WO2010091311A3 - Sonde afm à nanofil pour l'imagerie de matériaux souples - Google Patents

Sonde afm à nanofil pour l'imagerie de matériaux souples Download PDF

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Publication number
WO2010091311A3
WO2010091311A3 PCT/US2010/023407 US2010023407W WO2010091311A3 WO 2010091311 A3 WO2010091311 A3 WO 2010091311A3 US 2010023407 W US2010023407 W US 2010023407W WO 2010091311 A3 WO2010091311 A3 WO 2010091311A3
Authority
WO
WIPO (PCT)
Prior art keywords
nanowire
soft materials
afm probe
imaging soft
imaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2010/023407
Other languages
English (en)
Other versions
WO2010091311A2 (fr
Inventor
Paul D. Ashby
James P. Schuck
Shaul Aloni
Babak Sanii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of California Berkeley
University of California San Diego UCSD
Original Assignee
University of California Berkeley
University of California San Diego UCSD
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of California Berkeley, University of California San Diego UCSD filed Critical University of California Berkeley
Publication of WO2010091311A2 publication Critical patent/WO2010091311A2/fr
Publication of WO2010091311A3 publication Critical patent/WO2010091311A3/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/10—Shape or taper
    • G01Q70/12—Nanotube tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/02—Monitoring the movement or position of the probe by optical means

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

L'invention concerne un dispositif comprenant un support et un nanofil fixé au support, le dispositif étant conçu pour être utilisé avec un microscope à force atomique (AFM).
PCT/US2010/023407 2009-02-05 2010-02-05 Sonde afm à nanofil pour l'imagerie de matériaux souples Ceased WO2010091311A2 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15030709P 2009-02-05 2009-02-05
US61/150,307 2009-02-05

Publications (2)

Publication Number Publication Date
WO2010091311A2 WO2010091311A2 (fr) 2010-08-12
WO2010091311A3 true WO2010091311A3 (fr) 2010-09-30

Family

ID=42542671

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2010/023407 Ceased WO2010091311A2 (fr) 2009-02-05 2010-02-05 Sonde afm à nanofil pour l'imagerie de matériaux souples

Country Status (1)

Country Link
WO (1) WO2010091311A2 (fr)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070163335A1 (en) * 2002-07-02 2007-07-19 Lin Huang Method and apparatus for measuring electrical properties in torsional resonance mode
US20070221840A1 (en) * 2006-03-23 2007-09-27 International Business Machines Corporation Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth
US20070228439A1 (en) * 2002-09-30 2007-10-04 Nanosys, Inc. Large-Area Nanoenabled Macroelectronic Substrates and Uses Therefor
US20080061231A1 (en) * 2006-04-28 2008-03-13 Chamberlin Danielle R Nanowire scanning probe microscopy probe for molecular recognition imaging
US20080283773A1 (en) * 2000-09-06 2008-11-20 Guava Technologies, Inc. Particle or Cell Analyzer and Method
US20090000364A1 (en) * 2007-02-20 2009-01-01 Min-Feng Yu Electrochemical deposition platform for nanostructure fabrication
US20090056428A1 (en) * 2007-08-28 2009-03-05 King William P Cantilever probe and applications of the same
US20090321261A1 (en) * 2005-04-15 2009-12-31 Dr. Branislav Vlahovic Detection methods and detection devices based on the quantum confinement effects

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080283773A1 (en) * 2000-09-06 2008-11-20 Guava Technologies, Inc. Particle or Cell Analyzer and Method
US20070163335A1 (en) * 2002-07-02 2007-07-19 Lin Huang Method and apparatus for measuring electrical properties in torsional resonance mode
US20070228439A1 (en) * 2002-09-30 2007-10-04 Nanosys, Inc. Large-Area Nanoenabled Macroelectronic Substrates and Uses Therefor
US20090321261A1 (en) * 2005-04-15 2009-12-31 Dr. Branislav Vlahovic Detection methods and detection devices based on the quantum confinement effects
US20070221840A1 (en) * 2006-03-23 2007-09-27 International Business Machines Corporation Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth
US20080061231A1 (en) * 2006-04-28 2008-03-13 Chamberlin Danielle R Nanowire scanning probe microscopy probe for molecular recognition imaging
US20090000364A1 (en) * 2007-02-20 2009-01-01 Min-Feng Yu Electrochemical deposition platform for nanostructure fabrication
US20090056428A1 (en) * 2007-08-28 2009-03-05 King William P Cantilever probe and applications of the same

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
13IEDERMANN, LAURA B ET AL.: "Flexural vibration spectra of carbon nanotubes measured using laser Doppler vibrometry.", NANOTECHNOLOGY, vol. 20, no. 6PP, January 2009 (2009-01-01), pages 035702, Retrieved from the Internet <URL:http://docs.lib.purdue.edu/cgi/viewcontent.cgi?article=1378&context=nanopub> [retrieved on 20100630] *

Also Published As

Publication number Publication date
WO2010091311A2 (fr) 2010-08-12

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