WO2018124861A2 - Spectromètre de masse à temps de vol et ses parties constitutives - Google Patents

Spectromètre de masse à temps de vol et ses parties constitutives Download PDF

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Publication number
WO2018124861A2
WO2018124861A2 PCT/KZ2017/000029 KZ2017000029W WO2018124861A2 WO 2018124861 A2 WO2018124861 A2 WO 2018124861A2 KZ 2017000029 W KZ2017000029 W KZ 2017000029W WO 2018124861 A2 WO2018124861 A2 WO 2018124861A2
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coss
ion
plane
tof
mirrors
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WO2018124861A3 (fr
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Алдан Асанович САПАРГАЛИЕВ
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers

Definitions

  • the present invention relates to high-speed, high-resolution TOF MS (TOF MS - time-of-flight mass spectrometer).
  • the invention can be used, for example, in medicine, in biology, in the gas and oil industry, in metallurgy, energy, geochemistry, hydrology, ecology, the food industry, for the control of doping and narcotic drugs.
  • stepped focusing consists of a preliminary low order than that of a CO mirror (CO — corpuscular-optical), time-of-flight focusing by the energy spread of ions in an ionic packet using one or more deflecting-correcting elements and the subsequent high order of focus using a CO mirror.
  • Deflecting-correcting elements are called deflecting elements, for example, cylindrical capacitors (in particular segments of coaxial cylinders).
  • A-TIF is the averaged trajectory of the ion flux.
  • Decatre-two-dimensional view or SOE - is made with the possibility of two-dimensionality in the Cartesian coordinate system.
  • R TOF MS (R-reflective, TOF MS - time-of-flight mass spectrometer) are known.
  • R TOF MS contains: (i) one or more CO units containing at least one CO (CO - particle-optical) mirror; (Ii) an ion-source system and a detection system, including, respectively, one or more sources and one or more detectors; (w) controller-computer system,
  • the main disadvantages of this work are: a special case is considered out of many possible combinations of a cylindrical capacitor and two-dimensional ion mirrors in the mass spectrometer circuit; many possible combinations of a cylindrical capacitor and ionic two-dimensional mirrors in a mass spectrometer circuit; not considered the possibilities of using other than a cylindrical capacitor, deflecting elements for turning the ion flow on the mirror; The possibilities of using other than two-dimensional ion mirrors for a high order of the time-of-flight focusing of the ion packet are not considered.
  • the main objective of the present invention are to increase the resolution of R TOF MS.
  • device variants cover all blocking levels and dimensions of MS.
  • TOF MS - time-of-flight mass spectrometer including:
  • the COSS of its analyzer channel includes one or more selected from types of two-reflection components of COSS nodes, including V5R species
  • CO CO-copuscular-optical
  • Z91 ⁇ -shaped reflection
  • the COSS of its analyzer channel includes one or more deflecting-correcting SOEs (SOEs - corpuscular-optical elements), made possible at least one of the features selected from the following: low order TOF-F IP (TOF- F IP - time-of-flight focusing of the ion packet by the energy dispersion of ions in the packet), to provide S / TOF-F IP (S / TOF-F IP - "step-by-time focusing of the ion packet by the energy dispersion of ions in the packet) in conjunction with a single-band or two-band CO mirror; the direction of the ion flow from one to another mirror; Compensation of vertical spatial dispersion ("spreading") of the ion flux;
  • SOEs - corpuscular-optical elements deflecting-correcting SOEs
  • an AI unit that includes at least a single-source (single-channel or multi-channel) or multi-source (multi-channel) energy-filtering SFFI (SFFI is an ion-flux source-shaper), including their type with a “compensated difference in the length of the ion paths "Made with the possibility of passing into the analyzer channel an ion stream with a given or adjustable region (selection of the energy width and position of this width) of the energy distribution of ions in the stream.
