WO2020235231A1 - アクティブノイズコントロールシステム - Google Patents
アクティブノイズコントロールシステム Download PDFInfo
- Publication number
- WO2020235231A1 WO2020235231A1 PCT/JP2020/015246 JP2020015246W WO2020235231A1 WO 2020235231 A1 WO2020235231 A1 WO 2020235231A1 JP 2020015246 W JP2020015246 W JP 2020015246W WO 2020235231 A1 WO2020235231 A1 WO 2020235231A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- speaker
- layer
- sound
- region
- intervening layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Images
Classifications
-
- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10K—SOUND-PRODUCING DEVICES; METHODS OR DEVICES FOR PROTECTING AGAINST, OR FOR DAMPING, NOISE OR OTHER ACOUSTIC WAVES IN GENERAL; ACOUSTICS NOT OTHERWISE PROVIDED FOR
- G10K11/00—Methods or devices for transmitting, conducting or directing sound in general; Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
- G10K11/16—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
- G10K11/175—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general using interference effects; Masking sound
- G10K11/178—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general using interference effects; Masking sound by electro-acoustically regenerating the original acoustic waves in anti-phase
- G10K11/1787—General system configurations
- G10K11/17879—General system configurations using both a reference signal and an error signal
- G10K11/17881—General system configurations using both a reference signal and an error signal the reference signal being an acoustic signal, e.g. recorded with a microphone
-
- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10K—SOUND-PRODUCING DEVICES; METHODS OR DEVICES FOR PROTECTING AGAINST, OR FOR DAMPING, NOISE OR OTHER ACOUSTIC WAVES IN GENERAL; ACOUSTICS NOT OTHERWISE PROVIDED FOR
- G10K11/00—Methods or devices for transmitting, conducting or directing sound in general; Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
- G10K11/16—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
- G10K11/175—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general using interference effects; Masking sound
- G10K11/178—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general using interference effects; Masking sound by electro-acoustically regenerating the original acoustic waves in anti-phase
- G10K11/1781—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general using interference effects; Masking sound by electro-acoustically regenerating the original acoustic waves in anti-phase characterised by the analysis of input or output signals, e.g. frequency range, modes, transfer functions
- G10K11/17821—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general using interference effects; Masking sound by electro-acoustically regenerating the original acoustic waves in anti-phase characterised by the analysis of input or output signals, e.g. frequency range, modes, transfer functions characterised by the analysis of the input signals only
- G10K11/17825—Error signals
-
- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10K—SOUND-PRODUCING DEVICES; METHODS OR DEVICES FOR PROTECTING AGAINST, OR FOR DAMPING, NOISE OR OTHER ACOUSTIC WAVES IN GENERAL; ACOUSTICS NOT OTHERWISE PROVIDED FOR
- G10K11/00—Methods or devices for transmitting, conducting or directing sound in general; Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
- G10K11/16—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
- G10K11/175—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general using interference effects; Masking sound
- G10K11/178—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general using interference effects; Masking sound by electro-acoustically regenerating the original acoustic waves in anti-phase
- G10K11/1785—Methods, e.g. algorithms; Devices
-
- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10K—SOUND-PRODUCING DEVICES; METHODS OR DEVICES FOR PROTECTING AGAINST, OR FOR DAMPING, NOISE OR OTHER ACOUSTIC WAVES IN GENERAL; ACOUSTICS NOT OTHERWISE PROVIDED FOR
- G10K11/00—Methods or devices for transmitting, conducting or directing sound in general; Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
- G10K11/16—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
- G10K11/175—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general using interference effects; Masking sound
- G10K11/178—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general using interference effects; Masking sound by electro-acoustically regenerating the original acoustic waves in anti-phase
- G10K11/1785—Methods, e.g. algorithms; Devices
- G10K11/17853—Methods, e.g. algorithms; Devices of the filter
-
- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10K—SOUND-PRODUCING DEVICES; METHODS OR DEVICES FOR PROTECTING AGAINST, OR FOR DAMPING, NOISE OR OTHER ACOUSTIC WAVES IN GENERAL; ACOUSTICS NOT OTHERWISE PROVIDED FOR
- G10K11/00—Methods or devices for transmitting, conducting or directing sound in general; Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
- G10K11/16—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
- G10K11/175—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general using interference effects; Masking sound
- G10K11/178—Methods or devices for protecting against, or for damping, noise or other acoustic waves in general using interference effects; Masking sound by electro-acoustically regenerating the original acoustic waves in anti-phase
- G10K11/1785—Methods, e.g. algorithms; Devices
- G10K11/17857—Geometric disposition, e.g. placement of microphones
-
- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10K—SOUND-PRODUCING DEVICES; METHODS OR DEVICES FOR PROTECTING AGAINST, OR FOR DAMPING, NOISE OR OTHER ACOUSTIC WAVES IN GENERAL; ACOUSTICS NOT OTHERWISE PROVIDED FOR
- G10K9/00—Devices in which sound is produced by vibrating a diaphragm or analogous element, e.g. fog horns, vehicle hooters or buzzers
- G10K9/12—Devices in which sound is produced by vibrating a diaphragm or analogous element, e.g. fog horns, vehicle hooters or buzzers electrically operated
- G10K9/122—Devices in which sound is produced by vibrating a diaphragm or analogous element, e.g. fog horns, vehicle hooters or buzzers electrically operated using piezoelectric driving means
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; ELECTRIC HEARING AIDS; PUBLIC ADDRESS SYSTEMS
- H04R1/00—Details of transducers, loudspeakers or microphones
- H04R1/10—Earpieces; Attachments therefor ; Earphones; Monophonic headphones
- H04R1/1083—Reduction of ambient noise
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; ELECTRIC HEARING AIDS; PUBLIC ADDRESS SYSTEMS
- H04R17/00—Piezoelectric transducers; Electrostrictive transducers
- H04R17/005—Piezoelectric transducers; Electrostrictive transducers using a piezoelectric polymer
-
- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10K—SOUND-PRODUCING DEVICES; METHODS OR DEVICES FOR PROTECTING AGAINST, OR FOR DAMPING, NOISE OR OTHER ACOUSTIC WAVES IN GENERAL; ACOUSTICS NOT OTHERWISE PROVIDED FOR
- G10K2210/00—Details of active noise control [ANC] covered by G10K11/178 but not provided for in any of its subgroups
- G10K2210/10—Applications
- G10K2210/105—Appliances, e.g. washing machines or dishwashers
- G10K2210/1053—Hi-fi, i.e. anything involving music, radios or loudspeakers
-
- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10K—SOUND-PRODUCING DEVICES; METHODS OR DEVICES FOR PROTECTING AGAINST, OR FOR DAMPING, NOISE OR OTHER ACOUSTIC WAVES IN GENERAL; ACOUSTICS NOT OTHERWISE PROVIDED FOR
- G10K2210/00—Details of active noise control [ANC] covered by G10K11/178 but not provided for in any of its subgroups
- G10K2210/30—Means
- G10K2210/321—Physical
- G10K2210/3212—Actuator details, e.g. composition or microstructure
-
- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10K—SOUND-PRODUCING DEVICES; METHODS OR DEVICES FOR PROTECTING AGAINST, OR FOR DAMPING, NOISE OR OTHER ACOUSTIC WAVES IN GENERAL; ACOUSTICS NOT OTHERWISE PROVIDED FOR
- G10K2210/00—Details of active noise control [ANC] covered by G10K11/178 but not provided for in any of its subgroups
- G10K2210/30—Means
- G10K2210/321—Physical
- G10K2210/3229—Transducers
- G10K2210/32291—Plates or thin films, e.g. PVDF
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; ELECTRIC HEARING AIDS; PUBLIC ADDRESS SYSTEMS
- H04R2440/00—Bending wave transducers covered by H04R, not provided for in its groups
- H04R2440/05—Aspects relating to the positioning and way or means of mounting of exciters to resonant bending wave panels
Definitions
- the present invention relates to an active noise control system.
- An active noise control system (hereinafter sometimes referred to as an ANC system) is known.
- the ANC system noise is reduced by sounds of opposite phase.
- Patent Document 1 describes an example of an ANC system.
- Patent Document 1 describes that the noise that is diffracted and propagated above the sound insulation wall is reduced by the ANC system. Specifically, in the ANC system of Patent Document 1, a speaker having a line sound source characteristic is attached to a sound insulation wall. In Patent Document 1, the linear sound source characteristic is described as a characteristic in which the emitted sound wave propagates in a cylindrical shape with the linear sound source as the central axis.
- the present invention Structure and An active noise control system with a speaker attached to the structure.
- the speaker includes a radial surface and The radial surface has a first region, a second region, and a third region between the first region and the second region.
- an axis extending through the third region and extending away from the radiation surface is defined as a reference axis
- the speaker has a first wave surface propagating from the first region toward the reference axis and the first wave surface.
- a second wave plane propagating from the two regions so as to approach the reference axis is formed. Provides an active noise control system.
- the above structure When the above structure is on the noise propagation path, diffraction can occur at the opposite first and second ends of the structure.
- the wave surface generated by the diffraction at the first end and the wave surface generated by the diffraction at the second end of the structure propagate so as to approach the reference axis.
- a first wave plane propagating from the first region so as to approach the reference axis and a second wave plane propagating from the second region so as to approach the reference axis appear.
- the wave surface derived from the diffraction at the first end and the wave surface derived from the diffraction at the second end and the first wave surface and the second wave surface derived from the ANC system have a common propagation direction. This is suitable for reducing the diffracted sound generated by diffracting noise at the first end and the second end.
- FIG. 1 is an explanatory diagram of an ANC system.
- FIG. 2 is an explanatory diagram of the diffracted wave.
- FIG. 3 is an explanatory diagram of the wave surface formed by the speaker of the ANC system.
- FIG. 4 is an explanatory diagram of a wave surface formed by a conventional dynamic speaker.
- FIG. 5 is an explanatory view of a wave surface formed by a conventional flat speaker.
- FIG. 6A is an explanatory diagram of vibration of the radial surface of the speaker.
- FIG. 6B is an explanatory diagram of the support structure of the piezoelectric film.
- FIG. 7 is a perspective view for explaining the first and second margins.
- FIG. 8 is a plan view for explaining the first and second margins.
- FIG. 7 is a perspective view for explaining the first and second margins.
- FIG. 9 is a plan view for explaining the first and second margins.
- FIG. 10 is a plan view for explaining the first and second margins.
- FIG. 11 is a plan view for explaining the first and second margins.
- FIG. 12 is a plan view for explaining the first and second margins.
- FIG. 13A is a configuration diagram of a feedforward ANC system.
- FIG. 13B is a configuration diagram of a single channel ANC system.
- FIG. 13C is a configuration diagram of a multi-channel ANC system.
- FIG. 13D is a configuration diagram of the control device.
- FIG. 14A is a block diagram of the feedback ANC system.
- FIG. 14B is a configuration diagram of a single channel ANC system.
- FIG. 14C is a configuration diagram of a multi-channel ANC system.
- FIG. 14A is a block diagram of the feedback ANC system.
- FIG. 14D is a configuration diagram of the control device.
- FIG. 15 is a cross-sectional view of the piezoelectric speaker in a cross section parallel to the thickness direction.
- FIG. 16 is a top view of the piezoelectric speaker when observed from the side opposite to the fixed surface.
- FIG. 17 is a diagram showing a piezoelectric speaker according to another configuration example.
- FIG. 18 is a diagram for explaining the structure of the prepared sample.
- FIG. 19 is a diagram for explaining a configuration for measuring a sample.
- FIG. 20 is a diagram for explaining a configuration for measuring a sample.
- FIG. 21 is a block diagram of the output system.
- FIG. 22 is a block diagram of the evaluation system.
- FIG. 23A is a table showing the evaluation results of the samples.
- FIG. 23A is a table showing the evaluation results of the samples.
- FIG. 23B is a table showing the evaluation results of the samples.
- FIG. 24 is a graph showing the relationship between the degree of restraint of the intervening layer and the frequency at which sound begins to appear.
- FIG. 25 is a graph showing the frequency characteristics of the sound pressure level of sample E1.
- FIG. 26 is a graph showing the frequency characteristics of the sound pressure level of sample E2.
- FIG. 27 is a graph showing the frequency characteristics of the sound pressure level of sample E3.
- FIG. 28 is a graph showing the frequency characteristics of the sound pressure level of sample E4.
- FIG. 29 is a graph showing the frequency characteristics of the sound pressure level of sample E5.
- FIG. 30 is a graph showing the frequency characteristics of the sound pressure level of sample E6.
- FIG. 31 is a graph showing the frequency characteristics of the sound pressure level of sample E7.
- FIG. 32 is a graph showing the frequency characteristics of the sound pressure level of the sample E8.
- FIG. 33 is a graph showing the frequency characteristics of the sound pressure level of sample E9.
- FIG. 34 is a graph showing the frequency characteristics of the sound pressure level of the sample E10.
- FIG. 35 is a graph showing the frequency characteristics of the sound pressure level of sample E11.
- FIG. 36 is a graph showing the frequency characteristics of the sound pressure level of the sample E12.
- FIG. 37 is a graph showing the frequency characteristics of the sound pressure level of sample E13.
- FIG. 38 is a graph showing the frequency characteristics of the sound pressure level of the sample E14.
- FIG. 39 is a graph showing the frequency characteristics of the sound pressure level of the sample E15.
- FIG. 40 is a graph showing the frequency characteristics of the sound pressure level of the sample E16.
- FIG. 41 is a graph showing the frequency characteristics of the sound pressure level of sample E17.
- FIG. 42 is a graph showing the frequency characteristics of the sound pressure level of the sample R1.
- FIG. 43 is a graph showing the frequency characteristics of the sound pressure level of background noise.
- FIG. 44 is a block diagram of the ANC evaluation system.
- FIG. 45A is a diagram showing a sound pressure distribution when the speaker is off.
- FIG. 45B is a diagram showing a sound pressure distribution when the speaker is off.
- FIG. 45C is a diagram showing a sound pressure distribution when the speaker is off.
- FIG. 46 is a diagram showing the propagation of the wave surface when the speaker is off.
- FIG. 47A is a diagram showing a sound pressure distribution when the speaker is off.
- FIG. 47B is a diagram showing a sound pressure distribution when the speaker is off.
- FIG. 47C is a diagram showing a sound pressure distribution when the speaker is off.
- FIG. 48 is a diagram showing the propagation of the wave surface when the speaker is off.
- FIG. 49A is a diagram showing a sound pressure distribution derived from a piezoelectric speaker.
- FIG. 49B is a diagram showing a sound pressure distribution derived from a piezoelectric speaker.
- FIG. 49C is a diagram showing a sound pressure distribution derived from a piezoelectric speaker.
