WO2010091660A2 - Verfahren zur schaffung einer hochtemperatur- und temperaturwechselfesten verbindung eines baugruppen-halbleiters und eines halbleiterbausteins mit einem temperaturbeaufschlagenden verfahren - Google Patents
Verfahren zur schaffung einer hochtemperatur- und temperaturwechselfesten verbindung eines baugruppen-halbleiters und eines halbleiterbausteins mit einem temperaturbeaufschlagenden verfahren Download PDFInfo
- Publication number
- WO2010091660A2 WO2010091660A2 PCT/DE2010/000127 DE2010000127W WO2010091660A2 WO 2010091660 A2 WO2010091660 A2 WO 2010091660A2 DE 2010000127 W DE2010000127 W DE 2010000127W WO 2010091660 A2 WO2010091660 A2 WO 2010091660A2
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- WIPO (PCT)
- Prior art keywords
- temperature
- connection
- sintering
- semiconductor
- suspension
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/60—Strap connectors, e.g. thick copper clips for grounding of power devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/013—Manufacture or treatment of die-attach connectors
- H10W72/01361—Chemical or physical modification, e.g. by sintering or anodisation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07331—Connecting techniques
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07331—Connecting techniques
- H10W72/07332—Compression bonding, e.g. thermocompression bonding
- H10W72/07333—Ultrasonic bonding, e.g. thermosonic bonding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07331—Connecting techniques
- H10W72/07336—Soldering or alloying
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07341—Controlling the bonding environment, e.g. atmosphere composition or temperature
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/076—Connecting or disconnecting of strap connectors
- H10W72/07631—Techniques
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/321—Structures or relative sizes of die-attach connectors
- H10W72/325—Die-attach connectors having a filler embedded in a matrix
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/351—Materials of die-attach connectors
- H10W72/352—Materials of die-attach connectors comprising metals or metalloids, e.g. solders
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/884—Die-attach connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/732—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between stacked chips
Definitions
- the invention relates to a method for creating a high-temperature and temperature-resistant connection of a module semiconductor and a semiconductor device with a temperature-applying method.
- a complex step in the production of sintered compounds as described for example in DE 10 2006 033 073 B3 of the Applicant, are in the actual sintering (the so-called final sintering) required pressures of more than 30 MPa, by a special apparatus have to be applied for a few seconds to a few minutes.
- the invention is based on the finding that by selecting a suitable metal powder suspension by activating this, either by local, low pressure of for example 5 MPa or by heating to z. B. 25O 0 C, the sintering process can be initiated so far that a transport-resistant fixation for processing by further manufacturing steps takes place.
- an electrical component with metallic contact surfaces with either a silver or a gold surface by materially joined to a substrate material in several stages of production, without a critical sintering pressure is applied.
- circuit substrate can be used as a substrate material, such as.
- a substrate material such as.
- organic printed circuit boards PCB, ceramic circuit boards, DCB, metal core circuit boards, IMS or conductor leadframes, stamped grid, hybrid ceramic circuit carrier, etc.
- the electrotechnical component can be an inexhaustible Halbeiterbauelement or a gemoldetes, d. H. be cased semiconductor device.
- Electrical contact terminals SMD-B auimplantation or the like can also be connected to each other with the cohesive joining method according to the invention.
- connection tact-fast ie when heated for a few seconds.
- Fixing and sintering are separate processes. The fixing takes place predominantly by a clawing in the surface of the joining partners or the silver joining layers.
- the subsequent sintering is carried out without pressure in a heating furnace at temperatures between 170 ° C to 300 ° C, so it may be easily inserted in a transport line for components.
- the atmosphere for certain metal suspension layers can optionally be adjusted with an inert or reactive gas. Nitrogen is suitable as the inert gas, for example, and forming gas or inert gas saturated with formic acid can be used as the reactive gas.
- FIG. 1 shows a metallized device placed over a precoated and dried metal suspension layer.
- FIG. 3 shows the elements of FIG. 2 after an unpressurised temperature control step, which ensures preferably complete volume sintering, FIG.
- FIG. 4 shows a lower and further metallized component on a previously applied and dried metal suspension layer as in Fig. 1,
- FIG. 6 shows the elements of FIG. 5, wherein the contact tab with the other elements is fixed by low pressure
- FIG. 7 shows the elements of FIG. 6 after a pressure-free tempering step, which ensures a preferably complete volume sintering of all fixed contact positions
- a substrate material or a chip backside, or in a preferred embodiment on both surfaces to be joined, is applied in a uniform layer thickness by means of a layer containing silver particles, preferably with a stencil printer. This is done selectively at the points where the device is to be placed or, if applied to the chip, a full surface.
