WO2012111478A1 - Conductive paste and solar cell - Google Patents

Conductive paste and solar cell Download PDF

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Publication number
WO2012111478A1
WO2012111478A1 PCT/JP2012/052706 JP2012052706W WO2012111478A1 WO 2012111478 A1 WO2012111478 A1 WO 2012111478A1 JP 2012052706 W JP2012052706 W JP 2012052706W WO 2012111478 A1 WO2012111478 A1 WO 2012111478A1
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Prior art keywords
glass frit
conductive paste
glass
softening point
semiconductor substrate
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PCT/JP2012/052706
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French (fr)
Japanese (ja)
Inventor
義博 川口
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Murata Manufacturing Co Ltd
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Murata Manufacturing Co Ltd
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F19/00Integrated devices, or assemblies of multiple devices, comprising at least one photovoltaic cell covered by group H10F10/00, e.g. photovoltaic modules
    • H10F19/90Structures for connecting between photovoltaic cells, e.g. interconnections or insulating spacers
    • H10F19/902Structures for connecting between photovoltaic cells, e.g. interconnections or insulating spacers for series or parallel connection of photovoltaic cells
    • H10F19/906Structures for connecting between photovoltaic cells, e.g. interconnections or insulating spacers for series or parallel connection of photovoltaic cells characterised by the materials of the structures
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C3/00Glass compositions
    • C03C3/04Glass compositions containing silica
    • C03C3/062Glass compositions containing silica with less than 40% silica by weight
    • C03C3/064Glass compositions containing silica with less than 40% silica by weight containing boron
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C8/00Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
    • C03C8/14Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions
    • C03C8/18Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions containing free metals
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • H01B1/20Conductive material dispersed in non-conductive organic material
    • H01B1/22Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/20Electrodes
    • H10F77/206Electrodes for devices having potential barriers
    • H10F77/211Electrodes for devices having potential barriers for photovoltaic cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Definitions