- FIG. 50 is a diagram showing the propagation of the wave surface derived from the piezoelectric speaker.
- FIG. 51A is a diagram showing a sound pressure distribution derived from a piezoelectric speaker.
- FIG. 51A is a diagram showing a sound pressure distribution derived from a piezoelectric speaker.
- FIG. 51B is a diagram showing a sound pressure distribution derived from a piezoelectric speaker.
- FIG. 51C is a diagram showing a sound pressure distribution derived from a piezoelectric speaker.
- FIG. 52 is a diagram showing the propagation of the wave surface derived from the piezoelectric speaker.
- FIG. 53A is a diagram showing a sound pressure distribution derived from a dynamic speaker.
- FIG. 53B is a diagram showing a sound pressure distribution derived from a dynamic speaker.
- FIG. 53C is a diagram showing a sound pressure distribution derived from a dynamic speaker.
- FIG. 54 is a diagram showing the propagation of the wave surface derived from the dynamic speaker.
- FIG. 55A is a diagram showing a sound pressure distribution derived from a dynamic speaker.
- FIG. 55B is a diagram showing a sound pressure distribution derived from a dynamic speaker.
- FIG. 55C is a diagram showing a sound pressure distribution derived from a dynamic speaker.
- FIG. 56 is a diagram showing the propagation of the wave surface derived from the dynamic speaker.
- FIG. 57A is a diagram showing a sound pressure distribution derived from a flat speaker.
- FIG. 57B is a diagram showing a sound pressure distribution derived from a flat speaker.
- FIG. 57C is a diagram showing a sound pressure distribution derived from a flat speaker.
- FIG. 58 is a diagram showing the propagation of the wave surface derived from the flat speaker.
- FIG. 59A is a diagram showing a sound pressure distribution derived from a flat speaker.
- FIG. 59B is a diagram showing a sound pressure distribution derived from a flat speaker.
- FIG. 59C is a diagram showing a sound pressure distribution derived from a flat speaker.
- FIG. 60 is a diagram showing the propagation of the wave surface derived from the flat speaker.
- FIG. 61A is an explanatory diagram of the muffling effect.
- FIG. 61B is an explanatory diagram of the muffling effect.
- FIG. 61C is an explanatory diagram of the muffling effect.
- FIG. 62A is an explanatory diagram of the muffling effect.
- FIG. 62B is an explanatory diagram of the muffling effect.
- FIG. 62C is an explanatory diagram of the muffling effect.
- FIG. 1 shows an active noise control system (ANC system) 500 according to an embodiment.
- the ANC system 500 includes a structure 80 and a speaker 10.
- the speaker 10 is attached to the structure 80.
- the structure 80 is a plate-like body.
- the structure 80 which is a plate-like body, has, for example, a vertical dimension of 20 cm to 600 cm (may be 20 cm to 200 cm) and a horizontal dimension of 20 cm to 600 cm (may be 20 cm to 200 cm).
- the width direction dimension is 0.1 cm to 15 cm.
- the vertical direction, the horizontal direction, and the width direction are orthogonal to each other.
- the vertical dimension and the horizontal dimension may be the same or different.
- a specific example of the structure 80 is a partition.
- the speaker 10 has a radial surface 15.
- the radiating surface 15 radiates sound waves by vibrating. Noise is reduced by this sound wave.
- the radiation surface 15 is a continuous radiation surface.
- the structure 80 has opposite ends 81 and 82.
- the ANC system 500 is suitable for reducing the diffracted noise generated at the ends 81 and 82.
- this point will be described with reference to FIGS. 2 and 3.
- the noise from the noise source 200 propagates toward the structure 80.
- diffraction may occur at the first end 81 and the second end 82.
- the wave front generated by the diffraction at the ends 81 and 82 propagates around behind the structure 80.
- the wave surface 81w generated by the diffraction at the first end portion 81 and the wave surface 82w generated by the diffraction at the second end portion 82 propagate so as to approach the axis 80X.
- the shaft 80X is a shaft that passes between the first end portion 81 and the second end portion 82 and extends in a direction away from the structure 80.
- the shaft 80X is orthogonal to the mounting surface of the speaker 10 in the structure 80.
- the shaft 80X may pass through the center of the mounting surface.
- the ANC system 500 is suitable for reducing the diffracted sound thus generated at the ends 81 and 82.
- the radial surface 15 has a first region 15a, a second region 15b, and a third region 15c.
- the third region 15c is a region between the first region 15a and the second region 15b.
- the speaker 10 forms a first wave surface 16a that propagates from the first region 15a so as to approach the reference axis 10X, and a second wave surface 16b that propagates from the second region 15b so as to approach the reference axis 10X.
- such a first wave surface 16a and a second wave surface 16b are formed by the vibration of the radiation surface 15.
- the reference axis 10X is an axis extending so as to pass through the third region 15c and away from the radiation surface 15.
- the wave plane is a series of points with the same phase of the wave.
- the diffraction-derived wave surface 81w at the first end portion 81 and the diffraction-derived wave surface 82w at the second end portion 82 propagate so as to approach the reference axis 10X shown in FIG. Therefore, the wave surface 81w derived from the diffraction of the first end portion 81 and the wave surface 82w derived from the diffraction of the second end portion 82 and the first wave surface 16a and the second wave surface 16b derived from the ANC system 500 are common in the propagation direction. There is sex. This is suitable for reducing the diffracted sound generated by the noise diffracted at the first end portion 81 and the second end portion 82.
- the first wave surface 16a and the second wave surface 16b can be formed by the radiation surface 15 (a continuous radiation surface in the illustrated example) in one speaker 10. This is advantageous from the viewpoint of simplifying the control of the speaker 10.
- the reference axis 10X is orthogonal to the third region 15c at the time of non-vibration.
- the deviation angle ⁇ 1 in the propagation direction of the first wave surface 16a from the reference axis 10X is, for example, in the range of 5 ° to 85 °, may be in the range of 15 ° to 75 °, and is in the range of 25 ° to 65 °. There may be.
- the deviation angle ⁇ 2 in the propagation direction of the second wave surface 16b from the reference axis 10X is, for example, in the range of 5 ° to 85 °, may be in the range of 15 ° to 75 °, and is in the range of 25 ° to 65 °.
- the third region 15c may be flat when not vibrating. Further, the entire radiation surface 15 may be flat when not vibrating.
- the reference axis 10X may be an axis passing through the center of the radiation surface 15.
- the conventional dynamic speaker 610 shown in FIG. 4 emits a substantially hemispherical wave from its radiation surface.
- the wave surface 610w of the substantially hemispherical wave is also substantially hemispherical.
- the shaft 610X is a shaft extending through the radiation surface of the dynamic speaker 610 and away from the radiation surface.
- the conventional plane speaker 620 shown in FIG. 5 radiates a substantially plane wave from its radiating surface.
- the wave surface 620w of the substantially plane wave is also substantially flat.
- the shaft 620X is a shaft extending through the radiation surface of the flat speaker 620 and away from the radiation surface.
- the first wave surface 16a propagating from the first region 15a to the reference axis 10X and the second region 15b to the reference axis 10X according to the present embodiment.
- the combination with the second wave surface 16b propagating so as to approach cannot be obtained with the conventional speakers 610 and 710.
- the speaker 10 of the present embodiment is configured so that the end portion of the radial surface 15 can also vibrate satisfactorily.
- the radial surface 15 has a high degree of freedom of vibration as a whole. It is necessary to wait for further study on the details, but this may contribute to the formation of the first wave surface 16a and the second wave surface 16b.
- the radial surface 15 may vibrate in a mode close to the free end vibration mode to some extent.
- the radiating surface 15 may vibrate in a mode close to the primary free end vibration mode to some extent.
- the superiority of the muffling effect of the speaker 10 as compared with the conventional speakers 610 and 710 tends to appear when the frequency of the noise from the noise source 200 is high.
- a part of the end portion of the radial surface 15 is formed in the first region 15a.
- a part of the end portion of the radial surface 15 is formed in the second region 15b.
- the noise from the noise source 200 is diffracted at the first end 81 and the second end 82 of the structure 80, depending on the size of the structure 80 and the wavelength of the sound from the noise source 200. Therefore, the positive and negative of the phase of the sound wave in the first region 15a and the phase of the sound wave in the second region 15b are the same, and the positive and negative of the phase of the sound wave in the first region 15a and the phase of the sound wave in the third region 15c are opposite. In addition, a period may appear in which the phase of the sound wave in the second region 15b and the phase of the sound wave in the third region 15c are opposite.
- the positive and negative of the phase of the first sound wave and the phase of the second sound wave are the same, the positive and negative of the phase of the first sound wave and the phase of the third sound wave are opposite, and the phase of the second sound wave There appears a period in which the phase and the phase of the third sound wave are opposite.
- the first sound wave is a sound wave in the first region 15a formed by the speaker 10.
- the second sound wave is a sound wave in the second region 15b formed by the speaker 10.
- the third sound wave is a sound wave in the third region 15c formed by the speaker 10.
- the noise from the noise source 200 having the above-mentioned phase distribution in the first region 15a, the second region 15b, and the third region 15c can be reduced by the sound derived from the ANC system 500.
- the first sound wave is a sound wave in the first region 15a formed by the speaker 10.
- the first sound wave is a concept that includes a sound wave at a position as close as possible to the first region 15a in the space facing the first region 15a. Therefore, the measurement of the first sound wave can be realized by the measurement of the sound wave at this "infinitely close position". The same applies to the second sound wave and the third sound wave.
- phase distributions of the first sound wave, the second sound wave, and the third sound wave as described above can be obtained is consistent with the assumption that the radiation surface 15 is vibrating in a mode close to the primary free end vibration mode to some extent. To do.
- the ANC system 500 includes a control device 110.
- a certain frequency range is set.
- the control device 110 controls the frequency of the sound output from the speaker 10 to a value within the above frequency range.
- the frequency range is, for example, 20 Hz to 20000 Hz, and may be 20 Hz to 6000 Hz.
- the radiating surface 15 when the radiating surface 15 is observed in a plan view, the radiating surface 15 has a first end portion 15j and a second end portion 15k facing each other.
- the first margin M1 between the first end portion 15j and the end portion of the structure 80 is zero or more and 1/10 or less of the reference wavelength.
- the second margin M2 between the second end portion 15k and the end portion of the structure 80 is zero or more and 1/10 or less of the reference wavelength.
- the reference wavelength is the wavelength of the sound at the upper limit of the above frequency range.
- the ratio of 1/10 is derived from the fact that the muffling region of a general ANC is 1/10 of the wavelength of noise to be controlled.
- the first margin M1 and the second margin M2 should be increased to some extent for the convenience of commercialization.
- the upper limit of the first margin M1 and the second margin M2 may be made larger than 1/10 of the reference wavelength.
- the first margin M1 can be set to zero or more and 1/3 or less of the reference wavelength.
- the second margin M2 can be set to zero or more and 1/3 or less of the reference wavelength.
- the first margin M1 is, for example, 0 cm to 50 cm, and may be 0 cm to 10 cm.
- the second margin M2 is, for example, 0 cm to 50 cm, and may be 0 cm to 10 cm.
- the first margin M1 is the distance (specifically, the shortest distance) between the first end portion 15j and the end portion of the structure 80 when the radial surface 15 is observed in a plan view.
- the second margin M2 is the shortest distance (specifically, the shortest distance) between the second end portion 15k and the end portion of the structure 80 when the radiation surface 15 is observed in a plan view.
- the first margin M1 is the distance between the first end portion 15j and the first end portion 81 when the radiation surface 15 is observed in a plan view.
- the second margin M2 is the distance between the second end portion 15k and the second end portion 82 when the radiation surface 15 is observed in a plan view.
- the first margin M1 and the second margin M2 will be further described with reference to FIGS. 7 to 12.
- 8 to 12 show the longitudinal direction 80L and the lateral direction 80S of the structure 80 when the radial surface 15 is observed in a plan view. In FIGS. 8 to 12, the control device 110 is not shown.
- the first margin M1 and the second margin M2 are larger than zero.
- the distance between the radiating surface 15 and the end portion of the structure 80 is 1 / of the reference wavelength at any part of the outer peripheral edge of the radiating surface 15. It is 3 or less. Specifically, when the radiating surface 15 is observed in a plan view, the distance between that portion and the end portion of the structure 80 is 1/10 of the reference wavelength at any portion of the outer peripheral edge of the radiating surface 15. It is as follows.
- the longitudinal direction of the radiating surface 15 is the same as the lateral direction 80S of the structure 80.
- the first margin M1 and the second margin M2 are margins in the lateral direction 80S.
- the margin between the end of the structure 80 and the end of the radiation surface 15 in the longitudinal direction 80L is larger than 1/3 of the reference wavelength. large.
- the longitudinal direction of the radiating surface 15 is the same as the longitudinal direction 80L of the structure 80.
- the first margin M1 and the second margin M2 are margins of 80 L in the longitudinal direction.
- the margin between the end of the structure 80 and the end of the radiation surface 15 in the lateral direction 80S is 1/3 of the reference wavelength. Is also big.
- the longitudinal direction of the radiating surface 15 is different from the longitudinal direction 80L and the lateral direction 80S of the structure 80.
- the first margin M1 and the second margin M2 are margins in the lateral direction 80S.
- the margin between the end of the structure 80 and the end of the radiating surface 15 in the longitudinal direction 80L is larger than 1/3 of the reference wavelength. ..
- the lateral direction 80S is parallel to the horizontal direction and the longitudinal direction 80L is parallel to the vertical direction. Be placed.
- the assembly is arranged such that the lateral direction 80S is parallel to the vertical direction and the longitudinal direction 80L is parallel to the horizontal direction.
- the assembly is arranged such that the lateral direction 80S is parallel to the direction inclined from the horizontal and vertical directions, and the longitudinal direction 80L is also parallel to the direction inclined from the horizontal and vertical directions. Will be done.
- FIG. 12 shows an application of this tilted arrangement to the assembly of FIG.
- reference numeral HD refers to the horizontal direction
- reference numeral VD refers to the vertical direction.
- the first margin M1 and the second margin M2 may be the same or different.
- One of the first margin M1 and the second margin M2 may be zero, and the other may be larger than zero.
- the vertical dimension and the horizontal dimension of the radial surface 15 in a plan view may be the same.
- the "longitudinal direction of the radiating surface 15" and the “short direction of the radiating surface 15" in the above description can be read as “first direction of the radiating surface 15" and "second direction of the radiating surface 15". it can.
- the first direction and the second direction may be directions orthogonal to each other.
- the structure 80 When the radiating surface 15 is observed in a plan view, the structure 80 may have the same vertical dimension and horizontal dimension.
