WO2017207751A1 - Dispositif de détermination de l'état de polarisation par mesure d'au moins trois paramètres de stokes - Google Patents

Dispositif de détermination de l'état de polarisation par mesure d'au moins trois paramètres de stokes Download PDF

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Publication number
WO2017207751A1
WO2017207751A1 PCT/EP2017/063437 EP2017063437W WO2017207751A1 WO 2017207751 A1 WO2017207751 A1 WO 2017207751A1 EP 2017063437 W EP2017063437 W EP 2017063437W WO 2017207751 A1 WO2017207751 A1 WO 2017207751A1
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WIPO (PCT)
Prior art keywords
optical element
delay
optical
beams
polarization
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Ceased
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PCT/EP2017/063437
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German (de)
English (en)
Inventor
Christian NEGARA
Matthias Hartrumpf
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Fraunhofer Gesellschaft zur Foerderung der Angewandten Forschung eV
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Fraunhofer Gesellschaft zur Foerderung der Angewandten Forschung eV
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Anticipated expiration legal-status Critical
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G01J4/04—Polarimeters using electric detection means

Definitions

  • the invention relates to a device for determining the polarization state by measuring at least three Stokes parameters with optical elements which function either as a beam splitter or as a polarizing optical element, and at least three detectors for measuring the polarization.
  • Polarization state detectors detect the polarization of the incident radiation.
  • the 4 elements of the incident radiation With a 6-channel sensor, the 4 elements of the incident radiation.
  • Stokes vector are determined simultaneously - according to the definition of the Stokes vector.
  • DOAP Division-of-amplitude Photopolarimeter
  • a split-state polarization state detector which operates on 4 channels and at any one time monitors the state of polarization and the current state of polarization.
  • kes vector of incident radiation This detector requires a very specific beam splitter, which must be custom-made for this detector. In practice, the requirements for this device can be met only in a narrowly defined wavelength range, so that the detector can be used only in this wavelength range.
  • the optical parameters of this beam splitter are R, ⁇ ⁇ , ⁇ ⁇ for the reflected path and T, ⁇ ⁇ t for the transmitted path.
  • R is the reflectance in the reflected path of the beam splitter
  • tan ⁇ ⁇ the amplitude quotient and ⁇ ⁇ the phase difference, the reflection induced amplitude change or phase change of the s- and p-polarized radiation.
  • T transmittance, tan ⁇ ,.
  • a Wollaston prism was mounted after the beam splitter on the reflected and transmitted path, which is rotated by 45 ° relative to the plane of incidence of the beam splitter. The incident beam is thus split into four sub-beams whose intensity is measured by four photodetectors.
  • the instrument matrix AEE 4x4 is the mapping matrix of the Stokes vector to the measured intensity values.
  • the optical parameters of the beam splitter that maximize the objective function are:
  • each component can be optimized for a large wavelength range in addition to its basic function.
  • a device for determining the state of polarization by measuring at least three Stokes parameters contains the following components: ⁇ two optical elements (1, 2) which split incident light beams into two sub-beams, the polarization of the respective two sub-beams from the polarization of the incident light rays and the optical properties of the optical elements (1, 2),
  • the first optical element (1) divides the light beams incident on the detector into a transmitted and a reflected partial beam.
  • the second optical element (2) is arranged in the reflected or transmitted partial beam and in the other partial beam an optical element (3) is arranged which changes the polarization state of the light beam impinging on the optical element (3) or divides it into two partial beams,
  • the beam splitters (1), (2) or (3) may have a fixed or adjustable divider ratio.
  • steel dividers with a fixed divider ratio can be designed as a foil, beam splitter plate, beam splitter cube or as a diffractive beam splitter.
  • these embodiments are equivalent.
  • variable divisor beam splitters may be formed as components with locally variable divider ratio (rotatable or displaceable) or as electronically adjustable or modulatable components (e.g., liquid crystal or Kerr cells).
  • the delay in the individual sub-paths can be performed either by a delay element alone or in effect equivalent as a combination of a plurality of delay elements.
  • the delay elements may also be designed variably adjustable.
  • delay elements with fixed delay can be used by elements with a birefringent layer of fixed thickness.
  • elements with broadband constant delay eg Fresnel parallelepiped
  • Optimal are delay elements which have an optimum delay for each wavelength for this application, ie the difference between the total delay in the corresponding partial beam path close to a value.
  • the delay adjustable delay elements are photoelastic modulators or rotary compensators. Depending on the wavelength, the optimal delays and / or
  • beam splitters and delay elements on one or more sides can be tempered with an anti-reflection layer.