  • the present invention relates to a conductive paste and a solar cell, and more particularly to a conductive paste suitable for forming an electrode of a solar cell, and a solar cell manufactured using this conductive paste.
  • a solar cell usually has a light-receiving surface electrode of a predetermined pattern formed on one main surface of a semiconductor substrate. Further, an antireflection film is formed on the semiconductor substrate excluding the light receiving surface electrode, and the reflection loss of incident sunlight is suppressed by the antireflection film, thereby converting the conversion efficiency of sunlight into electric energy. Has improved.
  • the light receiving surface electrode is usually formed as follows using a conductive paste. That is, the conductive paste contains conductive powder, glass frit, and organic vehicle, and the conductive paste is applied to the surface of the antireflection film formed on the semiconductor substrate to form a conductive film having a predetermined pattern. To do. Then, the glass frit is melted in the firing process, and the antireflection film under the conductive film is decomposed and removed, whereby the conductive film is sintered to form the light receiving surface electrode, and the light receiving surface electrode and the semiconductor substrate are bonded together. They are bonded to make them both conductive.
  • This method of disassembling and removing the antireflection film in the firing process and bonding the semiconductor substrate and the light-receiving surface electrode is called fire-through, and the conversion efficiency of the solar cell is greatly increased in fire-through performance.
  • Dependent That is, it is known that if the fire-through property is insufficient, the conversion efficiency is lowered and the basic performance as a solar cell is inferior.
  • a glass frit having a low softening point in order to increase the adhesive strength between the light receiving surface electrode and the semiconductor substrate.
  • lead-based glass frit has been used as a glass frit with a low softening point.
  • lead (Pb) has a large environmental load, the appearance of a new material to replace lead-based glass frit is required. ing.
  • Patent Document 1 discloses that the glass frit has a softening point of 570 to 760 ° C., and the glass frit has a molar ratio of B 2 O 3 / SiO 2 of 0.3 or less.
  • a conductive paste containing B 2 O 3 and SiO 2 and containing less than 20 mol% Bi 2 O 3 has been proposed.
  • Patent Document 1 although it is a lead-free conductive paste that does not contain lead, the adhesive strength between the light-receiving surface electrode and the semiconductor substrate is large even when baked at a relatively low temperature, and between the light-receiving surface electrode and the semiconductor substrate. It is possible to obtain a solar cell having a low contact resistance.
  • a conductive paste is applied to an antireflection film on a semiconductor substrate, and this is fired as an object to be fired.
  • the present invention has been made in view of such circumstances, and it is a lead-free electrode for forming an electrode for a solar cell that can stably obtain high conversion efficiency even when fired in a wide temperature range. It aims at providing the electrically conductive paste and the solar cell manufactured using this electrically conductive paste.
  • the present inventor conducted intensive studies to achieve the above object, and as a result, the molar ratio of B 2 O 3 to SiO 2 was adjusted to 0.4 or less, and the two types of non-softening points differing by 20 ° C. or more.
  • the blending ratio of both glass frit is in the range of 1/4 to 4/1, good fire-through property can be secured even if the temperature fluctuates during firing. It was possible to obtain a solar cell having a desired high conversion efficiency in a wide range of firing temperatures.
  • the electrically conductive paste which concerns on this invention is an electrically conductive paste for forming the electrode of a solar cell, Comprising: Conductive powder and 1st glass Containing a frit, a second glass frit having a softening point higher by 20 ° C. or more than the first glass frit, and an organic vehicle, wherein the first and second glass frits do not contain Pb, At least B and Si are contained, and the molar ratio of B to Si is 0.4 or less in terms of SiO 2 and B 2 O 3 , respectively, and the first glass frit and the second glass frit
  • the content ratio of is characterized by being 1/4 to 4/1 in weight ratio.
  • adhesion is secured by the first glass frit having a relatively low softening point, while the light receiving surface electrode and the semiconductor are secured by the second glass frit having a softening point of 20 ° C. or more higher than that of the first glass frit. Excessive glass flow to and from the substrate can be suppressed, thereby ensuring a good fire-through property even when fired in a wide temperature range, and stably obtaining a solar cell having high conversion efficiency Is possible.
  • the softening point of the first glass frit is 510 to 570 ° C.
  • the softening point of the second glass frit is preferably 530 to 680 ° C.
  • the first glass frit is such that Bi 2 O 3 is 20 to 40 mol%, BaO is 5 to 20 mol%, and Al 2 O 3 is 5 mol% or less. Each is preferably contained.
  • the second glass frit has a Bi 2 O 3 content of 5 to 30 mol%, a BaO content of 5 to 25 mol%, and an Al 2 O 3 content of 5 mol% or less. It is preferably contained.
  • the first and second glass frit contain at least one of Bi and Ba.
  • the conductive paste of the present invention preferably contains ZnO.
  • the fire-through property can be further promoted, and a solar cell having a low contact resistance between the electrode and the semiconductor substrate can be realized.
  • the conductive powder is preferably Ag powder.
  • an antireflection film and a light receiving surface electrode penetrating the antireflection film are formed on one main surface of the semiconductor substrate, and the electrode is the conductive paste according to any one of the above Is characterized by being sintered.
  • the conductive powder such as Ag powder
  • the molar ratio of B to Si is 0.4 or less in terms of SiO 2 and B 2 O 3 , respectively, and the content ratio of the first glass frit and the second glass frit is expressed as a weight ratio.
  • the first glass frit having a relatively low softening point ensures adhesion, while the second glass frit having a softening point higher than the first glass frit by 20 ° C. or more.
  • an antireflection film and an electrode penetrating the antireflection film are formed on one main surface of the semiconductor substrate, and the electrode is formed of the conductive paste according to any one of the above. Since it is sintered, a solar cell having high conversion efficiency can be obtained stably even when fired in a wide temperature range.
  • FIG. 1 is a cross-sectional view of an essential part showing an embodiment of a solar cell manufactured using a conductive paste according to the present invention.
  • an antireflection film 2 and a light receiving surface electrode 3 are formed on one main surface of a semiconductor substrate 1 containing Si as a main component, and a back electrode 4 is formed on the other main surface of the semiconductor substrate 1.
  • the semiconductor substrate 1 has a p-type semiconductor layer 1b and an n-type semiconductor layer 1a, and an n-type semiconductor layer 1a is formed on the upper surface of the p-type semiconductor layer 1b.
  • the semiconductor substrate 1 can be obtained, for example, by diffusing impurities on one main surface of a single-crystal or polycrystalline p-type semiconductor layer 1b to form a thin n-type semiconductor layer 1a.
  • the n-type semiconductor layer 1a is formed on the upper surface of the layer 1b, its structure and manufacturing method are not particularly limited.
  • the semiconductor substrate 1 has a structure in which a thin p-type semiconductor layer 1b is formed on one main surface of the n-type semiconductor layer 1a, or a p-type semiconductor layer 1b on a part of one main surface of the semiconductor substrate 1.
  • a structure in which both the n-type semiconductor layer 1a and the n-type semiconductor layer 1a are formed may be used.
  • the conductive paste according to the present invention can be used effectively as long as it is the main surface of the semiconductor substrate 1 on which the antireflection film 2 is formed.
  • the surface of the semiconductor substrate 1 is shown in a flat shape, but the surface is formed to have a fine concavo-convex structure in order to effectively confine sunlight to the semiconductor substrate 1.
  • the antireflection film 2 is formed of an insulating material such as silicon nitride (SiN x ), suppresses reflection of light to the light receiving surface of sunlight indicated by an arrow A, and allows sunlight to be quickly and efficiently applied to the semiconductor substrate 1. Lead.
  • the material constituting the antireflection film 2 is not limited to the above silicon nitride, and other insulating materials such as silicon oxide and titanium oxide may be used, and two or more kinds of insulating materials may be used. May be used in combination. In addition, as long as it is crystalline Si, either single crystal Si or polycrystalline Si may be used.
  • the light receiving surface electrode 3 is formed on the semiconductor substrate 1 through the antireflection film 2.
  • the light-receiving surface electrode 3 is formed by applying a conductive paste of the present invention, which will be described later, onto the semiconductor substrate 1 by using screen printing or the like to produce a conductive film and baking it. That is, in the baking process for forming the light receiving surface electrode 3, the antireflection film 2 under the conductive film is decomposed and removed and fired through, whereby the light receiving surface electrode is formed on the semiconductor substrate 1 so as to penetrate the antireflection film 2. 3 is formed.
  • the light-receiving surface electrode 3 has a large number of finger electrodes 5a, 5b,... 5n arranged in a comb-like shape and intersects with the finger electrodes 5a, 5b,.
  • Bus bar electrode 6 is provided, and finger electrodes 5a, 5b,... 5n and bus bar electrode 6 are electrically connected.
  • the antireflection film 2 is formed in the remaining region excluding the portion where the light receiving surface electrode 3 is provided. In this way, the electric power generated in the semiconductor substrate 1 is collected by the finger electrodes 5n and taken out to the outside by the bus bar electrodes 6.
  • the back electrode 4 is formed on the back surface of the current collecting electrode 7 and the current collecting electrode 7 made of Al or the like formed on the back surface of the p-type semiconductor layer 1b. It is comprised with the extraction electrode 8 which consists of Ag etc. which were electrically connected with the current collection electrode 7. FIG. Then, the electric power generated in the semiconductor substrate 1 is collected by the collecting electrode 7 and is taken out by the extracting electrode 8.
  • the conductive paste of the present invention contains conductive powder, two types of lead-free glass frit (first and second glass frit) having different softening points, and an organic vehicle.
  • the first and second glass frit both contain at least B and Si, and satisfy the following formulas (1) to (3).
  • Ts 1 is the softening point of the first glass frit
  • Ts 2 is the softening point of the second glass frit
  • is the molar content of B 2 O 3 in each glass frit
  • is in each glass frit.
  • x is the content weight of the first glass frit
  • y is the content weight of the second glass frit.
  • the conductive paste of the present invention contains at least two lead-free glass frit containing B and Si and having different softening points, and the softening point Ts 2 of the second glass frit is the same as that of the first glass frit. 20 ° C. or more higher than the softening point Ts 1, the molar ratio ⁇ / ⁇ of B 2 O 3 to SiO 2 is 0.4 or less, and the weight ratio x / of the first glass frit to the second glass frit y is set to 1/4 to 4/1.
  • Softening points Ts 1 and Ts 2 of the first and second glass frit Si-B-Bi-Ba glass frit containing SiO 2 , B 2 O 3 , Bi 2 O 3 , and BaO is a promising substitute for lead glass frit because it has good fire-through properties. is there.
  • the glass frit having a low softening point easily flows at the interface between the light-receiving surface electrode 3 and the semiconductor substrate 1 (n-type semiconductor layer 1a) during the baking process, and is reflected. Since the decomposition / removal of the prevention film is promoted, it can contribute to the improvement of the fire-through property. It is also possible to improve the adhesive strength between the light receiving surface electrode 3 and the semiconductor substrate 1.
  • the lead-free glass frit having a low softening point flows excessively at the interface between the conductive film to be the light-receiving surface electrode 3 and the semiconductor substrate 1 and diffuses toward the semiconductor substrate 1 to cause the semiconductor substrate 1 to flow. There is a risk of erosion. As a result, the pn junction formed between the n-type semiconductor layer 1a and the p-type semiconductor layer 1b may be destroyed, and a desired high conversion efficiency may not be obtained. In this case, if the conductive powder is excessively diffused to the semiconductor substrate 1 side through the glass frit, the parallel resistance is lowered, and as a result, the voltage when the output terminal is opened, that is, the open circuit voltage Voc is lowered. High conversion efficiency cannot be obtained.
  • the first glass frit having a low softening point and the second glass frit having a softening point higher by 20 ° C. or more than the first glass frit are contained in the conductive paste, thereby Excessive flow of glass frit at the interface between the light receiving surface electrode 3 and the semiconductor substrate 1 is suppressed.
  • the glass component is appropriately flowed by the first glass frit, the adhesion at the interface is ensured, the decomposition and removal of the antireflection film is promoted, and the fire-through property is secured, while the second glass frit is secured.
  • the softening point of the second glass frit Ts 2 and the difference between the softening point Ts 1 of the first glass frit be at least 20 ° C. above, when both the softening point difference ⁇ Ts is reduced to below 20 ° C., This is because it is not much different from the case where one type of glass frit is contained in the conductive paste, and high conversion efficiency cannot be obtained stably.
  • the softening points Ts 1 and Ts 2 of the first and second glass frits are not particularly limited as long as the difference between the softening points ⁇ Ts between the commonly used glass frits can be 20 ° C. or more.
  • the first glass frit is preferably 510 to 570 ° C.
  • the second glass frit is preferably 530 to 680 ° C.
  • B 2 O 3 molar ratio to SiO 2 ⁇ / ⁇ Glass is composed of a network oxide that becomes amorphous to form a network network structure, a modified oxide that modifies the network oxide to make it amorphous, and an intermediate oxide between the two. Composed. Of these, SiO 2 and B 2 O 3 both act as network oxides and are important constituents.
  • the conductive powder is dissolved in the glass frit during firing of the conductive film, and the dissolved conductive powder is reduced on the semiconductor substrate 1 and deposited as metal particles. This facilitates the formation of electrical contact between the conductive powder and the semiconductor substrate 1.
  • the molar ratio ⁇ / ⁇ of B 2 O 3 with respect to SiO 2 is set to 0.4 or less.
  • the weight ratio x / y between the first glass frit and the second glass frit is less than 1/4, the second glass frit is excessively contained, while the weight ratio x / y is 4/1. If it exceeds, the first glass frit is excessively contained.
  • the weight ratio x / y between the first glass frit and the second glass frit is set to 1/4 to 4/1.
  • the total content of the glass frit is not particularly limited, but is preferably 1 to 6 parts by weight with respect to 100 parts by weight of the conductive powder.
  • the first glass frit having a relatively low softening point has the adhesiveness.
  • excessive glass flow between the light-receiving surface electrode and the semiconductor substrate can be suppressed by the second glass frit having a softening point 20 ° C. higher than that of the first glass frit. While preventing destruction, it is possible to prevent the open circuit voltage Voc from decreasing by suppressing the decrease in parallel resistance. As a result, while being a lead-free conductive paste, a solar cell having high conversion efficiency stably even when fired in a wide temperature range without impairing fire-through properties, electrical contact properties, adhesive strength, etc. Can be obtained.
  • the components of the first and second glass frit are not particularly limited as long as they contain Si and B. From the viewpoint of obtaining good battery characteristics, the above-described Si—B—Bi is used. -Ba type is preferred.
  • the composition of each glass component is such that the first glass frit contains 20 to 40 mol% Bi 2 O 3 , 5 to 20 mol% BaO, and 5 mol% or less Al 2 O 3.
  • the second glass frit preferably contains 5 to 30 mol% Bi 2 O 3 , 5 to 25 mol% BaO, and 5 mol% or less Al 2 O 3. .
  • Bi 2 O 3 has an effect of adjusting the fluidity of glass as a modified oxide, and further promotes fire-through properties, and therefore plays an important role in a conductive paste for solar cells.
  • the content molar amount of Bi 2 O 3 is 20 to 40 mol%, and in the case of the second glass frit requiring a higher softening point than the first glass frit, The amount is preferably 5 to 30 mol%.
  • BaO like Bi 2 O 3 , also has the effect of adjusting the fluidity of glass as a modified oxide, and contributes to the promotion of fire-through properties. Accordingly, the molar amount of BaO is determined in relation to the molar amount of Bi 2 O 3 having the same action.
  • the content of the second glass frit is 5 to 20 mol%. In this case, 5 to 25 mol% is preferable.
  • Alkaline earth metal oxides other than BaO such as MgO, SrO, and CaO, can be used because they have the effect of adjusting the fluidity of the glass as a modified oxide, as well as BaO, but are good. From the viewpoint of obtaining fire-through properties, it is preferable to use BaO.
  • Al 2 O 3 acts as an intermediate oxide, and by containing an appropriate amount, Al 2 O 3 can suppress crystallization of glass, obtain a stable amorphous glass, and improve the chemical durability of the glass frit. Can do.
  • the content molar amount of Al 2 O 3 exceeds 5 mol%, it becomes easier to crystallize. Therefore, when Al 2 O 3 is included, it is 5 mol% or less, preferably 0.1%. ⁇ 5 mol%.
  • the conductive powder is not particularly limited as long as it is a metal powder having good conductivity, but it maintains good conductivity without being oxidized even when the baking treatment is performed in the air. Ag powder that can be used is preferred.
  • the shape of the conductive powder is not particularly limited, and may be, for example, a spherical shape, a flat shape, an irregular shape, or a mixed powder thereof.
  • the average particle diameter of the conductive powder is not particularly limited, but from the viewpoint of securing a desired contact point between the conductive powder and the semiconductor substrate 1, in terms of spherical powder, 1. 0 to 5.0 ⁇ m is preferable.
  • ZnO promotes the decomposition and removal of the antireflection film 2 during the firing of the conductive paste to enable smooth fire-through, and lowers the contact resistance between the light receiving surface electrode 3 and the semiconductor substrate 1.
  • the organic vehicle is prepared such that the binder resin and the organic solvent are in a volume ratio of 1 to 3: 7 to 9, for example.
  • the binder resin is not particularly limited, and for example, ethyl cellulose resin, nitrocellulose resin, acrylic resin, alkyd resin, or a combination thereof can be used.
  • the organic solvent is not particularly limited, and ⁇ -terpineol, xylene, toluene, diethylene glycol monobutyl ether, diethylene glycol monobutyl ether acetate, diethylene glycol monoethyl ether, diethylene glycol monoethyl ether acetate, etc. alone or in combination thereof Can be used.
  • plasticizers such as di-2-ethylhexyl phthalate and dibutyl phthalate
  • a rheology modifier such as a fatty acid amide or a fatty acid, and a thixotropic agent, a thickener, a dispersant, etc. may be added.
  • the conductive paste is prepared by weighing and mixing the conductive powder, the first and second glass frit, the organic vehicle, and various additives as necessary at a predetermined mixing ratio, and so on. It can be easily manufactured by dispersing and kneading using the above.
  • the conductive powder such as Ag powder, the first and second glass frits, and the organic vehicle are contained, and the glass frit satisfies the above formulas (1) to (3). Therefore, the first glass frit having a relatively low softening point ensures adhesion, while the second glass frit having a softening point 20 ° C. higher than that of the first glass frit allows the light-receiving surface electrode and the semiconductor substrate to adhere to each other. In this way, it is possible to suppress excessive glass flow between them, and even when fired in a wide temperature range, it is possible to obtain a solar cell having stable and high conversion efficiency while ensuring good fireability. Become.
  • the first glass frit contains Bi 2 O 3 in an amount of 20 to 40 mol%, BaO in an amount of 5 to 20 mol%, and Al 2 O 3 in an amount of 5 mol% or less. Glass frit contains 5 to 30 mol% of Bi 2 O 3 , 5 to 25 mol% of BaO, and 5 mol% or less of Al 2 O 3 . Can be obtained.
  • the inclusion of ZnO can promote the fire-through property, and a solar cell with low contact resistance between the electrode and the semiconductor substrate can be realized.
  • the said solar cell will have high conversion efficiency stably even if it burns in a wide temperature range.
  • the present invention is not limited to the above embodiment.
  • the case where both Bi 2 O 3 and BaO are included is exemplified as a preferred form of the glass frit.
  • both are modified oxides and promote fire-through properties, only one of them is included. It is good also as a component composition containing this.
  • the glass frit it is also preferable to contain various oxides in the glass frit as required.
  • TiO 2 and ZrO 2 can be drastically improved in chemical durability of glass only by being contained in a small amount in a glass frit.
  • the content in the glass frit is preferably 5 mol% or less.
  • alkali metal oxide is contained in a large amount in the glass frit, the chemical durability of the glass frit may be lowered. Therefore, the content of the alkali metal oxide in the glass frit is 10 mol% or less. It is preferable to do this.
  • Example preparation (Production of glass frit) SiO 2 , B 2 O 3 , Bi 2 O 3 , BaO, and Al 2 O 3 were blended so as to have a blending ratio as shown in Table 1 in mol% to prepare glass frits A to L. Then, thermal analysis was performed using TG-DTA (thermogravimetric-differential thermal analyzer), and the softening points of the glass frits A to L were measured. That is, 5 mg of a sample is accommodated in an alumina container, ⁇ alumina is used as a standard sample, and the measuring apparatus is heated at 20 ° C. per minute while supplying air into the measuring apparatus at a flow rate of 100 mL / min. It heated with the profile and the TG curve and the DTA curve were created from the weight change with respect to temperature. And the softening point in each sample was measured from such TG curve and DTA curve.
  • TG-DTA thermogravimetric-differential thermal analyzer
  • the glass frit A to J has a B 2 O 3 / SiO 2 of 0.4 or less, indicating a glass frit composition within the scope of the present invention.
  • Example 1 a conductive paste was prepared using these glass frits A to L, and further, a solar battery cell was prepared using this conductive paste, and the characteristics were evaluated.
  • conductive paste As the conductive powder, spherical Ag powder having an average particle diameter of 1.6 ⁇ m and ZnO having a specific surface area of 10 m 2 / g were prepared.
  • the organic cellulose was prepared by mixing the ethyl cellulose resin and texanol so that the binder resin was 10% by weight of ethyl cellulose resin and the organic solvent was 90% by weight of texanol.
  • the glass frit contained in the conductive paste was blended so that the total amount was 2% by weight, as shown in Table 2, by appropriately selecting and combining glass frits A to J.
  • An antireflection film having a thickness of 0.1 ⁇ m was formed by plasma enhanced chemical vapor deposition (PECVD) over the entire surface of a single crystal Si-based semiconductor substrate having a length of 50 mm, a width of 50 mm, and a thickness of 0.2 mm.
  • PECVD plasma enhanced chemical vapor deposition
  • P is diffused into a part of the p-type Si-based semiconductor layer, whereby an n-type Si-based semiconductor layer is formed on the upper surface of the p-type Si-based semiconductor layer.
  • an Al paste mainly composed of Al and an Ag paste mainly composed of Ag were prepared. Then, an Al paste and an Ag paste were appropriately applied to the back surface of the Si-based semiconductor substrate and dried to form a back electrode conductive film.
  • each sample was placed in an oven set at a temperature of 150 ° C. to dry the conductive film.
  • a belt-type near infrared furnace (CDF7210, manufactured by Despatch) was used, and the conveyance speed was adjusted so that the sample passed between the inlet and the outlet in about 1 minute, and the maximum firing temperature of 760 to 800 in the air atmosphere.
  • the solar cells of Sample Nos. 1 to 16 were prepared by firing at 0 ° C. and sintering the conductive paste to form the light-receiving surface electrode. The reason why the maximum firing temperature is set to 760 to 800 ° C. is that the optimum maximum firing temperature varies depending on the paste composition.
  • Pmax is the maximum output of the sample
  • Voc is the open circuit voltage
  • Isc is the short circuit current
  • the conversion efficiency ⁇ was obtained from the maximum output Pmax, the area A of the light receiving surface electrode, and the irradiance E based on the formula (5).
  • Table 2 shows the paste composition, the glass frit softening point difference ⁇ Ts, the fill factor FF, and the conversion efficiency ⁇ of each sample Nos. 1 to 16.
  • Sample No. 13 was found to contain only glass frit C having a softening point Ts of 542 ° C. in the conductive paste, and the conversion efficiency ⁇ was as low as 16.06%.
  • Sample No. 14 contains glass frits C and D in the conductive paste, but the softening point difference ⁇ Ts is as small as 5 ° C. (glass frit C: 542 ° C., glass frit D: 547 ° C.).
  • the conversion efficiency ⁇ was slightly improved as compared with Sample No. 12 containing only the kind, but the conversion efficiency ⁇ was still low at 16.15%, and a sufficient conversion efficiency ⁇ could not be obtained.
  • Sample No. 15 has a softening point difference ⁇ Ts of 22 ° C. and a difference of 20 ° C. or more, but includes glass frit K outside the scope of the present invention in which B 2 O 3 / SiO 2 is 3.83, The conversion efficiency was greatly reduced to 13.56%. This is because glass frit K containing a large amount of B 2 O 3 / SiO 2 is contained, so that a large molten glass stays at the interface between the light-receiving surface electrode and the semiconductor substrate, resulting in a high contact resistance, resulting in conversion. The efficiency ⁇ seems to have decreased.
  • Sample No. 16 has a softening point difference ⁇ Ts of 51 ° C. and a difference of 20 ° C. or more, but includes glass frit L outside the scope of the present invention in which B 2 O 3 / SiO 2 is 2.49. For the same reason as Sample No. 15, the conversion efficiency ⁇ decreased to 13.80%.
  • Sample Nos. 1 to 12 use a combination of two types of glass frit having a softening point difference ⁇ Ts of 20 ° C. or more, and B 2 O 3 / SiO 2 is also 0.10 to 0.39. And the blending ratio of each glass frit is also 1/1, so that the conversion efficiency ⁇ is 16.36 to 16.75% and has a high conversion efficiency ⁇ of 16.35% or more. It was found that a battery was obtained.
  • Sample No. 12 has a softening point of the first glass frit of 597 ° C., which is a high temperature exceeding 570 ° C., but when the maximum firing temperature is optimally adjusted, a desired high conversion efficiency ⁇ is obtained. It was.
  • Example 2 Using the glass frits E, F and H produced in Example 1, the conductive pastes of sample numbers 21 to 24 were prepared by the same method and procedure as in Example 1 so that the paste composition shown in Table 3 was obtained. Produced.
  • solar cells of sample numbers 21 to 24 were produced in the same manner and procedure as in Example 1 except that the maximum firing temperature was set to 4 different temperatures between 780 and 820 ° C., respectively, and firing was performed.
  • Table 3 shows the paste composition, firing temperature (baking maximum temperature), fill factor FF, conversion efficiency ⁇ , and determination result for each sample Nos. 21 to 24.
  • the determination result made the sample whose conversion efficiency (eta) 16.35% or more (circle) (pass) and the sample whose conversion efficiency is less than 16.35% made x (fail).
  • Sample No. 23 contains only glass frit E having a softening point Ts of 567 ° C. in the conductive paste, so the conversion efficiency ⁇ is low at 13.90 to 15.89%, and the conversion efficiency depends on the firing temperature. It was found that ⁇ varies.
  • Sample No. 21 uses glass frits E and H having a softening point difference ⁇ Ts of 73 ° C., B 2 O 3 / SiO 2 are both 0.4 or less, and the blending ratio of the two types of glass frits Therefore, it was found that a solar cell having a high conversion efficiency ⁇ of 16.47 to 16.66% over a wide temperature range of 780 to 810 ° C. was obtained.
  • Sample No. 22 uses glass frits F and H having a softening point difference ⁇ Ts of 43 ° C., B 2 O 3 / SiO 2 are both 0.4 or less, and the mixing ratio of the two types of glass frits is Although the softening point of the first glass frit was 597 ° C. and exceeded 570 ° C., the conversion efficiency ⁇ was reduced to 13.90% when the firing temperature was lowered to 780 ° C. That is, when the softening point of the first glass frit is excessively high, the firing temperature region for obtaining high conversion efficiency is wider than that of sample numbers 23 and 24, but is slightly narrower than that of sample number 21. I understood.
  • Example 1 Using the glass frits A and J produced in Example 1, the conductive paste and solar cells of sample numbers 31 to 39 were prepared by the same method and procedure as in Example 1 so that the paste composition shown in Table 4 was obtained. A cell was produced.
  • Table 4 shows the paste composition, the weight ratio x / y (hereinafter referred to as “A / J”) of the glass frit A and the glass frit J, the fill factor FF, and the conversion efficiency ⁇ in each of the samples 31 to 39. Is shown.
  • Sample No. 38 had a large A / J of 9.00 and an excessive content of glass frit A having a low softening point, so the conversion efficiency ⁇ was reduced to 15.85%. This is because glass frit A having a low softening point is excessively contained, so that an excessive flow of the glass component occurs at the interface between the conductive film to be the light-receiving surface electrode and the semiconductor substrate during firing, and the glass component becomes a semiconductor substrate. In addition, Ag is excessively diffused into the semiconductor substrate through the molten glass, leading to a reduction in parallel resistance and a reduction in the open-circuit voltage Voc. As a result, a high conversion efficiency ⁇ cannot be obtained. This is probably because of this.
  • Sample Nos. 31 to 37 have an A / J of 0.25 to 4.0 (1/4 to 4/1), which is within the range of the present invention. % High solar cell was obtained.