- the "longitudinal direction of the structure 80" and the “short direction of the structure 80" in the above description can be read as “third direction of the structure 80" and "fourth direction of the structure 80". it can.
- the third direction and the fourth direction may be directions orthogonal to each other.
- the mounting direction of the speaker 10 with respect to the structure 80 is not particularly limited. Of course, this point is the same when the structure 80 is a partition.
- the ANC system 500 performs feedforward control.
- the ANC system 500 that performs feedforward control may be referred to as a feedforward ANC system 500A or an ANC system 500A.
- the control device 110 in the ANC system 500A may be referred to as a control device 110A.
- An ANC system 500A according to an example will be described with reference to FIGS. 13A to 13D.
- the feedforward ANC system 500A includes a reference microphone 130, an error microphone 140, and a control device 110A.
- the sound wave to be canceled reaches the region 300 from the noise source 200 and has a waveform 290 in the region 300.
- the speaker 10 emits a sound wave that has a waveform 90 having a phase opposite to that of the waveform 290 when the region 300 is reached. These sound waves cancel each other out in the region 300. In other words, these sound waves are combined in the region 300 to produce a synthetic sound wave with a waveform 390 whose amplitude is reduced to zero or a small level.
- muffling is realized in this way.
- feedforward control is performed using the reference microphone 130, the error microphone 140, and the control device 110A.
- the reference microphone 130 is arranged on the noise source 200 side when viewed from the speaker 10.
- the reference microphone 130 senses the sound from the noise source 200.
- the error microphone 140 is arranged in the area 300 and senses the sound in the area 300.
- the control device 110A adjusts the sound wave emitted from the speaker 10 based on the sound sensed by the reference microphone 130 and the error microphone 140.
- the number of error microphones 140 included in the ANC system 500A is one.
- Such an ANC system 500A can be referred to as a single channel ANC system 500A.
- the number of error microphones 140 included in the ANC system 500A may be plural.
- Such an ANC system 500A can be referred to as a multi-channel ANC system 500A.
- FIG. 13B schematically shows a single channel ANC system 500A.
- FIG. 13C schematically shows a multi-channel ANC system 500A.
- the single channel ANC system 500A is advantageous from the viewpoint of realizing simple control.
- noise can be reduced at each error microphone 140.
- Providing a plurality of points (control points) at which noise can be reduced by a plurality of error microphones 140 is advantageous from the viewpoint of realizing muffling of a wide space.
- FIG. 13D shows a configuration diagram of the control device 110A according to an example.
- the control device 110A includes a preamplifier (hereinafter, the amplifier may be referred to as an amplifier) 111, a low-pass filter 112, an analog digital converter (hereinafter, may be referred to as an AD converter) 113, and a power amplifier 114.
- the preamplifier 111 amplifies the output signal of the reference microphone 130.
- the low-pass filter 112 passes the low frequency component of the output signal of the preamplifier 111.
- the AD converter 113 converts the output signal of the low-pass filter 112 into a digital signal. As a result, the reference signal x (n) at time n is output from the AD converter 113.
- the pre-amplifier 117 amplifies the output signal of the error microphone 140.
- the low-pass filter 118 passes the low frequency component of the output signal of the preamplifier 117.
- the AD converter 119 converts the output signal of the low-pass filter 118 into a digital signal. As a result, the error signal e (n) at time n is output from the AD converter 119.
- the calculation unit 120A generates a control signal y (n) at time n from the reference signal x (n) and the error signal e (n).
- the calculation unit 120A is composed of, for example, a DSP (Digital Signal Processor) or an FPGA (Field-Programmable Gate Array).
- the calculation unit 120A operates based on, for example, a filtered-x algorithm.
- the DA converter 116 converts the control signal y (n) into an analog signal.
- the low-pass filter 115 passes the low frequency component of the output signal of the DA converter 116.
- the power amplifier 114 amplifies the output signal of the low-pass filter 115.
- the signal output from the power amplifier 114 is transmitted to the speaker 10 as a control signal. Based on this signal, sound is output from the radiation surface 15.
- the ANC system 500A includes an error microphone 140, a reference microphone 130, and a control device 110A.
- the reference microphone 130, the structure 80, the speaker 10, and the error microphone 140 are arranged in this order.
- the control device 110A executes feed-forward control for controlling the sound output from the speaker 10 based on the output signal of the reference microphone 130 and the output signal of the error microphone 140. According to the feedforward control, not only the periodic signal but also the aperiodic signal can be muted.
- the ANC system 500 performs feedback control.
- the ANC system 500 that performs feedback control may be referred to as a feedback ANC system 500B or an ANC system 500B.
- the control device 110 in the ANC system 500B may be referred to as a control device 110B.
- An ANC system 500B according to an example will be described with reference to FIGS. 14A to 14D.
- the feedback ANC system 500B includes an error microphone 140 and a control device 110B.
- the sound wave to be canceled reaches the region 300 from the noise source 200 and has a waveform 290 in the region 300.
- the speaker 10 emits a sound wave that has a waveform 90 having a phase opposite to that of the waveform 290 when the region 300 is reached.
- These sound waves cancel each other out in the region 300.
- these sound waves are combined in the region 300 to produce a synthetic sound wave with a waveform 390 whose amplitude is reduced to zero or a small level.
- muffling is realized in this way.
- feedback control is performed using the error microphone 140 and the control device 110B.
- the error microphone 140 is arranged in the area 300 and senses the sound in the area 300.
- the control device 110B adjusts the sound wave emitted from the speaker 10 based on the sound sensed by the error microphone 140.
- the number of error microphones 140 included in the ANC system 500B is one.
- Such an ANC system 500B can be referred to as a single channel ANC system 500B.
- the number of error microphones 140 included in the ANC system 500B may be plural.
- Such an ANC system 500B can be referred to as a multi-channel ANC system 500B.
- FIG. 14B schematically shows a single channel ANC system 500B.
- FIG. 14C schematically shows a multi-channel ANC system 500B.
- the single channel ANC system 500B is advantageous from the viewpoint of realizing simple control.
- noise can be reduced at each error microphone 140.
- Providing a plurality of control points by a plurality of error microphones 140 is advantageous from the viewpoint of realizing sound deadening in a wide space.
- FIG. 14D shows a configuration diagram of the control device 110B according to an example.
- the control device 110B includes a power amplifier 114, a low-pass filter 115, a DA converter 116, a pre-amplifier 117, a low-pass filter 118, an AD converter 119, and a calculation unit 120B.
- the pre-amplifier 117 amplifies the output signal of the error microphone 140.
- the low-pass filter 118 passes the low frequency component of the output signal of the preamplifier 117.
- the AD converter 119 converts the output signal of the low-pass filter 118 into a digital signal. As a result, the error signal e (n) at time n is output from the AD converter 119.
- the calculation unit 120B generates a control signal y (n) at time n from the error signal e (n).
- the calculation unit 120B is composed of, for example, a DSP, an FPGA, or the like.
- the calculation unit 120B operates based on, for example, a filtered-x algorithm.
- the DA converter 116 converts the control signal y (n) into an analog signal.
- the low pass filter 115 passes the low frequency component of the output signal of the DA converter 116.
- the power amplifier 114 amplifies the output signal of the low-pass filter 115.
- the signal output from the power amplifier 114 is transmitted to the speaker 10 as a control signal. Based on this signal, sound is output from the radiation surface 15.
- the ANC system 500B includes an error microphone 140 and a control device 110B.
- the structure 80, the speaker 10, and the error microphone 140 are arranged in this order.
- the control device 110B executes feedback control for controlling the sound output from the speaker 10 based on the output signal of the error microphone 140. According to the feedback control, it is possible to mute the periodic signal without the need for the reference microphone 130 of FIG. 13A.
- the control device 110 of the ANC system 500 may have at least one amplifier.
- the control device 110 may have at least one low-pass filter.
- the control device 110 may have at least one AD converter.
- the control device 110 may have at least one DA converter.
- the ANC system 500 can be installed in an office or the like.
- the speaker 10 is attached to the structure 80 which is a partition.
- the noise source 200 is a person in a conference space.
- Area 300 is another conference space.
- the speaker 10 is a piezoelectric speaker including a piezoelectric film.
- the speaker 10 according to the first configuration example may be referred to as a piezoelectric speaker 10.
- the piezoelectric speaker 10 includes a piezoelectric film 35, a first bonding layer 51, an intervening layer 40, and a second bonding layer 52.
- the first bonding layer 51, the intervening layer 40, the second bonding layer 52, and the piezoelectric film 35 are laminated in this order.
- the piezoelectric film 35 includes a piezoelectric body 30, a first electrode 61, and a second electrode 62.
- the piezoelectric body 30 has a film shape.
- the piezoelectric body 30 vibrates when a voltage is applied.
- a ceramic film, a resin film, or the like can be used as the piezoelectric body 30, a ceramic film, a resin film, or the like.
- the materials of the piezoelectric body 30 which is a ceramic film include lead zirconate, lead zirconate titanate, lead zirconate titanate, barium titanate, Bi layered compound, tungsten bronze structure compound, barium titanate and bismuth ferrite. Such as a solid solution of.
- Examples of the material of the piezoelectric body 30 which is a resin film include polyvinylidene fluoride and polylactic acid.
- the material of the piezoelectric body 30 which is a resin film may be a polyolefin such as polyethylene or polypropylene. Further, the piezoelectric body 30 may be a non-porous body or a porous body.
- the thickness of the piezoelectric body 30 is, for example, in the range of 10 ⁇ m to 300 ⁇ m, and may be in the range of 30 ⁇ m to 110 ⁇ m.
- the first electrode 61 and the second electrode 62 are in contact with the piezoelectric body 30 so as to sandwich the piezoelectric body 30.
- the first electrode 61 and the second electrode 62 have a film shape.
- the first electrode 61 and the second electrode 62 are each connected to a lead wire (not shown).
- the first electrode 61 and the second electrode 62 can be formed on the piezoelectric body 30 by vapor deposition, plating, sputtering, or the like.
- Metal foil can also be used as the first electrode 61 and the second electrode 62.
- the metal foil can be attached to the piezoelectric body 30 with a double-sided tape, an adhesive, an adhesive or the like.
- Examples of the material of the first electrode 61 and the second electrode 62 include metals, and specific examples thereof include gold, platinum, silver, copper, palladium, chromium, molybdenum, iron, tin, aluminum, and nickel.
- Examples of the material of the first electrode 61 and the second electrode 62 include carbon, a conductive polymer, and the like.
- Examples of the material of the first electrode 61 and the second electrode 62 include alloys thereof.
- the first electrode 61 and the second electrode 62 may contain a glass component or the like.
- the thickness of the first electrode 61 and the second electrode 62 is, for example, in the range of 10 nm to 150 ⁇ m, and may be in the range of 20 nm to 100 ⁇ m, respectively.
- the first electrode 61 covers the entire main surface of one of the piezoelectric bodies 30. However, the first electrode 61 may cover only a part of the one main surface of the piezoelectric body 30.
- the second electrode 62 covers the entire other main surface of the piezoelectric body 30. However, the second electrode 62 may cover only a part of the other main surface of the piezoelectric body 30.
- the intervening layer 40 is arranged between the piezoelectric film 35 and the first bonding layer 51.
- the intervening layer 40 may be a layer other than the adhesive layer and the adhesive layer, and may be an adhesive layer or an adhesive layer.
- the intervening layer 40 is a porous layer and / or a resin layer.
- the resin layer is a concept including a rubber layer and an elastomer layer, and therefore the intervening layer 40, which is a resin layer, may be a rubber layer or an elastomer layer.
- the intervening layer 40 which is a resin layer
- examples of the intervening layer 40 include an ethylene propylene rubber layer, a butyl rubber layer, a nitrile rubber layer, a natural rubber layer, a styrene butadiene rubber layer, a silicone layer, a urethane layer, and an acrylic resin layer.
- Examples of the intervening layer 40, which is a porous layer include a foam layer and the like.
- the intervening layer 40 which is a porous layer and a resin layer includes an ethylene propylene rubber foam layer, a butyl rubber foam layer, a nitrile rubber foam layer, a natural rubber foam layer, and a styrene butadiene rubber foam layer.
- the intervening layer 40 which is not a porous layer but is a resin layer, include an acrylic resin layer and the like.
- the intervening layer 40 which is not a resin layer but is a porous layer, include a metal porous layer and the like.
- the resin layer refers to a layer containing a resin, which may contain 30% or more of resin, 45% or more of resin, 60% or more of resin, and 80 resin. Refers to a layer that may contain% or more.
- the intervening layer 40 may be a blend layer of two or more kinds of materials.
- Elastic modulus of the intervening layer 40 is, for example, 10000N / m 2 ⁇ 20000000N / m 2, may be a 20000N / m 2 ⁇ 100000N / m 2.
- the pore size of the intervening layer 40 is 0.1 mm to 7.0 mm, and may be 0.3 mm to 5.0 mm.
- the pore size of the intervening layer 40, which is a porous layer is, for example, 0.1 mm to 2.5 mm, may be 0.2 mm to 1.5 mm, and may be 0.3 mm to 0.7 mm. You may.
- the porosity of the intervening layer 40, which is a porous layer is, for example, 70% to 99%, may be 80% to 99%, or may be 90% to 95%.
- the intervening layer 40 which is a foam layer (for example, the foam of Patent Document 2 can be used).
- the intervening layer 40 which is a foam layer, may have an open cell structure, a closed cell structure, or a semi-independent semi-open cell structure.
- the open cell structure refers to a structure in which the open cell ratio is 100%.
- the closed cell structure refers to a structure in which the open cell ratio is 0%.
- the semi-independent semi-open cell structure refers to a structure in which the open cell ratio is larger than 0% and smaller than 100%.
- the "volume of absorbed water” is the mass of water replaced with air in the bubbles of the foam layer after the foam layer is submerged in water and left under a reduced pressure of -750 mmHg for 3 minutes. It is obtained by measuring and converting the density of water into a volume of 1.0 g / cm 3 .
- material density is the density of the base material (medium substance) forming the foam layer.
- the foaming ratio (density ratio before and after foaming) of the intervening layer 40 which is a foam layer, is, for example, 5 to 40 times, and may be 10 to 40 times.
- the thickness of the intervening layer 40 in the uncompressed state is, for example, in the range of 0.1 mm to 30 mm, may be in the range of 1 mm to 30 mm, may be in the range of 1.5 mm to 30 mm, and may be in the range of 2 mm to 25 mm. It may be in the range of.
- the intervening layer 40 is thicker than the piezoelectric film 35.
- the ratio of the thickness of the intervening layer 40 to the thickness of the piezoelectric film 35 is, for example, 3 times or more, 10 times or more, or 30 times or more.
- the intervening layer 40 is thicker than the first bonding layer 51.
- the surface of the first bonding layer 51 forms a fixed surface 17.