  • At least one of the analyzer channels includes one of the types of R COSS (R - reflective), selected from a number of:
  • tl R COSS 11 - linearly single-plane, including two system-elongated CO mirrors selected from the series: full-row system-elongated and sector-system elongated;
  • 3D 2V mR COSS (3D - 3-dimensional, mR-multi-reflective), made in one-projection-two-looped form (in abbreviated form - 3D 2VI mR COS) or multiprojection-two-looped form (in short - 3D m2Vr mR COS);
  • - its COSS is made selected from the series: axisymmetric, transaxial, Cartesian-two-dimensional, including their conical views, while all COSS are made with the possibility of choosing the effective reflection surface in the form of a Cartesian-two-dimensional surface or section of surfaces in the plane of the ion path (incidence and reflection ) second order, in particular sectors of the circle, hyperbola, parabola;
  • the deflecting-correcting element in its COSS S / TOF-F IP is made in the form of a cylindrical capacitor
  • COSS S / TOF-F IP is designed to ensure scanning in layers with local CO mirrors and alternating layers without mirrors, and also with one or more periodic sweeps along the ⁇ -plane, with the straight and reverse branches of the trajectory separated or undiluted;
  • - SFFI includes one or more non-magnetic SOE selected from the following: an electrical prism, including its electrostatic two-dimensional form; cylindrical energy filter; axially symmetric energy filter;
  • At least one SFFI is made with a drain pocket for removing part of the ion stream from its main analyzed part;
  • - its vacuum casing is made in a systematic form, and it creates a system vacuum chamber, which contains: a compartment for the analyzer unit and one or more compartments of the attached pumping system, each of which has an attached pumping subsystem containing a periodically closed multilayer P s magnet view , in particular, four groups of magnets located antisymmetrically.
  • At least one of the branches of the attached pumping system is located in the region adjacent to its ion source and / or to the reflecting region of the COS in the MS.
  • FIG. Figure 1-25 shows the symbolic currents of ion fluxes (the paths of the ion flux paths are shown by solid lines with an arrow) and EPO (EPO are the effective reflection surfaces) of the ion flux (ion packets) in R (R-reflective) COS (COS-corpuscular-optical system) .
  • thick intermittent (dashed) lines indicate the EPO of the ion flux
  • thin continuous lines and arrows on them, respectively symbolic indicate currents of ion fluxes and the direction of movement of the ion flux
  • FIG. Figures 1a-9 show separate RS2 ⁇ 82 double-reflectors) with local EPOs, which includes one pair of conjugated local R ⁇ ( ⁇ - corpuscular-optical) elements in which ion flows can be wide (wide-flow) or narrow (narrow-flow), made with given local (sector) effective reflection surfaces located in the areas of reflection vertices.
  • FIG. 1a-4 are shown in projection onto a ⁇ -plane (middle plane) aligned with the coordinate ⁇ -plane.
  • EPO EPO-effective reflection surfaces
  • FIG. Figures 3 and 4 show RS2 species, respectively, with local sector elliptical and spherical EPOs with spaced foci, as well as ion flows in them.
  • FIG. Figures 5 and 6 show RS2 views in projections onto a vertically longitudinal h-plane, respectively at V91 and Z5R, reflections.
  • Any of the RS2 shown in figures 1A-4 can be performed in one of the types of VSR and Z5R.
  • the local lateral corrective SOE D * ] h presented in projection onto the longitudinally-vertical ⁇ -plane, covering the averaged interelement mating branch of the trajectory, is made possible to at least correct the vertical direction and conjugation of the ion flux.
  • FIG. 7-9 presented in projection onto the ⁇ -plane (Fig. 7) and the vertical longitudinal L-plane (Figs. 8a, 8b, 8c, 9), as can be seen, the ions emanating with small heights of the regions 2S ', 2S " and 2S '"(individual sections) located in around the axis of symmetry (the Z axis in Figs. 7 and 9, or the ⁇ 'axis in Figs.
  • any of FIG. 8a, 8b, 8c, together with FIG. 7, displays the case when one of the reflectors is made with a straight axis: 0 ⁇ ⁇ ⁇ ; / 4;
  • FIG. 8a, 8b and 8c projected onto the ⁇ -plane, two types of ion flux formation are shown, with intermediate focusing (in FIG. 8a) and without intermediate focusing (in FIGS. 8b, 8c).
  • FIG. 8a the ions emanating from the two extreme elements (sections) 2S 'and 2S "' with a small height of the region pass through the focus F ⁇ . Note that under certain conditions, for example, when the vertically longitudinal--plane coincides with the mid-plane COSS, along this plane The ion flux can be wide.
