WO2023061340A1 - 用于射线检查的成像系统和方法 - Google Patents

用于射线检查的成像系统和方法 Download PDF

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Publication number
WO2023061340A1
WO2023061340A1 PCT/CN2022/124449 CN2022124449W WO2023061340A1 WO 2023061340 A1 WO2023061340 A1 WO 2023061340A1 CN 2022124449 W CN2022124449 W CN 2022124449W WO 2023061340 A1 WO2023061340 A1 WO 2023061340A1
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WIPO (PCT)
Prior art keywords
detector
imaging
ray source
assembly
region
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Ceased
Application number
PCT/CN2022/124449
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English (en)
French (fr)
Inventor
陈志强
张丽
金鑫
杨洪恺
许晓飞
赵振华
张思远
陈昶羽
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Tsinghua University
Nuctech Co Ltd
Original Assignee
Tsinghua University
Nuctech Co Ltd
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Priority to PL22880277.3T priority Critical patent/PL4393406T3/pl
Priority to EP22880277.3A priority patent/EP4393406B1/en
Priority to ES22880277T priority patent/ES3057526T3/es
Publication of WO2023061340A1 publication Critical patent/WO2023061340A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0012—Biomedical image inspection
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/03—Computed tomography [CT]
    • A61B6/032—Transmission computed tomography [CT]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/027—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis characterised by the use of a particular data acquisition trajectory, e.g. helical or spiral
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/40—Arrangements for generating radiation specially adapted for radiation diagnosis
    • A61B6/4007—Arrangements for generating radiation specially adapted for radiation diagnosis characterised by using a plurality of source units
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/40—Arrangements for generating radiation specially adapted for radiation diagnosis
    • A61B6/4007—Arrangements for generating radiation specially adapted for radiation diagnosis characterised by using a plurality of source units
    • A61B6/4014—Arrangements for generating radiation specially adapted for radiation diagnosis characterised by using a plurality of source units arranged in multiple source-detector units
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4275—Arrangements for detecting radiation specially adapted for radiation diagnosis using a detector unit almost surrounding the patient, e.g. more than 180°
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/54—Control of apparatus or devices for radiation diagnosis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/25—Determination of region of interest [ROI] or a volume of interest [VOI]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/52—Devices using data or image processing specially adapted for radiation diagnosis
    • A61B6/5258—Devices using data or image processing specially adapted for radiation diagnosis involving detection or reduction of artifacts or noise
    • A61B6/5282—Devices using data or image processing specially adapted for radiation diagnosis involving detection or reduction of artifacts or noise due to scatter
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10072—Tomographic images
    • G06T2207/10081—Computed x-ray tomography [CT]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/03—Recognition of patterns in medical or anatomical images
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/12—Acquisition of 3D measurements of objects

Definitions

  • the present application relates to the technical field of perspective imaging, in particular to an imaging system for radiographic examination.
  • CT Computer Tomography
  • existing CT scanning systems may include dynamic helical CT scanning systems and static CT scanning systems.
  • the existing CT scanning system whether it is a dynamic spiral CT scanning system or a static CT scanning system, usually the X-ray emission range of the radiation source needs to cover the entire inspected object, that is, scan and image the entire inspected object, and these A CT scanning system only emits X-rays at a single target point at a time.
  • the existing static CT scanning system may use a single distributed ray source and a set of detector systems, or may use multiple distributed ray sources and a common set of detector systems.
  • the same detector system can only receive X-rays from one target at the same time. Therefore, the scanning speed of these CT scanning systems is limited by the rotational speed of the slip ring used in the dynamic helical scanning and the radiation emission frequency of the radiation source.
  • the scanning speed is also limited by the ray emission frequency of the ray source.
  • ROI region of interest
  • the scanning speed is required to be high, such as ROI imaging of a living body.
  • an additional detector system can be added, but this will greatly increase the size and cost of the CT scanning system.
  • An object of the present application to provide an imaging system and method capable of scanning only a region of interest.
  • An object of the present application is to provide an imaging system and method capable of increasing beam output frequency.
  • An object of the present application is to provide an imaging system and method capable of reducing equipment size and cost. It is an object of the present application to provide an imaging system and method that can better resolve intra-CT problems.
  • An object of the present application is to provide an imaging system and method capable of reducing the influence of scattered signals.
  • an imaging system for radiographic inspection including: an inspection area, wherein the object to be inspected can enter the inspection area, the inspection area includes an imaging area, and a region of interest of the object to be inspected can enter the imaging area.
  • the area is a local area of the object to be inspected;
  • the first ray source component is used to emit X-rays, wherein the first ray source component includes a plurality of distributed ray sources, and each distributed ray source includes a plurality of first targets, All first target points of the first ray source assembly are arranged in the plane of the first ray source;
  • the first detector assembly is used to receive X-rays emitted from the first ray source assembly and transmitted through the imaging area of the imaging system, wherein,
  • the first detector assembly includes a plurality of first detector units, each first detector unit includes a plurality of first detector crystals, the plurality of first detector units are arranged in a detector plane, and the detector plane is connected to the first The ray source planes are spaced apart by
  • the imaging system further includes a carrying device for carrying the object to be inspected, wherein the imaging system is configured such that the first ray source assembly and the first detector assembly can move relative to the carrying device along the traveling direction , so that the region of interest of the inspected object can enter the imaging region.
  • the carrying device is configured to be able to transport the inspected object along the direction of travel.
  • the carrying device is further configured to be able to adjust the position of the region of interest of the object under inspection relative to the imaging region, so that the region of interest of the object under inspection is located within the imaging region.
  • the imaging area is located between the first radiation source plane and the outer edge of the first detector assembly away from the first radiation source assembly, wherein the imaging area is defined sufficiently to accommodate the region of interest.
  • the imaging region is defined as a cylindrical region having a central axis.
  • the direction of travel is substantially parallel to the central axis.
  • the detector plane and the first ray source plane are parallel to each other.
  • the plurality of distributed radiation sources of the first radiation source assembly are configured to have a combined extension angle greater than 180 degrees around the imaging area.
  • the multiple distributed radiation sources of the first radiation source assembly are configured to extend completely around the imaging area to form a first radiation source ring.
  • the radiation emission range of each first target point of the first radiation source assembly is selected to be insufficient to cover the inspection area.
  • each first target point of the first radiation source assembly is configured to deflect toward the first detector unit of the first detector assembly by a first deflection angle along the traveling direction.
  • the first deflection angle is between 1 degree and 5 degrees.
  • the first radiation source assembly is configured to be able to rotate within a predetermined range relative to the carrying device, so as to adjust the position of the region of interest of the object under inspection relative to the imaging region, so that the The region of interest of the examination object is located within the imaging region.
  • the first radiation source assembly further includes at least one second target point, the radiation emission range of the second target point is selected to be able to cover the inspection area, wherein the radiation source control device is further configured: when the second target point When the first target point of a ray source component emits X-rays, the second target point does not emit X-rays, and when the second target point of the first ray source component emits X-rays, the first target point does not emit X-rays.
  • the first radiation source assembly includes a plurality of second target points, wherein the radiation source control device is configured such that the first radiation source assembly simultaneously inspects from at least two second target points at the same time The area emits X-rays, wherein, among at least two second target points that emit X-rays to the inspection area while the first ray source assembly is used, the first detector crystals corresponding to the ray emission ranges of any two second target points are mutually do not coincide.
  • the first detector assembly is arranged to be located radially inside the first radiation source assembly.
  • the first detector assembly is configured to extend completely around the imaging region to form a detector ring.
  • the first detector unit of the first detector assembly includes a single row of first detector crystals or multiple rows of first detector crystals.
  • the imaging system further includes a second detector assembly for receiving X-rays scattered from the object to be inspected, wherein the second detector assembly includes a plurality of second detector units, each of which The two-detector unit includes a plurality of second detector crystals.
  • the multiple second detector units of the second detector assembly are arranged corresponding to the multiple first detector units of the first detector assembly.
  • the imaging system further includes a shield arranged such that the second detector unit does not receive direct X-rays emitted from the first radiation source assembly.
  • the second detector crystal of each second detector unit is arranged to be spaced apart from the first detector crystal of the corresponding first detector unit, so that the second detector crystal The detector unit does not receive direct X-rays emitted from the first ray source assembly.
  • the number of second detector crystals of each second detector unit is equal to the number of first detector crystals of the corresponding first detector unit; or the number of first detector crystals of each second detector unit The number of second detector crystals is smaller than the number of first detector crystals of the corresponding first detector unit.
  • the imaging system further includes: a second ray source assembly for emitting X-rays, wherein the second ray source assembly includes a plurality of distributed ray sources, and each distributed ray source includes a plurality of The third target point, all the third target points of the second ray source assembly are arranged in the second ray source plane, the detector plane is separated from the second ray source plane by a predetermined distance along the travel direction, wherein the first detector assembly also configured to receive X-rays emitted from the second ray source assembly and transmitted through the imaging region of the imaging system, wherein the first ray source plane, the detector plane and the second ray source plane are sequentially distributed along the traveling direction, wherein the ray The source control device is configured such that when the region of interest is at least partly located in the imaging region, the second ray source assembly simultaneously emits X-rays from at least two third target points to the imaging region at the same moment, wherein, the second ray source Among the at least two third target points of the
  • the imaging system is configured so that the first ray source assembly, the first detector assembly and the second ray source assembly can move relative to the carrying device along the traveling direction, so that the region of interest of the object to be inspected can be into the imaging area.
  • the imaging region is located between the first ray source plane and the second ray source plane, wherein the imaging region is limited enough to accommodate the region of interest.
  • the imaging region is defined as a cylindrical region having a central axis.
  • the detector plane, the first ray source plane and the second ray source plane are parallel to each other.
  • the ray source control device is configured to make at least one first target point of the first ray source assembly and the second ray source At least one third target point of the component simultaneously emits X-rays to the imaging area at the same time, and wherein, at least one first target point of the first ray source component and at least one third target point of the second ray source component simultaneously emit X-rays to the imaging area
  • the detector crystal of the first detector component corresponding to the ray emission range of the first target point of the first ray source component and the ray emission range corresponding to the third target point of the second ray source component
  • the detector crystals of a detector assembly do not coincide with each other.
  • the imaging system is further configured to reconstruct a three-dimensional scanned image of the region of interest of the inspected object based on the detection data of the first detector assembly.
  • Another aspect of the present application provides an imaging method using the imaging system according to the embodiment of the present application, including: (a) making the object under inspection carried on the carrying device of the imaging system; and (b) making the first imaging system of the imaging system A ray source assembly and the first detector assembly move relative to the carrying device along the traveling direction, so that the region of interest of the object to be inspected can enter the imaging area, and at the same time the first ray source assembly emits X-rays and transmits the X-rays through the imaging area is received by the first detector assembly, wherein the step of emitting X-rays by the first ray source assembly includes: causing the first ray source assembly to simultaneously emit X-rays from at least two first target points to the imaging area at the same time, wherein, Among the at least two first target points that emit X-rays to the imaging area while the first ray source assembly is running, the ray emission range of each first target point can cover the imaging area, and the rays of any two first target points
  • the imaging method further includes adjusting the position of the region of interest of the object to be inspected relative to the imaging region through the carrying device after the object to be inspected is carried on the carrying device in step (a), so that the object to be inspected is The region of interest of the examination object is located within the imaging region.
  • the imaging method further includes: after the object to be inspected is carried on the carrying device in step (a), observing along the traveling direction, and rotating the first radiation source assembly relative to the carrying device within a predetermined range , to adjust the position of the region of interest of the object under inspection relative to the imaging region, so that the region of interest of the object under inspection is located within the imaging region.
  • the step of emitting X-rays by the first ray source assembly further includes: emitting X-rays from the second target point of the first ray source assembly, and the radiation emission range of the second target point is selected to be able to cover the inspection area, wherein, when the first target point of the first ray source assembly emits X-rays, the second target point does not emit X-rays, and when the second target point of the first ray source assembly emits X-rays, the first target point Does not emit X-rays.
  • the ray source assembly of the imaging system can simultaneously emit X-rays from multiple target points, thereby increasing the ray emission frequency of the imaging system, especially without increasing the occupied volume of the imaging system and additional In the case of the detector cost, the ray emission frequency is increased.
  • the imaging system can only perform transmission imaging on the imaging area and the area of interest of the inspected object located therein, thereby reducing the occupied volume and cost of the imaging system .
  • the detector crystals corresponding to the simultaneously emitted targets non-coincident with each other, it is possible to collect signals without interfering with each other while emitting beams from multiple targets at the same time, which can help image reconstruction and improve transmission scanning efficiency.
  • FIG. 1 is a schematic diagram of an imaging system according to some embodiments of the present application.
  • FIG. 2 is a schematic cross-sectional view of an imaging system according to some embodiments of the present application.
  • FIG. 3 is a schematic diagram of radiation emission of an imaging system according to some embodiments of the present application.
  • FIG. 4 is a schematic partial cross-sectional view of an imaging system according to some embodiments of the present application.
  • FIG. 5 is a schematic diagram of a first detector assembly and a second detector assembly, according to some embodiments of the present application.
  • FIG. 6 is a schematic diagram of a first detector assembly and a second detector assembly, according to some embodiments of the present application.
  • FIG. 7 is a schematic diagram of a first detector assembly and a second detector assembly, according to some embodiments of the present application.
  • FIG. 8 is a schematic partial cross-sectional view of an imaging system including a second detector assembly and a shield, according to some embodiments of the present application.
  • FIG. 9 is a schematic partial cross-sectional view of an imaging system including a second detector assembly and a shield, according to some embodiments of the present application.
  • FIG. 10 is a schematic partial cross-sectional view of an imaging system including a second detector assembly and a shield, according to some embodiments of the present application.
  • Fig. 11 is a schematic cross-sectional view of an imaging system including a second radiation source assembly according to some embodiments of the present application.
  • the imaging system and imaging method for radiographic inspection according to the embodiments of the present application can be applied in fields such as medical treatment, security inspection, and industry, for performing perspective imaging inspection on objects or human bodies.
  • FIG. 1 is a schematic diagram of an imaging system according to some embodiments of the present application.