- the first bonding layer 51 is a layer bonded to the structure 80. In the example of FIG. 15, the first bonding layer 51 is bonded to the intervening layer 40.
- the first bonding layer 51 is an adhesive or adhesive layer.
- the first bonding layer 51 is an adhesive layer or an adhesive layer.
- the fixed surface 17 is an adhesive surface or an adhesive surface.
- the first bonding layer 51 can be attached to the structure 80. In the example of FIG. 1, the first bonding layer 51 is in contact with the intervening layer 40.
- Examples of the first bonding layer 51 include a double-sided tape having a base material and an adhesive applied to both sides of the base material.
- Examples of the base material of the double-sided tape used as the first bonding layer 51 include a non-woven fabric and the like.
- Examples of the pressure-sensitive adhesive for the double-sided tape used as the first bonding layer 51 include a pressure-sensitive adhesive containing an acrylic resin.
- the first bonding layer 51 may be a layer of an adhesive having no base material.
- the thickness of the first bonding layer 51 is, for example, 0.01 mm to 1.0 mm, and may be 0.05 mm to 0.5 mm.
- the second bonding layer 52 is arranged between the intervening layer 40 and the piezoelectric film 35.
- the second bonding layer 52 is an adhesive or adhesive layer.
- the second bonding layer 52 is an adhesive layer or an adhesive layer.
- the second bonding layer 52 is bonded to the intervening layer 40 and the piezoelectric film 35.
- Examples of the second bonding layer 52 include a double-sided tape having a base material and an adhesive applied to both sides of the base material.
- Examples of the base material of the double-sided tape used as the second bonding layer 52 include a non-woven fabric and the like.
- Examples of the pressure-sensitive adhesive for the double-sided tape used as the second bonding layer 52 include a pressure-sensitive adhesive containing an acrylic resin.
- the second bonding layer 52 may be a layer of an adhesive having no base material.
- the thickness of the second bonding layer 52 is, for example, 0.01 mm to 1.0 mm, and may be 0.05 mm to 0.5 mm.
- the piezoelectric film 35 is integrated with the layer on the fixed surface 17 side by contacting the adhesive surface or the adhesive surface with the piezoelectric film 35.
- the adhesive surface or the adhesive surface is a surface formed by the surface of the second adhesive layer or the adhesive layer 52.
- the piezoelectric speaker 10 is applicable to the ANC system 500.
- the piezoelectric speaker 10 has a shorter time (hereinafter, may be referred to as a delay time) from when an electric signal reaches itself to when a sound is output, as compared with a dynamic speaker. Therefore, the piezoelectric speaker 10 is suitable for the configuration of a small ANC system not only because of its small size but also because the distance between the reference microphone 130 and the piezoelectric speaker 10 can be shortened.
- the reference microphone 130, the control device 110 and the piezoelectric speaker 10 can be attached to one partition.
- a voltage is applied to the piezoelectric film 35 via a lead wire while the piezoelectric speaker 10 is fixed to the structure 80. As a result, the piezoelectric film 35 vibrates, and sound waves are radiated from the piezoelectric film 35.
- the piezoelectric speaker 10 and the ANC system 500 to which the piezoelectric speaker 10 is applied will be further described.
- the piezoelectric speaker 10 can be fixed to the structure 80 by the fixing surface 17. In this way, the ANC system 500 using the piezoelectric speaker 10 can be configured.
- the intervening layer 40 is arranged between the piezoelectric film 35 and the structure 80.
- the piezoelectric film 35 when the piezoelectric film 35 is observed in a plan view, the interposition layer 40 can be arranged in a region of 25% or more of the area of the piezoelectric film 35.
- the intervening layer 40 may be arranged in a region of 50% or more of the area of the piezoelectric film 35, or intervening in a region of 75% or more of the area of the piezoelectric film 35.
- the layer 40 may be arranged, or the intervening layer 40 may be arranged in the entire region of the piezoelectric film 35. Further, 50% or more of the main surface 38 on the side opposite to the fixed surface 17 of the piezoelectric speaker 10 can be formed by the piezoelectric film 35. 75% or more of the main surface 38 may be made of the piezoelectric film 35, or the entire main surface 38 may be made of the piezoelectric film 35.
- the second bonding layer 52 prevents the piezoelectric film 35 and the intervening layer 40 from being separated from each other. From the viewpoint of the above "appropriate restraint", when the piezoelectric film 35 is observed in a plan view, the second bonding layer 52 and the intervening layer 40 are arranged in a region of 25% or more of the area of the piezoelectric film 35. Can be. When the piezoelectric film 35 is observed in a plan view, the second bonding layer 52 and the interposition layer 40 may be arranged in a region of 50% or more of the area of the piezoelectric film 35, and 75 of the area of the piezoelectric film 35. The second bonding layer 52 and the intervening layer 40 may be arranged in the region of% or more, or the second bonding layer 52 and the intervening layer 40 may be arranged in the entire region of the piezoelectric film 35.
- the ratio of the region where the intervening layer 40 is arranged is not a microscopic viewpoint considering the pores derived from the porous structure, but a macroscopic viewpoint. It is defined by.
- the piezoelectric film 35, the porous intervening layer 40, and the second bonding layer 52 are plate-like bodies having a common contour in a plan view, the second bonding layer is formed in a region of 100% of the area of the piezoelectric film 35. It is expressed that the 52 and the intervening layer 40 are arranged.
- the degree of restraint of the intervening layer 40 is 5 ⁇ 10 9 N / m 3 or less.
- the degree of restraint of the intervening layer 40 is, for example, 1 ⁇ 10 4 N / m 3 or more.
- the degree of restraint of the intervening layer 40 is preferably 5 ⁇ 10 8 N / m 3 or less, more preferably 2 ⁇ 10 8 N / m 3 or less, and further preferably 1 ⁇ 10 5 to 5 ⁇ 10 7 N. / M 3 .
- the degree of restraint (N / m 3 ) of the intervening layer 40 is the product of the elastic modulus (N / m 2 ) of the intervening layer 40 and the surface filling rate of the intervening layer 40 as shown in the following equation. It is a value obtained by dividing by a thickness (m) of 40.
- the surface filling rate of the intervening layer 40 is the filling rate (value obtained by subtracting the pore ratio from 1) of the main surface of the intervening layer 40 on the piezoelectric film 35 side. When the pores of the intervening layer 40 are evenly distributed, the surface filling rate can be regarded as equal to the three-dimensional filling rate of the intervening layer 40.
- Degree of restraint (N / m 3 ) Elastic modulus (N / m 2 ) x Surface filling rate ⁇ Thickness (m)
- the degree of restraint can be considered as a parameter representing the degree of restraint of the piezoelectric film 35 by the intervening layer 40. It is expressed by the above equation that the degree of restraint increases as the elastic coefficient of the intervening layer 40 increases. It is expressed by the above equation that the degree of restraint increases as the surface filling rate of the intervening layer 40 increases. It is expressed by the above equation that the smaller the thickness of the intervening layer 40, the greater the degree of restraint. It is necessary to wait for further study on the relationship between the degree of restraint of the intervening layer 40 and the sound generated from the piezoelectric film 35, but if the degree of restraint is excessively large, it is necessary to produce sound on the low frequency side.
- the deformation of the piezoelectric film 35 may be hindered.
- the degree of restraint is excessively small, the piezoelectric film 35 is not sufficiently deformed in the thickness direction and expands and contracts only in the in-plane direction (the direction perpendicular to the thickness direction), and the low frequency side. Sound generation may be blocked.
- the degree of restraint of the intervening layer 40 is set to an appropriate range, the expansion and contraction of the piezoelectric film 35 in the in-plane direction is appropriately converted into the deformation in the thickness direction, the piezoelectric film 35 is appropriately bent as a whole, and the low frequency is low. It can be considered that the side sound is likely to be generated.
- the different layer is, for example, the second adhesive layer 52.
- the structure 80 may have a larger degree of restraint than the intervening layer 40. Even in this case, due to the contribution of the intervening layer 40, low-frequency sound can be generated from the piezoelectric film 35. However, the structure 80 may have the same degree of restraint as the intervening layer 40, or may have a smaller degree of restraint than the intervening layer 40.
- the degree of restraint (N / m 3 ) of the structure 80 is the product of the elastic modulus (N / m 2 ) of the structure 80 and the surface filling rate of the structure 80, and the thickness (m) of the structure 80. It is the value obtained by dividing by.
- the surface filling rate of the structure 80 is the filling rate (value obtained by subtracting the pore ratio from 1) of the main surface of the structure 80 on the piezoelectric film 35 side.
- the structure 80 has greater rigidity (product of Young's modulus and moment of inertia of area), greater Young's modulus and / or greater thickness than the intervening layer 40.
- the structure 80 may have the same rigidity, Young's modulus and / or thickness as the intervening layer 40, and may have a lower rigidity, Young's modulus and / or thickness than the intervening layer 40.
- the Young's modulus of the structure 80 is, for example, 1 GPa or more, may be 10 GPa or more, or may be 50 GPa or more.
- the upper limit of Young's modulus of the structure 80 is not particularly limited, but is, for example, 1000 GPa.
- the piezoelectric film 35 is not completely surrounded by the intervening layer 40.
- "there is a virtual straight line” means that such a straight line can be drawn.
- the intervening layer 40 extends only to the fixed surface 17 side when viewed from the piezoelectric film 35.
- the main surface 38 on the side opposite to the fixed surface 17 of the piezoelectric film 35 constitutes the radial surface 15. That is, the main surface 38 of the piezoelectric film 35 opposite to the intervening layer 40 constitutes the radial surface 15.
- the main surface of the piezoelectric film 35 on the intervening layer 40 side is constrained by the intervening layer 40, so that the expansion and contraction of the piezoelectric film 35 in the in-plane direction can be appropriately converted into deformation in the thickness direction.
- other forms may also be adopted.
- the first layer may be provided on the side of the piezoelectric film 35 opposite to the intervening layer 40.
- the first layer is used to protect the piezoelectric film 35.
- the main surface of the first layer may constitute the radial surface 15.
- a second layer separate from the first layer may constitute the radiation surface 15.
- the thickness of the first layer is, for example, 0.05 mm to 5 mm.
- the material of the first layer is, for example, a polyester-based material.
- the polyester-based material refers to a material containing polyester, which may contain 30% or more of polyester, 45% or more of polyester, 60% or more of polyester, and polyester. Refers to a material that may contain 80% or more of.
- the material of the intervening layer 40 and the material of the first layer are different. When the material of the intervening layer 40 and the material of the first layer are different, the main surface of the piezoelectric film 35 on the intervening layer 40 side is constrained and the main surface of the piezoelectric film 35 on the first layer side is constrained.
- the degree of restraint of the intervening layer 40 and the degree of restraint of the first layer may be different.
- the degree of restraint (N / m 3 ) of the first layer is the product of the elastic modulus (N / m 2 ) of the first layer and the surface filling rate of the first layer, and the thickness of the first layer. It is a value obtained by dividing by (m).
- the surface filling rate of the first layer is the filling rate (value obtained by subtracting the pore ratio from 1) of the main surface of the piezoelectric film 35 side in the first layer.
- the difference between the degree of restraint of the intervening layer 40 and the degree of restraint of the first layer may make it possible to appropriately convert the in-plane expansion and contraction of the piezoelectric film 35 into the deformation in the thickness direction.
- the degree of restraint of the intervening layer 40 is larger than the degree of restraint of the first layer.
- the first layer may have a film shape.
- the first layer may be a non-woven fabric.
- the fixed surface 17 when the piezoelectric film 35 is observed in a plan view, at least a part of the piezoelectric film 35 overlaps with the fixed surface 17 (in the example of FIG. 15, it overlaps with the first bonding layer 51).
- a fixed surface 17 is arranged. From the viewpoint of stably fixing the piezoelectric speaker 10 to the structure 80, the fixed surface 17 is arranged in a region of 50% or more of the area of the piezoelectric film 35 when the piezoelectric film 35 is observed in a plan view. can do.
- the fixed surface 17 may be arranged in a region of 75% or more of the area of the piezoelectric film 35, and the fixed surface 17 is arranged in the entire region of the piezoelectric film 35. You may do so.
- the layers adjacent to each other existing between the piezoelectric film 35 and the fixed surface 17 are joined.
- "between the piezoelectric film 35 and the fixed surface 17" includes the piezoelectric film 35 and the fixed surface 17.
- the first bonding layer 51 and the intervening layer 40 are bonded, the intervening layer 40 and the second bonding layer 52 are bonded, and the second bonding layer 52 and the piezoelectric film 35 are bonded. .. Therefore, the piezoelectric film 35 can be stably arranged regardless of the mounting posture on the structure 80, and the piezoelectric film 35 can be easily mounted on the structure 80. Further, due to the contribution of the intervening layer 40, sound is output from the piezoelectric film 35 regardless of the mounting posture.
- layers adjacent to each other are joined means that layers adjacent to each other are joined in whole or in part. In the illustrated example, layers adjacent to each other are joined in a predetermined region extending along the thickness direction of the piezoelectric film 35 and passing through the piezoelectric film 35, the interposition layer 40, and the fixed surface 17 in this order.
- the thickness of each of the piezoelectric film 35 and the intervening layer 40 is substantially constant. This is often advantageous from various viewpoints such as storage of the piezoelectric speaker 10, usability, and control of sound emitted from the piezoelectric film 35.
- thickness is substantially constant means, for example, that the minimum value of the thickness is 70% or more and 100% or less of the maximum value.
- the minimum thickness of the piezoelectric film 35 and the intervening layer 40 may be 85% or more and 100% or less of the maximum value, respectively.
- the piezoelectric body 30 of the piezoelectric film 35 is a resin film
- the intervening layer 40 is a resin layer that does not function as a piezoelectric film. This is advantageous from the viewpoint of cutting the piezoelectric speaker 10 with scissors, human hands, etc. without causing cracks in the piezoelectric body 30 or the intervening layer 40 (the piezoelectric speaker 10 is scissors, human hands, etc.). Being able to cut with the ANC system 500 contributes to improving the design freedom of the ANC system 500 and facilitates the construction of the ANC system 500).
- the piezoelectric body 30 is a resin film and the intervening layer 40 is a resin layer from the viewpoint of fixing the piezoelectric speaker 10 on the curved surface without causing cracks in the piezoelectric body 30 or the intervening layer 40. ..
- the piezoelectric film 35, the intervening layer 40, the first bonding layer 51, and the second bonding layer 52 have the same contours in a plan view. However, these contours may be deviated.
- the piezoelectric film 35, the intervening layer 40, the first bonding layer 51, and the second bonding layer 52 are rectangular shapes having a lateral direction and a longitudinal direction in a plan view. However, these may be square, circular, elliptical or the like.