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Abstract

A conductive paste which contains an Ag powder, a first glass frit, a second glass frit that has a softening point higher than that of the first glass frit by 20˚C or more, and an organic vehicle. The first and second glass frits are free from lead and contain at least B and Si, with the molar ratio of B2O3 relative to SiO2 being 0.4 or less. The first glass frit and the second glass frit are contained in the conductive paste in a weight ratio of from 1/4 to 4/1. A light-receiving surface electrode (3) is formed using the conductive paste. Consequently there can be achieved: a conductive paste for forming an electrode for solar cells, which is free from lead and still capable of stably achieving high conversion efficiency even if fired over a wide temperature range; and a solar cell which is manufactured using the conductive paste.

Description

導電性ペースト及び太陽電池Conductive paste and solar cell

 本発明は、導電性ペースト及び太陽電池に関し、より詳しくは太陽電池の電極形成に適した導電性ペースト、及びこの導電性ペーストを使用して製造された太陽電池に関する。 The present invention relates to a conductive paste and a solar cell, and more particularly to a conductive paste suitable for forming an electrode of a solar cell, and a solar cell manufactured using this conductive paste.

 太陽電池は、通常、半導体基板の一方の主面に所定パターンの受光面電極を形成している。また、前記受光面電極を除く半導体基板上には反射防止膜が形成されており、入射される太陽光の反射損失を前記反射防止膜で抑制し、これにより太陽光の電気エネルギーへの変換効率を向上させている。 A solar cell usually has a light-receiving surface electrode of a predetermined pattern formed on one main surface of a semiconductor substrate. Further, an antireflection film is formed on the semiconductor substrate excluding the light receiving surface electrode, and the reflection loss of incident sunlight is suppressed by the antireflection film, thereby converting the conversion efficiency of sunlight into electric energy. Has improved.

 前記受光面電極は、通常、導電性ペーストを使用して以下のようにして形成される。すなわち、導電性ペーストは、導電性粉末、ガラスフリット、及び有機ビヒクルを含有しており、半導体基板上に形成された反射防止膜の表面に導電性ペーストを塗布し、所定パターンの導電膜を形成する。そして、焼成過程でガラスフリットを溶融させ、導電膜下層の反射防止膜を分解・除去し、これにより導電膜が焼結されて受光面電極を形成すると共に、該受光面電極と半導体基板とを接着させ、両者を導通させている。 The light receiving surface electrode is usually formed as follows using a conductive paste. That is, the conductive paste contains conductive powder, glass frit, and organic vehicle, and the conductive paste is applied to the surface of the antireflection film formed on the semiconductor substrate to form a conductive film having a predetermined pattern. To do. Then, the glass frit is melted in the firing process, and the antireflection film under the conductive film is decomposed and removed, whereby the conductive film is sintered to form the light receiving surface electrode, and the light receiving surface electrode and the semiconductor substrate are bonded together. They are bonded to make them both conductive.

 このように焼成過程で反射防止膜を分解・除去し、半導体基板と受光面電極とを接着させる方法は、ファイヤースルー(焼成貫通)と呼ばれ、太陽電池の変換効率は、ファイヤースルー性に大きく依存する。すなわち、ファイヤースルー性が不十分であると変換効率が低下し、太陽電池としての基本性能に劣ることが知られている。 This method of disassembling and removing the antireflection film in the firing process and bonding the semiconductor substrate and the light-receiving surface electrode is called fire-through, and the conversion efficiency of the solar cell is greatly increased in fire-through performance. Dependent. That is, it is known that if the fire-through property is insufficient, the conversion efficiency is lowered and the basic performance as a solar cell is inferior.

 また、この種の太陽電池では、受光面電極と半導体基板との接着強度を高めるために、低軟化点のガラスフリットを使用するのが好ましいとされている。 Further, in this type of solar cell, it is preferable to use a glass frit having a low softening point in order to increase the adhesive strength between the light receiving surface electrode and the semiconductor substrate.

 低軟化点のガラスフリットとしては、従来より、鉛系のガラスフリットが使用されていたが、鉛(Pb)は環境負荷が大きいことから、鉛系ガラスフリットに代わる新たな材料の出現が求められている。 Conventionally, lead-based glass frit has been used as a glass frit with a low softening point. However, since lead (Pb) has a large environmental load, the appearance of a new material to replace lead-based glass frit is required. ing.

 このような観点から特許文献1には、ガラスフリットの軟化点が570~760℃であり、かつ該ガラスフリットは、モル比でB/SiOが0.3以下の割合となるようにB及びSiOを含有し、かつBiを20mol%未満含有した導電性ペーストが提案されている。 From this viewpoint, Patent Document 1 discloses that the glass frit has a softening point of 570 to 760 ° C., and the glass frit has a molar ratio of B 2 O 3 / SiO 2 of 0.3 or less. A conductive paste containing B 2 O 3 and SiO 2 and containing less than 20 mol% Bi 2 O 3 has been proposed.

 特許文献1では、鉛を含まない非鉛系導電性ペーストでありながら、比較的低温で焼成しても受光面電極と半導体基板との接着強度が大きく、かつ受光面電極と半導体基板との間の接触抵抗の小さい太陽電池を得ることが可能となる。 In Patent Document 1, although it is a lead-free conductive paste that does not contain lead, the adhesive strength between the light-receiving surface electrode and the semiconductor substrate is large even when baked at a relatively low temperature, and between the light-receiving surface electrode and the semiconductor substrate. It is possible to obtain a solar cell having a low contact resistance.

国際公開2007/102287号(請求項2、段落番号〔0016〕)International Publication No. 2007/102287 (Claim 2, Paragraph Number [0016])

 特許文献1のような従来の太陽電池では、上述したように半導体基板上の反射防止膜に導電性ペーストを塗布し、これを被焼成物として焼成し、製造している。 In a conventional solar cell such as Patent Document 1, as described above, a conductive paste is applied to an antireflection film on a semiconductor substrate, and this is fired as an object to be fired.

 しかしながら、上記被焼成物は高速で焼成炉を通過することから、焼成過程でファイヤースルーが十分に行われず、このため、受光面電極と半導体基板との間に反射防止膜が残存するおそれがある。そしてその結果、受光面電極が半導体基板に接着していない部分が生じ、このため変換効率の低下を招くおそれがある。 However, since the object to be fired passes through the firing furnace at a high speed, fire-through is not sufficiently performed in the firing process, and thus there is a possibility that an antireflection film remains between the light receiving surface electrode and the semiconductor substrate. . As a result, there is a portion where the light receiving surface electrode is not bonded to the semiconductor substrate, which may cause a decrease in conversion efficiency.

 また、太陽電池の量産過程では、大量の被焼成物が高速で焼成炉を通過するため、焼成炉を所定温度に設定していても、焼成炉内を通過する被焼成物の搬送状態の影響を受けて焼成温度が変動し易く、ファイヤースルーの不十分な製品が焼成炉から排出されるおそれがある。 In addition, in the mass production process of solar cells, a large amount of the material to be baked passes through the baking furnace at a high speed. As a result, the firing temperature tends to fluctuate, and products with insufficient fire-through may be discharged from the firing furnace.

 したがって、導電性ペーストを使用して太陽電池を安定的に生産するためには、焼成条件の厳密な管理が必要となる。特に、特許文献1のように570~760℃と軟化点の高いガラスフリットを使用した場合は、最適な焼成条件では高変換効率を得ることができるが、焼成温度の変動による影響を受け易く、安定して高い変換効率を得るのが困難である。 Therefore, in order to stably produce solar cells using the conductive paste, it is necessary to strictly control the firing conditions. In particular, when a glass frit having a high softening point of 570 to 760 ° C. is used as in Patent Document 1, high conversion efficiency can be obtained under optimum firing conditions, but it is easily affected by fluctuations in the firing temperature, It is difficult to obtain high conversion efficiency stably.

 また、特許文献1では、軟化点の高い1種類のガラスフリットのみを使用しているため、導電性ペースト中に含有されるバインダ樹脂等が熱分解又は燃焼して消失した後、ガラス成分が軟化するまでの間は、受光面電極となるべき導電膜と半導体基板との間の接着は極めて弱い状態を持続する。このような状態で導電性粉末の焼結が過剰に進行した場合、焼成前には多数存在していた導電性粉末と半導体基板との接触箇所が減少してしまい、このため、所望の高い変換効率を得るのが困難となる。 Moreover, in patent document 1, since only one kind of glass frit having a high softening point is used, after the binder resin or the like contained in the conductive paste disappears by thermal decomposition or combustion, the glass component softens. In the meantime, the adhesion between the conductive film to be the light-receiving surface electrode and the semiconductor substrate remains extremely weak. If the sintering of the conductive powder proceeds excessively in such a state, the number of contact points between the conductive powder and the semiconductor substrate that existed before firing decreased, and therefore, the desired high conversion It becomes difficult to obtain efficiency.

 本発明はこのような事情に鑑みなされたものであって、非鉛系でありながら、幅広い温度領域で焼成しても、安定して高い変換効率を得ることができる太陽電池の電極形成用の導電性ペースト、及びこの導電性ペーストを使用して製造された太陽電池を提供することを目的とする。 The present invention has been made in view of such circumstances, and it is a lead-free electrode for forming an electrode for a solar cell that can stably obtain high conversion efficiency even when fired in a wide temperature range. It aims at providing the electrically conductive paste and the solar cell manufactured using this electrically conductive paste.

 本発明者は、上記目的を達成するために鋭意研究を行ったところ、SiOに対するBのモル比率が0.4以下に調整された、軟化点が20℃以上異なる2種類の非鉛系ガラスフリットを使用することにより、両者のガラスフリットの配合比率を1/4~4/1の範囲であれば、焼成中に温度変動が生じても良好なファイヤースルー性を確保することができ、これにより幅広い焼成温度領域で所望の高い変換効率を有する太陽電池を安定的に得ることができるという知見を得た。 The present inventor conducted intensive studies to achieve the above object, and as a result, the molar ratio of B 2 O 3 to SiO 2 was adjusted to 0.4 or less, and the two types of non-softening points differing by 20 ° C. or more. By using a lead-based glass frit, if the blending ratio of both glass frit is in the range of 1/4 to 4/1, good fire-through property can be secured even if the temperature fluctuates during firing. It was possible to obtain a solar cell having a desired high conversion efficiency in a wide range of firing temperatures.