  • an anti-reflection layer With the specified means disturbing reflections are avoided in order to increase the incident on the detectors light intensity and thus the sensitivity or to reduce the measurement uncertainty.
  • the measuring device is preceded by a diffractive optics or, alternatively, several diffractive optics are arranged in the partial beam paths.
  • a diffractive optics or, alternatively, several diffractive optics are arranged in the partial beam paths.
  • the detector is preceded by an imaging optics or multiple imaging optics arranged in the partial beam paths. This allows a defined area of a sample to be examined.
  • the detectors may be designed as:
  • Single point sensor e.g., photodiode or photomultiplier
  • As line sensor (such as photodiode array, CCD or CMOS line sensor)
  • a surface sensor according to claim 13 with an upstream diffractive element according to claim 11 and additionally connected in front of the imaging optical system according to claim 12 is such a Polarisa- tion state detector, which simultaneously analyzes an entire line of the object in a whole spectral range in each measurement interval.
  • line or area light sources may be arranged in partial beam paths (one or more). Depending on the task, it may be possible to arrange it with a parallel and / or angular offset in the partial beam path in such a way that the receiver beam path is essentially not disturbed and yet effective illumination of the measured objects takes place; ie altogether a negligible or compensable error arises. Otherwise, these light sources can be coupled via the beam splitter to the optical axis of the partial beam path. Depending on the embodiment of the invention, an arrangement in one (or more), otherwise unused partial beam path is possible. As a result, the device according to the invention becomes a combined polarization state detector and polarization state generator.
  • the first optical element (1) has a divider ratio which corresponds to neither a polarizing nor a non-polarizing divider ratio. This means that the first optical element is neither polarizing nor non-polarizing.
  • the four-channel Stokes vector can be measured without loss of intensity. In this way, a lower measurement uncertainty is achieved, wherein In addition, a better structure results. If the first optical element (1) is polarizing ( ⁇ ⁇ , ⁇ ; - ⁇ ⁇ 0 °, 90 ° ⁇ ), then the Stokes vector can not be measured. On the other hand, the first optical element (1) is non-polarizing
  • the four-channel Stokes vector can only be measured if intensity losses (through polarizing filters or the like) are accepted. This causes a higher measurement uncertainty and results in a sub-optimal design.
  • the intensity of the light rays incident in the apparatus for determining the state of polarization is distributed to the at least three detectors for measuring the polarization, preferably to four detectors for measuring the polarization.
  • the at least three detectors for measuring the polarization preferably to four detectors for measuring the polarization.
  • a further preferred embodiment is characterized in that at least one delay element is arranged between the first optical element and the second optical element and / or between the first optical element and the third optical element.
  • the first optical element (1) has a delay A r , A t which does not correspond to the optimum from equation 1.
  • the rotational angle of the optical (delay) can be dependent on elements ⁇ ⁇ A t is set so that the measuring uncertainty is minimized.
  • the disadvantageous effect of the deviations from ⁇ ⁇ , A t of the beam splitter (1) from the ideal for any ⁇ ⁇ A t can be compensated. If the optical elements or beam splitters are all arranged below 0 ° / 90 °, then delay elements must be arranged on both paths - usually at an angle * 0 °. As a rule, a total of at least 3 quarter-wave plates are required.
  • the second and third optical elements are arranged at 45 ° / 135 °, delay elements must be arranged on a path for this purpose-usually at an angle of 0 °. As a rule, at least 2 quarter-wave plates are required.
  • rotating the second polarizing optical element (2) or of the third polarizing optical element (3) is a function of ⁇ ⁇ A t to be selected angle, however, only a quarter-wave plate is necessary.
  • the value of the normalized determinant of the instrument matrix is greater than 0.8, preferably greater than 0.8 and less than 1.0.
  • the invention also relates to a method for determining the polarization state by measuring at least 3 Stokes parameters, in which
  • the incident light beams are split into two sub-beams, whereby the polarization of the respective two sub-beams results from the polarization of the incident light beams and the optical properties of the optical elements (1, 2),
  • the light beams incident on the detector are divided into a transmitted and a reflected partial beam
  • the second optical element (2) is arranged in the reflected or transmitted partial beam and in the other partial beam an optical element (3) is arranged which changes the polarization state of the light beam impinging on the optical element (3) or divides it into two partial beams,
  • At least three detectors (2a, 2b, 3a) are used for measuring the polarization, the detectors (2a, 2b) in the sub-beams behind the optical element (2) and the detector (3a) in the sub-beam behind the optical element (3 ) to be ordered.
  • the device described above is used.
  • Fig. 1 shows an embodiment of the invention for measuring three Stokes parameters
  • Fig. 2 shows an embodiment of the invention for measuring four Stokes parameters