- the piezoelectric speaker 10 may include a layer other than the layer shown in FIG.
- the layers other than the layer shown in FIG. 15 are, for example, the above-mentioned first layer and second layer.
- the piezoelectric speaker 110 includes a piezoelectric film 35, a fixed surface 117, and an intervening layer 140.
- the fixing surface 117 can be used to fix the piezoelectric film 35 to the structure 80.
- the intervening layer 140 is arranged between the piezoelectric film 35 and the fixed surface 117 (here, the “interval” includes the fixed surface 117. The same applies to the first configuration example).
- the fixed surface 117 is formed by the surface (main surface) of the intervening layer 140.
- the intervening layer 140 is a porous layer and / or a resin layer.
- the intervening layer 140 is an adhesive layer or an adhesive layer.
- a pressure-sensitive adhesive containing an acrylic resin can be used.
- another pressure-sensitive adhesive for example, a pressure-sensitive adhesive containing rubber, silicone, or urethane may be used.
- the intervening layer 140 may be a blend layer of two or more kinds of materials.
- Elastic modulus of the intervening layer 140 is, for example, 10000N / m 2 ⁇ 20000000N / m 2, may be a 20000N / m 2 ⁇ 100000N / m 2.
- the thickness of the intervening layer 140 in the uncompressed state is, for example, in the range of 0.1 mm to 30 mm, may be in the range of 1 mm to 30 mm, may be in the range of 1.5 mm to 30 mm, and may be in the range of 2 mm to 25 mm. It may be in the range of.
- the intervening layer 140 is thicker than the piezoelectric film 35.
- the ratio of the thickness of the intervening layer 140 to the thickness of the piezoelectric film 35 is, for example, 3 times or more, 10 times or more, or 30 times or more.
- the degree of restraint of the intervening layer 140 is 5 ⁇ 10 9 N / m 3 or less.
- the degree of restraint of the intervening layer 140 is, for example, 1 ⁇ 10 4 N / m 3 or more.
- the degree of restraint of the intervening layer 140 is preferably 5 ⁇ 10 8 N / m 3 or less, more preferably 2 ⁇ 10 8 N / m 3 or less, and further preferably 1 ⁇ 10 5 to 5 ⁇ 10 7 N. / M 3 .
- the definition of the degree of restraint is as explained above.
- the piezoelectric film 35 is integrated with the layer on the fixed surface 117 side by contacting the adhesive surface or the adhesive surface with the piezoelectric film 35.
- the adhesive surface or the adhesive surface is a surface formed by the intervening layer 140.
- the piezoelectric speaker 110 can also be fixed to the structure 80 by the fixing surface 117. In this way, the ANC system 500 using the piezoelectric speaker 110 can be configured.
- Example E1 The structure shown in FIG. 18 was produced by attaching the fixed surface 17 of the piezoelectric speaker 10 to the fixed support member 680. Specifically, a stainless flat plate (SUS flat plate) having a thickness of 5 mm was used as the support member 680. As the first bonding layer 51, an adhesive sheet (double-sided tape) having a thickness of 0.16 mm was used, in which both sides of the non-woven fabric were impregnated with an acrylic adhesive. As the interposition layer 40, a closed-cell foam having a thickness of 3 mm, in which a mixture containing ethylene propylene rubber and butyl rubber was foamed at a foaming ratio of about 10 times, was used.
- the second bonding layer 52 a pressure-sensitive adhesive sheet (double-sided tape) having a thickness of 0.15 mm was used, in which the base material was a non-woven fabric and a pressure-sensitive adhesive containing a solvent-free acrylic resin was applied to both sides of the base material.
- the piezoelectric film 35 a polyvinylidene fluoride film (total thickness 33 ⁇ m) having copper electrodes (including nickel) vapor-deposited on both sides was used.
- the first bonding layer 51, the intervening layer 40, the second bonding layer 52, and the piezoelectric film 35 of the sample E1 have dimensions of 37.5 mm in length ⁇ 37.5 mm in width in a plan view, and the contours overlap in a plan view.
- the support member 680 has dimensions of 50 mm in length and 50 mm in width in a plan view, and covers the first joint layer 51 as a whole. In this way, sample E1 having the configuration shown in FIG. 18 was prepared.
- sample E2 As the interposition layer 40, a semi-independent semi-open cell type foam having a thickness of 3 mm, in which a mixture containing ethylene propylene rubber was foamed at a foaming ratio of about 10 times, was used. This foam contains sulfur.
- a sample E2 similar to the sample E1 was prepared except for the sample E1.
- sample E3 In sample E3, a foam having the same material and structure as the intervening layer 40 of sample E2 and having a thickness of 5 mm was used as the intervening layer 40. A sample E3 similar to the sample E2 was prepared except for the sample E2.
- sample E4 In sample E4, a foam having the same material and structure as the intervening layer 40 of sample E2 and having a thickness of 10 mm was used as the intervening layer 40. A sample E4 similar to the sample E2 was prepared except for the sample E2.
- sample E5 a foam having the same material and structure as the intervening layer 40 of sample E2 and having a thickness of 20 mm was used as the intervening layer 40.
- a sample E5 similar to the sample E2 was prepared except for the sample E2.
- sample E6 As the interposition layer 40, a semi-independent semi-open cell type foam having a thickness of 20 mm, in which a mixture containing ethylene propylene rubber was foamed at a foaming ratio of about 10 times, was used. This foam does not contain sulfur and is more flexible than the foam used as the intervening layer 40 of the samples E2 to E5. A sample E6 similar to the sample E1 was prepared except for the sample E1.
- sample E7 As the interposition layer 40, a semi-independent semi-open cell type foam having a thickness of 20 mm, in which a mixture containing ethylene propylene rubber was foamed at a foaming ratio of about 20 times, was used. A sample E7 similar to the sample E1 was prepared except for the sample E1.
- sample E8 A metal porous body was used as the intervening layer 40. This metal porous body is made of nickel, has a pore diameter of 0.9 mm, and has a thickness of 2.0 mm.
- the second bonding layer 52 the same adhesive layer as the first bonding layer 51 of sample E1 was used.
- a sample E8 similar to the sample E1 was prepared except for the sample E1.
- sample E9 The first bonding layer 51 and the second bonding layer 52 of the sample E1 were omitted, and only the interposing layer 140 was interposed between the piezoelectric film 35 and the structure 80.
- the interposition layer 140 a base material-less pressure-sensitive adhesive sheet having a thickness of 3 mm, which was composed of an acrylic pressure-sensitive adhesive, was used.
- sample E10 As the intervening layer 40, the same intervening layer as the intervening layer 140 of sample E9 was used. A sample E10 similar to the sample E8 was prepared except for the sample E8.
- sample E11 As the intervening layer 40, urethane foam having a thickness of 5 mm was used. A sample E11 similar to the sample E8 was prepared except for the sample E8.
- sample E12 As the intervening layer 40, urethane foam having a thickness of 10 mm was used. This urethane foam has a smaller pore diameter than the urethane foam used as the intervening layer 40 of the sample E11. A sample E12 similar to the sample E8 was prepared except for the sample E8.
- sample E13 As the interposition layer 40, a foam of acrylonitrile butadiene rubber having a thickness of 5 mm and a closed cell type was used. A sample E13 similar to the sample E8 was prepared except for the above.
- sample E14 As the interposition layer 40, a closed-cell type ethylene propylene rubber foam having a thickness of 5 mm was used. A sample E14 similar to the sample E8 was prepared except for the sample E8.
- sample E15 As the interposition layer 40, a closed-cell foam having a thickness of 5 mm, which is a blend of natural rubber and styrene-butadiene rubber, was used. A sample E15 similar to the sample E8 was prepared except for the sample E8.
- sample E16 As the interposition layer 40, a closed-cell type silicone foam having a thickness of 5 mm was used. A sample E16 similar to the sample E8 was prepared except for the sample E8.
- Example E17 As the intervening layer 40, a foam having the same material and structure as the intervening layer 40 of sample E1 and having a thickness of 10 mm was used. As the second bonding layer 52, the same adhesive sheet as that of sample E1 was used. As the piezoelectric body 30 of the piezoelectric film 35, a resin sheet having a thickness of 35 ⁇ m and using polylactic acid derived from corn as a main raw material was used. The first electrode 61 and the second electrode 62 of the piezoelectric film 35 were aluminum films having a thickness of 0.1 ⁇ m, respectively, and were formed by vapor deposition. In this way, a piezoelectric film 35 having a total thickness of 35.2 ⁇ m was obtained. Other than that, a sample E17 similar to the sample E1 was prepared.
- sample R1 The piezoelectric film 35 of sample E1 was designated as sample R1.
- Sample R1 was placed on a table parallel to the ground without adhesion.
- ⁇ Elastic modulus of intervening layer> Small pieces were cut out from the intervening layer. The cut out small pieces were subjected to a compression test at room temperature using a tensile tester (“RSA-G2” manufactured by TA Instruments). As a result, a stress-strain curve was obtained. The elastic modulus was calculated from the initial slope of the stress-strain curve.
- ⁇ Pore diameter of intervening layer> A magnified image of the intervening layer was obtained with a microscope. By image analysis of this enlarged image, the average value of the pore size of the intervening layer was obtained. The obtained average value was taken as the pore size of the intervening layer.
- ⁇ Vacancy rate of intervening layer> A small piece of a rectangular parallelepiped was cut out from the intervening layer. The apparent density was determined from the volume and mass of the cut pieces. The apparent density was divided by the density of the base material (medium substance) forming the intervening layer. As a result, the filling rate was calculated. Further, the filling rate was subtracted from 1. As a result, the porosity was obtained.
- Conductive copper foil tape 70 (CU-35C manufactured by 3M) having a thickness of 70 ⁇ m and a length of 5 mm and a width of 70 mm was attached to the corners of both sides of the piezoelectric film 35. Further, a bagworm clip 75 was attached to each of these conductive copper foil tapes 70. The conductive copper foil tape 70 and the bagworm clip 75 form a part of an electric path for applying an AC voltage to the piezoelectric film 35.
- the configuration for measuring the sample E9 is shown in FIG.
- the configuration of FIG. 20 does not include the first bonding layer 51 and the second bonding layer 52 of FIG. In the configuration of FIG. 20, there is an intervening layer 140.
- the configuration for measuring the sample R1 is based on FIGS. 19 and 20. Specifically, according to FIGS. 19 and 20, conductive copper foil tapes 70 were attached to the corners of both sides of the piezoelectric film 35, and bagworm clips 75 were attached to these tapes 70. The resulting assembly was placed unbonded on a table parallel to the ground.
- FIG. 21 and 22 show block diagrams for measuring the acoustic characteristics of the sample. Specifically, FIG. 21 shows an output system, and FIG. 22 shows an evaluation system.
- a personal computer for audio output (hereinafter, the personal computer may be abbreviated as a PC) 401, an audio interface 402, a speaker amplifier 403, and a sample 404 (samples E1 to E17). And R1 piezoelectric speaker) were connected in this order.
- the speaker amplifier 403 was also connected to the oscilloscope 405 so that the output from the speaker amplifier 403 to the sample 404 could be confirmed.
- WaveGene is installed on the audio output PC401. WaveGene is free software for generating test audio signals.
- As the audio interface 402 QUAD-CAPTURE manufactured by Roland Corporation was used. The sampling frequency of the audio interface 402 was 192 kHz.
- the microphone 501, the acoustic evaluation device (PULSE) 502, and the acoustic evaluation PC 503 were connected in this order.
- Type 4939-C-002 manufactured by B & K was used as the microphone 501.
- the microphone 501 was placed at a position 1 m away from the sample 404.
- Type3052-A-030 manufactured by B & K was used as the acoustic evaluation device 502.
- the output system and the evaluation system were configured in this way, and an AC voltage was applied to the sample 404 from the audio output PC 401 via the audio interface 402 and the speaker amplifier 403.
- the audio output PC401 was used to generate a test audio signal that sweeps from 100 Hz to 100 kHz in 20 seconds.
- the voltage output from the speaker amplifier 403 was confirmed by the oscilloscope 405.
- the sound generated from the sample 404 was evaluated by the evaluation system. In this way, the sound pressure frequency characteristic measurement test was performed.
- a frequency range in which the sound pressure level is 3 dB or more higher than the background noise (the frequency range in which the sound pressure level is maintained above the background noise + 3 dB is less than ⁇ 10% of the peak frequency (frequency at which the sound pressure level peaks). The lower end of (excluding the steep peak part) was judged to be the frequency at which sound begins to appear.
- FIGS. 23A to 42 The evaluation results of Samples E1 to 17 and Sample R1 are shown in FIGS. 23A to 42.
- FIG. 43 shows the frequency characteristics of the sound pressure level of background noise.
- E1 to E17 correspond to samples E1 to 17.
- the ANC evaluation system 800 shown in FIG. 44 was configured by using the same piezoelectric speaker 10 as the piezoelectric speaker 10 of the sample E1 except that the dimensions in a plan view were 35 cm in length and 50 cm in width.
- the piezoelectric speaker 10 was attached to the partition 780. These are arranged so that the noise source 700, the reference microphone 730, the center of the partition 780, the center of the piezoelectric speaker 10, and the error microphone 735 are arranged in a straight line in this order. Further, the control area 790 is set on the piezoelectric speaker 10 side when viewed from the partition 780. A measurement microphone 740 was placed in the control area 790.
- the x direction is the vertical direction of the control area 790.
- the y direction is the lateral direction of the control region 790.
- the z direction is the depth direction of the control region 790.
- the x-direction, y-direction, and z-direction are directions orthogonal to each other.
- the z direction is also the direction in which the noise source 700, the reference microphone 730, the center of the partition 780, the center of the piezoelectric speaker 10, and the error microphone 735 are lined up.
- the z direction is also the direction in which the radiation surface 15 of the piezoelectric speaker 10 faces.
- the noise source 700 Eclipse TD508MK3 manufactured by Fujitsu Ten Co., Ltd. was used.
- the partition 780 a desk side screen R manufactured by Mihashi Kogei Co., Ltd. was used.
- the reference microphone 730 ECM-PC60 manufactured by Sony Corporation was used.
- An ECM-PC60 manufactured by Sony Corporation was used as the error microphone 735.
- An ECM-PC60 manufactured by Sony Corporation was used as the measurement microphone 740.
- the distance between the noise source 700 and the reference microphone 730 is 5 cm.
- the distance between the reference microphone 730 and the partition 780 is 60 cm.
- the distance between the radiation surface 15 of the piezoelectric speaker 10 and the error microphone 735 is 17.5 cm. These intervals are dimensions in the z direction.
- the partition 780 has a rectangular plate shape in a plan view.