 本発明はこのような知見に基づきなされたものであって、本発明に係る導電性ペーストは、太陽電池の電極を形成するための導電性ペーストであって、導電性粉末と、第1のガラスフリットと、該第1のガラスフリットに比べて軟化点が20℃以上高い第2のガラスフリットと、有機ビヒクルとを含有し、前記第1及び第2のガラスフリットは、Pbを含有せず、少なくともB及びSiを含有すると共に、Siに対するBのモル比率が、SiO及びBにそれぞれ換算して0.4以下であり、前記第1のガラスフリットと前記第2のガラスフリットとの含有比率は、重量比で1/4~4/1であることを特徴としている。 This invention is made | formed based on such knowledge, Comprising: The electrically conductive paste which concerns on this invention is an electrically conductive paste for forming the electrode of a solar cell, Comprising: Conductive powder and 1st glass Containing a frit, a second glass frit having a softening point higher by 20 ° C. or more than the first glass frit, and an organic vehicle, wherein the first and second glass frits do not contain Pb, At least B and Si are contained, and the molar ratio of B to Si is 0.4 or less in terms of SiO 2 and B 2 O 3 , respectively, and the first glass frit and the second glass frit The content ratio of is characterized by being 1/4 to 4/1 in weight ratio.

 上記導電性ペーストでは、比較的軟化点の低い第1のガラスフリットによって接着性を確保する一方、第1のガラスフリットよりも軟化点が20℃以上高い第2のガラスフリットによって受光面電極と半導体基板との間の過剰なガラスの流動を抑制することができ、これにより幅広い温度領域で焼成しても、良好なファイヤースルー性を確保して安定して高い変換効率を有する太陽電池を得ることが可能となる。 In the conductive paste, adhesion is secured by the first glass frit having a relatively low softening point, while the light receiving surface electrode and the semiconductor are secured by the second glass frit having a softening point of 20 ° C. or more higher than that of the first glass frit. Excessive glass flow to and from the substrate can be suppressed, thereby ensuring a good fire-through property even when fired in a wide temperature range, and stably obtaining a solar cell having high conversion efficiency Is possible.

 また、本発明の導電性ペーストは、前記第1のガラスフリットの軟化点は、510~570℃であり、前記第2のガラスフリットは、軟化点が530~680℃であるのが好ましい。 In the conductive paste of the present invention, the softening point of the first glass frit is 510 to 570 ° C., and the softening point of the second glass frit is preferably 530 to 680 ° C.

 さらに、本発明の導電性ペーストは、前記第1のガラスフリットは、Biが20~40モル%、BaOが5~20モル%、及びAlが5モル%以下の範囲でそれぞれ含有されているのが好ましい。 Furthermore, in the conductive paste of the present invention, the first glass frit is such that Bi 2 O 3 is 20 to 40 mol%, BaO is 5 to 20 mol%, and Al 2 O 3 is 5 mol% or less. Each is preferably contained.

 また、本発明の導電性ペーストは、前記第2のガラスフリットは、Biが5~30モル%、BaOが5~25モル%、及びAlが5モル%以下の範囲で含有されているのが好ましい。 In the conductive paste of the present invention, the second glass frit has a Bi 2 O 3 content of 5 to 30 mol%, a BaO content of 5 to 25 mol%, and an Al 2 O 3 content of 5 mol% or less. It is preferably contained.

 これによりファイヤースルー性や化学的耐久性の良好な導電性ペーストを得ることができる。 This makes it possible to obtain a conductive paste with good fire-through and chemical durability.

 また、本発明の導電性ペーストは、前記第1及び第2のガラスフリットは、Bi及びBaのうちの少なくともいずれか一方を含有しているのが好ましい。 In the conductive paste of the present invention, it is preferable that the first and second glass frit contain at least one of Bi and Ba.

 さらに、本発明の導電性ペーストは、ZnOを含有しているのが好ましい。 Furthermore, the conductive paste of the present invention preferably contains ZnO.

 これにより、より一層ファイヤースルー性を促進させることができ、電極と半導体基板との間の接触抵抗が低い太陽電池を実現することができる。 Thereby, the fire-through property can be further promoted, and a solar cell having a low contact resistance between the electrode and the semiconductor substrate can be realized.

 また、本発明の導電性ペーストは、前記導電性粉末が、Ag粉末であるのが好ましい。 In the conductive paste of the present invention, the conductive powder is preferably Ag powder.

 また、本発明に係る太陽電池は、半導体基板の一方の主面に反射防止膜及び該記反射防止膜を貫通する受光面電極が形成され、前記電極が、上記いずれかに記載の導電性ペーストが焼結されてなることを特徴としている。 Further, in the solar cell according to the present invention, an antireflection film and a light receiving surface electrode penetrating the antireflection film are formed on one main surface of the semiconductor substrate, and the electrode is the conductive paste according to any one of the above Is characterized by being sintered.

 これにより幅広い温度領域で焼成しても安定して高い変換効率を有する太陽電池を得ることができる。 This makes it possible to obtain a solar cell having a stable and high conversion efficiency even when fired in a wide temperature range.

 本発明の導電性ペーストによれば、Ag粉末等の導電性粉末と、軟化点が例えば510~570℃の第1のガラスフリットと、軟化点が例えば530~680℃で前記第1のガラスフリットに比べて20℃以上高い軟化点を有する第2のガラスフリットと、有機ビヒクルとを含有し、前記第1及び第2のガラスフリットは、Pbを含有せず、少なくともB及びSiを含有すると共に、Siに対するBのモル比率が、SiO及びBにそれぞれ換算して0.4以下であり、前記第1のガラスフリットと前記第2のガラスフリットとの含有比率は、重量比で1/4~4/1であるので、比較的軟化点の低い第1のガラスフリットによって接着性を確保する一方、第1のガラスフリットよりも軟化点が20℃以上高い第2のガラスフリットによって受光面電極と半導体基板との間の過剰なガラスの流動を抑制することができ、これにより幅広い温度領域で焼成しても、良好なファイヤースルー性を確保して安定して高い変換効率を有する太陽電池を得ることが可能となる。 According to the conductive paste of the present invention, the conductive powder such as Ag powder, the first glass frit having a softening point of, for example, 510 to 570 ° C., and the first glass frit having a softening point of, for example, 530 to 680 ° C. And a second glass frit having a softening point higher by 20 ° C. or more than the organic vehicle, and the first and second glass frits do not contain Pb and contain at least B and Si. , The molar ratio of B to Si is 0.4 or less in terms of SiO 2 and B 2 O 3 , respectively, and the content ratio of the first glass frit and the second glass frit is expressed as a weight ratio. Since it is 1/4 to 4/1, the first glass frit having a relatively low softening point ensures adhesion, while the second glass frit having a softening point higher than the first glass frit by 20 ° C. or more. Can suppress the flow of excess glass between the light-receiving surface electrode and the semiconductor substrate, thereby ensuring good fire-through performance and stable high conversion efficiency even when fired in a wide temperature range. It is possible to obtain a solar cell having the same.

 また、本発明の太陽電池によれば、半導体基板の一方の主面に反射防止膜及び該記反射防止膜を貫通する電極が形成され、前記電極が、上記いずれかに記載の導電性ペーストが焼結されてなるので、幅広い温度領域で焼成しても安定して高い変換効率を有する太陽電池を得ることができる。 Moreover, according to the solar cell of the present invention, an antireflection film and an electrode penetrating the antireflection film are formed on one main surface of the semiconductor substrate, and the electrode is formed of the conductive paste according to any one of the above. Since it is sintered, a solar cell having high conversion efficiency can be obtained stably even when fired in a wide temperature range.

本発明に係る導電性ペーストを使用して製造された太陽電池の一実施形態を示す要部断面図である。It is principal part sectional drawing which shows one Embodiment of the solar cell manufactured using the electrically conductive paste which concerns on this invention. 受光面電極側を模式的に示した拡大平面図である。It is the enlarged plan view which showed the light-receiving surface electrode side typically. 裏面電極側を模式的に示した拡大底面図である。It is the enlarged bottom view which showed the back electrode side typically.

 次に、本発明の実施の形態を詳説する。 Next, an embodiment of the present invention will be described in detail.

 図1は、本発明に係る導電性ペーストを使用して製造された太陽電池の一実施の形態を示す要部断面図である。 FIG. 1 is a cross-sectional view of an essential part showing an embodiment of a solar cell manufactured using a conductive paste according to the present invention.

 この太陽電池は、Siを主成分とした半導体基板1の一方の主面に反射防止膜2及び受光面電極3が形成されると共に、該半導体基板1の他方の主面に裏面電極4が形成されている。 In this solar cell, an antireflection film 2 and a light receiving surface electrode 3 are formed on one main surface of a semiconductor substrate 1 containing Si as a main component, and a back electrode 4 is formed on the other main surface of the semiconductor substrate 1. Has been.

 半導体基板1は、p型半導体層1bとn型半導体層1aとを有し、p型半導体層1bの上面にn型半導体層1aが形成されている。該半導体基板1は、例えば、単結晶又は多結晶のp型半導体層1bの一方の主面に不純物を拡散させ、薄いn型半導体層1aを形成することにより得ることができるが、p型半導体層1bの上面に、n型半導体層1aが形成されているのであれば、その構造及び製法は特に限定されるものではない。また、半導体基板1は、n型半導体層1aの一方の主面に薄いp型半導体層1bが形成された構造のものや、半導体基板1の一方の主面の一部にp型半導体層1bとn型半導体層1aの両方が形成されている構造のものを用いてもよい。いずれにしても、反射防止膜2が形成された半導体基板1の主面であれば、本発明に係る導電性ペーストを有効に用いることができる。 The semiconductor substrate 1 has a p-type semiconductor layer 1b and an n-type semiconductor layer 1a, and an n-type semiconductor layer 1a is formed on the upper surface of the p-type semiconductor layer 1b. The semiconductor substrate 1 can be obtained, for example, by diffusing impurities on one main surface of a single-crystal or polycrystalline p-type semiconductor layer 1b to form a thin n-type semiconductor layer 1a. As long as the n-type semiconductor layer 1a is formed on the upper surface of the layer 1b, its structure and manufacturing method are not particularly limited. The semiconductor substrate 1 has a structure in which a thin p-type semiconductor layer 1b is formed on one main surface of the n-type semiconductor layer 1a, or a p-type semiconductor layer 1b on a part of one main surface of the semiconductor substrate 1. A structure in which both the n-type semiconductor layer 1a and the n-type semiconductor layer 1a are formed may be used. In any case, the conductive paste according to the present invention can be used effectively as long as it is the main surface of the semiconductor substrate 1 on which the antireflection film 2 is formed.

 尚、図1では、半導体基板1の表面はフラット状に記載しているが、太陽光を半導体基板1に効果的に閉じ込めるために、表面は微小凹凸構造を有するように形成されている。 In FIG. 1, the surface of the semiconductor substrate 1 is shown in a flat shape, but the surface is formed to have a fine concavo-convex structure in order to effectively confine sunlight to the semiconductor substrate 1.

 反射防止膜2は、窒化ケイ素(SiN)等の絶縁性材料で形成され、矢印Aに示す太陽光の受光面への光の反射を抑制し、太陽光を半導体基板1に迅速かつ効率よく導く。この反射防止膜2を構成する材料としては、上述した窒化ケイ素に限定されるものではなく、他の絶縁性材料、例えば酸化ケイ素や酸化チタンを使用してもよく、2種類以上の絶縁性材料を併用してもよい。また、結晶Si系であれば単結晶Si及び多結晶Siのいずれを使用してもよい。 The antireflection film 2 is formed of an insulating material such as silicon nitride (SiN x ), suppresses reflection of light to the light receiving surface of sunlight indicated by an arrow A, and allows sunlight to be quickly and efficiently applied to the semiconductor substrate 1. Lead. The material constituting the antireflection film 2 is not limited to the above silicon nitride, and other insulating materials such as silicon oxide and titanium oxide may be used, and two or more kinds of insulating materials may be used. May be used in combination. In addition, as long as it is crystalline Si, either single crystal Si or polycrystalline Si may be used.

 受光面電極3は、半導体基板1上に反射防止膜2を貫通して形成されている。この受光面電極3は、スクリーン印刷等を使用し、後述する本発明の導電性ペーストを半導体基板1上に塗布して導電膜を作製し、焼成することによって形成される。すなわち、受光面電極3を形成する焼成過程で、導電膜下層の反射防止膜2が分解・除去されてファイヤースルーされ、これにより反射防止膜2を貫通する形態で半導体基板1上に受光面電極3が形成される。 The light receiving surface electrode 3 is formed on the semiconductor substrate 1 through the antireflection film 2. The light-receiving surface electrode 3 is formed by applying a conductive paste of the present invention, which will be described later, onto the semiconductor substrate 1 by using screen printing or the like to produce a conductive film and baking it. That is, in the baking process for forming the light receiving surface electrode 3, the antireflection film 2 under the conductive film is decomposed and removed and fired through, whereby the light receiving surface electrode is formed on the semiconductor substrate 1 so as to penetrate the antireflection film 2. 3 is formed.

 受光面電極3は、具体的には、図2に示すように、多数のフィンガー電極5a、5b、…5nが櫛歯状に並設されると共に、フィンガー電極5a、5b、…5nと交差状にバスバー電極6が設けられ、フィンガー電極5a、5b、…5nとバスバー電極6とが電気的に接続されている。そして、受光面電極3が設けられている部分を除く残りの領域に、反射防止膜2が形成されている。このようにして半導体基板1で発生した電力をフィンガー電極5nによって集電するとともにバスバー電極6によって外部へ取り出している。 Specifically, as shown in FIG. 2, the light-receiving surface electrode 3 has a large number of finger electrodes 5a, 5b,... 5n arranged in a comb-like shape and intersects with the finger electrodes 5a, 5b,. Bus bar electrode 6 is provided, and finger electrodes 5a, 5b,... 5n and bus bar electrode 6 are electrically connected. Then, the antireflection film 2 is formed in the remaining region excluding the portion where the light receiving surface electrode 3 is provided. In this way, the electric power generated in the semiconductor substrate 1 is collected by the finger electrodes 5n and taken out to the outside by the bus bar electrodes 6.

