WO2014128161A3 - Vorrichtung und verfahren zur berührungslosen detektion eines nicht infrarotaktiven zielgases - Google Patents
Vorrichtung und verfahren zur berührungslosen detektion eines nicht infrarotaktiven zielgases Download PDFInfo
- Publication number
- WO2014128161A3 WO2014128161A3 PCT/EP2014/053232 EP2014053232W WO2014128161A3 WO 2014128161 A3 WO2014128161 A3 WO 2014128161A3 EP 2014053232 W EP2014053232 W EP 2014053232W WO 2014128161 A3 WO2014128161 A3 WO 2014128161A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- excitation laser
- gas
- target location
- infrared
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/171—Systems in which incident light is modified in accordance with the properties of the material investigated with calorimetric detection, e.g. with thermal lens detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/171—Systems in which incident light is modified in accordance with the properties of the material investigated with calorimetric detection, e.g. with thermal lens detection
- G01N2021/1714—Photothermal radiometry with measurement of emission
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
- G01N2021/3513—Open path with an instrumental source
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Die Erfindung betrifft eine Vorrichtung und ein Verfahren zur Ferndetektion eines nicht infrarotaktiven Zielgases an einem Zielort, an dem sich das Zielgas befinden kann, mit einem Anregungslaser 4 zur Emission eines auf wenigstens zwei Zielorte Oi, Oi+1 lenkbaren Anregungslaserstrahls 5, mit einem Detektor 6 zum Nachweis einer von dem jeweiligen Zielort Oi, Oi+1 ausgehenden Strahlung 16 und mit einer Steuereinrichtung zum Steuern des Anregungslasers 4 und mit einer Auswerteeinrichtung zum Auswerten von Ausgangssignalen des Detektors 6 in Abhängigkeit von dem jeweiligen Zielort Oi, Oi+1 und in Korrelation mit dem von dem Anregungslaser 4 emittierten Anregungslaserstrahl 5. Ein zuverlässiger und sicherer Nachweis des Zielgases 1 wird dadurch erreicht, dass der Anregungslaser 4 zur Emission eines infraroten Anregungslaserstrahls 5 ausgebildet ist, dessen Wellenlänge auf die Wellenlänge einer im infraroten Bereich liegenden Absorptionslinie eines infrarotaktiven Hintergrundgases 3 abstimmbar ist, welches sich in der Umgebung des jeweiligen Zielortes Oi, Oi+1 befindet, dass mit dem Detektor 6 eine aufgrund der Anregung des Hintergrundgases 3 beeinflussbare Strahlung messbar ist, und dass mit der Auswerteeinrichtung mittels der Ausgangssignale des Detektors 6 Werte darstellbar sind, die in Korrelation mit der Konzentration des Hintergrundgases an dem jeweiligen Zielort Oi, Oi+1 stehen und aus welchen Eigenschaften eines vorhandenen Zielgases 1 an dem jeweiligen Zielort Oi, Oi+1 ermittelbar sind.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102013101610.3A DE102013101610B4 (de) | 2013-02-19 | 2013-02-19 | Vorrichtung und Verfahren zur Ferndetektion eines nicht infrarotaktiven Zielgases |
| DE102013101610.3 | 2013-02-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2014128161A2 WO2014128161A2 (de) | 2014-08-28 |
| WO2014128161A3 true WO2014128161A3 (de) | 2014-11-13 |
Family
ID=50289631
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/EP2014/053232 Ceased WO2014128161A2 (de) | 2013-02-19 | 2014-02-19 | Vorrichtung und verfahren zur berührungslosen detektion eines nicht infrarotaktiven zielgases |
Country Status (2)
| Country | Link |
|---|---|
| DE (1) | DE102013101610B4 (de) |
| WO (1) | WO2014128161A2 (de) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107884363B (zh) * | 2017-10-17 | 2023-10-24 | 中国矿业大学(北京) | 一种基于机器视觉技术的激光矿井气体遥测方法 |
| CN107870159B (zh) * | 2017-11-01 | 2023-09-19 | 中国矿业大学(北京) | 用于可调谐半导体激光吸收光谱的气体浓度二维重建方法 |
| JP7100988B2 (ja) * | 2018-02-05 | 2022-07-14 | 東京瓦斯株式会社 | ガス検知システムおよびガス検知方法 |
| PL3816609T3 (pl) * | 2019-11-04 | 2022-04-11 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Urządzenie i sposób do zdalnego wykrywania gazu docelowego |