- Other application techniques, in particular spraying, are conceivable.
- diving or spin-on of a silver particle solution would cause problems with layer-wide variance.
- the layer After application, the layer is dried and freed from the volatile organic compounds. Temperatures of up to 150 0 C support the process to ensure high clock rates. The dried layer produced thereby has a large porosity and a large roughness.
- the electrotechnical component is brought to a predetermined position by a component gripping and depositing device and unilateral or bilateral silver layers applied to the components are pressed together by the force applied during the application and clawed together. This is a short 0.1 to 3 second placement process, with the required force only enough to reshape the rough surface and claw each other.
- the bracket by Verkrallen does not have to meet the requirements for later use but only be so strong that during the process of locomotion in the manufacture of the components no longer slip.
- the two-dimensional clawing of the rough dried metal layer in a silver or gold surface provides for easy adhesion.
- a snowball sticks to a cement wall, or even snow, when a snowball is formed.
- the adhesion can be improved again by increasing the temperature up to, for example, 150 ° C. In the example "snow" this would be equivalent to a wet snow.
- Step 4 In a fourth step, the component thus fixed is finally subjected to a subsequent heat process without further pressure, wherein a diffusion of the silver atoms into the interface of the joining partner and vice versa takes place, so that the desired high temperature and temperature change resistant, for motor vehicle applications also stable connection over many years.
- FIG. 1 shows a pre-metallized component which is precoated with an example of about 50 micrometers and at a temperature of about 50 micrometers. temperature of less than 140 ° C for a few minutes (preferably 1-3 minutes) dried metal suspension layer is placed. A suitable pre-compaction of the layer in order to store it better, and to avoid abrasion, may have already taken place on the layer before the component is fixed.
- a layer produced in the same or a similar way - even in order to use it as similar to a pre-metallization - may also have already been sintered. It is sufficient if a layer still consists only of dried, non-sintered paste / suspension.
- a pressure of 1-10 MPa, preferably 2-6 MPa, and herein more preferably for a second less than 5 MPa can be exercised.
- Fig. 3 shows the elements of FIG . 2 after a non-pressurized tempering, at paste-dependent temperatures of typically more than 230 0 C, which ensures a preferably complete volume sintering. Reactive process gases can accelerate sintering.
- Figs. 4 to 7 show, as representative of many possible elements, a contact tab is fixed by low pressure with the assembly in the same way.
- the erfmdungshacke method for creating a high-temperature and tempe- ratur pizzafesten connection of a module semiconductor and a semiconductor device with a temperaturbeetzier waveden method in which a metal powder suspension is applied to the areas of the individual semiconductor devices to be joined later, the suspension layer with outgassing of the volatile constituents and dried to form a porous layer, then precompressed the porous layer, without a complete, the Sus- pensionstik penetrating sintering takes place, wherein to obtain a solid electrically and thermally well-conductive compound of a semiconductor device on a connection partner from the group: substrate, further semiconductor or circuit carrier, the compound is a sintered compound produced without pressing pressure by increasing the temperature, which consists of a dried metal powder suspension consists, in a Vorverdichtungsuze with the connection partner has undergone a first transport-resistant contact with the connection partner, and was solidified under temperature Ausausung unpressurized in a preferred embodiment can be extended daurch that more than one side of
- the atmosphere in a sealed chamber
- the atmosphere may be enriched with an inert or reactive gas during heating.
- the inert gas may preferably contain nitrogen as a main component.
- the reactive gas proposed is one with a predominant constituent of forming gas.