 裏面電極4は、具体的には、図3に示すように、p型半導体層1bの裏面に形成されたAl等からなる集電電極7と、該集電電極7の裏面に形成されて該集電電極7と電気的に接続されたAg等からなる取出電極8とで構成されている。そして、半導体基板1で発生した電力は集電電極7に集電され、取出電極8によって電力を取り出している。 Specifically, as shown in FIG. 3, the back electrode 4 is formed on the back surface of the current collecting electrode 7 and the current collecting electrode 7 made of Al or the like formed on the back surface of the p-type semiconductor layer 1b. It is comprised with the extraction electrode 8 which consists of Ag etc. which were electrically connected with the current collection electrode 7. FIG. Then, the electric power generated in the semiconductor substrate 1 is collected by the collecting electrode 7 and is taken out by the extracting electrode 8.

 次に、受光面電極3を形成するための本発明の導電性ペーストについて詳述する。 Next, the conductive paste of the present invention for forming the light receiving surface electrode 3 will be described in detail.

 本発明の導電性ペーストは、導電性粉末、軟化点の異なる2種類の非鉛系ガラスフリット(第1及び第2のガラスフリット)、及び有機ビヒクルを含有している。 The conductive paste of the present invention contains conductive powder, two types of lead-free glass frit (first and second glass frit) having different softening points, and an organic vehicle.

 そして、第1及び第2のガラスフリットは、いずれも少なくともB及びSiを含有し、かつ下記数式(1)~(3)を満足している。 The first and second glass frit both contain at least B and Si, and satisfy the following formulas (1) to (3).

 Ts-Ts≧20…(1)
 α/β≦0.4 …(2)
 1/4≦x/y≦4/1…(3)
Ts 2 −Ts 1 ≧ 20 (1)
α / β ≦ 0.4 (2)
1/4 ≦ x / y ≦ 4/1 (3)

 ここで、Tsは第1のガラスフリットの軟化点、Tsは第2のガラスフリットの軟化点、αは各ガラスフリット中のBの含有モル量、βは各ガラスフリット中のSiOの含有モル量、xは第1のガラスフリットの含有重量、yは第2のガラスフリットの含有重量である。 Here, Ts 1 is the softening point of the first glass frit, Ts 2 is the softening point of the second glass frit, α is the molar content of B 2 O 3 in each glass frit, and β is in each glass frit. The molar content of SiO 2 , x is the content weight of the first glass frit, and y is the content weight of the second glass frit.

 すなわち、本発明の導電性ペーストは、少なくともB及びSiを含有する軟化点の異なる2種類の非鉛系ガラスフリットを含有し、第2のガラスフリットの軟化点Tsは第1のガラスフリットの軟化点Tsよりも20℃以上高く、SiOに対するBのモル比率α/βが0.4以下とされ、かつ、第1のガラスフリットと第2のガラスフリットの重量比率x/yが1/4~4/1とされている。 That is, the conductive paste of the present invention contains at least two lead-free glass frit containing B and Si and having different softening points, and the softening point Ts 2 of the second glass frit is the same as that of the first glass frit. 20 ° C. or more higher than the softening point Ts 1, the molar ratio α / β of B 2 O 3 to SiO 2 is 0.4 or less, and the weight ratio x / of the first glass frit to the second glass frit y is set to 1/4 to 4/1.

 そしてこれにより、幅広い温度領域で焼成しても、良好なファイヤースルー性を確保でき、安定して高い変換効率を有する太陽電池を得ることができる。 Thus, even when fired in a wide temperature range, good fire-through properties can be ensured, and a solar cell having high conversion efficiency can be obtained stably.

 以下、ガラスフリットが上記数式(1)~(3)を満足するようにした理由を述べる。 Hereinafter, the reason why the glass frit satisfies the above formulas (1) to (3) will be described.

(1)第1及び第2のガラスフリットの軟化点Ts、Ts
 SiO、B、Bi、BaOを含有したSi-B-Bi-Ba系のガラスフリットは、良好なファイヤースルー性を有することから、鉛系ガラスフリットの代替物質として有望である。
(1) Softening points Ts 1 and Ts 2 of the first and second glass frit
Si-B-Bi-Ba glass frit containing SiO 2 , B 2 O 3 , Bi 2 O 3 , and BaO is a promising substitute for lead glass frit because it has good fire-through properties. is there.

 そして、Si-B-Bi-Ba系ガラスフリットのうち、軟化点が低いガラスフリットは、焼成過程において受光面電極3と半導体基板1(n型半導体層1a)との界面で流動し易く、反射防止膜の分解・除去を促進することから、ファイヤースルー性の向上に寄与することができる。また、受光面電極3と半導体基板1との接着強度を向上させることも可能である。 Of the Si-B-Bi-Ba-based glass frit, the glass frit having a low softening point easily flows at the interface between the light-receiving surface electrode 3 and the semiconductor substrate 1 (n-type semiconductor layer 1a) during the baking process, and is reflected. Since the decomposition / removal of the prevention film is promoted, it can contribute to the improvement of the fire-through property. It is also possible to improve the adhesive strength between the light receiving surface electrode 3 and the semiconductor substrate 1.

 しかしながら一方で、低軟化点の非鉛系ガラスフリットは、受光面電極3となるべき導電膜と半導体基板1との界面で過剰に流動し、半導体基板1側に拡散して該半導体基板1を浸食するおそれがある。そしてその結果、n型半導体層1aとp型半導体層1bとの間で形成されたpn接合が破壊され、所望の高い変換効率を得ることができなくなるおそれがある。また、この場合、導電性粉末がガラスフリットを介して半導体基板1側に過剰に拡散すると、並列抵抗が低下し、その結果出力端子を開放したときの電圧、すなわち開放電圧Vocが低下し、結果的に高い変換効率を得ることができなくなる。 However, the lead-free glass frit having a low softening point flows excessively at the interface between the conductive film to be the light-receiving surface electrode 3 and the semiconductor substrate 1 and diffuses toward the semiconductor substrate 1 to cause the semiconductor substrate 1 to flow. There is a risk of erosion. As a result, the pn junction formed between the n-type semiconductor layer 1a and the p-type semiconductor layer 1b may be destroyed, and a desired high conversion efficiency may not be obtained. In this case, if the conductive powder is excessively diffused to the semiconductor substrate 1 side through the glass frit, the parallel resistance is lowered, and as a result, the voltage when the output terminal is opened, that is, the open circuit voltage Voc is lowered. High conversion efficiency cannot be obtained.

 そこで、本実施の形態では、軟化点の低い第1のガラスフリットと、該第1のガラスフリットよりも軟化点が20℃以上高い第2のガラスフリットを導電性ペースト中に含有させ、これにより受光面電極3と半導体基板1との界面におけるガラスフリットの過剰な流動を抑制している。 Therefore, in the present embodiment, the first glass frit having a low softening point and the second glass frit having a softening point higher by 20 ° C. or more than the first glass frit are contained in the conductive paste, thereby Excessive flow of glass frit at the interface between the light receiving surface electrode 3 and the semiconductor substrate 1 is suppressed.

 このように第1のガラスフリットによってガラス成分を適度に流動させ、前記界面における接着性を確保して反射防止膜の分解・除去を促進し、ファイヤースルー性を確保する一方、第2のガラスフリットで前記界面におけるガラス成分の過剰な流動を抑制することにより、pn接合が破壊されるのを防止すると共に、並列抵抗の低下を抑制して開放電圧Vocが低下するのを回避し、これにより高い変換効率を得るようにしている。 As described above, the glass component is appropriately flowed by the first glass frit, the adhesion at the interface is ensured, the decomposition and removal of the antireflection film is promoted, and the fire-through property is secured, while the second glass frit is secured. By suppressing the excessive flow of the glass component at the interface, it is possible to prevent the pn junction from being destroyed, and to suppress the decrease of the parallel resistance to avoid the decrease of the open circuit voltage Voc. The conversion efficiency is obtained.

 ここで、第2のガラスフリットの軟化点Tsと第1のガラスフリットの軟化点Tsとの差を少なくとも20℃以上としたのは、両者の軟化点差ΔTsが20℃未満に小さくなると、1種類のガラスフリットを導電性ペーストに含有させた場合と大差なく、安定して高い変換効率を得ることができなくなるためである。 Here, the softening point of the second glass frit Ts 2 and the difference between the softening point Ts 1 of the first glass frit be at least 20 ° C. above, when both the softening point difference ΔTs is reduced to below 20 ° C., This is because it is not much different from the case where one type of glass frit is contained in the conductive paste, and high conversion efficiency cannot be obtained stably.

 尚、第1及び第2のガラスフリットの軟化点Ts、Tsは、通常使用されるガラスフリット間で両者の軟化点差ΔTsが20℃以上を確保できるのであれば特に限定されるものではないが、より幅広い焼成温度領域で所望の高変換効率を得るためには、第1のガラスフリットは510~570℃、第2のガラスフリットは530~680℃が好ましい。 The softening points Ts 1 and Ts 2 of the first and second glass frits are not particularly limited as long as the difference between the softening points ΔTs between the commonly used glass frits can be 20 ° C. or more. However, in order to obtain a desired high conversion efficiency in a wider firing temperature range, the first glass frit is preferably 510 to 570 ° C., and the second glass frit is preferably 530 to 680 ° C.

(2)SiOに対するBのモル比率α/β
 ガラスは、非晶質化して網目状のネットワーク構造を形成する網目状酸化物と、網目状酸化物を修飾して非晶質化する修飾酸化物と、両者の中間的な中間酸化物とで構成される。このうちSiO及びBはいずれも網目状酸化物として作用し、重要な構成成分である。
(2) B 2 O 3 molar ratio to SiO 2 α / β
Glass is composed of a network oxide that becomes amorphous to form a network network structure, a modified oxide that modifies the network oxide to make it amorphous, and an intermediate oxide between the two. Composed. Of these, SiO 2 and B 2 O 3 both act as network oxides and are important constituents.

 そして、太陽電池の電極形成用導電性ペーストでは、導電膜の焼成時に導電性粉末がガラスフリット中に溶解し、この溶解した導電性粉末が半導体基板1上で還元されて金属粒子として析出することにより、導電性粉末と半導体基板1との間の電気的接触の形成を促進する。 In the conductive paste for electrode formation of a solar cell, the conductive powder is dissolved in the glass frit during firing of the conductive film, and the dissolved conductive powder is reduced on the semiconductor substrate 1 and deposited as metal particles. This facilitates the formation of electrical contact between the conductive powder and the semiconductor substrate 1.

 しかしながら、SiOに対するBのモル比率α/βが0.4を超えると、Bの含有モル量が過剰となり、導電性粉末のガラスフリット中への溶解量は増加するものの、ガラスフリット中に溶解した導電性粉末が半導体基板1上に析出しに難くなる。そしてその結果、焼成後の受光面電極3と半導体基板1との界面に大量のガラス成分が滞留し、却って電気的接触の形成を阻害する。 However, if the molar ratio α / β of B 2 O 3 to SiO 2 exceeds 0.4, the content molar amount of B 2 O 3 becomes excessive and the amount of conductive powder dissolved in the glass frit increases. It becomes difficult for the conductive powder dissolved in the glass frit to be deposited on the semiconductor substrate 1. As a result, a large amount of a glass component stays at the interface between the light-receiving surface electrode 3 and the semiconductor substrate 1 after firing, thereby inhibiting the formation of electrical contact.

 そこで、本実施の形態では、SiOに対するBのモル比率α/βを0.4以下としている。 Therefore, in the present embodiment, the molar ratio α / β of B 2 O 3 with respect to SiO 2 is set to 0.4 or less.

(3)第1のガラスフリットと第2のガラスフリットの重量比率x/y
 上述したように軟化点が20℃以上異なる2種類の非鉛系ガラスフリット(第1及び第2のガラスフリット)を導電性ペースト中に含有させることにより、受光面電極3と半導体基板1との界面におけるガラスフリットの過剰な流動を抑制することができ、これによりpn接合の破壊が防止されると共に、並列抵抗の低下を抑制して開放電圧Vocが低下するのを回避することができ、高い変換効率を得ることが可能となる。
(3) Weight ratio x / y between the first glass frit and the second glass frit
As described above, by including two types of lead-free glass frit (first and second glass frit) having different softening points of 20 ° C. or more in the conductive paste, the light-receiving surface electrode 3 and the semiconductor substrate 1 are separated from each other. The excessive flow of the glass frit at the interface can be suppressed, thereby preventing the pn junction from being broken, and the decrease in the open circuit voltage Voc can be avoided by suppressing the decrease in the parallel resistance. Conversion efficiency can be obtained.

 しかしながら、第1のガラスフリットと第2のガラスフリットの重量比率x/yが1/4未満の場合は第2のガラスフリットが過剰に含有され、一方、前記重量比率x/yが4/1を超えると、第1のガラスフリットが過剰に含有される。 However, when the weight ratio x / y between the first glass frit and the second glass frit is less than 1/4, the second glass frit is excessively contained, while the weight ratio x / y is 4/1. If it exceeds, the first glass frit is excessively contained.

 このようにいずれか一方のガラスフリットが他方のガラスフリットに比べて大量に含有されると、たとえ両者のガラスフリットの軟化点に20℃以上の差異があったとしても、結果的に1種類のガラスフリットを導電性ペーストに含有させた場合と大差なく、安定して高い変換効率を得ることができなくなる。 Thus, when either one glass frit is contained in a larger amount than the other glass frit, even if there is a difference of 20 ° C. or more in the softening point of both glass frit, one kind of glass frit is eventually obtained. It is not much different from the case where glass frit is contained in the conductive paste, and stable and high conversion efficiency cannot be obtained.