  • 2 is a schematic cross-sectional view of an imaging system according to some embodiments of the present application.
  • FIG. 3 is a schematic diagram of radiation emission of an imaging system according to some embodiments of the present application.
  • an imaging system for radiation inspection includes: an inspection area 100 , a first radiation source assembly 200 and a first detector assembly 300 .
  • the first ray source assembly 200 is used for emitting X-rays.
  • the first detector assembly 300 is used for receiving X-rays emitted from the first ray source assembly 200 and transmitted through the inspection region 100 of the imaging system.
  • the first radiation source assembly 200 and the first detector assembly 300 are arranged to surround the inspection area 100 , that is, to be located radially outside the inspection area 100 .
  • the imaging system is configured so that the first ray source assembly 200 and the first detector assembly 300 can move relative to the inspected object along the traveling direction.
  • the imaging system defines an examination region 100 .
  • "inspection area” means an area into which an object to be inspected can enter.
  • inspection region 100 includes a first end and a second end.
  • the inspected object is conveyed into the inspection region 100 from one of the first end and the second end, and exits the inspection region 100 from the other.
  • the inspected object includes a region of interest (ROI), which is a local area of the inspected object.
  • ROI region of interest
  • the examination region 100 includes an imaging region 110 having a central axis, ie the imaging region 110 is a partial region of the examination region 100 .
  • imaging region means a region where a region of interest of an object to be inspected can enter and be subjected to X-ray transmission inspection.
  • the imaging region 110 is sized sufficiently to accommodate the region of interest of the object under examination.
  • the central axis of the imaging region means an axis passing through the approximate center of a cross section of the imaging region perpendicular to the traveling direction (described below).
  • the examination region and the imaging region are fixed relative to the first detector assembly 300 (and the second detector assembly 600 described below).
  • the inspection region and the imaging region are fixed relative to the first radiation source assembly 200 and the first detector assembly 300 (and the second radiation source assembly 700 and the second detector assembly 600 described below).
  • the imaging system further includes a carrying device 400 for carrying the object to be inspected.
  • the first radiation source assembly 200 and the first detector assembly 300 can move relative to the carrying device 400 along the traveling direction.
  • the region of interest of the object to be examined can enter the imaging region 110 of the examination region 100 .
  • the carrier device 400 is used to transport the inspected object into the inspection area 100 along the travel direction.
  • the direction of travel is parallel to the horizontal direction.
  • the carrying device 400 can reciprocally transport the inspected object through the inspection area 100 along the traveling direction, ie transport the inspected object back and forth in the opposite direction.
  • the carrying device 400 transports the inspected object in a uniform linear motion.
  • the direction of travel is substantially parallel to the central axis of imaging region 110 .
  • the carrier device 400 is a conveyor belt or a loading platform.
  • the imaging system may further include a shielding component 500 .
  • the shielding member 500 may be arranged to surround the examination region 100 of the imaging system.
  • the first radiation source assembly 200 and the first detector assembly 300 are arranged around the inspection area 100 and located outside the shielding component 500 , ie on a side of the shielding component 500 away from the inspection area 100 .
  • axial means a direction parallel to the direction of travel
  • radial means a direction radiating outward from the central axis in a plane perpendicular to the direction of travel
  • circumferential means a direction perpendicular to the direction of travel A direction that is in-plane and perpendicular to Radial.
  • the first radiation source assembly 200 includes multiple distributed radiation sources 210, and each distributed radiation source 210 includes multiple first targets.
  • each distributed radiation source 210 includes a separate housing to define a separate vacuum space, and includes a plurality of first targets packaged in the housing.
  • the plurality of first targets of each distributed radiation source 210 has a uniform distance between targets.
  • multiple first target points of each distributed radiation source 210 are distributed along a straight line.
  • each distributed radiation source 210 defines a separate vacuum space, and thus does not share the vacuum space with other distributed radiation sources 210 . Vacuum spaces of different distributed radiation sources 210 are not connected. According to some embodiments of the present application, each distributed radiation source 210 can be disassembled and/or installed in the imaging system independently from other distributed radiation sources 210 .
  • the multiple first targets in the distributed radiation source 210 have a uniform distance between targets.
  • the present application is not limited thereto.
  • the multiple first targets in the distributed ray source 210 may also be arranged non-uniformly, that is, have non-uniform target point spacing.
  • the multiple first target points in each distributed radiation source 210 are arranged along a straight line. However, the present application is not limited thereto. In some embodiments, the multiple first target points in the distributed radiation source 210 may also be arranged along an arc, a broken line, or the like.
  • all the first targets of the multiple distributed radiation sources 210 of the first radiation source assembly 200 are arranged in the same plane (hereinafter referred to as "the first radiation source plane"), that is, the first The multiple distributed radiation sources 210 of the radiation source assembly 200 are coplanarly arranged.
  • the target points are located in the same plane means that the beam exit points of the target points are all located in the same plane.
  • the plane of the first radiation source is substantially perpendicular to the direction of travel (or central axis).
  • the plurality of distributed radiation sources 210 of the first radiation source assembly 200 completely extend around the imaging region 110 , that is, the angle of continuous extension around the imaging region 110 substantially reaches 360° viewed along the traveling direction.
  • the multiple distributed radiation sources 210 of the first radiation source assembly 200 form a complete and continuous first radiation source ring.
  • the first ray source ring may be a circular ring, a square ring, a rectangular ring, a polygonal ring, and the like.
  • the multiple first distributed radiation sources 210 of the first radiation source assembly 200 form a polygonal ring.
  • the multiple distributed radiation sources 210 of the first radiation source assembly 200 form a complete radiation source ring.
  • the radiation source ring formed by the multiple distributed radiation sources 210 of the first radiation source assembly 200 may be incomplete, that is, there is a gap.
  • the multiple distributed radiation sources 210 of the first radiation source assembly 200 are divided into multiple segments, and the distributed radiation sources 210 of different segments may be distributed around the imaging area 110 at intervals.
  • the plurality of distributed radiation sources 210 of the first radiation source assembly 200 have a combined extension angle greater than 180 degrees around the imaging region 110 relative to the central axis.
  • the extension angle of each distributed ray source 210 around the imaging area 110 with respect to the central axis indicates that all the first target points of the distributed ray source 210 are relative to the imaging area 110 (relative to the central axis of the imaging area 110) angle range.
  • the multiple distributed radiation sources 210 at different scanning positions relative to the imaging area 110 can provide a combined extension angle.
  • the “combined extension angle” refers to the angle range generated by combining the extension angles of the plurality of distributed radiation sources 210 at different scanning positions relative to the imaging region 110 .
  • the combined extension angles of the multiple distributed radiation sources 210 at different scanning positions relative to the imaging region 110 may be continuous or discontinuous.
  • the multiple distributed radiation sources 210 of the first radiation source assembly 200 form a radiation source ring.
  • the present application is not limited thereto.
  • the plurality of distributed radiation sources 210 of the first radiation source assembly 200 may only partially extend continuously around the imaging area 110, that is, the plurality of distributed radiation sources 210 of the first radiation source assembly 200 are relatively
  • the axis provides a continuous combined extension angle around the imaging region 110 and the combined extension angle is less than 360°.
  • the continuous combination of the multiple distributed radiation sources 210 of the first radiation source assembly 200 extends around the imaging region 110 at an angle greater than 180° and less than 360° relative to the central axis.
  • the first detector assembly 300 is used for receiving X-rays emitted from the first ray source assembly 200 and transmitted through the imaging region 110 of the imaging system.
  • the first detector assembly 300 includes a plurality of detector units 310 .
  • the arrangement of the detector units in the first detector assembly 300 can be set according to the arrangement of the distributed radiation sources 210 in the first radiation source assembly 200 and/or the size of the inspected object and other factors.
  • the arrangement of the detector units in the first detector assembly 300 can also adopt a cost-effective arrangement, that is, use as few detector units as possible to meet the imaging requirements.
  • each first detector unit 310 of the first detector assembly 300 includes a plurality of first detector crystals.
  • each detector unit 310 is arranged so as not to block the X-rays emitted by the distributed radiation sources 210 on the same side, and to receive the X-rays emitted by the distributed radiation sources 210 on the other side.
  • the plurality of first detector units 310 are arranged in the same plane (hereinafter referred to as "detector plane").
  • the detector units are arranged in the same plane means that the central planes of the detector units (for example, the central plane of the detector crystal) are all arranged in the same plane.
  • the central planes of the multiple first detector units 310 are arranged in the same plane through the same positioning reference.
  • the detector plane is substantially perpendicular to the direction of travel (central axis).
  • the first detector unit 310 includes a single row of detector crystals or multiple rows of detector crystals.
  • the first radiation source plane of the first radiation source assembly 200 is separated from the detector plane of the first detector assembly 300 by a predetermined distance.
  • the first radiation source plane of the first radiation source assembly 200 is substantially parallel to the detector plane of the first detector assembly 300 .
  • the plurality of first detector units 310 of the first detector assembly 300 extend entirely around the imaging region.
  • a plurality of first detector units 310 form a complete and continuous first detector ring.
  • the first detector ring may be a circular ring, a square ring, a rectangular ring, a polygonal ring, or the like.
  • a plurality of first detector units 310 form a circular ring.
  • a plurality of first detector units 310 form a complete detector ring.
  • the present application is not limited thereto.
  • the detector ring formed by the plurality of first detector units 310 may be incomplete, that is, there is a gap.
  • the plurality of first detector units 310 are divided into multiple segments, and the first detector units 310 of different segments may be distributed at intervals around the imaging area.
  • Each first target point of the first ray source assembly 200 has a ray emission range.
  • the radiation emission range of at least a part of the first target point of the first radiation source assembly 200 is selected to cover the imaging area 110 .
  • the radiation emission range of the target point covers the imaging area 110 means that the radiation emission range of the target point just covers the imaging area 110 or is slightly larger than the imaging area 110 .
  • the radiation emission range of these first target points of the first radiation source assembly 200 may cover the inspection area 100 or may not cover the inspection area 100 .
  • the radiation emission range of each of the first target points of the first radiation source assembly 200 is selected to be insufficient to cover the inspection area 100, that is, the radiation emission range of each of these first target points is larger than the inspection range. Area 100 is small.
  • the radiation emission range of each first target point of the first radiation source assembly 200 can cover the imaging area 110, and optionally, the radiation emission range of each first target point is not enough to cover the inspection region 100.
  • the first radiation source assembly according to the embodiment of the present application can provide a smaller radiation emission range to cover only the imaging area, so that only the imaging area and The area of interest of the object under inspection is imaged in transmission.
  • the imaging region 110 is defined to be located between the first radiation source plane of the first radiation source assembly 200 and the outer edge of the first detector assembly 300 away from the first radiation source assembly 200 .
  • imaging region 110 is defined as a cylindrical region.
  • the central axis of the imaging area 110 is the rotation axis of the cylindrical area.
  • the imaging region 110 is defined as a region of interest sufficient to accommodate the subject being examined.
  • the imaging system is configured such that every point in the imaging region 110 can be passed through by the X-rays from the first ray source assembly 200 and the passed X-rays can be detected by the first detector assembly 300 .
  • FIG. 4 is a schematic partial cross-sectional view of an imaging system according to some embodiments of the present application.
  • each first target point of the first ray source assembly 200 is set to deflect toward the first detector unit 310 of the first detector assembly 300 along the traveling direction.
  • the first deflection angle is between 1° and 5°.
  • each distributed radiation source 210 is deflected about the axis of its first target point.
  • the first ray source assembly 200 may further include a collimator for making the direction of the X-rays emitted by the distributed ray source 210 of the first ray source assembly 200 toward the first detector assembly along the travel direction 300 deflection first tilt angle.
  • the first deflection angle is set so that the X-rays emitted by each distributed radiation source 210 of the first radiation source assembly 200 will not be blocked by the first detector assembly 300 before passing through the imaging area. In some embodiments, when the ray emitting direction of the first ray source assembly 200 is deflected relative to the first detector assembly 300 , the ray emitting direction is not perpendicular to the central axis of the imaging area.
  • the X-rays emitted by the distributed ray source 210 of the first ray source assembly 200 can avoid the first detector assembly 300 on the same side
  • the detector unit 310 of the first detector assembly 200 can also be received by the detector unit 310 on the other side of the first detector assembly 200 .
  • the first detector assembly 300 is arranged to be located at the radial inner side of the first radiation source assembly 200 . In other words, the first detector assembly 300 is arranged closer to the central axis of the imaging region 110 than the first radiation source assembly 200 .
  • the carrying device 400 is arranged to be located at the radial inner side of the first detector assembly 300 , and the first detector assembly 300 is arranged to be located at the inner side of the first radiation source assembly 200 Radially inside.
  • the first radiation source assembly 200 , the first detector assembly 300 and the carrying device 400 are arranged sequentially from outside to inside.
  • the imaging system may also have a position adjustment function to adjust the position of the region of interest of the inspected object relative to the imaging region 110 .
  • a position adjustment function to adjust the position of the region of interest of the inspected object relative to the imaging region 110 . For example, when the region of interest of the object to be inspected is not completely located in the imaging region 110 , the region of interest of the object to be inspected can be moved to be completely located in the imaging region 110 through the position adjustment function.
  • the carrying device 400 is configured to be able to adjust the position of the region of interest of the object under inspection relative to the imaging region 110 .
  • the first radiation source assembly 200 is configured to be able to rotate within a predetermined range relative to the imaging area 110 (or the carrying device 400), so as to adjust the area of interest of the object under inspection relative to the imaging area. 110 position.
  • the region of interest of the object to be inspected can be located within the imaging region 110 through adjustment.
  • the imaging system may further include a radiation source control device (not shown).
  • the radiation source control device may be configured to control the radiation emission of the first radiation source assembly 200 , such as target emission sequence, emission frequency, emission current and so on.
  • the ray source control device is configured to make the multiple distributed ray sources 210 of the first ray source assembly 200 in the same X-rays are simultaneously emitted from at least two first target points to the imaging region 110 at any moment.
  • the imaging system according to the embodiment of the present application can increase the radiation emission frequency, especially without increasing the occupied volume of the imaging system and the cost of additional detectors.