  • RS2 can also serve as an example for multi-path, when two or more ion flow paths have beginnings and ends outside the COSS midplane.
  • FIG. 10-19 show OLR R COSS including two or more RS2 located in the vicinity of one plane.
  • FIG. 10 and 11 are presented including four local CO-mirrors 2V OLR COSS (2V - two-loop, OLR - single-layer reflective), respectively vertically-longitudinally Y-plane-two-loop and ⁇ -plane-two-loop four-reflection R COSS.
  • 2V OLR COSS 2V - two-loop, OLR - single-layer reflective
  • FIG. 12a-14 show ⁇ 1 R COSS (tl - linearly single-plane), including two system-elongated CO mirrors selected from the series: full-row system-elongated and sector-system elongated.
  • SOEs in tl R COSS can be made in line-elongated or single-elongated, which include sector-or full-row-elongated components without a common middle surface / plane (in particular multilayer) or with a common middle surface / plane.
  • multi-path multi-reflective tl R COSSs (they can be single-path) are presented, including two or more RS2 located linearly in the YZ plane, the EPO of which are selected from the series: flat; sectors of cylindrical parabolas; sectors of cylindrical circles.
  • FIG. 12a presents a multi-path tl mR COSS (mR is multi-reflective), the unified elongated EPO of which, in the projection onto the X-plane, are made in the form of straight lines.
  • tl mR COSS such as rules, the A-TIF is located on the same plane.
  • the mR COSSs presented also apply to tl mR COS, but A-TIF can be located in the same plane (with a common middle plane) or wiped out of the same plane (without a common middle surface). This is due to the fact that not all adjacent reflection of the ion flux is carried out by one reflector (linearly elongated), in particular, each adjacent reflection can carried out by a separate reflector.
  • the SOE in FIG. 12b are made full-length elongated, and in FIG. 12c are made sector-elongated.
  • FIG. 13 and 14 show multi-path two-reflection tl R COSS, including two elongated SOE reflectors, with two reflections of each ion path.
  • the line-elongated SOEs in FIG. 13 are made with a common median plane, and in FIG. 14 are made by a multilayer middle plane
  • FIG. Figures 15-19 show rl R COSS (rl - concentrated single-plane), made in a curvilinear-boundary form of the second order, or n-granular / sector, including two or more RS2, which are located around one center. Moreover, in FIG. 15-19, in projection onto the ⁇ -plane (in Fig. 15-
  • R COSS EPO which are selected from the series: flat; sectors of cylindrical parabolas; sectors of cylindrical circles.
  • FIG. Figures 15 and 16 show wide-flow rl R COSS, whose EPO in the projection onto the ⁇ -plane are made in the form of sectors, respectively, straight lines and parabolas. Moreover, in FIG. 15 shows the loopback rl mR COSS, in FIG. 16 shows a direct-bireflective multi-path rl R COSS (abbreviated as direct-reflective rl 2R COSS). Loop rl mR COS shown in FIG.
  • COSS shown dashed lines
  • FIG. 17 shows a loopback rl 2R COSS with round EPO.
  • FIG. 18 and 19 in the longitudinal-vertical ⁇ -plane are represented by rl R COSS shown, respectively, in FIG. 16 and 17.
  • Thick dotted lines show EPO.
  • Symbols N and m respectively indicate sources and detectors.
  • FIG. Figures 20-25 show 3D 2V mR COSS (3D - 3-dimensional, mR - multi-reflective), one-projection-two-loop view (abbreviated - 3D 2V £ mR COS) or multi-projection-two-loop view (abbreviated - 3D m2Vr mR COS), including two conjugate rl mR COSS (or two AND mR COSS), the ⁇ -planes of which are located in parallel.
  • 3D 2V mR COSS 3D - 3-dimensional, mR - multi-reflective
  • one-projection-two-loop view abbreviated - 3D 2V £ mR COS
  • multi-projection-two-loop view abbreviated - 3D m2Vr mR COS
  • 3D 2Vt mR COS 3D 2Vt mR COS
  • Fig. 21 covering the averaged inter-element parts of the trajectories, are made with the possibility of at least one of the features selected from the series: correcting the horizontal direction and the conjugation of the ion flux; corrective longitudinal vertical chromatic expansion of the ion flux; correcting the longitudinal-vertical direction of the ion flux.
