레이터의 제조 방법 |
| CN111621768A (zh) * | 2020-06-02 | 2020-09-04 | 陕西科技大学 | 一种基于激光在金属表面原位生长石墨烯的方法及其应用 |
| CN116835574A (zh) * | 2023-05-16 | 2023-10-03 | 北京印刷学院 | 一种石墨烯的制备方法 |
| US12368061B1 (en) * | 2024-07-22 | 2025-07-22 | Destination 2D Inc. | Throughput improvements for low-temperature/beol-compatible highly scalable graphene synthesis methods including processing in retasked tools |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100482241B1 (ko) * | 2000-02-25 | 2005-04-13 | 샤프 가부시키가이샤 | 카본 나노튜브 및 그 제조 방법, 전자원 및 그 제조 방법및 표시 장치 |
| US20060233692A1 (en) * | 2004-04-26 | 2006-10-19 | Mainstream Engineering Corp. | Nanotube/metal substrate composites and methods for producing such composites |
| JP5054896B2 (ja) * | 2005-03-28 | 2012-10-24 | 勝 堀 | カーボンナノウォールの処理方法、カーボンナノウォール、カーボンナノウォールデバイス |
| JP4804272B2 (ja) * | 2006-08-26 | 2011-11-02 | 正義 梅野 | 単結晶グラファイト膜の製造方法 |
| US7772059B2 (en) * | 2008-01-16 | 2010-08-10 | Texas Instruments Incorporated | Method for fabricating graphene transistors on a silicon or SOI substrate |
| US8203195B2 (en) * | 2008-04-18 | 2012-06-19 | Invisage Technologies, Inc. | Materials, fabrication equipment, and methods for stable, sensitive photodetectors and image sensors made therefrom |
| CN101285175B (zh) * | 2008-05-29 | 2010-07-21 | 中国科学院化学研究所 | 化学气相沉积法制备石墨烯的方法 |
| US20100218801A1 (en) * | 2008-07-08 | 2010-09-02 | Chien-Min Sung | Graphene and Hexagonal Boron Nitride Planes and Associated Methods |
| JP5626948B2 (ja) * | 2008-10-08 | 2014-11-19 | 独立行政法人物質・材料研究機構 | グラフェン被覆部材の製造方法 |
| US20120003438A1 (en) * | 2009-02-20 | 2012-01-05 | University Of Florida Research Foundation, Inc. | Graphene processing for device and sensor applications |
| US8309438B2 (en) * | 2009-03-03 | 2012-11-13 | Board Of Regents, The University Of Texas System | Synthesizing graphene from metal-carbon solutions using ion implantation |
| US20100323113A1 (en) * | 2009-06-18 | 2010-12-23 | Ramappa Deepak A | Method to Synthesize Graphene |
| US8980217B2 (en) * | 2010-12-21 | 2015-03-17 | Nec Corporation | Method of manufacturing graphene substrate, and graphene substrate |
| EP2682366B1 (fr) * | 2011-02-28 | 2016-11-02 | Japan Science And Technology Agency | Procédé de production de graphène sur un substrat |
| US8501531B2 (en) * | 2011-04-07 | 2013-08-06 | The United States Of America, As Represented By The Secretary Of The Navy | Method of forming graphene on a surface |
| US10431354B2 (en) * | 2013-03-15 | 2019-10-01 | Guardian Glass, LLC | Methods for direct production of graphene on dielectric substrates, and associated articles/devices |
-
2008
- 2008-10-17 FR FR0805769A patent/FR2937343B1/fr active Active
-
2009
- 2009-10-16 WO PCT/EP2009/063617 patent/WO2010043716A2/fr not_active Ceased
- 2009-10-16 US US13/124,413 patent/US9206509B2/en not_active Expired - Fee Related
- 2009-10-16 EP EP09736945A patent/EP2334839A2/fr not_active Withdrawn
- 2009-10-16 JP JP2011531510A patent/JP5816981B2/ja not_active Expired - Fee Related
- 2009-10-16 KR KR1020117011250A patent/KR101626181B1/ko not_active Expired - Fee Related
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| Title |
|---|
| See references of WO2010043716A2 * |
Also Published As
| Publication number | Publication date |
|---|---|
| FR2937343B1 (fr) | 2011-09-02 |
| JP5816981B2 (ja) | 2015-11-18 |
| US20110198313A1 (en) | 2011-08-18 |
| FR2937343A1 (fr) | 2010-04-23 |
| KR20110094178A (ko) | 2011-08-22 |
| WO2010043716A3 (fr) | 2010-06-24 |
| KR101626181B1 (ko) | 2016-05-31 |
| US9206509B2 (en) | 2015-12-08 |
| JP2012505816A (ja) | 2012-03-08 |
| WO2010043716A2 (fr) | 2010-04-22 |
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