  • the ray source control device is configured to make the first ray source assembly 200 simultaneously emit X-rays from at least two first target points to the imaging region 110 each time the first ray source assembly 200 is controlled to emit X-rays. Rays. In this case, each X-ray emission of the first ray source assembly 200 emits beams from multiple target points simultaneously.
  • the ray emission range of each first target point can cover the imaging area 110, and
  • the detector crystals of the first detector assembly 300 corresponding to the ray emission ranges of any two first target points do not coincide with each other.
  • the first ray source assembly 200 can simultaneously emit X-rays from six first target points at the same time.
  • the radiation emission modes of the first radiation source assembly 200 of the imaging system are described below.
  • the first ray source assembly 200 includes a total of N first target points, and all the N first target points are divided into M groups, where M ⁇ N/2. The same number of first targets were included in each group.
  • the first target points in each group come from different distributed ray sources 210 respectively.
  • the first targets in each group do not overlap each other (that is, each first target belongs to only one group).
  • the detector crystals of the first detector assembly 300 corresponding to the radiation emission ranges of the first target points do not coincide with each other.
  • the ray source control device controls all the first target points in one group to simultaneously emit X-rays at the same moment, and makes the M groups of first target points emit X-rays sequentially.
  • the first ray source assembly 200 includes a total of N first target points, and all the N first target points are divided into M groups, where M ⁇ N/2.
  • Each group includes the same or different numbers of first targets, and each group includes at least one first target (that is, the number of first targets in each group can be one).
  • the first target points in each group come from different distributed ray sources 210 respectively.
  • the first targets in each group do not overlap each other (that is, each first target belongs to only one group).
  • the detector crystals of the first detector assembly 300 corresponding to the radiation emission ranges of the first target points do not coincide with each other.
  • the ray source control device controls all the first target points in one group to simultaneously emit X-rays at the same moment, and makes the M groups of first target points emit X-rays sequentially.
  • the first ray source assembly 200 includes a total of N first target points, and all the N first target points are divided into M groups, where M ⁇ N/2. The same number of first targets were included in each group.
  • the first target points in each group come from different distributed ray sources 210 respectively.
  • the first targets in each group may partially overlap (that is, one first target may belong to two or more groups at the same time).
  • the detector crystals of the first detector assembly 300 corresponding to the radiation emission ranges of the first target points do not coincide with each other.
  • the ray source control device controls all the first target points in one group to simultaneously emit X-rays at the same moment, and makes the M groups of first target points emit X-rays sequentially.
  • the imaging system may also have other radiation emission modes.
  • the ray emission mode of the imaging system can be based on the first target point in the first ray source assembly 200 The number of groups, the grouping of each first target point, the emission interval and sequence of each group of first target points, etc. are combined to achieve different modes of X-ray emission.
  • the imaging system may also be configured to reconstruct a three-dimensional scanning (CT) image of the region of interest of the inspected object based on the detection data of the first detector assembly 300 .
  • CT three-dimensional scanning
  • the imaging system may use an iterative reconstruction algorithm, an analytical reconstruction algorithm, or a combination of different reconstruction algorithms when reconstructing the three-dimensional scanning image of the region of interest of the inspected object.
  • the projection data may be truncated.
  • the object of interest to be inspected Imaging of the region is an internal CT problem. Compared with the image reconstruction in which the ray emission range covers the entire inspected object, the internal problem of CT has a non-unique solution theoretically.
  • the first ray source The component 200 may also include a second target point (also called a large fan angle target point) whose radiation emission range can cover the inspection area 100 .
  • a second target point also called a large fan angle target point
  • the first radiation source assembly 200 further includes at least one second target point (large fan angle target point).
  • the radiation emission range of the second target point is selected to be able to cover the inspection area 100 .
  • the first detector assembly 300 is also configured to be capable of receiving X-rays emitted from the second target point of the first radiation source assembly 200 and transmitted through the inspection region 100 .
  • the distributed radiation source 210 including the first target point and the second target point at the same time can be compared with only the second target point
  • the distributed radiation source 210 of a target point arranges its respective target points in the same manner.
  • the ray source control device is configured so that when the first target point of the first ray source assembly 200 emits X-rays, the second target point does not emit X-rays, and when the second target point of the first ray source assembly 200 When the point emits X-rays, the first target point does not emit X-rays. Therefore, the large fan angle target point and the small fan angle target point of the imaging system emit rays separately.
  • the first radiation source assembly 200 includes a plurality of second targets.
  • the radiation source control device is configured such that the first radiation source assembly 200 simultaneously emits X-rays from at least two second target points to the inspection area at the same time.
  • the first detector crystals corresponding to the ray emission ranges of any two second targets are mutually do not coincide.
  • the first ray source assembly 200 may have more than two second target points to simultaneously emit X-rays.
  • the multiple second targets of the first radiation source assembly 200 are evenly distributed.
  • the first ray source assembly 200 includes a total of 9 target points, wherein the 1st, 4th, and 7th target points can be the second target points, and the remaining 2nd, 3rd, 5th, 6th, 8th, and 9th target points It may be the first target mentioned above.
  • the first radiation source assembly 200 includes N1 first targets and N2 second targets.
  • the ray source control device can divide the N1 first target points into M groups (M ⁇ N1/2) with reference to the above-mentioned arbitrary ray emission mode, and control the M groups of first target points and N2 second target points to emit X-rays in a predetermined order .
  • the radiation source control device is configured so that when the first target point of the first radiation source assembly 200 emits X-rays, the second target point does not emit X-rays, and when the second target point of the first radiation source assembly 200 emits X-rays, it causes The first target does not emit X-rays.
  • the detector crystals of the first detector assembly 300 corresponding to the radiation emission ranges of the respective first target points do not coincide with each other.
  • the first detector crystals corresponding to the ray emission ranges of the second target points that emit X-rays at the same time are different from each other. coincide.
  • the large fan-angle target point can be used to image the whole inspected object, which helps to avoid or solve the internal problems of CT; at the same time, the small fan-angle target point can be used to improve the imaging quality of the region of interest.
  • multiple first target points of the first radiation source assembly 200 can simultaneously emit X-rays, and optionally multiple second target points of the first radiation source assembly 200 can also emit X-rays simultaneously. Since multiple targets emit X-rays at the same time, the X-rays emitted by each target point and the scattered signals generated by the inspected object will superimpose and affect each other, which may reduce the signal-to-noise ratio of the first detector assembly and thus affect the imaging quality.
  • the imaging system may further include a second detector assembly 600 for receiving X-rays scattered from the inspected object.
  • the second detector assembly 600 is arranged to surround the inspection region 100 , that is, to be located radially outside the inspection region 100 .
  • the second probe assembly 600 is fixed relative to the first probe assembly 300 .
  • the second detector assembly 600 includes a plurality of second detector units 610 .
  • the multiple second detector units 610 of the second detector assembly 600 are arranged corresponding to the multiple first detector units 310 of the first detector assembly 300 , preferably in a one-to-one correspondence.
  • the second detector unit 610 is arranged not to receive direct X-rays emitted from the first radiation source assembly 200, but to receive X-rays scattered by the inspected object.
  • each second detector unit 610 includes a plurality of second detector crystals.
  • the second detector crystal 611 of each second detector unit 610 is arranged side by side with the first detector crystal 311 of the corresponding first detector unit 310 .
  • "arranged side-by-side" means that the corresponding first and second detector crystals are at approximately the same radial and circumferential position as viewed along the direction of travel.
  • the corresponding second detector crystals 611 and the first detector crystals 311 are arranged in contact with or spaced apart from each other, which will be described in detail below with reference to the accompanying drawings respectively.
  • the second detector crystals of each second detector unit 610 are arranged to be spaced apart from the first detector crystals of the corresponding first detector unit 310 to This makes the second detector unit 610 not receive the direct X-rays emitted from the first ray source assembly 200 . Therefore, the second detector unit 610 of the second detector assembly 600 is disposed outside the radiation emission range of the first target point of the first radiation source assembly 200 .
  • FIGS. 5 and 6 are schematic diagram of a first detector assembly and a second detector assembly, according to some embodiments of the present application.
  • 6 is a schematic diagram of a first detector assembly and a second detector assembly, according to some embodiments of the present application.
  • the second detector crystal 611 of the second detector unit is arranged to be spaced apart from the corresponding first detector crystal 311 of the first detector unit.
  • the imaging system further includes a shield arranged such that the second detector unit 610 does not receive direct X-rays emitted from the first radiation source assembly 200 . Since the second detector crystal is arranged in close proximity to the first detector crystal, part of the direct X-rays may be received by the second detector crystal. By setting the shield, the second detector unit 610 can be prevented from receiving direct X-rays, so as to improve the detection accuracy of the second detector assembly and the detection accuracy of the corrected transmitted X-ray signals.
  • FIG. 7 is a schematic diagram of a first detector assembly and a second detector assembly, according to some embodiments of the present application.
  • 8 is a schematic partial cross-sectional view of an imaging system including a second detector assembly and a shield, according to some embodiments of the present application.
  • the second detector crystal 611 of the second detector unit 610 is arranged adjacent to the corresponding first detector crystal 311 of the first detector unit 310 along the traveling direction.
  • the blocking member 620 is arranged between the second detector crystal 611 of the adjacent second detector unit 610 and the first detector crystal 311 of the first detector unit 310 .
  • the shield 620 is arranged to be in direct contact with the second detector unit 610 and/or the first detector unit 310 , for example radially inward of the second detector unit 610 and/or the first detector unit 310 surface (upper surface shown in Figure 8).
  • the shielding member 620 is a vertical shielding member, that is, it extends substantially along the vertical direction when viewed along the circumferential direction.
  • FIG. 9 is a schematic partial cross-sectional view of an imaging system including a second detector assembly and a shield, according to some embodiments of the present application.
  • 10 is a schematic partial cross-sectional view of an imaging system including a second detector assembly and a shield, according to some embodiments of the present application.
  • the second detector crystals of the second detector unit 610 and the corresponding first detector crystals of the first detector unit 310 are closely arranged along the traveling direction.
  • the shield 620 is arranged to be spaced apart from the second detector unit 610 and the first detector unit 310 , ie not in direct contact. According to needs, the shield 620 can be set farther away from the second detector unit 610 and the first detector unit 310 (as shown in FIG.
  • the shielding member 620 is a horizontal shielding member, that is, it extends substantially along the horizontal direction when viewed along the circumferential direction.
  • the shutter is provided when the second detector crystal 611 of the second detector unit 610 and the first detector crystal 311 of the corresponding first detector unit 310 are in contact with each other along the traveling direction.
  • the present application is not limited thereto. It should be understood that when the second detector crystal 611 of the second detector unit 610 is arranged to be spaced apart from the corresponding first detector crystal 311 of the first detector unit 310 , a blocking member may also be provided.
  • the shield can prevent the second detector unit 610 from receiving direct X-rays, the shield can be arranged in any structure and form.
  • the number of second detector crystals 611 of each second detector unit is equal to the number of first detector crystals 311 of the corresponding first detector unit.
  • a column (at least one) of second detector crystals 611 for receiving scattered signals is correspondingly provided.
  • the number of second detector crystals 611 of each second detector unit is smaller than the number of first detector crystals 311 of the corresponding first detector unit.
  • the second detector crystals 611 of the second detector unit 610 are arranged at intervals along the length direction of the first detector unit 310 .
  • the calculated values of the scattered signals of the first detector crystals 311 in each column at places where the second detector crystals 611 are not provided can be obtained by means of interpolation or fitting, and Correct the scatter signal accordingly.
  • Fig. 11 is a schematic cross-sectional view of an imaging system including a second radiation source assembly according to some embodiments of the present application.
  • the imaging system further includes a second ray source assembly 700 for emitting X-rays.
  • the first detector assembly 300 is also configured to receive the X-ray emitted from the second ray source assembly 700 and transmitted through the examination region 100 (especially the imaging region 110) of the imaging system. Rays.
  • the X-rays emitted from the second ray source assembly 700 can penetrate the inspected object and be received by the first detector assembly 300 .
  • the second radiation source assembly 700 includes multiple distributed radiation sources, and each distributed radiation source includes multiple third targets.
  • Each distributed radiation source of the second radiation source assembly 700 may have the same structure, configuration and arrangement as the distributed radiation source 210 of the first radiation source assembly 200 according to any of the above-mentioned embodiments.
  • the third target point of the second radiation source assembly 700 may have the same structure, configuration and arrangement as the first target point of the first radiation source assembly 200 according to any of the above embodiments.
  • Each third target point of the second ray source assembly 700 has a ray emission range.
  • the radiation emission range of at least a part of the third target point of the second radiation source assembly 700 is selected to cover the imaging area 110 .
  • the radiation emission range of each of the part of the third target points of the second radiation source assembly 700 is selected to be insufficient to cover the inspection area 100, that is, the radiation emission range of each of these third target points is larger than the inspection range. Area 100 is small.
  • the radiation emission range of each third target point of the second radiation source assembly 700 can cover the imaging area 110, and optionally, the radiation emission range of each third target point is not enough to cover the inspection region 100.
  • all the third targets of the multiple distributed radiation sources of the second radiation source assembly 700 are arranged in the same plane (hereinafter referred to as "second radiation source plane"), that is, the second radiation source
  • the multiple distributed ray sources of the source assembly 700 are coplanarly arranged.
  • the plane of the second radiation source is substantially perpendicular to the direction of travel (or central axis).
  • the second ray source plane of the second ray source assembly 700 is spaced apart from the detector plane of the first detector assembly 300 by a predetermined distance.
  • the first ray source plane of the first ray source assembly 200, the detector plane of the first detector assembly 300, and the second ray source plane of the second ray source assembly 700 are along the traveling direction (or central axis) in sequence.
  • the first radiation source assembly 200 and the second radiation source assembly 700 are respectively arranged on both sides of the first detector assembly 300 along the traveling direction (or central axis). Therefore, the imaging system according to some embodiments of the present application has two ray source planes, and the two ray source planes are respectively located on two sides of the detector plane.