  • 3D 2V mR COS can have one (on one of its lateral sides) or two (on its two lateral sides) lateral corrective SOEs.
  • (2 - two superimposed, opposite directions of two A-TIF paths with their harmonic development in projection onto the X-plane are also shown.
  • FIG. 22-25 in the projections on the ⁇ -plane (Figs. 22 and 23) and on the longitudinally vertical ⁇ -plane (Figs. 24 and 25) are multi-projection loop 3D mR COS (abbreviated as 3D mVr mR COS), made in two paired rl mR COSS.
  • 3D mR COS abbreviated as 3D mVr mR COS
  • FIG. 22 and 24 respectively, in the projection onto the ⁇ -plane and in the projection onto the Y-plane, a diagonal scan 3D mVr mR COSS is shown.
  • FIG. 23 and 25 respectively, in the projection onto the ⁇ -plane and in the projection onto the% - plane, a 3D mVr mR COSS 4-way scan is shown.
  • 3D mVr mR COSS of diagonal scanning was performed with the possibility of only diagonal scanning of the ion flux - each reflection of the ion flux on one translates it to another rl mR COSS; 3D mVr mR COS of 4-sided scanning is made possible - from one rl mR COSS to another, the ion flux is transferred after two reflections on each rl mR COSS.
  • FIG. 26-45 present some possibilities for implementing the proposed new S / TOF-F IP concept (S / TOF-F IP - “stepwise time-of-flight focusing” of an ion packet by the energy spread of ions in the packet).
  • S / TOF-F IP “stepwise time-of-flight focusing” of an ion packet by the energy spread of ions in the packet.
  • the paths of the ion flow paths are shown by solid lines with an arrow.
  • deflecting-correcting elements for example, in the form of cylindrical capacitors D cdj ,
  • R COSS S / TOF-F IP in a projection on a longitudinally-vertical ⁇ -plane, single-layer, OLRs (with local SOEs, in particular located on the same plane) are represented in R COSS S / TOF-F IP: in FIG. 26 - with one mirror, and with the 1st turn of A-TIF onto the mirror; in FIG. 27 - with 2 mirrors, and with the 0.5th turn of A-TIF to the mirror; in FIG. 28 - at one mirror, and at one turn of A-TIF on a mirror;
  • FIG. 29-39 and 40-45 show mR COSS S / TOF-F IP designed to provide one or more periodic A-TIF scans along the ⁇ plane, respectively: with reflection of the ion flux on one or more mirrors on all scan layers (in FIG. 29-39); with reflection of the ion flux on local mirrors, on layers alternating with layers without mirrors (in Figs. 40-45).
  • Y-planes are represented by mR COSS S / TOF-F IP with one or more periodic A-TIF sweeps along the ⁇ -plane: with one mirror, and with
  • FIG. 34-36 in a projection onto the ⁇ plane are shown above in FIG. 29-
  • FIG. 34 shows mR COSS shown and FIG. 29; on FIG. 35 shows the mR COSS shown in FIG. 30 (with forward and reverse passage) and FIG. 31; in FIG. 36 shows the mR COSS shown in FIG. 32 (with forward and reverse passage) and FIG. 33.
  • FIG. 40-43 respectively, the 1st, 2nd, 3rd, 4th layers of the single-period A-TIF scan in mR COSS S / TOF-F IP are shown, which are designed to ensure the A-TIF scan in layers alternating with 2 local CO mirrors and without mirrors.
  • the periodic A-TIF scan in mR COSS S / TOF-F IP in FIG. 40-43 are obtained on the basis of providing the addition of one A-TIF scan layer without mirrors, placing it between the layers of the CO-mirrors in the mR COSS S / TOF-F IP shown in FIG. thirty.
  • FIG. 44 in a projection onto the ⁇ plane, is a view of a single-period A-TIF scan in mR COSS S / TOF-F IP shown above in FIG. 40-43.
  • FIG. 45 is a projection onto a ⁇ plane, a view of a single-periodic scan
  • A-TIF in mR COSS S / TOF-F IP above in FIG. 32 while providing the addition, between layers containing CO mirrors, of one A-TIF scan layer without mirrors.
  • mR COSS S / TOF-F IP can be multi-channel, single-channel or multi-channel.