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- Die Bonding (AREA)
- Powder Metallurgy (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Filtering Materials (AREA)
Abstract
Description
Claims
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201080016442.5A CN102396057B (zh) | 2009-02-13 | 2010-02-04 | 用于在半导体模块和连接配合件之间产生耐高温和耐温度变化的连接的方法 |
| EP10710533A EP2396814A2 (de) | 2009-02-13 | 2010-02-04 | Verfahren zur schaffung einer hochtemperatur- und temperaturwechselfesten verbindung eines baugruppen-halbleiters und eines halbleiterbausteins mit einem temperaturbeaufschlagenden verfahren |
| US13/148,848 US9287232B2 (en) | 2009-02-13 | 2010-02-04 | Method for producing a high-temperature and temperature-change resistant connection between a semiconductor module and a connection partner |
| JP2011549430A JP5731990B2 (ja) | 2009-02-13 | 2010-02-04 | 半導体モジュールと接続相手との間に高温および温度変化に強い接続を形成する方法 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102009008926.8 | 2009-02-13 | ||
| DE102009008926.8A DE102009008926B4 (de) | 2009-02-13 | 2009-02-13 | Verfahren zur Schaffung einer hochtemperatur- und temperaturwechselfesten Verbindung eines Halbleiterbausteins mit einem Verbindungspartner und einer Kontaktlasche unter Verwendung eines temperaturbeaufschlagenden Verfahrens |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2010091660A2 true WO2010091660A2 (de) | 2010-08-19 |
| WO2010091660A3 WO2010091660A3 (de) | 2011-06-03 |
Family
ID=42271896
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/DE2010/000127 Ceased WO2010091660A2 (de) | 2009-02-13 | 2010-02-04 | Verfahren zur schaffung einer hochtemperatur- und temperaturwechselfesten verbindung eines baugruppen-halbleiters und eines halbleiterbausteins mit einem temperaturbeaufschlagenden verfahren |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9287232B2 (de) |
| EP (1) | EP2396814A2 (de) |
| JP (1) | JP5731990B2 (de) |
| CN (1) | CN102396057B (de) |
| DE (1) | DE102009008926B4 (de) |
| WO (1) | WO2010091660A2 (de) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2013045369A1 (de) * | 2011-09-30 | 2013-04-04 | Osram Opto Semiconductors Gmbh | Bauelement und verfahren zum herstellen dieses bauelementes mittels drucklosen sinternprozesses durch einwirken von wärme und ultraschall |
| DE102015210061A1 (de) * | 2015-06-01 | 2016-12-01 | Siemens Aktiengesellschaft | Verfahren zur elektrischen Kontaktierung eines Bauteils und Bauteilmodul |
| DE102016108000B3 (de) * | 2016-04-29 | 2016-12-15 | Danfoss Silicon Power Gmbh | Verfahren zum stoffschlüssigen Verbinden einer ersten Komponente eines Leistungshalbleitermoduls mit einer zweiten Komponente eines Leistungshalbleitermoduls |
| WO2022200748A1 (fr) * | 2021-03-26 | 2022-09-29 | Safran Electronics & Defense | Procédé pour assembler un composant électronique à un substrat par pressage au moyen d'un matériau de frittage |
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| DE102012207652A1 (de) | 2012-05-08 | 2013-11-14 | Robert Bosch Gmbh | Zweistufiges Verfahren zum Fügen eines Halbleiters auf ein Substrat mit Verbindungsmaterial auf Silberbasis |
| US8835299B2 (en) | 2012-08-29 | 2014-09-16 | Infineon Technologies Ag | Pre-sintered semiconductor die structure |
| JP5664625B2 (ja) | 2012-10-09 | 2015-02-04 | 三菱マテリアル株式会社 | 半導体装置、セラミックス回路基板及び半導体装置の製造方法 |
| JP2015115481A (ja) * | 2013-12-12 | 2015-06-22 | 株式会社東芝 | 半導体部品および半導体部品の製造方法 |
| DE102014104272A1 (de) | 2014-03-26 | 2015-10-01 | Heraeus Deutschland GmbH & Co. KG | Träger und Clip jeweils für ein Halbleiterelement, Verfahren zur Herstellung, Verwendung und Sinterpaste |
| DE102014206606A1 (de) * | 2014-04-04 | 2015-10-08 | Siemens Aktiengesellschaft | Verfahren zum Montieren eines elektrischen Bauelements auf einem Substrat |
| DE102014114096A1 (de) | 2014-09-29 | 2016-03-31 | Danfoss Silicon Power Gmbh | Sinterwerkzeug für den Unterstempel einer Sintervorrichtung |
| DE102014114093B4 (de) * | 2014-09-29 | 2017-03-23 | Danfoss Silicon Power Gmbh | Verfahren zum Niedertemperatur-Drucksintern |
| DE102014114097B4 (de) | 2014-09-29 | 2017-06-01 | Danfoss Silicon Power Gmbh | Sinterwerkzeug und Verfahren zum Sintern einer elektronischen Baugruppe |
| TWI655693B (zh) | 2017-02-28 | 2019-04-01 | Kyocera Corporation | 半導體裝置之製造方法 |
| DE102017113153B4 (de) * | 2017-06-14 | 2022-06-15 | Infineon Technologies Ag | Elektronisches Gerät mit Chip mit gesintertem Oberflächenmaterial |