  • FIG 3 shows a schematic representation of the definition of the angles of rotation in the case of the optical elements (2) and (3) using the example of the element (2) on the basis of planes (e :) and (e 2 ) 4 shows by way of a schematic representation the definition of the angles of rotation for the delay elements (t 1) and ( 2 ) or (v la , v lb , v 2a , v 2b ) on the basis of the angle between a vector parallel to the plane of incidence e : and the fast axis for delay elements with birefringent materials
  • the device for determining the polarization state consists of the following components:
  • a beam splitter (1) with special polarization properties This is designed so that the polarization state is divided on the transmitted and reflected partial path so that by means of subsequent device for determining the polarization state, a high sensitivity or a low measurement uncertainty regarding. In the task desired model parameter is achieved. In a configuration according to the invention it is in contrast to the prior art
  • Delay elements (Vi), ( 2 ) are introduced on the transmitted and reflected path.
  • the delay elements serve to change a delay ⁇ ⁇ , t caused by the beam splitter on the transmitted and reflected path in such a way that the sensitivity of the entire measuring device is increased or the measurement uncertainty of the device is reduced.
  • This can be evaluated analogously to the prior art on the basis of the absolute value of the determinant of the instrument matrix.
  • the instrument matrix assumes a different shape than in the prior art, but this can be established analogously to the Stokes-Muller formalism.
  • the freely selectable configuration parameters of the measuring device are optimal in this case, if the
  • two ⁇ / 4 delay elements (v la ), (v lb ) or ( 2a ), (v 2b ) can be used to compensate for these deviations, for example the reflected or transmitted path are arranged. In order to avoid intensity losses, these are preferably provided with antireflection coatings.
  • the polarization state measuring device thus constructed has the same sensitivity in measuring the Stokes vector as one after the other
  • beam splitters are mounted behind the delay elements, which divide the polarization state in the respective partial beam path into two further partial beam paths with orthogonal polarization states.
  • these elements are designed as polarizing beam splitters (2) and (3), which are rotated by an angle a 2 and a 3 , respectively.
  • Photodetectors The measurement of the intensities is carried out via preferably four detectors. In the illustrated embodiment, these are photomultipliers, which are very well suited for fast polarization measurements.
  • the Stokes vector is then calculated from the intensity measurement values, the optical components being arranged or selected such that a measurement error in the intensity measurements influences the result of the calculated pose vector as little as possible.
  • angles a 2 , a 3 of the beam splitters (2) and (3) can assume any desired value (see FIG.
  • the minimum configuration for the measuring device according to the preceding examples consists of a total delay element, for example, on the reflected path and of rotated beam splitters (2) and (3).
  • a measuring device with a good sensitivity can be realized in some cases without delay elements. If the values A r , A t deviate from the ideal, it is in some cases better to position the beam splitters (2) and (3) at an angle other than 45 °. However, the measuring device is then generally no longer optimal. As a rule, the negative effect of deviations from ⁇ ⁇ , t from the ideal can no longer be completely compensated.
  • the incident light is completely polarized, the measurement of all four Stokes parameters is not necessary, since one parameter is then redundant. It Therefore, under this condition, only three measurements or detectors are necessary to detect the complete polarization state (see FIG. According to claim 1, therefore, three detectors can be arranged in the measuring device.
  • the Jones vector can then be determined with a three-channel measuring device (normalized with respect to the phase). In general, however, you get two solutions for the Jones vector. A solution can either be rejected as unphysical or both solutions must be considered in the subsequent analysis.
  • the optical element (3) can be designed, for example, as a beam splitter or polarization filter which is positioned at a rotation angle a 3 .
  • the optimal rotation angles a 2 , a 3 and the optimal optical parameters of the beam splitter (1) can be determined by non-linear optimization or analytical solution as in the previous example.
  • polarization optics it is not only possible to measure the Stokes vector but also to generate different polarization states. Instead of the photodetectors, light sources are arranged for this purpose.
  • the polarization optics can thus be used not only for a polarization state detector but also for a polarization state generator.
  • A be the instrument matrix that maps the Stokes vector to the 4 measured intensities.
  • W is also invertible. It should be noted that the functionality of the detector is not only given in unpolarized, but also in polarized light sources. If, for example, linearly polarized light sources are arranged so that the polarization planes corresponding to the rotation angles of Beam splitters (2,3) are aligned, we obtain a detector with minimal loss of light intensity.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