  • Stepped focus mR COSs have high compactness, resolution and scanning speed.
  • FIG. 46-50 in a projection onto a vertical plane, combined with XY - the plane of the rectangular Cartesian coordinate system XYZ, some examples of the formation of the system of pass-through windows of the ion-source block (abbreviated AI block) with energy-filtering SFFI are shown:
  • FIG. Figures 46, 47, and 48 show access window systems for a bi-symmetric field, the average plane of symmetry of which is aligned with the coordinate XZ and YZ planes, respectively, with their types: single-window, two-window, six-window;
  • FIG. Figures 49 and 50 show access window systems with an axially symmetric field (rotational symmetry, the axis of symmetry of which is aligned with the coordinate axis Z), which respectively include one circular window and four windows in a sector-view ring.
  • the storage and ejection chamber of the AI unit with energy-filtering SFFI can be formed by attaching to each of them any of the access window systems shown in FIG. 46-50.
  • any AI unit including one with energy-filtering SFFI, can be made with a “compensated difference in the ion path trajectory.”
  • the ion flux paths are shown by solid lines with an arrow.
  • FIG. 51 shows the general principle of a stepwise AI block with a “compensated difference in the ion path trajectory”.
  • each storage-pushing chamber of the AI block includes groups of electrodes - in FIG. 51
  • AI block consists of three groups of electrodes, each of which includes four local electrodes and is docked with one of the three storage-ejection cameras isSl, is52 is53.
  • the three ion flow paths do not have a difference in the stroke length between themselves when they fall onto the plane AA 1 — it is made with a “compensated difference in the stroke length of the ion trajectories”.
  • FIG. 52 also shows the structure of one of the cumulatively ejecting chamber "21, which includes: an output window WL21; constituent walls: two side walls of the insulating material spl sp2 buoyant electrode eE and the accumulating ions of volume iV, which is formed by the said constituent walls of the buoyancy chamber "21.
  • 55a and 55b shows examples of the formation of linear AI blocks with energy-filtering SFFI.
  • FIG. 54 additionally shows traps pi and p2 for blocking part of the ion flux while allowing an ion stream with a predetermined or adjustable region (selection of the energy width and position of this width) of the ion energy distribution in the stream to pass into the analyzer channel.
  • IlL0g is a fine mesh network for passing ions into traps
  • wl and w2 are the walls of the trap.
  • FIG. 56 and 57 in the projection onto the Y-plane examples of the formation of return-flow AI blocks with energy-filtering SFFI are shown.
  • FIG. 51-57 multi-path multi-channel AI units with energy-filtering SFFI are shown with separate storage-ejection chambers for each ion path.
  • the AI block with SFFI energy-filtering is single-source.
  • two or more single-source single-window accumulative-ejection cameras can be made, in principle, in the form of a single multicon accumulative-ejection camera.
  • AI-blocks with energy-filtering SFFI and its components are shown for bi-symmetric and axially symmetric fields.
  • COSS 2cl in the projection onto the xy plane, COSS 2cl is shown, consisting of two flat capacitors cll and c12, symmetrically located relative to the yz plane of the Cartesian coordinate system xyz.
  • FIG. 59 in a projection on the xz-plane, a filter capacitor type COSS 2clF is shown, made on the basis of the 2d capacitor system, where each flat capacitor is joined by the front ⁇ 1 and rear ⁇ 2 electrode diaphragms.
  • FIG. 60 in the projection onto the xy plane, a cylindrical condenser c3 consisting of two concentric cylinders c31 and c32, the axis of symmetry of which is aligned with the Z axis of the Cartesian coordinate system xyz, is shown from the end part. In this case, the possibility of truncating a sector of a cylindrical capacitor c3 with a central angle ⁇ 3 was shown.
  • FIG. 61 in the projection onto the xz-plane shown with a front-end input-output filtering capacitor type COSS c31F, made on the basis of a cylindrical capacitor C3, where the cylindrical capacitor is connected by the front ⁇ 1 and rear YID2 disk electrode diaphragms.
  • FIG. 62 in a projection onto the xz plane, a sector of a cylindrical capacitor c32 is shown from the side.
  • FIG. 63 in the projection onto the xy plane, a filtering condenser type COSS c32F is shown with a lateral input-output, based on the sector of the cylindrical capacitor c32, where the cylindrical capacitor is joined by the front ⁇ 1 and rear ⁇ 2 electrode diaphragms.