 そこで、本実施の形態では、第1のガラスフリットと第2のガラスフリットの重量比率x/yを1/4~4/1としている。 Therefore, in this embodiment, the weight ratio x / y between the first glass frit and the second glass frit is set to 1/4 to 4/1.

 尚、ガラスフリットの総含有量は、特に限定されるものではないが、導電性粉末100重量部に対し1~6重量部が好ましい。 The total content of the glass frit is not particularly limited, but is preferably 1 to 6 parts by weight with respect to 100 parts by weight of the conductive powder.

 このように本実施の形態では、上記数式(1)~(3)を満足するガラスフリットが導電性ペースト中に含有されているので、比較的軟化点の低い第1のガラスフリットによって接着性を確保する一方、第1のガラスフリットよりも軟化点が20℃高い第2のガラスフリットによって受光面電極と半導体基板との間の過剰なガラスの流動を抑制することができ、これによりpn接合が破壊されるのを防止すると共に、並列抵抗の低下を抑制して開放電圧Vocが低下するのを回避することができる。その結果、非鉛系導電性ペーストでありながら、ファイヤースルー性や電気的接触性、接着強度等を損なうこともなく、幅広い温度領域で焼成しても安定して高い変換効率を有する太陽電池を得ることが可能となる。 As described above, in the present embodiment, since the glass frit satisfying the above formulas (1) to (3) is contained in the conductive paste, the first glass frit having a relatively low softening point has the adhesiveness. On the other hand, excessive glass flow between the light-receiving surface electrode and the semiconductor substrate can be suppressed by the second glass frit having a softening point 20 ° C. higher than that of the first glass frit. While preventing destruction, it is possible to prevent the open circuit voltage Voc from decreasing by suppressing the decrease in parallel resistance. As a result, while being a lead-free conductive paste, a solar cell having high conversion efficiency stably even when fired in a wide temperature range without impairing fire-through properties, electrical contact properties, adhesive strength, etc. Can be obtained.

 尚、第1及び第2のガラスフリットの構成成分は、Si及びBを含有していれば特に限定されるものではないが、良好な電池特性を得る観点からは、上述したSi-B-Bi-Ba系が好ましい。そして、各ガラス成分の組成は、第1のガラスフリットでは、Biが20~40モル%、BaOが5~20モル%、及びAlが5モル%以下の範囲で含有されるのが好ましく、第2のガラスフリットでは、Biが5~30モル%、BaOが5~25モル%、及びAlが5モル%以下の範囲で含有されるのが好ましい。 The components of the first and second glass frit are not particularly limited as long as they contain Si and B. From the viewpoint of obtaining good battery characteristics, the above-described Si—B—Bi is used. -Ba type is preferred. The composition of each glass component is such that the first glass frit contains 20 to 40 mol% Bi 2 O 3 , 5 to 20 mol% BaO, and 5 mol% or less Al 2 O 3. The second glass frit preferably contains 5 to 30 mol% Bi 2 O 3 , 5 to 25 mol% BaO, and 5 mol% or less Al 2 O 3. .

 Biは、修飾酸化物としてガラスの流動性を調整する作用を有し、さらにファイヤースルー性を促進することから、太陽電池用の導電性ペーストでは重要な役割を果たす。 Bi 2 O 3 has an effect of adjusting the fluidity of glass as a modified oxide, and further promotes fire-through properties, and therefore plays an important role in a conductive paste for solar cells.

 ただし、Biは軟化点を低下させる作用があることから、Biの含有モル量が増加すると、ガラスの軟化点が過度に低下し、また結晶化しやすくなる。したがって、軟化点が低い第1のガラスフリットの場合は、含有モル量は20~40モル%、第1のガラスフリットよりも高軟化点が要求される第2のガラスフリットの場合は、含有モル量は5~30モル%が好ましい。 However, since Bi 2 O 3 has an effect of lowering the softening point, when the content molar amount of Bi 2 O 3 increases, the softening point of the glass is excessively lowered and crystallization becomes easy. Therefore, in the case of the first glass frit having a low softening point, the content molar amount is 20 to 40 mol%, and in the case of the second glass frit requiring a higher softening point than the first glass frit, The amount is preferably 5 to 30 mol%.

 また、BaOも、Biと同様、修飾酸化物としてガラスの流動性を調整する作用を有し、ファイヤースルー性の促進にも寄与する。したがって、BaOの含有モル量は、同様の作用を有するBiの含有モル量との関連で決定され、例えば第1のガラスフリットの場合で、5~20モル%、第2のガラスフリットの場合で、5~25モル%が好ましい。 BaO, like Bi 2 O 3 , also has the effect of adjusting the fluidity of glass as a modified oxide, and contributes to the promotion of fire-through properties. Accordingly, the molar amount of BaO is determined in relation to the molar amount of Bi 2 O 3 having the same action. For example, in the case of the first glass frit, the content of the second glass frit is 5 to 20 mol%. In this case, 5 to 25 mol% is preferable.

 尚、BaO以外のアルカリ土類金属酸化物、例えば、MgO、SrO、CaOも、BaOと同様、修飾酸化物としてガラスの流動性を調整する作用を有することから使用は可能であるが、良好なファイヤースルー性を得る観点からはBaOを使用するのが好ましい。 Alkaline earth metal oxides other than BaO, such as MgO, SrO, and CaO, can be used because they have the effect of adjusting the fluidity of the glass as a modified oxide, as well as BaO, but are good. From the viewpoint of obtaining fire-through properties, it is preferable to use BaO.

 また、Alは、中間酸化物として作用し、適量含有させることにより、ガラスの結晶化を抑制し、安定した非晶質ガラスを得られ、ガラスフリットの化学的耐久性を向上させることができる。 In addition, Al 2 O 3 acts as an intermediate oxide, and by containing an appropriate amount, Al 2 O 3 can suppress crystallization of glass, obtain a stable amorphous glass, and improve the chemical durability of the glass frit. Can do.

 ただし、Alの含有モル量が5モル%を超えて含有されると、却って結晶化し易くなることから、Alを含有させる場合は、5モル%以下、好ましくは0.1~5モル%である。 However, if the content molar amount of Al 2 O 3 exceeds 5 mol%, it becomes easier to crystallize. Therefore, when Al 2 O 3 is included, it is 5 mol% or less, preferably 0.1%. ~ 5 mol%.

 導電性粉末としては、良好な導電性を有する金属粉であれば特に限定されるものではないが、焼成処理を大気中で行った場合であっても酸化されることなく良好な導電性を維持することができるAg粉末を好んで使用することができる。尚、この導電性粉末の形状も、特に限定されるものではなく、例えば、球形状、扁平状、不定形形状、或いはこれらの混合粉であってもよい。 The conductive powder is not particularly limited as long as it is a metal powder having good conductivity, but it maintains good conductivity without being oxidized even when the baking treatment is performed in the air. Ag powder that can be used is preferred. The shape of the conductive powder is not particularly limited, and may be, for example, a spherical shape, a flat shape, an irregular shape, or a mixed powder thereof.

 また、導電性粉末の平均粒径も、特に限定されるものではないが、導電性粉末と半導体基板1との間で、所望の接触点を確保する観点からは、球形粉換算で、1.0~5.0μmが好ましい。 Further, the average particle diameter of the conductive powder is not particularly limited, but from the viewpoint of securing a desired contact point between the conductive powder and the semiconductor substrate 1, in terms of spherical powder, 1. 0 to 5.0 μm is preferable.

 また、導電性ペースト中にZnOを含有させるのも好ましい。すなわち、ZnOは、導電性ペーストの焼成に際し、反射防止膜2の分解・除去を促進して円滑なファイヤースルーを可能とし、受光面電極3と半導体基板1との接触抵抗を低くする。 Moreover, it is also preferable to contain ZnO in the conductive paste. That is, ZnO promotes the decomposition and removal of the antireflection film 2 during the firing of the conductive paste to enable smooth fire-through, and lowers the contact resistance between the light receiving surface electrode 3 and the semiconductor substrate 1.

 有機ビヒクルは、バインダ樹脂と有機溶剤とが、例えば体積比率で、1~3:7~9となるように調製されている。尚、バインダ樹脂としては、特に限定されるものではなく、例えば、エチルセルロース樹脂、ニトロセルロース樹脂、アクリル樹脂、アルキド樹脂、又はこれらの組み合わせを使用することができる。また、有機溶剤についても特に限定されるものではなく、α―テルピネオール、キシレン、トルエン、ジエチレングリコールモノブチルエーテル、ジエチレングリコールモノブチルエーテルアセテート、ジエチレングリコールモノエチルエーテル、ジエチレングリコールモノエチルエーテルアセテート等を単独、或いはこれらを組み合わせて使用することができる。 The organic vehicle is prepared such that the binder resin and the organic solvent are in a volume ratio of 1 to 3: 7 to 9, for example. The binder resin is not particularly limited, and for example, ethyl cellulose resin, nitrocellulose resin, acrylic resin, alkyd resin, or a combination thereof can be used. Also, the organic solvent is not particularly limited, and α-terpineol, xylene, toluene, diethylene glycol monobutyl ether, diethylene glycol monobutyl ether acetate, diethylene glycol monoethyl ether, diethylene glycol monoethyl ether acetate, etc. alone or in combination thereof Can be used.

 また、導電性ペーストには、必要に応じて、フタル酸ジ2-エチルヘキシル、フタル酸ジブチル等の可塑剤を1種又はこれらの組み合わせを添加するのも好ましい。また、脂肪酸アマイドや脂肪酸等のレオロジー調整剤を添加するのも好ましく、さらにはチクソトロピック剤、増粘剤、分散剤などを添加してもよい。 In addition, it is also preferable to add one or a combination of plasticizers such as di-2-ethylhexyl phthalate and dibutyl phthalate to the conductive paste as necessary. It is also preferable to add a rheology modifier such as a fatty acid amide or a fatty acid, and a thixotropic agent, a thickener, a dispersant, etc. may be added.

 そして、この導電性ペーストは、導電性粉末、第1及び第2のガラスフリット、有機ビヒクル、必要に応じて各種添加剤を所定の混合比率となるように秤量して混合し、三本ロールミル等を使用して分散・混練することにより、容易に製造することができる。 The conductive paste is prepared by weighing and mixing the conductive powder, the first and second glass frit, the organic vehicle, and various additives as necessary at a predetermined mixing ratio, and so on. It can be easily manufactured by dispersing and kneading using the above.

 このように本実施の形態では、Ag粉末等の導電性粉末と、第1及び第2のガラスフリットと、有機ビヒクルとを含有し、ガラスフリットが上記数式(1)~(3)を満足しているので、比較的軟化点の低い第1のガラスフリットによって接着性を確保する一方、第1のガラスフリットよりも軟化点が20℃高い第2のガラスフリットによって受光面電極と半導体基板との間の過剰なガラスの流動を抑制することができ、これにより幅広い温度領域で焼成しても、良好なファイヤーする性を確保して安定して高い変換効率を有する太陽電池を得ることが可能となる。 As described above, in the present embodiment, the conductive powder such as Ag powder, the first and second glass frits, and the organic vehicle are contained, and the glass frit satisfies the above formulas (1) to (3). Therefore, the first glass frit having a relatively low softening point ensures adhesion, while the second glass frit having a softening point 20 ° C. higher than that of the first glass frit allows the light-receiving surface electrode and the semiconductor substrate to adhere to each other. In this way, it is possible to suppress excessive glass flow between them, and even when fired in a wide temperature range, it is possible to obtain a solar cell having stable and high conversion efficiency while ensuring good fireability. Become.

 また、前記第1のガラスフリットは、Biが20~40モル%、BaOが5~20モル%、及びAlが5モル%以下の範囲でそれぞれ含有され、前記第2のガラスフリットは、Biが5~30モル%、BaOが5~25モル%、Alが5モル%以下の範囲でそれぞれ含有されることにより、ファイヤースルー性や化学的耐久性の良好な導電性ペーストを得ることができる。 The first glass frit contains Bi 2 O 3 in an amount of 20 to 40 mol%, BaO in an amount of 5 to 20 mol%, and Al 2 O 3 in an amount of 5 mol% or less. Glass frit contains 5 to 30 mol% of Bi 2 O 3 , 5 to 25 mol% of BaO, and 5 mol% or less of Al 2 O 3 . Can be obtained.

 また、ZnOを含有することによっても、ファイヤースルー性を促進させることが可能であり、電極と半導体基板との間の接触抵抗が低い太陽電池を実現することができる。 Also, the inclusion of ZnO can promote the fire-through property, and a solar cell with low contact resistance between the electrode and the semiconductor substrate can be realized.

 そして、上記太陽電池は、幅広い温度領域で焼成しても安定して高い変換効率を有するものとなる。 And the said solar cell will have high conversion efficiency stably even if it burns in a wide temperature range.

 尚、本発明は上記実施の形態に限定されるものではない。上記実施の形態ではガラスフリットの好ましい形態として、Bi及びBaOの双方を含有させた場合を例示したが、双方とも修飾酸化物でありファイヤースルー性を促進させることから、いずれか一方のみを含有した成分組成としてもよい。 The present invention is not limited to the above embodiment. In the above embodiment, the case where both Bi 2 O 3 and BaO are included is exemplified as a preferred form of the glass frit. However, since both are modified oxides and promote fire-through properties, only one of them is included. It is good also as a component composition containing this.

 また、必要に応じ、ガラスフリット中に種々の酸化物を含有させるのも好ましい。例えば、TiOやZrOは、ガラスフリット中に少量含有させるだけで、ガラスの化学的耐久性を飛躍的に向上させることが可能である。ただし、大量に含有させると核発生剤として作用するおそれがあるため、これらTiOやZrOをガラスフリットに含有させる場合は、ガラスフリット中の含有量は5モル%以下とするのが好ましい。 Moreover, it is also preferable to contain various oxides in the glass frit as required. For example, TiO 2 and ZrO 2 can be drastically improved in chemical durability of glass only by being contained in a small amount in a glass frit. However, since it may act as a nucleating agent if contained in a large amount, when these TiO 2 and ZrO 2 are contained in the glass frit, the content in the glass frit is preferably 5 mol% or less.