- the dimensions of the partition 780 are 60 cm in length ⁇ 45 cm in width ⁇ 0.5 cm in width.
- the dimensions of the control area 790 are 60 cm in length ⁇ 45 cm in width ⁇ 60 cm in depth. These vertical directions are the x direction. These lateral directions are the y direction. The width direction or depth direction of these is the z direction.
- the first margin M1 is 5 cm.
- the second margin M2 is 5 cm. These margins are dimensions in the x direction.
- an output signal PC (personal computer) 750 was used in the ANC evaluation system 800.
- the output signal PC750 was connected to the noise source 700 and the measurement PC760.
- the output signal PC750 transmits a noise signal to the noise source 700.
- the output signal PC750 causes the noise source 700 to radiate a sine wave.
- the output signal PC750 transmits a trigger signal to the measurement PC760.
- the Trigger signal allows each measurement data to be given a common reference time. Specifically, it is possible to obtain sound pressure data with a uniform time axis for 176 measurement points, which will be described later. This enables mapping of the sound pressure distribution shown in FIGS. 45A to 60, which will be described later.
- the reference microphone 730 senses the sound from the noise source 700.
- the output signal of the reference microphone 730 is transmitted to the control device 710.
- the error microphone 735 senses the sound in the control area 790.
- the output signal of the error microphone 735 is transmitted to the control device 710.
- the control device 710 transmits a control signal to the piezoelectric speaker 10 based on the output signals of the reference microphone 730 and the error microphone 735. As a result, the control device 710 controls the sound wave radiated from the piezoelectric speaker 10.
- the measurement microphone 740 senses the sound at the position where it is placed.
- the output signal of the measurement microphone 740 is transmitted to the measurement PC 760.
- the measurement PC 760 receives the Trigger signal from the output signal PC 750 and the output signal of the measurement microphone 740.
- the control area 790 has a measurement cross section 790CS extending in the x-direction and the z-direction.
- 176 measurement points are provided on the measurement cross section 790CS.
- the measurement cross section 790CS is evenly divided into 11 in the x direction and 16 evenly in the z direction.
- the number of measurement points of 176 is the product of the number of divisions 11 in the x direction and the number 16 divisions in the z direction.
- the position of the measurement cross section 790CS in the y direction is the same as the center position of the radiation surface 15 in the y direction.
- An error microphone 735 is provided on the measurement cross section 790CS.
- the measurement microphone 740 is sequentially moved to 176 measurement points. In this way, the microphone 740 cooperates with the measurement PC 760 to measure the sound pressure at 176 measurement points. Specifically, the measurement PC 760 maps the sound pressure distribution at 176 measurement points. By this mapping, the sound field of the measurement cross section 790CS is visualized.
- FIGS. 45A to 62C the part of the control area 790 shown in FIG. 44 far from the partition 780 is not shown.
- 45A to 45C, 47A to 47C, 49A to 49C, 51A to 51C, 53A to 53C, 55A to 55C, 57A to 57C, and 59A to 59C the colors.
- the numerical value of the bar indicates the sound pressure level, and the unit is Pascal (Pa). If this value is positive, it means that the sound pressure is positive, and if this value is negative, it means that the sound pressure is negative.
- FIGS. 45A to 45C show the sound pressure distributions derived from the noise source 700 at different times when the frequency of the sine wave emitted by the noise source 700 is 500 Hz.
- 45A to 45C are arranged in chronological order.
- the series of lines in FIG. 46 show the propagation of a wave surface over time caused by a noise source 700 that emits a 500 Hz sine wave.
- 47A to 47C show the sound pressure distributions derived from the noise source 700 at different times when the frequency of the sine wave emitted by the noise source 700 is 800 Hz.
- 47A to 47C are arranged in chronological order.
- the series of lines in FIG. 48 show the propagation of a wave surface over time caused by a noise source 700 that emits an 800 Hz sine wave.
- each of the series of lines shows the position of a "certain wave surface" at different times.
- the one farther from the partition 780 represents a "certain wave front" at a more advanced time.
- the block arrow in FIG. 46 indicates the propagation direction of the wave surface.
- FIG. 46 was created by the following procedure. First, a plurality of sound pressure distribution maps based on actual measurements at different times, similar to FIGS. 45A to 45C, were acquired. Next, in each of the plurality of sound pressure distribution maps, a line corresponding to a certain wave surface was manually drawn. Next, a plurality of sound pressure distribution maps after drawing a line were superimposed. As a result, a diagram showing a series of lines representing the propagation of the wave surface shown in FIG. 46 was obtained. These explanations regarding the procedure for creating the drawings are the same for FIGS. 48, 50, 52, 54, 56, 58 and 60.
- FIGS. 45A-48 show that diffraction is occurring at the opposing ends of partition 780.
- FIGS. 45A to 48 show that the wave plane generated by the diffraction at these ends propagates around the back of the partition 780.
- FIGS. 45A-48 show that the wave plane generated by the diffraction at these ends propagates so as to approach the axis extending in the z direction through the center of the partition 780.
- the method of propagation of the wave surface shown in FIGS. 45A to 48 is the same as that in FIG.
- Example 1 Measurement of sound emitted by the piezoelectric speaker 10.
- the piezoelectric speaker 10 is vibrated by using the control device 710, and a sound wave for silencing is generated from the piezoelectric speaker 10.
- the control device 710 stores the control signal to be transmitted to the piezoelectric speaker 10.
- the control device 710 transmits the stored control signal to the piezoelectric speaker 10.
- FIGS. 49A to 49C show the sound pressure distributions derived from the piezoelectric speaker 10 at different times when the frequency of the sine wave emitted by the noise source 700 is 500 Hz.
- 49A to 49C are arranged in chronological order.
- the series of lines in FIG. 50 show the propagation of a certain wave surface over time caused by the piezoelectric speaker 10 when the frequency of the sine wave emitted by the noise source 700 is 500 Hz.
- 51A to 51C show the sound pressure distributions derived from the piezoelectric speaker 10 at different times when the frequency of the sine wave emitted by the noise source 700 is 800 Hz.
- 51A to 51C are arranged in chronological order.
- the series of lines in FIG. 52 show the propagation of a certain wave surface over time caused by the piezoelectric speaker 10 when the frequency of the sine wave emitted by the noise source 700 is 800 Hz.
- FIGS. 49A to 52 show that the wave surface propagates from the two outer regions sandwiching the central region of the radial surface 15 of the piezoelectric speaker 10 so as to approach the axis extending in the z direction through the central region. ..
- the method of propagating the wave surface shown in FIGS. 49A to 52 is the same as that in FIG. Specifically, the wave surface of the diffracted wave generated by diffracting the noise from the noise source 700 at the partition 780 and the wave surface derived from the piezoelectric speaker 10 are common in that they propagate while approaching the above axis. ..
- the phase of the sound wave in the first region 15a and the phase of the sound wave in the second region 15b are the same due to the diffraction in the partition 780, and the phase of the sound wave in the first region 15a and the first It can be seen that there is a period in which the positive and negative phases of the sound waves in the three regions 15c are opposite, and the positive and negative phases of the sound waves in the second region 15b and the third region 15c are opposite. For regions 15a, 15b and 15c, see FIGS. 1-3 and related description). From FIGS.
- the positive and negative of the phase of the first sound wave and the phase of the second sound wave are the same by the piezoelectric speaker 10, the phase of the first sound wave and the phase of the third sound wave are opposite, and It can be seen that there is a period in which the phase of the second sound wave and the phase of the third sound wave are opposite to each other (for the first sound wave, the second sound wave, and the third sound wave, refer to FIGS. 1 to 3). Please refer to the explanation given).
- the phase distributions in the first region 15a, the second region 15b, and the third region 15c there is a commonality between the noise derived from the noise source 700 and the sound derived from the piezoelectric speaker 10.
- Example 1 Measurement of sound emitted by dynamic speaker 610
- the piezoelectric speaker 10 of Example 1 was replaced with a dynamic speaker 610.
- This dynamic speaker 610 is a Fostex P650K manufactured by Foster Electric Co., Ltd. Except for this replacement, the sound pressures at 176 measurement points of the measurement cross section 790CS derived from the dynamic speaker 610 were measured and mapped in the same manner as in Example 1.
- FIGS. 53A to 56 show the sound pressure distribution obtained by mapping.
- the dynamic speaker 610 is embedded in the partition 780.
- FIGS. 53A to 53C show sound pressure distributions derived from the dynamic speaker 610 at different times when the frequency of the sine wave emitted by the noise source 700 is 500 Hz.
- 53A to 53C are arranged in chronological order.
- the series of lines in FIG. 54 show the propagation of a wave surface over time caused by the dynamic speaker 610 when the frequency of the sine wave emitted by the noise source 700 is 500 Hz.
- 55A-55C show the sound pressure distributions derived from the dynamic speaker 610 at different times when the frequency of the sine wave emitted by the noise source 700 is 800 Hz.
- 55A to 55C are arranged in chronological order.
- the series of lines in FIG. 56 show the propagation of a wave surface over time caused by the dynamic speaker 610 when the frequency of the sine wave emitted by the noise source 700 is 800 Hz.
- FIGS. 53A to 56 show that a substantially hemispherical wave is radiated from the radiation surface of the dynamic speaker 610, and the wave surface of the substantially hemispherical wave is also substantially hemispherical.
- the method of propagation of the wave surface shown in FIGS. 53A to 56 is the same as that in FIG.
- Example 2 Measurement of sound emitted by flat speaker 620
- the piezoelectric speaker 10 of Example 1 was replaced with a flat speaker 620.
- This flat speaker 620 is an FPS2030M3P1R manufactured by FPS Co., Ltd. Except for this replacement, the sound pressures at 176 measurement points of the measurement cross section 790CS derived from the flat speaker 620 were measured and mapped in the same manner as in Example 1. 57A to 60 show the sound pressure distribution obtained by mapping.
- FIGS. 57A to 57C show sound pressure distributions derived from the flat speaker 620 at different times when the frequency of the sine wave emitted by the noise source 700 is 500 Hz.
- 57A to 57C are arranged in chronological order.
- the series of lines in FIG. 58 show the propagation of a wave surface over time caused by the planar speaker 620 when the frequency of the sine wave emitted by the noise source 700 is 500 Hz.
- 59A to 59C show sound pressure distributions derived from the flat speaker 620 at different times when the frequency of the sine wave emitted by the noise source 700 is 800 Hz.
- 59A to 59C are arranged in chronological order.
- the series of lines in FIG. 60 show the propagation of a wave surface over time caused by the planar speaker 620 when the frequency of the sine wave emitted by the noise source 700 is 800 Hz.
- FIGS. 57A to 60 show that a substantially plane wave is radiated from the radiation surface of the flat speaker 620, and the wave surface of the substantially plane wave is also substantially flat.
- the method of propagation of the wave surface shown in FIGS. 57A to 60 is the same as that in FIG.
- FIGS. 61A and 62A show the muffling state at a certain time when a sine wave is radiated from the noise source 700.
- the color map on the left shows the muffling state of the piezoelectric speaker 10 of the first embodiment.
- the color map on the right shows the muffling state of the flat speaker 620 of Comparative Example 2.
- FIG. 61A shows the sound pressure distribution at a certain time when the frequency of the sine wave emitted by the noise source 700 is 500 Hz.
- FIG. 62A shows the sound pressure distribution at a certain time when the frequency of the sine wave emitted by the noise source 700 is 800 Hz.
- the numerical value on the right side of the color bar indicates the amplification factor, and the unit thereof is dB.
- the amplification factor is X
- it means that the sound pressure when the speaker is ON is XdB amplified with reference to the time when the speaker is OFF.
- a negative amplification factor indicates that a muffling effect is exhibited.
- a positive amplification factor indicates that the noise is amplified.
- the reduction area (RA) indicates the ratio of the measurement cross section 790CS to the region where the amplification factor is -6 dB or less (that is, the region where the muffling effect is well exhibited).
- the amplification area (AA) indicates the ratio occupied by the region where the amplification factor is larger than 0 dB (that is, the region where noise is amplified) in the measurement cross section 790CS.
- FIG. 61B fine hatching is attached to a region where the amplification factor is smaller than 0 dB in FIG. 61A, and rough hatching is attached to a region where the amplification factor is larger than 0 dB.
- FIG. 62B the region where the amplification factor is smaller than 0 dB in FIG. 62A is provided with fine hatching, and the region where the amplification factor is larger than 0 is provided with rough hatching. That is, in FIGS. 61B and 62B, fine hatching is provided in the area where noise is reduced, and rough hatching is provided in the amplification area.
- the hatching in FIGS. 61B and 62B is a rough one manually attached based on the visual inspection of FIGS. 61A and 62A. This point is the same for FIGS. 61C and 62C described later.
- FIG. 61C fine hatching is added to the region where the amplification factor is -6 dB or less in FIG. 61A, and rough hatching is added to the region where the amplification factor is larger than 0.
- FIG. 62C the region where the amplification factor is ⁇ 6 dB or less in FIG. 62A is finely hatched, and the region where the amplification factor is larger than 0 is rough hatched. That is, in FIGS. 61C and 62C, the reduction area is provided with fine hatching, and the amplification area is provided with rough hatching.
- the piezoelectric speaker 10 of the first embodiment when the piezoelectric speaker 10 of the first embodiment is used, when the frequency of the sine wave emitted by the noise source 700 is 500 Hz, the reduction area is about 58% and the amplification area is about about 58%. It is 18%. When the frequency of the sine wave emitted by the noise source 700 is 800 Hz, the reduction area is about 27% and the amplification area is about 18%.
- the superiority of the sound deadening effect of the piezoelectric speaker 10 over the flat speaker 620 is more pronounced when the frequency of the sine wave emitted by the noise source 700 is 800 Hz than when it is 500 Hz.
- the area where noise is reduced and the reduction area are smaller and the amplification area is larger than when the flat speaker 620 of Comparative Example 2 is used. It is expected to be.
- piezoelectric film support structure and degree of freedom of vibration Refer to an example of the support structure of the piezoelectric speaker according to the present invention. As can be seen from FIGS. 6A, 15, 17, 18, and related descriptions, in the piezoelectric speaker 10, the entire surface of the piezoelectric film 35 is interposed through the bonding layers 51 and 52 and the intervening layer 40 to form the structure 80. It is fixed to.
- FIG. 6B A support structure based on this design concept is illustrated in FIG. 6B.
- the frame body 88 supports the peripheral edge portion of the piezoelectric film 35 at a position away from the structure 80.
- an inclusion having a convex upper surface and a non-constant thickness is arranged in a space 48 surrounded by the piezoelectric film 35, the frame body 88, and the structure 80, and the central portion of the piezoelectric film 35 is formed. It is conceivable to push it upward. However, such inclusions are not bonded to the piezoelectric film 35 so as not to interfere with the vibration of the piezoelectric film 35. Therefore, even if inclusions are arranged in the space 48, only the frame body 88 supports the piezoelectric film 35 in a manner that defines its vibration.