  • the sizes of the considered filtering condenser type COSS c31F and c32F in one of the directions of the coordinate axes are not physical.
  • COSS made on the basis of a cylindrical capacitor, can operate with a ring-shaped ion flow. These features of them, with their corresponding joints with the corresponding through-windows and the choice of input window symmetry, allow them to be used for a multi-path flow of charged particles.
  • a filtering condenser type COSS can be directly coupled to a short-pulse type ion source, such as, for example, sources using short-pulse laser radiation.
  • An MS may include multiple channels and / or paths. Multichannel MS can be performed with the possibility of simultaneous or alternate direction (translating-multichannel) of the ion stream, at least one shortened and one high-resolution MS channels.
  • a multi-channel MS includes two or more different types of channels and with using an additional COSS or additional electrodes, one or more ion streams are alternately transferred to different channels.
  • FIG. 64 -67 are examples of the use of energy-filtering SFFI in MS, when the AI unit includes uniform tractor ion flows, i.e. all ion fluxes are identical in shape.
  • the perpendicular dashed lines show the Ptf planes of the time-of-flight focusing.
  • FIG. 64 and 65 in a projection on X, MSs with SFFI are shown based on the systems shown in FIG. 55a and 55b.
  • FIG. 66 in a projection onto the Y-plane shows AI-blocks with energy-filtering SFFI, made with the possibility of time-of-flight focusing of ion packets, based on two reflections.
  • this AI block can be used as TOF MS.
  • An important part of it is the two-reflection CO unit, which is isolated separately in FIG. 67.
  • An analogous two-reflection CO-nodes can be performed with any field symmetry.
  • a two-reflection CO unit in particular, can be made two-dimensional or rotational symmetry about the Z axis and can be connected to an AI unit with a two-dimensional capacitor or with a COSS axisymmetric field (a cylindrical capacitor or any other axisymmetric energy filter).
  • FIG. 68 is a two-zone 10K mirror K160R with an averaged face vector n, comprising: a flat plug K161Rn constituting the first K161 electrode; second electrodes K162.1 and K162.2 of two zones; the third electrodes K163.1 and K163.2 of two zones; the fourth electrodes K164.1 of one zone and the horizontal component K164.2 and the side components K164sl, K164s2 of the fourth electrode of the other zone.
  • the interelectrode slots are made rectilinearly and vertically to the longitudinally vertical plane 10 of the mirror.
  • the K164.2 electrode can be made without side components.
  • Similar two-band IO mirrors for incident and reflected ion fluxes can have different focal lengths. This feature of a two-band Yu mirror can be used to expand the functionality of COSS, especially for COSS S / TOF-F IP.
  • FIG. 69a and 69b in a three-dimensional form, two examples of the formation of electrode groups together with a through-window system are shown:
  • FIG. 69a shows, with rotational symmetry, a four-electrode elongated EADc, which in principle is an energy-filtering SFFI with rotational symmetry about the Z coordinate axis;
  • FIG. 69b shows a bi-symmetric four-electrode EC ⁇ 2 ⁇ , which, in principle, is an energy-filtering SFFI with a bi-symmetric field distribution, and includes: four local electrodes 261, 262, 263, 264; boundary surface (access window system) PS1 in the form of a sector of the cylinder; two elongated input windows WC2 ⁇ and WC22; aperture electrode ⁇ with an output window ⁇ /.
  • the energy filtering SFFIs shown in FIG. 69a and 69b, as well as their other types, may further comprise, after the diaphragm electrode, at least one electrode.
  • An example of such a case is shown in FIG. 70, in the form of EC125, which after the diaphragm ⁇ contains an additional two electrodes 265 and 266.
  • the presence of such electrodes in the previous figures is not shown so as not to clutter the drawings, but we will always assume the possibility of the presence of such electrodes.
  • FIG. 71-77 are presented COS analyzer of some types of TOF MS.
  • FIG. 71 shows volumetric images of electrodes of an axisymmetric COS TOF MS; in FIG.
  • FIG. 73-76 shows only one half of 3D mVr mR COS and 3D 2Vt mR COS, which is possible, since the coordinate annombo Playuring Tai-plane is a plane of symmetry (symmetry is broken when the side corrections are not the same or there is only one side corrector).