 また、LiO、NaO、KO等のアルカリ金属酸化物は、Biと同様、ガラスの軟化点を調整する機能を有することから、適宜含有させるのも好ましい。ただし、アルカリ金属酸化物をガラスフリット中に大量に含有させると、ガラスフリットの化学的耐久性が低下するおそれがあることから、ガラスフリット中のアルカリ金属酸化物の含有量は10モル%以下とするのが好ましい。 Further, Li 2 O, Na 2 O , an alkali metal oxide K 2 O, etc., similar to the Bi 2 O 3, because it has a function of adjusting the softening point of the glass, also preferably be contained as appropriate. However, if alkali metal oxide is contained in a large amount in the glass frit, the chemical durability of the glass frit may be lowered. Therefore, the content of the alkali metal oxide in the glass frit is 10 mol% or less. It is preferable to do this.

 次に、本発明の実施例を具体的に説明する。 Next, specific examples of the present invention will be described.

〔試料の作製〕
(ガラスフリットの作製)
 SiO、B、Bi、BaO、Alが、モル%で表1のような配合比率となるように調合し、ガラスフリットA~Lを作製した。そして、TG-DTA(熱重量-示差熱分析装置)を使用して熱分析を行い、各ガラスフリットA~Lの軟化点を測定した。すなわち、アルミナ製容器に試料5mgを収容し、標準試料にαアルミナを使用し、流量100mL/分で測定装置内に空気を供給しながら、該測定装置を1分間に20℃上昇するような焼成プロファイルで加熱し、温度に対する重量変化からTG曲線及びDTA曲線を作成した。そして斯かるTG曲線及びDTA曲線から各試料における軟化点を測定した。
[Sample preparation]
(Production of glass frit)
SiO 2 , B 2 O 3 , Bi 2 O 3 , BaO, and Al 2 O 3 were blended so as to have a blending ratio as shown in Table 1 in mol% to prepare glass frits A to L. Then, thermal analysis was performed using TG-DTA (thermogravimetric-differential thermal analyzer), and the softening points of the glass frits A to L were measured. That is, 5 mg of a sample is accommodated in an alumina container, α alumina is used as a standard sample, and the measuring apparatus is heated at 20 ° C. per minute while supplying air into the measuring apparatus at a flow rate of 100 mL / min. It heated with the profile and the TG curve and the DTA curve were created from the weight change with respect to temperature. And the softening point in each sample was measured from such TG curve and DTA curve.

 表1はガラスフリットA~Lの成分組成、Bの含有モル量αとSiOの含有モル量βとのモル比率α/β(以下、「B/SiO」と記す。)、及び軟化点Tsを示している。 Table 1 chemical composition of the glass frit A ~ L, B 2 molar quantity of O 3 alpha and the molar content of SiO 2 beta molar ratio alpha / beta (hereinafter, referred to as "B 2 O 3 / SiO 2" )) And the softening point Ts.

Figure JPOXMLDOC01-appb-T000001
Figure JPOXMLDOC01-appb-T000001

 この表1から明らかなように、ガラスフリットA~Jは、B/SiOが0.4以下であり、本発明範囲内のガラスフリット組成を示している。 As is apparent from Table 1, the glass frit A to J has a B 2 O 3 / SiO 2 of 0.4 or less, indicating a glass frit composition within the scope of the present invention.

 これに対しガラスフリットK、Lは、B/SiOがそれぞれ3.83、2.49であり、0.4を大幅に超えており、本発明範囲外のガラスフリット組成を示している。 On the other hand, in the glass frit K and L, B 2 O 3 / SiO 2 is 3.83 and 2.49, respectively, and greatly exceeds 0.4, indicating a glass frit composition outside the scope of the present invention. Yes.

 この実施例1では、これらガラスフリットA~Lを使用して導電性ペーストを作製し、さらに、この導電性ペーストを使用して太陽電池セルを作製し、特性を評価した。 In Example 1, a conductive paste was prepared using these glass frits A to L, and further, a solar battery cell was prepared using this conductive paste, and the characteristics were evaluated.

(導電性ペーストの作製)
 導電性粉末として平均粒径が1.6μmの球形Ag粉末、比表面積が10m/gのZnOを用意した。
(Preparation of conductive paste)
As the conductive powder, spherical Ag powder having an average particle diameter of 1.6 μm and ZnO having a specific surface area of 10 m 2 / g were prepared.

 次いで、有機ビヒクルを作製した。すなわち、バインダ樹脂としてエチルセルロース樹脂10重量%、有機溶剤としてテキサノール90重量%となるようにエチルセルロース樹脂とテキサノールとを混合し、有機ビヒクルを作製した。 Next, an organic vehicle was produced. That is, the organic cellulose was prepared by mixing the ethyl cellulose resin and texanol so that the binder resin was 10% by weight of ethyl cellulose resin and the organic solvent was 90% by weight of texanol.

 そして、Ag粉末が82.0重量%、ZnOが4.5重量%、ガラスフリットが総計で2.0重量%となるように、これらを脂肪酸アマイドや脂肪酸等のレオロジー調整剤及び有機ビヒクルと共に配合し、プラネタリーミキサーで混合した後に、三本ロールミルで混練し、これにより試料番号1~16の導電性ペーストを作製した。 These are blended with rheology modifiers such as fatty acid amides and fatty acids and organic vehicles so that the Ag powder is 82.0% by weight, ZnO is 4.5% by weight, and the total glass frit is 2.0% by weight. After mixing with a planetary mixer, the mixture was kneaded with a three-roll mill, thereby producing conductive pastes of sample numbers 1 to 16.

 尚、導電性ペースト中に含有されるガラスフリットは、表2に示すようにガラスフリットA~Jを適宜選択して組み合わせ、総量が2重量%となるように配合した。 The glass frit contained in the conductive paste was blended so that the total amount was 2% by weight, as shown in Table 2, by appropriately selecting and combining glass frits A to J.

(太陽電池セルの作製)
 縦50mm、横50mm、厚み0.2mmの単結晶のSi系半導体基板の表面全域に膜厚0.1μmの反射防止膜をプラズマ化学気相成長法(PECVD)で形成した。尚、このSi系半導体基板は、p型Si系半導体層の一部にPを拡散させ、これによりp型Si系半導体層の上面にn型Si系半導体層が形成されている。
(Production of solar cells)
An antireflection film having a thickness of 0.1 μm was formed by plasma enhanced chemical vapor deposition (PECVD) over the entire surface of a single crystal Si-based semiconductor substrate having a length of 50 mm, a width of 50 mm, and a thickness of 0.2 mm. In this Si-based semiconductor substrate, P is diffused into a part of the p-type Si-based semiconductor layer, whereby an n-type Si-based semiconductor layer is formed on the upper surface of the p-type Si-based semiconductor layer.

 次いで、Alを主成分としたAlペースト、及びAgを主成分としたAgペーストを用意した。そして前記Si系半導体基板の裏面にAlペースト及びAgペーストを適宜塗付し、乾燥させて裏面電極用導電膜を形成した。 Next, an Al paste mainly composed of Al and an Ag paste mainly composed of Ag were prepared. Then, an Al paste and an Ag paste were appropriately applied to the back surface of the Si-based semiconductor substrate and dried to form a back electrode conductive film.

 次に、上記導電性ペーストを使用してスクリーン印刷を行い、焼成後の膜厚が20μmとなるように、Si系半導体基板の表面に導電性ペーストを塗布し、受光面電極用導電膜を作製した。 Next, screen printing is performed using the conductive paste, and the conductive paste is applied to the surface of the Si-based semiconductor substrate so that the film thickness after baking is 20 μm, and a conductive film for the light-receiving surface electrode is manufactured. did.

 次いで、各試料を温度150℃に設定したオーブン中に入れ、導電膜を乾燥させた。 Next, each sample was placed in an oven set at a temperature of 150 ° C. to dry the conductive film.

 その後、ベルト式近赤外炉(デスパッチ社製、CDF7210)を使用し、試料が入口~出口間を約1分で通過するように搬送速度を調整し、大気雰囲気下、焼成最高温度760~800℃で焼成し、導電性ペーストが焼結されて受光面電極が形成された試料番号1~16の太陽電池セルを作製した。尚、焼成最高温度を760~800℃としたのは、ペースト組成によって最適な焼成最高温度が異なるからである。 Thereafter, a belt-type near infrared furnace (CDF7210, manufactured by Despatch) was used, and the conveyance speed was adjusted so that the sample passed between the inlet and the outlet in about 1 minute, and the maximum firing temperature of 760 to 800 in the air atmosphere. The solar cells of Sample Nos. 1 to 16 were prepared by firing at 0 ° C. and sintering the conductive paste to form the light-receiving surface electrode. The reason why the maximum firing temperature is set to 760 to 800 ° C. is that the optimum maximum firing temperature varies depending on the paste composition.

〔試料の評価〕
 試料番号1~16の各試料について、ソーラーシミュレータ(英弘精機社製、SS-50XIL)を使用し、温度25℃、AM(エアマス)-1.5の条件下、電流-電圧特性曲線を測定し、この電流-電圧特性曲線から数式(4)で表わされる曲線因子FF(Fill Factor)を求めた。
(Sample evaluation)
For each sample number 1 to 16, a solar simulator (SS-50XIL, manufactured by Eihiro Seiki Co., Ltd.) was used, and a current-voltage characteristic curve was measured under conditions of a temperature of 25 ° C. and AM (air mass) -1.5. From this current-voltage characteristic curve, a fill factor (FF) represented by Equation (4) was obtained.

 FF=Pmax/(Voc×Isc) …(4) FF = Pmax / (Voc × Isc) (4)

 ここで、Pmaxは試料の最大出力、Vocは開放電圧、Iscは短絡電流である。 Here, Pmax is the maximum output of the sample, Voc is the open circuit voltage, and Isc is the short circuit current.

 また、最大出力Pmax、受光面電極の面積A、放射照度Eから、数式(5)に基づき変換効率ηを求めた。 Also, the conversion efficiency η was obtained from the maximum output Pmax, the area A of the light receiving surface electrode, and the irradiance E based on the formula (5).

 η=Pmax/(A×E) …(5) Η = Pmax / (A × E) (5)

 表2は試料番号1~16の各試料のペースト組成、ガラスフリットの軟化点差ΔTs、曲線因子FF、及び変換効率ηを示している。 Table 2 shows the paste composition, the glass frit softening point difference ΔTs, the fill factor FF, and the conversion efficiency η of each sample Nos. 1 to 16.

Figure JPOXMLDOC01-appb-T000002
Figure JPOXMLDOC01-appb-T000002

 試料番号13は、導電性ペースト中には軟化点Tsが542℃のガラスフリットCしか含有されておらず、変換効率ηが16.06%と低くなることが分かった。 Sample No. 13 was found to contain only glass frit C having a softening point Ts of 542 ° C. in the conductive paste, and the conversion efficiency η was as low as 16.06%.

 試料番号14は、導電性ペースト中にガラスフリットC、Dが含有されているが、軟化点差ΔTsが5℃と小さく(ガラスフリットC:542℃、ガラスフリットD:547℃)、ガラスフリットを1種類しか含有していない試料番号12に比べると変換効率ηは若干向上したが、変換効率ηは16.15%と未だ低く、十分な変換効率ηを得ることができなかった。 Sample No. 14 contains glass frits C and D in the conductive paste, but the softening point difference ΔTs is as small as 5 ° C. (glass frit C: 542 ° C., glass frit D: 547 ° C.). The conversion efficiency η was slightly improved as compared with Sample No. 12 containing only the kind, but the conversion efficiency η was still low at 16.15%, and a sufficient conversion efficiency η could not be obtained.

 試料番号15は、軟化点差ΔTsが22℃であり20℃以上の差異はあるが、B/SiOが3.83である本発明範囲外のガラスフリットKが含まれているため、変換効率が13.56%と大幅に低下した。これはB/SiOが大きいガラスフリットKが含まれているため、受光面電極と半導体基板との界面に大きな溶融ガラスが滞留し、このため接触抵抗が高くなり、その結果、変換効率ηが低くなったものと思われる。 Sample No. 15 has a softening point difference ΔTs of 22 ° C. and a difference of 20 ° C. or more, but includes glass frit K outside the scope of the present invention in which B 2 O 3 / SiO 2 is 3.83, The conversion efficiency was greatly reduced to 13.56%. This is because glass frit K containing a large amount of B 2 O 3 / SiO 2 is contained, so that a large molten glass stays at the interface between the light-receiving surface electrode and the semiconductor substrate, resulting in a high contact resistance, resulting in conversion. The efficiency η seems to have decreased.

 試料番号16は、軟化点差ΔTsが51℃であり20℃以上の差異があるが、B/SiOが2.49である本発明範囲外のガラスフリットLが含まれているため、試料番号15と同様の理由から変換効率ηが13.80%に低下した。 Sample No. 16 has a softening point difference ΔTs of 51 ° C. and a difference of 20 ° C. or more, but includes glass frit L outside the scope of the present invention in which B 2 O 3 / SiO 2 is 2.49. For the same reason as Sample No. 15, the conversion efficiency η decreased to 13.80%.