- the piezoelectric speaker 10 As described above, in the piezoelectric speaker 108 shown in FIG. 6B, the local support structure of the piezoelectric film 35 is adopted. On the other hand, in the piezoelectric speaker 10 shown in FIG. 6A or the like, the piezoelectric film 35 is not supported at a specific portion. Surprisingly, the piezoelectric speaker 10 exhibits practical acoustic characteristics even though the entire surface of the piezoelectric film 35 is fixed to the structure 80. Specifically, in the piezoelectric speaker 10, up to the peripheral edge of the piezoelectric film 35 can vibrate up and down. The entire piezoelectric film 35 can vibrate up and down. Therefore, as compared with the piezoelectric speaker 108, the piezoelectric speaker 10 has a higher degree of freedom in vibration, which is relatively advantageous for realizing good sounding characteristics.
- the high degree of freedom of vibration may contribute to the formation of the first wave surface 16a and the second wave surface 16b.
- the case where the speaker 10 is the piezoelectric speaker 10 shown in FIG. 15 is drawn.
- the illustration of the first bonding layer 51 and the second bonding layer 52 is omitted.
- a high degree of freedom of vibration can also be obtained when the speaker 10 is the piezoelectric speaker 110 shown in FIG.
- the intervening layer is a porous layer and / or a resin layer is suitable for ensuring the degree of freedom of vibration.
- the intervening layer is a porous layer and / or a resin layer
- the entire surface of the piezoelectric film 35 is fixed to the support member 680
- Practical acoustic characteristics are demonstrated. Therefore, even if the piezoelectric speaker 10 is changed from the sample E1 size difference product to the sample E2 to E17 size difference product in the ANC evaluation system 800, it is considered that the sound pressure distribution having the same tendency as that in FIGS. 49A to 52 appears. Be done.
- the ANC system 500 can also be interpreted as follows; Structure 80 and An ANC system 500 including a speaker 10 attached to a structure 80.
- the speaker 10 includes a radiation surface 15, a piezoelectric film 35, and an intervening layer 40 (or 140), and the intervening layer 40 is arranged between the structure 80 and the piezoelectric film 35.
- the intervening layer 40 is a porous layer and / or a resin layer.
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Acoustics & Sound (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Soundproofing, Sound Blocking, And Sound Damping (AREA)
- Piezo-Electric Transducers For Audible Bands (AREA)
- Diaphragms For Electromechanical Transducers (AREA)
Abstract
Description
構造物と、
前記構造物に取り付けられたスピーカーと、を備えたアクティブノイズコントロールシステムであって、
前記スピーカーは、放射面を含み、
前記放射面は、第1領域と、第2領域と、前記第1領域及び前記第2領域の間の第3領域と、を有し、
前記第3領域を通り前記放射面から離れていくように延びる軸を基準軸と定義したとき、前記スピーカーは、前記第1領域から前記基準軸に近づくように伝搬する第1波面と、前記第2領域から前記基準軸に近づくように伝搬する第2波面と、を形成する、
アクティブノイズコントロールシステムを提供する。
図1に、実施形態に係るアクティブノイズコントロールシステム(ANCシステム)500を示す。ANCシステム500は、構造物80と、スピーカー10と、を備えている。スピーカー10は、構造物80に取り付けられている。
一具体例では、ANCシステム500は、フィードフォワード制御を行う。以下、フィードフォワード制御を行うANCシステム500を、フィードフォワードANCシステム500A又はANCシステム500Aと表記することがある。また、ANCシステム500Aにおける制御装置110を、制御装置110Aと表記することがある。一例に係るANCシステム500Aについて、図13A~図13Dを参照しながら説明する。
一具体例では、ANCシステム500は、フィードバック制御を行う。以下、フィードバック制御を行うANCシステム500を、フィードバックANCシステム500B又はANCシステム500Bと表記することがある。また、ANCシステム500Bにおける制御装置110を、制御装置110Bと表記することがある。一例に係るANCシステム500Bについて、図14A~図14Dを参照しながら説明する。
図15及び図16を用いて、第1構成例に係るスピーカー10を説明する。第1構成例では、スピーカー10は、圧電フィルムを含む圧電スピーカーである。以下、第1構成例に係るスピーカー10を、圧電スピーカー10と称することがある。
拘束度(N/m3)=弾性率(N/m2)×表面充填率÷厚さ(m)
以下、図17を用いて第2構成例に係る圧電スピーカー110を説明する。以下では、第1構成例と同様の部分については、説明を省略することがある。
固定された支持部材680に圧電スピーカー10の固定面17を貼り付けることによって、図18に示す構造を作製した。具体的には、支持部材680として、厚さ5mmのステンレス平板(SUS平板)を用いた。第1接合層51として、不織布の両面にアクリル系粘着剤を含侵させた、厚み0.16mmの粘着シート(両面テープ)を用いた。介在層40として、エチレンプロピレンゴムとブチルゴムとを含む混和物を約10倍の発泡倍率で発泡させた、厚さ3mmで独立気泡型の発泡体を用いた。第2接合層52として、基材が不織布でありその基材の両面に無溶剤型のアクリル樹脂を含む粘着剤が塗布された、厚さ0.15mmの粘着シート(両面テープ)を用いた。圧電フィルム35として、両面に銅電極(ニッケルを含む)が蒸着されたポリフッ化ビニリデンフィルム(総厚み33μm)を用いた。サンプルE1の第1接合層51、介在層40、第2接合層52及び圧電フィルム35は、平面視で縦37.5mm×横37.5mmの寸法を有しており、平面視で輪郭が重複した非分割かつ非枠状の板状形状を有している(後述のサンプルE2~E17及びR1でも同様である)。支持部材680は、平面視で縦50mm×横50mmの寸法を有しており、第1接合層51を全体的に覆っている。このようにして、図18に示す構成を有するサンプルE1を作製した。
介在層40として、エチレンプロピレンゴムを含む混和物を約10倍の発泡倍率で発泡させた、厚さ3mmで半独立半連続気泡型の発泡体を用いた。この発泡体は、硫黄を含むものである。それ以外は、サンプルE1と同様のサンプルE2を作製した。
サンプルE3では、介在層40として、サンプルE2の介在層40と同一材料かつ同一構造の、厚さ5mmの発泡体を用いた。それ以外は、サンプルE2と同様のサンプルE3を作製した。
サンプルE4では、介在層40として、サンプルE2の介在層40と同一材料かつ同一構造の、厚さ10mmの発泡体を用いた。それ以外は、サンプルE2と同様のサンプルE4を作製した。
サンプルE5では、介在層40として、サンプルE2の介在層40と同一材料かつ同一構造の、厚さ20mmの発泡体を用いた。それ以外は、サンプルE2と同様のサンプルE5を作製した。
介在層40として、エチレンプロピレンゴムを含む混和物を約10倍の発泡倍率で発泡させた、厚さ20mmで半独立半連続気泡型の発泡体を用いた。この発泡体は、硫黄を含まないものであり、サンプルE2~E5の介在層40として用いた発泡体に比べて柔軟である。それ以外は、サンプルE1と同様のサンプルE6を作製した。
介在層40として、エチレンプロピレンゴムを含む混和物を約20倍の発泡倍率で発泡させた、厚さ20mmで半独立半連続気泡型の発泡体を用いた。それ以外は、サンプルE1と同様のサンプルE7を作製した。
介在層40として、金属多孔体を用いた。この金属多孔体は、材料がニッケルであり、孔径が0.9mmであり、厚みが2.0mmのものである。第2接合層52として、サンプルE1の第1接合層51と同じ粘着層を用いた。それ以外は、サンプルE1と同様のサンプルE8を作製した。
サンプルE1の第1接合層51及び第2接合層52を省略し、圧電フィルム35と構造物80との間に介在層140のみを介在させた。介在層140として、アクリル系粘着剤によって構成された、厚さ3mmの基材レス粘着シートを用いた。それ以外は、サンプルE1と同様の、図18の支持部材680に図17の積層体が取り付けられた構成を有する、サンプルE9を作製した。
介在層40として、サンプルE9の介在層140と同じ介在層を用いた。それ以外は、サンプルE8と同様のサンプルE10を作製した。
介在層40として、厚さ5mmのウレタンフォームを用いた。それ以外は、サンプルE8と同様のサンプルE11を作製した。
介在層40として、厚さ10mmのウレタンフォームを用いた。このウレタンフォームは、サンプルE11の介在層40として用いたウレタンフォームに比べて孔径が小さいものである。それ以外は、サンプルE8と同様のサンプルE12を作製した。
介在層40として、厚さ5mmで独立気泡型のアクリルニトリルブタジエンゴムの発泡体を用いた。それ以外は、サンプルE8と同様のサンプルE13を作製した。
介在層40として、厚さ5mmで独立気泡型のエチレンプロピレンゴムの発泡体を用いた。それ以外は、サンプルE8と同様のサンプルE14を作製した。
介在層40として、天然ゴムとスチレンブタジエンゴムとがブレンドされた厚さ5mmで独立気泡型の発泡体を用いた。それ以外は、サンプルE8と同様のサンプルE15を作製した。
介在層40として、厚さ5mmで独立気泡型のシリコーンの発泡体を用いた。それ以外は、サンプルE8と同様のサンプルE16を作製した。
介在層40として、サンプルE1の介在層40と同一材料かつ同一構造の、厚さ10mmの発泡体を用いた。第2接合層52として、サンプルE1と同じ粘着シートを用いた。圧電フィルム35の圧電体30として、厚さ35μmのトウモロコシ由来のポリ乳酸を主原料とした樹脂シートを用いた。圧電フィルム35の第1電極61及び第2電極62は、それぞれ、厚さ0.1μmのアルミニウム膜であり、蒸着によって形成した。こうして、総厚みが35.2μmの圧電フィルム35を得た。それ以外は、サンプルE1と同様のサンプルE17を作製した。
サンプルE1の圧電フィルム35を、サンプルR1とした。地面に平行な台上に、接着せずにサンプルR1を置いた。
介在層の厚さは、厚みゲージを用いて測定した。
介在層から、小片を切り出した。切り出した小片に対して、引張試験機(TA Instruments社製「RSA-G2」)を用いて、常温で圧縮試験を行った。これにより、応力-ひずみ曲線を得た。応力-ひずみ曲線の初期傾きから、弾性率を算出した。
顕微鏡により、介在層の拡大画像を得た。この拡大画像を画像解析することにより、介在層の孔径の平均値を求めた。求めた平均値を、介在層の孔径とした。
介在層から直方体の小片を切り出した。切り出した小片の体積及び質量から見かけの密度を求めた。見かけの密度を、介在層を形成する母材(中実体)の密度で除した。これにより、充填率を算出した。さらに1から充填率を差し引いた。これにより、空孔率を得た。
サンプルE2~16については、上述の充填率を表面充填率とした。サンプルE1及び17では、介在層は表面スキン層を有しているため、表面充填率は100%とした。
サンプルE1~E8及びE10~E17を測定するための構成を、図19に示す。圧電フィルム35の両面の角部に、厚さ70μmであり縦5mm×横70mmである導電性銅箔テープ70(3M社製のCU-35C)を取り付けた。また、これらの導電性銅箔テープ70のそれぞれに、みのむしクリップ75を取り付けた。導電性銅箔テープ70及びみのむしクリップ75は、圧電フィルム35に交流電圧を印加するための電気経路の一部を構成する。
・周波数範囲:100Hz~100kHz
・スイープ時間:20秒
・実効電圧:10V
・出力波形:サイン波
・測定時間:22秒
・ピークホールド
・測定範囲:4Hz~102.4kHz
・ライン数:6400
暗騒音よりも3dB以上音圧レベルが大きい周波数域(音圧レベルが暗騒音+3dB以上に保たれる周波数範囲がピーク周波数(音圧レベルがピークとなる周波数)の±10%に満たないような急峻なピーク部を除く)の下端を、音が出始める周波数と判断した。
平面視の寸法を縦35cm×横50cmとしたこと以外はサンプルE1の圧電スピーカー10と同様の圧電スピーカー10を用いて、図44に示すANC評価系800を構成した。
圧電スピーカー10が音を発しておらず、かつ、騒音源700が正弦波を放射している状況で、測定用断面790CSの176個の測定点における音圧を測定し、マッピングした。図45A~図48に、マッピングにより得た音圧分布を示す。なお、図45A~48では、回折音の測定を行っていることが直感的に理解され易くなるように、圧電スピーカー10の図示は省略している。しかし、参考例1の測定は、後述の実施例1と同様、圧電スピーカー10がパーティション780に取り付けられた状態で行った。
参考例1と同様に騒音源700が正弦波を放射している状態で、制御装置710を用いて圧電スピーカー10を振動させ、圧電スピーカー10から消音用の音波を発生させた。この際に、制御装置710に、圧電スピーカー10に送信する制御信号を記憶させた。その後、騒音源700が音を放射していない状態で、制御装置710に、記憶させた制御信号を圧電スピーカー10に送信させた。このようにして、騒音源700が音を放射していない状態で圧電スピーカー10の振動を再現し、測定用断面790CSの176個の測定点における音圧を測定し、マッピングした。図49A~図52に、マッピングにより得た音圧分布を示す。
実施例1の圧電スピーカー10を、ダイナミックスピーカー610に置き換えた。このダイナミックスピーカー610は、フォスター電機株式会社製のFostex P650Kである。この置き換えをしたこと以外は、実施例1と同様にして、ダイナミックスピーカー610に由来する、測定用断面790CSの176個の測定点における音圧を測定し、マッピングした。図53A~図56に、マッピングにより得た音圧分布を示す。なお、ダイナミックスピーカー610は、パーティション780に埋め込まれている。
実施例1の圧電スピーカー10を、平面スピーカー620に置き換えた。この平面スピーカー620は、株式会社エフ・ピー・エス製のFPS2030M3P1Rである。この置き換えをしたこと以外は、実施例1と同様にして、平面スピーカー620に由来する、測定用断面790CSの176個の測定点における音圧を測定し、マッピングした。図57A~図60に、マッピングにより得た音圧分布を示す。
図61A~62Cを用いて、実施例1と比較例2の消音効果の相違を説明する。以下の説明では、スピーカーON時及びスピーカーOFF時という用語を用いることがある。スピーカーON時は、スピーカーから消音用の音が放射されている時を指す。スピーカーOFF時は、スピーカーから消音用の音が放射されていない時を指す。
本発明による圧電スピーカーの支持構造の一例を参照する。図6A、図15、図17、図18及びこれらに関連する説明から理解されるように、圧電スピーカー10では、圧電フィルム35の全面が接合層51、52及び介在層40を介して構造物80に固定されている。
構造物80と、
構造物80に取り付けられたスピーカー10と、を備えたANCシステム500であって、
スピーカー10は、放射面15と、圧電フィルム35と、介在層40(又は140)と、を含み
介在層40は、構造物80と圧電フィルム35の間に配置され、
介在層40は、多孔体層及び/又は樹脂層である、
ANCシステム500。
Claims (12)
- 構造物と、
前記構造物に取り付けられたスピーカーと、を備えたアクティブノイズコントロールシステムであって、
前記スピーカーは、放射面を含み、
前記放射面は、第1領域と、第2領域と、前記第1領域及び前記第2領域の間の第3領域と、を有し、
前記第3領域を通り前記放射面から離れていくように延びる軸を基準軸と定義したとき、前記スピーカーは、前記第1領域から前記基準軸に近づくように伝搬する第1波面と、前記第2領域から前記基準軸に近づくように伝搬する第2波面と、を形成する、