  • FIG. 73-75 show 3D mVr mR COS (multi-projection-two-loop) with solid circular reflectors.
  • FIG. 76 and 77 show single-projection-two-loop 3D 2VC mR COS (single-projection-two-loop).
  • a projection onto a yz-plane shows the appearance of a TOF MS with 3D 2Vr mR COS with four compartments P p , P 12 , P 13 and P 14 of an attached pumping system.
  • FIG. shows some types of magnets and the possibilities of their application in CES (CES - attached pumping system).
  • FIG. 80, 81, and 82 show two types of periodically closed multilayer P G - a type of magnet, in the particular case when the magnet has only three layers and they are straight. Of course, they can contain two layers or more than three layers, can also be curved. In any case, in periodically closed multilayer magnets: the width of the gap between the layers is small / uy / - »0, the thickness of the layer is less than its length ⁇ . ⁇ 1 ⁇ .
  • FIG. 80 81 are shown two types of periodically closed multilayer P c type of magnet, respectively closed at the edges of P Ga zx type and closed through jumpers P Gb zx type.
  • FIG. 81 are shown when: the layers are closed through the four jumpers cs ⁇ , csl, cs3 and cs4; bi-symmetric with respect to two planes - the coordinate zy-plane and the geometric mid-plane parallel coordinate x-plane. In the general case, these conditions are not necessary - the number of jumpers and spatial configurations can be arbitrary.
  • FIG. 82 shows an i ⁇ type magnet in cross section along a transverse vertical plane.
  • FIG. 83 and 84 show examples of the implementation of CES (CES - attached pumping systems) in the form of ion pumps and the possibility of arranging magnets in them.
  • FIG. 83 shows an example of the formation of two lateral magnetic groups 0X3 - placement, 0X4-placement and the transverse-middle group of magnets 0X7 - placement together with a system of flat plate anode electrodes A3 and cathode electrodes SZ, parallel to each other and periodically alternating.
  • FIG. 84 shows an example of the formation of four groups of magnets antisymmetric, with respect to the xy plane.
  • FIG. 84 in cross section, along the xy plane, one of the types of CES formation is shown: SP and C12 — right and left plate cathode electrodes, respectively; A2 is a group of cylindrical anode electrodes. Of course, other forms of electrodes can be formed.
  • FIG. 83 and 84 also show sP3.1 and sP3.2 - two CES channels (window channel between the CES and IB channel) with the system of partitions pP1, pP2 and pPZ designed to protect the reflection areas of the IB channel from metal debris emanating from CES

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  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

L'invention concerne des équipements électroniques d'analyse destinés à déterminer la composition et la structure de substances et notamment des analyseurs MR TOF MS (MR pour « à réflexions multiples », TOF MS pour « spectromètre de masse à temps de vol ») et peut être utilisée en médecine, en biologie, dans les industries du pétrole et du gaz, en métallurgie, en génie énergétique et en géochimie, ainsi que dans les domaines de l'hydrotechnique et de la protection de l'environnement. Afin d'améliorer la capacité de résolution du MR TOF MS, son système RS (RS pour « système de réflexion ») comporte une série de particularités dont les principales consistent en ce que : (a) le COSS de son canal d'analyse comporte un ou plusieurs éléments sélectionnés parmi les types de composantes à double réflexion des unités COSS, qui sont choisis dans une série de miroirs à zone unique ou double et permet d'assurer une sélection des valeurs d'angles aigus γ 1 et γ 2, entre les directions du flux de sortie d'un miroir CO et d'entrée dans un autre miroir CO dans les limites suivantes : - π/4<γ 1≤0 et 0≤γ 1<π/4; 0≤γ 2<π/4 et - π/4< γ 2≤0; (b) le COSS de son canal d'analyse comprend un ou plusieurs COE de déviation et de correction (COE pour « éléments optiques corpusculaires »), réalisés de manière à assurer une possibilité de S/TOF-F IP (S/TOF-F IP pour « focalisation par paliers à temps de vol d'un paquet d'ions suivant la distribution énergétique des ions dans un paquet ») conjointement avec un miroir CO à zone simple ou double; (c) un bloc II qui comprend un élément SFFI de filtrage d'énergie (SFFI pour « source formatrice de flux d'ions »), y compris leur types à « différence de longueur compensée de course des trajectoires d'ions »).