 これに対し試料番号1~12は、軟化点差ΔTsが20℃以上異なる2種類のガラスフリットを組み合わせて使用し、B/SiOも0.10~0.39のガラスフリットA~Jを使用しており、しかも各ガラスフリットの配合比率も1/1であるので、変換効率ηは、16.36~16.75%となって16.35%以上の高い変換効率ηを有する太陽電池が得られることが分かった。 On the other hand, Sample Nos. 1 to 12 use a combination of two types of glass frit having a softening point difference ΔTs of 20 ° C. or more, and B 2 O 3 / SiO 2 is also 0.10 to 0.39. And the blending ratio of each glass frit is also 1/1, so that the conversion efficiency η is 16.36 to 16.75% and has a high conversion efficiency η of 16.35% or more. It was found that a battery was obtained.

 尚、試料番号12は、第1のガラスフリットの軟化点が597℃であり、570℃を超えて高温であるものの、最高焼成温度を最適に調整した場合は、所望の高い変換効率ηが得られた。 Sample No. 12 has a softening point of the first glass frit of 597 ° C., which is a high temperature exceeding 570 ° C., but when the maximum firing temperature is optimally adjusted, a desired high conversion efficiency η is obtained. It was.

 実施例1で作製したガラスフリットE、F及びHを使用し、表3に示すようなペースト組成となるように、実施例1と同様の方法・手順で試料番号21~24の導電性ペーストを作製した。 Using the glass frits E, F and H produced in Example 1, the conductive pastes of sample numbers 21 to 24 were prepared by the same method and procedure as in Example 1 so that the paste composition shown in Table 3 was obtained. Produced.

 次いで、最高焼成温度を780~820℃の間で各々4つの異なる温度に設定し、焼成した以外は、実施例1と同様の方法・手順で試料番号21~24の太陽電池セルを作製した。 Next, solar cells of sample numbers 21 to 24 were produced in the same manner and procedure as in Example 1 except that the maximum firing temperature was set to 4 different temperatures between 780 and 820 ° C., respectively, and firing was performed.

 そして、各試料について、実施例1と同様の方法・手順で曲線因子FF及び変換効率ηを測定した。 For each sample, the fill factor FF and the conversion efficiency η were measured by the same method and procedure as in Example 1.

 表3は、試料番号21~24の各試料におけるペースト組成、焼成温度(焼成最高温度)、曲線因子FF、及び変換効率η、判定結果を示している。 Table 3 shows the paste composition, firing temperature (baking maximum temperature), fill factor FF, conversion efficiency η, and determination result for each sample Nos. 21 to 24.

 尚、判定結果は、変換効率ηが16.35%以上の試料を○(合格)、変換効率が16.35%未満の試料を×(不合格)とした。 In addition, the determination result made the sample whose conversion efficiency (eta) 16.35% or more (circle) (pass) and the sample whose conversion efficiency is less than 16.35% made x (fail).

Figure JPOXMLDOC01-appb-T000003
Figure JPOXMLDOC01-appb-T000003

 試料番号23は、軟化点Tsが567℃のガラスフリットEしか導電性ペースト中に含まれていないため、変換効率ηが13.90~15.89%といずれも低く、しかも焼成温度によって変換効率ηにバラツキが生じることが分かった。 Sample No. 23 contains only glass frit E having a softening point Ts of 567 ° C. in the conductive paste, so the conversion efficiency η is low at 13.90 to 15.89%, and the conversion efficiency depends on the firing temperature. It was found that η varies.

 また、試料番号24は、導電性ペースト中には軟化点Tsが659℃のガラスフリットHしか含まれていないため、焼成温度が810℃の場合は16.66%と良好な変換効率ηを得られたが、その他の焼成温度では変換効率ηが13.28~15.96%と低くなった。すなわち、最適な焼成温度では良好な変換効率ηを得ることができるものの、焼成温度によって変換効率ηにバラツキが生じることが分かった。 In Sample No. 24, since the conductive paste contains only glass frit H having a softening point Ts of 659 ° C., a favorable conversion efficiency η of 16.66% is obtained when the firing temperature is 810 ° C. However, at other firing temperatures, the conversion efficiency η was as low as 13.28 to 15.96%. That is, it was found that although the conversion efficiency η can be obtained at the optimum firing temperature, the conversion efficiency η varies depending on the firing temperature.

 このように1種類のガラスフリットしか含まない場合は、変換効率ηは焼成温度によるバラツキが大きく、幅広い焼成温度域で所望の高い変換効率ηを安定的に得ることができないことが分かった。 Thus, it was found that when only one kind of glass frit is contained, the conversion efficiency η varies greatly depending on the firing temperature, and the desired high conversion efficiency η cannot be stably obtained in a wide firing temperature range.

 これに対し試料番号21は、軟化点差ΔTsが73℃のガラスフリットE、Hを使用し、B/SiOがいずれも0.4以下であり、しかも2種類のガラスフリットの配合比率も1/1であるので、最高焼成温度が780~810℃の広い温度範囲で16.47~16.66%の高い変換効率ηを有する太陽電池が得られることが分かった。 On the other hand, Sample No. 21 uses glass frits E and H having a softening point difference ΔTs of 73 ° C., B 2 O 3 / SiO 2 are both 0.4 or less, and the blending ratio of the two types of glass frits Therefore, it was found that a solar cell having a high conversion efficiency η of 16.47 to 16.66% over a wide temperature range of 780 to 810 ° C. was obtained.

 また、試料番号22は、軟化点差ΔTsが43℃のガラスフリットF、Hを使用し、B/SiOがいずれも0.4以下であり、また2種類のガラスフリットの配合比率も1/1であるが、第1のガラスフリットの軟化点が597℃であり、570℃を超えているため、焼成温度が780℃に低下すると変換効率ηが13.90%に低下した。すなわち、第1のガラスフリットの軟化点が過度に高い場合、高変換効率を得るための焼成温度領域は、試料番号23及び24に比べると広いが、試料番号21と比較すると若干狭くなることが分かった。 Sample No. 22 uses glass frits F and H having a softening point difference ΔTs of 43 ° C., B 2 O 3 / SiO 2 are both 0.4 or less, and the mixing ratio of the two types of glass frits is Although the softening point of the first glass frit was 597 ° C. and exceeded 570 ° C., the conversion efficiency η was reduced to 13.90% when the firing temperature was lowered to 780 ° C. That is, when the softening point of the first glass frit is excessively high, the firing temperature region for obtaining high conversion efficiency is wider than that of sample numbers 23 and 24, but is slightly narrower than that of sample number 21. I understood.

 実施例1で作製したガラスフリットA及びJを使用し、表4に示すようなペースト組成となるように、実施例1と同様の方法・手順で試料番号31~39の導電性ペースト及び太陽電池セルを作製した。 Using the glass frits A and J produced in Example 1, the conductive paste and solar cells of sample numbers 31 to 39 were prepared by the same method and procedure as in Example 1 so that the paste composition shown in Table 4 was obtained. A cell was produced.

 そして、各試料について、実施例1と同様の方法・手順で曲線因子FF及び変換効率ηを測定した。 For each sample, the fill factor FF and the conversion efficiency η were measured by the same method and procedure as in Example 1.

 表4は、試料番号31~39の各試料におけるペースト組成、ガラスフリットAとガラスフリットJの重量比率x/y(以下、「A/J」と記す。)、曲線因子FF、及び変換効率ηを示している。 Table 4 shows the paste composition, the weight ratio x / y (hereinafter referred to as “A / J”) of the glass frit A and the glass frit J, the fill factor FF, and the conversion efficiency η in each of the samples 31 to 39. Is shown.

Figure JPOXMLDOC01-appb-T000004
Figure JPOXMLDOC01-appb-T000004

 試料番号38は、A/Jが9.00と大きく、軟化点の低いガラスフリットAの含有量が過剰であるため、変換効率ηが15.85%に低下した。これは軟化点の低いガラスフリットAが過剰に含まれているため、焼成時に受光面電極となるべき導電膜と半導体基板との界面でガラス成分の過剰な流動が生じ、該ガラス成分が半導体基板を過剰に浸食してしまい、しかも溶融ガラスを介してAgが半導体基板に過度に拡散し、並列抵抗の低下を招いて開放電圧Vocが低下し、その結果高い変換効率ηを得ることができなくなるためと考えられる。 Sample No. 38 had a large A / J of 9.00 and an excessive content of glass frit A having a low softening point, so the conversion efficiency η was reduced to 15.85%. This is because glass frit A having a low softening point is excessively contained, so that an excessive flow of the glass component occurs at the interface between the conductive film to be the light-receiving surface electrode and the semiconductor substrate during firing, and the glass component becomes a semiconductor substrate. In addition, Ag is excessively diffused into the semiconductor substrate through the molten glass, leading to a reduction in parallel resistance and a reduction in the open-circuit voltage Voc. As a result, a high conversion efficiency η cannot be obtained. This is probably because of this.

 一方、試料番号39は、A/Jが0.11と小さく、軟化点の高いガラスフリットJの含有量が過剰であるため、変換効率ηが16.15%に低下した。これは軟化点の高いガラスフリットJが過剰に含まれているため、受光面電極となるべき導電膜と半導体基板との界面でのガラス成分の過剰な流動は生じないものの、ガラス成分が受光面電極の表面に浮きやすくなり、接着強度の低下を招き、結果的に変換効率が低下するためと思われる。 On the other hand, in Sample No. 39, A / J was as small as 0.11, and the content of glass frit J having a high softening point was excessive, so the conversion efficiency η decreased to 16.15%. This is because glass frit J having a high softening point is excessively contained, so that an excessive flow of the glass component does not occur at the interface between the conductive film to be the light receiving surface electrode and the semiconductor substrate, but the glass component is the light receiving surface. It seems that it tends to float on the surface of the electrode, leading to a decrease in adhesive strength, resulting in a decrease in conversion efficiency.

 これに対し試料番号31~37は、A/Jが0.25~4.0(1/4~4/1)と本発明範囲内であるので、変換効率ηが16.36~16.71%と高い太陽電池が得られた。 In contrast, Sample Nos. 31 to 37 have an A / J of 0.25 to 4.0 (1/4 to 4/1), which is within the range of the present invention. % High solar cell was obtained.

 非鉛系導電性ペーストを使用しても、幅広い焼成温度領域で所望の高い変換効率を有する太陽電池を安定的に得ることができる。 Even when a lead-free conductive paste is used, a solar cell having a desired high conversion efficiency can be stably obtained in a wide firing temperature range.

 1  半導体基板
 2  反射防止膜
 3  受光面電極(電極)
DESCRIPTION OF SYMBOLS 1 Semiconductor substrate 2 Antireflection film 3 Light-receiving surface electrode (electrode)

Claims (8)

 太陽電池の電極を形成するための導電性ペーストであって、
 導電性粉末と、第1のガラスフリットと、該第1のガラスフリットに比べて軟化点が20℃以上高い第2のガラスフリットと、有機ビヒクルとを含有し、
 前記第1及び第2のガラスフリットは、Pbを含有せず、少なくともB及びSiを含有すると共に、Siに対するBのモル比率が、SiO及びBにそれぞれ換算して0.4以下であり、
 前記第1のガラスフリットと前記第2のガラスフリットとの含有比率は、重量比で1/4~4/1であることを特徴とする導電性ペースト。
A conductive paste for forming a solar cell electrode,
Containing a conductive powder, a first glass frit, a second glass frit having a softening point higher by 20 ° C. or more than the first glass frit, and an organic vehicle;
The first and second glass frits do not contain Pb, contain at least B and Si, and the molar ratio of B to Si is 0.4 or less in terms of SiO 2 and B 2 O 3 , respectively. And
A conductive paste characterized in that the content ratio of the first glass frit and the second glass frit is 1/4 to 4/1 by weight.
 前記第1のガラスフリットは、軟化点が510~570℃であり、前記第2のガラスフリットは、軟化点が530~680℃であることを特徴とする請求項1記載の導電性ペースト。 The conductive paste according to claim 1, wherein the first glass frit has a softening point of 510 to 570 ° C, and the second glass frit has a softening point of 530 to 680 ° C.  前記第1のガラスフリットは、Biが20~40モル%、BaOが5~20モル%、及びAlが5モル%以下の範囲でそれぞれ含有されていることを特徴とする請求項1又は請求項2記載の導電性ペースト。 The first glass frit contains 20 to 40 mol% Bi 2 O 3 , 5 to 20 mol% BaO, and 5 mol% or less Al 2 O 3 , respectively. The conductive paste according to claim 1 or 2.  前記第2のガラスフリットは、Biが5~30モル%、BaOが5~25モル%、及びAlが5モル%以下の範囲でそれぞれ含有されていることを特徴とする請求項1乃至請求項3のいずれかに記載の導電性ペースト。 The second glass frit contains 5 to 30 mol% of Bi 2 O 3 , 5 to 25 mol% of BaO, and 5 mol% or less of Al 2 O 3 , respectively. The electrically conductive paste in any one of Claim 1 thru | or 3.  前記第1及び第2のガラスフリットは、Bi及びBaのうちの少なくともいずれか一方を含有していることを特徴とする請求項1又は請求項2記載の導電性ペースト。 3. The conductive paste according to claim 1, wherein the first and second glass frits contain at least one of Bi and Ba.  ZnOを含有していることを特徴とする請求項1乃至請求項5のいずれかに記載の導電性ペースト。 The conductive paste according to any one of claims 1 to 5, wherein the conductive paste contains ZnO.  前記導電性粉末は、Ag粉末であることを特徴とする請求項1乃至請求項6のいずれかに記載の導電性ペースト。 The conductive paste according to claim 1, wherein the conductive powder is an Ag powder.  半導体基板の一方の主面に反射防止膜及び該記反射防止膜を貫通する電極が形成され、
 前記電極が、請求項1乃至請求項7のいずれかに記載の導電性ペーストが焼結されてなることを特徴とする太陽電池。
An antireflection film and an electrode penetrating the antireflection film are formed on one main surface of the semiconductor substrate,
A solar cell, wherein the electrode is formed by sintering the conductive paste according to any one of claims 1 to 7.
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