  • the first radiation source plane, the detector plane and the second radiation source plane are substantially parallel to each other. In some embodiments, the first ray source plane, the detector plane and the second ray source plane are substantially perpendicular to the direction of travel (or central axis).
  • the imaging area 110 is defined as being located between the first ray source plane of the first ray source assembly 200 and the first ray source plane of the second ray source assembly 700 . Between two ray source planes.
  • imaging region 110 is defined as a cylindrical region. In some embodiments, the imaging region 110 is defined as a region of interest sufficient to accommodate the subject being examined.
  • the first radiation source assembly 200 , the first detector assembly 300 and the second radiation source assembly 700 can move together relative to the carrying device 400 along the traveling direction.
  • each target point of the second ray source assembly 700 is configured to deflect toward the first detector unit 310 of the first detector assembly 300 by a second deflection angle along the traveling direction.
  • the second deflection angle is between 1 degree and 5 degrees.
  • each distributed radiation source of the second radiation source assembly 700 is deflected about the axis of its target point.
  • the second ray source assembly 700 may further include a collimator for making the direction of the X-rays emitted by the distributed ray source of the second ray source assembly 700 toward the first detector assembly 300 along the traveling direction Deflects the second tilt angle.
  • the second deflection angle is set so that the X-rays emitted by each distributed radiation source of the second radiation source assembly 700 will not be blocked by the first detector assembly 300 before passing through the imaging area.
  • first ray source assembly 200 and the second ray source assembly 700 are arranged on both sides of the first detector assembly 300 respectively, the X-rays emitted by the first ray source assembly 200 and the X-rays emitted by the second ray source assembly 700 The rays are deflected relative to each other.
  • the first deflection angle is equal to the second deflection angle.
  • the radiation source control device is also used to control the radiation emission of the second radiation source assembly 700 .
  • the radiation source control device is configured so that when the region of interest of the object to be inspected is at least partially located in the imaging region 110, the plurality of distributed radiation sources of the second radiation source assembly 700 can simultaneously transmit from at least two The third target point emits X-rays to the imaging area 110 at the same time.
  • the radiation emission range of each third target point can cover the imaging area 110, and any two third target points
  • the detector crystals of the first detector assembly 300 corresponding to the ray emission range of the point do not coincide with each other. Therefore, there are more than two target points in the plane of the second ray source to simultaneously emit X-rays.
  • the radiation source control device may be configured to control the radiation emission of the second radiation source assembly 700 , such as target point emission sequence, emission frequency, emission current and so on.
  • the ray source control device is configured to make at least one first target point of the first ray source assembly 200 and the second At least one third target point of the ray source assembly 700 simultaneously emits X-rays to the imaging region 110 at the same moment.
  • the first ray source assembly 200 and the second ray source assembly 700 of the imaging system can emit X-rays from at least two target points (at least one first target point and at least one third target point). Therefore, the imaging system can further increase the radiation emission frequency and scanning efficiency.
  • the first ray source assembly 200 when at least one first target point of the first ray source assembly 200 and at least one third target point of the second ray source assembly 700 emit X-rays to the imaging region 110 at the same time, the first ray source assembly 200
  • the detector crystal of the first detector assembly 300 corresponding to the ray emission range of the first target point and the detector crystal of the first detector assembly 300 corresponding to the ray emission range of the third target point of the second ray source assembly 700 are mutually do not coincide.
  • imaging method according to some embodiments of the present application is described in detail below. According to some embodiments of the present application, any imaging system described above may be used to implement the imaging method.
  • the imaging method according to some embodiments of the present application will be described below by taking the imaging system including the first ray source assembly 200 and the first detector assembly 300 as an example. However, it should be understood that the imaging system for implementing the imaging method according to the embodiment of the present application may also include the second radiation source assembly 700 .
  • step S10 the object to be inspected is carried on the carrying device 400 of the imaging system.
  • step S20 the first ray source assembly 200 and the first detector assembly 300 are moved relative to the carrying device 400 along the traveling direction, so that the region of interest of the object to be inspected can enter the imaging area 110, and at the same time the first ray source assembly 200 emits X-rays and causes the X-rays to pass through imaging region 110 to be received by first detector assembly 300 .
  • the inspected object is transported along the travel direction by the carrier device 400 .
  • the multiple distributed radiation sources 210 of the first radiation source assembly 200 emit X-rays from at least two first target points to the imaging region 110 at the same time.
  • the ray emission range of each target point can cover the imaging area 110, and the ray emission ranges of any two target points correspond to The detector crystals of the first detector assembly 300 do not coincide with each other.
  • the imaging method can also adjust the position of the region of interest of the inspected object relative to the imaging region 110 through the position adjustment function of the imaging system. For example, when the ROI of the inspected object is not completely located in the imaging area 110 , the ROI of the inspected object can be moved to be completely located in the imaging area 110 through the position adjustment function of the imaging system.
  • the imaging method further includes adjusting the position of the region of interest of the inspected object relative to the imaging region 110 through the carrying device 400 after the inspected object is loaded on the carrying device 400 in step S10 .