PCT/KZ2017/000029 2016-12-30 2017-12-29 Spectromètre de masse à temps de vol et ses parties constitutives Ceased WO2018124861A2 (fr)

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US10950425B2 (en) 2016-08-16 2021-03-16 Micromass Uk Limited Mass analyser having extended flight path
US11049712B2 (en) 2017-08-06 2021-06-29 Micromass Uk Limited Fields for multi-reflecting TOF MS
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US11621156B2 (en) 2018-05-10 2023-04-04 Micromass Uk Limited Multi-reflecting time of flight mass analyser
US11817303B2 (en) 2017-08-06 2023-11-14 Micromass Uk Limited Accelerator for multi-pass mass spectrometers
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US11848185B2 (en) 2019-02-01 2023-12-19 Micromass Uk Limited Electrode assembly for mass spectrometer
US11881387B2 (en) 2018-05-24 2024-01-23 Micromass Uk Limited TOF MS detection system with improved dynamic range
US12205813B2 (en) 2019-03-20 2025-01-21 Micromass Uk Limited Multiplexed time of flight mass spectrometer
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US11309175B2 (en) 2017-05-05 2022-04-19 Micromass Uk Limited Multi-reflecting time-of-flight mass spectrometers
US11328920B2 (en) 2017-05-26 2022-05-10 Micromass Uk Limited Time of flight mass analyser with spatial focussing
US11817303B2 (en) 2017-08-06 2023-11-14 Micromass Uk Limited Accelerator for multi-pass mass spectrometers
US11756782B2 (en) 2017-08-06 2023-09-12 Micromass Uk Limited Ion mirror for multi-reflecting mass spectrometers
US11211238B2 (en) 2017-08-06 2021-12-28 Micromass Uk Limited Multi-pass mass spectrometer
US11239067B2 (en) 2017-08-06 2022-02-01 Micromass Uk Limited Ion mirror for multi-reflecting mass spectrometers
US11295944B2 (en) 2017-08-06 2022-04-05 Micromass Uk Limited Printed circuit ion mirror with compensation
US11081332B2 (en) 2017-08-06 2021-08-03 Micromass Uk Limited Ion guide within pulsed converters
US11049712B2 (en) 2017-08-06 2021-06-29 Micromass Uk Limited Fields for multi-reflecting TOF MS
US11205568B2 (en) 2017-08-06 2021-12-21 Micromass Uk Limited Ion injection into multi-pass mass spectrometers
US11837452B2 (en) 2018-02-22 2023-12-05 Micromass Uk Limited Charge detection mass spectrometry
US11367608B2 (en) 2018-04-20 2022-06-21 Micromass Uk Limited Gridless ion mirrors with smooth fields
US11621156B2 (en) 2018-05-10 2023-04-04 Micromass Uk Limited Multi-reflecting time of flight mass analyser
US11342175B2 (en) 2018-05-10 2022-05-24 Micromass Uk Limited Multi-reflecting time of flight mass analyser
US11881387B2 (en) 2018-05-24 2024-01-23 Micromass Uk Limited TOF MS detection system with improved dynamic range
US11587779B2 (en) 2018-06-28 2023-02-21 Micromass Uk Limited Multi-pass mass spectrometer with high duty cycle
WO2020071892A1 (fr) * 2018-10-04 2020-04-09 Алдан Асанович САПАРГАЛИЕВ Spectrométrie de masse à temps de vol haute résolution
US11848185B2 (en) 2019-02-01 2023-12-19 Micromass Uk Limited Electrode assembly for mass spectrometer
US12205813B2 (en) 2019-03-20 2025-01-21 Micromass Uk Limited Multiplexed time of flight mass spectrometer
US11842891B2 (en) 2020-04-09 2023-12-12 Waters Technologies Corporation Ion detector
US12431343B2 (en) 2021-12-15 2025-09-30 Waters Technologies Corporation Inductive detector with integrated amplifier
RU2841356C1 (ru) * 2023-12-28 2025-06-06 Общество с ограниченной ответственностью "Ионоскоп" Времяпролетный масс-анализатор

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