アクティブノイズコントロールシステム。 - 前記スピーカーが形成する前記第1領域における音波を第1音波と定義し、前記スピーカーが形成する前記第2領域における音波を第2音波と定義し、前記スピーカーが形成する前記第3領域における音波を第3音波と定義したとき、前記第1音波の位相と前記第2音波の位相の正負が同じであり、前記第1音波の位相と前記第3音波の位相の正負が逆であり、かつ、前記第2音波の位相と前記第3音波の位相の正負が逆である期間が現れる、
請求項1に記載のアクティブノイズコントロールシステム。 - 前記スピーカーは、圧電フィルムを含む、
請求項1又は2に記載のアクティブノイズコントロールシステム。 - 前記スピーカーは、介在層を含み、
前記介在層は、前記構造物と前記圧電フィルムの間に配置され、
前記介在層は、多孔体層及び/又は樹脂層である、
請求項3に記載のアクティブノイズコントロールシステム。 - 構造物と、
前記構造物に取り付けられたスピーカーと、を備えたアクティブノイズコントロールシステムであって、
前記スピーカーは、放射面と、圧電フィルムと、介在層と、を含み
前記介在層は、前記構造物と前記圧電フィルムの間に配置され、
前記介在層は、多孔体層及び/又は樹脂層である、
アクティブノイズコントロールシステム。 - 前記介在層及び前記圧電フィルムをこの順に通りその後前記介在層を経由せずに前記スピーカーの外部に至る仮想直線が存在する、
請求項4又は5に記載のアクティブノイズコントロールシステム。 - 前記圧電フィルムにおける前記介在層とは反対側の主面が、前記放射面を構成している、又は
前記圧電フィルムにおける前記介在層とは反対側に、第1の層が設けられており、前記第1の層の材料は、前記介在層の材料とは異なる、
請求項4から6のいずれか一項に記載のアクティブノイズコントロールシステム。 - 前記アクティブノイズコントロールシステムは、制御装置を備え、
前記制御装置では、ある周波数範囲が設定されており、
前記制御装置は、前記スピーカーから出力される音の周波数を前記周波数範囲内の値に制御し、
前記周波数範囲の上限の音の波長を基準波長と定義し、前記放射面を平面視で観察したとき、
前記放射面は、対向する第1端部及び第2端部を有し、
前記第1端部と前記構造物の端部の間の第1マージンは、ゼロ以上前記基準波長の1/3以下であり、
前記第2端部と前記構造物の端部の間の第2マージンは、ゼロ以上前記基準波長の1/3以下である、
請求項1から7のいずれか一項に記載のアクティブノイズコントロールシステム。 - 前記アクティブノイズコントロールシステムは、誤差マイクロフォンと、参照マイクロフォンと、制御装置と、を備え、
前記参照マイクロフォンと、前記構造物と、前記スピーカーと、前記誤差マイクロフォンと、はこの順に並んでおり、
前記制御装置は、前記参照マイクロフォンの出力信号及び前記誤差マイクロフォンの出力信号に基づいて、前記スピーカーから出力される音を制御するフィードフォワード制御を実行する、
請求項1から8のいずれか一項に記載のアクティブノイズコントロールシステム。 - 前記アクティブノイズコントロールシステムは、誤差マイクロフォンと、制御装置と、を備え、
前記構造物と、前記スピーカーと、前記誤差マイクロフォンと、はこの順に並んでおり、
前記制御装置は、前記誤差マイクロフォンの出力信号に基づいて、前記スピーカーから出力される音を制御するフィードバック制御を実行する、
請求項1から8のいずれか一項に記載のアクティブノイズコントロールシステム。 - 前記制御装置は、少なくとも1つのアンプリファイアと、少なくとも1つのローパスフィルタと、少なくとも1つのアナログデジタルコンバータと、少なくとも1つのデジタルアナログコンバータと、を有する、請求項9又は10に記載のアクティブノイズコントロールシステム。
- 前記構造物は、板状体である、
請求項1から11のいずれか一項に記載のアクティブノイズコントロールシステム。
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US17/595,617 US12456449B2 (en) | 2019-05-20 | 2020-04-02 | Active noise control system |
| CN202080034969.4A CN113853650B (zh) | 2019-05-20 | 2020-04-02 | 主动噪声控制系统 |
| EP20809590.1A EP3975169A4 (en) | 2019-05-20 | 2020-04-02 | ACTIVE NOISE REDUCTION SYSTEM |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019094731A JP7306650B2 (ja) | 2019-05-20 | 2019-05-20 | アクティブノイズコントロールシステム |
| JP2019-094731 | 2019-05-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2020235231A1 true WO2020235231A1 (ja) | 2020-11-26 |
Family
ID=73454490
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2020/015246 Ceased WO2020235231A1 (ja) | 2019-05-20 | 2020-04-02 | アクティブノイズコントロールシステム |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US12456449B2 (ja) |
| EP (1) | EP3975169A4 (ja) |
| JP (1) | JP7306650B2 (ja) |
| CN (1) | CN113853650B (ja) |
| TW (1) | TWI859218B (ja) |
| WO (1) | WO2020235231A1 (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20250061878A1 (en) * | 2022-02-15 | 2025-02-20 | Nitto Denko Corporation | Active noise control system |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102954843B1 (ko) | 2025-09-09 | 2026-04-20 | 주식회사 그리다 | Ai기반 능동형 소음감쇄장치 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004004583A (ja) | 2002-03-29 | 2004-01-08 | Toshiba Corp | 能動消音装置及び能動消音方法 |
| JP2015215415A (ja) * | 2014-05-08 | 2015-12-03 | 株式会社竹中工務店 | 騒音低減装置 |
| JP2016122187A (ja) | 2014-12-24 | 2016-07-07 | 日東電工株式会社 | 吸音材 |
| WO2017126257A1 (ja) * | 2016-01-19 | 2017-07-27 | 富士フイルム株式会社 | 電気音響変換器 |
Family Cites Families (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01245795A (ja) * | 1988-03-28 | 1989-09-29 | Daikin Ind Ltd | 電子消音装置 |
| JPH02222999A (ja) | 1989-02-23 | 1990-09-05 | Matsushita Electric Works Ltd | パーテイション |
| JP2651383B2 (ja) | 1989-03-14 | 1997-09-10 | パイオニア株式会社 | 指向性を有するスピーカ装置 |
| JPH0486898A (ja) | 1990-07-31 | 1992-03-19 | Matsushita Electric Works Ltd | 遮音パネル |
| JP2961996B2 (ja) * | 1991-10-14 | 1999-10-12 | 株式会社日立製作所 | 低騒音機器 |
| JPH0756580A (ja) | 1993-08-09 | 1995-03-03 | Agency Of Ind Science & Technol | 能動制御型遮音壁体 |
| JPH0865787A (ja) | 1994-08-22 | 1996-03-08 | Biiba Kk | アクティブ狭指向性スピーカシステム |
| JPH09281977A (ja) | 1996-04-12 | 1997-10-31 | Fujitsu Ltd | 騒音制御装置 |
| US5828760A (en) * | 1996-06-26 | 1998-10-27 | United Technologies Corporation | Non-linear reduced-phase filters for active noise control |
| GB9927131D0 (en) | 1999-11-16 | 2000-01-12 | Royal College Of Art | Apparatus for acoustically improving an environment and related method |
| CA2396347A1 (en) | 2000-01-04 | 2001-07-12 | American Technology Corporation | Piezoelectric film sonic emitter |
| US20020015507A1 (en) * | 2000-05-31 | 2002-02-07 | Neil Harris | Loudspeaker |
| JP2003066969A (ja) | 2001-08-28 | 2003-03-05 | Mitsubishi Heavy Ind Ltd | 消音装置、消音方法 |
| JP2003253628A (ja) | 2002-03-06 | 2003-09-10 | Fps:Kk | ノイズキャンセラー付き防音壁 |
| KR20030092458A (ko) * | 2002-05-29 | 2003-12-06 | 김순자 | 음향장치 |
| JP2004036299A (ja) | 2002-07-05 | 2004-02-05 | Sadao Akishita | 能動型遮音パネル |
| JP2004187410A (ja) | 2002-12-03 | 2004-07-02 | Fps:Kk | 列車騒音制御装置 |
| JP2004361938A (ja) | 2003-05-15 | 2004-12-24 | Takenaka Komuten Co Ltd | 騒音低減装置 |
| JP2005003777A (ja) | 2003-06-10 | 2005-01-06 | Rikogaku Shinkokai | 吸音システム |
| JP2006053503A (ja) | 2004-08-10 | 2006-02-23 | Biiba Kk | 直射騒音アクティブ消音制御装置 |
| WO2006051602A1 (ja) | 2004-11-12 | 2006-05-18 | Takenaka Corporation | 騒音低減装置 |
| KR100768523B1 (ko) * | 2005-03-09 | 2007-10-18 | 주식회사 휴먼터치소프트 | 필름스피커를 이용한 능동소음제거 방법 및 장치 |
| JP5227263B2 (ja) | 2008-06-03 | 2013-07-03 | パナソニック株式会社 | 能動騒音低減装置及びシステム |
| JP2010106537A (ja) | 2008-10-30 | 2010-05-13 | Fujifilm Corp | 遮音構造体、遮音システム及び遮音方法 |
| CA2827775A1 (en) | 2011-04-01 | 2012-10-04 | Magna International Inc. | Active buffeting control in an automobile |
| TW201344677A (zh) * | 2012-04-23 | 2013-11-01 | Signal Technology Instr Inc | 噪音抑制裝置 |
| TW201443872A (zh) * | 2012-12-21 | 2014-11-16 | Bayer Materialscience Ag | 具有用於消除噪音之電活性聚合物致動器之音響裝置 |
| JP6579924B2 (ja) | 2015-11-13 | 2019-09-25 | 三菱日立パワーシステムズ株式会社 | 煙突騒音低減システム及び煙突騒音低減システムの設定方法 |
| KR101850801B1 (ko) * | 2016-09-05 | 2018-04-23 | 한국과학기술연구원 | Mri 장치 내에서 이용되는 초음파 자극 장치 |
| TWI648992B (zh) * | 2016-09-30 | 2019-01-21 | 美律實業股份有限公司 | 抗噪耳機 |
| US12071761B2 (en) | 2017-11-21 | 2024-08-27 | Nitto Denko Corporation | Sound reducing system |
| JP7037476B2 (ja) | 2018-12-27 | 2022-03-16 | 本田技研工業株式会社 | 板状部材を制振する装置 |
-
2019
- 2019-05-20 JP JP2019094731A patent/JP7306650B2/ja active Active
-
2020
- 2020-04-02 WO PCT/JP2020/015246 patent/WO2020235231A1/ja not_active Ceased
- 2020-04-02 US US17/595,617 patent/US12456449B2/en active Active
- 2020-04-02 CN CN202080034969.4A patent/CN113853650B/zh active Active
- 2020-04-02 EP EP20809590.1A patent/EP3975169A4/en active Pending
- 2020-04-13 TW TW109112375A patent/TWI859218B/zh active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004004583A (ja) | 2002-03-29 | 2004-01-08 | Toshiba Corp | 能動消音装置及び能動消音方法 |
| JP2015215415A (ja) * | 2014-05-08 | 2015-12-03 | 株式会社竹中工務店 | 騒音低減装置 |
| JP2016122187A (ja) | 2014-12-24 | 2016-07-07 | 日東電工株式会社 | 吸音材 |
| WO2017126257A1 (ja) * | 2016-01-19 | 2017-07-27 | 富士フイルム株式会社 | 電気音響変換器 |
Non-Patent Citations (1)
| Title |
|---|
| See also references of EP3975169A4 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20250061878A1 (en) * | 2022-02-15 | 2025-02-20 | Nitto Denko Corporation | Active noise control system |
Also Published As
| Publication number | Publication date |
|---|---|
| US12456449B2 (en) | 2025-10-28 |
| TW202044227A (zh) | 2020-12-01 |
| EP3975169A4 (en) | 2023-01-25 |
| JP2020190599A (ja) | 2020-11-26 |
| EP3975169A1 (en) | 2022-03-30 |
| CN113853650A (zh) | 2021-12-28 |
| TWI859218B (zh) | 2024-10-21 |
| JP7306650B2 (ja) | 2023-07-11 |
| US20220223136A1 (en) | 2022-07-14 |
| CN113853650B (zh) | 2025-09-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2025170423A (ja) | 消音システム | |
| JP2024016278A (ja) | 圧電スピーカー | |
| JP7306650B2 (ja) | アクティブノイズコントロールシステム | |
| WO2022054475A1 (ja) | アクティブノイズコントロールシステム | |
| US20200342844A1 (en) | Soundproof structure | |
| JP7353183B2 (ja) | 圧電スピーカー | |
| JP7353182B2 (ja) | 圧電スピーカー形成用積層体 | |
| US20250061878A1 (en) | Active noise control system | |
| JP2026054799A (ja) | 圧電スピーカー | |
| JP2026054800A (ja) | 圧電スピーカー | |
| JP2026054801A (ja) | 圧電スピーカー | |
| TW202614639A (zh) | 壓電揚聲器 | |
| JP2024128821A (ja) | アクティブノイズコントロールシステム及びアクティブノイズコントロール方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 20809590 Country of ref document: EP Kind code of ref document: A1 |
|
| NENP | Non-entry into the national phase |
Ref country code: DE |
|
| ENP | Entry into the national phase |
Ref document number: 2020809590 Country of ref document: EP Effective date: 20211220 |
|
| WWG | Wipo information: grant in national office |
Ref document number: 202080034969.4 Country of ref document: CN |
|
| WWG | Wipo information: grant in national office |
Ref document number: 17595617 Country of ref document: US |