  • the imaging method further includes making the object under inspection carried on the carrying device 400 in step S10, and observing along the traveling direction, by making the first radiation source assembly 200 relative to the imaging region 110 (or the carrying device 400 ) within a predetermined range to adjust the position of the region of interest of the inspected object relative to the imaging region 110 .
  • the imaging method can make the region of interest of the object under inspection be located within the imaging region 110 through adjustment.
  • the imaging method may also provide a second target point (large fan angle target point) whose radiation emission range can cover the inspection area 100, so as to solve potential internal problems of CT. It should be understood that any of the embodiments herein that relate to the second target can be applied to the imaging method.
  • the step of emitting X-rays by the first ray source assembly 200 in the above step S20 further includes: emitting X-rays from the second target point of the first ray source assembly 200 .
  • the radiation emission range of the second target point is selected to be able to cover the inspection area 100 .
  • the second target point when the first target point of the first ray source assembly 200 emits X-rays, the second target point does not emit X-rays, and when the second target point of the first ray source assembly 200 emits X-rays such that The first target does not emit X-rays.
  • the imaging method may further include step S30: reconstructing a three-dimensional scanning (CT) image of the region of interest of the inspected object based on the detection data of the first detector assembly 300 .
  • the imaging method may further include identifying the inspected object and providing a recognition result after reconstructing the three-dimensional scanning image of the inspected object.
  • the imaging method may further include displaying the three-dimensional scanning image and/or the recognition result.
  • the imaging method may also use the second detector assembly 600 according to the above-mentioned embodiments of the present application to correct scattered signals. It should be understood that any of the embodiments herein that relate to the second detector assembly can be applied to the imaging method.
  • the imaging method reconstructs a three-dimensional scanning image of the region of interest of the inspected object based on the detection data of the first detector assembly 300 and the second detector assembly 600 . As a result, the signal-to-noise ratio of the first detector arrangement and thus the imaging quality can be increased.
  • the imaging method may also preload or generate configuration information or correction information, such as background data, air data, and the like.

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Abstract

一种用于射线检查的成像系统和方法，用于射线检查的成像系统包括：检查区域（100），包括成像区域（110）；第一射线源组件（200），其所有第一靶点布置在第一射线源平面内；第一探测器组件（300），其多个第一探测器单元（310）布置在探测器平面内，探测器平面与第一射线源平面沿被检查对象的行进方向间隔开预定距离；和射线源控制装置，其构造成当被检查对象的感兴趣区域至少部分地位于成像区域（110）中时，使得第一射线源组件（200）在同一时刻从至少两个第一靶点同时向成像区域（110）发射X射线，在第一射线源组件（200）的同时向成像区域（110）发射X射线的至少两个第一靶点中，每个第一靶点的射线发射范围都能够覆盖成像区域（110），并且任两个第一靶点的射线发射范围对应的第一探测器晶体（311）互相不重合。

Description

用于射线检查的成像系统和方法
相关申请的交叉引用
本申请要求享有于2021年10月15日提交的名称为“用于射线检查的成像系统及方法”的中国专利申请202111204463.6的优先权，该申请的全部内容通过引用并入本文中。
技术领域
本申请涉及透视成像技术领域，特别是涉及一种用于射线检查的成像系统。
背景技术
CT(计算机断层成像)扫描系统广泛应用于医疗、安检和工业等领域。CT扫描生成三维扫描图像并且具有高识别能力。根据在扫描过程中射线源相对于被检查对象的运动，现有的CT扫描系统可以包括动态螺旋CT扫描系统和静态CT扫描系统。
在现有的CT扫描系统中，不管是动态螺旋CT扫描系统和静态CT扫描系统，通常射线源的X射线发射范围需要覆盖整个被检查对象，即对被检查对象整体进行扫描和成像，并且这些CT扫描系统在同一时刻只有单个靶点发射X射线。例如，现有的静态CT扫描系统可以是采用单个分布式射线源和一套探测器系统，或者可以采用多个分布式射线源和共用的一套探测器系统。但是，同一套探测器系统在同一时刻只能接收来自一个靶点的X射线。因此，这些CT扫描系统的扫描速度受限于动态螺旋扫描中采用的滑环的旋转速度和射线源的射线发射频率。在静态CT扫描系统中，扫描速度同样受限于射线源的射线发射频率。但是在一些应用场景中，需要关注的只有被检查对象的感兴趣区域(Region of Interest，ROI)，而且对于扫描速度要求较高，例如对活体进行ROI成像。为了提 高CT扫描系统的采样频率，通常只能增加额外的探测器系统，但是这样就会大大增加CT扫描系统的尺寸和成本。
为此，需要一种改进的成像系统和方法。
发明内容
本申请的一个目的是提供一种能够仅扫描感兴趣区域的成像系统和方法。本申请的一个目的是提供一种能够提高出束频率的成像系统和方法。本申请的一个目的是提供一种能够减小设备尺寸和成本的成像系统和方法。本申请的一个目的是提供一种能够更好地解决CT内问题的成像系统和方法。本申请的一个目的是提供一种能够降低散射信号影响的成像系统和方法。
本申请的一方面提供一种用于射线检查的成像系统，包括：检查区域，其中被检查对象能够进入检查区域，检查区域包括成像区域，被检查对象的感兴趣区域能够进入成像区域，感兴趣区域是被检查对象的局部区域；第一射线源组件，用于发射X射线，其中，第一射线源组件包括多个分布式射线源，每个分布式射线源包括多个第一靶点，第一射线源组件的所有第一靶点布置在第一射线源平面内；第一探测器组件，用于接收从第一射线源组件发射并透射经过成像系统的成像区域的X射线，其中，第一探测器组件包括多个第一探测器单元，每个第一探测器单元包括多个第一探测器晶体，多个第一探测器单元布置在探测器平面内，探测器平面与第一射线源平面沿被检查对象的行进方向间隔开预定距离；和射线源控制装置，其构造成当感兴趣区域至少部分地位于成像区域中时，使得第一射线源组件的多个分布式射线源在同一时刻从至少两个第一靶点同时向成像区域发射X射线，其中，在第一射线源组件的同时向成像区域发射X射线的至少两个第一靶点中，每个第一靶点的射线发射范围都能够覆盖成像区域，并且任两个第一靶点的射线发射范围对应的第一探测器晶体互相不重合。
根据本申请的某些实施例，成像系统还包括承载装置，用于承载被检查对象，其中，成像系统构造成使得第一射线源组件和第一探测器组件能 够相对于承载装置沿行进方向移动，从而被检查对象的感兴趣区域能够进入成像区域。
根据本申请的某些实施例，承载装置构造成能够沿行进方向传送被检查对象。
根据本申请的某些实施例，承载装置还构造成能够调整被检查对象的感兴趣区域相对于成像区域的位置，使得被检查对象的感兴趣区域位于成像区域内。
根据本申请的某些实施例，成像区域位于第一射线源平面与第一探测器组件的远离第一射线源组件的外侧边缘之间，其中成像区域被限定为足以容纳感兴趣区域。
根据本申请的某些实施例，成像区域被限定为具有中心轴线的圆柱形区域。
根据本申请的某些实施例，行进方向与中心轴线基本上平行。
根据本申请的某些实施例，探测器平面与第一射线源平面彼此平行。
根据本申请的某些实施例，沿行进方向观察，第一射线源组件的多个分布式射线源构造成围绕成像区域具有大于180度的组合延伸角度。
根据本申请的某些实施例，第一射线源组件的多个分布式射线源构造成完整地围绕成像区域延伸以组成第一射线源环。
根据本申请的某些实施例，第一射线源组件的每个第一靶点的射线发射范围选择为不足以覆盖检查区域。
根据本申请的某些实施例，第一射线源组件的每个第一靶点都设置成沿行进方向朝着第一探测器组件的第一探测器单元偏转第一偏转角度。
根据本申请的某些实施例，第一偏转角度在1度到5度之间。
根据本申请的某些实施例，沿行进方向观察，第一射线源组件构造成能够相对于承载装置在预定范围内转动，以调整被检查对象的感兴趣区域相对于成像区域的位置，使得被检查对象的感兴趣区域位于成像区域内。
根据本申请的某些实施例，第一射线源组件还包括至少一个第二靶点，第二靶点的射线发射范围经选择能够覆盖检查区域，其中，射线源控制装置还构造成：当第一射线源组件的第一靶点发射X射线时使得第二靶 点不发射X射线，并且当第一射线源组件的第二靶点发射X射线时使得第一靶点不发射X射线。
根据本申请的某些实施例，第一射线源组件包括多个第二靶点，其中，射线源控制装置构造成使得第一射线源组件在同一时刻从至少两个第二靶点同时向检查区域发射X射线，其中，在第一射线源组件的同时向检查区域发射X射线的至少两个第二靶点中，任两个第二靶点的射线发射范围对应的第一探测器晶体互相不重合。
根据本申请的某些实施例，沿行进方向观察，第一探测器组件设置成位于第一射线源组件的径向内侧。
根据本申请的某些实施例，第一探测器组件构造成完整地围绕成像区域延伸以组成探测器环。
根据本申请的某些实施例，第一探测器组件的第一探测器单元包括单排第一探测器晶体或多排第一探测器晶体。
根据本申请的某些实施例，成像系统还包括第二探测器组件，用于接收从被检查对象散射的X射线，其中，第二探测器组件包括多个第二探测器单元，每个第二探测器单元包括多个第二探测器晶体。
根据本申请的某些实施例，第二探测器组件的多个第二探测器单元与第一探测器组件的多个第一探测器单元对应设置。
根据本申请的某些实施例，成像系统还包括遮挡件，遮挡件布置成使得第二探测器单元不接收从第一射线源组件发射的直射X射线。
根据本申请的某些实施例，沿行进方向，每个第二探测器单元的第二探测器晶体与对应的第一探测器单元的第一探测器晶体布置成间隔开，以使得第二探测器单元不接收从第一射线源组件发射的直射X射线。
根据本申请的某些实施例，每个第二探测器单元的第二探测器晶体的数量等于对应的第一探测器单元的第一探测器晶体的数量；或者每个第二探测器单元的第二探测器晶体的数量小于对应的第一探测器单元的第一探测器晶体的数量。
根据本申请的某些实施例，成像系统还包括：第二射线源组件，用于发射X射线，其中，第二射线源组件包括多个分布式射线源，每个分布式 射线源包括多个第三靶点，第二射线源组件的所有第三靶点布置在第二射线源平面内，探测器平面与第二射线源平面沿行进方向间隔开预定距离，其中，第一探测器组件还构造成用于接收从第二射线源组件发射并透射经过成像系统的成像区域的X射线，其中，第一射线源平面、探测器平面和第二射线源平面沿行进方向依次分布，其中，射线源控制装置构造成当感兴趣区域至少部分地位于成像区域中时，使得第二射线源组件在同一时刻从至少两个第三靶点同时向成像区域发射X射线，其中，在第二射线源组件的同时向成像区域发射X射线的至少两个第三靶点中，每个第三靶点的射线发射范围都能够覆盖成像区域，并且任两个第三靶点的射线发射范围对应的第一探测器晶体互相不重合。
根据本申请的某些实施例，成像系统构造成使得第一射线源组件、第一探测器组件和第二射线源组件能够相对于承载装置沿行进方向移动，从而被检查对象的感兴趣区域能够进入成像区域。
根据本申请的某些实施例，成像区域位于第一射线源平面与第二射线源平面之间，其中成像区域被限定为足以容纳感兴趣区域。
根据本申请的某些实施例，成像区域被限定为具有中心轴线的圆柱形区域。
根据本申请的某些实施例，探测器平面、第一射线源平面和第二射线源平面彼此平行。
根据本申请的某些实施例，射线源控制装置构造成当被检查对象的感兴趣区域至少部分地位于成像区域中时，使得第一射线源组件的至少一个第一靶点和第二射线源组件的至少一个第三靶点在同一时刻同时向成像区域发射X射线，并且其中，在第一射线源组件的至少一个第一靶点和第二射线源组件的至少一个第三靶点同时向成像区域发射X射线时，第一射线源组件的第一靶点的射线发射范围对应的第一探测器组件的探测器晶体和第二射线源组件的第三靶点的射线发射范围对应的第一探测器组件的探测器晶体互相不重合。
根据本申请的某些实施例，成像系统还构造成基于第一探测器组件的检测数据来重建被检查对象的感兴趣区域的三维扫描图像。
本申请的另一方面提供一种使用根据本申请的实施例的成像系统的成像方法，包括：(a)使被检查对象承载于成像系统的承载装置上；和(b)使成像系统的第一射线源组件和第一探测器组件相对于承载装置沿行进方向移动，从而被检查对象的感兴趣区域能够进入成像区域，同时使第一射线源组件发射X射线并且使X射线透射经过成像区域而被第一探测器组件接收，其中，第一射线源组件发射X射线的步骤包括：使第一射线源组件在同一时刻从至少两个第一靶点同时向成像区域发射X射线，其中，在第一射线源组件的同时向成像区域发射X射线的至少两个第一靶点中，每个第一靶点的射线发射范围都能够覆盖成像区域，并且任两个第一靶点的射线发射范围对应的第一探测器晶体互相不重合。