| EP3787012A4 (de) * | 2018-04-27 | 2022-05-11 | Nitto Denko Corporation | Herstellungsverfahren für halbleiterbauelement |
| JP7143156B2 (ja) | 2018-04-27 | 2022-09-28 | 日東電工株式会社 | 半導体装置製造方法 |
| DE102021116053A1 (de) | 2021-06-22 | 2022-12-22 | Danfoss Silicon Power Gmbh | Elektrischer Leiter, elektronische Baugruppe mit elektrischem Leiter und Verfahren zum Herstellen einer elektronischen Baugruppe mit einem elektrischen Leiter |
| DE102021121625B3 (de) * | 2021-08-20 | 2022-11-03 | Danfoss Silicon Power Gmbh | Verfahren zum Herstellen einer wenigstens ein aktives elektronisches Bauelement und wenigstens ein passives Bauelement aufweisenden elektronischen Baugruppe |
| CN113964050B (zh) * | 2021-10-18 | 2025-01-24 | 中冶赛迪工程技术股份有限公司 | 一种无压力、低温的烧结方法及其应用 |
| EP4224521A1 (de) | 2022-02-07 | 2023-08-09 | Siemens Aktiengesellschaft | Halbleiteranordnung mit einem halbleiterelement mit einem durch thermisches spritzen hergestellten kontaktierungselement sowie ein verfahren zur herstellung desselben |
| WO2025119440A1 (de) | 2023-12-04 | 2025-06-12 | Siemens Aktiengesellschaft | Halbleiteranordnung aufweisend ein halbleiterelement mit zumindest einem anschlusselement |
| CN119170509B (zh) * | 2024-08-16 | 2025-10-31 | 苏州固锝电子股份有限公司 | Mos场效应管双网印工艺结构及双网印制备方法 |
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| US8555491B2 (en) | 2007-07-19 | 2013-10-15 | Alpha Metals, Inc. | Methods of attaching a die to a substrate |
| DE102007035788A1 (de) | 2007-07-31 | 2009-02-05 | Robert Bosch Gmbh | Waferfügeverfahren, Waferverbund sowie Chip |
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2009
- 2009-02-13 DE DE102009008926.8A patent/DE102009008926B4/de active Active
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2010
- 2010-02-04 US US13/148,848 patent/US9287232B2/en active Active
- 2010-02-04 WO PCT/DE2010/000127 patent/WO2010091660A2/de not_active Ceased
- 2010-02-04 CN CN201080016442.5A patent/CN102396057B/zh active Active
- 2010-02-04 JP JP2011549430A patent/JP5731990B2/ja active Active
- 2010-02-04 EP EP10710533A patent/EP2396814A2/de not_active Ceased
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102006033073B3 (de) | 2006-07-14 | 2008-02-14 | Danfoss Silicon Power Gmbh | Verfahren zur Schaffung einer hitze- und stoßfesten Verbindung des Baugruppen-Halbleiters und zur Drucksinterung vorbereiteter Halbleiterbaustein |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2013045369A1 (de) * | 2011-09-30 | 2013-04-04 | Osram Opto Semiconductors Gmbh | Bauelement und verfahren zum herstellen dieses bauelementes mittels drucklosen sinternprozesses durch einwirken von wärme und ultraschall |
| DE102015210061A1 (de) * | 2015-06-01 | 2016-12-01 | Siemens Aktiengesellschaft | Verfahren zur elektrischen Kontaktierung eines Bauteils und Bauteilmodul |
| US11037862B2 (en) | 2015-06-01 | 2021-06-15 | Siemens Aktiengesellschaft | Method for electrically contacting a component by galvanic connection of an open-pored contact piece, and corresponding component module |
| DE102016108000B3 (de) * | 2016-04-29 | 2016-12-15 | Danfoss Silicon Power Gmbh | Verfahren zum stoffschlüssigen Verbinden einer ersten Komponente eines Leistungshalbleitermoduls mit einer zweiten Komponente eines Leistungshalbleitermoduls |
| US10438924B2 (en) | 2016-04-29 | 2019-10-08 | Danfoss Silicon Power Gmbh | Method for cohesively connecting a first component of a power semiconductor module to a second component of a power semiconductor module |
| WO2022200748A1 (fr) * | 2021-03-26 | 2022-09-29 | Safran Electronics & Defense | Procédé pour assembler un composant électronique à un substrat par pressage au moyen d'un matériau de frittage |
| FR3121278A1 (fr) * | 2021-03-26 | 2022-09-30 | Safran Electronics & Defense | Procédé pour assembler un composant électronique à un substrat par pressage |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2010091660A3 (de) | 2011-06-03 |
| JP2012517704A (ja) | 2012-08-02 |
| CN102396057B (zh) | 2014-04-02 |
| EP2396814A2 (de) | 2011-12-21 |
| DE102009008926B4 (de) | 2022-06-15 |
| US9287232B2 (en) | 2016-03-15 |
| JP5731990B2 (ja) | 2015-06-10 |
| DE102009008926A1 (de) | 2010-08-19 |
| US20120037688A1 (en) | 2012-02-16 |
| CN102396057A (zh) | 2012-03-28 |
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