L'invention concerne un dispositif de détermination de l'état de polarisation par mesure d'au moins trois paramètres de Stokes au moyen d'éléments optiques qui font fonction de séparateur de faisceau ou d'élément optique polarisant, ainsi que d'au moins trois détecteurs servant à mesurer la polarisation.
PCT/EP2017/063437 2016-06-02 2017-06-02 Dispositif de détermination de l'état de polarisation par mesure d'au moins trois paramètres de stokes Ceased WO2017207751A1 (fr)

Applications Claiming Priority (2)

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DE102016209706.7 2016-06-02
DE102016209706.7A DE102016209706A1 (de) 2016-06-02 2016-06-02 Vorrichtung zur Bestimmung des Polarisationszustands durch Messung von mindestens drei Stokes-Parametern

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110243477A (zh) * 2019-07-12 2019-09-17 重庆大学 一种实时全光谱脉冲激光偏振分析仪
CN112525493A (zh) * 2020-11-13 2021-03-19 华中科技大学 一种铁电液晶延迟器光学特性检测方法及装置
CN121163665A (zh) * 2025-11-19 2025-12-19 上海卫星互联网研究院有限公司 一种偏振光检测装置及激光通信终端设备

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US6043887A (en) * 1998-11-27 2000-03-28 Allard; Louis B. Polarimeter
DE10320658A1 (de) * 2002-05-10 2003-12-18 Canon Kk Polarisationszustandserfassungssystem, Lichtquelle und Belichtungsgerät
WO2005122875A1 (fr) * 2004-06-15 2005-12-29 Universidad De Murcia Dispositif et procede de mesure de diffusion (scattering) dans des systemes optiques

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AU6381500A (en) * 1999-07-27 2001-02-13 Colorado School Of Mines Parallel detecting, spectroscopic ellipsometers/polarimeters
US7116419B1 (en) * 2002-11-15 2006-10-03 Purdue Research Foundation Wavelength-parallel polarization measurement systems and methods

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US6043887A (en) * 1998-11-27 2000-03-28 Allard; Louis B. Polarimeter
DE10320658A1 (de) * 2002-05-10 2003-12-18 Canon Kk Polarisationszustandserfassungssystem, Lichtquelle und Belichtungsgerät
WO2005122875A1 (fr) * 2004-06-15 2005-12-29 Universidad De Murcia Dispositif et procede de mesure de diffusion (scattering) dans des systemes optiques

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R. M. A. AZZAM.: "Division-of-amplitude Photopolarimeter (DOAP) for the Simultaneous Measurement of All Four Stokes Parameters of Light. Optica Acta", INTERNATIONAL JOURNAL OF OPTICS, vol. 29, no. 5, 1982, pages 685 - 689
WENJIA YUAN; WEIDONG SHEN; YUEGUANG ZHANG; XU LIU.: "Dielectric multilayer beam splitter with differential phase shift on transmission and reflection for division-of-amplitude photopolarimeter.", OPTICS EXPRESS, vol. 22, no. 9, 2014, pages 11011

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110243477A (zh) * 2019-07-12 2019-09-17 重庆大学 一种实时全光谱脉冲激光偏振分析仪
CN112525493A (zh) * 2020-11-13 2021-03-19 华中科技大学 一种铁电液晶延迟器光学特性检测方法及装置
CN112525493B (zh) * 2020-11-13 2022-06-17 华中科技大学 一种铁电液晶延迟器光学特性检测方法及装置
CN121163665A (zh) * 2025-11-19 2025-12-19 上海卫星互联网研究院有限公司 一种偏振光检测装置及激光通信终端设备

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