根据本申请的某些实施例，成像方法还包括在步骤(a)中使被检查对象承载于承载装置上后，通过承载装置调整被检查对象的感兴趣区域相对于成像区域的位置，使得被检查对象的感兴趣区域位于成像区域内。
根据本申请的某些实施例，成像方法还包括在步骤(a)中使被检查对象承载于承载装置上后，沿行进方向观察，使第一射线源组件相对于承载装置在预定范围内转动，以调整被检查对象的感兴趣区域相对于成像区域的位置，使得被检查对象的感兴趣区域位于成像区域内。
根据本申请的某些实施例，第一射线源组件发射X射线的步骤还包括：从第一射线源组件的第二靶点发射X射线，第二靶点的射线发射范围选择为能够覆盖检查区域，其中，当第一射线源组件的第一靶点发射X射线时使得第二靶点不发射X射线，并且当第一射线源组件的第二靶点发射X射线时使得第一靶点不发射X射线。
根据本申请的某些实施例，成像系统的射线源组件可以同时从多个靶点发射X射线，由此可以提高成像系统的射线发射频率，特别是在不增加成像系统的所占体积和额外探测器成本的情况下提高射线发射频率。通过使射线源组件的靶点的射线发射范围仅覆盖成像区域，成像系统可以仅对成像区域和位于其中的被检查对象的感兴趣区域进行透射成像，从而可以降低成像系统的所占体积和成本。通过使与同时发射的靶点对应的探测器晶体互相不重合，可以在多靶点同时出束的同时进行互不干扰的信号采集， 这可以有助于图像重建和提高透射扫描效率。
附图说明
图1是根据本申请的某些实施例的成像系统的示意图。
图2是根据本申请的某些实施例的成像系统的截面示意图。
图3是根据本申请的某些实施例的成像系统的射线发射示意图。
图4是根据本申请的某些实施例的成像系统的局部截面示意图。
图5是根据本申请的某些实施例的第一探测器组件和第二探测器组件的示意图。
图6是根据本申请的某些实施例的第一探测器组件和第二探测器组件的示意图。
图7是根据本申请的某些实施例的第一探测器组件和第二探测器组件的示意图。
图8是根据本申请的某些实施例的包括第二探测器组件和遮挡件的成像系统的局部截面示意图。
图9是根据本申请的某些实施例的包括第二探测器组件和遮挡件的成像系统的局部截面示意图。
图10是根据本申请的某些实施例的包括第二探测器组件和遮挡件的成像系统的局部截面示意图。
图11是根据本申请的某些实施例的包括第二射线源组件的成像系统的截面示意图。
具体实施方式
下文中，参照附图描述本申请的实施例。下面的详细描述和附图用于示例性地说明本申请的原理，本申请不限于所描述的优选实施例，本申请的范围由权利要求书限定。现参考示例性的实施方式详细描述本申请，一些实施例图示在附图中。以下描述参考附图进行，除非另有表示，否则在不同附图中的相同附图标记代表相同或类似的元件。以下示例性实施方式中描述的方案不代表本申请的所有方案。相反，这些方案仅是所附权利要 求中涉及的本申请的各个方面的系统和方法的示例。
根据本申请的实施例的用于射线检查的成像系统和成像方法可以应用于医疗、安检和工业等领域，以用于对物体或人体等进行透视成像检查。
图1是根据本申请的某些实施例的成像系统的示意图。图2是根据本申请的某些实施例的成像系统的截面示意图。图3是根据本申请的某些实施例的成像系统的射线发射示意图。
根据本申请的某些实施例，如图1所示，用于射线检查的成像系统包括：检查区域100、第一射线源组件200和第一探测器组件300。第一射线源组件200用于发射X射线。第一探测器组件300用于接收从第一射线源组件200发射并透射经过成像系统的检查区域100的X射线。根据本申请的某些实施例，第一射线源组件200和第一探测器组件300布置成围绕检查区域100，即位于检查区域100的径向外侧。成像系统构造成使得第一射线源组件200和第一探测器组件300能够相对于被检查对象沿行进方向移动。
根据本申请的某些实施例，成像系统限定检查区域100。在本文中，“检查区域”表示被检查对象能够进入的区域。当被检查对象位于检查区域100中时，从第一射线源组件200发射的X射线能够穿透被检查对象并且被第一探测器组件300接收到。在示例性实施例中，检查区域100包括第一端和第二端。在一些实施例中，被检查对象从第一端和第二端中的一者被传送进入检查区域100，并且从另一者离开检查区域100。
根据本申请的某些实施例，被检查对象包括感兴趣区域(ROI)，感兴趣区域是被检查对象的局部区域。例如，当被检查对象是人体时，感兴趣区域可以是人体的心脏、肺部等局部区域。根据本申请的某些实施例，检查区域100包括具有中心轴线的成像区域110，即成像区域110是检查区域100的局部区域。在本文中，“成像区域”表示被检查对象的感兴趣区域能够进入并且在此接受X射线透射检查的区域。成像区域110的尺寸设置成足以容纳被检查对象的感兴趣区域。在本文中，成像区域的中心轴线表示经过成像区域的与行进方向(下文描述)垂直的横截面的大致中心的轴线。在一些实施例中，检查区域和成像区域相对于第一探测器组件300 (以及下文所述的第二探测器组件600)是固定的。在一些实施例中，检查区域和成像区域相对于第一射线源组件200和第一探测器组件300(以及下文所述的第二射线源组件700和第二探测器组件600)是固定的。
在示例性实施例中，如图1所示，成像系统还包括承载装置400，用于承载被检查对象。根据本申请的某些实施例，第一射线源组件200和第一探测器组件300能够相对于承载装置400沿行进方向移动。由此，被检查对象的感兴趣区域能够进入检查区域100的成像区域110中。在示例性实施例中，承载装置400用于沿行进方向传送被检查对象进入检查区域100。在示例性实施例中，行进方向平行于水平方向。根据本申请的某些实施例，承载装置400可以沿行进方向往复地传送被检查对象通过检查区域100，即沿相反方向来回传送被检查对象。在一些实施例中，承载装置400以匀速直线运动来传送被检查对象。在示例性实施例中，行进方向与成像区域110的中心轴线基本平行。在一些实施例中，承载装置400是传送带或载物平台。
根据本申请的某些实施例，如图1所示，成像系统还可以包括屏蔽部件500。在示例性实施例中，屏蔽部件500可以布置成围绕成像系统的检查区域100。在示例性实施例中，第一射线源组件200和第一探测器组件300布置成围绕检查区域100并且位于屏蔽部件500的外侧，即在屏蔽部件500的远离检查区域100的一侧。
在本文中，“轴向”表示与行进方向平行的方向，“径向”表示在与行进方向垂直的平面内从中心轴线向外辐射的方向，并且“周向”表示在与行进方向垂直的平面内且与“径向”垂直的方向。
下面参照附图详细描述根据本申请的某些实施例的第一射线源组件和第一探测器组件的结构和布置。
根据本申请的某些实施例，第一射线源组件200包括多个分布式射线源210，每个分布式射线源210包括多个第一靶点。在一些实施例中，每个分布式射线源210包括单独的壳体以限定单独的真空空间，并且包括封装在壳体内的多个第一靶点。在一些实施例中，每个分布式射线源210的多个第一靶点具有均匀的靶点间距。在一些实施例中，每个分布式射线源 210的多个第一靶点沿直线分布。
如上所述，当第一射线源组件200包括多个分布式射线源210时，每个分布式射线源210限定单独的真空空间，因此不与其他分布式射线源210共用真空空间。不同的分布式射线源210的真空空间不连通。根据本申请的某些实施例，每个分布式射线源210可以与其他分布式射线源210独立地被拆卸和/或安装在成像系统中。
上文描述分布式射线源210中的多个第一靶点具有均匀的靶点间距。但是，本申请不限于此。在一些实施例中，分布式射线源210中的多个第一靶点还可以非均匀排布，即具有非均匀的靶点间距。
上文描述每个分布式射线源210中的多个第一靶点沿直线排布。但是，本申请不限于此。在一些实施例中，分布式射线源210中的多个第一靶点还可以沿弧线、折线等排布。
根据本申请的某些实施例，第一射线源组件200的多个分布式射线源210的所有第一靶点布置在同一平面(以下称为“第一射线源平面”)内，即第一射线源组件200的多个分布式射线源210共面设置。在本文中，“靶点位于同一平面内”表示靶点的出束点都位于同一平面内。在一些实施例中，第一射线源平面与行进方向(或中心轴线)基本上垂直。
在示例性实施例中，第一射线源组件200的多个分布式射线源210完整地围绕成像区域110延伸，即沿行进方向观察围绕成像区域110连续延伸的角度基本上达到360°。由此，第一射线源组件200的多个分布式射线源210组成一个完整且连续的第一射线源环。在一些实施例中，第一射线源环可以是圆环、方形环、矩形环、多边形环等。例如，如图1所示，第一射线源组件200的多个第一分布式射线源210构成多边形环。
上文描述第一射线源组件200的多个分布式射线源210组成一个完整的射线源环。但是，本申请不限于此。在某些实施例中，第一射线源组件200的多个分布式射线源210组成的射线源环可以是不完整的，即存在缺口部分。在某些实施例中，第一射线源组件200的多个分布式射线源210分成多段，不同段的分布式射线源210可以围绕成像区域110间隔地分布。在示例性实施例中，沿行进方向观察，第一射线源组件200的多个分 布式射线源210相对于中心轴线围绕成像区域110具有大于180度的组合延伸角度。在本文中，每个分布式射线源210相对于中心轴线围绕成像区域110的延伸角度表示该分布式射线源210的所有第一靶点相对于成像区域110(相对于成像区域110的中心轴线)的角度范围。在第一射线源组件200包括多个分布式射线源210时，相对于成像区域110处于不同扫描位置的多个分布式射线源210可以提供一个组合延伸角度。在本文中，“组合延伸角度”表示将处于不同扫描位置的多个分布式射线源210相对于成像区域110的各个延伸角度组合在一起所产生的角度范围。在一些实施例中，处于不同扫描位置的多个分布式射线源210相对于成像区域110的组合延伸角度可以是连续的或不连续的。
上文描述第一射线源组件200的多个分布式射线源210组成一个射线源环。但是，本申请不限于此。在某些实施例中，第一射线源组件200的多个分布式射线源210可以仅部分地围绕成像区域110连续延伸，即第一射线源组件200的多个分布式射线源210相对于中心轴线围绕成像区域110提供一个连续的组合延伸角度且该组合延伸角度小于360°。在一些实施例中，第一射线源组件200的多个分布式射线源210相对于中心轴线围绕成像区域110的连续组合延伸角度大于180°且小于360°。
第一探测器组件300用于接收从第一射线源组件200发射并透射经过成像系统的成像区域110的X射线。
根据本申请的某些实施例，第一探测器组件300包括多个探测器单元310。在一些实施例中，第一探测器组件300中探测器单元的布置可以根据第一射线源组件200中的分布式射线源210的排布和/或被检查对象的尺寸等因素来设置。在一些实施例中，第一探测器组件300中探测器单元的布置还可以采用成本效益高的排布，即以尽量少的探测器单元来满足成像需求。
根据本申请的某些实施例，第一探测器组件300的每个第一探测器单元310包括多个第一探测器晶体。在示例性实施例中，每个探测器单元310布置成既不遮挡同侧分布式射线源210发射的X射线，又能接收到其他侧分布式射线源210发射的X射线。
在示例性实施例中，多个第一探测器单元310布置在同一平面(以下称为“探测器平面”)内。在本文中，“探测器单元布置在同一平面内”表示探测器单元的中心面(例如探测器晶体中心面)都布置在同一平面内。例如，通过相同的定位基准使得多个第一探测器单元310的中心面布置在同一平面内。在一些实施例中，探测器平面与行进方向(中心轴线)基本上垂直。在一些实施例中，第一探测器单元310包括单排探测器晶体或多排探测器晶体。
在一些实施例中，如图2所示，沿中心轴线(或行进方向)，第一射线源组件200的第一射线源平面与第一探测器组件300的探测器平面间隔开预定距离。在示例性实施例中，第一射线源组件200的第一射线源平面与第一探测器组件300的探测器平面基本上平行。
在示例性实施例中，第一探测器组件300的多个第一探测器单元310完整地围绕成像区域延伸。由此，多个第一探测器单元310组成一个完整且连续的第一探测器环。在一些实施例中，第一探测器环可以是圆环、方形环、矩形环、多边形环等。例如，如图1所示，多个第一探测器单元310构成圆环。
上文描述多个第一探测器单元310组成一个完整的探测器环。但是，本申请不限于此。在某些实施例中，多个第一探测器单元310组成的探测器环可以是不完整的，即存在缺口部分。在某些实施例中，多个第一探测器单元310分成多段，不同段的第一探测器单元310可以围绕成像区域间隔地分布。
第一射线源组件200的每个第一靶点具有一个射线发射范围。根据本申请的某些实施例，第一射线源组件200的至少一部分第一靶点的射线发射范围经选择能够覆盖成像区域110。在本文中，靶点的射线发射范围覆盖成像区域110表示该靶点的射线发射范围刚好可以覆盖成像区域110或者比成像区域110略大。第一射线源组件200的这些第一靶点的射线发射范围可以覆盖检查区域100或者可以不覆盖检查区域100。在一些实施例中，第一射线源组件200的这部分第一靶点中每一个的射线发射范围经选择不足以覆盖检查区域100，即这些第一靶点中每一个的射线发射范围比 检查区域100小。在示例性实施例中，第一射线源组件200的每个第一靶点的射线发射范围能够覆盖成像区域110，并且可选地，每个第一靶点的射线发射范围不足以覆盖检查区域100。与射线发射范围覆盖整个被检查对象的现有射线源相比，根据本申请的实施例的第一射线源组件可以提供较小的射线发射范围以只覆盖成像区域，从而可以只对成像区域和被检查对象的感兴趣区域进行透射成像。
根据本申请的某些实施例，成像区域110被限定为位于第一射线源组件200的第一射线源平面与第一探测器组件300的远离第一射线源组件200的外侧边缘之间。在示例性实施例中，成像区域110被限定为圆柱形区域。这时，成像区域110的中心轴线是该圆柱形区域的旋转轴线。在一些实施例中，成像区域110被限定为足以容纳被检查对象的感兴趣区域。在示例性实施例中，成像系统构造成使得成像区域110中的每一点都可以被来自第一射线源组件200的X射线穿过并且穿过后的X射线可以被第一探测器组件300检测到。
下面参照附图详细描述根据本申请的某些实施例的第一射线源组件和第一探测器组件的相对位置。图4是根据本申请的某些实施例的成像系统的局部截面示意图。
根据本申请的某些实施例，如图4所示，第一射线源组件200的每个第一靶点都设置成沿行进方向朝着第一探测器组件300的第一探测器单元310偏转第一偏转角度A1。在一些实施例中，第一偏转角度在1°到5°之间。在一些实施例中，每个分布式射线源210围绕其第一靶点的轴线偏转。在一些实施例中，第一射线源组件200还可以包括准直器，用于使第一射线源组件200的分布式射线源210发射的X射线的方向沿行进方向朝着第一探测器组件300偏转第一倾斜角度。
在一些实施例中，第一偏转角度设置成使得第一射线源组件200的每个分布式射线源210发射的X射线在经过成像区域之前不会被第一探测器组件300遮挡。在一些实施例中，第一射线源组件200的射线发射方向相对于第一探测器组件300偏转的情况下，该射线发射方向与成像区域的中心轴线不垂直。
通过将第一射线源组件200的射线发射方向相对于第一探测器组件300偏转，第一射线源组件200的分布式射线源210发射的X射线可以避开同侧的第一探测器组件300的探测器单元310，并且还可以被第一探测器组件200的其他侧的探测器单元310接收到。
在一些实施例中，沿行进方向(或中心轴线)观察，第一探测器组件300设置成位于第一射线源组件200的径向内侧。换言之，第一探测器组件300设置成相对于第一射线源组件200更靠近成像区域110的中心轴线。
在一些实施例中，沿中心轴线(或行进方向)观察，承载装置400设置成位于第一探测器组件300的径向内侧，并且第一探测器组件300设置成位于第一射线源组件200的径向内侧。由此，如图1所示，第一射线源组件200、第一探测器组件300和承载装置400依次外向内排布。
根据本申请的某些实施例，成像系统还可以具有位置调整功能，以调整被检查对象的感兴趣区域相对于成像区域110的位置。例如，当被检查对象的感兴趣区域未完全位于成像区域110中时，通过位置调整功能可以将被检查对象的感兴趣区域移动到完全位于成像区域110中。
在一些实施例中，承载装置400构造成能够调整被检查对象的感兴趣区域相对于成像区域110的位置。在一些实施例中，沿行进方向观察，第一射线源组件200构造成能够相对于成像区域110(或承载装置400)在预定范围内转动，以调整被检查对象的感兴趣区域相对于成像区域110的位置。由此，被检查对象的感兴趣区域能够通过调整而位于成像区域110内。
下面参照附图详细描述根据本申请的某些实施例的射线发射控制。
根据本申请的某些实施例，成像系统还可以包括射线源控制装置(未示出)。在一些实施例中，射线源控制装置可以构造成控制第一射线源组件200的射线发射，例如靶点发射顺序、发射频率、发射电流等。