| CN110836866A (zh) * | 2019-11-05 | 2020-02-25 | 度亘激光技术(苏州)有限公司 | 光谱分析系统及光谱分析设备 |
| CN111089848B (zh) * | 2019-12-31 | 2022-08-19 | 哈尔滨工业大学 | 三维激光气体扫描仪 |
| CN112611726A (zh) * | 2020-12-23 | 2021-04-06 | 陈政 | 一种分子特征吸收光谱测量装置及方法 |
| DE102022109027B4 (de) | 2022-04-13 | 2023-12-21 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren zum Kartieren der Oberfläche eines Makromoleküls |
| CN117491314A (zh) * | 2023-12-27 | 2024-02-02 | 金卡智能集团(杭州)有限公司 | 可燃气体探测装置及探测方法 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63309831A (ja) * | 1987-06-11 | 1988-12-16 | Mitsubishi Electric Corp | 蒸気もれ検出装置 |
| JPH01301138A (ja) * | 1988-05-30 | 1989-12-05 | Ishikawajima Harima Heavy Ind Co Ltd | ガス漏洩検出方法及び装置 |
| WO2002027297A1 (en) * | 2000-09-28 | 2002-04-04 | Sandia Corporation | Pulsed laser linescanner for a backscatter absorption gas imaging system |
| US20020166969A1 (en) * | 2001-03-14 | 2002-11-14 | Mau-Song Chou | Remote trace gas detection and analysis |
| US20060203248A1 (en) * | 2005-03-11 | 2006-09-14 | Reichardt Thomas A | Natural gas leak mapper |
| US20100064777A1 (en) * | 2006-12-07 | 2010-03-18 | Cascade Technologies Limited | Leak detection system and method |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2966702D1 (en) * | 1978-06-26 | 1984-03-29 | Measurex Corp | Method and apparatus for measuring gas, including standardisation |
| US5473162A (en) * | 1987-10-26 | 1995-12-05 | Baylor University | Infrared emission detection of a gas |
| CA1332204C (en) * | 1987-10-26 | 1994-10-04 | Kenneth W. Busch | Infrared emission detection |
| IL140055A0 (en) * | 1998-06-12 | 2002-02-10 | On Line Techn Inc | Method and apparatus for determining processing chamber cleaning or wafer etching endpoint |
| US6374831B1 (en) * | 1999-02-04 | 2002-04-23 | Applied Materials, Inc. | Accelerated plasma clean |
| US20020152797A1 (en) * | 2001-01-09 | 2002-10-24 | Mcandrew James J.F. | Gas delivery apparatus and method for monitoring a gas phase species therein |
| JP4385086B2 (ja) * | 2003-03-14 | 2009-12-16 | パナソニック株式会社 | Cvd装置のクリーニング装置およびcvd装置のクリーニング方法 |
| JP4749890B2 (ja) * | 2006-02-27 | 2011-08-17 | 株式会社四国総合研究所 | ラマン散乱光による水素ガス可視化方法及びシステム |
| DE102006060302B3 (de) * | 2006-12-14 | 2008-06-19 | Abb Ag | Anordnung sowie ein Verfahren zur Steuerung von Trocknungsprozessen für die Herstellung von Halbleiterbauelementen |
| DE102007056345B3 (de) * | 2007-11-22 | 2009-01-02 | Abb Ag | Verfahren zum Betrieb eines FTIR-Spektrometers, sowie FTIR-Spektrometer selbst |
| WO2009137768A2 (en) * | 2008-05-09 | 2009-11-12 | University Of Florida Research Foundation, Inc. | Oxygen and carbon dioxide sensing |
| US20100230593A1 (en) * | 2009-03-16 | 2010-09-16 | Southwest Research Institute | Compact handheld non-laser detector for greenhouse gasses |
-
2013
- 2013-02-19 DE DE102013101610.3A patent/DE102013101610B4/de not_active Expired - Fee Related
-
2014
- 2014-02-19 WO PCT/EP2014/053232 patent/WO2014128161A2/de not_active Ceased
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63309831A (ja) * | 1987-06-11 | 1988-12-16 | Mitsubishi Electric Corp | 蒸気もれ検出装置 |
| JPH01301138A (ja) * | 1988-05-30 | 1989-12-05 | Ishikawajima Harima Heavy Ind Co Ltd | ガス漏洩検出方法及び装置 |
| WO2002027297A1 (en) * | 2000-09-28 | 2002-04-04 | Sandia Corporation | Pulsed laser linescanner for a backscatter absorption gas imaging system |
| US20020166969A1 (en) * | 2001-03-14 | 2002-11-14 | Mau-Song Chou | Remote trace gas detection and analysis |
| US20060203248A1 (en) * | 2005-03-11 | 2006-09-14 | Reichardt Thomas A | Natural gas leak mapper |
| US20100064777A1 (en) * | 2006-12-07 | 2010-03-18 | Cascade Technologies Limited | Leak detection system and method |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2014128161A2 (de) | 2014-08-28 |
| DE102013101610A1 (de) | 2014-08-21 |
| DE102013101610B4 (de) | 2015-10-01 |
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