根据本申请的某些实施例，射线源控制装置构造成当被检查对象的感兴趣区域至少部分地位于成像区域110中时，使得第一射线源组件200的多个分布式射线源210在同一时刻从至少两个第一靶点同时向成像区域110发射X射线。由此，第一射线源组件200的第一射线源平面中存在两个以 上第一靶点同时发射X射线。因此，根据本申请的实施例的成像系统可以提高射线发射频率，特别是在不增加成像系统的所占体积和额外探测器成本的情况下提高射线发射频率。
在一些实施例中，射线源控制装置构造成在每次控制第一射线源组件200发射X射线时，都使得第一射线源组件200从至少两个第一靶点同时向成像区域110发射X射线。这种情况下，第一射线源组件200的每次X射线发射都是多靶点同时出束。
在一些实施例中，在第一射线源组件200的同时向成像区域110发射X射线的至少两个第一靶点中，每个第一靶点的射线发射范围都能够覆盖成像区域110，并且任两个第一靶点的射线发射范围对应的第一探测器组件300的探测器晶体互相不重合。通过使第一射线源组件200的第一靶点的射线发射范围都覆盖成像区域110，成像系统可以仅对成像区域110和位于其中的被检查对象的感兴趣区域进行透射成像，从而可以降低成像系统的所占体积和成本。通过使与同时发射的第一靶点对应的探测器晶体互相不重合，可以在多靶点同时出束的同时进行互不干扰的信号采集，这可以有助于后续图像重建和提高透射扫描效率。如图3所示，第一射线源组件200可以在同一时刻从六个第一靶点同时发射X射线。
下面描述根据本申请的某些实施例的成像系统的第一射线源组件200的射线发射模式。
在一些实施例中，第一射线源组件200包括总计N个第一靶点，所有N个第一靶点被分为M组，M<N/2。每组中包括相同数量的第一靶点。每组中的第一靶点分别来自不同的分布式射线源210。各组中的第一靶点互相不重合(即每个第一靶点只归属于一个组)。在每组中，各个第一靶点的射线发射范围对应的第一探测器组件300的探测器晶体互相不重合。射线源控制装置控制同一时刻一组中的所有第一靶点同时发射X射线，并且使M组第一靶点依次发射X射线。
在一些实施例中，第一射线源组件200包括总计N个第一靶点，所有N个第一靶点被分为M组，M<N/2。每组中包括相同或不同数量的第一靶点，并且每组中包括至少一个第一靶点(即，每组中第一靶点的数量可以 为一个)。每组中的第一靶点分别来自不同的分布式射线源210。各组中的第一靶点互相不重合(即每个第一靶点只归属于一个组)。在每组中，各个第一靶点的射线发射范围对应的第一探测器组件300的探测器晶体互相不重合。射线源控制装置控制同一时刻一组中的所有第一靶点同时发射X射线，并且使M组第一靶点依次发射X射线。
在一些实施例中，第一射线源组件200包括总计N个第一靶点，所有N个第一靶点被分为M组，M<N/2。每组中包括相同数量的第一靶点。每组中的第一靶点分别来自不同的分布式射线源210。各组中的第一靶点可以部分重合(即一个第一靶点可以同时归属于两个或更多个组)。在每组中，各个第一靶点的射线发射范围对应的第一探测器组件300的探测器晶体互相不重合。射线源控制装置控制同一时刻一组中的所有第一靶点同时发射X射线，并且使M组第一靶点依次发射X射线。
上文举例描述成像系统的三种射线发射模式。但是，本申请不限于此。根据本申请的实施例，成像系统还可以具有其他射线发射模式。在第一射线源组件200的第一射线源平面中存在两个以上第一靶点能够同时发射X射线的情况下，成像系统的射线发射模式可以根据第一射线源组件200中第一靶点的分组数量、各个第一靶点的分组归属、各组第一靶点的发射间隔和顺序等进行组合，以实现X射线发射的不同模式。
根据本申请的某些实施例，成像系统还可以构造成基于第一探测器组件300的检测数据来重建被检查对象的感兴趣区域的三维扫描(CT)图像。根据本申请的某些实施例，成像系统在重建被检查对象的感兴趣区域的三维扫描图像时可以采用迭代重建算法、解析重建算法等或不同重建算法的结合。
在第一射线源组件200的第一靶点的射线发射范围只覆盖感兴趣区域且感兴趣区域完全位于被检查对象内部时，投影数据可能是截断的，这种情况下被检查对象的感兴趣区域的成像属于CT内部问题。与射线发射范围覆盖整个被检查对象的图像重建相比，CT内部问题在理论上存在解不唯一的问题。
为了解决该问题，在一些实施案例中，除射线发射范围只覆盖成像区 域110而不覆盖整个检查区域100的上述第一靶点(也可称为小扇角靶点)外，第一射线源组件200还可以包括射线发射范围能够覆盖检查区域100的第二靶点(也可称为大扇角靶点)。
根据本申请的某些实施例，第一射线源组件200还包括至少一个第二靶点(大扇角靶点)。第二靶点的射线发射范围经选择能够覆盖检查区域100。在一些实施例中，第一探测器组件300还构造成能够接收从第一射线源组件200的第二靶点发射并透射经过检查区域100的X射线。在示例性实施例中，当第一射线源组件200的一个分布式射线源210包括第二靶点时，同时包括第一靶点和第二靶点的分布式射线源210可以与仅包括第一靶点的分布式射线源210以相同的方式布置其各个靶点。
在一些实施例中，射线源控制装置构造成当第一射线源组件200的第一靶点发射X射线时使得第二靶点不发射X射线，并且当第一射线源组件200的第二靶点发射X射线时使得第一靶点不发射X射线。由此，成像系统的大扇角靶点和小扇角靶点是分开进行射线发射的。
在一些实施例中，第一射线源组件200包括多个第二靶点。射线源控制装置构造成使得第一射线源组件200在同一时刻从至少两个第二靶点同时向检查区域发射X射线。在一些实施例中，在第一射线源组件200的同时向检查区域发射X射线的至少两个第二靶点中，任两个第二靶点的射线发射范围对应的第一探测器晶体互相不重合。由此，第一射线源组件200可以存在两个以上第二靶点同时发射X射线。在一些实施例中，第一射线源组件200的多个第二靶点均匀分布。例如，假设第一射线源组件200包括总共9个靶点，其中第1、4、7个靶点可以是第二靶点，其余的第2、3、5、6、8、9个靶点可以是上述第一靶点。
下面描述根据本申请的某些实施例的包括第二靶点的第一射线源组件200的射线发射模式。在一些实施例中，第一射线源组件200包括N1个第一靶点和N2个第二靶点。射线源控制装置可以参考上述任意射线发射模式将N1个第一靶点分成M组(M<N1/2)，并且控制M组第一靶点和N2个第二靶点以预定顺序发射X射线。射线源控制装置构造成当第一射线源组件200的第一靶点发射X射线时使得第二靶点不发射X射线，并且当第 一射线源组件200的第二靶点发射X射线时使得第一靶点不发射X射线。在每组第一靶点中，各个第一靶点的射线发射范围对应的第一探测器组件300的探测器晶体互相不重合。在第一射线源组件200在同一时刻从至少两个第二靶点同时向检查区域100发射X射线时，同时发射X射线的第二靶点的射线发射范围对应的第一探测器晶体互相不重合。
通过采用上述构造，大扇角靶点可以用于对被检查对象整体进行成像，有助于避免或解决CT内部问题；同时小扇角靶点可以用于提高感兴趣区域的成像质量。
根据上述实施例，第一射线源组件200的多个第一靶点可以同时发射X射线，并且可选地第一射线源组件200的多个第二靶点也可以同时发射X射线。由于多个靶点同时发射X射线，各个靶点发射的X射线与被检查对象产生的散射信号会相互叠加影响，这可能会降低第一探测器组件的信噪比并且因此影响成像质量。
为了对散射信号进行校正，根据本申请的某些实施例，成像系统还可以包括第二探测器组件600，用于接收从被检查对象散射的X射线。根据本申请的某些实施例，第二探测器组件600布置成围绕检查区域100，即位于检查区域100的径向外侧。在一些实施例中，第二探测器组件600相对于第一探测器组件300是固定的。
图4示出根据本申请的某些实施例的包括第二探测器组件的成像系统。在一些实施例中，第二探测器组件600包括多个第二探测器单元610。在示例性实施例中，第二探测器组件600的多个第二探测器单元610与第一探测器组件300的多个第一探测器单元310对应设置，优选为一一对应。根据本申请的某些实施例，第二探测器单元610布置成不接收从第一射线源组件200发射的直射X射线，而是接收经被检查对象散射的X射线。
在示例性实施例中，每个第二探测器单元610包括多个第二探测器晶体。每个第二探测器单元610的第二探测器晶体611与对应第一探测器单元310的第一探测器晶体311并排布置。在本文中，“并排布置”表示沿行进方向观察，对应的第一探测器晶体和第二探测器晶体处于大致相同的 径向位置和周向位置。沿行进方向(或中心轴线)，对应的第二探测器晶体611与第一探测器晶体311布置成彼此接触或者间隔开，这将在下文中参考附图分别详细描述。
在一些实施例中，沿行进方向(或中心轴线)，每个第二探测器单元610的第二探测器晶体与对应的第一探测器单元310的第一探测器晶体布置成间隔开，以使得第二探测器单元610不接收从第一射线源组件200发射的直射X射线。由此，第二探测器组件600的第二探测器单元610设置在第一射线源组件200的第一靶点的射线发射范围以外。
图5是根据本申请的某些实施例的第一探测器组件和第二探测器组件的示意图。图6是根据本申请的某些实施例的第一探测器组件和第二探测器组件的示意图。如图5和图6所示，沿行进方向(或中心轴线)，第二探测器单元的第二探测器晶体611与对应的第一探测器单元的第一探测器晶体311布置成间隔开。
在一些实施例中，沿行进方向(或中心轴线)，每个第二探测器单元610的第二探测器晶体与对应的第一探测器单元310的第一探测器晶体布置成彼此接触。在示例性实施例中，成像系统还包括遮挡件，其布置成使得第二探测器单元610不接收从第一射线源组件200发射的直射X射线。由于第二探测器晶体与第一探测器晶体紧邻布置，部分直射X射线可能会被第二探测器晶体接收到。通过设置遮挡件，可以防止第二探测器单元610接收到直射X射线，以提高第二探测器组件的检测精度并且提高经校正后的透射X射线信号的检测精度。
下面将参考附图描述根据本申请的某些实施例的遮挡件。
图7是根据本申请的某些实施例的第一探测器组件和第二探测器组件的示意图。图8是根据本申请的某些实施例的包括第二探测器组件和遮挡件的成像系统的局部截面示意图。如图7和图8所示，第二探测器单元610的第二探测器晶体611与对应的第一探测器单元310的第一探测器晶体311沿行进方向紧邻布置。沿行进方向(或中心轴线)，遮挡件620布置在相邻的第二探测器单元610的第二探测器晶体611与第一探测器单元310的第一探测器晶体311之间。在一些实施例中，遮挡件620布置成与第二探 测器单元610和/或第一探测器单元310直接接触，例如第二探测器单元610和/或第一探测器单元310的径向内表面(图8中所示的上表面)。在图7和图8所示的实施例中，遮挡件620为竖直遮挡件，即沿周向观察其大致沿竖直方向延伸。
图9是根据本申请的某些实施例的包括第二探测器组件和遮挡件的成像系统的局部截面示意图。图10是根据本申请的某些实施例的包括第二探测器组件和遮挡件的成像系统的局部截面示意图。如图9和图10所示，第二探测器单元610的第二探测器晶体与对应的第一探测器单元310的第一探测器晶体沿行进方向紧邻布置。遮挡件620布置成与第二探测器单元610和第一探测器单元310间隔开，即不直接接触。根据需要，遮挡件620可以设置成更远离第二探测器单元610和第一探测器单元310(如图9所示)，或者更靠近第二探测器单元610和第一探测器单元310(如图10所示)。在图9和图10所示的实施例中，遮挡件620为水平遮挡件，即沿周向观察其大致沿水平方向延伸。
上文描述在第二探测器单元610的第二探测器晶体611与对应的第一探测器单元310的第一探测器晶体311沿行进方向彼此接触时设置遮挡件。但是，本申请不限于此。应当理解，在第二探测器单元610的第二探测器晶体611与对应的第一探测器单元310的第一探测器晶体311布置成间隔开时，也可以设置遮挡件。
上文举例描述遮挡件的某些实施方式。但是，本申请不限于此。应当理解，只要遮挡件能够防止第二探测器单元610接收到直射X射线，该遮挡件可以以任何结构和形式布置。
在一些实施例中，如图5和图7所示，每个第二探测器单元的第二探测器晶体611的数量等于对应第一探测器单元的第一探测器晶体311的数量。由此，对于第一探测器单元310的每一列第一探测器晶体311，都对应地设置用于接收散射信号的一列(至少一个)第二探测器晶体611。
以下示例性地描述根据本申请的某些实施例的散射校正模式。假设第一探测器单元310的各列第一探测器晶体311的读数分别为p1、p2、p3…并且第二探测器单元610的各列第二探测器晶体611的读数为q，考虑到散 射信号为低频信号并且探测晶体的宽度较小，可以将经散射校正后的透射X射线信号表示为p1-q、p2-q、p3-q…。
在一些实施例中，如图6所示，每个第二探测器单元的第二探测器晶体611的数量小于对应第一探测器单元的第一探测器晶体311的数量。例如，第二探测器单元610的第二探测器晶体611沿着第一探测器单元310的长度方向间隔地布置。例如，可以基于各列第二探测器晶体611的读数，通过插值或拟合等方式得到在未设置第二探测器晶体611处的各列第一探测器晶体311的散射信号的计算值，并相应地进行散射信号校正。
上文描述成像系统包括第一靶点布置在第一射线源平面内的第一射线源组件200。但是，本申请不限于此。图11是根据本申请的某些实施例的包括第二射线源组件的成像系统的截面示意图。在一些实施例中，如图11所示，成像系统还包括用于发射X射线的第二射线源组件700。当成像系统包括第二射线源组件700时，第一探测器组件300还构造成用于接收从第二射线源组件700发射并透射经过成像系统的检查区域100(特别是成像区域110)的X射线。根据本申请的某些实施例，当被检查对象位于检查区域100中时，从第二射线源组件700发射的X射线能够穿透被检查对象并且被第一探测器组件300接收到。
根据本申请的某些实施例，第二射线源组件700包括多个分布式射线源，每个分布式射线源包括多个第三靶点。第二射线源组件700的每个分布式射线源可以具有与根据上述任意实施例的第一射线源组件200的分布式射线源210相同的结构、构造和布置。第二射线源组件700的第三靶点可以具有与根据上述任意实施方式的第一射线源组件200的第一靶点相同的结构、构造和布置。
第二射线源组件700的每个第三靶点具有一个射线发射范围。根据本申请的某些实施例，第二射线源组件700的至少一部分第三靶点的射线发射范围经选择能够覆盖成像区域110。在一些实施例中，第二射线源组件700的这部分第三靶点中每一个的射线发射范围经选择不足以覆盖检查区域100，即这些第三靶点中每一个的射线发射范围比检查区域100小。在示例性实施例中，第二射线源组件700的每个第三靶点的射线发射范围能 够覆盖成像区域110，并且可选地，每个第三靶点的射线发射范围不足以覆盖检查区域100。
根据本申请的某些实施例，第二射线源组件700的多个分布式射线源的所有第三靶点布置在同一平面(以下称为“第二射线源平面”)内，即第二射线源组件700的多个分布式射线源共面设置。在一些实施例中，第二射线源平面与行进方向(或中心轴线)基本上垂直。在一些实施例中，沿行进方向(或中心轴线)，第二射线源组件700的第二射线源平面与第一探测器组件300的探测器平面间隔开预定距离。
根据本申请的某些实施例，第一射线源组件200的第一射线源平面、第一探测器组件300的探测器平面和第二射线源组件700的第二射线源平面沿行进方向(或中心轴线)依次分布。在示例性实施例中，例如如图11所示，沿着行进方向(或中心轴线)，第一射线源组件200和第二射线源组件700分别设置在第一探测器组件300的两侧。由此，根据本申请的某些实施例的成像系统具有两个射线源平面，两个射线源平面分别位于探测器平面的两侧。
在示例性实施例中，第一射线源平面、探测器平面和第二射线源平面基本上相互平行。在一些实施例中，第一射线源平面、探测器平面和第二射线源平面与行进方向(或中心轴线)基本上垂直。
根据本申请的某些实施例，当成像系统还包括第二射线源组件700时，成像区域110被限定为位于第一射线源组件200的第一射线源平面与第二射线源组件700的第二射线源平面之间。在示例性实施例中，成像区域110被限定为圆柱形区域。在一些实施例中，成像区域110被限定为足以容纳被检查对象的感兴趣区域。
根据本申请的某些实施例，第一射线源组件200、第一探测器组件300和第二射线源组件700能够共同相对于承载装置400沿行进方向移动。
根据本申请的某些实施例，第二射线源组件700的每个靶点都设置成沿行进方向朝着第一探测器组件300的第一探测器单元310偏转第二偏转角度。在一些实施例中，第二偏转角度在1度到5度之间。在一些实施例中，第二射线源组件700的每个分布式射线源围绕其靶点的轴线偏转。在 一些实施例中，第二射线源组件700还可以包括准直器，用于使第二射线源组件700的分布式射线源发射的X射线的方向沿行进方向朝着第一探测器组件300偏转第二倾斜角度。在一些实施例中，第二偏转角度设置成使得第二射线源组件700的每个分布式射线源发射的X射线在经过成像区域之前不会被第一探测器组件300遮挡。
应当理解，由于第一射线源组件200和第二射线源组件700分别设置在第一探测器组件300的两侧，第一射线源组件200发射的X射线与第二射线源组件700发射的X射线彼此相对地偏转。在示例性实施例中，第一偏转角度与第二偏转角度相等。
根据本申请的某些实施例，当成像系统还包括第二射线源组件700时，射线源控制装置还用于控制第二射线源组件700的射线发射。
在一些实施例中，射线源控制装置构造成当被检查对象的感兴趣区域至少部分地位于成像区域110中时，使得第二射线源组件700的多个分布式射线源在同一时刻从至少两个第三靶点同时向成像区域110发射X射线。在第二射线源组件700的同时向成像区域110发射X射线的至少两个第三靶点中，每个第三靶点的射线发射范围都能够覆盖成像区域110，并且任两个第三靶点的射线发射范围对应的第一探测器组件300的探测器晶体互相不重合。由此，第二射线源平面中存在两个以上靶点同时发射X射线。根据本申请的某些实施例，射线源控制装置可以构造成控制第二射线源组件700的射线发射，例如靶点发射顺序、发射频率、发射电流等。
根据本申请的某些实施例，射线源控制装置构造成当被检查对象的感兴趣区域至少部分地位于成像区域110中时，使得第一射线源组件200的至少一个第一靶点和第二射线源组件700的至少一个第三靶点在同一时刻同时向成像区域110发射X射线。这种情况下，成像系统的第一射线源组件200和第二射线源组件700可以从至少两个靶点(至少一个第一靶点和至少一个第三靶点)发射X射线。因此，成像系统可以进一步提高射线发射频率和扫描效率。
在一些实施例中，在第一射线源组件200的至少一个第一靶点和第二射线源组件700的至少一个第三靶点同时向成像区域110发射X射线时， 第一射线源组件200的第一靶点的射线发射范围对应的第一探测器组件300的探测器晶体和第二射线源组件700的第三靶点的射线发射范围对应的第一探测器组件300的探测器晶体互相不重合。
上文描述第二射线源组件700的某些示例性结构、构造和布置。但是，本申请不限于此。应当理解，本文中描述的涉及第一射线源组件200的任何实施例都可以等同地应用于第二射线源组件700。
下面详细描述根据本申请的某些实施例的成像方法。根据本申请的某些实施例，可以使用上述任意成像系统来实施该成像方法。
下面以成像系统包括第一射线源组件200和第一探测器组件300为例来描述根据本申请的某些实施例的成像方法。但是，应当理解，用于实施根据本申请的实施例的成像方法的成像系统还可以包括第二射线源组件700。
在步骤S10中，使被检查对象承载于成像系统的承载装置400上。
在步骤S20中，使第一射线源组件200和第一探测器组件300相对于承载装置400沿行进方向移动，从而被检查对象的感兴趣区域能够进入成像区域110，同时使第一射线源组件200发射X射线并且使X射线经过成像区域110而被第一探测器组件300接收。在一些实施例中，通过承载装置400沿行进方向传送被检查对象。
在第一射线源组件200发射X射线的过程中，使第一射线源组件200的多个分布式射线源210在同一时刻从至少两个第一靶点同时向成像区域110发射X射线。在第一射线源组件200的同时向成像区域110发射X射线的至少两个靶点中，每个靶点的射线发射范围都能够覆盖成像区域110，并且任两个靶点的射线发射范围对应的第一探测器组件300的探测器晶体互相不重合。
根据本申请的某些实施例，该成像方法还可以通过成像系统的位置调整功能来调整被检查对象的感兴趣区域相对于成像区域110的位置。例如，当被检查对象的感兴趣区域未完全位于成像区域110中时，通过成像系统的位置调整功能可以将被检查对象的感兴趣区域移动到完全位于成像区域110中。
在一些实施例中，该成像方法还包括在步骤S10中使被检查对象承载于承载装置400上后，通过承载装置400调整被检查对象的感兴趣区域相对于成像区域110的位置。在一些实施例中，该成像方法还包括在步骤S10中使被检查对象承载于承载装置400上后，沿行进方向观察，通过使第一射线源组件200相对于成像区域110(或承载装置400)在预定范围内转动，以调整被检查对象的感兴趣区域相对于成像区域110的位置。由此，该成像方法可以使被检查对象的感兴趣区域通过调整而位于成像区域110内。
根据本申请的某些实施例，该成像方法还可以提供射线发射范围能够覆盖检查区域100的第二靶点(大扇角靶点)，以解决潜在的CT内部问题。应当理解，本文中涉及第二靶点的任意实施例都可以应用于该成像方法中。
在一些实施例中，在上述步骤S20中第一射线源组件200发射X射线的步骤还包括：从第一射线源组件200的第二靶点发射X射线。第二靶点的射线发射范围经选择能够覆盖检查区域100。在一些实施例中，当第一射线源组件200的第一靶点发射X射线时使得第二靶点不发射X射线，并且当第一射线源组件200的第二靶点发射X射线时使得第一靶点不发射X射线。
根据本申请的某些实施例，成像方法还可以包括步骤S30：基于第一探测器组件300的检测数据来重建被检查对象的感兴趣区域的三维扫描(CT)图像。在一些实施例中，成像方法还可以包括在重建被检查对象的三维扫描图像后，对被检查对象进行识别并提供识别结果。在一些实施例中，成像方法还可以包括显示三维扫描图像和/或识别结果。
在一些实施例中，成像方法还可以采用根据本申请的上述实施例的第二探测器组件600来校正散射信号。应当理解，本文中涉及第二探测器组件的任意实施例都可以应用于该成像方法中。在上述步骤S30中，成像方法基于第一探测器组件300和第二探测器组件600的检测数据来重建被检查对象的感兴趣区域的三维扫描图像。由此，可以提高第一探测器组件的信噪比并且因此提高成像质量。
在一些实施例中，在执行步骤S10前，成像方法还可以预先加载或生产配置信息或校正信息等，例如本底数据、空气数据等。
在根据本申请的某些实施例的成像方法中，所使用的成像系统的其他实施方式参见上文所述并且相应地结合到成像方法的实施例中，在此不再赘述。
尽管已经参考示例性实施例描述了本申请，但是应理解，本申请并不限于上述实施例的构造和方法。相反，本申请意在覆盖各种修改例和等同配置。另外，尽管在各种示例性结合体和构造中示出了本公开的各种元件和方法步骤，但是包括更多、更少的元件或方法的其它组合也落在本申请的范围之内。

Claims (35)

  1. 一种用于射线检查的成像系统，包括：
    检查区域，其中被检查对象能够进入所述检查区域，所述检查区域包括成像区域，所述被检查对象的感兴趣区域能够进入所述成像区域，所述感兴趣区域是所述被检查对象的局部区域；
    第一射线源组件，用于发射X射线，其中，所述第一射线源组件包括多个分布式射线源，每个分布式射线源包括多个第一靶点，所述第一射线源组件的所有第一靶点布置在第一射线源平面内；
    第一探测器组件，用于接收从所述第一射线源组件发射并透射经过所述成像系统的所述成像区域的X射线，其中，所述第一探测器组件包括多个第一探测器单元，每个第一探测器单元包括多个第一探测器晶体，所述多个第一探测器单元布置在探测器平面内，所述探测器平面与所述第一射线源平面沿所述被检查对象的行进方向间隔开预定距离；和
    射线源控制装置，其构造成当所述感兴趣区域至少部分地位于所述成像区域中时，使得所述第一射线源组件在同一时刻从至少两个第一靶点同时向所述成像区域发射X射线，
    其中，在所述第一射线源组件的同时向所述成像区域发射X射线的至少两个第一靶点中，每个第一靶点的射线发射范围都能够覆盖所述成像区域，并且任两个第一靶点的射线发射范围对应的第一探测器晶体互相不重合。
  2. 根据权利要求1所述的成像系统，还包括承载装置，用于承载所述被检查对象，其中，所述成像系统构造成使得所述第一射线源组件和所述第一探测器组件能够相对于所述承载装置沿所述行进方向移动，从而所述被检查对象的感兴趣区域能够进入所述成像区域。
  3. 根据权利要求2所述的成像系统，其中，所述承载装置构造成能够沿所述行进方向传送所述被检查对象。
  4. 根据权利要求2或3所述的成像系统，其中，所述承载装置还构造成能够调整所述被检查对象的感兴趣区域相对于所述成像区域的位置，使 得所述被检查对象的感兴趣区域位于所述成像区域内。
  5. 根据权利要求1或2所述的成像系统，其中，所述成像区域位于所述第一射线源平面与所述第一探测器组件的远离所述第一射线源组件的外侧边缘之间，其中所述成像区域被限定为足以容纳所述感兴趣区域。
  6. 根据权利要求5所述的成像系统，其中，所述成像区域被限定为具有中心轴线的圆柱形区域。
  7. 根据权利要求6所述的成像系统，其中，所述行进方向与所述中心轴线基本上平行。
  8. 根据权利要求1或2所述的成像系统，其中，所述探测器平面与所述第一射线源平面彼此平行。
  9. 根据权利要求1或2所述的成像系统，其中，沿所述行进方向观察，所述第一射线源组件的多个分布式射线源构造成围绕所述成像区域具有大于180度的组合延伸角度。
  10. 根据权利要求9所述的成像系统，其中，所述第一射线源组件的多个分布式射线源构造成完整地围绕所述成像区域延伸以组成第一射线源环。
  11. 根据权利要求1或2所述的成像系统，其中，所述第一射线源组件的每个第一靶点的射线发射范围选择为不足以覆盖所述检查区域。
  12. 根据权利要求1或2所述的成像系统，其中，所述第一射线源组件的每个第一靶点都设置成沿所述行进方向朝着所述第一探测器组件的第一探测器单元偏转第一偏转角度。
  13. 根据权利要求12所述的成像系统，其中，所述第一偏转角度在1度到5度之间。
  14. 根据权利要求2或3所述的成像系统，其中，沿所述行进方向观察，所述第一射线源组件构造成能够相对于所述承载装置在预定范围内转动，以调整所述被检查对象的感兴趣区域相对于所述成像区域的位置，使得所述被检查对象的感兴趣区域位于所述成像区域内。
  15. 根据权利要求11所述的成像系统，其中，所述第一射线源组件还包括至少一个第二靶点，所述第二靶点的射线发射范围经选择能够覆盖所 述检查区域，
    其中，所述射线源控制装置还构造成：当所述第一射线源组件的所述第一靶点发射X射线时使得所述第二靶点不发射X射线，并且当所述第一射线源组件的所述第二靶点发射X射线时使得所述第一靶点不发射X射线。
  16. 根据权利要求15所述的成像系统，其中，所述第一射线源组件包括多个第二靶点，其中，所述射线源控制装置构造成使得所述第一射线源组件在同一时刻从至少两个第二靶点同时向所述检查区域发射X射线，
    其中，在所述第一射线源组件的同时向所述检查区域发射X射线的至少两个第二靶点中，任两个第二靶点的射线发射范围对应的第一探测器晶体互相不重合。
  17. 根据权利要求2或3所述的成像系统，其中，沿所述行进方向观察，所述第一探测器组件设置成位于所述第一射线源组件的径向内侧。
  18. 根据权利要求17所述的成像系统，其中，所述第一探测器组件构造成完整地围绕所述成像区域延伸以组成探测器环。
  19. 根据权利要求18所述的成像系统，其中，所述第一探测器组件的第一探测器单元包括单排第一探测器晶体或多排第一探测器晶体。
  20. 根据权利要求17所述的成像系统，还包括第二探测器组件，用于接收从所述被检查对象散射的X射线，其中，所述第二探测器组件包括多个第二探测器单元，每个第二探测器单元包括多个第二探测器晶体。
  21. 根据权利要求20所述的成像系统，其中，所述第二探测器组件的多个第二探测器单元与所述第一探测器组件的多个第一探测器单元对应设置。
  22. 根据权利要求21所述的成像系统，其中，所述成像系统还包括遮挡件，所述遮挡件布置成使得所述第二探测器单元不接收从所述第一射线源组件发射的直射X射线。
  23. 根据权利要求21所述的成像系统，其中，沿所述行进方向，每个第二探测器单元的第二探测器晶体与对应的第一探测器单元的第一探测器晶体布置成间隔开，以使得所述第二探测器单元不接收从所述第一射线源 组件发射的直射X射线。
  24. 根据权利要求21所述的成像系统，其中，每个第二探测器单元的第二探测器晶体的数量等于对应的第一探测器单元的第一探测器晶体的数量；或者
    每个第二探测器单元的第二探测器晶体的数量小于对应的第一探测器单元的第一探测器晶体的数量。
  25. 根据权利要求2所述的成像系统，还包括：
    第二射线源组件，用于发射X射线，其中，所述第二射线源组件包括多个分布式射线源，每个分布式射线源包括多个第三靶点，所述第二射线源组件的所有第三靶点布置在第二射线源平面内，所述探测器平面与所述第二射线源平面沿所述行进方向间隔开预定距离，
    其中，所述第一探测器组件还构造成用于接收从所述第二射线源组件发射并透射经过所述成像系统的所述成像区域的X射线，
    其中，所述第一射线源平面、所述探测器平面和所述第二射线源平面沿所述行进方向依次分布，
    其中，所述射线源控制装置构造成当所述感兴趣区域至少部分地位于所述成像区域中时，使得所述第二射线源组件在同一时刻从至少两个第三靶点同时向所述成像区域发射X射线，
    其中，在所述第二射线源组件的同时向所述成像区域发射X射线的至少两个第三靶点中，每个第三靶点的射线发射范围都能够覆盖所述成像区域，并且任两个第三靶点的射线发射范围对应的第一探测器晶体互相不重合。
  26. 根据权利要求25所述的成像系统，其中，所述成像系统构造成使得所述第一射线源组件、所述第一探测器组件和所述第二射线源组件能够相对于所述承载装置沿所述行进方向移动，从而所述被检查对象的感兴趣区域能够进入所述成像区域。
  27. 根据权利要求25所述的成像系统，其中，所述成像区域位于所述第一射线源平面与所述第二射线源平面之间，其中所述成像区域被限定为足以容纳所述感兴趣区域。
  28. 根据权利要求27所述的成像系统，其中，所述成像区域被限定为具有中心轴线的圆柱形区域。
  29. 根据权利要求25所述的成像系统，其中，所述探测器平面、所述第一射线源平面和所述第二射线源平面彼此平行。
  30. 根据权利要求25所述的成像系统，其中，所述射线源控制装置构造成当所述被检查对象的所述感兴趣区域至少部分地位于所述成像区域中时，使得所述第一射线源组件的至少一个第一靶点和所述第二射线源组件的至少一个第三靶点在同一时刻同时向所述成像区域发射X射线，并且
    其中，在所述第一射线源组件的至少一个第一靶点和所述第二射线源组件的至少一个第三靶点同时向所述成像区域发射X射线时，所述第一射线源组件的第一靶点的射线发射范围对应的所述第一探测器组件的探测器晶体和所述第二射线源组件的第三靶点的射线发射范围对应的所述第一探测器组件的探测器晶体互相不重合。
  31. 根据权利要求1或2所述的成像系统，其中，所述成像系统还构造成基于所述第一探测器组件的检测数据来重建所述被检查对象的所述感兴趣区域的三维扫描图像。
  32. 一种使用根据权利要求2所述的成像系统的成像方法，包括：
    (a)使被检查对象承载于所述成像系统的承载装置上；和
    (b)使所述成像系统的第一射线源组件和第一探测器组件相对于所述承载装置沿行进方向移动，从而所述被检查对象的感兴趣区域能够进入成像区域，同时使所述第一射线源组件发射X射线并且使X射线透射经过所述成像区域而被所述第一探测器组件接收，
    其中，所述第一射线源组件发射X射线的步骤包括：使所述第一射线源组件在同一时刻从至少两个第一靶点同时向所述成像区域发射X射线，
    其中，在所述第一射线源组件的同时向所述成像区域发射X射线的至少两个第一靶点中，每个第一靶点的射线发射范围都能够覆盖所述成像区域，并且任两个第一靶点的射线发射范围对应的第一探测器晶体互相不重合。
  33. 根据权利要求32所述的成像方法，还包括在步骤(a)中使所述被 检查对象承载于所述承载装置上后，通过所述承载装置调整所述被检查对象的感兴趣区域相对于所述成像区域的位置，使得所述被检查对象的感兴趣区域位于所述成像区域内。
  34. 根据权利要求32所述的成像方法，还包括在步骤(a)中使所述被检查对象承载于所述承载装置上后，沿所述行进方向观察，使所述第一射线源组件相对于所述承载装置在预定范围内转动，以调整所述被检查对象的感兴趣区域相对于所述成像区域的位置，使得所述被检查对象的感兴趣区域位于所述成像区域内。
  35. 根据权利要求32所述的成像方法，其中，所述第一射线源组件发射X射线的步骤还包括：从所述第一射线源组件的第二靶点发射X射线，所述第二靶点的射线发射范围选择为能够覆盖所述检查区域，
    其中，当所述第一射线源组件的所述第一靶点发射X射线时使得所述第二靶点不发射X射线，并且当所述第一射线源组件的所述第二靶点发射X射线时使得所述第一靶点不发射X射线。
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